Transmission Tower Fault Location Method

Abstract

The present invention provides a method for locating faults of a transmission tower. The method comprises the steps of obtaining an inspection image taken by an inspection device on a corresponding transmission tower in a monitoring area, performing fault analysis on a power element corresponding to the transmission tower according to the inspection image to obtain fault detection data, determining a fault element according to the fault detection data, classifying the fault element based on a fault maintenance range of the inspection device to obtain a single fault element and a combined fault element, determining a single positioning data of the inspection device based on a single fault range of the single fault element, controlling the inspection device to perform maintenance operations on the single fault element based on the single positioning data, determining a combined positioning data of the inspection device based on a combined fault range of the combined fault element, and controlling the inspection device to perform maintenance operations on the combined fault element based on the combined positioning data.

Description

Technical Field

[0001] The invention relates to a fault location technology, and in particular to a method for locating a fault of a transmission tower. Background Art

[0002] As an important part of the transmission tower, the insulator string is located in a complex environment and is inevitably subjected to the invasion of nature and the impact of human activities for many years. When dust, rainwater and other dirty substances accumulate on the surface of the insulator string, it is easy to form a leakage path, causing the insulator string to flash over, and then cause the transmission tower to fail, affecting the stability of the power system. Therefore, in order to ensure the safe and reliable operation of the transmission tower, it is necessary to do a good job in fault maintenance of the insulator string.

[0003] In the prior art, fault maintenance of insulator strings is usually performed manually. For example, when an insulator string on a transmission tower is contaminated, manual labor needs to be dispatched to the tower for cleaning. The insulators need to be cleaned one by one, and the cleaning efficiency is relatively low. In addition, there may be poor or delayed information transmission from the discovery of the insulator string fault to the reporting of the fault and then to the dispatch of maintenance personnel, which will prolong the fault response time and increase the safety risks of the power system.

[0004] Therefore, how to automatically perform fault maintenance on insulators in transmission towers and reduce potential safety hazards in the power system has become an urgent problem to be solved. Summary of the invention

[0005] The invention provides a transmission iron tower fault locating method, which can perform automatic fault maintenance on insulators in the transmission iron tower and reduce the potential safety hazards of the power system.

[0006] A first aspect of the present invention provides a method for locating a transmission tower fault, characterized in that it comprises:

[0007] Obtaining inspection images taken by inspection equipment of corresponding transmission towers in the monitoring area, and performing fault analysis on power components corresponding to the transmission towers according to the inspection images to obtain fault detection data;

[0008] Determine the fault component according to the fault detection data, classify the fault component based on the fault maintenance scope of the inspection equipment, and obtain a single fault component and a combined fault component;

[0009] Determine single positioning data of the inspection device based on the single fault range of the single fault component, and control the inspection device to perform maintenance operations on the single fault component based on the single positioning data;

[0010] According to the combined fault range of the combined fault element, the combined positioning data of the inspection equipment is determined, and the inspection equipment is controlled to perform maintenance operations on the combined fault element based on the combined positioning data.

[0011] Optionally, in a possible implementation manner of the first aspect, obtaining an inspection image taken by an inspection device of a corresponding transmission tower in a monitoring area, and performing fault analysis on a power element corresponding to the transmission tower according to the inspection image to obtain fault detection data includes:

[0012] Extracting multiple insulator contours in the inspection image, obtaining a line start point and a line end point in the inspection image, and determining an operation direction according to the line start point and the line end point;

[0013] Determine that multiple insulator profiles arranged in parallel in the operating direction are the same power component group, and obtain a power component profile corresponding to the power component according to the multiple insulator profiles in the power component group;

[0014] Obtaining a sub-average pixel value of each of the insulator contours in the power component contour, and obtaining an average pixel value corresponding to each of the power component contours according to each of the sub-average pixel values;

[0015] Determine that the power element profile whose average pixel value is not within the normal pixel value interval is an abnormal power profile, and the power element profile whose average pixel value is within the normal pixel value interval is a normal power profile, and obtain fault detection data according to the abnormal power profile and the normal power profile.

[0016] Optionally, in a possible implementation manner of the first aspect, determining a faulty component according to the fault detection data, and classifying the faulty component based on a fault maintenance scope of the inspection device to obtain a single faulty component and a combined faulty component, including:

[0017] Determine that the power element corresponding to the abnormal power profile is a faulty element, and obtain a direction perpendicular to the operation direction as a covering direction;

[0018] Acquire the faulty components arranged adjacently in the covering direction as pending components, and determine the component distance according to the difference of the extreme value coordinate values ​​of a plurality of contour points adjacent to the pending components in the covering direction;

[0019] Determine the maximum coverage span of all cleaning components in the inspection device in the coverage direction according to the fault maintenance scope of the inspection device;

[0020] The faulty element whose element distance is less than the maximum coverage span is determined to be a combined faulty element, and the faulty element whose element distance is greater than or equal to the maximum coverage span is determined to be a single faulty element.

[0021] Optionally, in a possible implementation manner of the first aspect, determining single positioning data of an inspection device based on a single fault range of the single fault component, and controlling the inspection device to perform a maintenance operation on the single fault component based on the single positioning data includes:

[0022] Determine a single maximum distance according to the difference of the extreme coordinate values ​​of a plurality of contour points of the single faulty element in the working direction;

[0023] Determine the maximum operating span of all cleaning components in the inspection equipment in the operating direction according to the fault maintenance scope of the inspection equipment;

[0024] Based on the comparison result of the single maximum distance and the maximum operation span, determine a type of cleaning area corresponding to the single faulty component, and determine a type of cleaning point and an operation component corresponding to the type of cleaning point according to the type of cleaning area;

[0025] Obtaining a contamination coefficient of the single faulty component at the first type of cleaning point, and determining a cleaning time of the operating component at the first type of cleaning point according to the contamination coefficient;

[0026] A single positioning data is obtained according to the cleaning time of the working component at the type of cleaning point, and the inspection device is controlled to perform a maintenance operation on the single faulty component based on the single positioning data.

[0027] Optionally, in a possible implementation manner of the first aspect, based on a comparison result of the single maximum distance and the maximum operating span, determining a type of cleaning area corresponding to the single faulty component, and determining a type of cleaning point and an operating component corresponding to the type of cleaning point according to the type of cleaning area, includes:

[0028] When the single maximum distance is less than or equal to the maximum operating span, determining the contour area corresponding to the single faulty element as the first type of cleaning area;

[0029] When the single maximum distance is greater than the maximum operating span, the number of area divisions is obtained according to a ratio of the single maximum distance to the maximum operating span;

[0030] A unit cleaning distance is obtained according to a ratio of the single maximum distance to the number of area divisions, and a plurality of division lines which are spaced apart by the unit cleaning distance and are perpendicular to the operation direction are generated in the abnormal power profile corresponding to the single faulty element;

[0031] The abnormal power profile is evenly divided based on the dividing line to obtain a plurality of sub-power profiles, a profile area corresponding to each of the sub-power profiles is determined to be a type of clean area, and a profile center point of the type of clean area is obtained as the type of clean point;

[0032] Obtain and determine the sub-cleaning span of each cleaning component in the inspection device in the working direction, and obtain the number of openings of the cleaning components in the inspection device according to the ratio of the unit cleaning distance to the sub-cleaning span;

[0033] Starting from the middle position, corresponding cleaning components are selected from both sides of the plurality of cleaning components arranged in a line in the inspection device as working components, and the selection of the working components is stopped when the number of the working components is equal to the opening number.

[0034] Optionally, in a possible implementation manner of the first aspect, obtaining a contamination coefficient of the single faulty component at the type of cleaning point, and determining a cleaning time of the operating component at the type of cleaning point according to the contamination coefficient includes:

[0035] Determine a pixel point in each of the clean areas whose pixel value is not within the normal pixel value interval as a single dirty pixel point;

[0036] Obtaining a single abnormality ratio of the clean area of ​​the type according to the ratio of the number of the single dirty pixel point to the total number of all pixel points in the clean area of ​​the type;

[0037] Obtaining a single offset difference between the single abnormal ratio and the reference contamination ratio, obtaining a contamination coefficient of the first type of clean area according to a ratio of the single offset difference to the reference offset difference, and obtaining a type of duration coefficient based on a difference between the contamination coefficient and a standard contamination coefficient;

[0038] A type of duration offset value is obtained according to the product of the type of duration coefficient and the standard duration, and the cleaning duration of the operating component corresponding to the type of cleaning area at the corresponding type of cleaning point is obtained based on the sum of the standard duration and the type of duration offset value.

[0039] Optionally, in a possible implementation manner of the first aspect, determining combined positioning data of an inspection device according to a combined fault range of the combined fault element, and controlling the inspection device to perform a maintenance operation on the combined fault element based on the combined positioning data, includes:

[0040] Generate an operation path corresponding to the combined fault element based on the operation direction, and determine a combined maximum distance according to the difference of extreme coordinate values ​​of multiple contour points of the combined fault element in the operation direction;

[0041] Determine the maximum operating span of all cleaning components in the inspection equipment in the operating direction according to the fault maintenance scope of the inspection equipment;

[0042] Based on the comparison result of the combined maximum distance and the maximum operation span, determining the second type of cleaning points on the operation path and the operation parts of the inspection equipment corresponding to the second type of cleaning points;

[0043] Obtaining a contamination coefficient of the combined fault component at the second type of cleaning point, and determining a cleaning time of the operating component at the second type of cleaning point according to the contamination coefficient;

[0044] Combined positioning data is obtained according to the cleaning time of the operating component at the second type of cleaning point, and the inspection device is controlled to perform maintenance operations on the combined fault component based on the combined positioning data.

