Test system

Abstract

The invention discloses a testing system which comprises a feeding area, a discharging area, a testing area, an assembly and image inspection area, a separation and image inspection area, a cover plate storage area and a carrying module. An assembly and image inspection area, a separation and image inspection area and a test area are respectively arranged around the carrying module, the separation and image inspection area is arranged in the blanking area, a tray for bearing a test object is transferred to the assembly and image inspection area through the carrying module, and an upper cover plate is assembled after inspection; then, the carrying module conveys the cover plate and the tray to the testing area for testing, after testing is completed, the tray is moved to the separation and image inspection area through the carrying module, the cover plate is unloaded, the tray is inspected again through the separation and image inspection area, and then tested objects in the tray are classified through the discharging area; and the carrying module moves the unloaded cover plate back to the cover plate storage area, so that the automatic test operation is completed.

Description

Technical Field

[0001] The present invention relates to the technical field of chip testing machines, and more particularly to a fully automatic testing system. Background Art

[0002] Existing chip burn-in test equipment provides a high-temperature environment to test the chip. Each test device is equipped with a dedicated test probe card module for the corresponding chip. The probe card module directly contacts the chip and performs relevant tests. In addition, because the chip burn-in test takes a long time, in order to maintain the test efficiency, a chip burn-in test equipment usually has multiple sets of probe card modules, and uses a time difference method to test the test object separately, so as to facilitate sequential loading, testing and unloading. Therefore, once it is necessary to replace the chip with a different specification, the multiple sets of probe card modules responsible for contacting it must be replaced at the same time. The pre-operation of this replacement process will consume a lot of time and manpower. In addition, this type of chip burn-in test equipment is usually only suitable for testing a single type of chip. When different types of chips need to be tested, different machines and equipment must be purchased, which is costly. Summary of the invention

[0003] The main purpose of the present invention is to provide a fully automated testing system that can increase the number of single-disc tests, reduce testing costs, and add a cover between the testing machine and the tray, thereby shortening the machine modification time before testing and increasing the types of product tests, thereby saving the time and manpower required to disassemble and assemble the probe card module in the existing testing machine.

[0004] To achieve the above-mentioned purpose, the present invention adopts the following technical solutions:

[0005] The present invention is a testing system, comprising: a loading area, a unloading area, a testing area, an assembly and image inspection area, a separation and image inspection area, a cover plate storage area and a conveying module, wherein the loading area is used to place a plurality of trays, the loading area is arranged adjacent to the cover plate storage area and the assembly and image inspection area, the conveying module is respectively provided with the assembly and image inspection area, the separation and image inspection area and the testing area, the separation and image inspection area is arranged in the unloading area, the tray is transferred to the assembly and image inspection area by the conveying module, and the cover plate is inspected and assembled in the assembly and image inspection area, then the conveying module sends the cover plate and the tray to the aging test machine corresponding to the testing area for testing, after the test is completed, the tray is moved to the separation and image inspection area by the conveying module and the cover plate is removed, the separation and image inspection area inspects the tray again, and the test objects on the tray are classified in the unloading area, and the conveying module moves the removed cover plate back to the cover plate storage area to complete the automated testing operation.

[0006] As one of the preferred embodiments, the cover plate includes a test carrier and a second probe plate stacked in sequence, the second probe plate includes a probe base plate, a fixed plate, a plurality of probes, a support plate and a floating positioning block, the probe base plate is clamped between the test carrier and the fixed plate, the support plate is fixed under the fixed plate, the support plate fixes a plurality of the floating positioning blocks in a floating manner, the probes are confined between the probe base plate and the fixed plate, one end of the probe is electrically connected to the test carrier, and the other end of the probe is exposed after the floating positioning block moves toward the fixed plate.

[0007] As one of the preferred embodiments, the tray is provided with an alignment portion and a receiving groove, the receiving groove is for placing the test object, the support plate is provided with a plurality of the floating positioning blocks and a plurality of positioning members corresponding to the number of the test objects, when the cover plate is lowered to cover the tray, the positioning member matches the alignment portion, the floating positioning block matches the receiving groove, the cover plate is accurately combined with the tray, and the floating positioning block contacts the test object in the receiving groove to limit the position of the test object.

[0008] As one of the preferred embodiments, the floating positioning block has an inclined surface at the bottom facing the receiving groove, and after being lowered, the inclined surface contacts the side of the test object to limit the position of the test object.

