Infrared image non-uniformity correction method, device, equipment and storage medium
The noise filtering algorithm processes high-frequency noise data in the defocused image and corrects the infrared image, solving the problem of infrared detector response drift, realizing the miniaturization and efficient correction of infrared imaging equipment, and adapting to the correction needs in different scenarios. .
Patent Information
- Application Number
- CN202410308656.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2024-03-18
- Publication Date
- 2024-12-31
- Estimated Expiration
- 2044-03-18
AI Technical Summary
The response of infrared detectors will drift under the influence of factors such as temperature changes and voltage instability, resulting in a change in the voltage at the output of the circuit. In the prior art, the shutter structure is usually required to be corrected, but this limits the miniaturization and high reliability of the equipment. , and at the same time, it is difficult to achieve long-term static correction in motion scenarios.
By acquiring high-frequency noise data in the defocused image, using the noise filtering algorithm to obtain the noise image, correct the current frame image based on the noise image in the current state, remove high-frequency noise information, and realize non-uniformity correction without requiring The shutter structure reduces costs and realizes the miniaturization of infrared imaging movement.
Effectively remove high-frequency noise information in infrared images, reduce the size and cost of the equipment, improve the stability and reliability of infrared imaging equipment, and adapt to the correction needs in different scenarios.
Smart Images

Figure CN118037607B_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the field of autonomous driving technology, and in particular to an infrared image non-uniformity correction method, device, equipment and computer-readable storage medium. Background Art
[0002] Any object with a temperature above absolute zero will radiate energy outward, and the amount of energy is related to the temperature. Light with a wavelength of 2 to 1000 microns is invisible to humans and is called infrared light. Infrared thermal imaging equipment uses infrared detectors to detect and image infrared thermal radiation, presenting infrared light that is invisible to the human eye in the form of a two-dimensional image. In the 8-12μm band, there is a corresponding relationship between the temperature of an object and its radiation energy, and the response of the infrared detector is linearly related to the received energy, so at the same operating temperature, there is a fixed mapping relationship between the response and the temperature of the object. Due to the influence of factors such as temperature changes and voltage instability, the voltage at the output end of the circuit changes, and is gradually amplified and transmitted, causing the voltage at the output end of the circuit to move up and down from the original fixed value, causing the response of the infrared detector to drift. Because the pixel response of the infrared detector will drift differently over time, a motor shutter is required to correct the drift, which makes it difficult to miniaturize the movement. Summary of the invention
[0003] In order to solve the existing technical problems, the embodiments of the present invention provide an infrared image non-uniformity correction method, device, equipment and computer-readable storage medium, which can effectively remove high-frequency noise information in the image, and this non-uniformity correction method does not require a shutter structure, reduces costs, and miniaturizes the infrared imaging movement.
[0004] In a first aspect, a method for correcting non-uniformity of an infrared image is provided, comprising:
[0005] Get the current frame image;
[0006] Acquire a noise image corresponding to the current state, wherein the noise image is an image obtained by processing a defocused image using a noise filtering algorithm, and the defocused image is an image obtained by an infrared thermal imaging device in a defocused state;
[0007] The current frame image is corrected according to the noise image corresponding to the current state to obtain a corrected image corresponding to the current frame image.
[0008] The second aspect is an acquisition module, which is used to acquire the current frame image;
[0009] The acquisition module is also used to acquire a noise image corresponding to the current state, wherein the noise image is an image obtained by processing a defocused image using a noise filtering algorithm, and the defocused image is an image obtained by the infrared thermal imaging device in a defocused state;
[0010] The correction module is used to obtain a corrected image corresponding to the current frame image according to the current frame image and the noise image corresponding to the current state.
[0011] In a third aspect, an infrared thermal imaging device is provided, comprising a memory and a processor, wherein the memory stores a computer program, and when the computer program is executed by the processor, the processor executes the steps of the infrared image non-uniformity correction method provided in an embodiment of the present application.
[0012] In a fourth aspect, a storage medium is provided, storing a computer program. When the computer program is executed by a processor, the processor executes the steps of the infrared image non-uniformity correction method provided in the embodiment of the present application.