[0045] Optionally, in a possible implementation manner of the first aspect, generating an operation path corresponding to the combined fault component based on the operation direction includes:

[0046] Acquire the outer contour of each of the combined fault components, and number a plurality of contour points in the outer contour from small to large according to the operation direction to obtain the operation number of each of the contour points;

[0047] Determine that the contour points with the same operation number are the same operation group, and sequentially connect the multiple contour points in each operation group according to the covering direction to obtain the operation line corresponding to each operation group;

[0048] The midpoint of each of the operation lines is obtained as an operation point, and an operation path corresponding to the combined fault component is generated according to each of the operation points.

[0049] Optionally, in a possible implementation of the first aspect, determining the second type of cleaning points on the working path and the working parts of the inspection device corresponding to the second type of cleaning points based on the comparison result of the combined maximum distance and the maximum working span includes:

[0050] When the combined maximum distance is less than or equal to the maximum operation span, determining the center point of the operation path as the second type of cleaning point;

[0051] When the combined maximum distance is greater than the maximum operating span, the number of path divisions is obtained according to a ratio of the combined maximum distance to the maximum operating span;

[0052] Obtaining a unit division distance according to a ratio of a path length of the operation path to a number of path divisions;

[0053] Taking the operation point in the operation line corresponding to the contour point with the smallest operation number as the division point, and sequentially determining a plurality of points with intervals equal to the unit division distance as the division points;

[0054] Determine the point corresponding to the middle position of each adjacent dividing point in the operation path as a second-class cleaning point, divide the abnormal power contours corresponding to all combined fault components according to the operation lines corresponding to each dividing point, and obtain the second-class cleaning area corresponding to each second-class cleaning point;

[0055] Obtaining a sub-cleaning span of each cleaning component in the inspection device in the working direction, and obtaining the number of opened cleaning components in the inspection device according to a ratio of the unit division distance to the sub-cleaning span;

[0056] Starting from the middle position, corresponding cleaning components are selected from both sides of the plurality of cleaning components arranged in a line in the inspection device as working components, and the selection of the working components is stopped when the number of the working components is equal to the opening number.

[0057] Optionally, in a possible implementation manner of the first aspect, obtaining a contamination coefficient of the combined fault component at the second type of cleaning point, and determining a cleaning time of the operating component at the second type of cleaning point according to the contamination coefficient includes:

[0058] Acquire the contour area corresponding to each of the abnormal power contours in each of the two types of clean areas as the target area;

[0059] Determine the pixel points in the target area whose pixel values ​​are not within the normal pixel value interval as combined dirty pixel points;

[0060] Obtaining a combined abnormality ratio of the two types of clean areas according to a ratio of the number of the combined dirty pixels to the total number of all pixels in the target area;

[0061] Obtaining a combined offset difference between the combined abnormality ratio and the reference contamination ratio, obtaining a contamination coefficient of the second type of cleaning area according to a ratio of the combined offset difference to the reference offset difference, and obtaining a second type of duration coefficient based on a difference between the contamination coefficient and the standard contamination coefficient;

[0062] The second-category duration offset value is obtained according to the product of the second-category duration coefficient and the standard duration, and the cleaning duration of the operating component corresponding to the second-category cleaning area at the corresponding second-category cleaning point is obtained based on the sum of the standard duration and the second-category duration offset value.

[0063] A second aspect of the present invention provides a transmission tower fault location device, comprising:

[0064] An acquisition module is used to acquire inspection images taken by inspection equipment on corresponding transmission towers in the monitoring area, and to perform fault analysis on power components corresponding to the transmission towers according to the inspection images to obtain fault detection data;

[0065] A determination module, configured to determine a faulty component according to the fault detection data, and classify the faulty component based on the fault maintenance scope of the inspection equipment to obtain a single faulty component and a combined faulty component;

[0066] A control module, configured to determine single positioning data of an inspection device based on a single fault range of the single fault component, and control the inspection device to perform maintenance operations on the single fault component based on the single positioning data;

[0067] The maintenance module is used to determine the combined positioning data of the inspection equipment according to the combined fault range of the combined fault element, and control the inspection equipment to perform maintenance operations on the combined fault element based on the combined positioning data.

[0068] The beneficial effects of the present invention are as follows:

[0069] 1. The present invention can perform fault detection on the insulator string in combination with the image data of the insulator string captured by the inspection equipment, obtain fault detection data, and clean the insulator string with stains according to the fault detection data to ensure the normal operation of the insulator string. When the stains on the insulator are cleaned by the cleaning component on the inspection equipment, a corresponding cleaning plan can be made according to the contamination condition of the insulator string, thereby improving the cleaning efficiency and cleaning quality. When planning the cleaning of insulator strings, the present invention can classify them in combination with the distance between the insulator strings and the fault maintenance range of the inspection equipment. If the fault maintenance range of the inspection equipment can completely cover multiple insulator strings of the same insulating device, that is, the inspection equipment can clean multiple adjacent insulator strings on the same insulating device at the same time, then the multiple insulator strings of the same insulating device can be classified as combined fault elements, so that multiple insulator strings that meet the fault maintenance range can be cleaned simultaneously. If the inspection equipment cannot clean multiple adjacent insulator strings on the same insulating device at the same time, then each single insulator string corresponding to the insulating device can be classified as a single fault element. When cleaning, the multiple single fault elements are cleaned separately. The cleaning work can be performed in combination with the actual situation of the fault element, thereby improving the cleaning efficiency of the inspection equipment.

[0070] 2. When the present invention performs cleaning planning for a single faulty component, that is, when performing cleaning planning for a single string of insulators, the difference in extreme coordinate values ​​of multiple contour points of the single string of insulators in the operating direction can be determined as a single maximum distance. By comparing the single maximum distance of the insulator string with the maximum operating span of the inspection equipment, one or more first-class cleaning areas can be determined according to the comparison results, and the contour center point corresponding to the first-class cleaning area can be used as a first-class cleaning point. The inspection equipment can determine the position point where the cleaning work is actually performed according to the first-class cleaning point, and at the same time, the number of cleaning components that need to be turned on at the first-class cleaning point can be determined in combination with the sub-cleaning span of a single cleaning component and the unit cleaning distance of the first-class cleaning area, and the turned-on cleaning components can be selected, so as to ensure that the cleaning resources are reasonably allocated and utilized, and at the same time, it can ensure that the inspection equipment can fully cover the entire area that needs to be cleaned when performing the cleaning operation, thereby improving the cleaning efficiency. When the present invention performs cleaning planning for the combined fault element, that is, when performing cleaning planning for the double-string insulator string, in order to make the fault maintenance range of the inspection equipment include the complete double-string insulator string, an operation path in the operation direction can be planned for the inspection equipment. In order to make the operation path of the inspection equipment be located in the middle of the two insulator strings, the midpoint of each operation line can be obtained as the operation point, and each operation point is connected in sequence to obtain the operation path corresponding to the combined fault element, so that the cleaning range of the inspection equipment during operation can evenly cover the insulator strings on both sides, and at the same time, the cleaning efficiency of the inspection equipment can be improved.

[0071] 3. When obtaining the cleaning time corresponding to each cleaning point, the present invention can adjust the cleaning time according to the degree of contamination of the insulator string, thereby improving the cleaning degree of the cleaning area by the inspection equipment. When selecting the cleaning parts to be turned on, the present invention can select a corresponding number of cleaning parts from the middle position of multiple cleaning parts to both sides in sequence as operating parts, which can reduce the number of times the cleaning parts are adjusted, improve the cleaning efficiency, and at the same time make the inspection equipment clean more comprehensively when performing cleaning work. BRIEF DESCRIPTION OF THE DRAWINGS

[0072] Figure 1 It is a schematic flow chart of a method for locating a transmission tower fault provided by an embodiment of the present invention;

[0073] Figure 2 is a schematic diagram of an inspection device provided by an embodiment of the present invention;

[0074] Figure 3 is a schematic diagram of a type of cleaning area provided by an embodiment of the present invention;

[0075] Figure 4 The present invention is a schematic diagram of the structure of a transmission tower fault locating device provided in an embodiment of the present invention. DETAILED DESCRIPTION

[0076] In order to make the purpose, technical solution and advantages of the embodiments of the present invention clearer, the technical solution in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0077] The technical solution of the present invention is described in detail with specific embodiments below. The following specific embodiments can be combined with each other, and the same or similar concepts or processes may not be described in detail in some embodiments.

[0078] See also Figure 1 , is a schematic diagram of a method for locating a transmission tower fault provided by an embodiment of the present invention, Figure 1 The execution subject of the method shown may be a software and / or hardware device. The execution subject of the present application may include but is not limited to at least one of the following: user equipment, network equipment, etc. Among them, user equipment may include but is not limited to computers, smart phones, personal digital assistants (PDA) and the electronic devices mentioned above. Network equipment may include but is not limited to a single network server, a server group consisting of multiple network servers, or a cloud based on cloud computing consisting of a large number of computers or network servers, wherein cloud computing is a type of distributed computing, a super virtual computer composed of a group of loosely coupled computers. This embodiment does not limit this. It includes steps S1 to S4, as follows:

[0079] S1, obtaining inspection images taken by inspection equipment of corresponding transmission towers in a monitoring area, and performing fault analysis on power components corresponding to the transmission towers according to the inspection images to obtain fault detection data.

