Chip capacitor high-precision flexible automatic test system and test method

Abstract

The invention discloses a chip capacitor high-precision flexible automatic test system and test method, and the system comprises a test platform which is used for connecting a flexible test tool, and the flexible test tool is connected with a test interface; the test platform is respectively connected with the automatic platform and the test instrument; the automatic platform is used for realizing automatic loading and unloading of the chip capacitors; the automatic test system is used for realizing measurement and control of each functional module; in the sensing platform, a high-angle shooting camera is used for identifying and positioning a chip capacitor; the test instrument is used for carrying out parameter test on the capacitor; the technical problems that in the prior art, a testing system is poor in adaptability to chip capacitors of different models and sizes, the testing precision is limited, the automation degree is not high, and effective quality control means are lacked are solved.

Description

Technical Field

[0001] The invention belongs to the technical field of automatic testing of electronic components, and in particular relates to a high-precision flexible automatic testing system and a testing method for chip capacitors. Background Art

[0002] As one of the most widely used electronic components, the size of chip capacitors is showing a trend of miniaturization. Accurate testing of their performance is crucial to ensuring the reliability and stability of the entire equipment system. Full coverage of secondary screening of chip capacitors has become a general requirement.

[0003] In the existing secondary screening process of chip capacitors, most of them are manual screening methods, which have high labor input costs and employee fatigue testing, resulting in quality problems in test data. It is urgent to research automated testing methods to replace the existing manual testing methods.

[0004] In a similar patent, CN115616334A discloses a large-volume automatic testing device and method for patch capacitors, which includes a stage, a capacitor loading plate, an automatic feeding component, a capacitor testing component, and a capacitor measuring module. The method places the capacitor on the capacitor loading plate through the automatic feeding component, and then measures it through the capacitor testing component to achieve large-volume testing of patch capacitors. This patent is only applicable to specific types of patch capacitors, has poor compatibility, and the precision and accuracy of the test results also need to be further improved.

[0005] After checking and analyzing, it was found that the currently disclosed patents have many problems, such as the poor adaptability of the test system to chip capacitors of different models and sizes, limited test accuracy, low degree of automation, and lack of effective quality control measures. Summary of the invention

[0006] The technical problem to be solved by the present invention is to provide a high-precision flexible automated testing system and testing method for chip capacitors, so as to solve the problems of poor adaptability of the testing system to chip capacitors of different models and sizes, limited testing accuracy, low degree of automation and lack of effective quality control measures.

[0007] The technical solution of the present invention is: A high-precision flexible automatic testing system for chip capacitors, the system comprising: Test platform: used to connect the flexible test fixture, which is connected to the test interface; the test platform is connected to the automation platform and the test instrument respectively; Automation platform: used to realize automatic loading and unloading of chip capacitors; Automatic test system: used to realize the measurement and control of each functional module; In the perception platform: the overhead camera is used to identify and locate chip capacitors; Test instrument: used to perform parameter tests on capacitors.

[0008] The flexible test fixture includes a test board, a PCB circuit board, a test interface, a test cover, a positioning pin and a test station; the test board is used to carry the test station and connect the test station with the PCB circuit board, the PCB circuit board is used to lead out the electrodes of the test station and connect with the test interface, the test interface is used to connect the test line of the test instrument, the test cover is used to ensure that the chip capacitor maintains stable contact with the electrode of the test station, the positioning pin is used to connect the test board and the PCB circuit board to ensure that the circuit on the test station and the PCB board is accurately connected, and the test station is used to carry the chip capacitor of the test object.

[0009] The number of the test stations is more than one; each test station is designed to have different specifications according to the capacitance specifications; and an independent circuit is designed to be led out to the test interface.

[0010] The test station includes a test spring, a fixing pin, a test contact, a fixing clamp and a height limit block; each pole on the test station adopts two test spring structures, that is, one test station has a total of four test springs, the fixing pin for fixing the test spring passes through the fixing clamp, the height limit block and the test spring, each pole of the test station has two fixing pins, the test contact is connected to the corresponding circuit on the PCB circuit board, and the height limit block is used to limit the descending height of the chip capacitor when the test cover is pressed down.

[0011] The test interface is switched using a channel switching test circuit based on PLC control.

