Server sensor auxiliary test method

By obtaining sensor information of the server cluster, dynamically adjusting the temperature alarm threshold and optimizing the heating distance, the problem of cumbersome operation of server component testing in the prior art, fixed temperature threshold and self-determining the heating distance is solved, and more accurate and efficient testing is achieved process.

CN119248598AActive Publication Date: 2025-01-03百信信息技术有限公司
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Patent Information

Application Number
CN202411278453.0
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-09-12
Publication Date
2025-01-03
Estimated Expiration
2044-09-12

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Abstract

The invention relates to the field of server sensor testing, and discloses a server sensor auxiliary testing method, which comprises the following steps of: acquiring various information of a target server, establishing connection with the target server, and acquiring temperature data of a target sensor on the basis of the information. Various information of the target sensor is obtained through the sensor information list, the temperature alarm threshold value corresponding to the target sensor is determined, the obtained temperature data is compared with the temperature alarm threshold value, and when the temperature data is larger than the temperature alarm threshold value, the client side generates a light control signal and sends the light control signal to the server to control the prompt lamp to give an alarm. Therefore, damage to corresponding parts is reduced, and damage to the parts is avoided.
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Description

Technical Field

[0001] The present invention relates to the field of server sensor testing, and in particular to a server sensor auxiliary testing method. Background Art

[0002] At present, the temperature rise and fall test of the sensors of various server components is mainly performed by logging in to the BMC web page and constantly refreshing the page to obtain the real-time sensor temperature. In addition, there are many types and quantities of sensors in server components. After refreshing the web page, you need to click on the page where the specific sensor is located to view it. This method is very inconvenient and cumbersome to test the sensors of various server components. In order to simulate the test scenario of the actual temperature rise of various server components, a hot air gun needs to be used to heat the corresponding components.

[0003] In the existing simulation test process, the following technical problems often occur:

[0004] First, improper operation of the hot air gun can easily cause the temperature of the component to rise too quickly and fail to observe the temperature change in time, resulting in excessive temperature of the component and damaging the corresponding component, shortening its service life or causing irreparable damage;

[0005] Second, the temperature alarm threshold is generally fixed and cannot be changed dynamically, resulting in inaccurate test results or exceeding the temperature that some components can withstand and causing damage to the components.

[0006] Third, the heating distance is usually determined by the testers themselves. If the distance is too far, the heating efficiency will be low and the components cannot be effectively heated. If the distance is too close, the server will easily be damaged. Summary of the invention

[0007] The summary of the invention is used to introduce concepts in a brief form, which will be described in detail in the detailed implementation section below. The summary of the invention is not intended to identify the key features or essential features of the technical solution claimed for protection, nor is it intended to limit the scope of the technical solution claimed for protection.

[0008] The present invention proposes a server sensor-assisted testing method to solve one or more of the technical problems mentioned in the above background technology part.

[0009] The present invention provides a server sensor-assisted testing method, the method comprising:

[0010] Obtaining a server identifier, an Internet Protocol address, a sensor identifier of a target sensor, and login information of the target server in the server cluster to be tested, wherein each server in the server cluster to be tested is configured with multiple sensors, and the multiple sensors are used to collect temperature data of different components of the server;

[0011] By searching the sensor identification of the target sensor in the pre-configured sensor information list, the sensor type corresponding to the sensor identification, the component name corresponding to the target sensor, and the component operation time are obtained; according to the sensor type, the component name corresponding to the target sensor, and the component operation time, the temperature alarm threshold corresponding to the target sensor is determined;

[0012] Use the login information to establish a connection with the server corresponding to the server identifier, and obtain the temperature data of the target sensor; compare the temperature data with the temperature alarm threshold, and if the temperature data is greater than the temperature alarm threshold, generate a light control signal for the prompt light, and send the light control signal to the target server, so that the target server controls the light of the prompt light.

[0013] Optionally, a temperature alarm threshold corresponding to the target sensor is determined according to the sensor type, the component name corresponding to the target sensor, and the component operation time, including:

[0014] According to the component name corresponding to the target sensor, query the historical temperature alarm threshold corresponding to the component name and the update timestamp corresponding to the historical temperature alarm threshold;

[0015] Determine whether the historical temperature alarm threshold has expired according to the update timestamp. If the historical temperature alarm threshold has expired, obtain the corresponding component aging curve according to the component name, and query the aging rate corresponding to the component operation time from the component aging curve. The component aging curve represents the corresponding relationship between the component operation time and the aging rate.