[0080] Transmission towers are an important part of the power grid system, and their stable operation is directly related to the reliability and economy of power supply. Among them, insulator strings are very critical parts of transmission towers, which are used to support and fix conductors and ensure electrical insulation between conductors and towers and between conductors. Since insulators are exposed to the natural environment for a long time, dust, particles, sand and other contaminants are easily accumulated on their surfaces. When there are too many contaminants, it will affect the insulation performance of the insulators, increase the risk of leakage and breakdown, and may also reduce the heat dissipation capacity of the insulators and accelerate their aging. Therefore, pollutants on the insulator strings on transmission towers are the main cause of transmission tower failures.

[0081] This solution can perform fault detection on the insulator string in combination with the image data of the insulator string captured by the inspection equipment to obtain fault detection data, so that the insulator string with stains can be cleaned according to the fault detection data to ensure the normal operation of the insulator string.

[0082] Specifically, when performing fault detection on a transmission tower, the transmission tower can first be photographed by inspection equipment to obtain an inspection image. In actual applications, the position points and shooting postures of the inspection equipment when photographing the transmission tower can be configured in advance. Then, the insulator string on the transmission tower can be analyzed for faults based on the inspection image to determine whether the insulator string needs to be cleaned. Subsequently, a corresponding cleaning plan can be made based on the contamination condition of the insulator string.

[0083] Among them, the inspection equipment refers to the equipment for fault detection of transmission towers. The inspection equipment in this solution can be a drone equipped with multiple cleaning components. The monitoring area refers to the area where the transmission tower where fault detection is performed is located. The inspection image refers to the image of the insulator string in the transmission tower taken during the detection process. The power element refers to the insulator string composed of insulators on the transmission tower. The fault detection data refers to the data that can reflect the pollution condition of the insulator string.

[0084] Based on the above embodiment, the specific implementation of step S1 may be:

[0085] S11, extracting multiple insulator contours in the inspection image, obtaining a line start point and a line end point in the inspection image, and determining an operation direction according to the line start point and the line end point.

[0086] It can be understood that the relative position relationship between the insulator string and the transmission line in this scheme is horizontal, so the direction of the line is consistent with the hanging direction of the insulator string. Since the multiple insulators of the insulator string are arranged according to the hanging direction, when the insulator string is subsequently cleaned, the operation can be performed in a direction consistent with the hanging direction, that is, the direction from the starting point of the line to the end point of the line can be determined as the operating direction, so that the insulator string can be cleaned sequentially, thereby improving the cleaning efficiency of the inspection equipment.

[0087] Among them, the insulator contour refers to the complete contour of the insulator. The complete contours of multiple insulators can be extracted from the inspection image through contour extraction technology. For example, the contour of the insulator can be extracted through a feature-based method. The line starting point can be the point where the transmission line connects with the transmission tower in the inspection image, and the line end point can be the other end point of the transmission line in the inspection image. The operation direction refers to the cleaning operation direction of the inspection equipment.

[0088] S12, determining that a plurality of insulator contours arranged in parallel in the operating direction are the same power component group, and obtaining a power component contour corresponding to the power component according to a plurality of insulator contours in the power component group.

[0089] Specifically, since the multiple insulators of the insulator string are arranged in a hanging direction, and the hanging direction is consistent with the working direction of the inspection equipment, after the insulator contours are extracted from the inspection image, when the multiple insulator contours are arranged in parallel in the working direction, the multiple insulator contours arranged in parallel in the working direction can be regarded as the same power element group, that is, the multiple insulators arranged in parallel in the working direction can constitute an insulator string, and the contour corresponding to the insulator string can be obtained through the multiple insulator contours in the power element group, that is, the power element contour. Among them, the power element contour refers to the contour corresponding to the insulator string.

[0090] S13, obtaining the sub-average pixel values ​​of each of the insulator contours in the power component contour, and obtaining the average pixel value corresponding to each of the power component contours according to each of the sub-average pixel values.

[0091] It is understandable that after the surface of the insulator is contaminated, its color may change. For example, the insulator may appear white, while pollutants such as dust may appear gray. The color change of the insulator is reflected in the image as a difference in pixel values. Therefore, it is possible to determine whether the insulator is contaminated by analyzing the pixel values ​​of the insulator outline.

[0092] Specifically, since the outline of the insulator contains multiple pixel points in the image, the pixel values ​​corresponding to the multiple pixel points in the outline of each single insulator on the insulator string can be obtained, and the sub-average pixel value of the outline of each single insulator can be obtained by averaging the multiple pixel values. Since the insulator string contains multiple insulators, the sub-average pixel values ​​of the multiple insulator outlines can be averaged to obtain the average pixel value corresponding to the outline of the insulator string. The average pixel value can reflect the change in pixel value on the surface of the insulator string, and the degree of contamination of the insulator string can be judged by the average pixel value.

[0093] The sub-average pixel value refers to a value obtained by averaging the pixel values ​​of multiple pixel points corresponding to a single insulator contour, and the average pixel value refers to a value obtained by averaging the sub-average pixel values ​​of multiple insulator contours.

[0094] S14, determining that the power element profile whose average pixel value is not within the normal pixel value interval is an abnormal power profile, and the power element profile whose average pixel value is within the normal pixel value interval is a normal power profile, and obtaining fault detection data according to the abnormal power profile and the normal power profile.

[0095] Specifically, the average pixel value of each insulator string contour is compared with the set normal pixel value interval. If the average pixel value is not within the normal pixel value interval, the insulator string contour is considered to be an abnormal power contour and may contain stains, which requires cleaning. If the average pixel value is within the normal pixel value interval, the insulator string contour is considered to be a normal power contour and does not need to be cleaned.

[0096] The normal pixel value interval refers to the pixel value interval corresponding to the pixel points of a normal insulator string. For example, if a normal insulator string is white, then the pixel value interval corresponding to white is the normal pixel value interval.

[0097] Through the above implementation, the insulator string with stains can be quickly determined, thereby improving the efficiency of fault detection.

[0098] S2, determining a faulty component according to the fault detection data, and classifying the faulty component based on the fault maintenance scope of the inspection device to obtain a single faulty component and a combined faulty component.

[0099] In practical applications, an insulating device may correspond to one insulator string, such as a single-string insulator string, or may correspond to multiple insulator strings, such as a double-string insulator string. A double-string insulator string is an insulating device formed by two insulator strings connected in parallel. For multiple insulator strings connected in parallel, they can be cleaned simultaneously while meeting the fault maintenance scope of the inspection equipment, which can shorten the cleaning time and improve the cleaning efficiency.

[0100] Based on the above reasons, this scheme can classify the insulator strings in combination with the distance between them and the fault maintenance range of the inspection equipment, and classify multiple insulator strings arranged in parallel and belonging to the same insulating device together, so that multiple insulator strings that meet the fault maintenance range can be cleaned simultaneously in the future, thereby improving the cleaning efficiency.

[0101] Specifically, if the fault maintenance range of the inspection equipment can completely cover multiple insulator strings of the same insulating device, it can be considered that the inspection equipment can clean multiple adjacent insulator strings on the same insulating device at the same time, then the multiple insulator strings of the same insulating device can be classified as combined fault elements, and the combined fault elements can be cleaned simultaneously during cleaning. If the fault maintenance range of the inspection equipment cannot completely cover multiple insulator strings of the same insulating device, it can be considered that the inspection equipment cannot clean multiple adjacent insulator strings on the same insulating device at the same time, then each single insulator string corresponding to the insulating device can be classified as a single fault element, and multiple single fault elements can be cleaned separately during cleaning.

[0102] Among them, the faulty component refers to the insulator string that needs to be cleaned, the fault maintenance range refers to the cleaning range of the cleaning parts on the inspection equipment, including the cleaning span in the operating direction and the cleaning span in the covering direction, the single faulty component refers to a single-string insulator string, and the combined faulty component refers to multiple insulator strings corresponding to the same insulating device, and the multiple-string insulator strings meet the cleaning range of the drone, for example, it can be a double-string insulator string.

[0103] Based on the above embodiment, the specific implementation of step S2 may be:

[0104] S21, determining that the power element corresponding to the abnormal power profile is a faulty element, and acquiring a direction perpendicular to the operating direction as a covering direction.

[0105] Specifically, based on the fault detection data, the insulator string corresponding to the identified abnormal power profile can be determined as the faulty element. When cleaning the faulty element, in order for the inspection equipment to cover the entire corresponding insulator string during cleaning, the cleaning span of the drone in the direction perpendicular to the operating direction needs to be able to include the area span of the insulator string in the corresponding direction. Therefore, the direction perpendicular to the operating direction can be determined as the coverage direction, and the cleaning span of the inspection equipment in the coverage direction and the area span of the insulator string in the corresponding direction can be determined subsequently.

[0106] The covering direction refers to the direction perpendicular to the working direction.

[0107] S22, acquiring faulty components arranged adjacently in the covering direction as pending components, and determining component distances according to differences in extreme value coordinate values ​​of a plurality of contour points adjacent to the pending components in the covering direction.

[0108] Specifically, when obtaining the component distance, multiple contour points of the component to be determined can be obtained, and the contour points can be coordinate-converted. According to the coordinate values ​​corresponding to the contour points, the maximum coordinate value and the minimum coordinate value of the multiple contour points in the coverage direction can be determined. For example, when the coverage direction is consistent with the x-axis direction, the maximum coordinate value and the minimum coordinate value corresponding to the contour point in the coverage direction can be the maximum x-axis coordinate value and the minimum x-axis coordinate value. By calculating the difference between the maximum x-axis coordinate value and the minimum x-axis coordinate value, the equipment span of the component to be determined in the coverage direction can be obtained. Subsequently, it can be further determined whether the faulty component can be covered by the cleaning range of the inspection equipment according to the component distance.

