A steady-state transient parallel test spectrometer and test method

Abstract

The present invention relates to a steady-state transient parallel test spectrometer and test method, belonging to the technical field of spectrum test equipment, the method comprising: setting an optical fiber from a microscopic fluorescence imaging optical path to connect to a first optical path introduction slit or a second optical path introduction slit; setting a high repetition rate pulse laser excitation frequency; controlling an electric XY displacement stage to scan a selected sample test area point by point; acquiring transient data by a reflected light acquisition unit and saving it to a cache; acquiring spectrum data by a transmitted light acquisition unit and saving it to a cache at the same time; repeating the above steps until all points in the sample test area are scanned; and obtaining a transient fluorescence lifetime decay curve or steady-state spectrum information. The present invention solves the problem that the existing spectrometer cannot perform transient and steady-state tests on the same test point at the same time, improves test efficiency, saves half of the test time, minimizes the possibility of sample denaturation, eliminates the difference in the luminescence process during the test, and realizes in-situ testing.

Description

Technical Field

[0001] The present invention belongs to the technical field of spectrum testing equipment, and in particular, the present invention relates to a steady-state transient parallel testing spectrometer and a testing method. Background Art

[0002] Due to the reasons of optical and mechanical structure design, the existing spectrometer can only test the optical information of different properties one by one, and cannot perform transient and steady-state tests on the same test point at the same time. When the sample is scanned on the surface, the scanning process depends on the number of sampling points and the sampling time of each point. For example, for a micro-area of ​​100μmX100μm, the resolution is set to 2μm, and the sampling time of each point is 1 second, then the scanning time is 50×50×1=2500 seconds, about 40 minutes. If the two tests of FLIM (Fluorescence-Lifetime Imaging Microscopy) and PL-Mapping (Photo-Luminescence Mapping) are completed, it will take 80 minutes. If the resolution is doubled to 1μm, the test time will reach 20,000 seconds, and the test process will exceed five and a half hours.

[0003] For some unstable samples, the above test time requires that they be excited once and then again to complete two different tests. During the long test process, the sample may denature. More importantly, for stable samples, the luminescence process of the two different scanning processes may also be different, making it impossible to achieve in-situ testing. Summary of the invention

[0004] To solve the above problems, the present invention proposes a steady-state transient parallel testing spectrometer and testing method, which solves the problem that the existing spectrometer cannot perform transient and steady-state tests on the same test point at the same time, improves the test efficiency, minimizes the possibility of sample denaturation, eliminates the difference in the luminescence process during the test, and realizes in-situ testing.

[0005] A first aspect of the present invention provides a steady-state transient parallel testing spectrometer, comprising:

[0006] Collection component 10 and microscopic fluorescence imaging optical path 15;

[0007] The collection component 10 is connected to the microscopic fluorescence imaging optical path 15 via an optical fiber 17;

[0008] The acquisition component 10 includes:

[0009] The first optical path is introduced into the slit 1, and the optical fiber 17 enters the slit from the side to guide the signal light into the collection component 10;

[0010] The second optical path is introduced into the slit 9, and the optical fiber 17 directly enters the slit to guide the signal light into the collection component 10;

[0011] The total reflective mirror 2 is selected to reflect the incident light from the first optical path into the slit 1 to the collimator 4; when the incident light from the second optical path into the slit 9, the total reflective mirror 2 is automatically recovered to make way for the incident light to be directed to the collimator 4;

[0012] A collimator 4, used for collimating the incident light and filling the grating;

[0013] The three-grating tower 3 is provided with three gratings, and one of the gratings is used to disperse the light from the collimator 4 to the focusing lens 5 according to different usage requirements;

[0014] The focusing mirror 5 focuses the light dispersed by the grating and projects it onto the semi-transparent and semi-reflective mirror 6;

[0015] A semi-transparent and semi-reflective mirror 6 is used to split the incident light into two and output them to the slit of the reflected light collection unit 7 and the focal plane of the transmitted light collection unit 8 at the same time;

