Narrow-band wavelength filtering spectrometer device based on three-grating structure

Abstract

Disclosed is a narrowband wavelength filtering spectrometer device based on a three-grating structure. In the device, a first lens collects a light beam from a measured light object, a first 90°-rotated reflector group is located on the optical path of the first lens and reflects the light beam by rotating it 90°, a second lens is located on the optical path of the first 90°-rotated reflector and collects the light beam, a second 90°-rotated reflector is located on the optical path of the second lens and reflects the light beam by rotating it 90°; a sun-shaped baffle is located on the optical path of the fourth lens to filter the light beam, a second grating is located on the optical path of the fifth lens and combines the light beam along its wavelength spectrum, a slit is located on the optical path of the sixth lens to pass the light beam and filter the broadened light, a third grating collects the light beam from the seventh reflector and expands it twice along its wavelength spectrum, an eighth lens is located on the optical path of the third grating and focuses the light beam from the third grating, and an ICCD is located on the optical path of the eighth lens to receive the light beam.

Description

Technical Field

[0001] The invention relates to the technical field of optical diagnosis and measurement, in particular to a narrow-band wavelength filtering spectrometer device based on a three-grating structure. Background Art

[0002] The spectrometer can expand the measurement light along the wavelength, which is of great significance for optical diagnosis such as Thomson scattering method. Traditional narrowband filtering optical components have problems such as "narrow band" being too wide, marginal attenuation being too slow, and insufficient shielding rate, making it difficult to meet the standards of some optical diagnostic experiments that have high requirements for narrowband filtering. The Thomson scattering method often requires efficient and targeted filtering of the probe laser and the broadened light near it, which cannot be achieved with an ordinary spectrometer composed of only one grating and a narrowband filter lens. An ordinary single-grating structure spectrometer with a specific baffle can also block the target band, but it cannot separate the broadened light and non-stray signals in the target band, resulting in effective information being blocked or insufficient shielding of stray signals.

[0003] The information disclosed in this Background section is only for enhancement of understanding of the background of the invention and therefore it may contain information that does not form the prior art that is already known to a person of ordinary skill in the art. Summary of the invention

[0004] In view of the shortcomings or defects of the above-mentioned prior art, a narrow-band wavelength filtering spectrometer device based on a three-grating structure is provided, which collects the measurement object through a signal collection mirror group, expands, converges and re-expands the test light wavelength through three gratings and a lens system, and filters the target band light and its broadening through a spatial filter system.

[0005] The purpose of the present invention is achieved through the following technical solutions.

[0006] A narrow-band wavelength filtering spectrometer device based on a three-grating structure comprises:

[0007] A measuring light object collecting device comprising,

[0008] a first lens, which collects the light beam from the measuring light object,

[0009] A first 90° reflector is located on the optical path of the first lens and reflects the light beam by rotating it 90°.

[0010] A second lens is located on the optical path of the first 90° reflector and collects the light beam.

[0011] A second 90° rotating reflector, which is located on the optical path of the second lens and rotates the light beam by 90° for reflection;

[0012] Three grating and lens optical path system, which includes,

[0013] The third lens collects the light beam from the second 90° reflector,

[0014] a third reflecting mirror, which is located on the optical path of the third lens and reflects the light beam,

[0015] a first grating which collects the light beam from the third reflector and spreads it along its wavelength spectrum,

[0016] a fourth lens, which is located on the optical path of the first grating and focuses the light beam from the first grating,

[0017] A sun-shaped baffle is located on the optical path of the fourth lens to filter the light beam.

