Method and device for testing intelligent protocol of solid state disk

Abstract

In the technical field of solid state disk testing, the invention relates to a solid state disk intelligent protocol testing method and device, and the method comprises the steps: loading a to-be-tested solid state disk on a common testing mainboard through a specific connecting seat, and carrying out the testing interface judgment through a specific interface specification; and configuring a compiling environment by using a preloaded operating system or a sandbox simulation system, generating a test script according to the protocol test request, and finally testing the solid state disk to be tested through CDM performance. According to the invention, intelligent protocol consistency of automatic testing of the solid state disk is realized, solid state disks with various joint types are supported, and the testing efficiency and accuracy are improved.

Description

Technical Field

[0001] The present invention relates to the technical field of solid state hard disk testing, and in particular to a solid state hard disk intelligent protocol testing method and device. Background Art

[0002] In recent years, with the rapid development of solid-state drive (SSD) technology, the storage capacity of SSDs has continued to increase, and the transmission speed has been significantly improved, which has greatly promoted the advancement of computer hardware technology. In order to meet the application requirements of different scenarios, SSDs on the market have presented a variety of interface specifications and communication protocols, such as the common M.2, SATA interfaces, and PCI-E, SATA communication protocols. These diverse interfaces and protocols enable SSDs to be widely compatible among various devices, thereby improving the user experience. However, with the increasing diversity of interfaces and technologies, how to efficiently complete SSD testing for different customer product requirements has become an urgent problem to be solved.

[0003] In response to this challenge, the traditional method is usually to use a dedicated test machine to test a single type of interface specification and communication protocol. Although this method can more accurately obtain the various indicators of the SSD in a single state, it has many limitations and cannot meet the individual product requirements of different customers. If a shared machine is simply used, it is necessary to frequently replace the test equipment fixtures and adjust the test environment. The entire test cycle is long and the work efficiency is low. The specific product requirements of individual customers will cause the SSD testing efficiency to become even lower. In addition, there are some technologies that use an integrated test platform to handle hard drives with different types of interfaces. Although the operation process can be simplified to a certain extent, it is still difficult to support the compatibility and performance evaluation of all common interface specifications and protocols at the same time.

[0004] The problem with the existing technologies is that these testing methods cannot effectively cope with the simultaneous testing requirements of multiple interface specifications and communication protocols, nor can they meet the specific product requirements of individual customers in an efficient manner, resulting in high testing costs and low efficiency. Especially in the R&D stage, frequent switching of test equipment is not only time-consuming but also increases the possibility of errors, which seriously affects the progress of product development. Therefore, there is an urgent need for a new method that can efficiently and accurately perform SSD multi-interface protocol compatibility testing.

[0005] The invention patent application publication number CN113220514A discloses a solid-state hard disk test method, S1, install a preset operating system at a preset position of the tested motherboard according to the software environment configuration request, and be able to configure the compilation environment in the operating system and compile the open source driver and the open source unit test framework; S2, on the basis of the original driver interface of the open source driver, add the test interface required by the solid-state hard disk to be tested, and be able to adaptively add and adjust the test interface according to the configuration of the solid-state hard disk to be tested, so as to comprehensively configure the test interface in the solid-state hard disk test; S3, receive a protocol test request for the solid-state hard disk to be tested, and generate a corresponding test script file according to the protocol test request; S4, test the solid-state hard disk based on the open source unit test framework, the test script file and the open source driver, and adaptively generate the corresponding test method according to the configuration of the solid-state hard disk to be tested, so as to comprehensively perform the protocol test of the solid-state hard disk using open source technology and general PC hardware. In the related art, a software environment configuration request is used as a trigger condition (S1), followed by a test interface addition request (S2), and then a protocol test request for the solid-state drive to be tested (S3). Too many instructions need to be input from the outside, which is not conducive to the intelligent self-operation of the SSD test system.