[0016] A reflected light collection unit 7, used to collect incident light to obtain transient data and save it to a cache, and obtain a transient fluorescence lifetime decay curve based on the transient data;

[0017] The transmitted light collection unit 8 is used to collect incident light to obtain spectral data and save it to a cache, and form steady-state spectral information based on the spectral data;

[0018] The microscopic fluorescence imaging optical path 15 comprises:

[0019] A high repetition rate pulse laser 11 is used to generate laser light to excite the sample so that it produces a characteristic fluorescence spectrum;

[0020] The dichroic mirror 12 focuses the short-wavelength light from the high-repetition-rate pulse laser 11 onto the sample surface via the objective lens 13, and sends the characteristic luminescence spectrum of the sample to the total reflection mirror 14;

[0021] Objective lens 13, used to focus the excitation light and collect the characteristic luminescence spectrum of the sample;

[0022] The total reflection mirror 14 is used to reflect the incident light to the fiber lens focusing module 19 , and then guide the incident light to the collection component 10 through the optical fiber 17 .

[0023] Furthermore, the electric XY translation stage 16 is disposed below the objective lens 13, and is used to change the position of the sample in the X-axis and Y-axis directions, and to achieve point-by-point optical scanning through the objective lens 13 to obtain the characteristic luminescence spectrum of the sample;

[0024] The collection component 10 is movably connected to the microscopic fluorescence imaging optical path 15 via an optical fiber 17;

[0025] When the optical fiber 17 is connected to the first light path introduction slit 1, the total reflection mirror 14 reflects the incident light to the lens focusing module 19, and then the optical fiber 17 guides the incident light to the first light path introduction slit 1;

[0026] When the optical fiber 17 is connected to the second optical path introduction slit 9 , the total reflection mirror 14 reflects the incident light to the lens focusing module 19 , and then the incident light is introduced into the second optical path introduction slit 9 by the optical fiber 17 .

[0027] Furthermore, the high repetition rate pulse laser 11 can set the pulse frequency of the laser based on the fluorescence decay period of the tested sample.

[0028] Furthermore, the semi-transparent and semi-reflective mirror 6 has a transmission-reflection ratio of 1:1; and the dichroic mirror 12 reflects low wavelengths and transmits high wavelengths.

[0029] Furthermore, the reflected light collection unit 7 comprises:

[0030] The wavelength selector 71 is used to select the signal light of the test band after wavelength correction and send it to the convex lens group 72;

[0031] Convex lens group 72, used for focusing the incident light and projecting it onto PMT-TCSPC73;

[0032] PMT-TCSPC73 is used to collect incident light to obtain transient data and save it to a cache, and obtain a transient fluorescence lifetime decay curve based on the transient data.

[0033] Furthermore, the wavelength selector 71 is composed of a transverse fixed slit 711 and a longitudinal movable slit 712 placed in the focal plane. The longitudinal movable slit 712 is wavelength-calibrated and can be controlled to move in the direction of the spectral distribution of the incident light to achieve the selection of a specific test wavelength, and then focused to the PMT-TCSPC73 through the convex lens group 72.

[0034] Furthermore, the PMT-TCSPC73 is a data acquisition module composed of a photomultiplier tube and a time-correlated single photon counter.

[0035] A second aspect of the present invention provides a method for testing a steady-state transient parallel test spectrometer. Based on the steady-state transient parallel test spectrometer described in the first aspect, the method comprises:

[0036] S1, based on the sample testing requirements, set the optical fiber 17 from the microscopic fluorescence imaging optical path 15 to connect to the first optical path introduction slit 1 or the second optical path introduction slit 9;

[0037] S2, setting the excitation frequency of the high repetition rate pulse laser 11;

[0038] S3, controlling the electric XY translation stage 16 to scan the selected sample test area point by point;

[0039] S4, the reflected light collection unit 7 acquires transient data and saves it to a cache;

[0040] S5, simultaneously, the transmitted light collection unit 8 acquires the spectral data and saves it to the cache;

[0041] S6, repeating steps S3 to S5 until scanning of all points in the sample test area is completed;

[0042] S7, forming a transient fluorescence lifetime decay curve based on the transient data; forming steady-state spectrum information based on the spectrum data, and ending the test.

