Reactor quality testing device and method

Abstract

The present invention relates to the technical field of reactor quality testing, and specifically to a reactor quality testing device and method. The reactor quality testing device includes an infrared thermal imager and a data control module. The infrared thermal imager obtains infrared thermal images at each moment of the reactor test; the data control module obtains the maximum temperature change amplitude of the first test according to the difference in the maximum temperature in the infrared thermal images at adjacent moments; according to the preset current and the maximum temperature change amplitude of the first test, the current of the second test is obtained, and then the current of the third test is obtained, and so on, until the preset conditions are reached and stopped; according to the current and temperature of the last test, the final quality detection result of the reactor is obtained. The present invention obtains the current of each test by adaptively obtaining the current, thereby avoiding the situation where the current exceeds the limit current that the reactor can withstand, and at the same time improving the efficiency of detecting the quality of the reactor. Finally, the quality of the reactor is accurately analyzed through the relevant data of the last test.

Description

Technical Field

[0001] The present invention relates to the technical field of reactor quality testing, and in particular to a reactor quality testing device and method. Background Art

[0002] A reactor is an inductive device, usually composed of a winding and an iron core (or an air core). Its main function is to generate reactance through inductive characteristics. It is widely used in power systems for regulating voltage, current, limiting short-circuit current, filtering harmonics, etc. Reactors usually need to be tested for various parameters such as inductance, impedance, temperature rise, and withstand voltage to ensure that the various indicators of the reactor meet the design and manufacturing standards. By testing the reactor, it can be verified whether the key indicators of the reactor, such as electrical performance, mechanical strength, and thermal performance, meet the requirements, thereby ensuring the normal operation of the reactor in the power system.

[0003] In the existing method, the quality of the reactor is tested through temperature rise test. The temperature rise test usually applies currents of different gears to the reactor, and analyzes the temperature changes of the reactor during operation under currents of different gears to obtain the quality test results of the reactor. However, in actual situations, the current applied each time is a manually set current, and there is a situation where the applied current exceeds or does not reach the limit current that the reactor can withstand, resulting in the inability to accurately analyze the temperature changes of the reactor under the limit current, and thus the inability to accurately obtain the quality test results of the reactor. Summary of the invention

[0004] In order to solve the technical problem that the artificially set current applied in the temperature rise test exceeds or fails to reach the limit current that the reactor can withstand, resulting in the inability to accurately obtain the quality detection result of the reactor, the purpose of the present invention is to provide a reactor quality test device and method, and the technical scheme adopted is as follows:

[0005] In a first aspect, an embodiment of the present invention provides a method for testing the quality of a reactor, the method comprising the following steps:

[0006] Obtain infrared thermal images of the reactor at each moment of the first test; wherein the current in the first test is the preset current;

[0007] According to the difference of the highest temperature in the infrared thermal images between adjacent moments of the first test, the maximum temperature variation range of the first test is obtained; according to the preset current and the maximum temperature variation range of the first test, the current of the second test is obtained; according to the current of the second test and the maximum temperature variation range of the second test, the current of the third test is obtained, and so on, until the preset condition is reached and the process stops; wherein the preset condition is determined according to the degree of change of the current in the sliding window in the current sequence; the current sequence is composed of the current of each test;

[0008] The final quality inspection result of the reactor is obtained based on the current of the last test, the maximum temperature change amplitude of the last test, and the temperature fluctuation in the infrared thermal image at the end time of the last test.

[0009] Furthermore, the method for obtaining the maximum temperature variation amplitude of the first test is:

[0010] For any moment in the first test, the ratio of the maximum temperature in the infrared thermal image at that moment to the maximum temperature in the infrared thermal image at the previous adjacent moment is taken as the maximum temperature change degree value at that moment;

[0011] The average of the maximum temperature change values ​​at all moments in the first test is obtained and normalized to obtain the maximum temperature change amplitude of the first test.