[0006] Invention patent application publication number CN110427289A discloses a method for automatically testing the impact of SSD power failure on data consistency, including: building an automatic test environment; running an automatic test script in the automatic test environment; writing test data to the SSD; powering off and restarting the SSD; and detecting the consistency of the test data before and after the SSD power failure. This solution is based on the Driver Master automatically testing the impact of SSD power failure on data consistency. By automatically writing test data before the SSD power fails, controlling the SSD to power off and restart, and reading the test data after the restart, the consistency of the data is determined without human intervention, so as to improve the test efficiency of SSD data consistency and reduce the test cost. In the related art, the power failure and restart SSD is used to automatically write test data before the SSD power fails, and control the SSD to power off and restart, and read the test data after the restart to determine the consistency of the data; by comparing the read buffer and the write buffer, the data state change of the unit block is determined to detect the consistency of the test data before and after the SSD power failure. In fact, SSD products mainly contain non-volatile storage. During the SSD reading and writing process, whether the power is cut off and restarted, with the current internal backup power module, plus the data in the cache is transferred to the flash memory for storage to prevent data loss, whether the mapping table is fully rebuilt is no longer a technical issue. Whether the power is cut off accidentally or intentionally will not affect the consistency of the changed data, and the write rate and read rate of the SSD are not consistent, and there is no practical need to cut off the power in the middle to compare the consistency of read and write data.

[0007] Invention patent application publication number CN110427289A discloses a hard disk performance test method, including: a test server performs parallel testing on multiple hard disks to be tested according to a preset test task, wherein the test task includes multiple sub-test tasks; monitors the test progress of each hard disk to be tested, and the test progress is the progress of the sub-test task; when executing a sub-test task, according to the type of a sub-test task, the test progress of a sub-test task and the resource occupancy of the test server, determines the scheduling rules for multiple hard disks to be tested to execute a sub-test task; executes a sub-test task on multiple hard disks to be tested according to the scheduling rules; after all sub-test tasks are completed, obtains the performance test results. In the related art, the general performance of the hard disk is tested, and it is not disclosed how to perform protocol-consistent performance testing on individual protocol test requests corresponding to specific product requirements of different customers. Summary of the invention

[0008] The main purpose of the present invention is to provide a solid-state hard disk intelligent protocol testing method and device. The main improvement is to achieve intelligent protocol consistency for automated testing of solid-state hard disks, support solid-state hard disks of various interface types, and improve testing efficiency and accuracy.

[0009] The main purpose of the present invention is achieved through the following technical solutions: A solid state drive intelligent protocol testing method is proposed, comprising the following steps: Step S1, loading a plurality of solid state drives to be tested on a common test motherboard, a plurality of connection sockets connecting the corresponding solid state drives to be tested to the common test motherboard, an adapter socket for installing the solid state drive to be tested and a card slot for fixing the solid state drive to be tested are provided above each connection socket, and an electrical connector for electrically connecting the adapter socket to an interface slot of a specific interface specification and a plurality of morphological connectors for engaging with interface slots of other interface specifications are formed at the bottom of each connection socket; Step S2, current detecting the solid state drive to be tested to determine the working current of the solid state drive to be tested, judging the communicable test interface based on whether the electrical connector and the form connector are connected or not connected to the solid state drive to be tested, so as to determine the specific interface specification of the shared test motherboard; Step S3, when the specific interface specification meets the setting of the preloaded operating system, determine whether the preloaded open source driver of the preloaded operating system can drive the solid state drive to be tested at a first preset test reading speed; if it can, preferentially configure an out-of-box compilation environment in the preloaded operating system, and compile the preloaded open source driver and the open source unit test framework with a first communication protocol; generate an out-of-box test script in the preloaded operating system according to the protocol test request; Step S4, when the specific interface specification does not conform to the setting of the preloaded operating system and the preloaded open source driver cannot drive the solid state drive to be tested at the first preset test reading speed, the sandbox simulation system in the preloaded operating system is executed, and the in-box compilation environment is configured in the sandbox simulation system, and the corresponding sandbox open source driver and sandbox test framework are selected for compilation with the first communication protocol or the second communication protocol that can communicate; in the sandbox simulation system, an in-box test script is generated according to the protocol test request; Step S5, based on the open source unit test framework, the preloaded open source driver and the out-of-box test script of step S3 or the sandbox test framework, the sandbox open source driver and the in-box test script of step S4, CDM performance tests the solid state drive to be tested.

[0010] By adopting the technical solution of the above method, using the out-of-box test script or the in-box test script obtained from steps S1 to S4, a comprehensive performance test of the solid-state drive to be tested under different operating environments and specific driver conditions is carried out, which meets the specific customer product requirements and can accurately locate performance bottlenecks and optimize interface compatibility. This not only represents the effective verification of the method for enhancing the actual application performance of solid-state drives, but also highlights the technical contribution of the present invention in terms of technological innovation and applicability expansion.