[0043] According to a third aspect of the present invention, there is provided an electronic device, comprising:

[0044] at least one processor; and a memory in communication with the at least one processor; wherein,

[0045] The memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor can execute a test method for a steady-state transient parallel test spectrometer described in the second aspect of the present invention.

[0046] A fourth aspect of the present invention provides a computer-readable storage medium having a computer program stored thereon, which can be loaded and executed by a processor according to the test method for a steady-state transient parallel test spectrometer described in the second aspect of the present invention.

[0047] The advantages of the present invention compared to the prior art are:

[0048] The present invention solves the problem that the existing spectrometer cannot perform transient and steady-state tests on the same test point at the same time, improves test efficiency, saves 50% of test time, minimizes the possibility of sample denaturation, eliminates the difference in the luminescence process during the test, and realizes in-situ testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0049] Figure 1 It is a structural schematic diagram of a vertical test state of a steady-state transient parallel test spectrometer provided by an embodiment of the present invention.

[0050] Figure 2 It is a schematic diagram of the structure of a reflected light collection unit provided in an embodiment of the present invention.

[0051] Figure 3 It is a schematic diagram of the structure of a wavelength selector provided in an embodiment of the present invention.

[0052] Figure 4 The present invention provides a flow chart of a method for testing a steady-state and transient parallel testing spectrometer.

[0053] Figure 5 It is a structural block diagram of an electronic device according to an embodiment of the present invention.

[0054] Figure markings: 1-first light path introduction slit; 2-selected total reflection mirror; 3-three-grating turret; 4-collimating mirror; 5-focusing mirror; 6-semi-transparent and semi-reflective mirror; 7-reflected light collection unit; 8-transmitted light collection unit; 9-second light path introduction slit; 10-collection component; 11-high repetition rate pulse laser; 12-dichroic mirror; 13-objective lens; 14-total reflection mirror; 15-microscope fluorescence imaging light path; 16-electric XY translation stage; 17-optical fiber; 18-sample; 19-lens focusing module; 71-wavelength selector; 72-convex lens group; 73-PMT-TCSPC; 74-incident light; 711-lateral fixed slit; 712-longitudinal movable slit. DETAILED DESCRIPTION

[0055] The following will be combined with the drawings in the embodiments of the present application to clearly describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, rather than all the embodiments. All other embodiments obtained by ordinary technicians in this field based on the embodiments in the present application belong to the scope of protection of this application.

[0056] The terms "first", "second", etc. in the specification and claims of the present application are used to distinguish similar objects, and are not used to describe a specific order or sequence. It should be understood that the data used in this way can be interchangeable under appropriate circumstances, so that the embodiments of the present application can be implemented in an order other than those illustrated or described here, and the objects distinguished by "first", "second", etc. are generally of one type, and the number of objects is not limited. For example, the first object can be one or more. In addition, "and / or" in the specification and claims represents at least one of the connected objects, and the character " / " generally indicates that the objects associated with each other are in an "or" relationship.

[0057] Device Embodiment

[0058] The present invention mainly solves the problem that the existing spectrometer cannot perform transient and steady-state tests on the same test point at the same time, improves the test efficiency, minimizes the possibility of sample denaturation, eliminates the difference in the luminescence process during the test, and realizes in-situ testing.

[0059] A steady-state transient parallel test spectrometer, the structural schematic diagram of which is shown in Figure 1 As shown, specifically including:

[0060] Collection component 10, microscopic fluorescence imaging optical path 15 and electric XY translation stage 16.

[0061] The collection component 10 is connected to the microscopic fluorescence imaging optical path 15 via an optical fiber 17 .

[0062] 1. The acquisition component 10 specifically includes:

[0063] The first optical path is introduced into the slit 1 , and the optical fiber 17 introduces the signal light into the collection component 10 from the side of the slit.