[0013] In the above embodiment, a defocused image is acquired, which is an image acquired when the infrared thermal imaging device is in a defocused state. The defocused image includes high-frequency noise data. The effective high-frequency noise data in the defocused image can be extracted through a filtering algorithm, so that more effective high-frequency noise data is retained in the noise image. Therefore, the current frame image is corrected based on the noise image in the current state, and the high-frequency noise information in the current frame can be effectively removed. Moreover, this non-uniformity correction method does not require a shutter structure, thereby reducing costs and miniaturizing the infrared imaging movement. BRIEF DESCRIPTION OF THE DRAWINGS
[0014] Figure 1 A diagram showing an application environment of an infrared image non-uniformity correction method in an embodiment;
[0015] Figure 2 is a schematic diagram of an infrared thermal imaging device in a focusing state in one embodiment;
[0016] Figure 3 A schematic diagram of an infrared thermal imaging device in an embodiment when the device is in a defocused state;
[0017] Figure 4 is a flow chart of a method for correcting non-uniformity of infrared images in one embodiment;
[0018] Figure 5 A schematic diagram of processing a pixel point in a defocused image using a noise filtering algorithm in one embodiment;
[0019] Figure 6 is a schematic diagram of an infrared image non-uniformity correction device in one embodiment;
[0020] Figure 7 Schematic diagram of an infrared thermal imaging device in one embodiment. DETAILED DESCRIPTION
[0021] The technical solution of the present invention is further described in detail below in conjunction with the accompanying drawings and specific embodiments.
[0022] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those generally understood by those skilled in the art of the technical field of the present invention. The terms used herein in the specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the scope of protection of the present invention. The term "and / or" used herein includes any and all combinations of one or more related listed items.
[0023] In the following description, reference is made to “some embodiments”, which describes a subset of all possible embodiments, but it should be understood that “some embodiments” may be the same subset or different subsets of all possible embodiments and may be combined with each other without conflict.
[0024] See also Figure 1 , is an application environment diagram of an infrared image non-uniformity correction method in an embodiment. The infrared image non-uniformity correction method is applied to an infrared thermal imaging device 10, which includes a controller 100, a lens 101, a detector 102, and a display device 103. The controller 100 is connected to the lens 101, the detector 102, and the display device 103, respectively. The detector 102 includes a plurality of pixels, which are also called pixel points or pixel points, and are the smallest units for receiving and sampling a target.
[0025] In some other embodiments, the lens 101 may be an electrically adjustable focus lens, and the infrared thermal imaging device 10 may further include a power supply device and a measuring sensor. The power supply device includes but is not limited to various motors. The measuring sensor includes but is not limited to a potentiometer. The power supply device may be used to drive the lens 101 or the detector 102 to move, and automatically adjust the distance between the lens 101 and the detector 102, so that the infrared thermal imaging device 10 is in a defocused state or a focused state. The measuring sensor is used to record the position of the lens 101 or the detector 102 during the movement, so that the infrared thermal imaging device 10 is in a defocused state or a focused state according to the recorded position of the lens 101 or the detector 102. Figure 2 FIG. 1 is a schematic diagram of an infrared thermal imaging device in a focusing state in an embodiment. Figure 3 1 is a schematic diagram of an infrared thermal imaging device in an out-of-focus state in an embodiment. When in the focused state, the distance between the lens 101 and the detector 102 is smaller than the distance between the lens 101 and the detector 102 when in the out-of-focus state.
[0026] The infrared thermal imaging device 10 uses the detector 102 and the lens 101 to receive the infrared radiation energy distribution pattern of the measured target and reflect it on the photosensitive element of the detector 102, thereby obtaining an infrared thermal image, which corresponds to the heat distribution field on the surface of the object. The infrared thermal imaging device 10 converts the invisible infrared energy emitted by the object into a visible thermal image. The different colors on the thermal image represent the different temperatures of the measured object. By viewing the thermal image, the overall temperature distribution of the measured target can be observed, the heating condition of the target can be studied, and the judgment of the next step can be made.