[0011] The present invention can be further configured in a preferred method example as follows: the preloaded operating system is a Linux system, more specifically an Ubuntu operating system; the set interface specification of the preloaded operating system is an M.2-M Key interface type, the preloaded open source driver is an NVMe driver, the first preset test read speed is above 2500 MB / S, and the first communication protocol is a PCI-E protocol; and in the sandbox simulation system, the sandbox open source driver is an AHCI driver, and the second communication protocol is a SATA protocol.

[0012] By adopting the above-mentioned preferred technical features and using the more operator-friendly Ubuntu operating system in the Linux system as a preloaded platform, the compatibility and stability of the high-speed test system can be greatly improved. In this preloaded operating system, the specific interface specification is determined to be the M.2-M Key interface type, the first preset test read speed is set at more than 2500 MB / S, and the NVMe driver is used as a preloaded open source driver, which is in sharp contrast to the AHCI driver in the sandbox simulation system. The NVMe driver can dig deeper into the extreme performance of storage devices due to its high-level protocol performance, especially in terms of large-block data transmission and low latency characteristics, which greatly meets the test scenarios with high requirements for solid-state hard disk performance, without executing the sandbox simulation system, further improving the test effect and making the evaluation standard more rigorous and accurate. In terms of communication protocol, the PCI-E protocol is selected as the first communication protocol, in contrast to the more traditional SATA protocol as the second communication protocol. This combination prioritizes verifying the performance of the SSD in efficient data transmission and communication mechanisms before starting the sandbox simulation system. It does not require additional requests to be received, can intelligently and quickly call the appropriate operating system, self-judge the hardware environment configuration and intelligently select the appropriate software environment configuration, and selects the corresponding sandbox open source driver and sandbox test framework based on specific protocol test requests and corresponding communication protocols to prioritize compiling out-of-box test scripts for high-speed testing, otherwise compile corresponding diverse in-box test scripts.

[0013] The preferred method example of the present invention can be further configured as follows: the connector types of the electrical connector and the morphological connector are selected from one of M.2-M Key, M.2-B&M Key, mSATA, and SATA, and they are not repeated in pairs.

[0014] By adopting the above-mentioned preferred technical features and utilizing the fact that the connector types of the electrical connector and the morphological connector are not repeated in pairs, the connector types of the solid-state hard disk to be tested can be M.2-M Key, M.2-B&M Key, mSATA and SATA, thus ensuring the diversity and compatibility of the connectors. The morphological connector that is not used for electrical transmission can enhance the combination of the connection socket and the common test motherboard, and stabilize the electrical connection between the electrical connector and the specific interface specification interface slot of the common test motherboard. When the solid-state hard disk to be tested is loaded on the connection socket, the preloaded operating system can effectively determine which specific interface specification interface slot of the common test motherboard is connected by the electrical connector of the connection socket.

[0015] The present invention can be further configured in a preferred method example as follows: between step S2 and step S5, it also includes: RDT card opening, RDT high temperature test and MPT card opening, wherein during the MPT card opening process, the protocol test request is pre-stored in the solid state drive to be tested.

[0016] By adopting the above-mentioned preferred technical features, the entire test process integrates multiple technologies, including performance-driven based on open source drivers, dynamic simulation environment configuration, efficient test script generation mechanism, and coherent high-performance solid-state drive CDM performance testing. By directly pre-storing the protocol test request in the solid-state drive to be tested, the pre-processing feature greatly reduces the manual configuration workload in the test phase, further enhancing the test efficiency and the accuracy of the output quality.

[0017] The present invention can be further configured in a preferred method example as follows: after step S5, it also includes: MPT card clearing, which is used to clear the protocol test request and the test parameters of the firmware, and reset or select the optimized use parameters of the firmware.

[0018] By adopting the above-mentioned preferred technical features, the MPT card clearing operation is performed after the test is completed to completely clear the temporary parameters and test traces in the system during the SSD test, and at the same time reset or select the optimized system firmware parameters. This link ensures the independence and accuracy of the test, and ensures that the next production or test operation is carried out with optimized configuration parameters, so as to achieve the improvement of the stability and performance of the final product.

[0019] The present invention can be further configured in a preferred method example as follows: after step S5 and before MPT clearing and opening the card, it also includes: BIT testing and H2 reading and writing.

[0020] By adopting the above-mentioned optimal technical features, using BIT test and H2 read and write, BIT test and H2 read and write check before MPT clearing and opening the card, ensure that the test platform is clean and interference-free, providing a high-quality data verification basis for each test. This complete test solution not only realizes a comprehensive evaluation of the solid-state drive, but also ensures the flexibility and efficiency of the test process, providing a solid guarantee for the stability and compatibility of the product.

