Diagnosis method, diagnosis circuit, equipment and medium for digital-to-analog conversion circuit

Abstract

The invention relates to the technical field of safety circuits, and provides a diagnosis method and circuit of a digital-to-analog conversion circuit, equipment and a medium. According to the method, two independent AI acquisition modules are arranged to respectively acquire analog quantity signals acquired at the same target measurement point, the acquired analog quantity signals are converted into digital signals through a built-in ADC circuit, and then the two paths of digital signals are transmitted to a safety logic module to be compared and judged; when the difference value of the two paths of digital signals is smaller than the preset safety threshold value, it is determined that the ADC circuit passes the diagnosis, and when the difference value of the two paths of digital signals is larger than or equal to the preset safety threshold value, it is determined that the ADC circuit does not pass the diagnosis, and therefore it is not needed to independently configure a DAC circuit for the ADC circuit in each AI collection module; the implementation difficulty and the implementation cost of the diagnosis circuit are reduced, the development period of the diagnosis circuit is shortened, and the diagnosis efficiency is improved.

Description

Technical Field

[0001] The present application relates to the field of safety circuit technology, and in particular to a diagnostic method, diagnostic circuit, device and medium for a digital-to-analog conversion circuit. Background Art

[0002] In functional safety circuit design, in order to achieve the safety performance level of Performance Level d Category 3 Pld Cat.3, it is necessary to strictly follow the specified architecture of the standard for circuit design. At the same time, in order to achieve the functional safety design level requirements of Pld Cat.3, it is often necessary to have certain requirements for the diagnostic coverage in the circuit design, which requires providing diagnostic circuits for the functional modules in the circuit.

[0003] Taking the diagnosis of the analog input (AI) acquisition module for analog quantity acquisition as an example, the related art usually adopts a DAC circuit as a reference to implement fault diagnosis on the ADC circuit. This method is more complicated to implement, and multiple DACs are required as diagnostic reference signals in multi-channel acquisition, which is not only costly but also has a long development cycle. Summary of the invention

[0004] In view of this, the embodiments of the present application provide a diagnostic method, a diagnostic circuit, a device and a medium for a digital-to-analog conversion circuit to solve the problems of high cost and low efficiency in the prior art when diagnosing an ADC circuit in a safety function circuit.

[0005] According to a first aspect of an embodiment of the present application, a diagnostic method for an ADC circuit is provided. The ADC circuit is located in an analog AI acquisition module and is used to receive an analog signal acquired by a sensor. The method includes:

[0006] The first AI acquisition module receives a first analog signal of a target measurement point acquired by a first sensor, converts the first analog signal into a first digital signal, and sends the first digital signal to the safety logic module;

[0007] The second AI acquisition module receives a second analog signal of the target measurement point acquired by the second sensor, converts the second analog signal into a second digital signal, and sends the second digital signal to the safety logic module;

[0008] comparing the first digital signal and the second digital signal using a safety logic module;

[0009] In response to determining that the difference value between the first digital signal and the second digital signal is less than a preset safety threshold, it is determined that the ADC circuit passes the diagnosis; otherwise, it is determined that the ADC circuit fails the diagnosis.

[0010] In one implementation, the first AI acquisition module and the second AI acquisition module are logic modules in a safety function circuit, and the safety function circuit can achieve the safety performance level requirement of Pld Cat.3.

[0011] In one implementation, the first AI acquisition module and the second AI acquisition module have the same circuit configuration.

[0012] In one embodiment, the method further comprises:

[0013] In response to determining that the ADC circuit passes the diagnosis, outputting the first digital signal or the second digital signal to a processing unit of the safety function circuit;

[0014] In response to determining that the ADC circuit fails the diagnosis, the safety logic module reports fault information to the processing unit of the safety function circuit so that the processing unit determines a fault handling method based on the fault information.

[0015] In one implementation, the fault handling method includes:

[0016] Shield the signal at the target measurement point; or

[0017] Disconnect the first AI acquisition module and the second AI acquisition module from subsequent circuits.

