Chip parameter trimming method, device, equipment and medium

Abstract

The embodiment of the invention discloses a chip parameter trimming method and device, equipment and a medium. The method comprises the following steps: acquiring a plurality of register data of a to-be-tested chip and a plurality of corresponding to-be-trimmed parameters; wherein a plurality of to-be-trimmed parameters corresponding to the plurality of register data have a set change relationship; sorting the plurality of to-be-trimmed parameters according to a set sequence to obtain a sorted to-be-trimmed parameter list; establishing a linear corresponding relation based on the ranked to-be-trimmed parameter list and a set identifier list; wherein the register data is carried in the set identifier list; and determining a target trimming parameter according to the linear corresponding relation and the set standard parameter. According to the technical scheme, the target trimming parameter can be determined based on the linear corresponding relation reestablished by the to-be-trimmed parameter and the set identifier list, so that the determined target trimming parameter is higher in accuracy, the chip trimming quality is determined to be improved, and the efficiency of the chip trimming process is greatly improved.

Description

Technical Field

[0001] The present invention relates to the field of integrated circuit technology, and in particular to a chip parameter adjustment method, device, equipment and medium. Background Art

[0002] During chip production, due to the limitations of actual production conditions, the produced chips generally have certain process deviations, and the actual values ​​of key chip parameters may differ greatly from the expected values. In order to make the chip parameters meet the needs of the application, the chip parameters are generally corrected and adjusted to the allowable range close to the target value during the large-scale mass production test phase. In the process of chip adjustment, in many cases, the parameter value does not increase or decrease linearly with the register value, but a nonlinear jump relationship.

[0003] At present, the parameters of chip nonlinear changes are adjusted by incrementing or decrementing the register values ​​for nonlinearity, recording and comparing the corresponding parameter values ​​one by one until an error value is found that is smaller than the expected range. However, the registers are decremented or incremented, and the entire range must be traversed in the worst case, which is inefficient. In addition, during the parameter traversal and acquisition process, the parameter values ​​jump back and forth greatly. For some adjustment items, the large jumps in the parameter values ​​will result in a longer waiting time for the parameter values ​​to stabilize, which seriously affects the adjustment efficiency. Summary of the invention

[0004] The present invention provides a chip parameter adjustment method, device, equipment and medium, which can determine the target adjustment parameters based on the linear correspondence re-established between the parameters to be adjusted and the set identification list, so that the determined target adjustment parameters are more accurate, the chip adjustment quality is definitely improved, and the efficiency of the chip adjustment process is greatly improved.

[0005] According to one aspect of the present invention, a chip parameter adjustment method is provided, comprising:

[0006] Acquire multiple register data of the chip to be tested and corresponding multiple parameters to be adjusted; wherein the multiple parameters to be adjusted corresponding to the multiple register data have a setting change relationship;

[0007] Sorting the plurality of parameters to be adjusted according to a set order to obtain a sorted list of parameters to be adjusted;

[0008] A linear correspondence is established based on the sorted list of parameters to be adjusted and the list of setting identifiers; wherein the list of setting identifiers carries the register data;

[0009] The target adjustment parameter is determined according to the linear correspondence and the set standard parameter.

[0010] Optionally, determining a target adjustment parameter according to the linear correspondence and the set standard parameter includes:

[0011] Get initial register data;

[0012] Determine a first parameter to be adjusted corresponding to the initial register data based on the linear correspondence;

[0013] An adjustment operation is performed according to the first parameter to be adjusted and the set standard parameter to obtain a target adjustment parameter.

[0014] Optionally, performing an adjustment operation according to the first parameter to be adjusted and the set standard parameter to obtain a target adjustment parameter includes:

[0015] Determining a parameter difference between the first parameter to be adjusted and the set standard parameter;

[0016] Determine whether the parameter difference is less than a set error range;

[0017] If the parameter difference is smaller than the set error range, a target adjustment parameter is determined based on the first parameter to be adjusted.

[0018] Optionally, determining a target adjustment parameter based on the first parameter to be adjusted includes:

[0019] Determine the adjacent parameter to be adjusted of the first parameter to be adjusted according to the linear corresponding relationship;

[0020] Subtracting the adjacent parameters to be adjusted from the set standard parameters respectively to obtain operation results;

[0021] The target adjustment parameter is determined according to the calculation result.

[0022] Optionally, the setting identifier list is an array identifier list; and the method further includes:

[0023] Obtaining the current adjustment times and step value; wherein the step value is determined based on the linear correspondence;

[0024] If the parameter difference is greater than or equal to the set error range, determine whether the current adjustment times are less than the set adjustment times;

[0025] If the current adjustment number is less than the set adjustment number, determining the step number based on the parameter difference and the step value;

[0026] Adjusting the array identifier of the first parameter to be adjusted according to the step number to obtain a second parameter to be adjusted;

[0027] The adjustment operation is continued according to the second parameter to be adjusted and the set standard parameter to obtain a target adjustment parameter.

[0028] Optionally, establishing a linear correspondence based on the sorted list of parameters to be adjusted and the list of setting identifiers includes:

[0029] According to the sorted list of parameters to be adjusted, an array identification list for storing corresponding register data is established; wherein the array identification list is sorted by array subscript;

[0030] Determine a linear correspondence between the array identifier list and the sorted list of parameters to be adjusted.

