A kind of ADC chip testing method and anti-interference testing equipment

Abstract

The present invention belongs to the field of chip testing technology, and in particular to an ADC chip testing method. The ADC chip testing method comprises the following steps: S1: firstly installing an ADC chip in a testing device; S2: using the testing device to simulate a high temperature environment when the ADC chip is working; S3: detecting whether a data signal generated by the ADC chip in the high temperature environment is normal; and S4: detecting the heat dissipation condition of the surface of the ADC chip in the high temperature environment. The present invention can intermittently not block an opening provided on a side wall of a testing box, so that a cooling fan can cool down the heat in the testing box, thereby preventing the excessive temperature in the testing box from damaging the ADC chip body, and effectively preventing the excessive temperature from affecting the accuracy of the ADC chip body test, while also improving the safety and reliability of the device, and detecting the heat dissipation performance of the ADC chip body while monitoring the temperature of the ADC chip body.

Description

Technical Field

[0001] The invention belongs to the technical field of chip testing, and in particular relates to an ADC chip testing method and anti-interference testing equipment. Background Art

[0002] ADC chip can convert analog quantity into digital quantity, DAC chip can convert digital quantity into analog quantity, and can collect data. It is an indispensable component in sensors and a commonly used device in electronic circuits.

[0003] When performing temperature testing on an ADC chip, a heating device is generally used to continuously heat the ADC chip. However, when the temperature exceeds the maximum tolerance of the ADC chip, the excessive temperature may damage the circuit components of the chip. For example, as the temperature rises, the on-resistance of the chip may decrease, resulting in excessive current or short circuit. In this case, the chip may be damaged, affecting the test of the chip. Excessive temperature may cause thermal failure of the internal components of the chip, such as open circuit, damage or electrical leakage, which may cause malfunction and unreliability of the ADC chip, and may even lead to complete failure.

[0004] Moreover, in a high-temperature environment, poor heat dissipation of the ADC chip itself will cause hot spots on the chip surface, that is, the temperature of the local area is too high. The hot spots may cause uneven heat diffusion, causing problems such as stress concentration inside the chip and solder joint breakage, thereby reducing the reliability of the chip.

[0005] To this end, we propose an ADC chip testing method and anti-interference testing equipment to solve the above problems. Summary of the invention

[0006] The object of the present invention is to provide an ADC chip testing method and anti-interference testing equipment in view of the above problems.

[0007] To achieve the above object, the present invention adopts the following technical scheme: an ADC chip testing method, the ADC chip testing method comprising the following steps:

[0008] S1: First, install the ADC chip in the test equipment;

[0009] S2: Use test equipment to simulate the high temperature environment when the ADC chip is working;

[0010] S3: Check whether the data signal generated by the ADC chip in a high temperature environment is normal;

[0011] S4: and detecting the heat dissipation condition of the ADC chip surface in a high temperature environment;

[0012] S5: The digital signal is captured by the logic analyzer and uploaded to the host computer. The host computer processes the digital signal to obtain the performance test results and the heat dissipation of the ADC surface.

[0013] An ADC chip anti-interference test device, the test device comprises a test box, one end side wall of the test box is provided with an opening, the side wall of the test box is rotatably connected to a box door through a rotating shaft, the outer wall of the box door is fixedly connected to a handle, the lower inner wall of the test box is fixedly connected to a mounting platform, the upper surface of the mounting platform is installed with an ADC chip body, the upper and lower inner walls of the test box are rotatably connected to the same first reciprocating screw rod, the upper side wall of the test box is provided with a servo motor, one output end of the servo motor passes through the side wall of the test box and is fixedly connected to one end of the first reciprocating screw rod, the rod wall of the first reciprocating screw rod is rotatably sleeved with a heating plate, the inner wall of the test box is provided with a limited position slide groove, the The internal movable card of the limiting slide is engaged with the limiting plate, and the side wall of one end of the limiting plate is fixedly connected to the side wall of the heating plate, and the side wall of one end of the detection box is fixedly connected to the temperature control box, and the upper and lower inner walls of the temperature control box are rotatably connected to the same rotating rod, and the rotating rod and the rod wall of the first reciprocating screw are rotatably sleeved with the same transmission belt, and the side walls of the opposite ends of the detection box and the temperature control box are provided with openings for the transmission belt to rotate, and the rod wall of the rotating rod is fixedly sleeved with a first worm gear, and the inner wall of one end of the temperature control box is rotatably connected to a connecting rod, and the rod wall of the connecting rod is fixedly sleeved with a first worm gear, and the first worm gear is meshed with the first worm gear, and one end of the connecting rod is fixedly connected to a cooling fan.