[0018] In one embodiment, the safety logic module includes a dual comparison algorithm unit, a diagnosis core unit, and a judgment result output unit;

[0019] The safety logic module implements the following method to diagnose the ADC circuit:

[0020] The first digital signal output by the first AI acquisition module and the second digital signal output by the second AI acquisition module are received by the dual comparison algorithm unit, and the difference value between the first digital signal and the second digital signal is calculated;

[0021] The difference value is compared with a preset safety threshold value by the diagnostic core unit to obtain a comparison result, wherein the comparison result includes that the difference value is less than the preset safety threshold value, and the difference value is greater than or equal to the safety threshold value;

[0022] The comparison result is output to the processing module in the safety function circuit through the judgment result output unit.

[0023] In one implementation, when at least one of the following conditions exists in the first AI acquisition module or the second AI acquisition module, the difference value is greater than or equal to the safety threshold:

[0024] A channel of the first AI acquisition module or the second AI acquisition module fails;

[0025] The ADC circuit of the first AI acquisition module or the second AI acquisition module fails;

[0026] The power supply or communication unit of the first AI acquisition module or the second AI acquisition module fails.

[0027] According to a second aspect of an embodiment of the present application, a diagnostic circuit for an ADC circuit is provided, the diagnostic circuit comprising:

[0028] A first analog AI acquisition module, a second AI acquisition module, a safety logic module, a first sensor, and a second sensor;

[0029] Wherein, the first AI acquisition module and the second AI acquisition module each include an ADC circuit;

[0030] The first AI acquisition module receives a first analog signal of a target measurement point acquired by a first sensor, converts the first analog signal into a first digital signal, and sends the first digital signal to the safety logic module;

[0031] The second AI acquisition module receives a second analog signal of the target measurement point acquired by the second sensor, converts the second analog signal into a second digital signal, and sends the second digital signal to the safety logic module;

[0032] The safety logic module compares the first digital signal and the second digital signal;

[0033] In response to determining that the difference value between the first digital signal and the second digital signal is less than a preset safety threshold, it is determined that the ADC circuit passes the diagnosis; otherwise, it is determined that the ADC circuit fails the diagnosis.

[0034] According to a third aspect of an embodiment of the present application, an electronic device is provided, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of the above method when executing the computer program.

[0035] According to a fourth aspect of an embodiment of the present application, a computer-readable storage medium is provided, which stores a computer program, and when the computer program is executed by a processor, the steps of the above method are implemented.

[0036] Compared with the prior art, the embodiments of the present application have the following beneficial effects: the embodiments of the present application set up two independent AI acquisition modules to respectively obtain analog signals collected from the same target measurement point, convert the collected analog signals into digital signals through a built-in ADC circuit, and then transmit the two digital signals to a safety logic module for comparison and judgment. When the difference between the two digital signals is less than a preset safety threshold, it is determined that the ADC circuit has passed the diagnosis; and when the difference between the two digital signals is greater than or equal to the preset safety threshold, it is determined that the ADC circuit has failed the diagnosis. Therefore, there is no need to separately configure a DAC circuit for the ADC circuit in each AI acquisition module, thereby reducing the difficulty and cost of implementing the diagnostic circuit, while reducing the development cycle of the diagnostic circuit and improving the diagnostic efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0037] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0038] Figure 1 It is a scenario diagram of an application scenario of an embodiment of the present application.

[0039] Figure 2 It is a schematic diagram of the circuit architecture specified by Pld Cat.3.

[0040] Figure 3 It is a flowchart of a diagnostic method for an ADC circuit provided in an embodiment of the present application.

[0041] Figure 4 It is a schematic diagram of a specific implementation of the diagnosis method of the ADC circuit provided in an embodiment of the present application.

[0042] Figure 5 It is a flowchart of a method for diagnosing an ADC circuit through a safety logic module provided in an embodiment of the present application.

[0043] Figure 6 It is a flow chart of another ADC circuit diagnosis method provided in an embodiment of the present application.

[0044] Figure 7 It is a schematic diagram of a diagnostic circuit of a digital-to-analog conversion ADC circuit provided in an embodiment of the present application.

[0045] Figure 8 It is a schematic diagram of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0046] In the following description, specific details such as specific system structures, technologies, etc. are provided for the purpose of illustration rather than limitation, so as to provide a thorough understanding of the embodiments of the present application. However, it should be clear to those skilled in the art that the present application may also be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to prevent unnecessary details from obstructing the description of the present application.

[0047] A diagnostic method and circuit for an ADC circuit according to an embodiment of the present application will be described in detail below with reference to the accompanying drawings.