[0031] Optionally, after determining the target adjustment parameter according to the linear correspondence and the set standard parameter, the method further includes:

[0032] The target register data corresponding to the target trimming parameter is written into the chip to be tested, so as to complete the trimming of the chip to be tested.

[0033] According to another aspect of the present invention, a chip parameter adjustment device is provided, comprising:

[0034] A data acquisition module, used for acquiring a plurality of register data of the chip to be tested and a plurality of corresponding parameters to be adjusted; wherein the plurality of parameters to be adjusted corresponding to the plurality of register data have a setting change relationship;

[0035] A sorting module, used for sorting the plurality of parameters to be adjusted according to a set order to obtain a sorted list of parameters to be adjusted;

[0036] A relationship establishing module, used for establishing a linear correspondence relationship based on the sorted list of parameters to be adjusted and the list of setting identifiers; wherein the list of setting identifiers carries the register data;

[0037] The target adjustment parameter determination module is used to determine the target adjustment parameter according to the linear correspondence and the set standard parameter.

[0038] According to another aspect of the present invention, there is provided an electronic device, the electronic device comprising:

[0039] at least one processor; and

[0040] a memory communicatively connected to the at least one processor; wherein,

[0041] The memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor so that the at least one processor can execute the chip parameter adjustment method described in any embodiment of the present invention.

[0042] According to another aspect of the present invention, a computer-readable storage medium is provided, wherein the computer-readable storage medium stores computer instructions, and the computer instructions are used to enable a processor to implement the chip parameter adjustment method described in any embodiment of the present invention when executed.

[0043] The technical solution of the embodiment of the present invention is to obtain multiple register data of the chip to be tested and the corresponding multiple parameters to be adjusted; wherein the multiple parameters to be adjusted corresponding to the multiple register data have a set change relationship; sort the multiple parameters to be adjusted according to the set order to obtain a sorted list of parameters to be adjusted; establish a linear correspondence based on the sorted list of parameters to be adjusted and a set identification list; wherein the setting identification list carries the register data; determine the target adjustment parameters according to the linear correspondence and the set standard parameters. This technical solution can determine the target adjustment parameters based on the linear correspondence re-established between the parameters to be adjusted and the setting identification list, so that the determined target adjustment parameters are more accurate, the chip adjustment quality is definitely improved, and the efficiency of the chip adjustment process is greatly improved.

[0044] It should be understood that the contents described in this section are not intended to identify the key or important features of the embodiments of the present invention, nor are they intended to limit the scope of the present invention. Other features of the present invention will become easily understood through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0045] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0046] Figure 1 is a flow chart of a chip parameter adjustment method provided according to the first embodiment of the present invention;

[0047] Figure 2 is a flow chart of a chip parameter adjustment method provided according to the second embodiment of the present invention;

[0048] Figure 3 This is an example diagram of a change trend of a voltage parameter to be adjusted provided according to the second embodiment of the present invention;

[0049] Figure 4 is a schematic diagram of the structure of a chip parameter adjustment device provided according to Embodiment 3 of the present invention;

[0050] Figure 5 It is a structural schematic diagram of an electronic device provided according to Embodiment 4 of the present invention. DETAILED DESCRIPTION

[0051] In order to enable those skilled in the art to better understand the scheme of the present invention, the technical scheme in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present invention.

[0052] It should be noted that the terms "first", "second", "initial" and "target" in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0053] Embodiment 1

[0054] Figure 1 This is a flow chart of a chip parameter adjustment method provided according to the first embodiment of the present invention. This embodiment is applicable to the case where the chip parameters are adjusted during chip manufacturing. The method can be executed by a chip parameter adjustment device. The chip parameter adjustment device can be implemented in the form of hardware and / or software. The chip parameter adjustment device can be configured in an electronic device with data processing capabilities. Figure 1 As shown, the method includes:

[0055] In this embodiment, the chip master controller can be used to perform adjustments to chip parameters for nonlinear transformations, mainly by using an array to re-establish a linear correspondence, and then determining the optimal target adjustment parameters based on a new approximate linear correspondence in combination with an empirical value method and a difference compensation method, thereby finding the minimum error target value of the chip adjustment parameters, improving the chip adjustment quality, and greatly improving the yield rate of the chip adjustment process.

[0056] S110, obtaining a plurality of register data of the chip to be tested and a plurality of corresponding parameters to be adjusted.

[0057] Among them, the chip to be tested can be understood as a chip that needs to perform parameter adjustment operations. There is a set change relationship between the multiple parameters to be adjusted corresponding to the multiple register data. The set change relationship can be understood as a nonlinear change relationship, but the multiple register data and the corresponding multiple parameters to be adjusted have a regular change consistency relationship. It can be understood that in the process of chip adjustment in this embodiment, the value of the parameter to be adjusted does not increase or decrease linearly with the register value, that is, it is a nonlinear change relationship. Specifically, although the chip parameter value to be adjusted and the register data are nonlinear, the corresponding change relationship between them is determined and consistent, that is, if the register data of a chip to be tested is increased by 1 from a certain value, the value of the parameter to be adjusted becomes larger, then the corresponding change relationship of other chips to be tested in the same batch is also the same data change relationship.