[0014] Preferably, a sealing shell is fixedly connected to the inner wall at one end of the detection box, a sealing piston is connected to the internal sealing sleeve of the sealing shell, a push rod is fixedly connected to the side wall at one end of the sealing piston, a heat conducting plate is fixedly connected to the side wall at one end of the sealing shell, one end of the heat conducting plate passes through the side wall of the sealing shell and extends inward, two support plates are symmetrically fixedly connected to the inner walls at both ends of the temperature control box, the upper end side walls of the two support plates are movably connected to a fixed plate, and one end of the push rod passes through the side walls of the sealing shell, the detection box and the temperature control box and is fixedly connected to one end of one of the fixed plates.

[0015] Preferably, the side walls at opposite ends of the two fixed plates are rotatably connected to the same second reciprocating screw, the rod wall of the second reciprocating screw is rotatably sleeved with a baffle through a threaded connection, the side walls at opposite ends of the temperature control box and the detection box are provided with the same opening, the inner wall of the temperature control box is fixedly connected to a limiting spring telescopic rod, one output end of the limiting spring telescopic rod is fixedly connected to the side wall at one end of the baffle, and the rod wall of the second reciprocating screw is provided with multiple transmission plates in a ring-shaped distribution.

[0016] Preferably, the inner walls at both ends of the temperature control box are rotatably connected to the same transmission rod, the rod wall of the transmission rod is fixedly sleeved with a second worm gear, the rod wall of the connecting rod is also fixedly sleeved with a second worm, the second worm is meshed with the second worm gear, the inner wall of one end of the temperature control box is rotatably connected to a support rod, the support rod and the outer wall of the transmission rod are rotatably sleeved with the same connecting belt, and the rod wall of the support rod is fixedly connected to a guide plate.

[0017] Preferably, the lower end side wall of one of the fixed plates is fixedly connected to a side plate, the side plate passes through one end side wall of the support plate and is fixedly connected to a connecting block, one end of the connecting block passes through the side wall of the detection box and is fixedly connected to a rectangular plate, one end side wall of the rectangular plate is rotatably connected to a threaded screw, the inner wall of the detection box is fixedly connected to two supporting telescopic rods, one end output end of the two supporting telescopic rods is fixedly connected to a rectangular plate, and one end of the threaded screw is rotatably connected to the side wall of another rectangular plate.

[0018] Preferably, the side wall of the heating plate is fixedly connected with a toothed plate, the rod wall of the threaded screw is rotatably connected with a movable slider through a thread, the side wall of the movable slider is fixedly connected with a temperature detector, the upper side walls of the two rectangular plates are fixedly connected with the same limit block, the lower side wall of the limit block is movably clamped with a guide block, the lower side wall of the guide block is fixedly connected to the side wall of the movable slider, the side walls of the two rectangular plates at opposite ends are rotatably connected with the same round rod, the rod wall of the round rod is fixedly sleeved with a pointed gear, the round rod and the rod wall of the threaded screw are both fixedly sleeved with circular gears, and the two circular gears are meshed.

[0019] Preferably, a warning rod is rotatably connected to the side wall of one of the fixed plates, one end of the warning rod passes through the side wall of the fixed plate and is fixedly connected to one end of the second reciprocating screw rod, the side wall of the temperature control box is provided with an opening for the warning rod to extend out, one end of the side wall of the temperature control box is fixedly connected to a storage plate, the upper end side wall of the storage plate is fixedly connected to a spring, one end of the spring is fixedly connected to a copper plate, and the rod wall of the warning rod is fixedly connected to a knocking plate.