[0012] The high-precision and flexible automated testing system is based on the automated control framework developed on the QT platform. According to the tasks issued by the intelligent management platform, it automatically performs process division, equipment call and parameter setting, visual analysis and logical control between devices. The automated control framework includes a business layer, an Internet of Things layer and a support layer. The business layer deploys an intelligent management platform for task issuance, system scheduling, data analysis and equipment management. The Internet of Things layer deploys a high-precision and flexible automated testing system for task acquisition, equipment control, data upload and data analysis. The support layer provides basic support for communication and automation, including hardware equipment, equipment networking, equipment integration, network protocols and data exchange.

[0013] The hardware equipment includes an industrial computer, a manipulator, a manipulator controller, a camera, a vibration plate and a touch screen. The industrial computer is used to deploy a high-precision flexible automatic testing system, the manipulator is used to perform automatic grasping of chip capacitors, the manipulator controller is used to deploy the manipulator program, the camera is used to identify, locate and correct the position of chip capacitors, the vibration plate is used to turn over the chip capacitors, and the touch screen is used for human-computer interaction with the PLC program.

[0014] A test method for a high-precision flexible automatic test system for chip capacitors, the method comprising: Step 1: Connect the test lines of the flexible test fixture, PLC and test instrument; connect the communication lines of the manipulator controller, industrial computer, PLC, camera and test instrument and configure the communication address; connect the control lines of the manipulator controller, solenoid valve, light source controller and vibration plate; Step 2: Deploy software, including the deployment of intelligent management platform, high-precision flexible automatic testing system, manipulator control program, PLC control program and touch screen program; Step 3: Formulate the test task, issue the task on the intelligent management platform, and then directly start the test process after receiving the task on the high-precision flexible automatic test system; or directly set the test parameters on the high-precision flexible automatic test system and then start the test process; Step 4: The automated control framework controls the execution of the entire test process in an orderly manner according to the preset process and logic. By working in collaboration with the manipulator, PLC, and flexible test fixture, it realizes adaptive adaptation of chip capacitors of different models and sizes. During the test, the PLC controls channel switching. Step 5. During the test, the high-precision flexible automatic test system will continuously collect various data generated during the test, including the capacitance value, loss tangent value, and leakage current value parameters of the chip capacitor, and transmit these data to the intelligent management platform in real time; Step 6: The intelligent management platform processes and analyzes the test data in real time and issues warning signals if abnormal data or potential problems are found.

[0015] Beneficial effects of the present invention: The present invention includes the following important aspects: First, it has a unique test system, which can support the automatic flexible test of various models and sizes of chip capacitors through flexible test fixtures and image recognition, breaking through the limitation that other similar patents can only test several models and sizes of components in a specific range, and also reducing cumbersome manual adjustments, realizing highly automated flexible switching, and greatly improving the test efficiency and accuracy. Second, in terms of high-precision testing, the automated control framework based on the QT development platform, combined with the PLC control channel switching technology, lays a more stable and reliable foundation for the test process, realizes fine control and accurate data acquisition during the test process, significantly improves the test accuracy, and surpasses most other patents. Third, in terms of system quality controllability, it has software functions for task issuance, data upload, and data analysis, builds a complete quality control system, can arrange test tasks in a timely and effective manner, ensure accurate data transmission and aggregation, and discover potential problems and optimization directions through in-depth analysis, comprehensively improving the quality stability and reliability of the system, which is an outstanding advantage lacking in other similar patents.

[0016] The advantages of the present invention are: The automated control framework based on the QT development platform makes the test system stable and reliable. The framework makes full use of the powerful functions of QT to build highly accurate control logic. Through the detailed division of the test process and intelligent scheduling, the automated operation of the test process is realized. The graphical interface design of QT makes the operation intuitive and convenient, while improving the stability and maintainability of the system.

[0017] Design a flexible test fixture to solve the flexible testing of various chip capacitors. The fixture adopts a unique design and can flexibly adapt to chip capacitors of various models and sizes. Its test station can be adaptively designed and adjusted according to the specifications of the chip capacitors, and closely cooperates with the automated control framework to achieve fast and accurate test switching, greatly improving test efficiency.

[0018] The high-precision test of chip capacitors is solved based on PLC control channel switching technology. Through precise PLC control, the accuracy and timeliness of channel switching are guaranteed. This technology effectively avoids test errors caused by channel switching problems, ensures the realization of high-precision testing, and plays a key role in the reliability of test results.