[0048] Figure 1 1 is a schematic diagram of an application scenario of an embodiment of the present application. The application scenario may include an input device 1, a logic module 2 and an output device 3.

[0049] The input device 1 may be a device that provides input signals to the logic module 2, such as a sensor, etc. The logic module 2 may be a logic module in a safety function circuit, such as an AI acquisition module, etc. The output device 3 may receive an output signal of the logic module 2 and output it to a processing unit such as a microcontroller unit (MCU).

[0050] It should be noted that the specific types, quantities and combinations of the input device 1, the logic module 2 and the output device 3 can be adjusted according to the actual needs of the application scenario, and the embodiments of the present application do not limit this.

[0051] As mentioned above, in functional safety circuit design, in order to achieve the safety performance level of Pld Cat.3, the circuit design needs to be strictly carried out in accordance with the specified architecture of the standard. Figure 2 This is a schematic diagram of the circuit architecture specified by Pld Cat.3. Figure 2 As shown, the architecture includes logic modules L1 and L2, input devices I1 and I2, and output devices O1 and O2. The input device I1 and the logic module L1 and the input device I2 and the logic module L2 can be connected by i m The logic module L1 and the output device O1 and the logic module L2 and the output device O2 can also be connected by i mOptionally, a cross-monitoring method c may be configured between the logic module L1 and the logic module L2, for monitoring the function of the logic module L2 by using the logic module L1, or for monitoring the function of the logic module L1 by using the logic module L2. On the other hand, a monitoring method m may also be configured between the logic module L1 and the output device O1, and between the logic module L2 and the output device O2, for monitoring the performance of the logic module L1 by the output device O1, and for monitoring the performance of the logic module L2 by the output device O2.

[0052] At the same time, in order to meet the functional safety design level requirements of Pld Cat.3, it is often necessary to have certain requirements for the diagnostic coverage in the circuit design, which requires providing diagnostic circuits for the functional modules in the circuit. Taking the diagnosis of the ADC circuit in the AI ​​acquisition module for collecting analog quantities as an example, the relevant technology usually adopts a DAC circuit as a reference to implement fault diagnosis on the ADC circuit. In this way, it is necessary to integrate an additional DAC circuit in the circuit board where the AI ​​acquisition module is located. In some cases, it is necessary to modify the circuit structure inside the integrated circuit chip, and then it is necessary to redesign, produce, and package the chip of the AI ​​acquisition module. The implementation is very complex and the re-production and packaging cycle is long, and the cost is high. Furthermore, after adding a DAC circuit to the circuit board, it may be necessary to adaptively modify and configure the software associated with the circuit, which will also increase the complexity of implementation. Furthermore, in multi-channel acquisition, multiple DAC circuits are required as diagnostic reference signals, so multiple DAC circuits need to be integrated, which will greatly extend the development cycle and increase the implementation cost.

[0053] In view of this, an embodiment of the present application provides a diagnostic method for an ADC circuit, which provides two independent AI acquisition modules to respectively obtain analog signals collected from the same target measurement point, convert the collected analog signals into digital signals through a built-in ADC circuit, and then transmit the two digital signals to a safety logic module for comparison and judgment. When the difference between the two digital signals is less than a preset safety threshold, it is determined that the ADC circuit has passed the diagnosis; and when the difference between the two digital signals is greater than or equal to the preset safety threshold, it is determined that the ADC circuit has not passed the diagnosis. Therefore, there is no need to separately configure a DAC circuit for the ADC circuit in each AI acquisition module, thereby reducing the implementation difficulty and cost of the diagnostic circuit, while reducing the development cycle of the diagnostic circuit and improving the diagnostic efficiency.

[0054] Figure 3 The ADC circuit is located in the analog AI acquisition module and is used to receive analog signals collected by the sensor.

[0055] like Figure 3 As shown, the method comprises the following steps:

[0056] In step S301, a first analog signal of a target measurement point acquired by a first sensor is received by a first AI acquisition module, and the first analog signal is converted into a first digital signal and sent to a safety logic module.

[0057] In step S302, a second analog signal of a target measurement point acquired by a second sensor is received by a second AI acquisition module, and the second analog signal is converted into a second digital signal and sent to a safety logic module.