[0012] Furthermore, the method for obtaining the current of the second test is:

[0013] The result of negative correlation of the maximum temperature change amplitude of the first test is taken as the first result;

[0014] The product of the first result and the preset control parameter is used as the control weight;

[0015] According to the adjustment weight and the preset current, the current of the second test is obtained; wherein the adjustment weight and the preset current are both positively correlated with the current of the second test.

[0016] Furthermore, the calculation formula for obtaining the current of the second test is: ; In the formula, is the current of the second test; is the first preset constant; To preset control parameters; is the second preset constant; This is the first test of the maximum temperature change range; is the preset current; is the first result; To regulate the weight.

[0017] Furthermore, the method for obtaining the preset condition is:

[0018] The sliding window slides from front to back in the current sequence, and obtains the difference between the maximum current and the minimum current in the area where the sliding window is located as the change degree value;

[0019] The result of normalizing the difference between the maximum change value and the change value of the area where the sliding window is last located is used as the stop judgment value;

[0020] When the stop judgment value is greater than or equal to the preset stop judgment value threshold, the test on the reactor is stopped.

[0021] Furthermore, the current sequence is obtained by:

[0022] The current of each test is arranged according to the order of the test from the front to the back to obtain the current sequence.

[0023] Furthermore, the method for obtaining the final quality test result is:

[0024] According to the temperature fluctuation in the infrared thermal image at the end of the last test, the stability value of the reactor is obtained;

[0025] The final quality inspection result of the reactor is obtained based on the current of the last test, the maximum temperature change amplitude and the stability value of the last test; among them, the current and stability value of the last test are positively correlated with the final quality inspection result; the maximum temperature change amplitude of the last test is negatively correlated with the final quality inspection result.

[0026] Furthermore, the method for obtaining the stability value is:

[0027] The average value of the difference between all the temperatures in the infrared thermal image at the end of the last test and the highest temperature is taken as the difference degree value;

[0028] According to the difference degree value, the stability degree value of the reactor is obtained; wherein the difference degree value and the stability degree value are negatively correlated.

[0029] Furthermore, the calculation formula of the final quality test result is: ; Where G is the final quality inspection result; is the current of the last test; is the maximum temperature change amplitude of the last test; W is the stability value; norm is the normalization function.

[0030] In the second aspect, another embodiment of the present invention provides a reactor quality testing device, including a reactor quality testing mechanism, wherein the reactor quality testing mechanism includes a first wiring terminal, a second wiring terminal, a device body, a main power input terminal, a display screen and a touch-sensitive operation panel, a main switch, an upper cover fixing slot, a temperature insulating rubber pad, a reactor, a first cooling fan, an infrared thermal imager, an upper cover and a second cooling fan. The reactor quality testing device also includes a data control module, and the output terminal of the infrared thermal imager is connected to the input terminal of the data control module. The reactor quality testing device can implement the steps of any one of the above methods.

[0031] The present invention has the following beneficial effects:

[0032] According to the difference in the highest temperature in the infrared thermal image between adjacent moments of the first test, the variation range of the highest temperature of the first test is obtained, which accurately reflects the temperature change of the reactor during the first test, and indirectly reflects the tolerance of the reactor to the current of the first test, which is conducive to the subsequent accurate acquisition of the current of the second test, and then the current of the second test is adaptively obtained according to the preset current and the variation range of the highest temperature of the first test; similarly, according to the current of the second test and the variation range of the highest temperature of the second test, the current of the third test is adaptively obtained, and so on, until the preset condition is reached and stopped, and the time when the test of the reactor is stopped is accurately and efficiently determined, thereby improving the efficiency of detecting the quality of the reactor; wherein, the preset condition is determined according to the degree of change of the current in the sliding window in the current sequence, so as to avoid the current adaptively applied to the reactor during the test exceeding the limit current that the reactor can withstand, resulting in damage to the reactor and affecting the subsequent quality detection of the reactor; in order to accurately detect the quality of the reactor, the final quality detection result of the reactor is accurately obtained according to the current of the last test, the variation range of the highest temperature of the last test and the temperature fluctuation in the infrared thermal image at the end time of the last test, and the quality of the reactor is accurately determined. BRIEF DESCRIPTION OF THE DRAWINGS