[0027] Due to the influence of factors such as temperature changes and voltage instability, the voltage at the output end of the circuit changes, and is gradually amplified and transmitted, causing the voltage at the output end of the circuit to move up and down around the original fixed value, causing the infrared response of the detector to drift. In order to solve the above problems, the prior art generally uses the shutter, a uniform surface, for correction. However, this method brings two design limitations. One is that the size of the device's movement is limited by the shutter size and cannot be made smaller. The other is that the shutter, as a mechanical structure, has inherent defects in high reliability. In the prior art, when the scene is in motion, the fixed high-frequency noise of the scene is separated, and then the detailed information of the scene is extracted, and the bias correction parameters corresponding to the current image scene are adaptively calculated, and then non-uniformity correction is performed. This scene-based correction method has a large amount of calculation and is not easy to implement. It requires obvious changes in the scene, that is, it is necessary to obtain sufficient images of the changing scene, and correction cannot be performed under long-term static conditions.
[0028] See also Figure 3 , is a flow chart of an infrared image non-uniformity correction method provided in an embodiment of the present application. The infrared image non-uniformity correction method is applied to an infrared thermal imaging device, and the infrared image non-uniformity correction method includes the following steps:
[0029] S11, obtaining the current frame image.
[0030] In this embodiment, the current frame image is the image currently captured in real time by the infrared thermal imaging device 10. The current frame image is an image captured by the infrared thermal imaging device 10 in a focused and clear state. Before acquiring the current frame image, the initial state of the infrared thermal imaging device 10 may be in a focused and clear state or in a defocused state. When the initial state of the infrared imaging device 10 is in a defocused state, the infrared imaging device 10 is adjusted to a focused and clear state before acquiring the current frame image.
[0031] S12. Obtain a noise image corresponding to the current state.
[0032] In this embodiment, the noise image is an image obtained by processing a defocused image using a noise filtering algorithm, and the defocused image is an image obtained when the infrared thermal imaging device is in a defocused state. When the infrared thermal imaging device 10 is in a defocused state, the defocused image includes more high-frequency noise information. After processing the defocused image using a noise filtering algorithm, effective high-frequency noise information can be obtained, thereby facilitating the removal of high-frequency noise information in the captured image.
[0033] The noise image corresponding to the current state may be pre-calculated and stored in the storage device of the infrared thermal imaging device 10, or a defocused image may be obtained in the current state and processed by a noise filtering algorithm. The noise image is not fixed and can be updated. When the infrared thermal imaging device 10 obtains a trigger instruction for updating the noise image, the noise image is calculated once, thereby updating the noise image. By updating the noise image, the noise image can be dynamically changed and can be more adaptable to non-uniformity correction in different scenarios.
[0034] S13. Correct the current frame image according to the noise image corresponding to the current state to obtain a corrected image corresponding to the current frame image.
[0035] In this embodiment, the noise image corresponding to the current state contains high-frequency noise data corresponding to the current state. Each pixel point in the current frame image is corresponded one-to-one with the noise pixel point in the noise image. According to the pixel value of each pixel point in the current frame image and the pixel value of the corresponding noise pixel point, the noise value in each pixel point is removed, so that a clearer current frame image can be obtained.
[0036] In the above embodiment, by acquiring a noise image in the current state, the noise image is an image obtained by processing a defocused image using a noise filtering algorithm. The defocused image is an image acquired when the infrared thermal imaging device is in a defocused state. The defocused image includes high-frequency noise data. Therefore, the noise image in the current state includes the high-frequency noise data in the current state. The current frame image is corrected based on the noise image in the current state, which can effectively remove the high-frequency noise information in the current frame. Moreover, this non-uniformity correction method does not require a shutter structure, reduces costs, and miniaturizes the infrared imaging movement.
[0037] In some embodiments, obtaining a noise image corresponding to the current state further includes:
[0038] Controlling the infrared thermal imaging device to be in a defocused state;
[0039] Acquire a defocused image in a defocused state;
[0040] Using a noise filtering algorithm to obtain pixel values of pixels in a neighborhood of each pixel in the defocused image;
[0041] Based on the pixel values of the pixels in the vicinity of each pixel in the defocused image, the processed pixel value corresponding to each pixel is calculated to obtain the noise image corresponding to the current state.