[0020] Compared with the existing technology, the advantages of an ADC chip testing method and anti-interference testing equipment are:

[0021] The servo motor, heating plate, first worm, first worm wheel and rotating rod are arranged to bring thrust to the transmission plate during the continuous rotation of the guide plate, so that the transmission plate rotates continuously, driving the second reciprocating screw to rotate, so that the baffle plate which is sleeved on the rod wall of the reciprocating screw by threaded rotation moves back and forth, and the baffle plate can be limited by the limit spring telescopic rod to prevent the baffle plate from following the rotation of the second reciprocating screw rod and becoming unable to move. At this time, with the movement of the baffle plate, the opening on the side wall of the detection box can be intermittently unblocked, so that the cooling fan can cool down the heat in the detection box, preventing the temperature in the detection box from being too high to damage the ADC chip body, and can effectively prevent the accuracy of the internal ADC chip body test from being affected by the high temperature, while also improving the safety and reliability of the equipment.

[0022] By setting the side plates, tooth plates, pointed gears, round rods, movable sliders and threaded screws, when the temperature in the detection box reaches the maximum tolerance range of the ADC chip body, the push rod will drive the side plates to move in the process of pushing the fixed plate to move, and drive the temperature detector to move continuously, so as to detect the temperature of various places on the surface of the ADC chip body and the heat dissipation performance of the ADC chip body. It can monitor the temperature of the ADC chip body and detect the heat dissipation performance of the ADC chip body at the same time, thereby improving the use effect and detection efficiency of the equipment.

[0023] The warning rod, knocking plate and copper plate are arranged to drive the warning rod to rotate when the second reciprocating screw rotates. Because the fixed plate is located at the farthest end when the second reciprocating screw rotates, the knocking plate will continuously knock on the copper plate during the rotation of the knocking plate, making a sound, reminding the staff that the temperature in the detection box has reached the maximum tolerance range of the ADC chip body. The staff will test the performance of the ADC chip body at this time to improve the reliability and practicality of the equipment during detection. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 It is a structural schematic diagram of an ADC chip anti-interference test device provided by the present invention;

[0025] Figure 2 It is a schematic cross-sectional structure diagram of an ADC chip anti-interference test device provided by the present invention;

[0026] Figure 3 It is a schematic diagram of a top view of the structure of an ADC chip anti-interference test device provided by the present invention;

[0027] Figure 4 The present invention provides an ADC chip anti-interference test device Figure 3 A schematic diagram of the enlarged structure of part A;

[0028] Figure 5 It is a schematic diagram of a cross-sectional structure of an ADC chip anti-interference test device provided by the present invention, viewed from another angle;

[0029] Figure 6 The present invention provides an ADC chip anti-interference test device Figure 5 A schematic diagram of the enlarged structure of part B;

[0030] Figure 7 It is a side view structural schematic diagram of an ADC chip anti-interference test device provided by the present invention;

[0031] Figure 8 It is a schematic structural diagram of an ADC chip anti-interference test device provided by the present invention from another angle;

[0032] Fig. 9 It is a schematic diagram of the side view structure of an ADC chip anti-interference test device provided by the present invention from another angle.

[0033] In the figure: 1 ADC chip body, 2 detection box, 3 box door, 4 handle, 5 mounting table, 6 first reciprocating screw, 7 servo motor, 8 heating plate, 9 limit slide, 10 limit plate, 11 temperature control box, 12 rotating rod, 13 transmission belt, 14 first worm, 15 connecting rod, 16 first worm gear, 17 cooling fan, 18 sealing shell, 19 sealing piston, 20 push rod, 21 heat conduction plate, 22 support plate, 23 fixed plate, 24 second reciprocating screw, 25 gear Plate, 26 limit spring telescopic rod, 27 transmission plate, 28 transmission rod, 29 second worm wheel, 30 second worm, 31 support rod, 32 connecting belt, 33 guide plate, 34 side plate, 35 connecting block, 36 rectangular plate, 37 threaded screw, 38 supporting telescopic rod, 39 tooth plate, 40 moving slider, 41 temperature detector, 42 limit block, 43 guide block, 44 round rod, 45 sharp gear, 46 warning rod, 47 storage plate, 48 copper plate, 49 knocking plate, 50 round gear. DETAILED DESCRIPTION

[0034] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments.