[0033] In order to more clearly illustrate the technical solutions and advantages in the embodiments of the present invention or the prior art, the drawings required for use in the embodiments or the prior art descriptions are briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0034] Figure 1 A schematic diagram of the structure of a reactor quality testing mechanism provided by one embodiment of the present invention;

[0035] Figure 2 A schematic flow chart of a reactor quality testing method provided by an embodiment of the present invention;

[0036] Figure 3 A flow chart of a method for obtaining a preset condition provided by an embodiment of the present invention;

[0037] Figure 4 A flow chart of a method for obtaining a final quality inspection result provided by an embodiment of the present invention;

[0038] In the figure, 1 is the first wiring terminal, 2 is the second wiring terminal, 3 is the device body, 4 is the main power input terminal, 5 is the display screen and touch operation panel, 6 is the main switch, 7 is the upper cover fixing slot, 8 is the temperature insulation pad, 9 is the tested inductor, 11 is the first cooling fan, 12 is the infrared thermal imager, 13 is the upper cover and 14 is the second cooling fan. DETAILED DESCRIPTION

[0039] In order to further explain the technical means and effects adopted by the present invention to achieve the predetermined invention purpose, the following is a detailed description of a reactor quality test device and method proposed by the present invention, its specific implementation, structure, features and effects, in combination with the accompanying drawings and preferred embodiments. In the following description, different "one embodiment" or "another embodiment" does not necessarily refer to the same embodiment. In addition, specific features, structures or characteristics in one or more embodiments may be combined in any suitable form.

[0040] Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs.

[0041] The specific scheme of a reactor quality testing device and method provided by the present invention is described in detail below with reference to the accompanying drawings.

[0042] The present invention proposes a reactor quality testing device, including a reactor quality testing mechanism. The structural schematic diagram of the reactor quality testing mechanism is shown in FIG. Figure 1 As shown, in Figure 1 The device includes a first wiring terminal 1, a second wiring terminal 2, a device body 3, a main power input terminal 4, a display screen and a touch operation panel 5, a main switch 6, a top cover fixing slot 7, a temperature isolation rubber pad 8, a reactor 9, a first cooling fan 11, an infrared thermal imager 12, a top cover 13, and a second cooling fan 14. The reactor quality test device also includes a data control module, which is located in the device body 3. The output end of the infrared thermal imager 12 is connected to the input end of the data control module. The two can be connected by wire through a data transmission line, or by wireless communication methods such as Bluetooth and WiFi, which are not limited here.

[0043] The specific process of the reactor quality testing device for testing the reactor is as follows: (1) placing the reactor 9 on the temperature insulating rubber pad 8; (2) using a wire with alligator clips at both ends to connect the reactor 9 to the first terminal 1 and the second terminal 2 respectively; (3) connecting the upper cover 13 to the upper cover fixing slot 7 so that the upper cover 13 covers the reactor 9, thereby placing the reactor 9 in an independent test environment to prevent the external ambient temperature from interfering with the temperature of the reactor 9 during the test; (4) connecting the main power input terminal 4 to the AC power supply through the power cord; (5) starting the main switch 6, and setting the first test to be applied to the reactor through the display screen and the touch-sensitive operation panel 5. voltage, preset current, and duration of each test; (6) starting the test through the display screen and the touch-sensitive operation panel 5. During the test, the infrared thermal imager 12 is used to obtain the infrared thermal image of the reactor 9 at each moment, and the image is transmitted to the data control module for analysis, and the test process of the adaptive reactor quality test device is carried out; (7) the reactor 9 is cooled by the first cooling fan 11 and the second cooling fan 14 to ensure that the temperature of the reactor 9 is the same at the beginning of each test; (8) the test process of the reactor quality test device is controlled by the data control module until the test is completed, and the final quality test result of the reactor 9 is output on the display screen and the touch-sensitive operation panel 5.