[0009] As one of the preferred embodiments, the loading area includes multiple object to be tested picking and placing modules, an object to be tested tray moving module, multiple tracks, a first product to be tested area and a second product to be tested area, the first product to be tested area and the second product to be tested area are used to place different types of objects to be tested, and the first product to be tested area and the second product to be tested area are provided with the tracks and the corresponding object to be tested picking and placing modules, the two end ranges of each track are used to store multiple trays and to place corresponding test objects, the object to be tested picking and placing module is used to pick and place the test objects in the tray, and the object to be tested tray moving module is used to move the tray on different tracks to the picking and placing arm in the conveying module to move the tray to the assembly and image inspection area.

[0010] As one of the preferred embodiments, the cover plate storage area includes a test cover plate storage cart, a grabbing and assembly mechanism, a test cover plate assembly station and a test cover plate temporary storage station. The test cover plate storage cart is a multi-layer storage structure for placing multiple cover plates therein. The grabbing and assembly mechanism takes the cover plates out of the test cover plate storage cart and sends them to the test cover plate assembly station. The test cover plate storage cart is provided with rollers at the bottom to move the test cover plate storage cart. The test cover plate temporary storage station serves as a temporary storage place for the cover plates retrieved from the unloading area.

[0011] As one of the preferred embodiments, the assembly and image inspection area includes a detection module and a carrying portion, and the detection module is used to photograph the tray placed on the carrying portion to confirm whether the tray and the test object placed thereon meet the specifications.

[0012] As one of the preferred embodiments, the transport module includes a pick-and-place arm and a track, and the pick-and-place arm can move between the loading area, the testing area and the unloading area via the track. A clamp is provided on the top of the pick-and-place arm, and a code reader and a distance measuring sensor are arranged on the clamp. The clamp is used to grab the tray and the cover plate, and the code reader on the claw is used to read the QR code on the cover plate, and the distance measuring sensor is used to check the fitting height of the cover plate and the tray after being buckled.

[0013] As one of the preferred embodiments, it also includes at least one test assembly, the test assembly includes multiple test boards, a test transfer board and the cover plate, the test transfer board includes an adapter plate and a first probe board, the cover plate includes the test carrier plate and the second probe board, the test boards are respectively inserted into the adapter plate, and are electrically connected to the first probe board via the adapter plate, the test carrier plate is electrically connected to the second probe board to form the cover plate, when the cover plate is assembled on the tray, the tray is electrically contacted with the test object via the multiple probes in the second probe board, and the test carrier plate is electrically connected to the first probe board, so that the test board can test the test object.

[0014] As one of the preferred embodiments, at least one aging test machine is provided in the test area, and the aging test machine includes two extension pieces, a frame and four groups of aging test modules installed. The frame includes two test operation areas, each test operation area is provided with one aging test module, and each test operation area performs two groups of tests simultaneously. The aging test module is locked to the frame through the extension piece, and the aging test module is extended out of the frame through the extension piece. The aging test module includes a lifting module and the test assembly. The guide rail of the lifting module guides the tray assembled with the cover plate to enter under the test assembly, and the lifting member drives the cover plate and the tray to rise and perform pressure testing with the test assembly.

[0015] As one of the preferred embodiments, the unloading area includes multiple tested object picking and placing modules, a tested object tray moving module, multiple tracks, a first tested product area and a second tested product area. The first tested product area and the second tested product area are used to place test objects with different test results, and the first tested product area and the second tested product area are provided with the tracks and the corresponding tested object picking and placing modules. Each of the tracks is used to place the corresponding tray according to different test results, so that the tested object tray moving module and the tested object picking and placing module can move on the corresponding track and classify the test objects.

[0016] Compared with the prior art, the test system of the present invention utilizes fully automatic operation to make the tray as full as possible for subsequent testing in the loading area, assembly and image inspection area, so as to increase the number of tests and reduce the testing cost. The test assembly adds a cover plate as an intermediary for the electrical contact of the tray, and the test structure that meets the test object is customized through the cover plate, which increases the types of product tests and can also shorten the operation time and labor cost when modifying the machine. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 FIG. 4 is an architecture diagram of the test system of the present invention.

[0018] Figure 2 It is a schematic diagram of the longitudinal structure of the cover plate of the present invention.

[0019] Figure 3 It is an enlarged view of the local structure of the cover plate of the present invention.