[0058] In this embodiment, multiple register data can be understood as setting multiple register reg values ​​during the trimming process of the chip to be tested; wherein, multiple parameters to be trimmed can be parameter values ​​to be trimmed corresponding to multiple register data one by one. In this embodiment, the parameters to be trimmed may include trimming parameters such as voltage, current and frequency. In this embodiment, during the chip manufacturing process, certain parameters of the chip after the return need to be trimmed, which may specifically include the trimming of parameters such as voltage, current and frequency.

[0059] For example, in the present embodiment, the multiple register reg values ​​set in the chip to be tested may be 0x00 to 0x0f, and the adjustment parameters may be voltage parameter values. Then, the parameter values ​​of the voltage vol (V) to be adjusted corresponding to the multiple register reg values ​​output in the present embodiment may be: {1.569, 1.298, 1.419, 1.149, 1.516, 1.220, 1.358, 1.064, 1.855, 1.581, 1.704, 1.415, 1.801, 1.497, 1.642, 1.311}.

[0060] As shown in the above example, the voltage parameter relationship data of a chip under test is given, so the data relationship before and after the voltage parameter has been determined. Therefore, the voltage when reg=X can be recorded as regX_vol. Then the consistency relationship between the register of the chip under test and the voltage parameter under test can be determined as: reg0_vol>reg1_vol, reg1_vol<reg2_vol,reg2_vol> reg3_vol,….

[0061] In this embodiment, multiple register data of the chip to be tested and the corresponding multiple parameters to be adjusted can be obtained, and there is a corresponding regular change consistency relationship between the multiple register data and the corresponding multiple parameters to be adjusted.

[0062] S120 , sorting the multiple parameters to be adjusted according to a set sequence to obtain a sorted list of parameters to be adjusted.

[0063] The setting order can be understood as a descending order from large to small, or an ascending order from small to large, and can be set according to actual needs. The sorted list of parameters to be adjusted can be understood as a list of parameters to be adjusted obtained by arranging multiple parameters to be adjusted in ascending or descending order.

[0064] In this embodiment, the multiple parameters to be adjusted may be re-arranged in an ascending or descending setting order to obtain an ordered list of parameters to be adjusted.

[0065] S130: Establish a linear correspondence relationship based on the sorted list of parameters to be adjusted and the list of setting identifiers.

[0066] Among them, the setting identification list carries register data. Exemplarily, in this embodiment, the setting identification list can be represented by an array subscript, or can be represented by other identifications, and can be set according to actual needs, which is not limited in this embodiment. The linear correspondence can be understood as establishing an increasing or decreasing approximate linear correspondence between the setting identification list and the sorted list of parameters to be adjusted. In this embodiment, a setting identification list for storing corresponding register data can be established first, and then a linear correspondence can be established between the sorted list of parameters to be adjusted and the setting identification list.

[0067] S140: Determine target adjustment parameters according to the linear correspondence and set standard parameters.

[0068] Among them, the setting standard parameter can be understood as the standard parameter set for the adjustment parameter. It can be understood that in this embodiment, different standard parameters are set for different parameters to be adjusted, that is, if the parameter to be adjusted is a voltage adjustment parameter, the standard parameter is set to correspond to the standard parameter of the voltage adjustment parameter; if the parameter to be adjusted is a current adjustment parameter, the standard parameter is set to correspond to the standard parameter of the current adjustment parameter; if the parameter to be adjusted is a frequency adjustment parameter, the standard parameter is set to correspond to the standard parameter of the frequency adjustment parameter. The target adjustment parameter can be understood as the adjustment parameter with the minimum error determined from the parameter to be adjusted, that is, the optimal adjustment parameter.

[0069] In this embodiment, the linear relationship can be analyzed by a tool to obtain a linear relationship function, and the optimal adjustment parameters can be determined based on the linear relationship function in combination with the difference compensation method and the set standard parameters.

[0070] In this embodiment, optionally, after determining the target trimming parameters according to the linear correspondence and the set standard parameters, the method further includes: writing target register data corresponding to the target trimming parameters into the chip to be tested, so as to complete the trimming of the chip to be tested.

[0071] The target register data can be understood as the register data corresponding to the target trimming parameter. In this embodiment, the trimming parameter with the smallest error is determined according to the linear correspondence and the set standard parameter, the target register data corresponding to the target trimming parameter is determined by the correspondence between the parameter to be trimmed and the register data, and the target register data is written into the chip to be tested, thereby completing the trimming operation on the chip to be tested.

[0072] In this embodiment, through such a setting, the target trimming parameters are determined according to the linear relationship and the set standard parameters, and then the target register values ​​corresponding to the target trimming parameters are written into the chip to be tested, thereby completing the trimming operation of the chip to be tested. The trimming parameters in the case of nonlinear changes can be trimmed quickly and efficiently to improve the production efficiency of the chip trimming process.

[0073] The technical solution of the embodiment of the present invention is to obtain multiple register data of the chip to be tested and the corresponding multiple parameters to be adjusted; wherein the multiple parameters to be adjusted corresponding to the multiple register data have a set change relationship; sort the multiple parameters to be adjusted according to the set order to obtain a sorted list of parameters to be adjusted; establish a linear correspondence based on the sorted list of parameters to be adjusted and the set identification list; wherein the setting identification list carries the register data; determine the target adjustment parameters according to the linear correspondence and the set standard parameters. This technical solution can determine the target adjustment parameters based on the linear correspondence re-established between the parameters to be adjusted and the setting identification list, so that the determined target adjustment parameters are more accurate, the chip adjustment quality is definitely improved, and the efficiency of the chip adjustment process is greatly improved.