[0058] In step S303 , the first digital signal and the second digital signal are compared using a safety logic module.

[0059] In step S304 , in response to determining that the difference value between the first digital signal and the second digital signal is less than a preset safety threshold, it is determined that the ADC circuit passes the diagnosis; otherwise, it is determined that the ADC circuit fails the diagnosis.

[0060] In an embodiment of the present application, when diagnosing the ADC circuit in the AI ​​acquisition module, the first analog signal of the target measurement point collected by the first sensor can be first received through the first AI acquisition module, and the first analog signal can be converted into a first digital signal and sent to the safety logic module. On the other hand, the second analog signal of the target measurement point collected by the second sensor can also be received through the second AI acquisition module, and the second analog signal can be converted into a second digital signal and sent to the safety logic module. It can be understood that the first sensor and the second sensor collect the analog signal of the same measurement point. In theory, the analog signals collected by the two sensors should be basically consistent, even if there is an error within the measurement error range of the sensor. The first AI acquisition module and the second AI acquisition module respectively receive an analog signal input by a sensor, and use their built-in ADC circuits to convert the received analog signal into a digital signal.

[0061] In the embodiment of the present application, a safety logic module can be used to compare the first digital signal and the second digital signal. The safety logic module is connected to the first AI acquisition module and the second AI acquisition module respectively, receives the first digital signal output by the first AI acquisition module and the second digital signal output by the second AI acquisition module, and compares the first digital signal and the second digital signal to obtain the difference value between the first digital signal and the second digital signal.

[0062] In the embodiment of the present application, the safety logic module can diagnose the ADC circuit based on the difference value of the first digital signal and the second digital signal obtained by comparison. If the difference value of the first digital signal and the second digital signal is less than a preset safety threshold, it is determined that the ADC circuit has passed the diagnosis, otherwise it is determined that the ADC circuit has not passed the diagnosis.

[0063] That is to say, the first sensor and the second sensor respectively output analog signals obtained by measuring the same measurement point. The analog signal collected by the first sensor and the analog signal collected by the second sensor are sent to the input end of the first AI acquisition module and the second AI acquisition module through an external connection method. The two AI acquisition modules quantize the received analog signals to obtain their own digital signals, and report the digital signals to the safety logic module through the connection method with the safety logic module.

[0064] The safety logic algorithm performs a double comparison on the two received digital signals, calculates the difference value of the two digital signals, and compares the difference value with a preset safety threshold, and then determines the diagnosis result based on the comparison result.

[0065] According to the technical solution provided in the embodiment of the present application, two independent AI acquisition modules are set up to respectively obtain analog signals collected from the same target measurement point, and the collected analog signals are converted into digital signals through the built-in ADC circuit. Then, the two digital signals are transmitted to the safety logic module for comparison and judgment. When the difference value of the two digital signals is less than the preset safety threshold, it is determined that the ADC circuit has passed the diagnosis, and when the difference value of the two digital signals is greater than or equal to the preset safety threshold, it is determined that the ADC circuit has not passed the diagnosis. Therefore, there is no need to separately configure a DAC circuit for the ADC circuit in each AI acquisition module, which reduces the implementation difficulty and cost of the diagnostic circuit, while reducing the development cycle of the diagnostic circuit and improving the diagnostic efficiency.

[0066] Figure 4 FIG. 1 is a schematic diagram of a specific implementation of the ADC circuit diagnosis method provided in the embodiment of the present application. Figure 4 As shown, when collecting pressure information of the same measuring point A, two identical pressure sensors (i.e., pressure sensor 1 and pressure sensor 2) can be set at point A. The pressure sensors 1 and 2 convert the pressure information into analog quantities for reporting, and the analog quantities can be, for example, 4-20 milliampere (mA) current signals. Since the pressure at point A is the same, the analog quantities reported by the two pressure sensors should also be the same.

[0067] Pressure sensor 1 sends the collected analog quantity to the first AI acquisition module, and pressure sensor 2 sends the collected analog quantity to the second AI acquisition module. Both AI acquisition modules have built-in ADC circuits for quantizing the received analog quantity into digital signals. For the two AI acquisition modules, the two identical input analog quantities (i.e., current signals) will be quantized into digital signals by the channel ADC circuit, and then processed by the internal MCU of the AI ​​acquisition module and transmitted to the safety logic module through the peripheral interface. The safety logic module judges and compares the results of the two channels. If the error exceeds the set value range, it is judged that there is a fault in the acquisition point A.