[0021] The present invention can be further configured in a preferred method example as follows: the protocol test request includes the protocol test scheme of all test cases, and the judgment identification of the test case is implemented by the gtest assertion method under each test case to develop the corresponding test script file, and the test result can be located and analyzed according to the assertion identification.

[0022] By adopting the above-mentioned preferred technical features and using GTest assertion technology, precise control and effect verification of each test case can be achieved, ensuring the accuracy of the test results and the traceability of the test process. The preferred method of the present invention simplifies a large number of code writing, compatibility verification and performance evaluation processes in existing projects, significantly improves test efficiency and data accuracy, reduces cost investment, and provides strong support for the rapid development and technological upgrading of the solid-state drive industry. In addition, the powerful customization and expansion capabilities enable the test method to adapt to the diverse needs of future solid-state drive technology, ensuring the continuous provision of high-quality test reports and performance optimization suggestions in a rapidly changing market environment.

[0023] In the preferred method example, the present invention can be further configured as follows: when the test result is lower than the warning value, product downgrade verification is performed, and the first preset test reading speed is replaced by a second preset test reading speed lower than the first preset test reading speed, and steps S3 to S5 are re-run. When the test result is lower than the warning value, product downgrade verification is performed, and the first preset test reading speed is replaced by a second preset test reading speed lower than the first preset test reading speed, and steps S3 to S5 are re-run, and the re-run protocol test request is lower than the protocol test request before the re-run.

[0024] By adopting the above-mentioned preferred technical features, if it is found during the test that the performance indicators do not reach the preset warning values, it indicates that there is a quality risk. By adjusting the test strategy and retesting at the second lowest rate (the second preset test reading speed), the comprehensiveness and accuracy of the test are guaranteed, and the performance shortcomings of the solid-state drive are accurately identified and optimized. This strategy is flexible to adjust, does not require the replacement of the carrier, strikes a balance between problem discovery and rapid response, effectively improves the product optimization cycle, and ensures high standards of product quality. It can complement the advantages of other test solutions and adopt efficient dynamic strategy adjustments when problems arise. This solid-state drive test method shows significant technical effects in the evaluation and optimization of compatibility between operating systems and interfaces, and provides strong technical support for the hardware product planning, design, production and quality control of solid-state drives.

[0025] The second main purpose of the present invention is achieved through the following technical solutions: A solid state drive intelligent protocol test device is proposed, which is mainly used to implement a solid state drive intelligent protocol test method as described above. The test device includes: A common test motherboard has a plurality of slot groups, each of which has a plurality of interface slots corresponding to a plurality of interface specifications; A plurality of connection seats are correspondingly arranged on the slot group, an adapter seat for installing the solid-state hard disk to be tested and a card slot for fixing the solid-state hard disk to be tested are arranged above each connection seat, and an electric connector for electrically connecting the adapter seat to an interface slot of a specific interface specification and a plurality of morphological connectors for engaging with interface slots of other interface specifications are formed at the bottom of each connection seat; the interface specification of the electric connector can correspond to the interface specification of the adapter seat; The solid state drive intelligent protocol testing device also includes a test interface judgment module under a preloaded operating system, an operating system sandbox simulation module, a compilation environment configuration module, a test script generation module and a test result analysis module.

[0026] By adopting the above-mentioned device technical solution, multiple slot groups of the shared test motherboard are used, each group is provided with multiple interface slots for different interface specifications (such as M.2-M Key, M.2-B&M Key, mSATA, SATA, etc.), and connectors corresponding to various interface specifications, each connector is equipped with an adapter seat and a card slot, so as to realize the simple installation and stable clamping of the solid-state hard disk to be tested, and the connector can be used as an extended base for the upright installation of the solid-state hard disk to be tested; at the same time, through the design of the electrical connector and the form connector, the reliable electrical and physical connection with the specific interface slot of the motherboard is ensured, and an efficient interface matching environment is established.

[0027] The test interface judgment module under the preloaded operating system can quickly identify the physical properties and interface requirements of the SSD, and realize intelligent automatic adaptation and adjustment to match the corresponding environmental test conditions. The operating system sandbox simulation module builds an isolated and independent operating system running environment to ensure the purity and security of the test process and effectively avoid the influence of external environmental interference on the test results. The compilation environment configuration module provides adaptive environment configuration according to the specific requirements of the SSD driver or related software being tested to ensure the high consistency of the test environment with the actual application environment. The test script generation module intelligently generates test scripts that closely match the characteristics of the SSD to be tested, and efficiently realizes comprehensive and detailed functional inspections, covering key test points of data reading and writing, performance benchmarks and stability. The test result analysis module further analyzes the test data, refines key performance indicators, and produces easy-to-understand test reports, providing developers, manufacturers or end users with detailed references to help improve the quality and compatibility of SSDs. Through this device, full coverage from compatibility verification to functional testing is achieved without accepting multiple external requests, which significantly improves the efficiency and accuracy of SSD quality verification.