[0074] Embodiment 2

[0075] Figure 2 This is a flow chart of a chip parameter adjustment method provided according to the second embodiment of the present invention. This embodiment is optimized based on the above embodiment. The specific optimization is: determining the target adjustment parameter according to the linear correspondence and the set standard parameter, including: obtaining the initial register data; determining the first adjustment parameter corresponding to the initial register data based on the linear correspondence; performing adjustment operations according to the first adjustment parameter and the set standard parameter to obtain the target adjustment parameter. Figure 2 As shown, the method includes:

[0076] S210, obtaining a plurality of register data of the chip to be tested and a plurality of corresponding parameters to be adjusted.

[0077] Among them, the multiple parameters to be adjusted corresponding to the multiple register data have a setting change relationship.

[0078] S220 , sorting the multiple parameters to be adjusted according to a set sequence to obtain a sorted list of parameters to be adjusted.

[0079] S230: Establish a linear correspondence based on the sorted list of parameters to be adjusted and the list of setting identifiers, wherein the list of setting identifiers carries register data.

[0080] S240, obtaining initial register data.

[0081] The initial register data can be understood as data for initializing the register of the chip to be tested. The initial register data in this embodiment can be pre-set by a technician based on experience. The initial register data in this embodiment can be the register data that is closest to the set standard parameters.

[0082] S250 , determining a first parameter to be adjusted corresponding to the initial register data based on the linear correspondence relationship.

[0083] The first parameter to be adjusted may be parameter data to be adjusted corresponding to the initial register data determined from the plurality of parameters to be adjusted. In this embodiment, the first parameter to be adjusted corresponding to the initial register data may be determined according to a linear correspondence.

[0084] S260: Perform an adjustment operation according to the first parameter to be adjusted and the set standard parameter to obtain a target adjustment parameter.

[0085] The adjustment operation can be understood as a cyclic operation of adjusting the first parameter to be adjusted and the standard parameter by using the difference compensation method. In this embodiment, the first parameter to be adjusted and the standard parameter can be adjusted by using the difference compensation method until the target adjustment parameter with the minimum error is determined.

[0086] In this embodiment, optionally, an adjustment operation is performed according to the first parameter to be adjusted and the set standard parameter to obtain a target adjustment parameter, including: determining a parameter difference between the first parameter to be adjusted and the set standard parameter; judging whether the parameter difference is less than a set error range; if the parameter difference is less than the set error range, determining the target adjustment parameter based on the first parameter to be adjusted.

[0087] The parameter difference can be understood as the parameter difference obtained by subtracting the first adjustment parameter from the set standard parameter. The set error range can be a pre-set error range. The set error range in this embodiment can be determined based on a linear correspondence. For example, when the parameter to be adjusted in this embodiment is voltage, the example diagram of the change trend of the voltage parameter to be adjusted is as follows: Figure 3As shown, in this embodiment, the linear correspondence established according to the list of voltage parameters to be adjusted and the list of array subscript identifiers is analyzed by Excel tools to obtain the corresponding trend graph, and the approximate straight line relationship is determined according to the corresponding trend graph. Based on the approximate straight line relationship, the approximate linear relationship function is determined. As shown in the figure, the approximate linear relationship function can be y=0.047x+1.108, where a=0.047, constant b=1.108, the adjusted voltage parameter vol=y, and the array subscript i=x. In this embodiment, according to the linear relationship function, it can be known that the step value step between adjacent voltage parameter values ​​is step=0.047V, and the set error range can be determined according to the step value step between adjacent voltage parameter values. The set error range can be a range of less than half the step value step.

[0088] In this embodiment, it can be determined whether the parameter difference is less than the set error range; if the parameter difference is less than the set error range, the parameters to be adjusted adjacent to the first parameter to be adjusted can be determined based on the first parameter to be adjusted, and the parameters to be adjusted of the upper and lower vectors are respectively subtracted from the set standard parameters, and the target adjustment parameters are determined according to the calculation results. If the parameter difference is greater than or equal to the set error range, it can be determined whether to perform the adjustment cycle operation by setting the number of adjustment times.

[0089] Through such a setting in the present embodiment, the parameter difference between the first parameter to be adjusted and the set standard parameter can be determined, and the minimum error target value of the adjustment parameter of the chip to be tested can be determined based on the comparison between the parameter difference and the set error range, thereby improving the chip adjustment quality and greatly improving the yield rate of the chip adjustment process.

[0090] In this embodiment, optionally, determining the target adjustment parameter based on the first parameter to be adjusted includes: determining adjacent parameters to be adjusted of the first parameter to be adjusted according to a linear correspondence; performing subtraction operations on the adjacent parameters to be adjusted and the set standard parameters respectively to obtain operation results; and determining the target adjustment parameter according to the operation results.

[0091] Among them, the adjacent parameters to be adjusted can be understood as the upper and lower adjacent parameters to be adjusted in the list of parameters to be adjusted after the sorting of the first parameter to be adjusted. The calculation result can be understood as the difference data obtained by subtracting the upper and lower adjacent parameters to be adjusted from the set standard parameter. In this embodiment, the specific method of determining the target adjustment parameter according to the calculation result can be to select the adjustment parameter with the smallest error as the target adjustment parameter according to the calculation result obtained by subtraction.