[0035] like Figure 1-Figure 9 As shown, a method for testing an ADC chip includes the following steps:

[0036] S1: First, install the ADC chip in the test equipment;

[0037] S2: Use test equipment to simulate the high temperature environment when the ADC chip is working;

[0038] S3: Check whether the data signal generated by the ADC chip in a high temperature environment is normal;

[0039] S4: and detecting the heat dissipation condition of the ADC chip surface in a high temperature environment;

[0040] S5: The digital signal is captured by the logic analyzer and uploaded to the host computer. The host computer processes the digital signal to obtain the performance test results and the heat dissipation of the ADC surface.

[0041] An ADC chip anti-interference test device, the test device includes a test box 2, one end side wall of the test box 2 is provided with an opening, the side wall of the test box 2 is rotatably connected to a box door 3 through a rotating shaft, the outer wall of the box door 3 is fixedly connected to a handle 4, the lower inner wall of the test box 2 is fixedly connected to a mounting table 5, the upper surface of the mounting table 5 is installed with an ADC chip body 1, the upper and lower inner walls of the test box 2 are rotatably connected to the same first reciprocating screw rod 6, the upper side wall of the test box 2 is provided with a servo motor 7, one end output end of the servo motor 7 passes through the side wall of the test box 2 and is fixedly connected to one end of the first reciprocating screw rod 6, the rod wall of the first reciprocating screw rod 6 is rotatably sleeved with a heating plate 8, the inner wall of the test box 2 is provided with a limited slide groove 9, the inner part of the limited slide groove 9 The detection box 2 is movably connected to the limit plate 10, and the side wall of one end of the limit plate 10 is fixedly connected to the side wall of the heating plate 8. The side wall of one end of the detection box 2 is fixedly connected to the temperature control box 11. The upper and lower inner walls of the temperature control box 11 are rotatably connected to the same rotating rod 12. The rotating rod 12 and the rod wall of the first reciprocating screw 6 are rotatably sleeved with the same transmission belt 13. The side walls of the opposite ends of the detection box 2 and the temperature control box 11 are provided with openings for the transmission belt 13 to rotate. The rod wall of the rotating rod 12 is fixedly sleeved with a first worm 14. The inner wall of one end of the temperature control box 11 is rotatably connected to a connecting rod 15. The rod wall of the connecting rod 15 is fixedly sleeved with a first worm gear 16. The first worm gear 16 is meshed with the first worm gear 14. One end of the connecting rod 15 is fixedly sleeved with a first worm gear 16. A cooling fan 17 is fixedly connected, a sealing shell 18 is fixedly connected to the inner wall of one end of the detection box 2, a sealing piston 19 is connected to the inner sealing sleeve of the sealing shell 18, a push rod 20 is fixedly connected to the side wall of one end of the sealing piston 19, a heat conducting plate 21 is fixedly connected to the side wall of one end of the sealing shell 18, one end of the heat conducting plate 21 penetrates the side wall of the sealing shell 18 and extends inward, two support plates 22 are symmetrically fixedly connected to the inner walls of the two ends of the temperature control box 11, and the upper end side walls of the two support plates 22 are movably connected to the fixed plate 23, one end of the push rod 20 penetrates the sealing shell 18, the side walls of the detection box 2 and the temperature control box 11 and are fixedly connected to one end of one of the fixed plates 23, and the two fixed plates 23 are rotatably connected to the side walls at one end thereof with the same second reciprocating screw 24, the rod wall of the second reciprocating screw 24 is rotatably sleeved with a baffle 25 through a thread, the side wall of the temperature control box 11 opposite to the detection box 2 is provided with the same opening, the inner wall of the temperature control box 11 is fixedly connected with a limit spring telescopic rod 26, one end of the output end of the limit spring telescopic rod 26 is fixedly connected to the side wall of one end of the baffle 25, the rod wall of the second reciprocating screw 24 is annularly distributed with a plurality of transmission plates 27, the inner walls at both ends of the temperature control box 11 are rotatably connected with the same transmission rod 28, the rod wall of the transmission rod 28 is fixedly sleeved with a second worm gear 29, the rod wall of the connecting rod 15 is also fixedly sleeved with a second worm 30, the second worm 30 is meshed with the second worm gear 29, and the inner wall of one end of the temperature control box 11 is rotatably connected with a support rod 31,The support rod 31 and the outer wall of the transmission rod 28 are rotatably sleeved with a connecting belt 32, and the rod wall of the support rod 31 is fixedly connected with a guide plate 33, which can intermittently not block the opening opened on the side wall of the detection box 2, so that the cooling fan 17 can cool down the heat in the detection box 2, prevent the excessive temperature in the detection box 2 from damaging the ADC chip body 1, and effectively prevent the excessive temperature from affecting the accuracy of the test of the ADC chip body 1, and at the same time can also improve the safety and reliability of the equipment.