[0068] Furthermore, the safety logic module includes a dual comparison algorithm unit, a diagnosis core unit and a judgment result output unit.

[0069] Figure 5 FIG. 1 is a flow chart of a method for diagnosing an ADC circuit through a safety logic module provided in an embodiment of the present application. Figure 5 As shown, the method comprises the following steps:

[0070] In step S501, a first digital signal output by the first AI acquisition module and a second digital signal output by the second AI acquisition module are received by a dual comparison algorithm unit, and a difference value between the first digital signal and the second digital signal is calculated.

[0071] In step S502, the difference value is compared with a preset safety threshold by the diagnosis core unit to obtain a comparison result.

[0072] The comparison result includes that the difference value is less than a preset safety threshold, and the difference value is greater than or equal to the safety threshold.

[0073] In step S503 , the comparison result is output to a processing module in the safety function circuit through a judgment result output unit.

[0074] In an embodiment of the present application, the safety logic module can first receive the first digital signal output by the first AI acquisition module and the second digital signal output by the second AI acquisition module through a dual comparison algorithm unit, and calculate the difference value between the first digital signal and the second digital signal. Then, the difference value is compared with a preset safety threshold through a diagnostic core unit to obtain a comparison result, and the comparison result includes that the difference value is less than the preset safety threshold, and the difference value is greater than or equal to the safety threshold. Finally, the comparison result is output to the processing module in the safety function circuit through a judgment result output unit.

[0075] In the embodiment of the present application, the preset safety threshold can be set according to actual needs. In one example, if the acquisition accuracy of the AI ​​acquisition module is between 0.1% and 0.3%, the preset safety threshold can be set to 1%, that is, the difference between the first digital signal and the second digital signal is the numerical error between the two, and when the numerical error is less than 1%, the ADC circuit in the first AI acquisition module and the second AI acquisition module can be determined to pass the diagnosis.

[0076] In the embodiment of the present application, the first AI acquisition module and the second AI acquisition module are logic modules in the safety function circuit, and the safety function circuit can achieve the safety performance level requirements of Pld Cat.3. In other words, the technical solution provided in the embodiment of the present application is a method for diagnosing the ADC circuit in the AI ​​acquisition module under the safety performance required by the Pld Cat.3 standard. This method can flexibly and efficiently realize the diagnosis of the ADC circuit, and the diagnostic coverage can meet the requirements of the Pld Cat.3 standard.

[0077] In the embodiment of the present application, the first AI acquisition module and the second AI acquisition module have the same circuit configuration. It is understandable that in order to ensure the consistency of the two acquisition signals, the first AI acquisition module and the second AI acquisition module need to be completely identical.

[0078] Figure 6 It is a flow chart of another ADC circuit diagnosis method provided in an embodiment of the present application.

[0079] in, Figure 6 Steps S601 to S604 in the embodiment shown are Figure 3 Steps S301 to S304 in the illustrated embodiment are substantially the same and will not be described in detail herein. Figure 6 As shown, the method also includes the following steps:

[0080] In step S605 , in response to determining that the ADC circuit passes the diagnosis, the first digital signal or the second digital signal is output to the processing unit of the safety function circuit.

[0081] In step S606 , in response to determining that the ADC circuit fails the diagnosis, the safety logic module reports fault information to the processing unit of the safety function circuit, so that the processing unit determines a fault handling method based on the fault information.

[0082] In an embodiment of the present application, the safety function circuit may further include a processing unit, such as an MCU. If the safety logic module determines that the ADC circuit passes the diagnosis, the first digital signal or the second digital signal may be output to the processing unit of the safety function circuit for subsequent use. On the other hand, if the safety logic module determines that the ADC circuit fails the diagnosis, the safety logic module may report the fault information to the processing unit of the safety function circuit so that the processing unit determines the fault handling method based on the fault information.

[0083] Among them, the fault handling method may be to shield the signal of the target measurement point; or disconnect the connection between the first AI acquisition module and the second AI acquisition module and the subsequent circuit. That is to say, when the processing unit receives the fault information, it can determine that the information collected from the target detection point has a fault, so the current template detection point information is unreliable information, and thus the signal of the target measurement point can be directly shielded, or the connection between the first AI acquisition module and the second AI acquisition module and the subsequent circuit can be disconnected, so that the information collected from the target detection point cannot be transmitted to the subsequent processing module.