[0109] It is worth noting that since multiple insulator strings corresponding to the same insulating device are generally arranged in parallel, when determining the pending element, this scheme will only determine the faulty element as the pending element when the faulty element is an insulator string arranged adjacently. For example, if the faulty element is two insulator strings corresponding to the same insulating device, and these two insulator strings are arranged in parallel in the horizontal direction, then the faulty elements corresponding to these two insulator strings can be determined as the pending element.

[0110] Among them, the undetermined components refer to the adjacent arranged insulator strings that need further analysis, and the component distance refers to the farthest span of the contours of adjacent insulator strings in the coverage direction, which can reflect the regional span of two adjacent faulty insulator strings in the coverage direction.

[0111] S23, determining the maximum coverage span of all cleaning components in the inspection device in the coverage direction according to the fault maintenance scope of the inspection device.

[0112] It can be understood that when the inspection equipment moves in the operating direction, the cleaning range of its cleaning components has a corresponding coverage span perpendicular to the operating direction. If the maximum coverage span of the cleaning components in the coverage direction can cover multiple corresponding insulator strings on the same insulating device, the insulating devices composed of multiple insulator strings can be cleaned simultaneously. If the maximum coverage span of the cleaning components in the coverage direction cannot cover multiple corresponding insulator strings on the same insulating device, the multiple insulator strings can be cleaned separately.

[0113] The maximum coverage span refers to the maximum span that the cleaning component of the inspection equipment can clean in the coverage direction. The cleaning component refers to the component used for cleaning configured on the inspection equipment, such as a cleaning nozzle. Figure 2 , is a schematic diagram of an inspection device provided by an embodiment of the present invention, such as Figure 2 As shown in , the inspection device is equipped with a plurality of cleaning nozzles arranged in a line, and during cleaning, the arrangement direction of the cleaning nozzles can be parallel to the operation direction, thereby improving the cleaning efficiency of the inspection device.

[0114] S24, determining that the faulty element whose element distance is less than the maximum coverage span is a combined faulty element, and determining that the faulty element whose element distance is greater than or equal to the maximum coverage span is a single faulty element.

[0115] Specifically, if the element distance between two adjacent elements to be determined is less than the maximum coverage span of the inspection equipment, the two adjacent elements to be determined can be regarded as combined fault elements, that is, the adjacent faulty insulator strings can be cleaned simultaneously by the inspection equipment; if the element distance between two adjacent elements to be determined is greater than or equal to the maximum coverage span of the inspection equipment, the two elements to be determined can be regarded as single fault elements respectively. Since the distance between them exceeds the one-time coverage range of the inspection equipment, the corresponding faulty insulator strings can be cleaned separately.

[0116] S3, determining single positioning data of an inspection device based on a single fault range of the single fault component, and controlling the inspection device to perform maintenance operations on the single fault component based on the single positioning data.

[0117] It can be understood that in order to determine whether the fault maintenance range of the inspection equipment can cover the area range of the insulator string that needs to be cleaned at one time, the area range of the insulator string that needs to be cleaned can be obtained. By comparing the area range with the fault maintenance range of the inspection equipment, it can be determined whether the inspection equipment performs a single cleaning or multiple cleanings, thereby improving the cleaning efficiency of the inspection equipment.

[0118] Specifically, if the single fault range is smaller than the fault maintenance range of the inspection equipment, the inspection equipment can perform a single cleaning on the single fault component; if the single fault range is larger than the fault maintenance range of the inspection equipment, the single fault component can be divided so that each small fault range after the division can be covered by the fault maintenance range of the inspection equipment. The inspection equipment can clean the single fault component multiple times, and when performing cleaning work, the inspection equipment can plan appropriate cleaning locations for the inspection equipment in combination with the single fault range.

[0119] Among them, the single fault range refers to the area where a single string of insulators needs to be cleaned. The single positioning data includes the positioning point and cleaning time when the inspection equipment is cleaning. Since different insulators have different degrees of contamination, setting different time durations can improve the cleanliness and carry out targeted cleaning of the insulators to ensure their normal operation.

[0120] In some embodiments, step S3 includes S31 to S35, which are specifically as follows:

[0121] S31, determining a single maximum distance according to the difference between the extreme coordinate values ​​of multiple contour points of the single faulty element in the working direction.

[0122] Specifically, when obtaining a single maximum distance, the maximum coordinate value and the minimum coordinate value of multiple contour points corresponding to a single faulty element in the operating direction can be obtained. For example, when the operating direction is consistent with the y-axis direction, the maximum coordinate value and the minimum coordinate value corresponding to the contour point in the covering direction can be the maximum y-axis coordinate value and the minimum y-axis coordinate value. By calculating the difference between the maximum y-axis coordinate value and the minimum y-axis coordinate value, the single maximum distance can be obtained.

[0123] Among them, the single maximum distance refers to the equipment span of the insulator string in the operating direction. The single maximum distance can be used to classify the cleaning area corresponding to a single fault component later.

[0124] S32: Determine the maximum operation span of all cleaning components in the inspection device in the operation direction according to the fault maintenance scope of the inspection device.

[0125] Among them, the maximum operating span refers to the maximum cleaning distance that all cleaning components in the inspection equipment can cover in the operating direction when performing cleaning work.

[0126] S33, based on the comparison result of the single maximum distance and the maximum operation span, determine a type of cleaning area corresponding to the single faulty component, and determine a type of cleaning point and an operation component corresponding to the type of cleaning point according to the type of cleaning area.

[0127] By comparing the single maximum distance of the insulator string and the maximum operating span of the inspection equipment, it can be determined whether the cleaning range of the cleaning component in the inspection equipment can cover the area range of a single insulator string that needs to be cleaned in one operation. If the area range of a single insulator string that needs to be cleaned can be covered at one time, then the range can be determined as a first-class cleaning area. If the area range of a single insulator string that needs to be cleaned cannot be covered at one time, then the area of ​​a single insulator string that needs to be cleaned can be evenly divided in the operating direction to obtain multiple first-class cleaning areas. After obtaining the first-class cleaning area, a suitable cleaning position point, that is, a first-class cleaning point, can be set for the inspection equipment in the first-class cleaning area. Specifically, the center point of the first-class cleaning area can be determined as the corresponding first-class cleaning point.

[0128] Since the scope of a class of cleaning areas is different, this solution can determine the number of cleaning components to be opened in combination with the scope of a class of cleaning areas, so that the cleaning scope of the inspection equipment can cover the complete class of cleaning areas.

[0129] Among them, a type of cleaning area refers to the cleaning area corresponding to a single faulty component, including the above two situations, a type of cleaning point refers to the contour center point corresponding to a type of cleaning area, and an operating part refers to a cleaning part to be cleaned.

[0130] Based on the above embodiment, the specific implementation of step S33 may be:

[0131] S331: When the single maximum distance is less than or equal to the maximum operation span, determine that the contour area corresponding to the single faulty component is the first type of cleaning area.

[0132] If the single maximum distance is less than or equal to the maximum operating span, it means that the cleaning range of the inspection equipment in the operating direction can cover all areas that need to be cleaned on the insulator string. It can be considered that the inspection equipment only needs to perform a single cleaning operation on a single faulty component. At this time, a type of cleaning area is the contour area corresponding to the entire single faulty component.

[0133] S332: When the single maximum distance is greater than the maximum operating span, the number of area divisions is obtained according to a ratio of the single maximum distance to the maximum operating span.

[0134] When the single maximum distance is greater than the maximum operating span, it can be considered that the inspection equipment cannot complete the cleaning of the entire single faulty component at one time, and the single faulty component needs to be divided into areas and then multiple cleaning operations can be performed to complete the cleaning of the single faulty component. Specifically, the single maximum distance and the maximum operating span can be ratio-calculated to obtain a ratio that reflects the relative relationship between the operation length required for cleaning the single faulty component and the single operation coverage span of the inspection equipment. The number of area divisions can be obtained by rounding up the calculated ratio. The single faulty component is divided into areas in the operating direction according to the number of area divisions, which can ensure that the range of each sub-area after division will not exceed the maximum operating span of the inspection equipment.

[0135] The number of area divisions refers to the number of area divisions for a single faulty component when the maximum operating span of the inspection equipment cannot fully cover the single maximum distance of the insulator string, so that the divided sub-areas can be fully covered by the cleaning range of the inspection equipment.

[0136] S333, obtaining a unit cleaning distance according to a ratio of the single maximum distance and the number of area divisions, and generating a plurality of division lines spaced by unit cleaning distances and perpendicular to the operation direction in the abnormal power profile corresponding to the single faulty component.

[0137] In some embodiments, when generating a dividing line, the first contour point of the abnormal power contour in the working direction can be determined first, and the first dividing line perpendicular to the working direction can be generated at a unit cleaning distance from the first contour point. At a unit cleaning distance from the first dividing line, a second dividing line perpendicular to the working direction can be generated. By analogy, multiple dividing lines perpendicular to the working direction can be generated, and the interval between two adjacent dividing lines is the unit cleaning distance. The unit cleaning distance refers to the interval distance that divides a single faulty component equally in the working direction, and the dividing line refers to a line that can divide the abnormal power contour.

