EMC (Electro Magnetic Compatibility) test method and test system for electronic parts

Abstract

The invention relates to the field of equipment testing, and discloses an EMC testing method and system for an electronic product, and the method comprises the steps: obtaining product information, obtaining an EMC testing strategy of the product in a cloud data server, and enabling the EMC testing strategy to comprise an EMI testing strategy and an EMS testing strategy; the method comprises the following steps of: obtaining products to be tested from produced products according to a set proportion, dividing the products to be tested into an EMI test group and an electromagnetic sensitivity test group, carrying out electromagnetic emission test on the electromagnetic emission test group, carrying out electromagnetic sensitivity test on the electromagnetic sensitivity test group, and according to an electromagnetic sensitivity qualification rate and an electromagnetic emission test qualification rate, carrying out electromagnetic sensitivity test on the products to be tested. And obtaining the qualified rate of the to-be-tested product according to the product classification and the qualified rate, obtaining the EMC data of the to-be-tested product, and completing the EMC test of the electronic product. The EMC performance qualification rate of the product is obtained by comprehensively evaluating the results of the electromagnetic emission test and the electromagnetic sensitivity test, and powerful support is provided for quality control of the product.

Description

Technical Field

[0001] The invention relates to the field of equipment testing, and in particular to an EMC testing method and a testing system for electronic products. Background Art

[0002] In today's highly information-based development process, electronic products, equipment and technologies are increasingly being used in various fields of society. These products and technologies play a vital role in modern manufacturing, helping to improve production efficiency, product quality and production flexibility while reducing costs and energy consumption. With the development of Internet of Things technology, electronic products are moving towards intelligence, interconnection and visualization. However, with the increasing complexity and integration of electronic product functions, their electromagnetic compatibility (EMC) issues are becoming increasingly prominent. EMC refers to the ability of electronic equipment to work normally in an electromagnetic environment without causing unacceptable electromagnetic interference to other devices in its environment. Good EMC performance is the key to ensuring the stable and reliable operation of electronic products, and is also an important factor in whether products can successfully enter the market and gain user recognition.

[0003] Traditional EMC testing methods often rely on manual operations, and the testing process is cumbersome and inefficient, making it difficult to meet the needs of rapid iteration and update of modern industrial control products. In addition, traditional testing methods also have problems such as single testing strategy, inaccurate test data, and difficult to trace test results, which seriously affect the evaluation and improvement of product EMC performance. Summary of the invention

[0004] The object of the present invention is to overcome the deficiencies of the prior art and provide an EMC testing method for electronic products, comprising the following steps: Step 1: Obtain product information, and obtain the EMC test strategy of the product in the cloud data server, wherein the EMC test strategy includes an electromagnetic emission test strategy and an electromagnetic sensitivity test strategy; the electromagnetic emission test strategy includes a conducted emission test and a radiated emission test; the electromagnetic sensitivity test includes a conducted sensitivity test and a radiated sensitivity test; Step 2: Obtain the products to be tested according to the set ratio among the finished products, divide the products to be tested into an electromagnetic emission test group and an electromagnetic sensitivity test group, perform an electromagnetic emission test on the electromagnetic emission test group, and proceed to step 3; perform an electromagnetic sensitivity test on the electromagnetic sensitivity test group, and proceed to step 4; Step 3: Perform a conducted emission test on the products to be tested in the electromagnetic emission test group according to the electromagnetic emission test strategy to obtain test interference data. If the test interference data is within the design interference data range, the conducted emission test is qualified and a radiated emission test is performed. Otherwise, the electromagnetic emission test fails. Test radiation data is obtained according to the radiated emission test. If the test radiation data is within the design radiation data range, the electromagnetic emission test passes and the process goes to step 5. Otherwise, the electromagnetic emission test fails. Step 4: Perform a conducted sensitivity test on the products to be tested in the electromagnetic sensitivity test group according to the electromagnetic sensitivity test strategy to obtain conducted anti-interference data. If the conducted anti-interference is qualified, the conducted sensitivity test is qualified and a radiation sensitivity test is performed. Otherwise, the electromagnetic sensitivity test fails. According to the radiation sensitivity test, test anti-interference data is obtained. If the test anti-interference data is within the design anti-interference data range, the electromagnetic sensitivity test is qualified and step 5 is entered. Otherwise, the electromagnetic sensitivity test fails. Step 5: Obtain the electromagnetic sensitivity pass rate according to the products that have passed the electromagnetic sensitivity test, obtain the electromagnetic emission test pass rate according to the products that have passed the electromagnetic emission test, and obtain the pass rate of the product to be tested according to the electromagnetic sensitivity pass rate and the electromagnetic emission test pass rate. If the pass rate of the product to be tested is not less than the set pass rate, the product to be tested is qualified and the process goes to step 6; otherwise, the product to be tested is unqualified. Step 6: According to product classification and pass rate, obtain the EMC data of the product to be tested and complete the EMC test of the electronic product.