[0019] The intelligent management platform and high-precision flexible automatic test system are designed to make the quality of automatic testing controllable. The two systems work together to support functions such as task issuance, data upload, and data analysis. The platform has a complete task issuance mechanism and can flexibly allocate test tasks according to needs. The data upload function ensures the real-time return of test data, and the powerful data analysis function can deeply mine and analyze a large amount of data, discover problems in time and issue early warnings, thereby achieving effective control of system quality.

[0020] The invention solves the technical problems that the existing test system has poor adaptability to chip capacitors of different models and sizes, limited test accuracy, low degree of automation and lack of effective quality control measures. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] Figure 1 It is a schematic diagram of the composition of the high-precision flexible automatic testing system of the present invention; Figure 2 This is the overall architecture diagram of the present invention; Figure 3 This is a schematic diagram of the overall structure of the flexible test fixture of the present invention; Figure 4 This is a schematic diagram of the structure of the flexible test fixture of the present invention; Figure 5 It is a schematic diagram of the test station structure of the flexible test fixture of the present invention; Figure 6 This is a schematic diagram of the channel switching connection of the present invention.

[0022] Markings in the figure: 1. test board, 2. PCB circuit board, 3. test interface, 4. test cover, 5. positioning pin, 6. test station, 7. test object, 61. test spring, 62. fixing pin, 63. test contact, 64. fixing clamp, 65. height limit block. DETAILED DESCRIPTION

[0023] The present invention will be further explained with reference to the accompanying drawings.

[0024] like Figure 2 As shown, the present invention designs an architecture of high-precision flexible automatic testing and quality control. The architecture is divided into a business layer, an Internet of Things layer and a support layer. The business layer deploys an intelligent management platform for task issuance, system scheduling, data analysis and equipment control. The Internet of Things layer deploys a high-precision flexible automatic testing system for task acquisition, equipment control, data upload and data analysis. The support layer provides basic support for communication and automation, including hardware equipment, equipment networking, equipment integration, network protocols and data exchange.

[0025] The intelligent management platform is a system built based on Web technology and presented in the form of a web page. Functions such as task issuance and management, data analysis and display, and equipment supervision and control are all completed through the intelligent management platform.

[0026] The high-precision and flexible automatic testing system is an automation control framework developed based on the QT platform. It can automatically perform process division, equipment call and parameter setting, visual analysis, and precise logical control between devices according to the tasks issued by the intelligent management platform.

[0027] The hardware equipment of the high-precision flexible automatic testing system includes industrial computers, manipulators, manipulator controllers, cameras, vibration plates, touch screens, etc. The industrial computers are used to deploy the high-precision flexible automatic testing system, the manipulators are used to perform automatic grasping of chip capacitors, the manipulator controllers are used to deploy manipulator programs, the cameras are used to identify, locate and correct the chip capacitors, the vibration plates are used to flip the chip capacitors, and the touch screens are used for human-computer interaction with the PLC programs.

[0028] The high-precision flexible automatic test system consists of functions such as Figure 2As shown, it includes five functional modules, namely, test platform, automation platform, automatic test system, test instrument and perception platform. The test platform is used to connect the flexible test fixture, the flexible test fixture is connected to the test interface, the automation platform is used to realize automatic loading and unloading of chip capacitors, the automatic test system is used for core measurement and control, the test instrument is a specific electrical parameter testing equipment, and the test instruments of different automation systems are different. In the perception platform, the overhead camera is used to identify and locate the chip capacitor so that the robot can automatically grab the chip capacitor, and the bottom camera is used to correct the position of the chip capacitor so that the robot can accurately grab the device to the corresponding test station of the flexible test fixture.

[0029] The overall structure of the flexible test fixture is as follows: Figure 3 , Figure 4 As shown, it includes a test board 1, a PCB circuit board 2, a test interface 3, a test cover 4, a positioning pin 5, and a test station 6. Figure 4 7 in the figure is the chip capacitor under test.

[0030] In this embodiment, the test board 1 is used to carry the test station 6 and connect the test station 6 with the PCB circuit board 2. The PCB circuit board 2 is used to lead out the electrodes of the test station and connect the test interface 3. The test interface 3 is used to connect the test line of the test instrument. The test cover 4 is used to ensure that the chip capacitor maintains stable contact with the electrode of the test station. The positioning pin 5 is used to connect the test board 1 and the PCB circuit board 2 to ensure that the test station 6 and the circuit on the PCB board are accurately connected. The test station 6 is used to carry the chip capacitor of the test object.

[0031] Multiple test stations can be designed on the test board 1 according to actual needs, and the order of the test stations and the positive and negative poles are marked. In this embodiment, 6 test stations are designed. On the PCB circuit board, independent circuits are designed according to the number of test stations and led out to the test interface.