[0092] In this embodiment, according to the two adjacent parameters to be adjusted above and below the position of the first parameter to be adjusted in the sorted list of parameters to be adjusted in the linear correspondence, these two adjacent parameters to be adjusted can be subtracted from the set standard parameter to obtain corresponding difference data, and the one with the smallest difference data is determined as the target adjustment parameter, that is, the one with the smallest difference data has the smallest error between the parameter to be adjusted and the set standard parameter.

[0093] In this embodiment, through such a setting, after determining the first parameter to be adjusted, the first parameter to be adjusted can be adjusted up or down to determine the target adjustment parameter, thereby improving the accuracy of the chip adjustment parameter and the quality of chip adjustment.

[0094] In this embodiment, optionally, the identification list is set as an array identification list; the method also includes: obtaining the current number of adjustments and the step value; wherein the step value is determined based on a linear correspondence; if the parameter difference is greater than or equal to a set error range, determining whether the current number of adjustments is less than the set number of adjustments; if the current number of adjustments is less than the set number of adjustments, determining the step number based on the parameter difference and the step value; adjusting the array identification of the first parameter to be adjusted according to the step number to obtain a second parameter to be adjusted; continuing the adjustment operation according to the second parameter to be adjusted and the set standard parameter to obtain a target adjustment parameter.

[0095] Among them, the current number of adjustments can be understood as the number of current adjustment operations. In this embodiment, the adjustment operation can be counted. The step value can be used as the data based on which the setting mark in the adjustment operation process is adjusted. In this embodiment, the linear correspondence established according to the list of voltage parameters to be adjusted and the list of array subscript marks is analyzed by the Excel tool to obtain the corresponding trend chart, determine the approximate straight line relationship according to the corresponding trend chart, determine the approximate linear relationship function based on the approximate straight line relationship, and determine the difference between adjacent voltage values ​​according to the approximate linear relationship as the step value. Exemplarily, if the approximate linear relationship function can be y=0.047x+1.108, where a=0.047, constant b=1.108, with adjustment voltage parameter vol=y, array subscript i=x, then in this embodiment, according to the linear relationship function, it can be known that the step value step between adjacent voltage parameter values ​​can be 0.047V. The set adjustment number can be understood as the set maximum adjustment number. Exemplarily, in this embodiment, the set adjustment number can be 4 times, and can also be set according to actual needs. This embodiment is not limited to this. The stepping factor can be the data obtained by rounding the result obtained by dividing the parameter difference and the stepping factor. The second parameter to be adjusted can be understood as the parameter to be adjusted corresponding to the register data obtained by adjusting the array subscript of the first parameter to be adjusted according to the stepping factor.

[0096] In this embodiment, the specific method of continuing the adjustment operation according to the second parameter to be adjusted and the set standard parameter can be to determine the second parameter difference between the second parameter to be adjusted and the set standard parameter; determine whether the second parameter difference is less than the set error range; if the second parameter difference is less than the set error range, the upper and lower adjacent parameters to be adjusted of the second parameter to be adjusted can be determined according to the linear correspondence; the upper and lower adjacent parameters to be adjusted are respectively subtracted from the set standard parameter to obtain the calculation result; and the target adjustment parameter with the smallest error is determined according to the calculation result. In this embodiment, the adjustment operation can be cyclically performed according to the parameters to be adjusted and the set standard parameters until the target adjustment parameter is determined or the number of adjustments is greater than or equal to the set maximum number of adjustments.

[0097] For example, in this embodiment, the standard parameter Target may be set to 1.353V; the initial register data obtained may be reg

[10] =0x00, then the corresponding voltage parameter value to be adjusted vol

[10] =1.569V is determined according to the linear correspondence, and the parameter difference between the standard parameter Target=1.353V may be dif_vol=vol

[10] -Target=0.216V. Then, the step number to be adjusted is obtained by dividing the parameter difference and the step value, and the step number may be determined by step_num=dif_vol / step=0.216V / 0.047V=4.59, taking the integer 5. That is, the array index is adjusted down by 5 steps, and the register data corresponding to the second parameter to be adjusted is obtained, reg[5]=0x06, that is, the corresponding second parameter to be adjusted vol[5] can be 1.358V, and its second parameter to be adjusted is greater than the set standard parameter 1.353V, and dif_vol=vol

[10] -Target=0.005V<set error range (step / 2). Then take the adjacent parameter to be adjusted vol[4]=1.311. Comparing the calculation results, it can be seen that the error between vol[5] and the set standard parameter is the smallest, that is, the voltage parameter to be adjusted of vol[5] can be used as the target adjustment parameter, and the register data corresponding to the target adjustment parameter can be written into the chip to be tested, thereby completing the adjustment of the chip to be tested.

[0098] Through such a setting in the present embodiment, judgment can be made based on the difference between the parameter to be adjusted and the set standard parameter, and a cyclic adjustment operation can be performed based on the judgment result and the number of adjustments until the target adjustment parameter is determined, so that the error of the determined target adjustment parameter is minimized, thereby further improving the accuracy and reliability of the target adjustment parameter.