[0044] The present invention also proposes a reactor quality testing method, including specific implementation steps of the data control module, please refer to Figure 2 , which shows a schematic flow chart of a reactor quality testing method provided by an embodiment of the present invention, the method comprising the following steps:

[0045] Step S1: Obtain infrared thermal images of the reactor at each moment during the first test; wherein the current in the first test is a preset current.

[0046] The specific scenario of this embodiment is: in the existing method, the method of temperature rise test needs to manually set multiple different currents, which are applied to the reactor for testing respectively, that is, set a current for a test, and determine the quality of the reactor by analyzing the temperature change of the reactor each time. Artificially setting the current of different gears to test the reactor will consume a lot of time cost on the one hand, and more importantly, the artificially set current may exceed or fail to reach the limit current that the reactor can withstand, which leads to the inability to accurately analyze the quality of the reactor. Therefore, this embodiment only sets the current and voltage of the first test of the reactor and the duration of each test, and then adaptively obtains the current of each test of the reactor through the data control module. At the same time, the data control module determines when the reactor quality test is terminated according to the current of each test, so as to avoid the current exceeding the limit current that the reactor can withstand. In actual situations, the current must increase with the increase of the number of tests, so that the current tends to the limit current of the reactor, and then accurately analyzes the quality of the reactor. Therefore, this embodiment accurately analyzes the quality of the reactor according to the temperature and current during the final test of the reactor.

[0047] In order to facilitate the subsequent accurate analysis of the quality of the reactor, this embodiment uses an infrared thermal imager to obtain infrared thermal images of the reactor at each moment of the first test, wherein this embodiment sets the preset current applied to the reactor for the first test to 1A and the voltage to 5V, and sets the duration of each test to 20 seconds. The implementer can set the voltage, preset current, and duration of each test applied to the reactor for the first test according to actual conditions, which are not limited here. Among them, this embodiment sets the voltage of each test of the reactor to the voltage applied to the reactor for the first test, ensuring that the voltage of each test remains consistent. This embodiment sets the time interval between two adjacent moments to 1 second. The implementer can set the size of the time interval between two adjacent moments according to actual conditions, which are not limited here.

[0048] Step S2: according to the difference of the highest temperature in the infrared thermal image between adjacent moments of the first test, obtain the maximum temperature change amplitude of the first test; according to the preset current and the maximum temperature change amplitude of the first test, obtain the current of the second test; according to the current of the second test and the maximum temperature change amplitude of the second test, obtain the current of the third test, and so on, until the preset condition is reached and stop; wherein the preset condition is determined according to the degree of change of the current in the sliding window in the current sequence; the current sequence is composed of the current of each test.

[0049] Specifically, when the temperature change amplitude of the surface of the reactor during the first test is larger, it means that the reactor is more sensitive to the preset current applied, which indirectly means that the reactor has a worse ability to withstand current. In order to avoid damage to the reactor caused by excessively high current during the test, and at the same time, to improve the accuracy of the quality assessment of the reactor through the temperature rise test, the current of the second test increases less on the basis of the preset current. In order to determine the increase amplitude of the current of the second test on the basis of the preset current, therefore, this embodiment analyzes the temperature difference in the infrared thermal image at two adjacent moments during the first test, and then determines the temperature change of the reactor during the first test. Considering that the temperature in the infrared thermal image is not unique, in order to accurately predict the current of the second test, therefore, this embodiment first obtains the maximum temperature change amplitude of the first test based on the difference in the maximum temperature in the infrared thermal image between adjacent moments of the first test. Among them, the larger the maximum temperature change amplitude of the first test, the larger the temperature change of the surface of the reactor during the first test, which indirectly reflects that the current of the second test has a smaller increase compared to the preset current.

[0050] It is known that the current of each test approaches the limiting current that the reactor can withstand as the number of tests increases. Therefore, the current of the second test is increased on the basis of the preset current. The larger the preset current, the larger the current of the second test. At the same time, the larger the maximum temperature change of the first test, the smaller the increase of the current of the second test compared to the preset current. Therefore, this embodiment obtains the current of the second test based on the preset current and the maximum temperature change of the first test.