[0138] S334, equally divide the abnormal power profile based on the dividing line to obtain multiple sub-power profiles, determine that the profile area corresponding to each of the sub-power profiles is a type of clean area, and obtain the profile center point of the type of clean area as the type of clean point.

[0139] It can be understood that since the arrangement direction of the cleaning nozzles on the inspection equipment is parallel to the operating direction, the cleaning nozzles can be adjusted in combination with the span of the cleaning area in the operating direction. Evenly dividing the abnormal power contour can reduce the number of adjustments to the cleaning nozzles and improve cleaning efficiency. Specifically, the abnormal power contour can be evenly divided into multiple sub-power contours through dividing lines, and the contour area corresponding to each sub-power contour is determined as a type of cleaning area. When determining a type of cleaning point, the contour center point corresponding to a type of cleaning area can be used as a type of cleaning point. Subsequently, the location point where the inspection equipment actually performs cleaning work can be determined based on the type of cleaning point.

[0140] See also Figure 3 , is a schematic diagram of a type of cleaning area provided by an embodiment of the present invention, such as Figure 3 As shown in , when the number of area divisions is 3, the abnormal power contour can be evenly divided into three sub-power contours through two dividing lines. The contour area corresponding to each sub-power contour is a class-one clean area, and three class-one clean areas can be obtained. The contour center point corresponding to the class-one clean area is taken as a class-one clean point, and three class-one clean points can be obtained. Subsequent inspection equipment can clean the three class-one clean areas in turn.

[0141] When obtaining the contour center point corresponding to a type of cleaning area, the contour point corresponding to the type of cleaning area can be coordinateized. According to the coordinate values ​​corresponding to the multiple contour points, the maximum coordinate value and the minimum coordinate value of the multiple contour points in the working direction, as well as the maximum coordinate value and the minimum coordinate value in the covering direction can be determined. By averaging the maximum coordinate value and the minimum coordinate value in the working direction, the coordinate value of the center point in the working direction can be obtained. By averaging the maximum coordinate value and the minimum coordinate value in the covering direction, the coordinate value of the center point in the covering direction can be obtained. For example, when the covering direction is consistent with the x-axis direction, the maximum coordinate value and the minimum coordinate value corresponding to the contour point in the covering direction can be the maximum x-axis coordinate value and the minimum x-axis coordinate value, then the coordinate value of the center point in the covering direction is the average value of the maximum x-axis coordinate value and the minimum x-axis coordinate value. When the working direction is consistent with the y-axis direction, the maximum coordinate value and the minimum coordinate value corresponding to the contour point in the working direction can be the maximum y-axis coordinate value and the minimum y-axis coordinate value, then the coordinate value of the center point in the working direction is the average value of the maximum y-axis coordinate value and the minimum y-axis coordinate value.

[0142] The sub-power profile refers to a power profile obtained by dividing the abnormal power profile by a dividing line.

[0143] S335 , obtaining and determining a sub-cleaning span of each cleaning component in the inspection device in the working direction, and obtaining the number of opened cleaning components in the inspection device according to a ratio of the unit cleaning distance to the sub-cleaning span.

[0144] By calculating the ratio of the unit cleaning distance to the sub-cleaning span, the number of cleaning components that need to be opened simultaneously in the working direction of the inspection equipment can be obtained. The number of cleaning components to be opened can be obtained by rounding up the obtained ratio. By rounding up, it can be ensured that the unit cleaning distance can be fully covered by the cleaning range of the cleaning components. Among them, the sub-cleaning span refers to the span of the coverage range of a single cleaning component when performing cleaning work in the working direction.

[0145] S336, starting from the middle position, selecting corresponding cleaning components from both sides as working components for the plurality of cleaning components arranged in a line in the inspection device, and stopping the selection of the working components when the number of the working components is equal to the opening number.

[0146] It is understandable that, since the multiple cleaning components on the inspection device are arranged in a line, when selecting the cleaning components to be turned on, in order to ensure that the selected working components can be evenly distributed in the working direction, thereby improving the uniformity and efficiency of cleaning, it is possible to select a corresponding number of cleaning components from the middle position of the multiple cleaning components to both sides in sequence as working components until the number of selected working components is equal to the number of turned on components, such as Figure 2 As shown in , when there are 5 cleaning parts arranged in a line on the inspection device, the 5 cleaning parts are arranged in order from left to right as 1-5. If the number of open cleaning parts is 3, then starting from the 3rd, the 2nd and 4th cleaning parts can be selected as the working parts on both sides in turn. This can ensure that the inspection equipment can fully cover the entire area that needs to be cleaned during the cleaning operation.

[0147] Through the above implementation, it can be ensured that cleaning resources are reasonably allocated and utilized, and at the same time it can be ensured that the inspection equipment can fully cover the entire area that needs to be cleaned during the cleaning operation, thereby improving the comprehensiveness and efficiency of cleaning.

[0148] S34, obtaining a contamination coefficient of the single faulty component at the first type of cleaning point, and determining a cleaning time of the operating component at the first type of cleaning point according to the contamination coefficient.

[0149] In practical applications, different cleaning times can be set for operating parts according to the degree of contamination. Specifically, the degree of contamination of the faulty component can be judged by the contamination coefficient. The higher the contamination coefficient, the more serious the contamination. Therefore, the cleaning time required can be correspondingly longer, thereby ensuring the cleaning effect.

[0150] Among them, the contamination coefficient refers to the coefficient used to evaluate the degree of contamination on the surface of the insulator string, and the cleaning time refers to the time it takes for the working parts to perform cleaning work at a type of cleaning point.

[0151] In some embodiments, the cleaning time of a type of cleaning point can be obtained in the following manner:

[0152] S341, determining that a pixel point in each of the clean areas of the type whose pixel value is not within a normal pixel value interval is a single dirty pixel point.

[0153] It is understandable that the larger the polluted area, the higher the degree of pollution may be, and the pixel points that are not in the normal pixel value interval may be the pixel points corresponding to the pollutants. Therefore, by obtaining multiple pixel points in a type of clean area, the multiple pixel values ​​corresponding to the type of clean area can be compared with the normal pixel value interval, and the pixel points whose pixel values ​​are not in the normal pixel value interval can be determined as single dirty pixel points. The polluted area can be determined according to the number of single dirty pixel points, and then the degree of pollution can be judged. Among them, single dirty pixel points refer to pixel points whose pixel values ​​are not in the normal pixel value interval, for example, they can be pixels corresponding to pollutants.

[0154] S342: Obtain a single abnormality ratio of the one type of clean area according to the ratio of the number of the single dirty pixel point to the total number of all pixel points in the one type of clean area.

[0155] It is understandable that the more single dirty pixels there are, the larger the polluted area is. Therefore, the single anomaly ratio can be used to represent the degree of pollution in a clean area. The larger the single anomaly ratio is, the more serious the pollution is.

[0156] S343, obtaining a single offset difference between the single abnormal ratio and the reference contamination ratio, obtaining a contamination coefficient of the first type of clean area according to the ratio of the single offset difference to the reference offset difference, and obtaining a type of duration coefficient based on the difference between the contamination coefficient and the standard contamination coefficient.

[0157] Among them, the benchmark pollution ratio refers to the preset standard pollution area ratio, which can be the pollution area ratio under normal circumstances. The single offset difference refers to the difference between the single abnormal ratio and the benchmark pollution ratio, which reflects the deviation between the pollution level of the current type of cleaning area and the benchmark pollution level. The larger the single offset difference, the greater the pollution level may be, so the pollution coefficient will also be correspondingly larger. The benchmark offset difference refers to the preset offset difference under normal circumstances. The standard pollution coefficient is the preset standard pollution coefficient, which can be the standard pollution level under normal circumstances. The standard pollution coefficient can be set corresponding to the benchmark pollution ratio. A type of time coefficient is calculated based on the difference between the pollution coefficient and the standard pollution coefficient. The larger the difference, the higher the pollution level may be, which means that it will take longer to clean the area, so the type of time coefficient will also be correspondingly larger.

[0158] S344, obtaining a type of duration offset value according to the product of the type of duration coefficient and the standard duration, and obtaining the cleaning duration of the operating component corresponding to the type of cleaning area at the corresponding type of cleaning point based on the sum of the standard duration and the type of duration offset value.

[0159] Among them, the standard duration is a preset cleaning duration, and a type of duration offset value is obtained by multiplying a type of duration coefficient by the standard duration, which can represent the additional cleaning time required when the degree of contamination in a type of cleaning area is higher than the standard degree of contamination. A type of duration offset value is an adjustment value for the standard duration to ensure that appropriate cleaning time can be allocated to the inspection equipment according to the actual situation of the cleaning area. By adding the standard duration to a type of duration offset value, the cleaning time corresponding to a type of cleaning area can be obtained, and subsequent inspection equipment can perform cleaning work in combination with the cleaning time.

[0160] Through the above implementation, the efficiency and accuracy of the cleaning operation can be improved.

[0161] S35, obtaining single positioning data according to the cleaning time of the operating component at the type of cleaning point, and controlling the inspection device to perform maintenance operations on the single faulty component based on the single positioning data.

[0162] Specifically, after obtaining the cleaning time of the working parts at each Class-A cleaning point, combined with the positioning data of each Class-A cleaning point, the single positioning data of the inspection equipment during the cleaning process can be obtained. The inspection equipment can move to the actual position corresponding to each Class-A cleaning point according to the single positioning data, and perform cleaning work on the single faulty component combined with the corresponding cleaning time.

