A test case generation method and system based on Bayesian estimation

A test case generation and Bayesian estimation technology, applied in the computer field, can solve problems such as huge computational overhead, and achieve the effects of improving operating efficiency, solving boundary effects, and solving computational overhead problems.

Active Publication Date: 2022-02-01
WUHAN UNIV
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Problems solved by technology

[0009] The purpose of the present invention is to provide a method based on Bayesian for the problem of the boundary effect that the large amount of distance calculations in the method in the prior art lead to a huge calculation cost and the test cases are easy to accumulate at the boundary of the software input domain. Estimated test case generation scheme

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  • A test case generation method and system based on Bayesian estimation
  • A test case generation method and system based on Bayesian estimation
  • A test case generation method and system based on Bayesian estimation

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Embodiment Construction

[0045] The present invention provides a test case generation method based on Bayesian estimation. By dividing the input domain into a plurality of sub-areas with unequal sizes, the probability of software errors that may occur in each sub-area is estimated using Bayesian thinking. Finally, these sub-areas are sorted according to the size of the estimated value of the probability, and test cases are generated in the sub-areas that are ranked first. In order to comply with the practice in the technical field, the test case generation method based on Bayesian estimation proposed by the present invention is now referred to as the Bayes-ART method for short.

[0046]In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, ...

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Abstract

The present invention provides a test case generation method and system based on Bayesian estimation, including the following: dividing the input domain of the software into a plurality of sub-areas, and distinguishing the boundary area of ​​the input domain from the internal area, and using the boundary area as Sub-areas with the highest priority; Bayesian estimation method is introduced to estimate the probability that the sub-areas in the internal area may contain failure areas, and the sub-areas in the internal area are sorted based on the probability; test cases are generated according to the priority order of the sub-areas , until a software error is found; if the number of test cases reaches the preset condition and no software error is found, continue to generate test cases in the sub-area with the highest priority until a software error is found. The method of the invention can well solve the huge calculation overhead problem existing in the existing ART method, solve the boundary effect problem of the ART method to a certain extent, and improve the operation efficiency at the same time.

Description

technical field [0001] The invention relates to the field of computer technology, in particular to a test case generation method and system based on Bayesian estimation. Background technique [0002] Software testing is an important link in the software development process. It can run the entire system or some modules manually or automatically, and judge whether the overall or partial functions of the software meet the specified requirements according to whether the expected results are consistent with the actual results. . At present, there are many types of technologies in the field of software testing, and the most common software testing technologies are white-box testing, gray-box testing, and black-box testing. However, no matter which test method the tester chooses to use, it is almost impossible to completely test the input domain of the software. Therefore, it is more common to select from some representative subset of the input domain of the software. Test cases ...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/36G06N7/00
CPCG06F11/3684G06F11/3688G06N7/01
Inventor 谢晓园姚羽秋关超浦帆
Owner WUHAN UNIV
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