Chip testing device with storage location

Abstract

The application provides a chip testing device with a storage position, which comprises a testing load board and a clamp arranged on the testing load board. The clamp comprises a clamp base and a clamp cover. The clamp base is connected to one side of the testing load board. The clamp base has a chip bearing position for bearing a chip to be tested. The chip testing device further comprises a clamp cover storage structure. The clamp cover storage structure is connected to the side of the testing load board which is away from the clamp base. The clamp cover is selectively connected to the clamp base or the clamp cover storage structure. In a first working state, the clamp cover is connected to the clamp base and presses against the chip to be tested, so that the chip to be tested is electrically connected to the testing load board through the clamp base. In a second working state, the clamp cover is connected to the clamp cover storage structure. The application avoids loss of the clamp cover, reduces the space occupation, shortens the transfer route of the clamp cover, and improves the testing efficiency.

Description

Technical Field

[0001] This invention relates to the field of chip testing technology, and more specifically, to a chip testing device with its own storage location. Background Technology

[0002] In chip packaging and testing, a chip testing device is required. This device includes a fixture for holding the chip, comprising a fixture base and a fixture cover. During debugging, the fixture cover is used to close the fixture base to press the chip firmly, thereby electrically connecting the chip to the circuitry on the test load board. However, in mass production, robotic arms are used instead of manual labor. The chip can be pressed firmly by the robotic arm, in which case only the fixture base is needed, and the fixture cover is not required.

[0003] Currently, when not in use, the fixture cover is usually stored in a unified space for manual verification in case of mass production anomalies or low yields. Due to the diversity of chips, fixtures are custom-made and not universal, which means that storing the fixture cover requires a large space. Moreover, the storage space is usually far from the usage space, and moving the fixture cover will affect the testing efficiency. Summary of the Invention

[0004] The purpose of this invention is to provide a chip testing device with a built-in storage location, which solves the technical problem that the fixture cover occupies a large space and affects testing efficiency during chip testing. The specific solution is as follows:

[0005] According to a specific embodiment of the present invention, the present invention provides a chip testing device with a built-in storage location, including a test load board and a fixture disposed on the test load board. The fixture includes a fixture base and a fixture cover. The fixture base is connected to one side of the test load board and has a chip support position for supporting the chip under test.

[0006] The chip testing apparatus further includes a fixture cover storage structure, which is connected to the side of the test load board opposite to the fixture base. The fixture cover can be selectively connected to either the fixture base or the fixture cover storage structure.

[0007] In the first working state, the clamp cover of the chip testing device is connected to the clamp base and presses against the chip under test, so that the chip under test is electrically connected to the test load board through the clamp base. In the second working state, the clamp cover is connected to the clamp cover storage structure.

[0008] Optionally, the fixture cover includes a main structure and a first snap-fit ​​structure disposed on the main structure, the fixture base includes a support portion and a second snap-fit ​​structure disposed on the support portion, the chip support position is disposed on the support portion, and in the first working state, the first snap-fit ​​structure is engaged with the second snap-fit ​​structure, and the main structure presses against the chip under test.

[0009] Optionally, the first snap-fit ​​structure has a snap-fit ​​connector, and the second snap-fit ​​structure has a snap-fit ​​groove, wherein the snap-fit ​​connector can snap into the snap-fit ​​groove.

[0010] Optionally, the clamp cover includes a main body structure and a first snap-fit ​​structure disposed on the main body structure, and the clamp cover storage structure includes a body part and a third snap-fit ​​structure disposed on the body part. In the second working state, the first snap-fit ​​structure is engaged with the third snap-fit ​​structure.

[0011] Optionally, the first snap-fit ​​structure has a snap-fit ​​connector, and the third snap-fit ​​structure has a snap-fit ​​groove, wherein the snap-fit ​​connector can snap into the snap-fit ​​groove.

[0012] Optionally, one end of the first snap-fit ​​structure is formed as the snap-fit ​​connector, and the other end is formed as a force-applying part. The portion of the first snap-fit ​​structure located between the snap-fit ​​connector and the force-applying part is hinged to the main body structure.