[0051] The current of the third test is increased based on the current of the second test, and the degree of increase depends on the maximum temperature change amplitude of the second test. Similarly, this embodiment obtains the current of the third test based on the current of the second test and the maximum temperature change amplitude of the second test, and so on, to obtain the current of each test until the preset conditions are met and stop.

[0052] During the continuous test process, the current applied to the reactor gradually increases, and the temperature variation of the reactor surface may become larger and larger, so that the current increase applied to the reactor becomes smaller and smaller, which indirectly shows that the current applied to the reactor is getting closer and closer to the limit current that the reactor can withstand. In order to avoid the applied current exceeding the limit current that the reactor can withstand, this embodiment arranges the current of each test according to the order of the test from front to back, obtains the current sequence, and then analyzes the change of the current in the current sequence. When the degree of change of the current is smaller, it means that the test of the reactor should be stopped. Therefore, this embodiment determines the preset condition according to the degree of change of the current in the sliding window in the current sequence.

[0053] Preferably, in a method that can be implemented in this embodiment, the method for obtaining the maximum temperature change amplitude of the first test is: for any moment in the first test, the ratio of the maximum temperature in the infrared thermal image at that moment to the maximum temperature in the infrared thermal image at the previous adjacent moment is used as the maximum temperature change degree value at that moment; the larger the maximum temperature change degree value, the greater the maximum temperature change in the infrared thermal image at that moment, which indirectly indicates that the temperature change degree of the reactor is greater during the first test. In order to accurately represent the temperature change of the reactor during the first test, therefore, this embodiment obtains the average of the maximum temperature change degree values ​​at all moments in the first test and normalizes the result as the maximum temperature change amplitude of the first test. The larger the maximum temperature change amplitude of the first test, the more sensitive the reactor is to the applied preset current. In order to avoid the predicted current of the second test being too large and causing damage to the reactor, the current of the second test increases less than the preset current.

[0054] Among them, the calculation formula for the maximum temperature change range of the first test is: ; In the formula, is the maximum temperature change amplitude of the first test; N is the total number of all moments during the first test; is the highest temperature in the infrared thermal image at the nth moment during the first test; is the highest temperature in the infrared thermal image at the n+1th moment during the first test; is the maximum temperature change value at the n+1th moment during the first test; norm is the normalization function.

[0055] It should be noted that there is no previous adjacent moment in the first test, and therefore, the first moment is not analyzed, that is, the maximum temperature change value at the first moment in the first test is not obtained.

[0056] Preferably, in a method that can be implemented in this embodiment, the method for obtaining the current of the second test is: if the temperature rise on the surface of the reactor changes slowly during the first test, that is, the smaller the maximum temperature change amplitude of the first test, it means that the reactor has a stronger tolerance to the preset current during the first test, which indirectly indicates that the difference between the preset current and the limiting current that the reactor can withstand is greater. In order to detect the quality performance of the reactor more quickly, the amplitude of the current increase in the second test should be greater. Therefore, the result of the negative correlation of the maximum temperature change amplitude of the first test is used as the first result; the larger the first result, the larger the amplitude of the current increase in the second test should be. In order to more accurately obtain the current of the second test, this embodiment sets a preset control parameter to further limit the first result, that is, the product of the first result and the preset control parameter is used as the control weight; the larger the control weight, the more accurately the current increase amplitude of the second test is greater. In this embodiment, the preset control parameter is set to 0.6, and the implementer can set the size of the preset control parameter according to actual conditions, which is not limited here. It is known that the current of the second test is increased on the basis of the preset current. Therefore, the current of the second test is obtained according to the adjustment weight and the preset current; wherein the adjustment weight and the preset current are both positively correlated with the current of the second test.

[0057] Among them, the calculation formula for obtaining the current of the second test is: ; In the formula, is the current of the second test; is the first preset constant; To preset the control parameter, this embodiment is set to 0.6; is the second preset constant; This is the first test of the maximum temperature change range; is the preset current; is the first result; To regulate the weight.

[0058] This embodiment will and All are set to 1. The implementer can set it according to the actual situation. and The size is not limited here.