[0028] The present invention can be further configured as follows in a preferred device example: a plurality of the connecting seats are formed on or fixed to an adapter board; a replaceable circuit board is provided in the connecting seat for changing the connection path of the adapter seat corresponding to the connection to the electrical connector, so as to interchange the position of the electrical connector and one of the morphological connectors; based on the limiting position of the card slot on the solid state drive to be tested, the interface specifications corresponding to the adapter seat and the electrical connector correspond to each other.

[0029] By adopting the technical features of the above-mentioned preferred device, a common test motherboard with a plurality of slot groups is designed, and a connection seat with an electrical connector and a form connector is specially configured at the bottom, and an adapter seat and a card slot are arranged above the connection seat, so as to achieve compatibility of diversified interface specifications, and provide greater possibilities for testing more abundant and diverse peripherals of solid-state hard disks. The diverse interface design can not only test the solid-state hard disks to be tested with different specifications and types of interfaces installed vertically, but also provide the preloaded operating system with priority to determine whether to trigger the sandbox simulation system, which greatly improves the adaptability and practicality of the test device. The test device integrates the test interface judgment module, the operating system sandbox simulation module, the compilation environment configuration module, the test script generation module and the test result analysis module under the preloaded operating system, and provides a comprehensive test process from test script generation, test execution to result analysis. The design of the swappable circuit board built into the connection seat, by changing the circuit connection path of the connection seat, the interface specifications corresponding to the electrical connector may not correspond to the interface specifications corresponding to the adapter seat, further enhancing the adaptability of the solid-state hard disk test device. The design of the universal interface slot and the limit of the card slot on the solid-state hard disk to be tested ensure the safe installation and quick operation of the solid-state hard disk to be tested before the test. Overall, the testing device of the present invention combines high compatibility, efficient testing process and flexibility, greatly improving the testing efficiency and quality of solid-state hard drives, simplifying the testing process, and reducing testing costs. It is particularly suitable for various customer product requirements and diverse interface compatibility testing requirements during the development, verification and quality control stages.

[0030] In summary, the present invention includes at least one of the following technical effects that contribute to the prior art: 1. Provide an intelligent testing method and device for solid-state hard disks that can test multiple interface specifications and communication protocols, improve testing efficiency, and reduce testing costs; 2. Through the design of a shared test motherboard and multiple connectors, it is possible to test solid-state drives with various interface specifications; combined with the sandbox simulation system, it broadens the compatibility range of the tested solid-state drives; 3. By optimizing the test process and introducing designs such as adapter boards, the flexibility and efficiency of the test are improved, the test reprint of the SSD to be tested is reduced, and the test cost of the SSD is reduced; 4. Build a real and comprehensive test environment for SSDs with various interface specifications and sizes to conduct multi-interface and multi-protocol compatibility and performance tests, so as to more accurately evaluate the performance of SSDs under the selected operating system and hardware configuration. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] Figure 1 A schematic diagram of the main steps of a solid state drive intelligent protocol testing method according to an embodiment of the present invention is shown; Figure 2 Draw Figure 1 A partial cross-sectional diagram of a component implementing step S1; Figure 3 Draw Figure 1 A partial plan view of a common test mainboard for implementing step S1; Figure 4 Draw Figure 1 A schematic diagram of a system block for implementing steps S3 and S4; Figure 5 Draw Figure 1 A schematic diagram of a partial cross-section of a component in a variation of the embodiment in which step S1 is implemented.

[0032] Figure numerals: 10, solid-state hard disk to be tested; 11, finished product interface; 20, common test mainboard; 21, slot group; 22, interface slot; 30, connection seat; 31, adapter seat; 32, card slot; 33, electrical connector; 34, morphological connector; 35, replaceable circuit board; 40, adapter board; 50, test interface judgment module; 60, operating system sandbox simulation module; 70, compilation environment configuration module; 80, test script generation module; 90, test result analysis module. DETAILED DESCRIPTION

[0033] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments for understanding the inventive concept of the present invention, and cannot represent all the embodiments, nor are they interpreted as the only embodiments. Based on the embodiments in the present invention, all other embodiments obtained by ordinary technicians in this field on the premise of understanding the inventive concept of the present invention are within the scope of protection of the present invention.