[0099] In this embodiment, optionally, a linear correspondence is established based on the sorted list of parameters to be adjusted and the setting identification list, including: establishing an array identification list for storing corresponding register data according to the sorted list of parameters to be adjusted; and determining a linear correspondence between the array identification list and the sorted list of parameters to be adjusted.

[0100] The array identifier list is sorted by array index. In this embodiment, an array index list storing corresponding register data can be established based on the sorted parameter list to be adjusted, and then a one-to-one correspondence, i.e., a linear correspondence, between the array index list and the sorted parameter list to be adjusted can be established.

[0101] Exemplarily, the setting identifier in this embodiment is represented by an array index, and the parameter to be adjusted is a voltage adjustment parameter. Then, the voltage adjustment parameter vol value can be reordered to establish a linear correspondence between the array index and the increasing voltage adjustment parameter. In this embodiment, after reordering the multiple parameters to be adjusted in ascending order, the sorted list of voltage parameters to be adjusted vol can be: Vol[0-15]={1.064, 1.149, 1.220, 1.298, 1.311, 1.358, 1.415, 1.419, 1.497, 1.516, 1.569, 1.581, 1.642, 1.704, 1.801, 1.855};

[0102] At the same time, the array subscript identifier list for storing the corresponding register data value reg can be established as follows:

[0103] Reg[0~15]={0x07,0x03,0x05,0x01,0x0f,0x06,0x0b,0x02,0x0d,0x04,0x00,0x09,0x0e,0x0a,0x0c,0x08};

[0104] In this embodiment, the data subscript identifier can be represented by i, and the linear correspondence established according to the sorted list of voltage parameters to be adjusted and the list of array subscript identifiers can be shown in the following Table 1:

[0105] Table 1

[0106]

[0107]

[0108] In this embodiment, through such a setting, the linear correspondence between the sorted list of parameters to be adjusted and the array index list can be re-established to facilitate the adjustment operation on the chip to be tested.

[0109] The technical solution of the embodiment of the present invention is to obtain multiple register data of the chip to be tested and the corresponding multiple parameters to be adjusted; wherein the multiple parameters to be adjusted corresponding to the multiple register data have a set change relationship; sort the multiple parameters to be adjusted according to the set order to obtain a sorted list of parameters to be adjusted; establish a linear correspondence based on the sorted list of parameters to be adjusted and the set identification list; wherein the setting identification list carries register data; obtain initial register data; determine the first parameter to be adjusted corresponding to the initial register data based on the linear correspondence; perform adjustment operations according to the first parameter to be adjusted and the set standard parameters to obtain the target adjustment parameters. This technical solution can determine the target adjustment parameters based on the linear correspondence re-established between the parameters to be adjusted and the set identification list, so that the determined target adjustment parameters are more accurate, the chip adjustment quality is definitely improved, and the efficiency of the chip adjustment process is greatly improved.

[0110] Embodiment 3

[0111] Figure 4 1 is a schematic diagram of the structure of a chip parameter adjustment device provided according to the third embodiment of the present invention. Figure 4 As shown, the device comprises:

[0112] The data acquisition module 410 is used to acquire a plurality of register data of the chip to be tested and a plurality of corresponding parameters to be adjusted; wherein the plurality of parameters to be adjusted corresponding to the plurality of register data have a setting change relationship;

[0113] A sorting module 420 is used to sort the multiple parameters to be adjusted according to a set order to obtain a sorted list of parameters to be adjusted;

[0114] A relationship establishing module 430 is used to establish a linear correspondence relationship based on the sorted list of parameters to be adjusted and the list of setting identifiers; wherein the list of setting identifiers carries register data;

[0115] The target adjustment parameter determination module 440 is used to determine the target adjustment parameter according to the linear correspondence and the set standard parameter.

[0116] Optionally, the target adjustment parameter determination module 440 includes:

[0117] An initial register data acquisition unit, used for acquiring initial register data;

[0118] A first parameter-to-be-adjusted determining unit, configured to determine a first parameter to be adjusted corresponding to the initial register data based on a linear correspondence;

[0119] The adjustment unit is used to perform an adjustment operation according to the first parameter to be adjusted and the set standard parameter to obtain a target adjustment parameter.

[0120] Optional, trimming unit, including:

[0121] A parameter difference determination subunit, used to determine a parameter difference between a first parameter to be adjusted and a set standard parameter;

[0122] A judgment subunit is used to judge whether the parameter difference is less than a set error range;

[0123] The first target adjustment parameter determination subunit is used to determine the target adjustment parameter based on the first parameter to be adjusted if the parameter difference is less than the set error range.

[0124] Optionally, the target adjustment parameter determination subunit is specifically used to determine adjacent parameters to be adjusted of the first parameter to be adjusted according to a linear correspondence; subtract the adjacent parameters to be adjusted from the set standard parameters respectively to obtain operation results; and determine the target adjustment parameter according to the operation results.

[0125] Optionally, the identifier list is set to an array identifier list; the adjustment unit further includes:

[0126] The data acquisition subunit is used to obtain the current adjustment times and step value; wherein the step value is determined based on the linear correspondence;

[0127] The adjustment times judgment subunit is used to judge whether the current adjustment times are less than the set adjustment times if the parameter difference is greater than or equal to the set error range;

[0128] A step number determination subunit, for determining the step number based on the parameter difference and the step value if the current adjustment number is less than the set adjustment number;

[0129] An adjusting subunit, used for adjusting the array identifier of the first parameter to be adjusted according to the step number to obtain a second parameter to be adjusted;

[0130] The second target adjustment parameter determination subunit is used to continue the adjustment operation according to the second parameter to be adjusted and the set standard parameter to obtain the target adjustment parameter.