[0016] According to the component name corresponding to the target sensor, determine the target temperature load level corresponding to the component name from multiple pre-set temperature load levels, determine the temperature load range corresponding to the target temperature load level, and extract the temperature upper limit value of the temperature load range;

[0017] The temperature alarm threshold corresponding to the target sensor is determined according to the aging rate and the upper temperature limit value corresponding to the component operation time.

[0018] Optionally, before searching the pre-configured sensor information list by the sensor identifier of the target sensor to obtain the sensor type corresponding to the sensor identifier, the component name corresponding to the target sensor, and the component running time, the method further includes:

[0019] Determine a cluster architecture diagram corresponding to the server cluster to be tested, the cluster architecture diagram including multiple nodes and edges connecting different nodes, wherein each node corresponds to a server in the server cluster to be tested, and the edges represent associations between different servers;

[0020] Grouping multiple nodes to obtain multiple node groups, the multiple node groups include a root node group, an intermediate node group, and a child node group; respectively configuring a corresponding importance factor for each node group; and

[0021] Determine the temperature alarm threshold corresponding to the target sensor based on the sensor type, the component name corresponding to the target sensor, and the component operation time, including:

[0022] Determine the reference temperature alarm threshold corresponding to the target sensor according to the sensor type, the component name corresponding to the target sensor, and the component operation time;

[0023] Determine the node group to which the target server belongs, and determine the importance coefficient corresponding to the target server according to the importance factor corresponding to the node group to which it belongs;

[0024] According to the importance coefficient and the reference temperature alarm threshold, a temperature alarm threshold corresponding to the target sensor is generated.

[0025] Optionally, determining an importance coefficient corresponding to the target server according to an importance factor corresponding to the node group to which the target server belongs includes:

[0026] If the node group to which the target server belongs is a sub-node group, the priorities of the multiple nodes in the sub-node group are determined respectively, and the nodes in the sub-node group are sorted according to the priorities to obtain a sub-node sequence;

[0027] The ranking of the target server in the subnode sequence is determined, and the importance coefficient corresponding to the target server is determined according to the ranking of the target server in the subnode sequence and the importance factor of the subnode group.

[0028] Optionally, each component of the target server is configured with a prompt light, and each prompt light is configured with multiple light modes; the light control signal includes a prompt light number and a target light mode; and

[0029] Sending a light control signal to a target server so that the target server controls the light of the prompt light, including:

[0030] The light control signal is sent to the target server, so that the target server controls the light of the prompt light corresponding to the prompt light number, so that the prompt light corresponding to the prompt light number enters the target light mode.

[0031] The present invention has the following beneficial effects:

[0032] 1. By establishing a connection between the client and the server, the temperature data of the corresponding component of the sensor is obtained, the temperature data is compared with the temperature alarm threshold, a light control signal is generated, and an alarm is issued through the light to reduce the damage to the corresponding component and avoid damage to the component. Specifically, various information of the target server is obtained, and a connection with the target server is established. On this basis, the temperature data of the target sensor is obtained. By obtaining various information of the target sensor, the temperature alarm threshold corresponding to the target sensor is determined. The obtained temperature data is compared with the temperature alarm threshold. When the temperature data is greater than the temperature alarm threshold, the client generates a light control signal and sends it to the server to control the prompt light to alarm. Thereby reducing the damage to the corresponding component and avoiding damage to the component.

[0033] 2. The temperature alarm threshold corresponding to the sensor is determined by the reference temperature alarm threshold and the importance coefficient corresponding to the server, which improves the accuracy of the test results and avoids component damage. Specifically, the main reason for inaccurate test results and component damage is that the temperature alarm threshold is fixed, but the temperature that each component can withstand is different. Based on this, the present invention determines the reference temperature alarm threshold corresponding to the sensor through the sensor type, the component name corresponding to the sensor, and the running time of the component, determines the importance coefficient corresponding to the target server through the importance factor corresponding to the node group to which the target server belongs, and determines the temperature alarm threshold corresponding to the sensor based on the reference temperature alarm threshold and the importance coefficient. Thereby, a temperature alarm threshold is set for each component, the accuracy of the test results is improved, and damage to the component due to the temperature alarm threshold exceeding the component's withstand temperature is avoided.