[0018] a fifth lens, which is located on the other side of the sun-shaped baffle plate opposite to the fourth lens and collects the light beam from the sun-shaped baffle plate,

[0019] A second grating is located on the optical path of the fifth lens and combines the light along its wavelength spectrum,

[0020] a sixth lens, which is located on the optical path of the second grating and focuses the light beam from the second grating,

[0021] a slit located on the optical path of the sixth lens to pass the light beam and filter the broadened light,

[0022] a seventh lens, which is located on the other side of the slit opposite to the sixth lens and collects the light beam from the slit,

[0023] A third grating, which collects the light beam from the seventh reflector and spreads it secondarily along its wavelength spectrum,

[0024] an eighth lens, which is located on the optical path of the third grating and focuses the light beam from the third grating,

[0025] The ICCD is located on the optical path of the eighth lens to receive the light beam.

[0026] In the narrow-band wavelength filtering spectrometer device based on the three-grating structure, the first lens and the second lens form a double lens group, the diameter of the double lens group is greater than 60 mm, the first lens is a plano-convex lens, the plane part faces the measurement light object, and the second lens is a plano-convex lens, the plane part faces the second 90° rotated reflector.

[0027] In the narrow-band wavelength filtering spectrometer device based on the three-grating structure, the first 90° rotating reflector group is composed of a pair of reflectors assembled along a climbing frame to realize the 90° image rotation function.

[0028] In the narrow-band wavelength filtering spectrometer device based on a three-grating structure, the first grating, the second grating and the third grating are all high-reflection gratings with a refractive index of 1800 l / mm and greater than 80%.

[0029] In the narrow-band wavelength filtering spectrometer device based on a three-grating structure, the diameters of the fourth lens to the eighth lens are all greater than 60 mm.

[0030] In the narrow-band wavelength filtering spectrometer device based on a three-grating structure, the width of the central baffle of the Chinese-Signal baffle is less than 1 mm.

[0031] In the narrow-band wavelength filtering spectrometer device based on a three-grating structure, the slit passes the light beam and filters the broadened light.

[0032] In the narrow-band wavelength filtering spectrometer device based on the three-grating structure, the third lens is a plano-convex lens, and the flat part faces the second 90° reflector, the fourth lens is a plano-convex lens, and the flat part faces the Japanese-shaped baffle, the fifth lens is a plano-convex lens, and the flat part faces the Japanese-shaped baffle, the sixth lens is a plano-convex lens, and the flat part faces the slit, the seventh lens is a plano-convex lens, and the flat part faces the slit, and the eighth lens is a plano-convex lens, and the flat part faces the ICCD.

[0033] In the narrow-band wavelength filtering spectrometer device based on a three-grating structure, the first grating, the fourth lens, the fifth lens, and the second grating are symmetrical relative to the sun-shaped baffle.

[0034] In the narrow-band wavelength filtering spectrometer device based on a three-grating structure, the second grating, the sixth lens, the seventh lens, and the third grating are symmetrical relative to the slit.

[0035] Compared with the prior art, the present invention has the following beneficial effects:

[0036] The spectrometer based on the three-grating structure of the present invention can achieve extremely narrow band filtering of the target wavelength for the measuring light by arranging precise spatial filtering between the gratings, and can efficiently filter the stray interference light generated in optical diagnosis such as emission spectrum and Thomson scattering. The present invention has the characteristics of strong wavelength targeting, strong filtering and high signal-to-noise ratio, and realizes the improvement of signal-to-noise ratio by targeting the pain point that specific narrow-band light in the measuring light is difficult to filter.

[0037] The above description is only an overview of the technical solution of the present invention. In order to make the technical means of the present invention clearer and to achieve the extent that those skilled in the art can implement it according to the contents of the specification, and in order to make the above and other purposes, features and advantages of the present invention more obvious and easy to understand, the specific implementation methods of the present invention are exemplified below. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] By reading the detailed description of the preferred specific embodiments below, various other advantages and benefits of the present invention will become clear to those of ordinary skill in the art. The drawings in the specification are only for the purpose of illustrating the preferred embodiments and are not considered to be limitations of the present invention. Obviously, the drawings described below are only some embodiments of the present invention. For those of ordinary skill in the art, other drawings can also be obtained based on these drawings without creative work. Moreover, the same reference numerals are used to represent the same components throughout the drawings.