[0005] Furthermore, the method of obtaining the products to be tested according to a set ratio from the finished products and dividing the products to be tested into an electromagnetic emission test group and an electromagnetic sensitivity test group includes: The set ratio is to select the finished products on the production line according to the set product interval number, and allocate them to the electromagnetic emission test group and the electromagnetic sensitivity test group in turn until both the electromagnetic emission test group and the electromagnetic sensitivity test group reach the set test number.

[0006] Furthermore, the conduction emission test is performed on the products to be tested in the electromagnetic emission test group according to the electromagnetic emission test strategy to obtain the test interference data, including: The product under test is operated according to the product operating parameters of the conducted emission test to obtain the electromagnetic interference intensity and interference frequency in the output signal of the product under test.

[0007] Further, the conducted sensitivity test is performed on the products to be tested in the electromagnetic sensitivity test group according to the electromagnetic sensitivity test strategy to obtain conducted anti-interference data. If the conducted anti-interference data is qualified, the conducted sensitivity test is qualified, including: The conducted anti-interference data includes anti-interference strength and anti-interference consistency of the anti-interference circuit module; the anti-interference strength is: the difference between the product output data and the standard data is the set data deviation threshold, and the corresponding conducted interference strength is the maximum anti-interference strength; The consistency of the anti-interference circuit module is: according to the obtained maximum anti-interference strength, if the difference with the designed maximum anti-interference strength is within the deviation range, the anti-interference circuit module of the product is consistent in anti-interference, otherwise, it is inconsistent; If the product's anti-interference circuit module has consistent anti-interference performance, the conducted anti-interference test is qualified.

[0008] Further, the electromagnetic sensitivity qualified rate is obtained according to the products that have passed the electromagnetic sensitivity test, the electromagnetic emission test qualified rate is obtained according to the products that have passed the electromagnetic emission test, and the qualified rate of the products to be tested is obtained according to the electromagnetic sensitivity qualified rate and the electromagnetic emission test qualified rate, including: According to the obtained electromagnetic sensitivity test pass rate and electromagnetic emission test pass rate, the larger one of the electromagnetic sensitivity test pass rate and the electromagnetic emission test pass rate is the pass rate of the product to be tested.

[0009] An EMC test system for electronic products, applying the EMC test method for electronic products, comprising an EMC test module, a data acquisition module, a cloud data server, a data processing module and a communication module; The EMC test module, data acquisition module and communication module are respectively connected to the data processing module; the cloud data server is communicatively connected to the communication module.

[0010] Preferably, the EMC test module includes an electromagnetic emission test module and an electromagnetic sensitivity test module; the electromagnetic emission test module and the electromagnetic sensitivity test module are respectively connected to the data processing module.

[0011] Preferably, the electromagnetic emission test device comprises a conducted emission test module and a radiated emission test module; the conducted emission test module and the radiated emission test module are respectively connected to the data processing module.

[0012] Preferably, the electromagnetic sensitivity testing device comprises a conduction sensitivity testing module and a radiation sensitivity testing module; the conduction sensitivity testing module and the radiation sensitivity testing module are respectively connected to the data processing module.

[0013] The beneficial effects of the present invention are: High test efficiency: The EMC test strategy of the product is obtained through the cloud data server, which realizes the automation and intelligence of the test process, greatly shortens the test cycle and improves the test efficiency.

[0014] Enhanced test accuracy: Scientific and reasonable test grouping and ratio setting ensure the comprehensiveness and representativeness of the test results. At the same time, through precise measurement and data analysis, the accuracy and reliability of the test data are improved.

[0015] Optimize test strategy: According to the characteristics of the product and the application environment, the customized EMC test strategy can more accurately reflect the EMC performance of the product and provide targeted guidance for product design and improvement.