[0042] The lower side wall of one of the fixed plates 23 is fixedly connected to a side plate 34, and the side plate 34 passes through one end of the support plate 22 and is fixedly connected to a connecting block 35. One end of the connecting block 35 passes through the side wall of the detection box 2 and is fixedly connected to a rectangular plate 36. One end of the side wall of the rectangular plate 36 is rotatably connected to a threaded screw 37. The inner wall of the detection box 2 is fixedly connected to two supporting telescopic rods 38. One end of the output ends of the two supporting telescopic rods 38 are fixedly connected to the rectangular plate 36. One end of the threaded screw 37 is rotatably connected to the side wall of another rectangular plate 36. The side wall of the heating plate 8 is fixedly connected to a toothed plate 39. The rod wall of the threaded screw 37 is rotatably connected to a movable slider 40 through a thread. The movable slider 40 A temperature detector 41 is fixedly connected to the side wall of the two rectangular plates 36, a limit block 42 is fixedly connected to the upper side walls of the two rectangular plates 36, a guide block 43 is movably connected to the lower side wall of the limit block 42, and the lower side wall of the guide block 43 is fixedly connected to the side wall of the movable slider 40, and the side walls of the two rectangular plates 36 at the opposite ends are rotatably connected to the same round rod 44, a sharp gear 45 is fixedly sleeved on the rod wall of the round rod 44, and a circular gear 50 is fixedly sleeved on the rod wall of the round rod 44 and the rod wall of the threaded screw 37. The two circular gears 50 are meshed with each other, so that the heat dissipation performance of the ADC chip body 1 can be detected while the temperature of the ADC chip body 1 is monitored, thereby improving the use effect and detection efficiency of the equipment.

[0043] A warning rod 46 is rotatably connected to the side wall of one of the fixed plates 23, one end of the warning rod 46 passes through the side wall of the fixed plate 23 and is fixedly connected to one end of the second reciprocating screw rod 24, and an opening is provided on the side wall of the temperature control box 11 for the warning rod 46 to extend out, a storage plate 47 is fixedly connected to the side wall of one end of the temperature control box 11, a spring is fixedly connected to the upper side wall of the storage plate 47, a copper plate 48 is fixedly connected to one end of the spring, and a knocking plate 49 is fixedly connected to the rod wall of the warning rod 46, which can remind the staff that the temperature in the detection box 2 has reached the maximum tolerance range of the ADC chip body 1 at this time, and the staff can test the performance of the ADC chip body 1 at this time, thereby improving the reliability and practicality of the equipment during detection.