[0163] In some embodiments, the step S35 of “controlling the inspection device to perform a maintenance operation on the single faulty component based on the single positioning data” includes the following steps:

[0164] S351, arranging the cleaning points of the first category according to the operation direction to obtain a cleaning sequence, and obtaining the first cleaning point of the first category in the cleaning sequence as a target point.

[0165] It can be understood that since there may be multiple Class A cleaning points, in order to facilitate the inspection equipment to perform cleaning work in the operating direction, multiple Class A cleaning points can be arranged in the operating direction to obtain a cleaning sequence of Class A cleaning points. When the inspection equipment is performing cleaning work, the first Class A cleaning point in the cleaning sequence can be determined as the target point, as the starting point for the inspection equipment to perform cleaning work.

[0166] S352, acquiring the image center point of the inspection image, and determining the direction from the image center point to the target point as the moving direction.

[0167] It is understandable that when the inspection device takes the inspection image, the insulator string captured is located at the center of the shooting picture. Since the inspection device must also be located at the center of the cleaning area when performing cleaning work, when the center point of the image and the target point have been determined, the direction from the center point of the image to the target point can be obtained. This direction is the moving direction of the inspection device, through which the inspection device can move from the shooting position to the center of the cleaning area to perform cleaning work. Among them, the moving direction refers to the direction from the center point of the image to the target point, which can be used to indicate the direction in which the inspection device moves during cleaning.

[0168] S353: Convert the virtual distance between the image center point and the target point to obtain a first actual distance.

[0169] It can be understood that when the inspection device is shooting the inspection image, due to different shooting heights, the proportion of the insulator string in the image is also different. The higher the shooting height, the smaller the proportion of the insulator string in the image, so the virtual distance between the center point of the image and the target point will be correspondingly smaller. After the virtual distance between the center point of the image and the target point is obtained through the inspection image, since the inspection device needs to move according to the actual distance when moving during the cleaning process, the conversion ratio between the virtual distance and the actual distance can be obtained. In this solution, the shooting height of the inspection device is determined, so the conversion ratio can also be determined. Therefore, according to the conversion ratio, the first actual distance can be obtained. For example, the conversion ratio between the virtual distance and the first actual distance is 1:10. When the virtual distance is 5cm, the first actual distance can be obtained as 50cm. Converting the virtual distance to the first actual distance in the actual environment can facilitate the inspection device to accurately move to a position near the target point in the actual environment. Among them, the virtual distance refers to the distance between the center point of the image and the target point in the inspection image, and the first actual distance refers to the actual distance after the virtual distance is converted.

[0170] S354: Acquire a position point in the moving direction that is a first actual distance away from the current position point of the inspection device as the actual operation point.

[0171] Specifically, in the moving direction, a position point that is separated from the current position point of the inspection equipment by a first actual distance can be determined as the actual operation point, which is the specific position point where the inspection equipment starts the cleaning operation, wherein the current position point refers to the current position point of the inspection equipment, and the actual operation point refers to the actual position point where the inspection equipment performs cleaning work.

[0172] S355, controlling the inspection device to go to the actual operation point to perform a cleaning operation based on the cleaning time corresponding to the target point.

[0173] Specifically, after determining the actual working point, the cleaning time at the target point corresponding to the actual working point can be obtained, and the inspection equipment can go to the actual working point to perform cleaning operations based on the cleaning time.

[0174] S356: Perform actual conversion on the unit cleaning distance to obtain a second actual distance, and determine actual operation points corresponding to the remaining cleaning points of the first type in the cleaning sequence based on the second actual distance.

[0175] It can be understood that since the unit cleaning distance is a virtual distance in the image, the inspection equipment needs to convert the unit cleaning distance into an actual distance, i.e., the second actual distance, when moving. After obtaining the first actual working point, along the working direction, the point at the second actual distance from the first actual working point is the second actual working point, and the point at the second actual distance from the second actual working point is the third actual working point, and so on. The actual working points corresponding to all the first-class cleaning points in the cleaning sequence can be obtained.

[0176] S357, controlling the inspection device to perform a cleaning operation on the single faulty component based on each of the actual operation points.

[0177] Specifically, after obtaining each actual working point, the inspection device can move between each actual working point in the working direction to achieve the cleaning operation of a single faulty component.

[0178] Through the above implementation, a single faulty component can be cleaned in combination with single positioning data.

[0179] S4, determining combined positioning data of an inspection device according to the combined fault range of the combined fault component, and controlling the inspection device to perform maintenance operations on the combined fault component based on the combined positioning data.

[0180] Among them, the combined fault range refers to the area where the double-string insulator string needs to be cleaned, and the combined positioning data refers to the positioning data of the position point where the inspection equipment hovers when cleaning the double-string insulator string and the cleaning time data at each position point.

[0181] Based on the above embodiment, the specific implementation of step S4 may be:

[0182] S41, generating an operation path corresponding to the combined fault element based on the operation direction, and determining a combined maximum distance according to a difference in extreme coordinate values ​​of a plurality of contour points of the combined fault element in the operation direction.

[0183] It is understandable that when the combined fault element is a double-string insulator string, since the double-string insulator strings are separated by a certain distance, when cleaning the double-string insulator string, in order to make the cleaning range of the inspection equipment completely cover the double-string insulator string, an operation path in the operation direction can be planned for the inspection equipment, and the inspection equipment can clean the double-string insulator string according to the operation path. Among them, the combined maximum distance refers to the equipment span of the double-string insulator string in the operation direction.

[0184] In some embodiments, the step S41 of "generating the operation path corresponding to the combined fault component based on the operation direction" includes the following steps:

[0185] S411, obtaining the outer contour of each of the combined faulty components, and numbering a plurality of contour points in the outer contour from small to large according to an operation direction to obtain an operation number of each of the contour points.

[0186] It can be understood that after obtaining the external contour of the combined fault component, in order to facilitate the planning of the operation path, multiple contour points corresponding to the external contour can be obtained. In the operation direction, multiple contour points are numbered from small to large, and the operation number of each contour point can be obtained. The operation path can be planned subsequently according to the operation number.

[0187] S412, determining that the contour points with the same operation number are the same operation group, and sequentially connecting the multiple contour points in each operation group according to the covering direction to obtain the operation line corresponding to each operation group.

[0188] In practical applications, when multiple contour points are arranged in parallel in a direction perpendicular to the working direction, the working numbers of the multiple contour points can be the same. The contour points with the same working numbers are determined as the same working group. The contour points in each working group can be connected in sequence according to the covering direction to form multiple working lines, where the working line refers to the line segment obtained by connecting the contour points with the same working number.

[0189] S413, obtaining the midpoint of each of the operation lines as an operation point, and generating an operation path corresponding to the combined fault component according to each of the operation points.

[0190] It can be understood that in order to enable the inspection equipment to be located in the middle of the two insulator strings during operation, the midpoint of each operation line can be obtained as the operation point, and each operation point can be connected in sequence to obtain the operation path corresponding to the combined fault element, so that the cleaning range of the inspection equipment during operation can evenly cover the insulator strings on both sides.

[0191] S42, determining the maximum operation span of all cleaning components in the inspection device in the operation direction according to the fault maintenance scope of the inspection device.

[0192] Similarly, when cleaning a combined fault component, obtaining the maximum operating span of the inspection equipment in the operating direction is also to determine whether the fault maintenance range of the cleaning components in the inspection equipment can cover the area that needs to be cleaned for the double-string insulator string in one operation.

[0193] S43: Based on the comparison result of the combined maximum distance and the maximum operation span, determine the second type of cleaning points on the operation path and the operation parts of the inspection device corresponding to the second type of cleaning points.

[0194] By comparing the combined maximum distance of the double-string insulator strings and the maximum operating span of the inspection equipment, it can be determined whether the cleaning components in the inspection equipment can completely cover the cleaning area range of the double-string insulator strings in one operation. If the cleaning area range of the double-string insulator strings can be completely covered at one time, the midpoint of the operating path corresponding to the double-string insulator strings can be determined as a Class II cleaning point. If the cleaning area range of the double-string insulator strings cannot be completely covered at one time, multiple Class II cleaning points can be determined on the path, and the insulator strings can be fully cleaned through multiple Class II cleaning points.

[0195] The second type of cleaning point refers to the contour center point corresponding to the second type of cleaning area.

[0196] Based on the above embodiment, the specific implementation of step S43 may be:

[0197] S431: When the combined maximum distance is less than or equal to the maximum operation span, determine the center point of the operation path as the second type cleaning point.

[0198] If the combined maximum distance is less than or equal to the maximum operating span, it can be considered that the inspection equipment can complete the cleaning of the entire combined faulty component at one time. In order to make the inspection equipment located at the center of the Class II cleaning area during cleaning and improve the cleaning effect of the inspection equipment, the center point of the operating path can be used as the Class II cleaning point.

[0199] S432: When the combined maximum distance is greater than the maximum operating span, the number of path divisions is obtained according to a ratio of the combined maximum distance to the maximum operating span.

[0200] When the combined maximum distance is greater than the maximum operating span, it can be considered that the inspection equipment cannot complete the cleaning of the entire combined faulty component at one time, and the operating path of the combined faulty component needs to be divided and then multiple cleaning operations are performed to complete the cleaning of the combined faulty component. Specifically, the ratio of the combined maximum distance and the maximum operating span can be calculated to obtain a ratio that reflects the relative relationship between the length of the combined faulty component that needs to be cleaned and the maximum operating span of a single operation of the inspection equipment. The value obtained by rounding up the ratio is the number of path divisions, which can ensure that the length of each sub-path after division will not exceed the maximum operating span of a single operation of the inspection equipment.