[0042] When the infrared thermal imaging device 10 is in a defocused state, a virtual focus plane can be obtained, so that a defocused image can be obtained, and the defocused image includes more high-frequency noise information. The pixel values in the defocused image are smoothed by a noise filtering algorithm to obtain effective high-frequency noise data. The noise filtering algorithm includes but is not limited to a mean filtering algorithm, a median filtering algorithm, a Gaussian filtering algorithm, a spatial domain filtering algorithm, and the like. The neighboring range can be a preset range, such as an N*N pixel range centered on a pixel point, where N is a positive integer. In an optional embodiment, for a pixel point in a noise image, the pixel values of the pixel points in the neighboring range of the pixel point are accumulated and averaged as the processed pixel value of the pixel point. In another optional embodiment, the weighted weight corresponding to each pixel point in the neighboring range, the closer the pixel point in the neighboring range is to the processed pixel point, the larger the corresponding weighted weight is, and the value obtained by weighted accumulation of the pixel values of the pixel points in the neighboring range of the processed pixel point is used as the processed pixel value of the pixel point.
[0043] For example Figure 5 : This is a schematic diagram of processing a pixel in a defocused image using a noise filtering algorithm in an embodiment, the noise image is a 5×5 image, the neighborhood range is set to 3×3, for the pixel with a pixel value of 5 in the second row and second column, the pixels in the neighborhood range are centered on the pixel, and the pixels in the 3×3 range are respectively the pixel with a pixel value of 8 in the first row and first column, the pixel with a pixel value of 1.8 in the first row and second column, the pixel with a pixel value of 1 in the first row and third column, the pixel with a pixel value of 2 in the second row and first column, the pixel with a pixel value of 1.6 in the second row and third column, the pixel with a pixel value of 3 in the third row and first column, the pixel with a pixel value of 4.5 in the third row and second column, the pixel with a pixel value of 2.3 in the third row and third column, and the pixel with a pixel value of 5 in the second row and second column. For example, the pixel points in the neighborhood range are summed and the value obtained by cumulatively averaging is used as the updated pixel value of the pixel with a pixel value of 5 in the second row and second column.
[0044] In the above embodiment, a defocused image is obtained, and the defocused image is an image obtained when the infrared thermal imaging device is in a defocused state. The defocused image includes high-frequency noise data. The effective high-frequency noise data in the defocused image can be extracted through a filtering algorithm, so that more effective high-frequency noise data is retained in the noise image, and the current frame image is corrected based on the noise image in the current state, which can effectively remove the high-frequency noise information in the current frame. Moreover, this non-uniformity correction method does not require a shutter structure, reduces costs, and miniaturizes the infrared imaging movement.
[0045] In some embodiments, controlling the infrared thermal imaging device to be in a defocused state includes:
[0046] When a trigger instruction for updating the noise image is obtained, the power supply device of the infrared thermal imaging device is controlled to drive the lens of the infrared thermal imaging device to move, and during the movement of the lens, the position of the lens is recorded by a measuring sensor of the infrared thermal imaging device, and when the position of the lens reaches a first preset position range that causes the infrared thermal imaging device to be in a defocused state, the power supply device is controlled to stop working; or
[0047] When a trigger instruction for updating a noise image is obtained, the detector of the infrared thermal imaging device is driven to move by controlling a power supply device of the infrared thermal imaging device. During the movement of the detector, the position of the detector is recorded by a measuring sensor of the infrared thermal imaging device. When the position of the detector reaches a second preset position range that puts the infrared thermal imaging device in a defocused state, the power supply device is controlled to stop working.
[0048] In this embodiment, when a trigger instruction for updating the noise image is obtained, the infrared thermal imaging device 10 is controlled to be in a defocused state to update the noise image. The lens 101 may be an electrically adjustable focus lens. In an optional embodiment, when the lens 101 is driven to move to a first preset position range by a power supply device, a virtual focus plane can be obtained, and the controller 100 controls the infrared thermal imaging device 10 to obtain the current image through the virtual focus plane, and the obtained current image is used as a defocused image. In the process of driving the lens 101 to move, the current position of the lens 101 is recorded by a measuring sensor, and when the current position moves to the first preset position range, the power supply device is controlled to stop working. In another optional embodiment, when the detector 102 is driven to move to a second preset position range by a power supply device, a virtual focus plane can be obtained, and the controller 100 controls the infrared thermal imaging device 10 to obtain the current image through the virtual focus plane, and the obtained current image is used as a defocused image. In the process of driving the detector 102 to move, the current position of the detector 102 is recorded by a measuring sensor, and when the current position moves to the second preset position range, the power supply device is controlled to stop working.
[0049] In the above embodiment, when a trigger instruction for updating the noise image is obtained, the lens or detector can be automatically controlled to move, and a virtual focus plane can be obtained to obtain the current defocused image, so that the noise image can be automatically updated. When correcting the current frame image, the updated noise image is used to more accurately remove the noise in the current frame image, making the current frame image clearer.