[0034] It should be noted that if there are directional indications (such as up, down, left, right, front, back, etc.) involved in the embodiments of the present invention, the directional indications are only used to explain the relative position relationship and movement of the components in a certain specific posture. If the specific posture changes, the directional indications will also change accordingly. In order to facilitate the understanding of the technical solution of the present invention, the following is a further detailed description and explanation of a solid-state hard disk intelligent protocol testing method and device of the present invention, but it is not limited to the scope of protection of the present invention.

[0035] The drawings only illustrate the common parts of multiple embodiments, and the parts with differences or distinctions are described in text or presented in comparison with the drawings. Therefore, based on the industrial characteristics and technical essence, technicians familiar with the field should correctly and reasonably understand and judge whether the individual technical features described below or any combination of them can represent the same embodiment, or whether multiple technical features with mutually exclusive technical essences can only represent different variant embodiments.

[0036] Reference Figure 1 A solid state drive intelligent protocol testing method disclosed in an embodiment of the present invention includes main steps S1 to S5, wherein main steps S3 and S4 are parallel steps after the judgment, and S1-S5 of the method are described as follows.

[0037] For main step S1, refer to Figure 2 and Figure 3, for the object to be tested loading operation, a number of solid state drives 10 to be tested are loaded on the common test motherboard 20, each solid state drive 10 to be tested has a finished product interface 11, selected from one of the interfaces of M.2-M Key, M.2-B&M Key, mSATA, and SATA, and the finished product interface 11 can also be a USB or TYPE-C interface. A plurality of connection sockets 30 connect the corresponding solid state drives 10 to be tested to the common test motherboard 20, and an adapter socket 31 for installing the solid state drive 10 to be tested and a card slot 32 for fixing the solid state drive 10 to be tested are provided above each connection socket 30. The adapter socket 31 has a connector structure corresponding to the interface type of the finished product interface 11, and the adapter socket 31 of the connection socket 30 is combined with the finished product interface 11 of the solid state drive 10 to be tested. The card slot 32 of the connection socket 30 is used to stabilize the connection of the solid state drive 10 to be tested, usually supporting both sides of the solid state drive 10 to be tested. The bottom of each connection seat 30 is formed with an electric connector 33 electrically connecting the adapter seat 31 to the interface slot of a specific interface specification and a plurality of form connectors 34 engaged with the interface slots of other interface specifications; the electric connector 33 and the form connector 34 together constitute the combined base of the connection seat 30 to better fix it on the common test motherboard 20. The form connector 34 is not electrically connected to the solid state drive 10 to be tested, but only provides a mechanical fixation effect on the common test motherboard 20 and provides a non-empty seat signal to the operating system. The connector types of the electric connector 33 and the form connector 34 are not repeated in pairs, and the interface slot types corresponding to the solid state drive 10 to be tested can be M.2-M Key, M.2-B&M Key, mSATA and SATA connectors, ensuring the diversity and compatibility of the interface. The common test motherboard 20 is a multi-layer printed circuit board or a multi-layer ceramic circuit board, which is used to connect the preloaded operating system.

[0038] For main step S2, refer to Figure 2 and Figure 3, which is the circuit detection operation of the object to be tested, current detection of the solid state hard disk 10 to be tested is performed to determine the working current of the solid state hard disk 10 to be tested, for example, the standard current is 0.11A, the working voltage is 5V or 12V, the qualified range of current detection can be 5%, and it can be reflected when the current exceeds the qualified range; at the same time, based on the connection and non-connection of the solid state hard disk 10 to be tested by the electrical connector 33 and the form connector 34, the communicable test interface is judged to determine the specific interface specification of the common test motherboard 20. That is, the preloaded operating system knows which interface slot 22 of a specific interface specification in the slot group 21 of the common test motherboard 20 is enabled, and the enabled interface slot 22 is combined with the electrical connector 33; the remaining interface slots 22 of the slot group 21 are not enabled, because the remaining interface slots 22 that are not enabled are combined by the form connector 34 of the connection seat 30. Step S2 ensures that the communication between the SSD 10 to be tested and the shared test motherboard 20 is smooth within the specific interface specification, and can further determine which test interfaces (interface slots 22) of the shared test motherboard 20 are valid interfaces for communication. Therefore, step S2 serves as a pre-judgment of the effective performance test in the subsequent step S5.