[0084] In an embodiment of the present application, when at least one of the following situations exists in the first AI acquisition module or the second AI acquisition module, the difference value is greater than or equal to the safety threshold: a channel of the first AI acquisition module or the second AI acquisition module fails; an ADC circuit of the first AI acquisition module or the second AI acquisition module fails; a power supply or communication unit of the first AI acquisition module or the second AI acquisition module fails.

[0085] That is to say, the double comparison algorithm can be executed by the safety logic module to diagnose the faults from the channels in the first and second AI acquisition modules. Specifically, when the two AI acquisition modules are collecting, if the channel of one of the modules is partially faulty, such as the channel disconnection or component failure, resulting in the acquisition value of the channel being 0 or the acquisition value being deviated, then the double comparison acquisition point value between it and the other channel has an error of more than 1% in the acquisition safety accuracy, then the channel fault of the AI ​​acquisition module is diagnosed in the safety logic module, and the safety logic module outputs the judgment result.

[0086] On the other hand, the double comparison algorithm can also be executed by the safety logic module to diagnose the faults from the internal conversion of the ADC circuit in the first and second AI acquisition modules. Specifically, when the two AI acquisition modules are collecting, if the ADC circuit of one of the modules fails when converting the analog quantity, such as the internal bit position stuck failure during the ADC circuit conversion, the internal reference source failure of the ADC circuit, etc., resulting in a certain deviation in the signal output by the ADC circuit. At this time, the other acquisition signal from the dual-channel comparison reports the acquisition value normally, then the judgment error in the double comparison algorithm in the safety logic module will exceed 1%, so it is judged that this channel of the module is faulty, and the safety logic module outputs the judgment result.

[0087] On the other hand, the safety logic module can also execute the dual comparison algorithm to diagnose the faults of other parts in the first and second AI acquisition modules. Similar to the above description, in the dual comparison channel, if other faults in one of the modules cause the acquisition value of the module to be abnormal, such as power failure, communication failure, etc. of the module, which causes the module to be unable to collect signals normally, the fault can also be diagnosed by dual comparison.

[0088] In this way, channel faults on the link from the target measurement point to the ADC output digital signal, ADC faults and other faults can be diagnosed, thereby improving the accuracy of ADC circuit diagnosis.

[0089] All the above optional technical solutions can be arbitrarily combined to form optional embodiments of the present application, which will not be described one by one here.

[0090] The following is an embodiment of the device of the present application, which can be used to execute the embodiment of the method of the present application. For details not disclosed in the embodiment of the device of the present application, please refer to the embodiment of the method of the present application.

[0091] Figure 7 Schematic diagram of a diagnostic circuit of a digital-to-analog conversion ADC circuit provided in an embodiment of the present application. Figure 7 As shown, the diagnostic circuit of the digital-to-analog conversion ADC circuit includes:

[0092] The first analog AI acquisition module, the second AI acquisition module, the safety logic module, the first sensor and the second sensor. The first AI acquisition module and the second AI acquisition module each include an ADC circuit; the first AI acquisition module receives the first analog signal of the target measurement point acquired by the first sensor, converts the first analog signal into a first digital signal and sends it to the safety logic module; the second AI acquisition module receives the second analog signal of the target measurement point acquired by the second sensor, converts the second analog signal into a second digital signal and sends it to the safety logic module; the safety logic module compares the first digital signal and the second digital signal; in response to determining that the difference between the first digital signal and the second digital signal is less than a preset safety threshold, it is determined that the ADC circuit passes the diagnosis, otherwise it is determined that the ADC circuit fails the diagnosis.

[0093] According to the technical solution provided in the embodiment of the present application, two independent AI acquisition modules are set up to respectively obtain analog signals collected from the same target measurement point, and the collected analog signals are converted into digital signals through the built-in ADC circuit. Then, the two digital signals are transmitted to the safety logic module for comparison and judgment. When the difference value of the two digital signals is less than the preset safety threshold, it is determined that the ADC circuit has passed the diagnosis, and when the difference value of the two digital signals is greater than or equal to the preset safety threshold, it is determined that the ADC circuit has not passed the diagnosis. Therefore, there is no need to separately configure a DAC circuit for the ADC circuit in each AI acquisition module, which reduces the implementation difficulty and cost of the diagnostic circuit, while reducing the development cycle of the diagnostic circuit and improving the diagnostic efficiency.