[0064] The second optical path is introduced into the slit 9 , and the optical fiber 17 directly enters the slit to introduce the signal light into the collection component 10 .

[0065] The first light path is introduced into the slit 1, which is a side-entry slit, and the second light path is introduced into the slit 9, which is a straight-entry slit.

[0066] The total reflective mirror 2 is selected to reflect the incident light from the first optical path into the slit 1 to the collimating mirror 4; when the incident light from the second optical path into the slit 9, the optical path is automatically recovered to make way for the incident light to be directly incident on the collimating mirror 4.

[0067] The collimating lens 4 is used to collimate the incident light and fill the grating.

[0068] The three-grating tower 3 is provided with three gratings, and one of the gratings is used to disperse the light from the collimating lens 4 to the focusing lens 5 according to different usage requirements.

[0069] The focusing mirror 5 focuses the light dispersed by the grating and projects it onto the semi-transparent and semi-reflective mirror 6.

[0070] The semi-transparent and semi-reflective mirror 6 is used to split the incident light into two and output them to the slit of the reflected light collection unit 7 and the focal plane of the transmitted light collection unit 8 at the same time, so as to obtain different sample surface optical characteristic data in the two light collection units at the same time.

[0071] The reflected light collection unit 7 is used to collect incident light to obtain transient data and save it to a cache, and obtain a transient fluorescence lifetime decay curve based on the transient data.

[0072] Specifically, the reflected light collection unit 7 includes:

[0073] The wavelength selector 71 is used to select the signal light of the test band after wavelength correction and send it to the convex lens group 72;

[0074] Convex lens group 72, used for focusing the incident light and projecting it onto PMT-TCSPC73;

[0075] PMT-TCSPC73 is used to collect incident light to obtain transient data and save it to a cache, and obtain a transient fluorescence lifetime decay curve based on the transient data.

[0076] Preferably, the wavelength selector 71 is composed of a transverse fixed slit 711 and a longitudinal movable slit 712 placed on the focal plane. The longitudinal movable slit 712 is wavelength-calibrated and can be controlled to move in the direction of the spectral distribution of the incident light 74 to select a specific test wavelength, and then focus to the PMT-TCSPC73 through the convex lens group 72. Figure 3 shown.

[0077] Preferably, if Figure 2 As shown, the reflected light collection unit 7 focuses the incident light 74 through the internal wavelength selector 71 and the convex lens group 72 and projects it onto the PMT-TCSPC73. The PMT-TCSPC73 is a data acquisition module composed of a photomultiplier tube and a time-correlated single photon counter, and is used to obtain the transient fluorescence lifetime decay curve of the same test point at the same time, thereby realizing transient testing of the sample 18.

[0078] The transmitted light collection unit 8 is used to collect incident light to obtain spectral data and save it to a cache, and form steady-state spectral information based on the spectral data.

[0079] Specifically, the transmitted light collection unit 8 acquires spectral data on the focal plane through an internal area array CCD spectral camera, acquires steady-state spectral information, and implements steady-state spectral testing of the sample 18 .

[0080] 2. Microscopic fluorescence imaging optical path 15, specifically including:

[0081] The high repetition rate pulse laser 11 is used to generate laser light to excite the sample so that it produces a characteristic fluorescence spectrum.

[0082] The high repetition rate pulse laser 11 can set the pulse frequency of the laser based on the fluorescence decay period of the sample being tested, and can also be regarded as a quasi-continuous output laser, which can obtain two different surface optical characteristic spectra of the same sample 18, and these two different surface optical characteristic spectra can describe the luminescence mechanism of the sample 18 by different methods. The frequency of the high repetition rate pulse laser 11 is generally above 100KHz.

[0083] The dichroic mirror 12 focuses the short-wavelength light from the high-repetition-rate pulse laser 11 onto the sample surface via the objective lens 13 , and sends the characteristic luminescence spectrum of the sample to the total reflection mirror 14 .