[0020] Figure 4 It is a partial enlarged view of the location of the floating positioning block of the present invention.

[0021] Figure 5 It is a schematic structural diagram of the cover plate and the tray of the present invention.

[0022] Figure 6 It is a structural diagram of the loading area of ​​the present invention.

[0023] Figure 7 It is a structural schematic diagram of the cover plate storage area of ​​the present invention.

[0024] Figure 8 It is a schematic diagram of the structure of the loading area, assembly and image inspection area and handling module of the present invention.

[0025] Fig. 9 It is a three-dimensional diagram of the transport module of the present invention.

[0026] Fig.10 This is an enlarged view of the clamping claws of the handling module of the present invention.

[0027] Fig.11 It is a schematic diagram of the architecture of the test component of the present invention.

[0028] Fig.12 It is a three-dimensional diagram of the test assembly of the present invention.

[0029] Fig.13 It is a three-dimensional diagram of the aging test machine of the present invention.

[0030] Fig.14 It is a three-dimensional diagram of the aging test module of the present invention.

[0031] Fig.15 Schematic diagram of the aging test module of the present invention.

[0032] Fig.16 It is a schematic diagram of the separation and image inspection module of the present invention.

[0033] Fig.17 It is a structural diagram of the material unloading area of ​​the present invention.

[0034] Description of main reference numerals:

[0035] 11: Loading area 111: Object pick-up and placement module

[0036] 112: Object moving module 113: Track

[0037] 114: first product area to be tested 115: second product area to be tested

[0038] 12: Unloading area 121: Measured object pick-up and placement module

[0039] 122: Object moving module 123: Track

[0040] 124: First tested product area 125: Second tested product area

[0041] 13: Testing area 14: Assembly and image inspection area

[0042] 141: Assembling the detection module 142: Assembling the bearing part

[0043] 15: Separation and image inspection area 151: Separation inspection module

[0044] 152: Separation bearing part 16: Cover plate storage area

[0045] 161: Test cover storage cart 1611: Roller

[0046] 162: Grasping assembly mechanism 163: Test cover assembly station

[0047] 164: Test cover temporary placement station 17: Transport module

[0048] 171: Pick and place arm 172: Track

[0049] 173: Gripper 174: Code reader

[0050] 175: Distance sensor 18: Cover

[0051] 181: test carrier board 182: second probe board

[0052] 1821: probe substrate 1822: fixing plate

[0053] 1823: Probe 1824: Support plate

[0054] 1825: floating positioning block 1826: positioning piece

[0055] 1827: Slope 19: Tray

[0056] 191: Accommodation groove 192: Alignment part

[0057] 21:Test Components 211:Test Board

[0058] 212: Test transfer board 2121: Transfer board

[0059] 2122: first probe card 22: aging test machine

[0060] 222: Extension 223: Frame

[0061] 224: Test operation area 23: Aging test module

[0062] 231: lifting module 232: guide rail. DETAILED DESCRIPTION

[0063] The technical solution of the present invention will be clearly and completely described below in conjunction with specific embodiments and accompanying drawings. It should be noted that when a component is referred to as being "mounted on or fixed to" another component, it means that it can be directly on the other component or there can also be a central component. When a component is considered to be "connected" to another component, it means that it can be directly connected to the other component or there can be a central component at the same time. In the illustrated embodiments, the directions indicating up, down, left, right, front and back are relative, and are used to explain that the structures and movements of different components in this case are relative. These representations are appropriate when the components are in the positions shown in the figures. However, if the description of the component positions changes, it is believed that these representations will also change accordingly.

[0064] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those generally understood by those skilled in the art of the present invention. The terms used herein are only for the purpose of describing specific embodiments and are not intended to limit the present invention. The term "and / or" used herein includes any and all combinations of one or more related listed items.