[0034] 3. Determine the key monitoring component group and the recommended heating distance through test records to improve the heating efficiency so that the components can be effectively heated. Specifically, the main reason for the low heating efficiency is that the heating distance is random, which leads to uneven heating of the components and poor heating effect. Based on this, the present invention obtains the target test record group to obtain the test records, sorts the components according to the alarm times of different components in the test records, and obtains the component sequence. A target number of components are selected to form a key monitoring component group, and the sum of the heating distances corresponding to different components is averaged to obtain the average heating distance, i.e. the recommended heating distance. Thereby, the heating efficiency is improved and the components can be effectively heated. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] The above and other features, advantages and aspects of the embodiments of the present invention will become more apparent with reference to the following detailed description in conjunction with the accompanying drawings. Throughout the accompanying drawings, the same or similar reference numerals represent the same or similar elements. It should be understood that the drawings are schematic and that components and elements are not necessarily drawn to scale.

[0036] Figure 1The present invention is a flow chart of a server sensor-assisted testing method. DETAILED DESCRIPTION

[0037] The present invention will be described in more detail below with reference to the accompanying drawings. Although certain embodiments of the present invention are shown in the accompanying drawings, it should be understood that the present invention can be implemented in various forms and should not be construed as being limited to the embodiments set forth herein. On the contrary, these embodiments are provided to provide a more thorough and complete understanding of the present invention. It should be understood that the drawings and embodiments of the present invention are only for exemplary purposes and are not intended to limit the scope of protection of the present invention.

[0038] It should also be noted that, for ease of description, only the parts related to the invention are shown in the drawings. In the absence of conflict, the embodiments of the present invention and the features in the embodiments can be combined with each other.

[0039] It should be noted that the concepts such as "first" and "second" mentioned in the present invention are only used to distinguish different devices, modules or units, and are not used to limit the order or interdependence of the functions performed by these devices, modules or units.

[0040] It should be noted that the modifications of "one" and "plurality" mentioned in the present invention are illustrative rather than restrictive, and those skilled in the art should understand that, unless otherwise clearly indicated in the context, it should be understood as "one or more".

[0041] The names of the messages or information exchanged between multiple devices of the present invention are only used for illustrative purposes, and are not used to limit the scope of these messages or information.

[0042] The present invention will be described in detail below with reference to the accompanying drawings and in conjunction with embodiments.

[0043] like Figure 1 FIG. 1 is a flow chart of a server sensor-assisted testing method of the present invention, which specifically includes the following steps:

[0044] Step 101, obtain the server identifier, Internet Protocol address, sensor identifier of the target sensor and login information of the target server in the server cluster to be tested, wherein each server in the server cluster to be tested is configured with multiple sensors, and the multiple sensors are used to collect temperature data of different components of the server.

[0045] In some embodiments, the execution subject of the flowchart of the sensor-assisted testing method for a server of the present invention may be a client, which may be a desktop computer or a laptop computer.

[0046] In practice, the execution subject can store various information of each server in the server cluster to be tested locally. The server cluster to be tested includes each server. On this basis, the execution subject can obtain the server ID, Internet Protocol address, sensor ID of the target sensor and login information of the target server. The target server can be any one or more servers. The server ID is to number the server, and one server ID corresponds to one server. The Internet Protocol address can be an IP address. The login information can be a user name and password.

[0047] In practice, each server in the server cluster to be tested is configured with multiple sensors. Each sensor is configured with a sensitive element, a conversion element, and a communication serial port as needed, wherein the communication serial port is connected to the server and outputs an electrical signal to the server through the communication serial port. Each sensor senses the temperature change information of different components through the sensitive element, and then converts the temperature change information into an electrical signal through the conversion element, and outputs the electrical signal as an output signal to the server through the communication serial port to obtain the temperature data of different components. Among them, the components include but are not limited to: disk array card, central processing unit, disk backplane, etc.

[0048] In practice, multiple sensors collect temperature data of different components. In order to distinguish the temperature data of the components collected by each sensor, each sensor can be numbered to obtain a sensor identification of each sensor. Each sensor corresponds to a component.

[0049] Step 102, query the sensor information list configured in advance through the sensor identification of the target sensor to obtain the sensor type corresponding to the sensor identification, the component name corresponding to the target sensor, and the component operation time; determine the temperature alarm threshold corresponding to the target sensor according to the sensor type, the component name corresponding to the target sensor, and the component operation time.