[0084] Preferably, the semi-transparent and semi-reflective mirror 6 has a transmission-reflection ratio of 1:1; the dichroic mirror 12 reflects low wavelengths and transmits high wavelengths.

[0085] The objective lens 13 is used to focus the excitation light and collect the characteristic luminescence spectrum of the sample.

[0086] Specifically, the electric XY stage 16 is disposed below the objective lens 13. When the electric XY stage 16 changes the position of the sample in the X-axis and Y-axis directions, the characteristic luminescence spectrum of the sample can be obtained by optical scanning point by point through the objective lens 13. The scanning process depends on the number of sampling points and the sampling time of each point.

[0087] The total reflection mirror 14 is used to reflect the incident light to the lens focusing module 19 , and then guide the incident light to the collection component 10 through the optical fiber 17 .

[0088] Furthermore, the collection assembly 10 is movably connected to the microscopic fluorescence imaging optical path 15 via an optical fiber 17;

[0089] When the optical fiber 17 is connected to the first optical path introduction slit 1, the total reflection mirror 14 reflects the incident light to the lens focusing module 19, and then the optical fiber 17 introduces it into the first optical path introduction slit 1; when the optical fiber 17 is connected to the second optical path introduction slit 9, the total reflection mirror 14 reflects the incident light to the lens focusing module 19, and then the optical fiber 17 introduces it into the second optical path introduction slit 9.

[0090] 3. The electric XY translation stage 16 is arranged below the objective lens 13 and is used to change the position of the sample in the X-axis and Y-axis directions, and to achieve point-by-point optical scanning through the objective lens 13 to obtain the characteristic luminescence spectrum of the sample.

[0091] Method Embodiment

[0092] The second aspect of the present invention provides a testing method based on steady-state and transient parallel testing of a spectrometer. Multi-threaded programming is used in the data acquisition software to simultaneously acquire steady-state and transient test data. The flowchart of the testing method is as follows: Figure 4 shown.

[0093] A testing method based on steady-state transient parallel testing of a spectrometer, comprising:

[0094] S1, based on the sample testing requirements, set the optical fiber 17 from the microscopic fluorescence imaging optical path 15 to connect to the first optical path introduction slit 1 or the second optical path introduction slit 9.

[0095] When the optical fiber 17 is connected from the microscopic fluorescence imaging optical path 15 to the first optical path introduction slit 1, the strobed total reflection mirror 2 reflects the incident light to the collimating mirror 4; when the optical fiber 17 is connected from the microscopic fluorescence imaging optical path 15 to the second optical path introduction slit 9, the strobed total reflection mirror 2 automatically retracts to clear the optical path, allowing the incident light to directly hit the collimating mirror 4.

[0096] S2, setting the excitation frequency of the high repetition rate pulse laser 11.

[0097] S3, controlling the electric XY translation stage 16 to scan the selected sample test area point by point.

[0098] S4, the reflected light collection unit 7 acquires transient data and saves it into a cache.

[0099] S5, at the same time, the transmitted light collection unit 8 acquires the spectrum data and saves it into the cache.

[0100] S6, repeat steps S3 to S5 until all points in the sample test area are scanned.

[0101] S7, forming a transient fluorescence lifetime decay curve based on the transient data; forming steady-state spectrum information based on the spectrum data, and ending the test.

[0102] The sample testing requirements refer to that some samples are suitable for testing in the test state of the first light path leading into the slit 1, and some samples are suitable for testing in the test state of the second light path leading into the slit 9. The connection interface of the optical fiber 17 between the acquisition component 10 and the microscopic fluorescence imaging optical path 15 can be changed according to the actual test requirements. Such a structure enhances the compatibility of samples.

[0103] Electronic device embodiment

[0104] According to a third aspect of the present invention, there is provided an electronic device, comprising:

[0105] at least one processor; and a memory in communication with the at least one processor; wherein,

[0106] The memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor can execute a test method for a steady-state transient parallel test spectrometer described in the second aspect of the present invention.