[0050] In some embodiments, controlling the infrared thermal imaging device to be in a defocused state includes:
[0051] When a trigger instruction for updating the noise image is obtained and a confirmation instruction for completion of the defocus configuration of the infrared thermal imaging device is obtained, it is indicated that the infrared thermal imaging device is in a defocus state.
[0052] In this embodiment, the infrared thermal imaging device 10 provides a user interface on the display device 103. When a trigger instruction for updating the noise image is obtained, the infrared thermal imaging device 10 can prompt the user on the user interface to manually adjust the infrared thermal imaging device 10 to a defocused state. When the user determines that the infrared thermal imaging device 10 is in a defocused state, the user can click the defocus confirmation item on the user interface. When the infrared thermal imaging device 10 obtains a confirmation instruction that the defocus configuration of the infrared thermal imaging device is completed, it is determined that the infrared thermal imaging device is in a defocused state. At this time, the virtual focus plane can be obtained. The controller 100 controls the infrared thermal imaging device 10 to obtain the current image through the virtual focus plane, and uses the obtained current image as the defocused image.
[0053] In the above embodiment, a manual adjustment method is also provided to put the infrared thermal imaging device 10 in a defocused state, so that the user can manually adjust the infrared thermal imaging device 10 according to their own needs, thereby improving the user experience.
[0054] In some embodiments, the acquiring of a trigger instruction for updating the noise image includes any one of the following:
[0055] Get the current time to reach the trigger time; or
[0056] It is detected that the infrared thermal imaging device has a response drift phenomenon; or
[0057] Obtaining a selected instruction to update a noise image item; or
[0058] A selected instruction for starting infrared image non-uniformity correction is obtained.
[0059] In this embodiment, due to changes in the environment or the influence of the device's own factors, the noise of the image taken by the device may change. Therefore, in order to enable the noise image to be continuously updated, a preset time interval is set to regularly update the noise image, so that when the current frame image is corrected, the noise in the current frame image can be removed in time. The response drift phenomenon of the infrared thermal imaging device 10 can also be automatically detected. When the response drift phenomenon of the infrared thermal imaging device 10 is detected, the infrared thermal imaging device is controlled to be in a defocused state, and a new noise image is acquired. In an optional embodiment, the infrared thermal imaging device 10 can be used to monitor whether the surface temperature value of the same target has changed significantly. If the surface temperature value of the same target has changed significantly, it is determined that the infrared thermal imaging device 10 has a response drift phenomenon. In an optional embodiment, the infrared thermal imaging device 10 provides a user interface, and the user interface is provided with an update noise image item. The user can trigger the update noise image item to control the infrared thermal imaging device 10 to be in a defocused state. In an optional embodiment, a start item for infrared image non-uniformity correction is provided on the user interface. The user can control the infrared thermal imaging device 10 to start the infrared image non-uniformity correction program and recalculate the noise image in the current state by selecting the start item for infrared image non-uniformity correction.
[0060] In the above embodiments, the infrared thermal imaging device is triggered to update the noise image in a variety of ways, so that the non-uniformity correction of the infrared thermal imaging device is more accurate.
[0061] In some embodiments, after obtaining the noise image corresponding to the current state, the method further includes:
[0062] The infrared thermal imaging device is controlled to be in a clearly focused state.
[0063] After obtaining the noise image, in order to facilitate the subsequent use of the infrared thermal imaging device, it is necessary to control the infrared thermal imaging device to be in a focused and clear state. In an optional embodiment, the infrared thermal imaging device can be driven to move the lens of the infrared thermal imaging device by controlling the power supply device of the infrared thermal imaging device, and the position of the lens is recorded by the measuring sensor of the infrared thermal imaging device during the movement of the lens. When the position of the lens reaches the third preset position range that makes the infrared thermal imaging device in a focused and clear state, the power supply device is controlled to stop working. In an optional embodiment, the infrared thermal imaging device can be driven to move the detector of the infrared thermal imaging device by controlling the power supply device of the infrared thermal imaging device, and the position of the detector is recorded by the measuring sensor of the infrared thermal imaging device during the movement of the detector. When the position of the detector reaches the fourth preset position range that makes the infrared thermal imaging device in a focused and clear state, the power supply device is controlled to stop working. In an optional embodiment, the infrared thermal imaging device 10 can prompt the user on the user interface to manually adjust the infrared thermal imaging device 10 to be in a focused and clear state. When the user determines that the infrared thermal imaging device 10 is in a focused and clear state, the user can click the focus confirmation item on the user interface. When the infrared thermal imaging device 10 obtains the confirmation instruction that the gathering configuration of the infrared thermal imaging device is completed, it is determined that the infrared thermal imaging device is in a focused state, and a clear image can be obtained at this time.