[0044] The operating principle of the present invention is now described as follows:

[0045] When the ADC chip body 1 needs to be temperature tested, the staff opens the box door 3 and places the ADC chip body 1 on the mounting table 5. At this time, the box door 3 is closed, and then the staff starts the servo motor 7 and the heating plate 8 at the same time. When the servo motor 7 is started, the first reciprocating screw rod 6 is driven to rotate continuously. During the continuous rotation of the first reciprocating screw rod 6, the heating plate 8 connected to the rod wall of the first reciprocating screw rod 6 through threaded rotation is moved up and down reciprocatingly, so that the temperature in the detection box 2 can be evenly increased when the heating plate 8 is heated, so as to facilitate more stable detection of the ADC chip body 1. As the heating plate 8 continues to work, the temperature in the detection box 2 will continue to rise, and the temperature in the detection box 2 will continue to rise. When the temperature reaches the maximum tolerance limit of the ADC chip body 1, since mercury is arranged in the sealing shell 18, under the effect of thermal expansion and contraction, the sealing piston 19 will be continuously pushed to move to one end. When the temperature in the detection box 2 reaches the maximum temperature range of the ADC chip body 1, the sealing piston 19 drives the push rod 20 to move to the farthest position, so that the push rod 20 pushes the fixed plate 23 in the temperature control box 11 to move to one end. In the process of continuous rotation of the first reciprocating screw 6, under the transmission action of the transmission belt 13, the rotating rod 12 will be driven to rotate continuously. In the process of continuous rotation of the rotating rod 12, the first worm 14 will be continuously rotated, thereby driving the first worm wheel 16 meshing with the first worm 14 to rotate continuously. As the wheel 16 rotates continuously, the connecting rod 15 is driven to rotate continuously, thereby rotating the cooling fan 17. As the connecting rod 15 rotates continuously, the second worm 30 is driven to rotate continuously. As the second worm 30 rotates continuously, the second worm wheel 29 meshing with the second worm 30 is rotated, thereby driving the transmission rod 28 to rotate. During the rotation of the transmission rod 28, the support rod 31 is driven by the connecting belt 32, thereby driving the guide plate 33 to rotate continuously. When the fixed plate 23 moves to the farthest position under the pushing action of the push rod 20, the second reciprocating screw rod 24 moves with the fixed plate 23. At this time, the transmission plate 27 on the rod wall of the second reciprocating screw rod 24 moves to the moving track of the guide plate 33. In the process of continuous rotation of the guide plate 33, a thrust will be brought to the transmission plate 27, so that the transmission plate 27 is continuously rotated, driving the second reciprocating screw 24 to rotate, so that the baffle 25 sleeved on the rod wall of the reciprocating screw through threaded rotation moves back and forth, and the baffle 25 can be limited by the limit spring telescopic rod 26 to prevent the baffle 25 from following the rotation of the second reciprocating screw 24 and becoming unable to move. At this time, with the movement of the baffle 25, the opening opened on the side wall of the detection box 2 can be intermittently unblocked, so that the cooling fan 17 can cool down the heat in the detection box 2, preventing the temperature in the detection box 2 from being too high to damage the ADC chip body 1, and can effectively prevent the accuracy of the test of the ADC chip body 1 from being affected by the excessive temperature.At the same time, the safety and reliability of the device can be improved. When the temperature in the detection box 2 drops, the mercury in the sealing shell 18 will drive the sealing piston 19 to move back due to thermal expansion and contraction, and drive the push rod 20 and the fixing plate 23 to move back. At this time, the transmission plate 27 is not on the movement track of the guide plate 33, and the limit spring telescopic rod 26 will pull the baffle 25 back to continue to cover the opening of the side wall of the detection box 2, and start again when the temperature is too high;

[0046] When the temperature in the detection box 2 reaches the maximum tolerance range of the ADC chip body 1, the push rod 20 will drive the side plate 34 to move in the process of pushing the fixed plate 23 to move, thereby driving the side plate 34 to follow the movement. In the process of the side plate 34 moving, the rectangular plate 36 will follow the movement. When the fixed plate 23 moves to the farthest position, the rectangular plate 36 will drive the round rod 44 to move to the farthest position. At this time, the sharp gear 45 fixedly sleeved on the wall of the round rod 44 will be on the movement trajectory of the toothed plate 39. In the process of the heating plate 8 moving up and down, it will drive the toothed plate 39 to follow the movement. When the sharp gear 45 moves to the movement trajectory of the toothed plate 39, under the action of the up and down movement of the toothed plate 39, it will drive the sharp gear 45 The gear 45 rotates, thereby driving the round rod 44 to rotate accordingly. During the continuous rotation of the round rod 44, the round gear 50 is driven to rotate, thereby causing another round gear 50 meshing with it to rotate accordingly, driving the threaded screw 37 to rotate back and forth continuously, thereby causing the moving slider 40 sleeved on the rod wall of the threaded screw 37 through threaded rotation to move back and forth, driving the temperature detector 41 to move continuously, detecting the temperature of various locations on the surface of the ADC chip body 1, and detecting the heat dissipation performance of the ADC chip body 1. While monitoring the temperature of the ADC chip body 1, the heat dissipation performance of the ADC chip body 1 can be detected, thereby improving the use effect and detection efficiency of the device;