[0201] The number of path divisions refers to the number of path divisions performed on the operating path when the maximum operating span of the inspection equipment cannot completely cover the combined maximum distance of the double-string insulator strings.

[0202] S433: Obtain a unit division distance according to a ratio of the path length of the operation path to the number of path divisions.

[0203] The path length refers to the total length of the operation path, and the unit division distance refers to the distance between each small segment of the operation path after the operation path is divided.

[0204] S434, taking the operation point in the operation line corresponding to the contour point with the smallest operation number as the division point, and sequentially determining a plurality of points with an interval distance equal to the unit division distance as the division points.

[0205] Specifically, when obtaining the division points, the work point in the work line corresponding to the contour point with the smallest work number can be used as the first division point, and a division point can be determined every unit division distance along the work direction. For example, the point at the unit division distance from the first division point is the second division point, and the point at the unit division distance from the second division point is the third division point. And so on. Multiple division points can be determined, and the work path can be divided through the work lines corresponding to the division points.

[0206] S435, determining that the point corresponding to the middle position of each adjacent dividing point in the operation path is a second-class cleaning point, dividing the abnormal power contours corresponding to all combined fault components according to the operation lines corresponding to each dividing point, and obtaining the second-class cleaning area corresponding to each of the second-class cleaning points.

[0207] In order to make the inspection equipment clean more comprehensively during cleaning, the point corresponding to the middle position of adjacent divided points in the operation path can be determined as a second-class cleaning point. Among them, the second-class cleaning area refers to the overall area corresponding to the adjacent insulator strings after the operation path is divided, including the contour area of ​​the adjacent insulator strings corresponding to the combined fault element and the non-contour area between the adjacent insulator strings.

[0208] S436, obtaining the sub-cleaning span of each cleaning component in the inspection device in the working direction, and obtaining the number of opened cleaning components in the inspection device according to the ratio of the unit division distance and the sub-cleaning span.

[0209] By calculating the ratio of the unit division distance and the sub-cleaning span and rounding up the obtained ratio, the number of cleaning parts that need to be opened simultaneously in the working direction of the inspection equipment can be obtained. By rounding up, it can be ensured that the cleaning range of the inspection equipment can cover the corresponding equipment area during each cleaning.

[0210] S437, starting from the middle position, selecting corresponding cleaning components as working components from both sides of the plurality of cleaning components arranged in a line in the inspection device, and stopping the selection of the working components when the number of the working components is equal to the opening number.

[0211] Specifically, you can choose to select a corresponding number of cleaning components from the middle position of multiple cleaning components to both sides as working components until the number of selected working components is equal to the number of cleaning components that are opened. This can reduce the number of times the cleaning components are adjusted, improve cleaning efficiency, and at the same time make the inspection equipment clean more comprehensively during cleaning work.

[0212] S44, obtaining a contamination coefficient of the combined fault component at the second type of cleaning point, and determining a cleaning time of the operating component at the second type of cleaning point according to the contamination coefficient.

[0213] In actual applications, when obtaining the cleaning time of a combined faulty component, different cleaning times can also be set for the operating parts according to the different degrees of contamination. Specifically, the degree of contamination of the faulty component can be judged by the contamination coefficient. The higher the contamination coefficient, the more serious the contamination. A longer cleaning time may be required to ensure that the contaminants are completely removed. Therefore, the cleaning time is correspondingly longer, thereby ensuring the cleaning effect.

[0214] In some embodiments, the cleaning time of the second type of cleaning point can be obtained in the following way:

[0215] S441, acquiring contour areas corresponding to the abnormal power contours in the two types of cleaning areas as target areas.

[0216] It is understandable that due to the certain spacing distance between the double-string insulator strings, there may be blank areas in the second-class cleaning area. However, when planning the cleaning time, this scheme plans the contour area corresponding to the insulator string. Therefore, when obtaining the cleaning time corresponding to the second-class cleaning point, it is necessary to obtain the area corresponding to the insulator string. Specifically, the contour area corresponding to each abnormal power contour in the second-class cleaning area can be used as the target area, and the degree of pollution in the target area can be analyzed, so as to obtain a more accurate cleaning time.

[0217] S442: Determine the pixel points in the target area whose pixel values ​​are not within the normal pixel value interval as combined dirty pixel points.

[0218] It is understandable that since the larger the pollution area, the higher the pollution degree may be, the pixel points that are not in the normal pixel value interval may correspond to the pixel points corresponding to the pollutants, so by obtaining multiple pixel points in the second type of clean area, the multiple pixel values ​​corresponding to the second type of clean area can be compared with the normal pixel value interval, and the pixel points whose pixel values ​​are not in the normal pixel value interval can be determined as combined dirty pixel points. The pollution area can be determined according to the number of combined dirty pixel points, and then the pollution degree can be judged. Among them, the combined dirty pixel point refers to the pixel point whose pixel value is not in the normal pixel value interval, for example, it can be the pixel point corresponding to the pollutant.

[0219] S443, obtaining a combined abnormality ratio of the two types of clean areas according to the ratio of the number of the combined dirty pixels to the total number of all pixels in the target area.

[0220] It can be understood that the greater the number of combined dirty pixels, the larger the pollution area. Therefore, the combined anomaly ratio can be used to represent the pollution degree of the second-class clean area. The larger the combined anomaly ratio, the more serious the pollution degree of the second-class clean area.

[0221] S444, obtaining a combined offset difference between the combined abnormality ratio and the reference contamination ratio, obtaining a contamination coefficient of the second type of cleaning area according to a ratio of the combined offset difference and the reference offset difference, and obtaining a second type of duration coefficient based on a difference between the contamination coefficient and the standard contamination coefficient.

[0222] Among them, the combined offset difference refers to the difference between the combined abnormality ratio and the benchmark pollution ratio, which reflects the deviation between the current pollution level of the second-class cleaning area and the benchmark pollution level. The larger the combined offset difference, the greater the pollution level may be, so the pollution coefficient will also be correspondingly larger. The second-class time coefficient is calculated based on the difference between the pollution coefficient and the standard pollution coefficient. The larger the difference, the higher the pollution level may be, which means that it will take longer to clean the area, so the second-class time coefficient will also be correspondingly larger.

[0223] S445, obtaining a second-category duration offset value according to the product of the second-category duration coefficient and the standard duration, and obtaining the cleaning duration of the operating component corresponding to the second-category cleaning area at the corresponding second-category cleaning point based on the sum of the standard duration and the second-category duration offset value.

[0224] Among them, the Class II time offset value is obtained by multiplying the Class II time coefficient by the standard time, which can represent the additional cleaning time required when the degree of contamination in the Class II cleaning area is higher than the standard degree of contamination. The Class II time offset value is an adjustment value for the standard time to ensure that appropriate cleaning time can be allocated to the inspection equipment according to the actual situation of the cleaning area. By adding the standard time and the Class II time offset value, the cleaning time of the operating parts at the corresponding Class II cleaning points can be obtained.

[0225] Through the above implementation, the cleaning time can be adjusted according to the degree of dirtiness of the target area, thereby improving the cleaning degree of the target area by the inspection equipment.

[0226] S45, obtaining combined positioning data according to the cleaning time of the operating component at the second type of cleaning point, and controlling the inspection device to perform maintenance operations on the combined faulty component based on the combined positioning data.

[0227] Specifically, after obtaining the cleaning time of the working parts at each Class II cleaning point, combined with the positioning data of each Class II cleaning point, the combined positioning data of the inspection equipment during the cleaning process can be obtained. The inspection equipment can move to the position of each Class II cleaning point according to the combined positioning data, and clean the combined faulty components according to the corresponding cleaning time. When controlling the inspection equipment to perform maintenance operations on the combined faulty components, it is similar to the single faulty components and will not be elaborated here.

[0228] See also Figure 4 , is a schematic diagram of the structure of a transmission tower fault locating device provided by an embodiment of the present invention, the transmission tower fault locating device comprising:

[0229] An acquisition module is used to acquire inspection images taken by inspection equipment on corresponding transmission towers in the monitoring area, and to perform fault analysis on power components corresponding to the transmission towers according to the inspection images to obtain fault detection data;

[0230] A determination module, configured to determine a faulty component according to the fault detection data, and classify the faulty component based on the fault maintenance scope of the inspection equipment to obtain a single faulty component and a combined faulty component;

[0231] A control module, configured to determine single positioning data of an inspection device based on a single fault range of the single fault component, and control the inspection device to perform maintenance operations on the single fault component based on the single positioning data;

[0232] The maintenance module is used to determine the combined positioning data of the inspection equipment according to the combined fault range of the combined fault element, and control the inspection equipment to perform maintenance operations on the combined fault element based on the combined positioning data.

[0233] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or replace some or all of the technical features therein with equivalents. However, these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present invention.