[0013] The clamp cover also includes an elastic element, the two ends of which are respectively connected to the first snap-fit ​​structure and the main body structure. In its natural state, the snap-fit ​​connector is snapped into the snap-fit ​​groove under the action of the elastic element. When the force-applying part is subjected to pressing pressure, it can drive the snap-fit ​​connector to disengage from the snap-fit ​​groove.

[0014] Optionally, there are two snap-fit ​​connectors arranged opposite each other, and two snap-fit ​​slots arranged opposite each other, with the two snap-fit ​​connectors snapping into the two snap-fit ​​slots in a one-to-one correspondence.

[0015] Optionally, the main structure includes a substrate and a pressing member movably disposed on the substrate. The first snap-fit ​​structure is connected to the substrate, and the pressing member is movable relative to the substrate in a direction toward or away from the chip carrier position to press or release the chip under test carried on the chip carrier position.

[0016] Optionally, the substrate has a threaded hole, and the pressing member includes an external threaded shaft and a pressing part rotatably connected to one end of the external threaded shaft. The external threaded shaft is threaded to the threaded hole. The external threaded shaft can drive the pressing part to move in a direction toward or away from the chip support position by screwing, so that the pressing part presses against or releases the chip under test.

[0017] Optionally, the pressing member further includes a gripping and screwing part connected to one end of the external threaded shaft opposite to the pressing part.

[0018] Compared with the prior art, the embodiments of the present invention have the following technical effects:

[0019] The fixture cover in the chip testing apparatus provided in this embodiment can be selectively connected to a fixture base or a fixture cover storage structure. When the fixture cover is needed during testing, it is connected to the fixture base so that the fixture cover presses against the chip under test, allowing the chip under test to be electrically connected to the test load board through the fixture base, thus enabling testing of the chip under test. When the fixture cover is not needed during testing, it is connected to the fixture cover storage structure for storage, which avoids loss of the fixture cover, reduces space occupation, and shortens the transfer route of the fixture cover, thereby improving testing efficiency. Attached Figure Description

[0020] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and, together with the description, serve to explain the principles of the invention. It is obvious that the drawings described below are merely some embodiments of the invention, and those skilled in the art can obtain other drawings based on these drawings without any inventive effort. In the drawings:

[0021] Figure 1 This is a front view of a chip testing apparatus in its first operating state, according to some embodiments of the present invention.

[0022] Figure 2 This is a front view of a chip testing apparatus in a second operating state, according to some embodiments of the present invention.

[0023] Figure 3 This is a three-dimensional structural diagram of a portion of the chip testing apparatus in the first operating state according to some embodiments of the present invention.

[0024] Figure 4 This is a side view of a portion of the structure of a chip testing apparatus in a first operating state, according to some embodiments of the present invention.

[0025] Figure 5 This is a cross-sectional view of the clamp cover according to some embodiments of the present invention.

[0026] Figure 6 This is an exploded view of a portion of the structure of a chip testing apparatus according to some embodiments of the present invention.

[0027] Explanation of reference numerals in the attached figures:

[0028] The components include: chip under test 100, test load board 1, fixture 2, fixture base 21, bearing part 211, middle pin seat 2111, limit frame 2112, base plate 2113, spring pin 2114, positioning pin 2115, fixing nut 2116, second snap-fit ​​structure 212, fixture cover 22, main structure 221, base 2211, gripping rotating part 2212, threaded shaft 2213, first pressure head 2214, second pressure head 2215, first snap-fit ​​structure 222, snap-fit ​​connector 2221, force application part 2222, fixture cover storage structure 3, main body part 31, and third snap-fit ​​structure 32. Detailed Implementation

[0029] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this invention, and not all of them. Based on the embodiments of this invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this invention.

[0030] The terminology used in the embodiments of this invention is for the purpose of describing particular embodiments only and is not intended to limit the invention. The singular forms “a,” “the,” and “the” as used in the embodiments of this invention and the appended claims are also intended to include the plural forms, and “multiple” generally includes at least two unless the context clearly indicates otherwise.

[0031] It should be understood that the term "and / or" used in this article is merely a description of the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A existing alone, A and B existing simultaneously, and B existing alone. Additionally, the character " / " in this article generally indicates that the preceding and following related objects have an "or" relationship.