[0047] When the second reciprocating screw 24 rotates, the warning rod 46 will be driven to rotate. During the continuous rotation of the warning rod 46, the knocking plate 49 will be driven to rotate accordingly. Since the fixed plate 23 is located at the farthest end when the second reciprocating screw 24 rotates, the copper plate 48 will be continuously knocked during the rotation of the knocking plate 49, making a sound to remind the staff that the temperature in the detection box 2 has reached the maximum tolerance range of the ADC chip body 1. The staff will test the performance of the ADC chip body 1 at this time to improve the reliability and practicality of the equipment during detection.

[0048] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. An ADC chip anti-interference test device, comprising a detection box (2), characterized in that: The detection box (2) has an opening on one side wall, the detection box (2) is rotatably connected to a box door (3) on the side wall via a rotating shaft, the box door (3) is fixedly connected to a handle (4) on the outer wall, the lower inner wall of the detection box (2) is fixedly connected to a mounting platform (5), the upper surface of the mounting platform (5) is mounted with an ADC chip body (1), the upper and lower inner walls of the detection box (2) are rotatably connected to the same first reciprocating screw (6), the upper side wall of the detection box (2) is provided with a servo motor (7), one output end of the servo motor (7) passes through the side wall of the detection box (2) and is fixedly connected to one end of the first reciprocating screw (6), the rod wall of the first reciprocating screw (6) is rotatably sleeved with a heating plate (8), the inner wall of the detection box (2) is provided with a limit slide groove (9), the inner part of the limit slide groove (9) is movably engaged with a limit plate (10), the limit plate ( One end side wall of the detection box (10) is fixedly connected to the side wall of the heating plate (8), one end side wall of the detection box (2) is fixedly connected to the temperature control box (11), the upper and lower inner walls of the temperature control box (11) are rotatably connected to the same rotating rod (12), the rotating rod (12) and the rod wall of the first reciprocating screw (6) are rotatably sleeved with the same transmission belt (13), the side walls of the detection box (2) and the temperature control box (11) at the opposite ends are each provided with an opening for the transmission belt (13) to rotate, the rod wall of the rotating rod (12) is fixedly sleeved with a first worm (14), one end inner wall of the temperature control box (11) is rotatably connected to a connecting rod (15), the rod wall of the connecting rod (15) is fixedly sleeved with a first worm gear (16), the first worm gear (16) is meshed with the first worm gear (14), and one end of the connecting rod (15) is fixedly connected to a cooling fan (17); A sealing shell (18) is fixedly connected to the inner wall at one end of the detection box (2), and mercury is arranged in the sealing shell (18). A sealing piston (19) is sealed inside the sealing shell (18), and a push rod (20) is fixedly connected to the side wall at one end of the sealing piston (19). A heat conducting plate (21) is fixedly connected to the side wall at one end of the sealing shell (18), and one end of the heat conducting plate (21) penetrates the side wall of the sealing shell (18) and protrudes inwardly. Two support plates (22) are symmetrically fixedly connected to the inner walls at both ends of the temperature control box (11), and the upper side walls of the two support plates (22) are movably connected to a fixed plate (23). One end of the push rod (20) penetrates the side walls of the sealing shell (18), the detection box (2) and the temperature control box (11), and is fixedly connected to one end of one of the fixed plates (23); The side walls of the two fixed plates (23) at opposite ends are rotatably connected to a same second reciprocating screw (24); a baffle (25) is rotatably sleeved on the rod wall of the second reciprocating screw (24) through a thread; the side walls of the temperature control box (11) and the detection box (2) at opposite ends are provided with a same opening; a limit spring telescopic rod (26) is fixedly connected to the inner wall of the temperature control box (11); an output end of the limit spring telescopic rod (26) is fixedly connected to a side wall of one end of the baffle (25); and a plurality of transmission plates (27) are arranged in an annular shape on the rod wall of the second reciprocating screw (24); The inner walls of both ends of the temperature control box (11) are rotatably connected to a transmission rod (28), a second worm gear (29) is fixedly sleeved on the rod wall of the transmission rod (28), a second worm gear (30) is also fixedly sleeved on the rod wall of the connecting rod (15), the second worm gear (30) is meshed with the second worm gear (29), a support rod (31) is rotatably connected to the inner wall of one end of the temperature control box (11), the support rod (31) and the outer wall of the transmission rod (28) are rotatably sleeved with a connection belt (32), and a guide plate (33) is fixedly connected to the rod wall of the support rod (31).