[0064] In the above embodiment, after the noise image corresponding to the current state is obtained, the infrared thermal imaging device 10 is restored to a focused and clear state, thereby improving the convenience of the user in using the device.
[0065] In some embodiments, the correcting the current frame image according to the noise image corresponding to the current state to obtain the corrected image corresponding to the current frame image includes:
[0066] Determining, in the noise image corresponding to the current state, a noise pixel corresponding to each pixel in the current frame image;
[0067] The pixel value of each pixel in the current frame image is subtracted from the pixel value of the corresponding noise pixel to obtain a corrected image corresponding to the current frame image.
[0068] The noise image corresponding to the current state includes high-frequency noise data. By removing these high-frequency noise data from the current frame image, the corrected image corresponding to the current frame image can be obtained. For example, if the current frame image is A and the noise image is B, then the corrected image C is (AB), that is, the pixel value of each pixel in A is subtracted from the pixel value of the corresponding pixel in B, so as to obtain the corrected image C.
[0069] See also Figure 6An embodiment of the present application provides an infrared image non-uniformity correction device, including: an acquisition module 21, used to acquire a current frame image; the acquisition module is also used to acquire a noise image corresponding to a current state, wherein the noise image is an image obtained by processing a defocused image using a noise filtering algorithm, and the defocused image is an image obtained when the infrared thermal imaging device is in a defocused state; a correction module 22, used to obtain a corrected image corresponding to the current frame image based on the current frame image and the noise image corresponding to the current state.
[0070] Optionally, the acquisition module 21 is further used for:
[0071] Controlling the infrared thermal imaging device to be in a defocused state;
[0072] Acquire a defocused image in a defocused state;
[0073] Using a noise filtering algorithm to obtain pixel values of pixels in a neighborhood of each pixel in the defocused image;
[0074] Based on the pixel values of the pixels in the vicinity of each pixel in the defocused image, the processed pixel value corresponding to each pixel is calculated to obtain the noise image corresponding to the current state.
[0075] Optionally, the acquisition module 21 is further used for:
[0076] When a trigger instruction for updating the noise image is obtained, the power supply device of the infrared thermal imaging device is controlled to drive the lens of the infrared thermal imaging device to move, and during the movement of the lens, the position of the lens is recorded by a measuring sensor of the infrared thermal imaging device, and when the position of the lens reaches a first preset position range that causes the infrared thermal imaging device to be in a defocused state, the power supply device is controlled to stop working; or
[0077] When a trigger instruction for updating a noise image is obtained, the detector of the infrared thermal imaging device is driven to move by controlling a power supply device of the infrared thermal imaging device. During the movement of the detector, the position of the detector is recorded by a measuring sensor of the infrared thermal imaging device. When the position of the detector reaches a second preset position range that puts the infrared thermal imaging device in a defocused state, the power supply device is controlled to stop working.
[0078] Optionally, the acquisition module 21 is further used for:
[0079] When a trigger instruction for updating the noise image is obtained and a confirmation instruction for completion of the defocus configuration of the infrared thermal imaging device is obtained, it is indicated that the infrared thermal imaging device is in a defocus state.
[0080] Optionally, the trigger instruction obtained for updating the noise image includes any one of the following:
[0081] Get the current time to reach the trigger time; or
[0082] It is detected that the infrared thermal imaging device has a response drift phenomenon; or
[0083] Get the selected instruction to update the noise image item.
[0084] Optionally, the correction module 22 is further configured to control the infrared thermal imaging device to be in a clearly focused state after obtaining the noise image corresponding to the current state.