[0032] It should be understood that although the terms first, second, third, etc., may be used in the embodiments of the present invention, these are not intended to limit the scope of the invention. These terms are used only to distinguish the parts. For example, first may also be referred to as second, and similarly, second may also be referred to as first, without departing from the scope of the embodiments of the invention.

[0033] It should also be noted that the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that an article or device that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such an article or device. Without further limitation, an element defined by the phrase "comprising one" does not exclude the presence of other identical elements in the article or device that includes said element.

[0034] The optional embodiments of the present invention will now be described in detail with reference to the accompanying drawings.

[0035] Figure 1 This is a front view of a chip testing apparatus in its first operating state, according to some embodiments of the present invention. Figure 2 This is a front view of a chip testing apparatus in a second operating state, according to some embodiments of the present invention. Figure 3 This is a three-dimensional structural diagram of a portion of the chip testing apparatus in the first operating state according to some embodiments of the present invention. Figure 4 This is a side view of a portion of the structure of a chip testing apparatus in a first operating state, according to some embodiments of the present invention.

[0036] Figure 5 This is a cross-sectional view of the clamp cover according to some embodiments of the present invention. Figure 6 This is an exploded view of a portion of the structure of a chip testing apparatus according to some embodiments of the present invention.

[0037] like Figures 1 to 4 As shown, this embodiment of the present disclosure provides a chip testing device with a built-in storage location, including a test load board 1 and a fixture 2 disposed on the test load board 1. The fixture 2 includes a fixture base 21 and a fixture cover 22. The fixture base 21 is connected to one side of the test load board 1 and has a chip support position for supporting the chip 100 under test. The chip testing device also includes a fixture cover storage structure 3, which is connected to the side of the test load board 1 opposite to the fixture base 21. The fixture cover 22 can be selectively connected to either the fixture base 21 or the fixture cover storage structure 3. In a first working state, the fixture cover 22 is connected to the fixture base 21 and presses against the chip 100 under test, so that the chip 100 under test is electrically connected to the test load board 1 through the fixture base 21. In a second working state, the fixture cover 22 is connected to the fixture cover storage structure 3.

[0038] "The clamp cover 22 can be selectively connected to the clamp base 21 or the clamp cover storage structure 3," indicating that the clamp cover 22 can be connected to the clamp base 21 and can be removed from the clamp base 21, or it can be connected to the clamp cover storage structure 3 and can be removed from the clamp cover storage structure 3. The connection method between the clamp cover 22 and the clamp base 21 can be, but is not limited to, snap-fit, threaded connection, plug-in, etc. The connection method between the clamp cover 22 and the clamp cover storage structure 3 can be, but is not limited to, snap-fit, threaded connection, plug-in, or containment, etc. Specifically, the containment method means that the clamp cover storage structure 3 is an openable housing, and in the second working state, the clamp cover 22 is contained within the housing that serves as the clamp cover storage structure 3.

[0039] Test load board 1 refers to a test tool used to test semiconductor chips. It is a printed circuit board with a series of interfaces and pins for connecting the chip under test 100 to the test equipment. Test load board 1 also includes circuits and components to provide test signals and power to ensure that the chip under test 100 can function properly. The specific structure of test load board 1 and the specific methods for testing the chip can be found in existing technology and will not be described in detail here.

[0040] The fixture base 21 is a component used to carry the chip under test 100 and electrically connect the chip under test 100 to the test load board 1. The fixture base 21 has a chip carrier position for carrying the chip under test 100. A conductor is provided in the chip carrier position. One end of the conductor is electrically connected to the circuit of the test load board 1, and the other end extends into the chip carrier position. In this way, the chip under test 100 is placed in the chip carrier position, and when it is subjected to pressure, the circuit of the chip under test 100 is electrically connected to the conductor, thereby realizing the electrical connection between the chip under test 100 and the test load board 1, and thus enabling testing.