[0039] For main step S3, please refer to Figure 4, when the test interface judgment module 50 determines that the specific interface specification meets the setting of the preloaded operating system, and judges whether the preloaded open source driver of the preloaded operating system can drive the solid state drive 10 to be tested at the first preset test reading speed. If the preloaded open source driver can normally drive the solid state drive 10 to be tested at the first preset test reading speed, the compilation environment configuration module 70 preferentially configures the out-of-box compilation environment in the preloaded operating system, and compiles the preloaded open source driver and the open source unit test framework with the first communication protocol; the test script generation module 80 generates an out-of-box test script in the preloaded operating system according to the protocol test request. That is, the main step S3 is the setting of the system priority operation. During the test, the preloaded operating system takes precedence over the sandbox simulation system. When the conditions are met, step S3 can be skipped without executing the sandbox simulation system, and step S3 jumps to step S5. In a specific example, the preloaded operating system is a Linux system, more specifically an Ubuntu operating system; the set interface specification of the preloaded operating system is an M.2-M Key interface slot type, the preloaded open source driver is an NVMe driver, and the first preset test read speed is set at more than 2500 MB / S (specifically up to 3000 MB / S), then the first communication protocol is specifically a PCI-E protocol. It can be seen that the solid-state hard disk 10 to be tested that meets the high-speed interface specification and has a fast read speed can be pre-screened, compiled with the preloaded operating system under high priority, and an out-of-box test script is generated according to the protocol test request. Step S3 ensures that the communication between the solid-state hard disk 10 to be tested and the shared test motherboard 20 can communicate with the preloaded operating system in a specific interface specification, so that effective performance testing can be performed in the subsequent step S5. Step S3 serves as a priority system selection and preparation for efficient and effective performance testing in the subsequent step S5.

[0040] For main step S4, refer to Figure 4, when the test interface judgment module 50 determines that the specific interface specification does not meet the setting of the preloaded operating system and the preloaded open source driver cannot drive the solid state drive 10 to be tested at the first preset test reading speed, the operating system sandbox simulation module 60 executes the sandbox simulation system in the preloaded operating system, the compilation environment configuration module 70 configures the in-box compilation environment in the sandbox simulation system, and the test script generation module 80 selects the corresponding sandbox open source driver and sandbox test framework for compilation in the first communication protocol or the second communication protocol that can communicate; the sandbox open source driver of the sandbox simulation system drives the solid state drive 10 to be tested at a reading speed lower than the first preset test reading speed. The set reading speed of the sandbox open source driver is between 500 MB / S and 2000 MB / S. In the sandbox simulation system, an in-box test script is generated according to the protocol test request. The sandbox simulation system (SandBox System) can be a Linux subsystem, a Window subsystem or an Android subsystem, which meets the applicable application and can also avoid fault changes to the preloaded operating system. By using Docker or firejail container technology, combined with appropriate system kernel, management system and simulator, the security and stability of the operating system can be improved by limiting the access of processes or applications to system resources. Step S4 is used as a backup system selection and preparation to expand effective performance testing in the subsequent step S5, which broadens the compatibility range of the solid state drive tested.

[0041] Regarding the main step S5, based on the open source unit test framework, the preloaded open source driver and the out-of-box test script of step S3 or the sandbox test framework, the sandbox open source driver and the in-box test script of step S4, the CDM performance test of the solid-state drive 10 to be tested is used to evaluate the performance of semiconductor devices under specific electrostatic discharge conditions. The full text of CDM is Charged-Device Model Electrostatic Discharge Test. The CDM performance test of the example of the present invention is a customized test method for evaluating the performance of solid-state drives. It works by measuring the data transmission speed of the hard disk under specific conditions. Therefore, the CDM performance test is set according to the product requirements of individual customers, mainly including hard disk formatting and the test speed after formatting. CDM software is usually used for testing. The test capacity can be selected as 1GB or other capacity, or full test and other results are selected to finally obtain the read and write speed, which is used to accurately reflect the performance of the solid-state drive 10 to be tested under various workloads. The core parameters of the CDM test include block size, queue depth and thread for sequential and random tests. Sequential testing involves accessing continuous data and is suitable for evaluating the performance of data hard disks. Random testing is to access data scattered on the disk, which is suitable for evaluating system disks. Larger block size values ​​usually result in higher transmission speeds; queue depth indicates the number of I / O requests processed simultaneously. The greater the depth, the faster the transmission speed; the number of threads is related to the processing power of the CPU. The more threads, the stronger the ability to handle multiple tasks.