[0016] Improve product quality: By comprehensively evaluating the results of electromagnetic emission test and electromagnetic sensitivity test, the EMC performance qualification rate of the product is obtained, which provides strong support for product quality control. At the same time, the generated EMC data report provides a valuable reference for subsequent improvement and optimization of the product.

[0017] Realize remote monitoring and sharing: Upload test data to the cloud data server through the communication module, realize remote access and sharing of test data, facilitate multi-party collaboration and data analysis, and further improve the value and efficiency of testing.

[0018] Reduce costs: The automated testing process reduces manual intervention and reduces testing costs. At the same time, through precise testing and data analysis, it reduces additional development and production costs caused by inaccurate testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 A schematic diagram of a flow chart of an EMC test method for electronic products; Figure 2 It is a principle schematic diagram of an EMC test system for electronic products; Figure 3 This is a schematic diagram of the EMC test module. DETAILED DESCRIPTION

[0020] The technical solution of the present invention is further described in detail below in conjunction with the accompanying drawings, but the protection scope of the present invention is not limited to the following.

[0021] The features and performance of the present invention are further described in detail below in conjunction with the embodiments.

[0022] like Figure 1 As shown, an EMC test method for electronic products includes the following steps: Step 1: Obtain product information, and obtain the EMC test strategy of the product in the cloud data server, wherein the EMC test strategy includes an electromagnetic emission test strategy and an electromagnetic sensitivity test strategy; the electromagnetic emission test strategy includes a conducted emission test and a radiated emission test; the electromagnetic sensitivity test includes a conducted sensitivity test and a radiated sensitivity test; Step 2: Obtain the products to be tested according to the set ratio among the finished products, divide the products to be tested into an electromagnetic emission test group and an electromagnetic sensitivity test group, perform an electromagnetic emission test on the electromagnetic emission test group, and proceed to step 3; perform an electromagnetic sensitivity test on the electromagnetic sensitivity test group, and proceed to step 4; Step 3: Perform a conducted emission test on the products to be tested in the electromagnetic emission test group according to the electromagnetic emission test strategy to obtain test interference data. If the test interference data is within the design interference data range, the conducted emission test is qualified and a radiated emission test is performed. Otherwise, the electromagnetic emission test fails. Test radiation data is obtained according to the radiated emission test. If the test radiation data is within the design radiation data range, the electromagnetic emission test passes and the process goes to step 5. Otherwise, the electromagnetic emission test fails. Step 4: Perform a conducted sensitivity test on the products to be tested in the electromagnetic sensitivity test group according to the electromagnetic sensitivity test strategy to obtain conducted anti-interference data. If the conducted anti-interference is qualified, the conducted sensitivity test is qualified and a radiation sensitivity test is performed. Otherwise, the electromagnetic sensitivity test fails. According to the radiation sensitivity test, test anti-interference data is obtained. If the test anti-interference data is within the design anti-interference data range, the electromagnetic sensitivity test is qualified and step 5 is entered. Otherwise, the electromagnetic sensitivity test fails. Step 5: Obtain the electromagnetic sensitivity pass rate according to the products that have passed the electromagnetic sensitivity test, obtain the electromagnetic emission test pass rate according to the products that have passed the electromagnetic emission test, and obtain the pass rate of the product to be tested according to the electromagnetic sensitivity pass rate and the electromagnetic emission test pass rate. If the pass rate of the product to be tested is not less than the set pass rate, the product to be tested is qualified and the process goes to step 6; otherwise, the product to be tested is unqualified. Step 6: According to product classification and pass rate, obtain the EMC data of the product to be tested and complete the EMC test of the electronic product.

[0023] The method of obtaining the products to be tested according to a set ratio from the finished products and dividing the products to be tested into an electromagnetic emission test group and an electromagnetic sensitivity test group comprises: The set ratio is to select the finished products on the production line according to the set product interval number, and allocate them to the electromagnetic emission test group and the electromagnetic sensitivity test group in turn until both the electromagnetic emission test group and the electromagnetic sensitivity test group reach the set test number.

[0024] The said conducting emission test on the products to be tested in the electromagnetic emission test group according to the electromagnetic emission test strategy to obtain the test interference data includes: The product under test is operated according to the product operating parameters of the conducted emission test to obtain the electromagnetic interference intensity and interference frequency in the output signal of the product under test.