[0039] In the attached picture:

[0040] Figure 1 It is a structural schematic diagram of the present invention.

[0041] The present invention is further explained below in conjunction with the accompanying drawings and embodiments. DETAILED DESCRIPTION

[0042] The specific embodiments of the present invention will be described in more detail below with reference to the accompanying drawings. Although the specific embodiments of the present invention are shown in the accompanying drawings, it should be understood that the present invention can be implemented in various forms and should not be limited by the embodiments set forth herein. On the contrary, these embodiments are provided in order to enable a more thorough understanding of the present invention and to enable the scope of the present invention to be fully communicated to those skilled in the art.

[0043] It should be noted that certain words are used in the specification and claims to refer to specific components. Those skilled in the art should understand that technicians may use different nouns to refer to the same component. This specification and claims do not use the difference in nouns as a way to distinguish components, but use the difference in the functions of the components as the criterion for distinction. As mentioned throughout the specification and claims, "including" or "comprising" is an open term, so it should be interpreted as "including but not limited to". The subsequent description of the specification is a preferred embodiment of the present invention, but the description is based on the general principles of the specification and is not intended to limit the scope of the present invention. The scope of protection of the present invention shall be determined by the attached claims.

[0044] To facilitate understanding of the embodiments of the present invention, several specific embodiments will be further explained below with reference to the accompanying drawings, and each of the accompanying drawings does not constitute a limitation on the embodiments of the present invention.

[0045] For a better understanding, Figure 1 As shown, a narrow-band wavelength filtering spectrometer device based on a three-grating structure includes:

[0046] A measuring light object collecting device comprising,

[0047] a first lens 3 which collects the light beam from the measuring light object 1,

[0048] The first 90° rotating reflector 2 is located on the optical path of the first lens 3 and reflects the light beam by rotating it 90°.

[0049] A second lens 9 is located on the optical path of the first 90° reflector 2 and collects the light beam.

[0050] A second 90° rotating reflector 8, which is located on the optical path of the second lens 9 and rotates the light beam by 90° for reflection;

[0051] Three grating and lens optical path system, which includes,

[0052] The third lens 10 collects the light beam from the second 90° reflector 8,

[0053] A third reflector 11 is located on the optical path of the third lens 10 and reflects the light beam,

[0054] A first grating 4, which collects the light beam from the third reflector 11 and spreads it along its wavelength spectrum,

[0055] a fourth lens 12, which is located on the optical path of the first grating 4 and focuses the light beam from the first grating 4,

[0056] The sun-shaped baffle 6 is located on the optical path of the fourth lens 12 to filter the light beam.

[0057] The fifth lens 13 is located on the other side of the Japanese-shaped baffle plate 6 opposite to the fourth lens 12 and collects the light beam from the Japanese-shaped baffle plate 6.

[0058] The second grating 14 is located on the optical path of the fifth lens 13 and combines the light along its wavelength spectrum.

[0059] a sixth lens 15, which is located on the optical path of the second grating 14 and focuses the light beam from the second grating 14,

[0060] a slit 7, which is located on the optical path of the sixth lens 15 to pass the light beam and filter the broadened light,

[0061] a seventh lens 16, which is located on the other side of the slit 7 opposite to the sixth lens 15 and collects the light beam from the slit 7,

[0062] The third grating 17 collects the light beam from the seventh reflector and expands it twice along its wavelength spectrum,

[0063] an eighth lens 18, which is located on the optical path of the third grating 17 and focuses the light beam from the third grating 17,

[0064] The ICCD 5 is located on the optical path of the eighth lens 18 to receive the light beam.