[0050] In some embodiments, the sensor identifier of the target sensor is queried in a pre-configured sensor information list to obtain the sensor type corresponding to the sensor identifier, the component name corresponding to the target sensor, and the component operation time. As an example, the sensor identifier of the target sensor may be sensor 3. For sensor 3, sensor 3 is queried in a pre-configured sensor information list to obtain the sensor type corresponding to sensor 3, the component name corresponding to sensor 3, and the component operation time. In practice, the sensor information in the pre-configured sensor information list includes: sensor identifier, sensor type, component name corresponding to the sensor, and component operation time.

[0051] Optionally, according to the sensor type, the component name corresponding to the target sensor, and the component operation time, determining the temperature alarm threshold corresponding to the target sensor is determined by the following steps:

[0052] Step 1: According to the component name corresponding to the target sensor, query the historical temperature alarm threshold corresponding to the component name and the update timestamp corresponding to the historical temperature alarm threshold.

[0053] In some embodiments, the execution subject may store a component information list locally. The component information list includes: component name, historical temperature alarm threshold, and update timestamp corresponding to the historical temperature alarm threshold. As an example, the component name corresponding to the target sensor is the central processing unit, and the component operation time is half a year. The central processing unit is queried in the component information list to obtain the historical temperature alarm threshold corresponding to the central processing unit, and the update timestamp corresponding to the historical temperature alarm threshold is obtained.

[0054] Step 2: Determine whether the historical temperature alarm threshold has expired based on the update timestamp. If the historical temperature alarm threshold has expired, obtain the corresponding component aging curve based on the component name, and query the aging rate corresponding to the component operating time from the component aging curve. The component aging curve represents the corresponding relationship between the component operating time and the aging rate.

[0055] In some embodiments, as an example, an expiration time threshold is set, and the expiration time threshold may be 3 months. In practice, if the update timestamp of the historical temperature alarm threshold corresponding to the central processor obtained by the execution subject is July 3, and the current timestamp is September 3, the time difference is 2 months obtained by subtracting the update timestamp of the historical temperature alarm threshold corresponding to the central processor from the current timestamp, and the time difference is less than the expiration time threshold, then the historical temperature alarm threshold has not expired. If the update timestamp of the historical temperature alarm threshold corresponding to the central processor obtained by the execution subject is May 3, and the current timestamp is September 3, the time difference is 3 months obtained by subtracting the update timestamp of the historical temperature alarm threshold corresponding to the central processor from the current timestamp, and the time difference is greater than the expiration time threshold, then the historical temperature alarm threshold has expired.

[0056] In some embodiments, the execution subject may store a component aging curve atlas locally. The component aging curve atlas includes a component aging curve graph corresponding to each component. As an example, if the historical temperature alarm threshold has expired, the component aging curve graph corresponding to the central processing unit is obtained from the locally stored component aging curve atlas, and the aging rate corresponding to the component operation time is queried from the component aging curve graph. The component aging curve graph represents the corresponding relationship between the component operation time and the aging rate. As an example, the operation time of the central processing unit is half a year, and the corresponding aging rate is 0.9.

[0057] Step three, according to the component name corresponding to the target sensor, determine the target temperature load level corresponding to the component name from multiple pre-set temperature load levels, determine the temperature load range corresponding to the target temperature load level, and extract the temperature upper limit value of the temperature load range.

[0058] In some embodiments, the execution subject has locally stored a plurality of pre-set temperature bearing levels. Among them, the temperature bearing levels in the pre-set plurality of temperature bearing levels include component name, temperature bearing level, and temperature bearing range. As an example, the component name corresponding to the target sensor is the central sensor, and the target temperature bearing level corresponding to the central sensor is queried from the pre-set plurality of temperature bearing levels. The target temperature bearing level may be level one, and the temperature bearing range corresponding to level one may be 50-60°C, and the upper temperature limit of the temperature bearing range is 60°C.

[0059] Step 4: Determine the temperature alarm threshold corresponding to the target sensor according to the aging rate and the upper temperature limit value corresponding to the component operation time.