[0085] Optionally, the correction module 22 is further configured to correct the current frame image according to the noise image corresponding to the current state, and obtaining a corrected image corresponding to the current frame image includes:
[0086] Determining, in the noise image corresponding to the current state, a noise pixel corresponding to each pixel in the current frame image;
[0087] The pixel value of each pixel in the current frame image is subtracted from the pixel value of the corresponding noise pixel to obtain a corrected image corresponding to the current frame image.
[0088] It can be understood by those skilled in the art that Figure 6 The structure of the mid-infrared image non-uniformity correction device does not constitute a limitation on the infrared image non-uniformity correction device, and the various modules can be implemented in whole or in part by software, hardware, or a combination thereof. The above modules can be embedded in or independent of the controller in the infrared thermal imaging device in the form of hardware, or can be stored in the memory in the infrared thermal imaging device in the form of software, so that the controller can call and execute the operations corresponding to the above modules. In other embodiments, the infrared image non-uniformity correction device may include more or fewer modules than those shown in the figure.
[0089] See also Figure 7 On the other hand, an embodiment of the present application further provides an infrared thermal imaging device 10, including a memory 3011 and a processor 3012, wherein the memory 3011 stores a computer program, and when the computer program is executed by the processor, the processor 3012 executes the steps of the infrared image non-uniformity correction method provided in any of the above embodiments of the present application.
[0090] The processor 3012 is the control center, which uses various interfaces and lines to connect various parts of the entire infrared thermal imaging device, and executes various functions and processes data of the infrared thermal imaging device by running or executing software programs and / or modules stored in the memory 3011, and calling data stored in the memory 3011. Optionally, the processor 3012 may include one or more processing cores; preferably, the processor 3012 may integrate an application processor and a modem processor, wherein the application processor mainly processes the operating system, user pages and application programs, etc., and the modem processor mainly processes wireless communications. It is understandable that the above-mentioned modem processor may not be integrated into the processor 3012.
[0091] The memory 3011 can be used to store software programs and modules. The processor 3012 executes various functional applications and data processing by running the software programs and modules stored in the memory 3011. The memory 3011 can mainly include a program storage area and a data storage area, wherein the program storage area can store an operating system, an application required for at least one function (such as a sound playback function, an image playback function, etc.), etc.; the data storage area can store data created according to the use of the infrared thermal imaging device 10, etc. In addition, the memory 3011 can include a high-speed random access memory, and can also include a non-volatile memory, such as at least one disk storage device, a flash memory device, or other volatile solid-state storage devices. Accordingly, the memory 3011 can also include a memory controller to provide the processor 3012 with access to the memory 3011.
[0092] On the other hand, an embodiment of the present application further provides a storage medium storing a computer program. When the computer program is executed by a processor, the processor executes the steps of the infrared image non-uniformity correction method provided in any of the above embodiments of the present application.
[0093] Those skilled in the art can understand that all or part of the processes in the methods provided in the above embodiments can be completed by instructing the relevant hardware through a computer program, and the program can be stored in a non-volatile computer-readable storage medium. When the program is executed, it can include the processes of the embodiments of the above methods. Among them, any reference to memory, storage, database or other media used in the embodiments provided in the present application can include non-volatile and / or volatile memory. Non-volatile memory may include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM) or flash memory. Volatile memory may include random access memory (RAM) or external cache memory. As an illustration and not limitation, RAM is available in many forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link (Synchlink) DRAM (SLDRAM), memory bus (Rambus) direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM).
[0094] The above is only a specific embodiment of the present invention, but the protection scope of the present invention is not limited thereto. Any person skilled in the art can easily think of changes or substitutions within the technical scope disclosed by the present invention, which should be included in the protection scope of the present invention. The protection scope of the present invention should be based on the protection scope of the claims.