[0094] In the embodiment of the present application, the first AI acquisition module and the second AI acquisition module are logic modules in the safety function circuit, and the safety function circuit can achieve the safety performance level requirements of performance level d category 3Pld Cat.3.

[0095] In the embodiment of the present application, the first AI acquisition module and the second AI acquisition module have the same circuit configuration.

[0096] In an embodiment of the present application, it also includes: in response to determining that the ADC circuit passes the diagnosis, outputting the first digital signal or the second digital signal to the processing unit of the safety function circuit; in response to determining that the ADC circuit fails the diagnosis, the safety logic module reports fault information to the processing unit of the safety function circuit, so that the processing unit determines a fault handling method based on the fault information.

[0097] In an embodiment of the present application, the fault handling method includes: shielding the signal of the target measurement point; or disconnecting the connection between the first AI acquisition module and the second AI acquisition module and the subsequent circuit.

[0098] In an embodiment of the present application, the safety logic module includes a dual comparison algorithm unit, a diagnostic core unit and a judgment result output unit; the safety logic module implements diagnosis of the ADC circuit in the following manner: receiving a first digital signal output by a first AI acquisition module and a second digital signal output by a second AI acquisition module through a dual comparison algorithm unit, and calculating a difference value between the first digital signal and the second digital signal; comparing the difference value with a preset safety threshold through the diagnostic core unit to obtain a comparison result, the comparison result including a difference value less than a preset safety threshold, and a difference value greater than or equal to the safety threshold; outputting the comparison result to a processing module in the safety function circuit through the judgment result output unit.

[0099] In an embodiment of the present application, when at least one of the following situations exists in the first AI acquisition module or the second AI acquisition module, the difference value is greater than or equal to the safety threshold: a channel of the first AI acquisition module or the second AI acquisition module fails; an ADC circuit of the first AI acquisition module or the second AI acquisition module fails; a power supply or communication unit of the first AI acquisition module or the second AI acquisition module fails.

[0100] It should be understood that the size of the serial numbers of the steps in the above embodiments does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present application.

[0101] Figure 8 Schematic diagram of an electronic device provided in an embodiment of the present application. Figure 8 As shown, the electronic device 8 of this embodiment includes: a processor 801, a memory 802, and a computer program 803 stored in the memory 802 and executable on the processor 801. When the processor 801 executes the computer program 803, the steps in the above-mentioned method embodiments are implemented. Alternatively, when the processor 801 executes the computer program 803, the functions of the modules / units in the above-mentioned device embodiments are implemented.

[0102] The electronic device 8 may be a desktop computer, a notebook, a PDA, a cloud server, or other electronic device. The electronic device 8 may include, but is not limited to, a processor 801 and a memory 802. Those skilled in the art will appreciate that Figure 8 The electronic device 8 is merely an example and does not limit the electronic device 8 . The electronic device 8 may include more or fewer components than those shown in the figure, or different components.

[0103] The processor 801 may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc.

[0104] The memory 802 may be an internal storage unit of the electronic device 8, for example, a hard disk or memory of the electronic device 8. The memory 802 may also be an external storage device of the electronic device 8, for example, a plug-in hard disk, a smart media card (SMC), a secure digital (SD) card, a flash card, etc. equipped on the electronic device 8. The memory 802 may also include both an internal storage unit of the electronic device 8 and an external storage device. The memory 802 is used to store computer programs and other programs and data required by the electronic device.

[0105] Those skilled in the art can clearly understand that for the convenience and simplicity of description, only the division of the above-mentioned functional units and modules is used as an example. In actual applications, the above-mentioned functions can be assigned to different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above. The functional units and modules in the embodiments can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The above-mentioned integrated unit can be implemented in the form of hardware or in the form of software functional units.