[0059] It should be noted that before conducting a second test on the reactor, the data control module needs to set the current and voltage applied to the reactor to 0 after the first test is completed; at the same time, in order to avoid the difference in the initial temperature of the reactor during a single test affecting the accuracy of the subsequent test results, the data control module starts the first cooling fan and the second cooling fan to jointly continuously dissipate heat from the surface of the reactor, and the infrared thermal imager continuously monitors the temperature of the reactor surface. When the maximum temperature of the reactor surface is equal to the maximum temperature at the first moment of the first test, the data control module controls the first cooling fan and the second cooling fan to stop cooling.

[0060] Then the data control module will test the current of the second test The voltage of 5V is applied to the reactor, so that the reactor starts the second test. The infrared thermal image at each moment in the second test is obtained by the infrared thermal imager, and the maximum temperature change amplitude of the second test is obtained according to the method of obtaining the maximum temperature change amplitude of the first test. Then, according to the method of obtaining the current of the second test, the current of the third test is obtained through the current of the second test and the maximum temperature change amplitude of the second test, and so on, until the preset condition is reached and the reactor quality test device stops testing the reactor.

[0061] Preferably, in one possible implementation of this embodiment, the method for obtaining the preset condition can be found in Figure 3 , which shows a flow chart of a method for obtaining a preset condition provided in this embodiment, the method comprising the following steps:

[0062] Step S201: the sliding window slides from front to back in the current sequence, and obtains the difference between the maximum current and the minimum current in the area where the sliding window is located as the change degree value.

[0063] In order to analyze the change of current as the number of tests increases, this embodiment sets a sliding window of size 3 to slide from front to back in the current sequence, and sets the sliding step to 1. The implementer can set the size of the sliding window and the size of the sliding step according to the actual situation, which is not limited here. The difference between the maximum current and the minimum current in the area where the sliding window is located is obtained as the degree of change value. When the degree of change value is larger, it means that the reactor has a better ability to withstand the applied current in the corresponding test stage; when the degree of change value is smaller, it means that the current applied in the corresponding test stage is getting closer and closer to the limit current that the reactor can withstand.

[0064] Step S202: normalize the difference between the maximum change degree value and the change degree value of the area where the sliding window is last located, and use the result as the stop judgment value.

[0065] As the test sequence increases, the current tends to the limit current that the reactor can withstand. The further the sliding window is, the smaller the change degree value of the area where the sliding window is located. Therefore, when the change degree value of the last area where the sliding window is located is smaller, it means that the current applied to the reactor at this time may be the limit current that the reactor can withstand. In addition, this embodiment normalizes the difference between the maximum change degree value and the change degree value of the last area where the sliding window is located as the stop judgment value. The larger the stop judgment value, the smaller the change degree value of the last area where the sliding window is located, and the greater the possibility of stopping the test of the reactor.

[0066] It should be noted that, in this embodiment, it is determined whether the test of the reactor is stopped only after the reactor is tested at least four times.

[0067] Step S203: When the stop judgment value satisfies the preset stop range, the test on the reactor is stopped.

[0068] It is known that the larger the stop judgment value is, the more the test of the reactor should be stopped. Therefore, this embodiment sets the preset stop judgment value threshold to 0.73. The implementer can set the size of the preset stop judgment value threshold according to the actual situation, which is not limited here. When the stop judgment value is less than the preset stop judgment value threshold, the data control module continues to test the reactor; when the stop judgment value is greater than or equal to the preset stop judgment value threshold, the test of the reactor is stopped to avoid the subsequent application of current causing damage to the reactor. At this point, it is determined when the test of the reactor is stopped.

[0069] Step S3: obtaining the final quality inspection result of the reactor according to the current of the last test, the maximum temperature variation amplitude of the last test and the temperature fluctuation in the infrared thermal image at the end time of the last test.