[0032] In this embodiment, the details of the test station 6 are as follows: Figure 5 As shown, it specifically includes a test spring 61 , a fixing pin 62 , a test contact 63 , a fixing clamp 64 and a height limiting block 65 .

[0033] Each pole on the test station adopts a structure with two test springs, that is, one test station has a total of four test springs. The fixing pins for fixing the test springs pass through the fixed clamping block, the height limit block and the test spring to achieve the purpose of fixing the test springs. Each pole of the test station has two fixing pins, and the test contacts are connected to the corresponding circuits on the PCB circuit board to achieve the purpose of leading out the electrodes of the chip capacitors. The height limit block is used to limit the descending height of the chip capacitor when the test cover is pressed down.

[0034] like Figure 6The figure shows the connection diagram of the channel switching test circuit based on PLC control in this embodiment. The high-speed and accurate response characteristics of the PLC mechanical relay are utilized to build a fast and accurate channel switching solution to ensure the realization of high-precision testing. Figure 6 In the diagram, C0 is the common terminal of output terminals Y0~Y7, C1 is the common terminal of output terminals Y8~Y15, and C2 is the common terminal of output terminals Y16~Y23. The three common terminals C0, C1, and C2 are connected, and the negative poles of the six test stations on the flexible test fixture 1 are connected to the output terminals Y0~Y5 respectively, and the negative poles of the six test stations on the flexible test fixture 2 are connected to the output terminals Y8~Y13 respectively. The negative pole of test instrument 1 is connected to the output terminal Y16, and the negative pole of test instrument 2 is connected to the output terminal Y17. All test fixtures and the positive poles of all test instruments are connected. At the same time, all test cables are shielded cables to further improve the test accuracy.

[0035] In this embodiment, the channel switching technology based on PLC control has very high adaptability. The number of flexible test fixtures, the number of test instruments, and the number of test stations on the flexible test fixture can be increased or decreased according to actual needs. It is very flexible and can be quickly set up in a high-precision flexible automatic testing system to adapt to changes in demand.

[0036] The complete implementation and testing process is as follows: the first step is to make hardware connections. First, connect the test lines of the flexible test fixture, PLC and test instruments. Then, connect the communication lines of the manipulator controller, industrial computer, PLC, camera and test instruments and configure the communication address. Next, connect the control lines of the manipulator controller, solenoid valve, light source controller and vibration disk. The second step is to deploy software, including the deployment of the intelligent management platform, high-precision flexible automatic testing system, manipulator control program, PLC control program and touch screen program. The third step is to formulate test tasks. Tasks can be issued on the intelligent management platform, and then the test process can be started directly after receiving the tasks on the high-precision flexible automatic testing system. The test parameters can also be accurately set on the high-precision flexible automatic testing system, and then the test process can be started. The fourth step is to start the test process. The automation control framework of the high-precision flexible automatic testing system will control the entire test process in an orderly manner according to the preset process and logic. During the test, the PLC-controlled channel switching technology will accurately switch channels. The fifth step is to upload data in real time. During the test, the high-precision flexible automatic test system will continuously collect various data generated during the test, including key parameters such as the capacitance value, loss tangent value, and leakage current value of the chip capacitor, and transmit these data to the intelligent management platform in real time. The sixth step is to perform data analysis. The intelligent management platform processes and analyzes the test data in real time. If abnormal data or potential problems are found, an early warning signal will be issued in time so that the operator can take timely measures. A detailed test report will be produced based on the data analysis results, including various test parameters, test results, and evaluation and suggestions on the results. Testers can fully understand the performance of the chip capacitor based on the report, which can provide a strong basis for subsequent production, use or further research.

[0037] During the entire implementation process, it is necessary to ensure the stability and reliability of the test environment to avoid external interference from affecting the test results. At the same time, the test system must be calibrated and maintained regularly to ensure that the accuracy, flexibility and precision of the test are always in good condition.

Claims

1. A high-precision flexible automatic test system for chip capacitors, characterized by: The system comprises: Test platform: used to connect the flexible test fixture, which is connected to the test interface; the test platform is connected to the automation platform and the test instrument respectively; Automation platform: used to realize automatic loading and unloading of chip capacitors; Automatic test system: used to realize the measurement and control of each functional module; In the perception platform: the overhead camera is used to identify and locate chip capacitors; Test instrument: used to perform parameter tests on capacitors.