[0065] The test system of the present invention provides a fully automatic system for chip aging test, which can save time, increase the number of single-disk tests, reduce test costs and shorten the time of changing machines before testing. Figure 1 As shown, the test system of the present invention comprises: a loading area 11, a unloading area 12, a testing area 13, an assembly and image inspection area 14, a separation and image inspection area 15, a cover storage area 16 and a handling module 17. The loading area 11 is used to place a plurality of trays, and is located adjacent to the cover storage area 16 and the assembly and image inspection area 14. The assembly and image inspection area 14, the separation and image inspection area 15 and the testing area 13 are respectively arranged around the handling module 17. The separation and image inspection area 15 is arranged in the unloading area 12. The tray carrying the test object is transferred to the assembly and image inspection area 14 through the handling module 17, and the assembly and image inspection area 14 checks whether the test object on the tray meets the specification, such as whether the quantity is correct or whether it is set. The front and back sides are determined, and then the cover is taken from the cover storage area 16 and assembled on the tray. Then the conveying module 17 sends the assembled cover and tray to the corresponding aging tester 22 in the test area 13 for testing. After the test is completed, the conveying module 17 moves the tray to the separation and image inspection area 15 and unloads the cover. The separation and image inspection area 15 inspects the test objects in the tray and classifies them in the unloading area 12. The conveying module 17 moves the unloaded cover back to the cover storage area 16, thereby completing the automated testing operation.

[0066] Next, the structure of each component is described in detail:

[0067] First of all, it is emphasized that the test system of the present invention has a special feature, that is, a set of cover plates are installed on the tray. The cover plates serve as an intermediary for electrical contact between the aging tester and the tray, and then the cover plates are used to customize the electrical test contact structure corresponding to each test object to increase the types of applicable test objects. In addition, the cover plate can be directly electrically connected to the probe board of the aging tester, and can also be removed from the tray in time, saving the time and manpower required to disassemble and install the probe board of the existing aging tester, and improving the operating efficiency of the machine change.

[0068] like Figure 2 , Figure 3 and Figure 4As shown, the cover plate 18 used in the present invention includes a test carrier plate 181 and a second probe plate 182 stacked in sequence, the second probe plate 182 includes a probe substrate 1821, a fixed plate 1822, a plurality of probes 1823, a support plate 1824 and a floating positioning block 1825, the probe substrate 1821 is clamped between the test carrier plate 181 and the fixed plate 1822, the support plate 1824 is fixed under the fixed plate 1822, the support plate 1824 adopts a floating method to fix a plurality of floating positioning blocks 1825, and a plurality of probes 1823 are confined between the probe substrate 1821 and the fixed plate 1822, but one end of the probe 1823 can be electrically connected to the test carrier plate 181, and the other end is exposed after the floating positioning block 1825 moves toward the fixed plate 1822, thereby enabling the probe 1823 to electrically contact the test object for testing. The present invention utilizes the cover plate 18 structure as an intermediary for electrical contact between the test object and the aging test machine, which can save machine replacement time and manpower and is more applicable to a variety of different types of test objects.

[0069] like Figure 5 As shown, the cover plate 18 is used to be assembled on the tray 19. In order to make the cover plate 18 more accurately match the tray 19, the support plate 1824 at the bottom of the cover plate 18 is provided with a plurality of floating positioning blocks 1825 corresponding to the number of test objects 30 on the tray 19, and a plurality of positioning members 1826. The tray 19 has a plurality of receiving grooves 191 and a plurality of alignment parts 192. The receiving grooves 191 are used to place the test objects 30. In this embodiment, the test objects 30 are chips. When the cover plate 18 is lowered to cover the tray 19, the positioning members 1826 match the alignment parts 192, and the floating positioning blocks 1825 match the receiving grooves 191, so that the cover plate 18 can be accurately combined with the tray 19. In addition, the floating positioning block 1825 has an inclined surface 1827 at the bottom facing the receiving groove 191 . After being pressed down, the inclined surface 1827 contacts the side of the test object 30 , thereby effectively limiting the position of the test object 30 and making the probe 1823 more accurately electrically contact the test object 30 .

[0070] like Figure 6As shown, the loading area 11 includes a plurality of test object pick-up and placement modules 111, a test object tray moving module 112, a plurality of tracks 113, a first test product area 114 and a second test product area 115. The first test product area 114 and the second test product area 115 are used to place different types of test objects, and the first test product area 114 and the second test product area 115 are provided with tracks 113 and corresponding test object pick-up and placement modules 111. The two ends of each track 113 are used to place a plurality of trays 19. The trays 19 are used to place corresponding test objects. The test object pick-up and placement modules 111 are used to pick up and place the test objects in the trays 19. The test object tray moving module 112 is used to move the trays 19 in different tracks 113. Finally, the pick-up and placement arm of the transport module 17 moves the trays 19 to the assembly and image inspection area 14. The loading area 11 is mainly used to place the test objects as full as possible on the corresponding trays 19 according to the type, so as to improve the test quantity and efficiency each time.