[0025] The conducted sensitivity test is performed on the products to be tested in the electromagnetic sensitivity test group according to the electromagnetic sensitivity test strategy to obtain conducted anti-interference data. If the conducted anti-interference data is qualified, the conducted sensitivity test is qualified, including: The conducted anti-interference data includes anti-interference strength and anti-interference consistency of the anti-interference circuit module; the anti-interference strength is: the difference between the product output data and the standard data is the set data deviation threshold, and the corresponding conducted interference strength is the maximum anti-interference strength; The consistency of the anti-interference circuit module is: according to the obtained maximum anti-interference strength, if the difference with the designed maximum anti-interference strength is within the deviation range, the anti-interference circuit module of the product is consistent in anti-interference, otherwise, it is inconsistent; If the product's anti-interference circuit module has consistent anti-interference performance, the conducted anti-interference test is qualified.

[0026] The method of obtaining the electromagnetic sensitivity qualified rate according to the products that have passed the electromagnetic sensitivity test, obtaining the electromagnetic emission test qualified rate according to the products that have passed the electromagnetic emission test, and obtaining the qualified rate of the products to be tested according to the electromagnetic sensitivity qualified rate and the electromagnetic emission test qualified rate includes: According to the obtained electromagnetic sensitivity test pass rate and electromagnetic emission test pass rate, the larger one of the electromagnetic sensitivity test pass rate and the electromagnetic emission test pass rate is the pass rate of the product to be tested.

[0027] like Figure 2 As shown, an EMC test system for electronic products, applying the EMC test method for electronic products, includes an EMC test module, a data acquisition module, a cloud data server, a data processing module and a communication module; The EMC test module, data acquisition module and communication module are respectively connected to the data processing module; the cloud data server is communicatively connected to the communication module.

[0028] like Figure 3 As shown, the EMC test module includes an electromagnetic emission test module and an electromagnetic sensitivity test module; the electromagnetic emission test module and the electromagnetic sensitivity test module are respectively connected to the data processing module.

[0029] The electromagnetic emission test device comprises a conducted emission test module and a radiated emission test module; the conducted emission test module and the radiated emission test module are respectively connected to the data processing module.

[0030] The electromagnetic sensitivity testing device comprises a conduction sensitivity testing module and a radiation sensitivity testing module; the conduction sensitivity testing module and the radiation sensitivity testing module are respectively connected to the data processing module.

[0031] Specifically, the present invention proposes an EMC testing method for electronic products, the method comprising the following steps: Step 1: Obtain product information and develop a testing strategy First, in the finished product, the EMC test strategy of the product is obtained through the cloud data server. These strategies are pre-formulated according to the characteristics and application environment of the product, including electromagnetic emission test strategy and electromagnetic sensitivity test strategy. The electromagnetic emission test strategy mainly focuses on the electromagnetic interference that may be generated by the product during operation, including conducted emission test and radiated emission test; while the electromagnetic sensitivity test strategy focuses on the product's resistance to external electromagnetic interference, including conducted sensitivity test and radiated sensitivity test. This step ensures the pertinence and effectiveness of the test process.

[0032] Step 2: Select products to be tested and test them in groups On the production line, according to the set ratio (e.g., M products are selected as the products to be tested for every N products produced) and the number of intervals, the products to be tested are selected from the finished products and assigned to the electromagnetic emission test group and the electromagnetic sensitivity test group in turn until both groups reach the set number of tests. This grouping method ensures the comprehensiveness of the test and improves the test efficiency.

[0033] Step 3: Electromagnetic emission test For the products to be tested in the electromagnetic emission test group, conduction emission test and radiation emission test are performed according to the electromagnetic emission test strategy. In the conducted emission test, the electromagnetic interference intensity and interference frequency in the output signal of the product to be tested are measured by running the product to be tested according to the preset operating parameters to obtain the test interference data. If the test interference data is within the design interference data range, the conducted emission test is qualified and the radiation emission test is continued; otherwise, the electromagnetic emission test is unqualified. In the radiation emission test, the electromagnetic radiation intensity of the product to be tested is also measured, and its qualification is judged based on the test results.