2. A high-precision flexible automatic test system for chip capacitors according to claim 1, characterized in that: The flexible test fixture comprises a test board (1), a PCB circuit board (2), a test interface (3), a test cover plate (4), a positioning pin (5) and a test station (6); the test board (1) is used to carry the test station (6) and connect the test station (6) with the PCB circuit board (2); the PCB circuit board (2) is used to lead out electrodes of the test station and connect with the test interface (3); the test interface (3) is used to connect a test line of a test instrument; the test cover plate (4) is used to ensure that the chip capacitor maintains stable contact with the electrode of the test station; the positioning pin (5) is used to connect the test board (5) and the PCB circuit board (2) to ensure that the test station (6) and the circuit on the PCB board are accurately connected; and the test station (6) is used to carry the chip capacitor of the test object.

3. A high-precision flexible automatic test system for chip capacitors according to claim 2, characterized in that: The number of the test stations (6) is more than one; each test station is designed to have different specifications according to the capacitor specifications; Design an independent circuit and bring it out to the test interface.

4. A high-precision flexible automatic test system for chip capacitors according to claim 3, characterized in that: The test station (6) comprises a test spring (61), a fixing pin (62), a test contact (63), a fixing clamp (64) and a height limiting block (65); each pole on the test station adopts two test spring structures, that is, one test station has a total of four test springs, the fixing pin for fixing the test spring passes through the fixing clamp, the height limiting block and the test spring, each pole of the test station has two fixing pins, the test contact is connected to the corresponding circuit on the PCB circuit board, and the height limiting block is used to limit the descending height of the chip capacitor when the test cover is pressed down.

5. A high-precision flexible automatic test system for chip capacitors according to claim 3, characterized in that: The test interface is switched using a channel switching test circuit based on PLC control.

6. A high-precision flexible automatic test system for chip capacitors according to claim 1, characterized in that: The high-precision and flexible automated testing system is based on the automated control framework developed on the QT platform. According to the tasks issued by the intelligent management platform, it automatically performs process division, equipment call and parameter setting, visual analysis and logical control between devices. The automated control framework includes a business layer, an Internet of Things layer and a support layer. The business layer deploys an intelligent management platform for task issuance, system scheduling, data analysis and equipment management. The Internet of Things layer deploys a high-precision and flexible automated testing system for task acquisition, equipment control, data upload and data analysis. The support layer provides basic support for communication and automation, including hardware equipment, equipment networking, equipment integration, network protocols and data exchange.

7. A high-precision flexible automatic test system for chip capacitors according to claim 6, characterized in that: The hardware equipment includes an industrial computer, a manipulator, a manipulator controller, a camera, a vibration plate and a touch screen. The industrial computer is used to deploy a high-precision flexible automatic testing system, the manipulator is used to perform automatic grasping of chip capacitors, the manipulator controller is used to deploy the manipulator program, the camera is used to identify, locate and correct the position of chip capacitors, the vibration plate is used to turn over the chip capacitors, and the touch screen is used for human-computer interaction with the PLC program.

8. The testing method of the chip capacitor high-precision flexible automatic testing system according to any one of claims 1 to 7, characterized in that: The method comprises: Step 1: Connect the test lines of the flexible test fixture, PLC and test instrument; connect the communication lines of the manipulator controller, industrial computer, PLC, camera and test instrument and configure the communication address; connect the control lines of the manipulator controller, solenoid valve, light source controller and vibration plate; Step 2: Deploy software, including the deployment of intelligent management platform, high-precision flexible automatic testing system, manipulator control program, PLC control program and touch screen program; Step 3: Formulate the test task, issue the task on the intelligent management platform, and then directly start the test process after receiving the task on the high-precision flexible automatic test system; or directly set the test parameters on the high-precision flexible automatic test system and then start the test process; Step 4: The automated control framework controls the execution of the entire test process in an orderly manner according to the preset process and logic. By working in collaboration with the manipulator, PLC, and flexible test fixture, it realizes adaptive adaptation of chip capacitors of different models and sizes. During the test, the PLC controls channel switching. Step 5. During the test, the high-precision flexible automatic test system will continuously collect various data generated during the test, including the capacitance value, loss tangent value, and leakage current value parameters of the chip capacitor, and transmit these data to the intelligent management platform in real time; Step 6: The intelligent management platform processes and analyzes the test data in real time and issues warning signals if abnormal data or potential problems are found.

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