[0131] Optionally, the relationship establishment module 430 is specifically used to establish an array identification list for storing corresponding register data according to the sorted list of parameters to be adjusted; wherein the array identification list is sorted by array subscript; and determine the linear correspondence between the array identification list and the sorted list of parameters to be adjusted.

[0132] Optionally, the device also includes: a data writing module, which is used to write the target register data corresponding to the target trimming parameter into the chip under test after determining the target trimming parameter according to the linear correspondence and the set standard parameters, so as to complete the trimming of the chip under test.

[0133] A chip parameter adjustment device provided in an embodiment of the present invention can execute a chip parameter adjustment method provided in any embodiment of the present invention, and has corresponding functional modules and beneficial effects of the execution method.

[0134] Embodiment 4

[0135] Figure 5 1 is a schematic diagram of the structure of an electronic device provided according to Embodiment 4 of the present invention. The electronic device 10 is intended to represent various forms of digital computers, such as laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. The electronic device may also represent various forms of mobile devices, such as personal digital processing, cellular phones, smart phones, wearable devices (such as helmets, glasses, watches, etc.) and other similar computing devices. The components shown herein, their connections and relationships, and their functions are merely examples and are not intended to limit the implementation of the present invention described and / or required herein.

[0136] like Figure 5 As shown, the electronic device 10 includes at least one processor 11, and a memory connected to the at least one processor 11, such as a read-only memory (ROM) 12, a random access memory (RAM) 13, etc., wherein the memory stores a computer program that can be executed by at least one processor, and the processor 11 can perform various appropriate actions and processes according to the computer program stored in the read-only memory (ROM) 12 or the computer program loaded from the storage unit 18 to the random access memory (RAM) 13. In the RAM 13, various programs and data required for the operation of the electronic device 10 can also be stored. The processor 11, ROM 12 and RAM 13 are connected to each other through a bus 14. An input / output (I / O) interface 15 is also connected to the bus 14.

[0137] A number of components in the electronic device 10 are connected to the I / O interface 15, including: an input unit 16, such as a keyboard, a mouse, etc.; an output unit 17, such as various types of displays, speakers, etc.; a storage unit 18, such as a disk, an optical disk, etc.; and a communication unit 19, such as a network card, a modem, a wireless communication transceiver, etc. The communication unit 19 allows the electronic device 10 to exchange information / data with other devices through a computer network such as the Internet and / or various telecommunication networks.

[0138] The processor 11 may be a variety of general and / or special processing components with processing and computing capabilities. Some examples of the processor 11 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various special artificial intelligence (AI) computing chips, various processors running machine learning model algorithms, a digital signal processor (DSP), and any appropriate processor, controller, microcontroller, etc. The processor 11 executes the various methods and processes described above, such as the parameter adjustment method.

[0139] In some embodiments, the parameter adjustment method may be implemented as a computer program, which is tangibly contained in a computer-readable storage medium, such as a storage unit 18. In some embodiments, part or all of the computer program may be loaded and / or installed on the electronic device 10 via the ROM 12 and / or the communication unit 19. When the computer program is loaded into the RAM 13 and executed by the processor 11, one or more steps of the parameter adjustment method described above may be performed. Alternatively, in other embodiments, the processor 11 may be configured to perform the parameter adjustment method in any other appropriate manner (e.g., by means of firmware).

[0140] Various implementations of the systems and techniques described above herein can be implemented in digital electronic circuit systems, integrated circuit systems, field programmable gate arrays (FPGAs), application specific integrated circuits (ASICs), application specific standard products (ASSPs), systems on chips (SOCs), load programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. These various implementations can include: being implemented in one or more computer programs that can be executed and / or interpreted on a programmable system including at least one programmable processor, which can be a special purpose or general purpose programmable processor that can receive data and instructions from a storage system, at least one input device, and at least one output device, and transmit data and instructions to the storage system, the at least one input device, and the at least one output device.

[0141] Computer programs for implementing the methods of the present invention may be written in any combination of one or more programming languages. These computer programs may be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing device, so that when the computer program is executed by the processor, the functions / operations specified in the flow chart and / or block diagram are implemented. The computer program may be executed entirely on the machine, partially on the machine, partially on the machine and partially on a remote machine as a stand-alone software package, or entirely on a remote machine or server.

[0142] In the context of the present invention, a computer-readable storage medium may be a tangible medium that may contain or store a computer program for use by or in combination with an instruction execution system, device or equipment. A computer-readable storage medium may include, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, devices or equipment, or any suitable combination of the foregoing. Alternatively, a computer-readable storage medium may be a machine-readable signal medium. A more specific example of a machine-readable storage medium may include an electrical connection based on one or more lines, a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.

[0143] To provide interaction with a user, the systems and techniques described herein may be implemented on an electronic device having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to the user; and a keyboard and a pointing device (e.g., a mouse or trackball) through which the user can provide input to the electronic device. Other types of devices may also be used to provide interaction with the user; for example, the feedback provided to the user may be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user may be received in any form (including acoustic input, voice input, or tactile input).