[0106] If the integrated module / unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the present application implements all or part of the processes in the above-mentioned embodiment method, and can also be completed by instructing the relevant hardware through a computer program. The computer program can be stored in a computer-readable storage medium, and the computer program can implement the steps of the above-mentioned various method embodiments when executed by the processor. The computer program may include computer program code, which may be in source code form, object code form, executable file or some intermediate form. Computer-readable media may include: any entity or device capable of carrying computer program code, recording medium, U disk, mobile hard disk, disk, optical disk, computer memory, read-only memory (ROM), random access memory (RAM), electric carrier signal, telecommunication signal and software distribution medium, etc.

[0107] The above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. These modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present application, and should all be included in the protection scope of the present application.

Claims

1. A diagnostic method for a digital-to-analog conversion (ADC) circuit, characterized in that: The ADC circuit is located in the analog AI acquisition module and is used to receive analog signals collected by the sensor. The method includes: The first AI acquisition module receives a first analog signal of a target measurement point acquired by a first sensor, converts the first analog signal into a first digital signal, and sends the first digital signal to the safety logic module; The second AI acquisition module receives a second analog signal of the target measurement point acquired by the second sensor, converts the second analog signal into a second digital signal, and sends the second digital signal to the safety logic module; comparing the first digital signal and the second digital signal using the safety logic module; In response to determining that the difference value between the first digital signal and the second digital signal is less than a preset safety threshold, it is determined that the ADC circuit passes the diagnosis; otherwise, it is determined that the ADC circuit fails the diagnosis.

2. The method according to claim 1, characterized in that The first AI acquisition module and the second AI acquisition module are logic modules in a safety function circuit, and the safety function circuit can achieve the safety performance level requirements of performance level d category 3PldCat.

3.

3. The method according to claim 1 or 2, characterized in that: The first AI acquisition module and the second AI acquisition module have the same circuit configuration.

4. The method according to claim 2, characterized in that: The method further comprises: In response to determining that the ADC circuit passes the diagnosis, outputting the first digital signal or the second digital signal to a processing unit of the safety function circuit; In response to determining that the ADC circuit fails the diagnosis, the safety logic module reports fault information to the processing unit of the safety function circuit, so that the processing unit determines a fault handling method based on the fault information.

5. The method according to claim 4, characterized in that The fault handling method comprises: shielding the signal of the target measurement point; or Disconnect the first AI acquisition module and the second AI acquisition module from subsequent circuits.

6. The method according to claim 2, characterized in that The safety logic module includes a dual comparison algorithm unit, a diagnosis core unit and a judgment result output unit; The safety logic module implements the diagnosis of the ADC circuit in the following manner: The first digital signal output by the first AI acquisition module and the second digital signal output by the second AI acquisition module are received by the dual comparison algorithm unit, and the difference value between the first digital signal and the second digital signal is calculated; The diagnostic core unit compares the difference value with a preset safety threshold to obtain a comparison result, wherein the comparison result includes that the difference value is less than the preset safety threshold and that the difference value is greater than or equal to the safety threshold; The comparison result is output to a processing module in the safety function circuit through a judgment result output unit.

7. The method according to claim 6, characterized in that When at least one of the following conditions exists in the first AI acquisition module or the second AI acquisition module, the difference value is greater than or equal to the safety threshold: A channel of the first AI acquisition module or the second AI acquisition module fails; An ADC circuit of the first AI acquisition module or the second AI acquisition module fails; The power supply or communication unit of the first AI acquisition module or the second AI acquisition module fails.

8. A diagnostic circuit for a digital-to-analog conversion (ADC) circuit, characterized in that: The diagnostic circuit comprises: A first analog AI acquisition module, a second AI acquisition module, a safety logic module, a first sensor, and a second sensor; Wherein, the first AI acquisition module and the second AI acquisition module each include an ADC circuit; The first AI acquisition module receives a first analog signal of a target measurement point acquired by the first sensor, converts the first analog signal into a first digital signal, and sends the first digital signal to the safety logic module; The second AI acquisition module receives a second analog signal of the target measurement point acquired by the second sensor, converts the second analog signal into a second digital signal, and sends the second digital signal to the safety logic module; The security logic module compares the first digital signal and the second digital signal; In response to determining that the difference value between the first digital signal and the second digital signal is less than a preset safety threshold, it is determined that the ADC circuit passes the diagnosis; otherwise, it is determined that the ADC circuit fails the diagnosis.

9. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 7 are implemented.

10. A computer-readable storage medium storing a computer program, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 7 are implemented.

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