2. The ADC chip anti-interference test device according to claim 1, characterized in that: A side plate (34) is fixedly connected to the side wall at the lower end of one of the fixed plates (23); the side plate (34) passes through the side wall of one end of the support plate (22) and is fixedly connected to a connecting block (35); one end of the connecting block (35) passes through the side wall of the detection box (2) and is fixedly connected to a rectangular plate (36); one end of the side wall of the rectangular plate (36) is rotatably connected to a threaded screw (37); two supporting telescopic rods (38) are fixedly connected to the inner wall of the detection box (2); one end output end of the two supporting telescopic rods (38) is fixedly connected to the rectangular plate (36); one end of the threaded screw (37) is rotatably connected to the side wall of another rectangular plate (36).

3. The ADC chip anti-interference test equipment according to claim 2, characterized in that: The side wall of the heating plate (8) is fixedly connected to a toothed plate (39); the rod wall of the threaded screw (37) is rotatably connected to a movable slider (40) through a thread; the side wall of the movable slider (40) is fixedly connected to a temperature detector (41); the upper side walls of the two rectangular plates (36) are fixedly connected to a same limit block (42); the lower side wall of the limit block (42) is movably connected to a guide block (43); the lower side wall of the guide block (43) is fixedly connected to the side wall of the movable slider (40); the side walls of the two rectangular plates (36) at opposite ends are rotatably connected to a same round rod (44); the rod wall of the round rod (44) is fixedly sleeved with a sharp gear (45); the round rod (44) and the rod wall of the threaded screw (37) are both fixedly sleeved with a circular gear (50); the two circular gears (50) are meshed with each other.

4. The ADC chip anti-interference test device according to claim 1, characterized in that: A warning rod (46) is rotatably connected to a side wall at one end of one of the fixed plates (23); one end of the warning rod (46) penetrates the side wall of the fixed plate (23) and is fixedly connected to one end of the second reciprocating screw rod (24); an opening is provided on the side wall of the temperature control box (11) for the warning rod (46) to extend out; a storage plate (47) is fixedly connected to a side wall at one end of the temperature control box (11); a spring is fixedly connected to an upper side wall of the storage plate (47); one end of the spring is fixedly connected to a copper plate (48); and a knocking plate (49) is fixedly connected to the rod wall of the warning rod (46).

5. An ADC chip testing method, applied to an ADC chip anti-interference testing device as claimed in any one of claims 1 to 4, characterized in that: The ADC chip testing method comprises the following steps: S1: First, install the ADC chip in the test equipment; S2: Use test equipment to simulate the high temperature environment when the ADC chip is working; S3: Check whether the data signal generated by the ADC chip in a high temperature environment is normal; S4: and detecting the heat dissipation condition of the ADC chip surface in a high temperature environment; S5: The digital signal is captured by the logic analyzer and uploaded to the host computer. The host computer processes the digital signal to obtain the performance test results and the heat dissipation of the ADC surface.

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