[0144] The systems and techniques described herein may be implemented in a computing system that includes backend components (e.g., as a data server), or a computing system that includes middleware components (e.g., an application server), or a computing system that includes frontend components (e.g., a user computer with a graphical user interface or a web browser through which a user can interact with implementations of the systems and techniques described herein), or a computing system that includes any combination of such backend components, middleware components, or frontend components. The components of the system may be interconnected by any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include: a local area network (LAN), a wide area network (WAN), a blockchain network, and the Internet.

[0145] A computing system may include a client and a server. The client and the server are generally remote from each other and usually interact through a communication network. The client and server relationship is generated by computer programs running on the corresponding computers and having a client-server relationship with each other. The server may be a cloud server, also known as a cloud computing server or cloud host, which is a host product in the cloud computing service system to solve the defects of difficult management and weak business scalability in traditional physical hosts and VPS services.

[0146] It should be understood that the various forms of processes shown above can be used to reorder, add or delete steps. For example, the steps described in the present invention can be executed in parallel, sequentially or in different orders, as long as the desired results of the technical solution of the present invention can be achieved, and this document does not limit this.

[0147] The above specific implementations do not constitute a limitation on the protection scope of the present invention. It should be understood by those skilled in the art that various modifications, combinations, sub-combinations and substitutions can be made according to design requirements and other factors. Any modification, equivalent substitution and improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A chip parameter adjustment method, characterized in that: include: Acquire multiple register data of the chip to be tested and corresponding multiple parameters to be adjusted; wherein the multiple parameters to be adjusted corresponding to the multiple register data have a setting change relationship; Sorting the plurality of parameters to be adjusted according to a set order to obtain a sorted list of parameters to be adjusted; A linear correspondence is established based on the sorted list of parameters to be adjusted and the list of setting identifiers; wherein the list of setting identifiers carries the register data; The target adjustment parameter is determined according to the linear correspondence and the set standard parameter.

2. The method according to claim 1, characterized in that Determining a target adjustment parameter according to the linear correspondence and the set standard parameter includes: Get initial register data; Determine a first parameter to be adjusted corresponding to the initial register data based on the linear correspondence; An adjustment operation is performed according to the first parameter to be adjusted and the set standard parameter to obtain a target adjustment parameter.

3. The method according to claim 2, characterized in that Performing an adjustment operation according to the first parameter to be adjusted and the set standard parameter to obtain a target adjustment parameter includes: Determining a parameter difference between the first parameter to be adjusted and the set standard parameter; Determine whether the parameter difference is less than a set error range; If the parameter difference is smaller than the set error range, a target adjustment parameter is determined based on the first parameter to be adjusted.

4. The method according to claim 3, characterized in that Determining a target adjustment parameter based on the first parameter to be adjusted includes: Determine the adjacent parameter to be adjusted of the first parameter to be adjusted according to the linear corresponding relationship; Subtracting the adjacent parameters to be adjusted from the set standard parameters respectively to obtain operation results; The target adjustment parameter is determined according to the calculation result.

5. The method according to claim 3, characterized in that: The setting identifier list is an array identifier list; the method further includes: Obtaining the current adjustment times and step value; wherein the step value is determined based on the linear correspondence; If the parameter difference is greater than or equal to the set error range, determine whether the current adjustment times are less than the set adjustment times; If the current adjustment number is less than the set adjustment number, determining the step number based on the parameter difference and the step value; Adjusting the array identifier of the first parameter to be adjusted according to the step number to obtain a second parameter to be adjusted; The adjustment operation is continued according to the second parameter to be adjusted and the set standard parameter to obtain a target adjustment parameter.

6. The method according to claim 5, characterized in that A linear correspondence is established based on the sorted list of parameters to be adjusted and the list of setting identifiers, including: According to the sorted list of parameters to be adjusted, an array identification list for storing corresponding register data is established; wherein the array identification list is sorted by array subscript; Determine a linear correspondence between the array identifier list and the sorted list of parameters to be adjusted.

7. The method according to claim 1, characterized in that After determining the target adjustment parameter according to the linear correspondence and the set standard parameter, the method further includes: The target register data corresponding to the target trimming parameter is written into the chip to be tested, so as to complete the trimming of the chip to be tested.

8. A chip parameter adjustment device, characterized in that: include: A data acquisition module, used for acquiring a plurality of register data of the chip to be tested and a plurality of corresponding parameters to be adjusted; wherein the plurality of parameters to be adjusted corresponding to the plurality of register data have a setting change relationship; A sorting module, used for sorting the plurality of parameters to be adjusted according to a set order to obtain a sorted list of parameters to be adjusted; A relationship establishing module, used for establishing a linear correspondence relationship based on the sorted list of parameters to be adjusted and the list of setting identifiers; wherein the list of setting identifiers carries the register data; The target adjustment parameter determination module is used to determine the target adjustment parameter according to the linear correspondence and the set standard parameter.

9. An electronic device, characterized in that: The electronic device comprises: at least one processor; and a memory communicatively connected to the at least one processor; wherein, The memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor so that the at least one processor can execute the chip parameter adjustment method according to any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores computer instructions, and the computer instructions are used to enable a processor to implement the chip parameter adjustment method according to any one of claims 1 to 7 when executed.

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