[0041] The fixture cover 22 in the chip testing apparatus provided in this embodiment can be selectively connected to the fixture base 21 or the fixture cover storage structure 3. When the fixture cover 22 is needed during testing, it is connected to the fixture base 21 so that the fixture cover 22 presses against the chip under test 100, so that the chip under test 100 is electrically connected to the test load board 1 through the fixture base 21, thereby realizing the testing of the chip under test 100. When the fixture cover 22 is not needed during testing, it is connected to the fixture cover storage structure 3 to store the fixture cover 22, which not only avoids the loss of the fixture cover 22, but also reduces the space occupied, and shortens the transfer route of the fixture cover 22, thereby improving the testing efficiency.

[0042] In one embodiment of the present invention, such as Figure 1 and Figure 2 As shown, the fixture cover 22 includes a main structure 221 and a first snap-fit ​​structure 222 disposed on the main structure 221. The fixture base 21 includes a support portion 211 and a second snap-fit ​​structure 212 disposed on the support portion 211. The chip support position is disposed on the support portion 211. In the first working state, the first snap-fit ​​structure 222 engages with the second snap-fit ​​structure 212, and the main structure 221 presses against the chip 100 under test.

[0043] The engagement of the first snap-fit ​​structure 222 and the second snap-fit ​​structure 212 can be achieved by the engagement of the snap-fit ​​groove and the snap-fit ​​connector 2221. Specifically, one of the first snap-fit ​​structure 222 and the second snap-fit ​​structure 212 has a snap-fit ​​groove, and the other has a snap-fit ​​connector 2221. The snap-fit ​​connector 2221 engages with the snap-fit ​​groove, thereby achieving the engagement of the first snap-fit ​​structure 222 and the second snap-fit ​​structure 212.

[0044] The clamp cover 22 and the clamp base 21 are detachably connected by the first snap-fit ​​structure 222 and the second snap-fit ​​structure 212. This not only improves the connection reliability between the clamp cover 22 and the clamp base 21, but also facilitates the installation and removal of the clamp cover 22 on the clamp base 21.

[0045] In one embodiment of the present invention, such as Figures 2 to 5 As shown, the first snap-fit ​​structure 222 forms a snap-fit ​​connector 2221, and the second snap-fit ​​structure 212 forms a snap-fit ​​groove, wherein the snap-fit ​​connector 2221 can snap into the snap-fit ​​groove.

[0046] In the first working state, the snap-fit ​​connector 2221 snaps into the snap-fit ​​groove, realizing the snap-fit ​​of the first snap-fit ​​structure 222 and the second snap-fit ​​structure 212, thereby realizing the detachable connection between the clamp cover 22 and the clamp base 21.

[0047] In one embodiment of the present invention, such as Figure 2 and Figure 6 As shown, the carrier 211 includes a central pin holder 2111, a base plate 2113 connected to the bottom of the central pin holder 2111, and a limiting frame 2112 disposed within the central pin holder 2111. A spring pin 2114 is disposed within the central pin holder 2111. The bottom end of the spring pin 2114 passes through the base plate 2113 and is electrically connected to the circuit of the test load board 1. The top end of the spring pin 2114 extends into the internal space of the limiting frame 2112. The internal space of the limiting frame 2112 forms a chip carrier position.

[0048] Thus, when the chip under test 100 is placed on the chip carrier position of the fixture base 21, the limiting frame 2112 restricts the chip under test 100 around its perimeter, limiting the circumferential position of the chip under test 100, preventing the chip under test 100 from shifting when pressed, which would affect the accuracy of the alignment between the chip under test 100 and the spring pin 2114, thereby improving the stability of the electrical connection between the chip under test 100 and the test load board 1.

[0049] like Figure 6 As shown, the second snap-fit ​​structure 212 is disposed on the circumferential outer wall of the central pin seat 2111.

[0050] In one embodiment of the present invention, such as Figure 6As shown, the center needle seat 2111 is provided with several positioning pins 2115, and the limiting frame 2112 is provided with several positioning holes. The several positioning pins 2115 are inserted into the several positioning holes one by one.

[0051] The matching arrangement of the positioning pin 2115 and the positioning hole improves the convenience and accuracy of the alignment between the center needle seat 2111 and the limit frame 2112.

[0052] In one embodiment of the present invention, such as Figure 6 As shown, the center needle seat 2111 is provided with several fixing nuts 2116, and the limiting frame 2112 is provided with several mounting holes. The mounting holes and the fixing nuts 2116 are aligned one to one, and each set of aligned mounting holes and fixing nuts 2116 is secured with a bolt.