[0034] Step 4: Electromagnetic susceptibility test For the products to be tested in the electromagnetic sensitivity test group, conduction sensitivity test and radiation sensitivity test according to the electromagnetic sensitivity test strategy. In the conducted sensitivity test, the anti-interference ability of the product is measured by applying electromagnetic interference signals of different intensities to obtain the conducted anti-interference data. These data include the anti-interference strength and the anti-interference consistency of the anti-interference circuit module. If the anti-interference strength of the product meets the set requirements and the consistency of the anti-interference circuit module is good (that is, the difference between the maximum anti-interference strength and the design value is within the deviation range), the conducted sensitivity test is qualified and the radiation sensitivity test is continued; otherwise, the electromagnetic sensitivity test fails. In the radiation sensitivity test, the anti-interference performance of the product is also evaluated by applying external electromagnetic interference.

[0035] Step 5: Comprehensive evaluation to determine the pass rate According to the results of the electromagnetic sensitivity test and the electromagnetic emission test, the electromagnetic sensitivity pass rate and the electromagnetic emission test pass rate are calculated respectively. Then, according to the larger value of the two pass rates, the overall pass rate of the product to be tested is determined. If the pass rate of the product to be tested is not less than the set pass rate threshold (such as 90%), the product to be tested is judged to be qualified; otherwise, it is judged to be unqualified.

[0036] Step 6: Generate EMC data report For qualified products, an EMC data report of the tested product is generated based on product classification and pass rate. This report records in detail the product's EMC test process, test results, pass rate and other information, providing a valuable reference for product quality control and subsequent improvements. At the same time, the test data is uploaded to the cloud data server through the communication module to achieve remote access and sharing of the test data.

[0037] Product information acquisition: Product information includes but is not limited to product type, function, operating frequency, use environment, etc. This information is the basis for formulating EMC test strategies. In actual operation, it can be obtained by scanning the QR code or barcode on the product, or directly from the production management system.

[0038] Test strategy formulation: Develop specific EMC test strategies based on product information, combined with international standards and industry specifications (such as IEC, CISPR, EN, etc.). The electromagnetic emission test strategy should clearly define the test frequency range, test methods (such as sweep frequency test, point frequency test, etc.), test limits, etc.; the electromagnetic sensitivity test strategy should clearly define the type of interference signal (such as sine wave, pulse wave, etc.), interference intensity, test mode (such as normal working mode, standby mode, etc.), etc.

[0039] Selection and grouping: On the production line, the automated control system selects the products to be tested according to the set ratio and interval number, and automatically allocates them to the electromagnetic emission test group and the electromagnetic sensitivity test group. To ensure the randomness and uniformity of the grouping, a random number generation algorithm or a cyclic allocation mechanism can be used.

[0040] Conducted emission test: The conducted emission test module is used to evaluate the conducted emission performance of the product by measuring the electromagnetic interference intensity and interference frequency in the output signal of the product under test. During the test, it is necessary to ensure that the electromagnetic interference level of the test environment is lower than the test limit to avoid the influence of external interference on the test results.

[0041] Radiated emission test: The radiated emission test module is used to evaluate the radiated emission performance of the product by measuring the electromagnetic radiation intensity of the product under test within a specific frequency range. During the test, a suitable test antenna and measurement distance must be used to ensure the accuracy of the test results.

[0042] Conducted sensitivity test: Use the conducted sensitivity test module to measure the anti-interference ability of the product by applying electromagnetic interference signals of different strengths. During the test, it is necessary to pay attention to indicators such as the anti-interference strength of the product and the anti-interference consistency of the anti-interference circuit module to ensure that the product can work stably under different interference intensities.

[0043] Radiation sensitivity test: The radiation sensitivity test module is used to apply external electromagnetic interference signals to evaluate the product's resistance to radiation interference. During the test, it is necessary to simulate the radiation interference that the product may encounter in the actual use environment, such as mobile phone signals, radar signals, etc.

[0044] Data processing and analysis: The test data is processed and analyzed through the data processing module to calculate the electromagnetic sensitivity test pass rate and the electromagnetic emission test pass rate. In the data processing process, appropriate statistical methods and algorithms must be used to ensure the accuracy and reliability of the calculation results.

[0045] Qualified rate determination: Determine the qualified rate of the product to be tested based on the larger value of the electromagnetic sensitivity qualified rate and the electromagnetic emission test qualified rate.

[0046] Example 1: EMC testing of industrial PC products Step 1: Obtain product information and develop a testing strategy For newly produced industrial PCs, the EMC test strategy for the product model is first obtained from the cloud data server. According to the design characteristics and expected use environment of the industrial PC, the test strategy includes: conduction and radiation emission test strategies for key components such as power supply ports and telecommunication ports, as well as conduction and radiation sensitivity test strategies for the entire machine in different frequency bands. Special attention is paid to the electromagnetic compatibility performance of industrial PCs in data computing and data transmission.