[0070] It is known that the current of the last test is closest to the limit current that the reactor can withstand. Therefore, this embodiment analyzes the quality of the reactor based on the relevant data of the last test. When the current of the last test is larger, it means that the current that the reactor can withstand is larger, reflecting that the quality of the reactor is better; when the maximum temperature change amplitude of the last test is smaller, it means that the current that can be applied to the reactor is larger, which indirectly indicates that the quality of the reactor is better; when the temperature distribution in the infrared thermal image at the end of the last test is more similar, it means that the surface temperature rise of the reactor is more uniform, which indirectly indicates that the overall manufacturing process and materials of the reactor are better, and then it can be reflected that the stability of the reactor is better. Therefore, this embodiment obtains the final quality detection result of the reactor based on the current of the last test, the maximum temperature change amplitude of the last test, and the temperature fluctuation in the infrared thermal image at the end of the last test. The larger the final quality detection result, the greater the quality of the reactor.

[0071] Preferably, in one possible implementation of this embodiment, the method for obtaining the final quality test result is as follows: Figure 4 , which shows a flow chart of a method for obtaining a final quality inspection result provided in this embodiment, the method comprising the following steps:

[0072] Step S301: Obtain the stability value of the reactor according to the temperature fluctuation in the infrared thermal image at the end time of the last test.

[0073] In order to accurately indicate the stability of the reactor, this embodiment obtains the stability value of the reactor according to the temperature fluctuation in the infrared thermal image at the end time of the last test.

[0074] In one possible implementation of the present embodiment, the method for obtaining the stability value is: taking the average of the absolute values ​​of the differences between all temperatures and the highest temperature in the infrared thermal image at the time of the last test termination as the difference value; the larger the difference value, the more uneven the temperature distribution in the infrared thermal image at the time of the last test termination, which indirectly indicates that the material distribution of the reactor is more uneven, which can reflect that the stability of the reactor is worse. Then, based on the difference value, the stability value of the reactor is obtained; wherein the difference value is negatively correlated with the stability value. Therefore, the calculation formula for the final quality inspection result is: ;W is the stability value;Y is the difference value; is the third preset constant.

[0075] This embodiment will Set to 1 to avoid the denominator being 0. Implementers can set it according to actual conditions. The size is not limited here.

[0076] Step S302: Obtain the final quality inspection result of the reactor according to the current of the last test, the maximum temperature change amplitude of the last test and the stability value; wherein the current and stability value of the last test are positively correlated with the final quality inspection result; and the maximum temperature change amplitude of the last test is negatively correlated with the final quality inspection result.

[0077] Among them, the calculation formula for the final quality test result is: ; Where G is the final quality inspection result; is the current of the last test; is the maximum temperature variation amplitude of the last test; W is the stability value; norm is the normalization function. Get G, which is not limited here.

[0078] The data control module displays the final quality inspection results obtained through the display screen and touch-screen operation panel, accurately and efficiently informing the staff of the quality of the reactor.

[0079] In summary, the reactor quality testing device of this embodiment includes an infrared thermal imager and a data control module. The infrared thermal imager obtains infrared thermal images at each moment of the reactor test; the data control module obtains the maximum temperature change amplitude of the first test according to the difference in the maximum temperature in the infrared thermal images at adjacent moments; according to the preset current and the maximum temperature change amplitude of the first test, the current of the second test is obtained, and then the current of the third test is obtained, and so on, until the preset conditions are met and stopped; according to the current and temperature of the last test, the final quality detection result of the reactor is obtained. The present invention obtains the current of each test by adaptively obtaining the current, thereby avoiding the situation where the current exceeds the limit current that the reactor can withstand, and at the same time improving the efficiency of detecting the quality of the reactor. Finally, the quality of the reactor is accurately analyzed through the relevant data of the last test.

[0080] It should be noted that the sequence of the above embodiments of the present invention is only for description and does not represent the advantages and disadvantages of the embodiments. The processes depicted in the accompanying drawings do not necessarily require the specific order or continuous order shown to achieve the desired results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0081] The various embodiments in this specification are described in a progressive manner, and the same or similar parts between the various embodiments can be referenced to each other, and each embodiment focuses on the differences from other embodiments.