[0071] like Figure 1 and 7 As shown, the cover plate storage area 16 is provided with two areas, which are respectively located on both sides of the assembly and image inspection area 14. Since the two areas have the same structure, only one of the areas is described. The cover plate storage area 16 includes a test cover plate storage cart 161, a grabbing assembly mechanism 162, a test cover plate assembly station 163 and a test cover plate temporary storage station 164. The test cover plate storage cart 161 is a multi-layer storage structure for placing cover plates 18 therein. The grabbing assembly mechanism 162 takes the cover plate 18 out of the test cover plate storage cart 161 and sends it to the test cover plate assembly station 163, waiting for subsequent assembly on the pallet 19. In addition, a roller 1611 is provided at the bottom of the test cover plate storage cart 161, which can freely move the test cover plate storage cart 161 to facilitate the replenishment or replacement of different types of cover plates 18. The test cover temporary storage station 164 is used as a temporary storage place for the cover 18 retrieved after the test, and is subsequently sent back to the test cover storage vehicle 161 by the grabbing and assembling mechanism 162, or moved to the test cover assembly station 163 to wait for assembly on another tray 19.

[0072] like Figure 8 , which is a schematic diagram of the structure of the loading area, the assembly and image inspection area and the handling module. The assembly and image inspection area 14 is located between the loading area 11 and the handling module 17. The assembly and image inspection area 14 includes a detection module 141 and a carrier 142. The detection module 141 is used to photograph the tray 19 placed on the carrier 142, and compare the photographed image with the database to check whether the position of the test object 30 (such as a chip) is correct, such as whether the pins are facing upward, whether the marking position is correct, etc., or to check whether the tray 19 is full. If not, confirm whether it is filled manually or released after recording.

[0073] Fig. 9As shown, the handling module 17 includes a pick-and-place arm 171 and a track 172. The pick-and-place arm 171 is a six-axis robotic arm that can move between the loading area 11, the testing area 13, and the unloading area 12 via the track 172. A clamp 173 is provided at the top of the pick-and-place arm 171. Fig.10 As shown, a code reader 174 and a distance sensor 175 are also provided on the clamp 173, so that the clamp 173 can accurately grasp the tray 19 and the cover 18. Figure 8 As shown, the pick-and-place arm 171 moves the tray 19 from the loading area 11 to the supporting portion 142 of the assembly and image inspection area 14. After checking that there are no problems, the pick-and-place arm 171 takes out the cover 18 from the cover storage area 16 and assembles it on the tray 19. The code reader 174 on the clamp 173 is used to read the QR code on the cover 18, and the distance sensor 175 is used to check the matching height of the cover 18 and the tray 19 after they are buckled together to ensure that the two are indeed covered.

[0074] like Fig.11 and Fig.12 As shown, when the test operation is performed, the cover plate 18 will be coupled with other mechanisms to form a test assembly 21, so that the test assembly 21 will be electrically contacted with multiple test objects 30 in the tray 19 to perform related test operations. The test assembly 21 includes multiple test boards 211, a test transfer board 212 and a cover plate 18, and the test transfer board 212 includes an adapter board 2121 and a first probe board 2122. The cover plate 18 includes a test carrier 181 and a second probe board 182. The test boards 211 are respectively inserted into the adapter boards 2121, and are electrically connected to the first probe board 2122 through the adapter board 2121, and the second probe board 182 is electrically connected to the test carrier 181. When the cover plate 18 is assembled on the tray 19, the tray 19 is electrically contacted with the test object 30 via the plurality of probes 1823 in the second probe plate 182, the test carrier 181 is electrically connected to the first probe plate 2122 thereon, and the test plate 211 performs various electrical tests on the test object 30. In this embodiment, the cover plate 18 can be modularly designed and replaced according to test requirements, thereby being applicable to more different trays 19 and test objects 30.

[0075] like Figure 1 and Fig.13 As shown, at least one aging test machine 22 is provided in the test area 13. The aging test machine 22 includes two groups of extension pieces 222, a frame 223 and four groups of aging test modules 23 installed. The frame 223 is provided with two test operation areas 224. Each test operation area 224 is provided with an aging test module 23. Two groups of trays 19 can be tested at the same time. The aging test module 23 is locked to the frame 223 through the extension piece 222, and the aging test module 23 is extended out of the frame 223 through the extension piece 222. Fig.14 and Fig.15As shown, the aging test module 23 in this embodiment includes a set of lifting modules 231 and the above-mentioned test assembly 21. In addition, a guide rail 232 is provided to guide the tray 19 into the area below the test assembly 21, and when the lifting module 231 is actuated, the cover plate 18 and the tray 19 are driven up to perform pressure testing with the test assembly 21.