[0053] In this way, the limiting frame 2112 is fixedly connected within the needle holder 2111.

[0054] In one embodiment of the present invention, such as Figure 1 and Figure 2 As shown, the clamp cover 22 includes a main body structure 221 and a first snap-fit ​​structure 222 disposed on the main body structure 221. The clamp cover storage structure 3 includes a main body part 31 and a third snap-fit ​​structure 32 disposed on the main body part 31. In the second working state, the first snap-fit ​​structure 222 engages with the third snap-fit ​​structure 32.

[0055] The engagement of the first snap-fit ​​structure 222 and the third snap-fit ​​structure 32 can be achieved by the engagement of the snap-fit ​​groove and the snap-fit ​​connector 2221. Specifically, one of the first snap-fit ​​structure 222 and the third snap-fit ​​structure 32 has a snap-fit ​​groove, and the other has a snap-fit ​​connector 2221. The snap-fit ​​connector 2221 engages with the snap-fit ​​groove, thereby achieving the engagement of the first snap-fit ​​structure 222 and the third snap-fit ​​structure 32.

[0056] In the second working state, the first snap-fit ​​structure 222 engages with the third snap-fit ​​structure 32, realizing the detachable connection between the clamp cover 22 and the clamp cover storage structure 3. This not only improves the connection reliability between the clamp cover 22 and the clamp cover storage structure 3, but also facilitates the assembly and disassembly of the clamp cover 22 on the clamp cover storage structure 3.

[0057] In one embodiment of the present invention, such as Figure 1 and Figure 5 As shown, the first snap-fit ​​structure 222 forms a snap-fit ​​connector 2221, and the third snap-fit ​​structure 32 forms a snap-fit ​​groove, wherein the snap-fit ​​connector 2221 can snap into the snap-fit ​​groove.

[0058] In the second working state, the snap-fit ​​connector 2221 snaps into the snap-fit ​​groove of the third snap-fit ​​structure 32, realizing the snap-fit ​​between the first snap-fit ​​structure 222 and the third snap-fit ​​structure 32, thereby realizing the detachable connection between the clamp cover 22 and the clamp cover storage structure 3.

[0059] In one embodiment of the present invention, the circumferential outer contour of the clamp cover storage structure 3 and the circumferential outer contour of the clamp base 21 are basically the same, and the snap-fit ​​groove of the clamp cover storage structure 3 and the snap-fit ​​groove of the clamp base 21 have the same structure.

[0060] Since the snap-fit ​​groove of the clamp cover storage structure 3 and the snap-fit ​​groove of the clamp base 21 are both engaged with the snap-fit ​​connector 2221 of the first snap-fit ​​structure 222, the above arrangement allows the snap-fit ​​connector 2221 to be adapted to the snap-fit ​​groove of the clamp cover storage structure 3 and the snap-fit ​​groove of the clamp base 21. Moreover, it saves investment in the structural design of the clamp cover storage structure 3 during the design phase.

[0061] In one embodiment of the present invention, one end of the first snap-fit ​​structure 222 is formed as a snap-fit ​​connector 2221, and the other end is formed as a force-applying part 2222. The portion of the first snap-fit ​​structure 222 located between the snap-fit ​​connector 2221 and the force-applying part 2222 is hinged to the main body structure 221. The clamp cover 22 also includes an elastic member. The two ends of the elastic member are respectively connected to the first snap-fit ​​structure 222 and the main body structure 221. In the natural state, the snap-fit ​​connector 2221 is snapped into the snap-fit ​​groove under the action of the elastic member. When the force-applying part 2222 is subjected to pressing pressure, it can drive the snap-fit ​​connector 2221 to disengage from the snap-fit ​​groove.

[0062] The elastic element can be a torsion spring located at the hinge point between the first snap-fit ​​structure 222 and the main structure 221, or a helical spring located near the snap-fit ​​joint 2221 or the force-applying part 2222, etc.

[0063] In this way, the snap-fit ​​connector 2221 can be snapped into the snap-fit ​​groove of the clamp base 21 or the snap-fit ​​groove of the clamp cover storage structure 3, and the snap-fit ​​connector 2221 can be released from the snap-fit ​​groove of the clamp base 21 or the snap-fit ​​groove of the clamp cover storage structure 3 by pressing the force application part 2222. The operation is simple, time-saving and labor-saving.