[0060] In some embodiments, the temperature alarm threshold corresponding to the target sensor is determined according to the aging rate and the upper temperature limit value corresponding to the operation time of the component. As an example, the operation time of the central sensor is half a year, the corresponding aging rate is 0.9, and the upper temperature limit value is 60°C. The aging rate and the upper temperature limit value are multiplied to determine the temperature alarm threshold corresponding to the target sensor, and the temperature alarm threshold corresponding to the target sensor is 54°C.

[0061] Step 103, establish a connection with the target server corresponding to the server identifier using the login information, and obtain temperature data of the target sensor; compare the temperature data with the temperature alarm threshold, and if the temperature data is greater than the temperature alarm threshold, generate a light control signal for the prompt light, and send the light control signal to the target server, so that the target server controls the light of the prompt light.

[0062] In some embodiments, a connection is established with a target server corresponding to the server identifier using the login information, and the temperature data of the target sensor is obtained. In practice, the execution subject communicates with the server through the IPMI interface protocol. On this basis, the execution subject can obtain the temperature data of the target sensor. In practice, the temperature data corresponding to the target sensor is compared with the temperature alarm threshold to obtain a comparison result. If the temperature data is less than or equal to the temperature alarm threshold, there is no need to generate a light control signal. If the temperature data is greater than the temperature alarm threshold, a light control signal is generated and sent to the target server. The target server issues a light-on command to the prompt light according to the light control signal to control the light of the prompt light to turn on. 60 seconds after the light control signal is issued, the target server issues a light-off command to control the light of the prompt light to turn off.

[0063] In these embodiments, by establishing a connection between the client and the server, obtaining the temperature data of the corresponding component of the sensor, comparing the temperature data with the temperature alarm threshold, generating a light control signal, and alarming through the light, the function of timely alarming when the temperature is too high is finally realized, thereby reducing the damage to the corresponding component and avoiding damage to the component. Specifically, various information of the target server is obtained, and a connection with the target server is established. On this basis, the temperature data of the target sensor is obtained. By obtaining various information of the target sensor, the temperature alarm threshold corresponding to the target sensor is determined. The obtained temperature data is compared with the temperature alarm threshold. When the temperature data is greater than the temperature alarm threshold, the client generates a light control signal and sends it to the server to control the prompt light to alarm, thereby reducing the damage to the corresponding component and avoiding damage to the component.

[0064] In some embodiments, in order to further solve the second technical problem described in the background technology section, that is, "the temperature alarm threshold is generally fixed and cannot be changed dynamically, resulting in inaccurate test results, or exceeding the withstand temperature of some components and damaging the components", in some embodiments of the present invention, the above method further includes the following steps:

[0065] Step 1: determine the cluster architecture diagram corresponding to the server cluster to be tested, the cluster architecture diagram includes multiple nodes and edges connecting different nodes, wherein each node corresponds to a server in the server cluster to be tested, and the edges represent the association relationship between different servers.

[0066] In some embodiments, the execution subject has locally stored a cluster architecture diagram corresponding to each server cluster. On this basis, the cluster architecture diagram corresponding to the server cluster to be tested is determined, and the cluster architecture diagram includes multiple nodes and edges connecting different nodes, wherein each node corresponds to a server in the server cluster to be tested, and the edges represent the association relationship between different servers.

[0067] Step 2: Group multiple nodes to obtain multiple node groups, including a root node group, an intermediate node group, and a child node group; and configure a corresponding importance factor for each node group.

[0068] On this basis, according to the sensor type, the component name corresponding to the target sensor, and the component operation time, the temperature alarm threshold corresponding to the target sensor is determined, which also includes the following sub-steps:

[0069] Sub-step 1: determining a reference temperature alarm threshold corresponding to the target sensor according to the sensor type, the component name corresponding to the target sensor, and the component operation time;

[0070] Sub-step 2, determining the node group to which the target server belongs, and determining the importance coefficient corresponding to the target server according to the importance factor corresponding to the node group to which it belongs;

[0071] Sub-step three: generating a temperature alarm threshold corresponding to the target sensor according to the importance coefficient and the reference temperature alarm threshold.

[0072] In some embodiments, multiple nodes are grouped to obtain multiple node groups, and the multiple node groups include a root node group, an intermediate node group, and a child node group. The root node group is the starting point in the entire cluster architecture. The intermediate node group is located between the root node group and the child node group. The child node group is located below the intermediate node group. In practice, a corresponding importance factor is configured for each node group. The importance factor represents the importance of each node group in the cluster architecture diagram. As an example, the importance factor of the root node group can be 1, the importance factor of the intermediate node group can be 0.5, and the importance factor of the child node group can be 0.1.