[0076] like Fig.16 As shown, the separation and image inspection area 15 is located in the unloading area 12, and the separation and image inspection area 15 includes a separation detection module 151 and a separation carrying portion 152. When the test is completed, the conveying module 17 will transport the cover 18 and the tray 19 to the separation carrying portion 152, and remove the cover 18 and send it back to the test cover temporary placement station 164 in the cover storage area 16. The separation detection module 151 is used to photograph the tray 19 located on the separation carrying portion 152, and use the photographed image to compare with the database, and confirm whether the number of test objects 30 on the tray 19 is the same as the number before the test. If different, the system automatically stops to check and record it.

[0077] like Fig.17 As shown, the unloading area 12 includes multiple groups of tested object placement modules 121, a tested object tray moving module 122, multiple tracks 123, a first tested product area 124 and a second tested product area 125. The first tested product area 124 and the second tested product area 125 are used to place test objects 30 with different test results, and the first tested product area 124 and the second tested product area 125 are provided with tracks 123 and corresponding tested object placement modules 121. Each track 123 can be defined as a tray 19 corresponding to different test results, so that the tested object tray moving module 122 and the tested object placement module 121 can move on the corresponding track 123, so as to classify the test objects 30 in different trays 19 and move them to the trays 19 on the corresponding track 123. For example, in this embodiment, Fig.17 The two leftmost longitudinal tracks 123 can be regarded as replenishment tracks, the second track 123 from the right is the NG product track, and the rightmost track 123 is the good product track. After inspection, the defective test objects 30 will be placed in the tray 19 on the NG product track by the tested object picking and placing module 121, and the tray 19 that has been replenished with good products will be moved to the good product track by the tested object moving tray module 122 to facilitate the final collection and output.

[0078] In summary, the test system of the present invention adopts a fully automated operation mode from the initial material collection, material loading test and material unloading classification operations, which can effectively save manpower, increase the number of single-plate tests, reduce costs and shorten the preparation time before testing. The aging tester in the test area is designed to be able to test two trays in a single test area and test multiple groups of trays in batches at the same time. Although it cannot significantly shorten the test time, it can increase the test efficiency due to the increase in test volume. In addition, by adding an assembly mode of a cover plate and a tray, it can save time and manpower for changing machines, and can also increase the test applicable to more different types of test objects. It is innovative and progressive and meets the requirements of patent applications.

[0079] The above is only a preferred embodiment of the present invention and is not intended to limit the scope of the embodiments of the present invention. That is, all equivalent changes and modifications made according to the scope of the claims of the present invention are covered by the protection scope of the present invention.

Claims

1. A testing system, characterized in that: include: The loading area, the unloading area, the testing area, the assembly and image inspection area, the separation and image inspection area, the cover plate storage area and the conveying module, the loading area is used to place multiple trays, the loading area is arranged adjacent to the cover plate storage area and the assembly and image inspection area, the conveying module is respectively provided with the assembly and image inspection area, the separation and image inspection area and the testing area, the separation and image inspection area is arranged in the unloading area, the tray is transferred to the assembly and image inspection area by the conveying module, and the cover plate is inspected and assembled in the assembly and image inspection area, and then the conveying module sends the cover plate and the tray to the aging tester corresponding to the testing area for testing, after the test is completed, the tray is moved to the separation and image inspection area by the conveying module and the cover plate is removed, the separation and image inspection area inspects the tray again, and the test objects on the tray are classified in the unloading area, and the conveying module moves the removed cover plate back to the cover plate storage area to complete the automated testing operation.

2. The test system according to claim 1, characterized in that: The cover plate includes a test carrier and a second probe plate stacked in sequence, the second probe plate includes a probe base plate, a fixed plate, a plurality of probes, a support plate and a floating positioning block, the probe base plate is clamped between the test carrier and the fixed plate, the support plate is fixed under the fixed plate, the support plate fixes a plurality of the floating positioning blocks in a floating manner, the probe is confined between the probe base plate and the fixed plate, one end of the probe is electrically connected to the test carrier, and the other end of the probe is exposed after the floating positioning block moves toward the fixed plate.