[0065] In a preferred embodiment of the narrow-band wavelength filtering spectrometer device based on the three-grating structure, the first lens 3 and the second lens 9 form a double lens group, the diameter of the double lens group is greater than 60 mm, the first lens 3 is a plano-convex lens, and the plane part faces the measurement light object 1, and the second lens 9 is a plano-convex lens, and the plane part faces the second 90° rotated reflector 8.

[0066] In the preferred embodiment of the narrow-band wavelength filtering spectrometer device based on the three-grating structure, the first 90° rotating reflector 2 groups are composed of a pair of reflectors assembled along a climbing frame to realize the 90° image rotation function.

[0067] In a preferred embodiment of the narrow-band wavelength filtering spectrometer device based on a three-grating structure, the first grating 4, the second grating 14 and the third grating 17 are all high-reflection gratings with a refractive index of 1800 l / mm and greater than 80%.

[0068] In a preferred embodiment of the narrow-band wavelength filtering spectrometer device based on a three-grating structure, the diameters of the fourth lens 12 to the eighth lens 18 are all greater than 60 mm.

[0069] In a preferred embodiment of the narrow-band wavelength filtering spectrometer device based on a three-grating structure, the width of the central baffle of the Chinese-Japanese-style baffle 6 is less than 1 mm.

[0070] In a preferred embodiment of the narrow-band wavelength filtering spectrometer device based on a three-grating structure, the slit 7 passes the light beam and broadens the light.

[0071] In a preferred embodiment of the narrow-band wavelength filtering spectrometer device based on the three-grating structure, the third lens 10 is a plano-convex lens, with the flat portion facing the second 90° rotated reflector 8, the fourth lens 12 is a plano-convex lens, with the flat portion facing the Japanese-shaped baffle 6, the fifth lens 13 is a plano-convex lens, with the flat portion facing the Japanese-shaped baffle 6, the sixth lens 15 is a plano-convex lens, with the flat portion facing the slit 7, the seventh lens 16 is a plano-convex lens, with the flat portion facing the slit 7, and the eighth lens 18 is a plano-convex lens, with the flat portion facing the ICCD 5.

[0072] In the preferred embodiment of the narrow-band wavelength filtering spectrometer device based on the three-grating structure, the first grating 4 , the fourth lens 12 , the fifth lens 13 , and the second grating 14 are symmetrical relative to the sun-shaped baffle 6 .

[0073] In a preferred embodiment of the narrow-band wavelength filtering spectrometer device based on a three-grating structure, the second grating 14 , the sixth lens 15 , the seventh lens 16 , and the third grating 17 are symmetrical relative to the slit 7 .

[0074] In one embodiment, the optical path formed by the first grating 4 , the fourth lens 12 , the Japanese-shaped baffle 6 , the fifth lens 13 , and the second grating 14 is parallel to the optical path formed by the third grating 17 and the eighth lens 18 .

[0075] In one embodiment, the three-grating and lens optical path system is disposed in a closed housing, and further the housing is a rectangular structure.

[0076] In one embodiment, two slits and a sun-shaped baffle form a spatial filter device. The target wavelength light in the measured light object can be filtered in a targeted manner and the effective signal can be efficiently collected. The three gratings play the role of collecting light signals along the wavelength spectrum, combining beams, and secondary expansion, and cooperate with the sun-shaped baffle and slits to achieve the function of filtering target light and filtering target light and widening light.

[0077] The basic principles of the present application are described above in conjunction with specific embodiments. However, it should be noted that the advantages, strengths, effects, etc. mentioned in the present application are only examples and not limitations, and it cannot be considered that these advantages, strengths, effects, etc. are required by each embodiment of the present application. In addition, the specific details disclosed above are only for the purpose of illustration and ease of understanding, not for limitation, and the above details do not limit the present application to being implemented by adopting the above specific details.

[0078] The above description has been given for the purpose of illustration and description. In addition, this description is not intended to limit the embodiments of the present application to the forms disclosed herein. Although multiple example aspects and embodiments have been discussed above, those skilled in the art will recognize certain variations, modifications, changes, additions and sub-combinations thereof.