[0064] In one embodiment of the present invention, two snap-fit ​​connectors 2221 are arranged opposite to each other, and two snap-fit ​​slots are arranged opposite to each other, with the two snap-fit ​​connectors 2221 snapping into the two snap-fit ​​slots in a one-to-one correspondence.

[0065] It is understandable that the snap-fit ​​groove here can be the snap-fit ​​groove of the clamp base 21, that is, the clamp cover 22 can be connected to the clamp base 2 by the two snap-fit ​​joints 2221 and the two snap-fit ​​grooves of the clamp base 21 in a one-to-one snap-fit; the snap-fit ​​groove here can also be the snap-fit ​​groove of the clamp cover storage structure 3, and the clamp cover 22 can be connected to the clamp cover storage structure 3 by the two snap-fit ​​joints 2221 and the two snap-fit ​​grooves of the clamp cover storage structure 3 in a one-to-one snap-fit.

[0066] For example, the clamp cover 22 includes two first snap-fit ​​structures 222, which are respectively disposed on opposite sides of the main body structure 221, and the snap-fit ​​joints 2221 of the two first snap-fit ​​structures 222 are disposed opposite to each other; the clamp base 21 includes two second snap-fit ​​structures 212, whose snap-fit ​​grooves are disposed opposite to each other and are respectively disposed on opposite sides of the bearing portion 211; the clamp cover storage structure 3 includes two third snap-fit ​​structures 32, whose snap-fit ​​grooves are disposed opposite to each other and are respectively disposed on opposite sides of the main body portion 31.

[0067] This improves the locking reliability of the clamp cover 22 and the clamp base 21, and also improves the locking reliability of the clamp cover 22 and the clamp cover storage structure 3.

[0068] In one embodiment of the present invention, the main structure 221 includes a base 2211 and a pressing member movably disposed on the base 2211. A first snap-fit ​​structure 222 is connected to the base 2211. The pressing member can move relative to the base 2211 in a direction toward or away from the chip carrier position to press or release the chip 100 under test carried on the chip carrier position.

[0069] Thus, in the first working state, the fixture cover 22 is connected to the fixture base 21, and the pressing member moves to press against the chip under test 100, so that the chip under test 100 is electrically connected to the spring pin in the fixture base 21, thereby realizing the electrical connection between the chip under test 100 and the test load board 1, and thus enabling testing.

[0070] In one embodiment of the present invention, such as Figure 5 As shown, the substrate 2211 has a threaded hole, and the pressing member includes an external threaded shaft 2213 and a pressing part rotatably connected to one end of the external threaded shaft 2213. The external threaded shaft 2213 is threadedly connected to the threaded hole. The external threaded shaft 2213 can drive the pressing part to move in the direction toward or away from the chip carrier position by screwing, so that the pressing part presses against or releases the chip 100 under test.

[0071] The threaded connection allows the pressing part to move in a straight line when rotating, enabling the pressing part to move closer to or further away from the chip support position. The structure is simple, the operation is convenient, and it saves time and effort.

[0072] In one embodiment of the present invention, such as Figure 6 As shown, the pressing part includes a first pressing head 2214 and a second pressing head 2215 sleeved on the outer periphery of the first pressing head 2214. The first pressing head 2214 presses against the top of the chip 100 under test, and the bottom of the second pressing head 2215 is provided with a protrusion. The protrusion presses against the conductive terminal on the side of the chip 100 under test, pressing the conductive terminal tightly against the spring pin 2114 of the fixture base 21.

[0073] In this way, the pressing part can press the chip under test 100 tightly, which improves the stability of the electrical connection between the chip under test 100 and the test load board 1.

[0074] In one embodiment of the present invention, the pressing member further includes a gripping rotation part 2212 connected to the external threaded shaft 2213, the gripping rotation part 2212 being located outside the base 2211.

[0075] By twisting the rotating part 2212, the external threaded shaft 2213 can be rotated, simplifying the operation of twisting the pressing part.