Claims

1. A method for locating a transmission tower fault, characterized in that: include: Obtaining inspection images taken by inspection equipment of corresponding transmission towers in the monitoring area, and performing fault analysis on power components corresponding to the transmission towers according to the inspection images to obtain fault detection data; Determine the fault component according to the fault detection data, classify the fault component based on the fault maintenance scope of the inspection equipment, and obtain a single fault component and a combined fault component; Determine single positioning data of the inspection device based on the single fault range of the single fault component, and control the inspection device to perform maintenance operations on the single fault component based on the single positioning data; Determine the combined positioning data of the inspection equipment according to the combined fault range of the combined fault element, and control the inspection equipment to perform maintenance operations on the combined fault element based on the combined positioning data; Obtaining inspection images taken by inspection equipment of corresponding transmission towers in the monitoring area, and performing fault analysis on power components corresponding to the transmission towers according to the inspection images to obtain fault detection data, including: Extracting multiple insulator contours in the inspection image, obtaining a line start point and a line end point in the inspection image, and determining an operation direction according to the line start point and the line end point; Determine that multiple insulator profiles arranged in parallel in the operating direction are the same power component group, and obtain a power component profile corresponding to the power component according to the multiple insulator profiles in the power component group; Obtaining a sub-average pixel value of each of the insulator contours in the power component contour, and obtaining an average pixel value corresponding to each of the power component contours according to each of the sub-average pixel values; Determine that the power element profile whose average pixel value is not within the normal pixel value interval is an abnormal power profile, and the power element profile whose average pixel value is within the normal pixel value interval is a normal power profile, and obtain fault detection data according to the abnormal power profile and the normal power profile.

2. The method according to claim 1, characterized in that Determining a faulty component according to the fault detection data, classifying the faulty component based on the fault maintenance scope of the inspection equipment, and obtaining a single faulty component and a combined faulty component, including: Determine that the power element corresponding to the abnormal power profile is a faulty element, and obtain a direction perpendicular to the operation direction as a covering direction; Acquire the faulty components arranged adjacently in the covering direction as pending components, and determine the component distance according to the difference of the extreme value coordinate values ​​of a plurality of contour points adjacent to the pending components in the covering direction; Determine the maximum coverage span of all cleaning components in the inspection device in the coverage direction according to the fault maintenance scope of the inspection device; The faulty element whose element distance is less than the maximum coverage span is determined to be a combined faulty element, and the faulty element whose element distance is greater than or equal to the maximum coverage span is determined to be a single faulty element.

3. The method according to claim 2, characterized in that Determining single positioning data of an inspection device based on a single fault range of the single fault component, and controlling the inspection device to perform a maintenance operation on the single fault component based on the single positioning data, including: Determine a single maximum distance according to the difference of the extreme coordinate values ​​of a plurality of contour points of the single faulty element in the working direction; Determine the maximum operating span of all cleaning components in the inspection equipment in the operating direction according to the fault maintenance scope of the inspection equipment; Based on the comparison result of the single maximum distance and the maximum operation span, determine a type of cleaning area corresponding to the single faulty component, and determine a type of cleaning point and an operation component corresponding to the type of cleaning point according to the type of cleaning area; Obtaining a contamination coefficient of the single faulty component at the first type of cleaning point, and determining a cleaning time of the operating component at the first type of cleaning point according to the contamination coefficient; A single positioning data is obtained according to the cleaning time of the working component at the type of cleaning point, and the inspection device is controlled to perform a maintenance operation on the single faulty component based on the single positioning data.

4. The method according to claim 3, characterized in that Based on the comparison result of the single maximum distance and the maximum operation span, determining a type of cleaning area corresponding to the single faulty component, and determining a type of cleaning point and an operation component corresponding to the type of cleaning point according to the type of cleaning area, including: When the single maximum distance is less than or equal to the maximum operating span, determining the contour area corresponding to the single faulty element as the first type of cleaning area; When the single maximum distance is greater than the maximum operating span, the number of area divisions is obtained according to a ratio of the single maximum distance to the maximum operating span; A unit cleaning distance is obtained according to a ratio of the single maximum distance to the number of area divisions, and a plurality of division lines which are spaced apart by the unit cleaning distance and are perpendicular to the operation direction are generated in the abnormal power profile corresponding to the single faulty element; The abnormal power profile is evenly divided based on the dividing line to obtain a plurality of sub-power profiles, a profile area corresponding to each of the sub-power profiles is determined to be a type of clean area, and a profile center point of the type of clean area is obtained as the type of clean point; Obtain and determine the sub-cleaning span of each cleaning component in the inspection device in the working direction, and obtain the number of openings of the cleaning components in the inspection device according to the ratio of the unit cleaning distance to the sub-cleaning span; Starting from the middle position, corresponding cleaning components are selected from both sides of the plurality of cleaning components arranged in a line in the inspection device as working components, and the selection of the working components is stopped when the number of the working components is equal to the opening number.

5. The method according to claim 3, characterized in that: Obtaining the contamination coefficient of the single faulty component at the first type of cleaning point, and determining the cleaning time of the operating component at the first type of cleaning point according to the contamination coefficient, including: Determine a pixel point in each of the clean areas whose pixel value is not within the normal pixel value interval as a single dirty pixel point; Obtaining a single abnormality ratio of the clean area of ​​the type according to the ratio of the number of the single dirty pixel point to the total number of all pixel points in the clean area of ​​the type; Obtaining a single offset difference between the single abnormal ratio and the reference contamination ratio, obtaining a contamination coefficient of the first type of clean area according to a ratio of the single offset difference to the reference offset difference, and obtaining a type of duration coefficient based on a difference between the contamination coefficient and a standard contamination coefficient; A type of duration offset value is obtained according to the product of the type of duration coefficient and the standard duration, and the cleaning duration of the operating component corresponding to the type of cleaning area at the corresponding type of cleaning point is obtained based on the sum of the standard duration and the type of duration offset value.

6. The method according to claim 2, characterized in that Determining combined positioning data of an inspection device according to a combined fault range of the combined fault element, and controlling the inspection device to perform a maintenance operation on the combined fault element based on the combined positioning data, including: Generate an operation path corresponding to the combined fault element based on the operation direction, and determine a combined maximum distance according to the difference of extreme coordinate values ​​of multiple contour points of the combined fault element in the operation direction; Determine the maximum operating span of all cleaning components in the inspection equipment in the operating direction according to the fault maintenance scope of the inspection equipment; Based on the comparison result of the combined maximum distance and the maximum operation span, determining the second type of cleaning points on the operation path and the operation parts of the inspection equipment corresponding to the second type of cleaning points; Obtaining a contamination coefficient of the combined fault component at the second type of cleaning point, and determining a cleaning time of the operating component at the second type of cleaning point according to the contamination coefficient; Combined positioning data is obtained according to the cleaning time of the operating component at the second type of cleaning point, and the inspection device is controlled to perform maintenance operations on the combined fault component based on the combined positioning data.

7. The method according to claim 6, characterized in that Generating an operation path corresponding to the combined fault component based on the operation direction includes: Acquire the outer contour of each of the combined fault components, and number a plurality of contour points in the outer contour from small to large according to the operation direction to obtain the operation number of each of the contour points; Determine that the contour points with the same operation number are the same operation group, and sequentially connect the multiple contour points in each operation group according to the covering direction to obtain the operation line corresponding to each operation group; The midpoint of each of the operation lines is obtained as an operation point, and an operation path corresponding to the combined fault component is generated according to each of the operation points.

8. The method according to claim 7, characterized in that Based on the comparison result of the combined maximum distance and the maximum operation span, determining the second type of cleaning points on the operation path and the operation parts of the inspection device corresponding to the second type of cleaning points includes: When the combined maximum distance is less than or equal to the maximum operation span, determining the center point of the operation path as the second type of cleaning point; When the combined maximum distance is greater than the maximum operating span, the number of path divisions is obtained according to a ratio of the combined maximum distance to the maximum operating span; Obtaining a unit division distance according to a ratio of a path length of the operation path and a number of path divisions; Taking the operation point in the operation line corresponding to the contour point with the smallest operation number as the division point, and sequentially determining a plurality of points with intervals equal to the unit division distance as the division points; Determine the point corresponding to the middle position of each adjacent dividing point in the operation path as a second-class cleaning point, divide the abnormal power contours corresponding to all combined fault components according to the operation lines corresponding to each dividing point, and obtain the second-class cleaning area corresponding to each second-class cleaning point; Obtaining a sub-cleaning span of each cleaning component in the inspection device in the working direction, and obtaining the number of opened cleaning components in the inspection device according to a ratio of the unit division distance to the sub-cleaning span; Starting from the middle position, corresponding cleaning components are selected from both sides of the plurality of cleaning components arranged in a line in the inspection device as working components, and the selection of the working components is stopped when the number of the working components is equal to the opening number.

9. The method according to claim 8, characterized in that Obtaining the contamination coefficient of the combined fault component at the second type of cleaning point, and determining the cleaning time of the operating component at the second type of cleaning point according to the contamination coefficient, including: Acquire the contour area corresponding to each of the abnormal power contours in each of the two types of clean areas as the target area; Determine the pixel points in the target area whose pixel values ​​are not within the normal pixel value interval as combined dirty pixel points; Obtaining a combined abnormality ratio of the two types of clean areas according to a ratio of the number of the combined dirty pixels to the total number of all pixels in the target area; Obtaining a combined offset difference between the combined abnormality ratio and the reference contamination ratio, obtaining a contamination coefficient of the second type of cleaning area according to a ratio of the combined offset difference to the reference offset difference, and obtaining a second type of duration coefficient based on a difference between the contamination coefficient and the standard contamination coefficient; The second-category duration offset value is obtained according to the product of the second-category duration coefficient and the standard duration, and the cleaning duration of the operating component corresponding to the second-category cleaning area at the corresponding second-category cleaning point is obtained based on the sum of the standard duration and the second-category duration offset value.

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