[0073] In some embodiments, the reference temperature alarm threshold corresponding to the target sensor is determined according to the sensor type, the component name corresponding to the target sensor, and the component operation time. The temperature alarm threshold determined in the above embodiment is used as the reference temperature alarm threshold. As an example, the sensor type may be a temperature sensor, the name corresponding to the target sensor may be a central processing unit, and the component operation time may be half a year, then the reference temperature alarm threshold corresponding to the target sensor is 54°C.

[0074] In some embodiments, the node group to which the target server belongs is determined, and the importance coefficient corresponding to the target server is determined according to the importance factor corresponding to the node group. As an example, the node group to which the target server belongs may be a child node group.

[0075] Optionally, the importance coefficient corresponding to the target server is determined according to the importance factor corresponding to the node group to which it belongs. The following steps are also included:

[0076] Step 1: If the node group to which the target server belongs is a child node group, the priorities of multiple nodes in the child node group are determined respectively, and the nodes in the child node group are sorted according to the priorities to obtain a child node sequence.

[0077] In some embodiments, if the node group to which the target server belongs is a sub-node group, each sub-node is sorted according to the maximum number of connections of each server corresponding to the multiple sub-nodes, and the priority of the multiple nodes in the sub-node group is determined. As an example, the multiple nodes in the sub-node group may be node A, node B, and node C, the maximum number of connections of the server corresponding to node A may be 8, the maximum number of connections of the server corresponding to node B may be 6, and the maximum number of connections of the server corresponding to node C may be 7, and the priority of the multiple nodes is node A takes precedence over node C takes precedence over node B.

[0078] In practice, the nodes in the child node group are sorted according to the priority, and the ranking of node A may be 1, the ranking of node B may be 3, and the ranking of node C may be 2. The resulting child node sequence is node A, node C, and node B.

[0079] Step 2: determine the ranking of the target server in the sub-node sequence, and determine the importance coefficient corresponding to the target server according to the ranking of the target server in the sub-node sequence and the importance factor of the sub-node group.

[0080] In some embodiments, as an example, the ranking in the subnode sequence is scored, the score of ranking 1 is 10, the score of ranking 2 is 8, and the score of ranking 3 is 6. The target server may be node C, the ranking of node C in the subnode sequence is 2, and the ranking score of node C is 8. In practice, the importance factor of the subnode group may be 0.1, and the ranking score of the target server in the subnode sequence and the importance factor of the subnode group are multiplied to obtain the importance coefficient corresponding to the target server is 0.8.

[0081] In some embodiments, the temperature alarm threshold corresponding to the target sensor is generated according to the importance coefficient and the reference temperature alarm threshold. As an example, the importance coefficient may be 0.8, the reference temperature alarm threshold may be 54°C, and the reference temperature alarm threshold and the importance coefficient are divided to obtain a temperature alarm threshold corresponding to the target sensor of 67.5°C.

[0082] Optionally, some embodiments of the present invention further include the following steps:

[0083] Step 1: Each component of the target server is equipped with a prompt light, and each prompt light is equipped with multiple light modes; the light control signal includes the prompt light number and the target light mode.

[0084] On this basis, sending the light control signal to the target server so that the target server controls the light of the prompt light also includes the following sub-steps:

[0085] Sub-step one: sending a light control signal to a target server, so that the target server controls the light of the prompt light corresponding to the prompt light number, so that the prompt light corresponding to the prompt light number enters a target light mode.

[0086] In some embodiments, each component of the target server is configured with a prompt light, and each prompt light is configured with multiple light modes. The light mode can be a light-on mode and a light-off mode. In practice, each prompt light is numbered to obtain a prompt light number. The control signal in the light control signal includes the prompt light number and the target light mode.

[0087] In some embodiments, as an example, the indicator light number may be 3, and the target light mode may be a light-on mode. In practice, a light control signal is sent to a target server, and the target server controls the light of the indicator light numbered 3 to enter the light-on mode.