[0076] In one embodiment of the present invention, the clamp cover storage structure 3 is bonded to the test load plate.

[0077] The connection is made by adhesive bonding, which will not affect the internal circuitry of the test load board 1.

[0078] Finally, it should be noted that the various embodiments in this specification are described in a progressive manner, with each embodiment focusing on its differences from other embodiments. Similar or identical parts between embodiments can be referred to interchangeably. For the systems or apparatus disclosed in the embodiments, since they correspond to the methods disclosed in the embodiments, the descriptions are relatively simple, and relevant parts can be referred to the method section.

[0079] The above embodiments are only used to illustrate the technical solutions of this disclosure, and are not intended to limit it. Although this disclosure has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this disclosure.

Claims

1. A chip testing device with its own storage location, comprising a test load board and a fixture disposed on the test load board, characterized in that, The fixture includes a fixture base and a fixture cover. The fixture base is connected to one side of the test load board, and the fixture base has a chip carrier position for carrying the chip under test. The chip testing apparatus further includes a fixture cover storage structure, which is connected to the side of the test load board opposite to the fixture base. The fixture cover is connected to either the fixture base or the fixture cover storage structure. In the first operating state, the fixture cover of the chip testing apparatus is connected to the fixture base and presses against the chip under test, so that the chip under test is electrically connected to the test load board through the fixture base. In the second operating state, the fixture cover is connected to the fixture cover storage structure. The fixture cover includes a main structure and a first snap-fit ​​structure disposed on the main structure. The fixture base includes a support portion and a second snap-fit ​​structure disposed on the support portion. The chip support position is disposed on the support portion. In the first working state, the first snap-fit ​​structure engages with the second snap-fit ​​structure, and the main structure presses against the chip under test. The first snap-fit ​​structure has a snap-fit ​​connector, and the second snap-fit ​​structure has a snap-fit ​​groove, wherein the snap-fit ​​connector can snap into the snap-fit ​​groove. The clamp cover includes a main structure and a first snap-fit ​​structure disposed on the main structure. The clamp cover storage structure includes a body portion and a third snap-fit ​​structure disposed on the body portion. In the second working state, the first snap-fit ​​structure engages with the third snap-fit ​​structure. One end of the first snap-fit ​​structure is formed as the snap-fit ​​connector, and the other end is formed as the force-applying part. The portion of the first snap-fit ​​structure located between the snap-fit ​​connector and the force-applying part is hinged to the main body structure. The clamp cover also includes an elastic element, the two ends of which are respectively connected to the first snap-fit ​​structure and the main body structure. In its natural state, the snap-fit ​​connector is snapped into the snap-fit ​​groove under the action of the elastic element. When the force-applying part is subjected to pressing pressure, it can drive the snap-fit ​​connector to disengage from the snap-fit ​​groove.

2. The chip testing apparatus according to claim 1, characterized in that, The first snap-fit ​​structure has a snap-fit ​​connector, and the third snap-fit ​​structure has a snap-fit ​​groove, wherein the snap-fit ​​connector can snap into the snap-fit ​​groove.

3. The chip testing apparatus according to claim 1 or 2, characterized in that, Two snap-fit ​​connectors are arranged opposite each other, and two snap-fit ​​slots are arranged opposite each other. The two snap-fit ​​connectors are snapped into the two snap-fit ​​slots in a one-to-one correspondence.

4. The chip testing apparatus according to claim 1, characterized in that, The main structure includes a substrate and a pressing member movably disposed on the substrate. The first snap-fit ​​structure is connected to the substrate. The pressing member is movable relative to the substrate in a direction toward or away from the chip carrier position to press or release the chip under test carried on the chip carrier position.

5. The chip testing apparatus according to claim 4, characterized in that, The substrate has a threaded hole, and the pressing member includes an external threaded shaft and a pressing part rotatably connected to one end of the external threaded shaft. The external threaded shaft is threaded to the threaded hole. The external threaded shaft can drive the pressing part to move in a direction toward or away from the chip support position by screwing, so that the pressing part presses against or releases the chip under test.

6. The chip testing apparatus according to claim 5, characterized in that, The pressing component also includes a gripping and screwing part connected to one end of the external threaded shaft that is opposite to the pressing part.

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