[0107] Figure 5 Schematic diagram of the structure of an electronic device according to an embodiment of the present invention. Figure 5 As shown, the electronic device may include one or more ( Figure 5 Only one is shown in the figure) processor 102 (processor 102 may include but is not limited to a microprocessor (Microprocessor Unit, referred to as MPU) or a programmable logic device (Programmable logic device, referred to as PLD)) and a memory 104 for storing data. In an exemplary embodiment, the electronic device may also include a transmission device 106 and an input / output device 108 for communication functions. It can be understood by those skilled in the art that Figure 5 The structure shown is for illustration only and does not limit the structure of the above terminal device. Figure 5 More or fewer components as shown, or with Figure 5 Equivalent functions or comparisons shown Figure 5 A different configuration with more features is shown.

[0108] The memory 104 can be used to store computer programs, for example, software programs and modules of application software, such as computer programs corresponding to the methods in the embodiments of the present invention. The processor 102 executes various functional applications and data processing by running the computer programs stored in the memory 104, that is, to implement the above-mentioned methods. The memory 104 may include a high-speed random access memory, and may also include a non-volatile memory, such as one or more magnetic storage devices, flash memory, or other non-volatile solid-state memory. In some examples, the memory 104 may further include a memory remotely arranged relative to the processor 102, and these remote memories may be connected to the terminal device via a network. Examples of the above-mentioned network include, but are not limited to, the Internet, an intranet, a local area network, a mobile communication network, and combinations thereof.

[0109] The transmission device 106 is used to receive or send data via a network. The specific example of the above network may include a wireless network provided by a communication provider of the switching device. In one example, the transmission device 106 includes a network adapter (Network Interface Controller, referred to as NIC), which can be connected to other network devices through a base station so as to communicate with the Internet. In one example, the transmission device 106 can be a radio frequency (RF) module, which is used to communicate with the Internet wirelessly.

[0110] Computer Readable Storage Medium Embodiments

[0111] A fourth aspect of the present invention provides a computer-readable storage medium having a computer program stored thereon, wherein the computer program can be loaded and executed by a processor to implement the method for testing a steady-state and transient parallel testing spectrometer as described in the second aspect.

[0112] The embodiments of the present application are described above in conjunction with the accompanying drawings, but the present application is not limited to the above-mentioned specific implementation methods. The above-mentioned specific implementation methods are merely illustrative and not restrictive. Under the guidance of the present application, ordinary technicians in this field can also make many forms without departing from the purpose of the present application and the scope of protection of the claims, all of which are within the protection of the present application.

Claims

1. A steady-state transient parallel test spectrometer, characterized in that: include: A collection component (10) and a microscopic fluorescence imaging optical path (15); The collection component (10) comprises: The first light path is introduced into the slit (1), and the optical fiber (17) enters the slit from the side to introduce the signal light into the collection component (10); The second optical path is introduced into the slit (9), and the optical fiber (17) directly enters the slit to guide the signal light into the collection component (10); The fully reflective mirror (2) is selected to reflect incident light from the first light path into the slit (1) to the collimator (4); when incident light from the second light path into the slit (9), the light path is automatically recovered to make way for the incident light to be directed to the collimator (4); A collimator (4), used for collimating the incident light and filling the grating; A three-grating tower (3) is provided with three gratings, and one of the gratings is used to disperse light from a collimating lens (4) to a focusing lens (5) according to different usage requirements; A focusing mirror (5) focuses the light dispersed by the grating and projects it onto a semi-transparent and semi-reflective mirror (6); A semi-transparent and semi-reflective mirror (6) is used to split the incident light into two and output them simultaneously to the slit of the reflected light collection unit (7) and the focal plane of the transmitted light collection unit (8); A reflected light collection unit (7) is used to collect incident light to obtain transient data and save it to a cache, and obtain a transient fluorescence lifetime decay curve based on the transient data; A transmitted light collection unit (8) is used to collect incident light to obtain spectral data and store it in a cache, and to form steady-state spectral information based on the spectral data; The microscopic fluorescence imaging optical path (15) comprises: A high repetition rate pulse laser (11), used to generate laser light to excite the sample so that it produces a characteristic fluorescence spectrum; A dichroic mirror (12) focuses the short-wavelength light from the high-repetition-rate pulse laser (11) onto the sample surface via an objective lens (13), and sends the characteristic luminescence spectrum of the sample to a total reflection mirror (14); An objective lens (13) is used to focus the excitation light and collect the characteristic luminescence spectrum of the sample; A total reflective mirror (14) is used to reflect incident light to the optical fiber lens focusing module (19), and then guide the incident light to the collection component (10) through the optical fiber (17); The reflected light collection unit (7) comprises: A wavelength selector (71) is used to select the signal light of the test wavelength band and send it to the convex lens group (72) after wavelength correction; A convex lens group (72) is used to focus the incident light and project it onto the PMT-TCSPC (73); PMT-TCSPC (73), used for collecting incident light to obtain transient data and save it to a cache, and obtaining a transient fluorescence lifetime decay curve based on the transient data; The wavelength selector (71) is composed of a transverse fixed slit (711) and a longitudinal movable slit (712) placed on a focal plane. The longitudinal movable slit (712) can be controlled to move in the direction of the incident light spectrum distribution after wavelength correction to achieve the gating of a specific test wavelength, and then focus to the PMT-TCSPC (73) through a convex lens group (72); The PMT-TCSPC (73) is a data acquisition module composed of a photomultiplier tube and a time-correlated single photon counter.