[0088] In these embodiments, the temperature alarm threshold corresponding to the sensor is determined by the reference temperature alarm threshold and the importance coefficient corresponding to the server, thereby improving the accuracy of the test results and avoiding component damage. Specifically, the main reason for inaccurate test results and component damage is that the temperature alarm threshold is fixed, but the temperature that each component can withstand is different. Based on this, the present invention determines the reference temperature alarm threshold corresponding to the sensor through the sensor type, the component name corresponding to the sensor, and the component running time, determines the importance coefficient corresponding to the target server through the importance factor corresponding to the node group to which the target server belongs, and determines the temperature alarm threshold corresponding to the sensor based on the reference temperature alarm threshold and the importance coefficient. Thereby, a temperature alarm threshold is set for each component, the accuracy of the test results is improved, and damage to the component due to the temperature alarm threshold exceeding the component's withstand temperature is avoided.

[0089] In some embodiments, in order to further solve the technical problem 3 described in the background technology section, that is, "the heating distance is generally determined by the tester himself. If the distance is too far, the heating efficiency will be low and the components cannot be effectively heated. If the distance is too close, the server will be easily damaged", in some embodiments of the present invention, the above method further includes the following steps:

[0090] Step 1: Obtain a test record set corresponding to the server cluster to be tested within the target time period from the test record database, and filter out test records with temperature alarm conditions from the test record set to form a target test record group. The test records in the target test record group include test time, server ID, component name where a temperature alarm occurs, and heating distance.

[0091] In some embodiments, the execution subject has stored a test record database locally. On this basis, the target time period can be set to 3 months, and the test record set corresponding to the server cluster to be tested within 3 months is obtained, and the test record set includes the test records corresponding to each server cluster to be tested. In practice, the test records with temperature alarm conditions are screened out from the test record set to form a target test record group. Among them, the test records in the target test record group include the test time, server identification, the name of the component where the temperature alarm occurs, and the heating distance. The heating distance can be 1 cm, 2 cm.

[0092] Step 2: According to the target test record group, the number of temperature alarms and the average heating distance corresponding to different components of the server are counted, and different components are sorted in descending order according to the number of temperature alarms to obtain a component sequence.

[0093] In some embodiments, different components of the server may be a disk array card, a central processing unit, and a disk backplane. The number of temperature alarms and the average heating distances corresponding to different components are counted from the target test record group. The average value of the sum of the heating distances corresponding to different components is calculated to obtain the average heating distance. As an example, the number of alarms for the disk array card may be 3 times, the number of alarms for the central processing unit may be 5 times, and the number of alarms for the disk backplane may be 2 times. Different components are sorted in descending order of the number of alarms to obtain a component sequence, which may be a central processing unit, a disk array card, and a disk backplane.

[0094] Step three: Select a target number of components from the component sequence in descending order of the number of temperature alarms to form a key monitoring component group.

[0095] In some embodiments, as an example, the target number can be set to 2, and 2 components are selected from the component sequence in order of the number of temperature alarms from high to low to form a key monitoring component group. The components in the key monitoring component group can be a central processing unit and a disk array card.

[0096] Step 4: For each component in the key monitoring component group, generate operation prompt information corresponding to the component, the operation prompt information includes a recommended heating distance, and the recommended heating distance is generated based on the average heating distance of the component.

[0097] In some embodiments, as an example, the component in the key monitoring component group may be a central processing unit. On this basis, the operation prompt information corresponding to the central processing unit is generated. Among them, the operation prompt information may be a recommended heating distance. The average heating distance obtained in the above embodiment is used as the recommended heating distance.

[0098] In these embodiments, the key monitoring component group and the recommended heating distance are determined through test records, and the heating efficiency is improved, so that the components can be effectively heated. Specifically, the main reason for the low heating efficiency is that the heating distance is random, which leads to uneven heating of the components and poor heating effect. Based on this, the present invention obtains the test records by acquiring the target test record group, and sorts the components according to the alarm times of different components in the test records to obtain a component sequence. A target number of components are selected to form a key monitoring component group, and the sum of the heating distances corresponding to different components is averaged to obtain the average heating distance, that is, the recommended heating distance. Thereby, the heating efficiency is improved, and the components can be effectively heated and damage is avoided.

[0099] The above descriptions are only some preferred embodiments of the present invention and the explanation of the technical principles used. Those skilled in the art should understand that the scope of the invention involved in the present invention is not limited to the technical solutions formed by the specific combination of the above technical features, but also should cover other technical solutions formed by any combination of the above technical features or their equivalent features without departing from the above inventive concept. For example, the above features are replaced with the technical features with similar functions disclosed in the present invention (but not limited to) to form a technical solution.