[0047] On the production line, for every 100 industrial products produced, 10 are randomly selected as the products to be tested, of which 5 are assigned to the electromagnetic emission test group and the other 5 are assigned to the electromagnetic sensitivity test group. Ensure that each group of products covers different batches and production periods to fully evaluate the stability of EMC performance during the production process.

[0048] For the industrial PCs in the electromagnetic emission test group, the conducted emission test is first performed. By simulating normal equipment operation and data transmission, the spectrum analyzer is used to measure the electromagnetic interference of the industrial PC through the power port, telecommunication port and other conductive paths. Then the radiated emission test is performed. The antenna and receiver are used in a darkroom to measure the radiated emission level of the industrial PC in standby, operation, communication and other states to ensure that it does not exceed the internationally prescribed limit.

[0049] In the electromagnetic sensitivity test group, the industrial PC is first subjected to a conducted sensitivity test, which injects electromagnetic interference signals of different frequencies and intensities into the power port and telecommunication port of the industrial PC to monitor whether the industrial PC function is affected. Then the radiated sensitivity test is carried out, placing the industrial PC in a simulated electromagnetic field environment to test its working stability under electromagnetic radiation of different intensities, such as whether there is any interruption in operation.

[0050] Based on the test results, a detailed EMC data report is generated, including the test method, test environment, specific test data, pass rate analysis, and records of any abnormal conditions. The report is uploaded to the cloud data server through the company's internal network for review by the quality control department, R&D team, and management, providing a basis for subsequent product optimization.

[0051] Example 2: EMC test of human-computer interaction products For newly produced human-machine interaction products, obtain their EMC test strategies from the cloud data server. Considering the design characteristics and expected use environment of human-machine exchange products, the test strategies include: conduction and radiation emission test strategies for key components such as power ports, telecommunications ports, and display screens, as well as conduction and radiation sensitivity test strategies for the entire machine in different frequency bands.

[0052] On the production line, for every 100 HMI products produced, 10 are randomly selected as the products to be tested and evenly divided into two groups, 5 in each group, for electromagnetic emission test and electromagnetic sensitivity test respectively. Ensure that the samples cover different production batches to evaluate production consistency.

[0053] For the electromagnetic emission test group, the conducted emission test is first carried out. By simulating scenes such as normal equipment operation and data transmission, a spectrum analyzer is used to measure the electromagnetic interference of the human-computer interaction products through the power port, telecommunication port and other conduction paths. Then the radiated emission test is carried out. Antennas and receivers are used in a darkroom to measure the radiated emission levels of human-computer interaction products in standby, operation, communication and other states to ensure that they do not exceed the internationally prescribed limits.

Claims

1. An EMC test method for electronic products, characterized in that: The steps include: Step 1: Obtain product information, and obtain the EMC test strategy of the product in the cloud data server, wherein the EMC test strategy includes an electromagnetic emission test strategy and an electromagnetic sensitivity test strategy; the electromagnetic emission test strategy includes a conducted emission test and a radiated emission test; the electromagnetic sensitivity test includes a conducted sensitivity test and a radiated sensitivity test; Step 2: Obtain the products to be tested according to the set ratio among the finished products, divide the products to be tested into an electromagnetic emission test group and an electromagnetic sensitivity test group, perform an electromagnetic emission test on the electromagnetic emission test group, and proceed to step 3; perform an electromagnetic sensitivity test on the electromagnetic sensitivity test group, and proceed to step 4; Step 3: Perform a conducted emission test on the products to be tested in the electromagnetic emission test group according to the electromagnetic emission test strategy to obtain test interference data. If the test interference data is within the design interference data range, the conducted emission test is qualified and a radiated emission test is performed. Otherwise, the electromagnetic emission test fails. According to the radiation emission test, the test radiation data is obtained. If the test radiation data is within the design radiation data range, the electromagnetic emission test is qualified and the process goes to step 5. Otherwise, the electromagnetic emission test is unqualified. Step 4: Perform a conducted sensitivity test on the products to be tested in the electromagnetic sensitivity test group according to the electromagnetic sensitivity test strategy to obtain conducted anti-interference data. If the conducted anti-interference is qualified, the conducted sensitivity test is qualified and a radiation sensitivity test is performed. Otherwise, the electromagnetic sensitivity test fails. According to the radiation sensitivity test, test anti-interference data is obtained. If the test anti-interference data is within the design anti-interference data range, the electromagnetic sensitivity test is qualified and step 5 is entered. Otherwise, the electromagnetic sensitivity test fails. Step 5: Obtain the electromagnetic sensitivity pass rate according to the products that have passed the electromagnetic sensitivity test, obtain the electromagnetic emission test pass rate according to the products that have passed the electromagnetic emission test, and obtain the pass rate of the product to be tested according to the electromagnetic sensitivity pass rate and the electromagnetic emission test pass rate. If the pass rate of the product to be tested is not less than the set pass rate, the product to be tested is qualified and the process goes to step 6; otherwise, the product to be tested is unqualified. Step six, obtain product classification according to the pass rate, obtain EMC data of the product to be tested according to the product classification and pass rate, and complete the EMC test of the electronic product.