Claims
1. A method for correcting infrared image non-uniformity, characterized in that: The method comprises: Get the current frame image; Acquire a noise image corresponding to the current state, wherein the noise image is an image obtained by processing a defocused image using a noise filtering algorithm, and the defocused image is an image obtained when the infrared thermal imaging device is in a defocused state; the acquiring of the noise image corresponding to the current state further comprises: controlling the infrared thermal imaging device to be in a defocused state; acquiring a defocused image in a defocused state, and processing the defocused image to obtain the noise image; wherein the controlling the infrared thermal imaging device to be in a defocused state comprises: when a trigger instruction for updating the noise image is acquired, driving the lens of the infrared thermal imaging device to move by controlling a power supply device of the infrared thermal imaging device, during the movement of the lens, recording the position of the lens through a measuring sensor of the infrared thermal imaging device, and when the position of the lens reaches a first preset position range that makes the infrared thermal imaging device in a defocused state, controlling the power supply device to stop working; or when a trigger instruction for updating the noise image is acquired, driving the detector of the infrared thermal imaging device to move by controlling a power supply device of the infrared thermal imaging device, during the movement of the detector, recording the position of the detector through a measuring sensor of the infrared thermal imaging device, and when the position of the detector reaches a second preset position range that makes the infrared thermal imaging device in a defocused state, controlling the power supply device to stop working; The current frame image is corrected according to the noise image corresponding to the current state to obtain a corrected image corresponding to the current frame image.
2. The infrared image non-uniformity correction method according to claim 1, characterized in that: The processing of the defocused image to obtain the noise image further comprises: Using a noise filtering algorithm to obtain pixel values of pixels in a neighborhood of each pixel in the defocused image; Based on the pixel values of the pixels in the vicinity of each pixel in the defocused image, the processed pixel value corresponding to each pixel is calculated to obtain the noise image corresponding to the current state.
3. The infrared image non-uniformity correction method according to claim 1, characterized in that: The controlling the infrared thermal imaging device to be in a defocused state comprises: When a trigger instruction for updating the noise image is obtained and a confirmation instruction for completion of the defocus configuration of the infrared thermal imaging device is obtained, it is indicated that the infrared thermal imaging device is in a defocus state.
4. The infrared image non-uniformity correction method according to any one of claims 1 to 3, characterized in that: The trigger instruction obtained for updating the noise image includes any one of the following: Get the current time to reach the trigger time; or It is detected that the infrared thermal imaging device has a response drift phenomenon; or Obtaining a selected instruction to update a noise image item; or A selected instruction for starting infrared image non-uniformity correction is obtained.
5. The infrared image non-uniformity correction method according to claim 1, characterized in that: After obtaining the noise image corresponding to the current state, the method further includes: The infrared thermal imaging device is controlled to be in a clearly focused state.
6. The infrared image non-uniformity correction method according to claim 1, characterized in that: The correcting the current frame image according to the noise image corresponding to the current state to obtain a corrected image corresponding to the current frame image comprises: Determining, in the noise image corresponding to the current state, a noise pixel corresponding to each pixel in the current frame image; The pixel value of each pixel in the current frame image is subtracted from the pixel value of the corresponding noise pixel to obtain a corrected image corresponding to the current frame image.
7. A method for correcting infrared image non-uniformity, characterized in that: The method comprises: An acquisition module is used to acquire the current frame image; The acquisition module is also used to acquire a noise image corresponding to the current state, wherein the noise image is an image obtained by processing a defocused image using a noise filtering algorithm, and the defocused image is an image acquired when the infrared thermal imaging device is in a defocused state; the acquisition module is also used to: control the infrared thermal imaging device to be in a defocused state; acquire a defocused image in a defocused state, and process the defocused image to obtain the noise image; the acquisition module is also used to: when a trigger instruction for updating the noise image is acquired, drive the lens of the infrared thermal imaging device to move by controlling the power supply device of the infrared thermal imaging device, and during the movement of the lens, record the position of the lens through the measuring sensor of the infrared thermal imaging device, and when the position of the lens reaches a first preset position range that makes the infrared thermal imaging device in a defocused state, control the power supply device to stop working; or when a trigger instruction for updating the noise image is acquired, drive the detector of the infrared thermal imaging device to move by controlling the power supply device of the infrared thermal imaging device, and during the movement of the detector, record the position of the detector through the measuring sensor of the infrared thermal imaging device, and when the position of the detector reaches a second preset position range that makes the infrared thermal imaging device in a defocused state, control the power supply device to stop working; The correction module is used to obtain a corrected image corresponding to the current frame image according to the current frame image and the noise image corresponding to the current state.
8. An infrared thermal imaging device, characterized in that: The method comprises a memory and a processor, wherein the memory stores a computer program, and when the computer program is executed by the processor, the processor executes the steps of the method according to any one of claims 1 to 6.
9. A computer-readable storage medium storing a computer program, characterized in that: When the computer program is executed by a processor, the processor is caused to perform the steps of the method according to any one of claims 1 to 6.