Claims

1. A server sensor-assisted testing method, applied to a client, characterized in that: include: Obtaining a server identifier, an Internet Protocol address, a sensor identifier of a target sensor, and login information of the target server in the server cluster to be tested, wherein each server in the server cluster to be tested is configured with a plurality of sensors, and the plurality of sensors are used to collect temperature data of different components of the server; By querying the sensor identification of the target sensor in the pre-configured sensor information list, the sensor type corresponding to the sensor identification, the component name corresponding to the target sensor, and the component operation time are obtained; according to the sensor type, the component name corresponding to the target sensor, and the component operation time, the temperature alarm threshold corresponding to the target sensor is determined; Use the login information to establish a connection with the target server corresponding to the server identifier, and obtain temperature data of the target sensor; compare the temperature data with the temperature alarm threshold, and if the temperature data is greater than the temperature alarm threshold, generate a light control signal for the prompt light, and send the light control signal to the target server, so that the target server controls the light of the prompt light.

2. The server sensor-assisted testing method according to claim 1, characterized in that: The step of determining the temperature alarm threshold corresponding to the target sensor according to the sensor type, the component name corresponding to the target sensor, and the component operation time includes: According to the component name corresponding to the target sensor, query the historical temperature alarm threshold corresponding to the component name and the update timestamp corresponding to the historical temperature alarm threshold; Determine whether the historical temperature alarm threshold has expired according to the update timestamp; if the historical temperature alarm threshold has expired, obtain a corresponding component aging curve graph according to the component name, and query the aging rate corresponding to the component operation time from the component aging curve graph, wherein the component aging curve graph represents the corresponding relationship between the component operation time and the aging rate; According to the component name corresponding to the target sensor, determine the target temperature load level corresponding to the component name from a plurality of pre-set temperature load levels, determine the temperature load range corresponding to the target temperature load level, and extract the temperature upper limit value of the temperature load range; The temperature alarm threshold corresponding to the target sensor is determined according to the aging rate corresponding to the running time of the component and the upper temperature limit.

3. The server sensor-assisted testing method according to claim 2, characterized in that: Before searching the pre-configured sensor information list through the sensor identifier of the target sensor to obtain the sensor type corresponding to the sensor identifier, the component name corresponding to the target sensor, and the component running time, the method further includes: Determine a cluster architecture diagram corresponding to the server cluster to be tested, wherein the cluster architecture diagram includes a plurality of nodes and edges connecting different nodes, wherein each node corresponds to a server in the server cluster to be tested, and the edges represent associations between different servers; Grouping the multiple nodes to obtain multiple node groups, the multiple node groups including a root node group, an intermediate node group and a child node group; respectively configuring a corresponding importance factor for each node group; and The step of determining the temperature alarm threshold corresponding to the target sensor according to the sensor type, the component name corresponding to the target sensor, and the component operation time includes: Determine a reference temperature alarm threshold corresponding to the target sensor according to the sensor type, the component name corresponding to the target sensor, and the component operation time; Determine the node group to which the target server belongs, and determine the importance coefficient corresponding to the target server according to the importance factor corresponding to the node group to which it belongs; A temperature alarm threshold corresponding to the target sensor is generated according to the importance coefficient and the reference temperature alarm threshold.

4. The server sensor-assisted testing method according to claim 3, characterized in that: Determining the importance coefficient corresponding to the target server according to the importance factor corresponding to the node group to which it belongs includes: If the node group to which the target server belongs is a child node group, priorities of multiple nodes in the child node group are determined respectively, and each node in the child node group is sorted according to the priority to obtain a child node sequence; The ranking of the target server in the sub-node sequence is determined, and the importance coefficient corresponding to the target server is determined according to the ranking of the target server in the sub-node sequence and the importance factor of the sub-node group.

5. The server sensor-assisted testing method according to claim 4, characterized in that: Each of the different components of the target server is configured with a prompt light, and each prompt light is configured with multiple light modes; the light control signal includes a prompt light number and a target light mode; as well as The step of sending the light control signal to the target server so that the target server controls the light of the prompt light includes: The light control signal is sent to the target server, so that the target server controls the light of the prompt light corresponding to the prompt light number, so that the prompt light corresponding to the prompt light number enters a target light mode.

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