2. A steady-state transient parallel test spectrometer according to claim 1, characterized in that: Also includes: An electric XY translation stage (16) is arranged below the objective lens (13) and is used to change the position of the sample in the X-axis and Y-axis directions, and to achieve point-by-point optical scanning through the objective lens (13) to obtain a characteristic luminescence spectrum of the sample; The collection component (10) is movably connected to the microscopic fluorescence imaging optical path (15) via an optical fiber (17); When the optical fiber (17) is connected to the first light path introduction slit (1), the total reflection mirror (14) reflects the incident light to the lens focusing module (19), and then the optical fiber (17) guides the incident light to the first light path introduction slit (1); When the optical fiber (17) is connected to the second light path introduction slit (9), the total reflection mirror (14) reflects the incident light to the lens focusing module (19), and then the incident light is introduced into the second light path introduction slit (9) by the optical fiber (17).

3. The steady-state transient parallel test spectrometer according to claim 1, characterized in that: A high repetition rate pulse laser (11) can set the pulse frequency of the laser based on the fluorescence decay period of the sample being tested.

4. The steady-state transient parallel testing spectrometer according to claim 1, characterized in that: The semi-transparent and semi-reflective mirror (6) has a transmission-reflection ratio of 1:1; the dichroic mirror (12) reflects low wavelengths and transmits high wavelengths.

5. A method for testing a steady-state and transient parallel testing spectrometer, characterized in that: Based on a steady-state transient parallel test spectrometer according to any one of claims 2 to 4, the test method comprises: S1, based on the sample testing requirements, setting an optical fiber (17) from the microscopic fluorescence imaging optical path (15) to connect to the first optical path introduction slit (1) or the second optical path introduction slit (9); S2, setting the excitation frequency of the high repetition rate pulse laser (11); S3, controlling the electric XY translation stage (16) to scan the selected sample test area point by point; S4, the reflected light collection unit (7) acquires transient data and saves it to a cache; S5, simultaneously, the transmitted light collection unit (8) acquires spectral data and saves it into a cache; S6, repeating steps S3 to S5 until scanning of all points in the sample test area is completed; S7, forming a transient fluorescence lifetime decay curve based on the transient data; forming steady-state spectrum information based on the spectrum data, and ending the test.

6. An electronic device, characterized in that: include: at least one processor; and a memory communicatively connected to the at least one processor; wherein, The memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor can execute the test method for a steady-state transient parallel test spectrometer as described in claim 5.

7. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program thereon, and the computer program can be loaded and executed by a processor. The method for testing a steady-state and transient parallel testing spectrometer as claimed in claim 5.

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