2. The EMC testing method for electronic products according to claim 1, characterized in that: The method of obtaining the products to be tested according to a set ratio from the finished products and dividing the products to be tested into an electromagnetic emission test group and an electromagnetic sensitivity test group comprises: The set ratio is to select the finished products on the production line according to the set product interval number, and allocate them to the electromagnetic emission test group and the electromagnetic sensitivity test group in turn until both the electromagnetic emission test group and the electromagnetic sensitivity test group reach the set test number.

3. The EMC testing method for electronic products according to claim 2, characterized in that: The said conducting emission test on the products to be tested in the electromagnetic emission test group according to the electromagnetic emission test strategy to obtain the test interference data includes: The product under test is operated according to the product operating parameters of the conducted emission test to obtain the electromagnetic interference intensity and interference frequency in the output signal of the product under test.

4. The EMC testing method for electronic products according to claim 3, characterized in that: The conducted sensitivity test is performed on the products to be tested in the electromagnetic sensitivity test group according to the electromagnetic sensitivity test strategy to obtain conducted anti-interference data. If the conducted anti-interference data is qualified, the conducted sensitivity test is qualified, including: The conducted anti-interference data includes anti-interference strength and anti-interference consistency of the anti-interference circuit module; the anti-interference strength is: the difference between the product output data and the standard data is the set data deviation threshold, and the corresponding conducted interference strength is the maximum anti-interference strength; The consistency of the anti-interference circuit module is: according to the obtained maximum anti-interference strength, if the difference with the designed maximum anti-interference strength is within the deviation range, the anti-interference circuit module of the product is consistent in anti-interference, otherwise, it is inconsistent; If the product's anti-interference circuit module has consistent anti-interference performance, the conducted anti-interference test is qualified.

5. The EMC testing method for electronic products according to claim 4, characterized in that: The method of obtaining the electromagnetic sensitivity qualified rate according to the products that have passed the electromagnetic sensitivity test, obtaining the electromagnetic emission test qualified rate according to the products that have passed the electromagnetic emission test, and obtaining the qualified rate of the products to be tested according to the electromagnetic sensitivity qualified rate and the electromagnetic emission test qualified rate includes: According to the obtained electromagnetic sensitivity test pass rate and electromagnetic emission test pass rate, the larger one of the electromagnetic sensitivity test pass rate and the electromagnetic emission test pass rate is the pass rate of the product to be tested.

6. An EMC test system for electronic products, characterized in that: An EMC test method for electronic products according to any one of claims 1 to 5 is applied, comprising an EMC test module, a data acquisition module, a cloud data server, a data processing module and a communication module; The EMC test module, data acquisition module and communication module are respectively connected to the data processing module; the cloud data server is communicatively connected to the communication module.

7. An EMC test system for electronic products according to claim 6, characterized in that: The EMC test module comprises an electromagnetic emission test module and an electromagnetic sensitivity test module; the electromagnetic emission test module and the electromagnetic sensitivity test module are respectively connected to the data processing module.

8. An EMC test system for electronic products according to claim 7, characterized in that: The electromagnetic emission test device comprises a conducted emission test module and a radiated emission test module; the conducted emission test module and the radiated emission test module are respectively connected to the data processing module.

9. The EMC test system for electronic products according to claim 7, characterized in that: The electromagnetic sensitivity testing device comprises a conduction sensitivity testing module and a radiation sensitivity testing module; the conduction sensitivity testing module and the radiation sensitivity testing module are respectively connected to the data processing module.

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