Claims

1. A method for testing the quality of a reactor, characterized in that: The method comprises the following steps: Obtain infrared thermal images of the reactor at each moment of the first test; wherein the current in the first test is the preset current; According to the difference of the highest temperature in the infrared thermal images between adjacent moments of the first test, the maximum temperature variation range of the first test is obtained; according to the preset current and the maximum temperature variation range of the first test, the current of the second test is obtained; according to the current of the second test and the maximum temperature variation range of the second test, the current of the third test is obtained, and so on, until the preset condition is reached and the process stops; wherein the preset condition is determined according to the degree of change of the current in the sliding window in the current sequence; the current sequence is composed of the current of each test; The final quality inspection result of the reactor is obtained according to the current of the last test, the maximum temperature change amplitude of the last test and the temperature fluctuation in the infrared thermal image at the end time of the last test; The method for obtaining the current of the second test is: The result of negative correlation of the maximum temperature change amplitude of the first test is taken as the first result; The product of the first result and the preset control parameter is used as the control weight; According to the adjustment weight and the preset current, the current of the second test is obtained; wherein the adjustment weight and the preset current are both positively correlated with the current of the second test; The calculation formula for obtaining the current of the second test is: ; In the formula, is the current of the second test; is the first preset constant; To preset control parameters; is the second preset constant; This is the first test of the maximum temperature change range; is the preset current; is the first result; To regulate the weight.

2. A reactor quality testing method according to claim 1, characterized in that: The method for obtaining the maximum temperature variation range of the first test is: For any moment in the first test, the ratio of the maximum temperature in the infrared thermal image at that moment to the maximum temperature in the infrared thermal image at the previous adjacent moment is taken as the maximum temperature change degree value at that moment; The average of the maximum temperature change values ​​at all moments in the first test is obtained and normalized to obtain the maximum temperature change amplitude of the first test.

3. A reactor quality testing method according to claim 1, characterized in that: The method for obtaining the preset conditions is: The sliding window slides from front to back in the current sequence, and obtains the difference between the maximum current and the minimum current in the area where the sliding window is located as the change degree value; The result of normalizing the difference between the maximum change value and the change value of the area where the sliding window is last located is used as the stop judgment value; When the stop judgment value meets the preset stop range, the test on the reactor is stopped.

4. A reactor quality testing method according to claim 1, characterized in that: The method for obtaining the current sequence is: The current of each test is arranged according to the order of the test from the front to the back to obtain the current sequence.

5. A reactor quality testing method according to claim 1, characterized in that: The method for obtaining the final quality test result is: According to the temperature fluctuation in the infrared thermal image at the end of the last test, the stability value of the reactor is obtained; The final quality inspection result of the reactor is obtained based on the current of the last test, the maximum temperature change amplitude and the stability value of the last test; among them, the current and stability value of the last test are positively correlated with the final quality inspection result; the maximum temperature change amplitude of the last test is negatively correlated with the final quality inspection result.

6. A reactor quality testing method as claimed in claim 5, characterized in that: The method for obtaining the stability value is: The average value of the difference between all the temperatures and the highest temperature in the infrared thermal image at the end of the last test is taken as the difference degree value; According to the difference degree value, the stability degree value of the reactor is obtained; wherein the difference degree value and the stability degree value are negatively correlated.

7. A reactor quality testing method as claimed in claim 5, characterized in that: The calculation formula of the final quality test result is: ; Where G is the final quality inspection result; is the current of the last test; is the maximum temperature change amplitude of the last test; W is the stability value; norm is the normalization function.

8. A reactor quality test device, comprising a reactor quality test mechanism, wherein the reactor quality test mechanism comprises a first terminal, a second terminal, a device body, a main power input terminal, a display screen and a touch operation panel, a main switch, an upper cover fixing slot, a temperature isolation rubber pad, a reactor, a first cooling fan, an infrared thermal imager, an upper cover and a second cooling fan, wherein: The reactor quality testing device also includes a data control module, the output end of the infrared thermal imager is connected to the input end of the data control module, and the reactor quality testing device can implement the steps of a reactor quality testing method described in any one of claims 1-7 above.

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