3. The test system according to claim 2, characterized in that: The tray is provided with an alignment portion and a receiving groove, the receiving groove is for placing the test object, the support plate is provided with a plurality of the floating positioning blocks and a plurality of positioning members corresponding to the number of the test objects, when the cover plate descends to cover the tray, the positioning member matches with the alignment portion, the floating positioning block matches with the receiving groove, the cover plate is accurately combined with the tray, and the floating positioning block contacts with the test object in the receiving groove to limit the position of the test object.

4. The test system according to claim 3, characterized in that: The floating positioning block has an inclined surface at the bottom facing the containing groove, and after descending, the inclined surface contacts the side of the test object to limit the position of the test object.

5. The test system according to claim 1, characterized in that: The loading area includes multiple object to be tested picking and placing modules, an object to be tested tray moving module, multiple tracks, a first product to be tested area and a second product to be tested area. The first product to be tested area and the second product to be tested area are used to place different types of objects to be tested, and the first product to be tested area and the second product to be tested area are provided with the tracks and the corresponding object to be tested picking and placing modules. The two end ranges of each track are used to store multiple trays and to place corresponding test objects. The object to be tested picking and placing module is used to pick and place the test objects in the trays. The object to be tested tray moving module is used to move the trays on different tracks to the picking and placing arm in the conveying module to move the trays to the assembly and image inspection area.

6. The test system according to claim 1, characterized in that: The cover plate storage area includes a test cover plate storage cart, a grabbing and assembling mechanism, a test cover plate assembly station and a test cover plate temporary storage station. The test cover plate storage cart is a multi-layer storage structure for placing multiple cover plates therein. The grabbing and assembling mechanism takes the cover plates out of the test cover plate storage cart and sends them to the test cover plate assembly station. Rollers are provided at the bottom of the test cover plate storage cart to move the test cover plate storage cart. The test cover plate temporary storage station serves as a temporary storage place for the cover plates retrieved from the unloading area.

7. The test system according to claim 1, characterized in that: The assembly and image inspection area includes a detection module and a carrying portion. The detection module is used to photograph the tray placed on the carrying portion to confirm whether the tray and the test object placed thereon meet the specifications.

8. The test system according to claim 1, characterized in that: The transport module includes a pick-and-place arm and a track. The pick-and-place arm can move between the loading area, the testing area and the unloading area via the track. A clamp is provided on the top of the pick-and-place arm, and a code reader and a distance sensor are arranged on the clamp. The clamp is used to grab the tray and the cover plate, and the code reader on the claw is used to read the QR code on the cover plate, and the distance sensor is used to check the fitting height of the cover plate and the tray after being buckled.

9. The test system according to claim 2, characterized in that: It also includes at least one test component, which includes multiple test boards, a test transfer board and the cover plate. The test transfer board includes an adapter plate and a first probe board. The cover plate includes the test carrier plate and the second probe board. The test boards are respectively inserted into the adapter plate and electrically connected to the first probe board via the adapter plate. The test carrier plate is electrically connected to the second probe board to form the cover plate. When the cover plate is assembled on the tray, the tray is electrically contacted with the test object via the multiple probes in the second probe board, and the test carrier plate is electrically connected to the first probe board, so that the test board can test the test object.

10. The test system according to claim 9, characterized in that: At least one aging test machine is provided in the test area, and the aging test machine includes two extension pieces, a frame and four groups of aging test modules installed. The frame includes two test operation areas, each test operation area is provided with one aging test module, and each test operation area performs two groups of tests simultaneously. The aging test module is locked to the frame by the extension piece, and the aging test module is extended out of the frame by the extension piece. The aging test module includes a lifting module and the test assembly. The guide rail of the lifting module guides the tray assembled with the cover plate to enter under the test assembly, and the lifting member drives the cover plate and the tray to rise and perform pressure testing with the test assembly.

11. The test system according to claim 1, characterized in that: The unloading area includes multiple tested object picking and placing modules, a tested object tray moving module, multiple tracks, a first tested product area and a second tested product area. The first tested product area and the second tested product area are used to place test objects with different test results, and the first tested product area and the second tested product area are provided with the tracks and the corresponding tested object picking and placing modules. Each track is used to place the corresponding tray according to different test results, so that the tested object tray moving module and the tested object picking and placing module can move on the corresponding track and classify the test objects.

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