Claims

1. A narrow-band wavelength filtering spectrometer device based on a three-grating structure, characterized in that: These include, A measuring light object collecting device comprising, a first lens, which collects the light beam from the measuring light object, A first 90° reflector is located on the optical path of the first lens and reflects the light beam by rotating it 90°. A second lens is located on the optical path of the first 90° reflector and collects the light beam. A second 90° rotating reflector, which is located on the optical path of the second lens and rotates the light beam by 90° for reflection; Three grating and lens optical path system, which includes, The third lens collects the light beam from the second 90° reflector, a third reflecting mirror, which is located on the optical path of the third lens and reflects the light beam, a first grating which collects the light beam from the third reflector and spreads it along its wavelength spectrum, a fourth lens, which is located on the optical path of the first grating and focuses the light beam from the first grating, A sun-shaped baffle is located on the optical path of the fourth lens to filter the light beam. a fifth lens, which is located on the other side of the sun-shaped baffle plate opposite to the fourth lens and collects the light beam from the sun-shaped baffle plate, A second grating is located on the optical path of the fifth lens and combines the light along its wavelength spectrum, a sixth lens, which is located on the optical path of the second grating and focuses the light beam from the second grating, a slit located on the optical path of the sixth lens to pass the light beam and filter the broadened light, a seventh lens, which is located on the other side of the slit opposite to the sixth lens and collects the light beam from the slit, The third grating collects the light beam from the seventh lens and expands it twice along its wavelength spectrum, an eighth lens, which is located on the optical path of the third grating and focuses the light beam from the third grating, The ICCD is located on the optical path of the eighth lens to receive the light beam. The third lens is a plano-convex lens, with a flat portion facing the second 90° reflector. The fourth lens is a plano-convex lens, with a flat portion facing the Japanese-shaped baffle. The fifth lens is a plano-convex lens, with a flat portion facing the Japanese-shaped baffle. The sixth lens is a plano-convex lens, with a flat portion facing the slit. The seventh lens is a plano-convex lens, with a flat portion facing the slit. The eighth lens is a plano-convex lens, with a flat portion facing the ICCD. The first grating, the fourth lens, the Japanese-shaped baffle, and the fifth lens The optical path formed by the first and second gratings is parallel to the optical path formed by the third grating and the eighth lens, the width of the central baffle of the Chinese-Signal baffle is less than 1 mm, the first grating, the fourth lens, the fifth lens and the second grating are symmetrical relative to the Chinese-Signal baffle, the second grating, the sixth lens, the seventh lens and the third grating are symmetrical relative to the slit, the three-grating and lens optical path system is arranged in a closed housing, the three gratings play the role of collecting light signals along the wavelength spectrum expansion-beam combination-secondary expansion, and cooperate with the Chinese-Signal baffle and the slit to achieve filtering of target light-filtering of target light and broadening of light.

2. The narrow-band wavelength filtering spectrometer device based on a three-grating structure as claimed in claim 1, characterized in that: The first lens and the second lens form a double lens group with a diameter greater than 60 mm. The first lens is a plano-convex lens with a flat portion facing the measurement light object, and the second lens is a plano-convex lens with a flat portion facing the first 90° reflector.

3. The narrow-band wavelength filtering spectrometer device based on a three-grating structure as claimed in claim 1, characterized in that: The first 90° rotating reflector group is composed of a pair of reflectors assembled along the climbing frame to realize the function of rotating the image 90°.

4. The narrow-band wavelength filtering spectrometer device based on a three-grating structure as claimed in claim 1, characterized in that: The first grating, the second grating and the third grating are all high-reflection gratings with a refractive index of 1800 l / mm and greater than 80%.

5. The narrow-band wavelength filtering spectrometer device based on a three-grating structure as claimed in claim 1, characterized in that: The diameters of the fourth lens to the eighth lens are all greater than 60 mm.

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