[0042] The implementation principle of the method example of the present invention is to use the out-of-box test script or the in-box test script obtained from steps S1 to S4 to perform a comprehensive performance test (step S5) on the solid-state drive 10 to be tested under different operating environments and specific driver conditions, which meets the specific customer product requirements and can accurately locate performance bottlenecks and optimize interface compatibility. This not only represents the effective verification of the method for enhancing the actual application performance of solid-state drives, but also highlights the technical contribution of the present invention in terms of technological innovation and applicability expansion.

[0043] In the preferred method example, in the sandbox simulation system of step S4, the sandbox open source driver is the AHCI driver, and the second communication protocol is the SATA protocol. The Ubuntu operating system, which is more operator-friendly in the Linux system, is used as the preloaded platform, which greatly improves the compatibility and stability of the high-speed test system. In this preloaded operating system, the specific interface specification is determined to be the M.2-M Key interface slot type, and the first preset test read speed is set at more than 2500 MB / S. The NVMe driver is used as the preloaded open source driver, which is in sharp contrast to the AHCI driver in the sandbox simulation system. The NVMe driver can dig deeper into the extreme performance of the storage device due to its high-level protocol performance, especially in terms of large-block data transmission and low latency characteristics. It greatly meets the test scenarios with high requirements for the performance of solid-state hard disks, and does not execute the sandbox simulation system, further improving the test effect, making the evaluation standard more stringent and accurate. In terms of communication protocol, the PCI-E protocol is selected as the first communication protocol, and the more traditional SATA protocol is used as the second communication protocol in contrast. This combination prioritizes verifying the performance of the SSD in efficient data transmission and communication mechanisms before starting the sandbox simulation system. It does not require additional requests to be received, can intelligently and quickly call the appropriate operating system, self-judge the hardware environment configuration and intelligently select the appropriate software environment configuration, and selects the corresponding sandbox open source driver and sandbox test framework based on specific protocol test requests and corresponding communication protocols to prioritize compiling out-of-box test scripts for high-speed testing, otherwise compile corresponding diverse in-box test scripts.

[0044] The out-of-box test script or in-box test script includes the following information: automated test process, performance evaluation, and post-test processing. The information of the automated test process includes the test environment that needs to be started for test preparation, and the setting of the initialization state of the SSD to ensure the consistency and repeatability of the test. The information of the automated test process also includes test execution, in which the test script automatically runs a series of test commands or operations to simulate the operator's various usage scenarios of the SSD. For example, data write, read, and delete operations to evaluate the performance and reliability of the SSD. The information of the automated test process also includes result collection, which collects test results after the test is completed, including performance data (such as read and write speeds), error reports, and records of abnormalities or failures.

[0045] In the preferred method example, between step S2 and step S5, it also includes: RDT card opening, RDT high temperature test and MPT card opening, wherein the protocol test request can be pre-stored in the solid state drive 10 to be tested during the MPT card opening process; in a variation or improvement example, the protocol test request or a new mandatory protocol test request can also be input from the outside into the preloaded operating system or the sandbox simulation system. Multiple technologies can be integrated into the entire test process, including performance-driven based on open source drivers, dynamic simulation environment configuration, efficient test script generation mechanism, and coherent high-performance solid state drive CDM performance testing. By pre-storing the protocol test request directly in the solid state drive 10 to be tested, the preprocessing feature greatly reduces the manual configuration workload in the test phase, further enhancing the test efficiency and the accuracy of the output quality.

[0046] Among them, the RDT card opening should mainly play the role of optimizing the performance of the solid-state hard disk. The full name of RDT for RDT card opening is ReadDrive Tag, which is a special serial identifier used to identify and configure the solid-state hard disk 10 to be tested. A series of tests and configurations are performed on the solid-state hard disk 10 to be tested to ensure that it can work normally. The detailed functions of RDT card opening mainly include: detecting and shielding bad blocks, configuring granular information, generating customized firmware and writing it to the main control ROM, ensuring firmware correctness and stability of firmware verification, and flashing the main control ROM. Flashing the main control ROM is to flash the main control of the solid-state hard disk into the operating system, so it is also feasible to flash the protocol test request into the operating system during the MPT card opening process in the subsequent steps.

[0047] Among them, the RDT high temperature test is used to evaluate the performance of the SSD under harsh conditions, and helps take measures to extend the service life of the SSD. The general example of the RDT high temperature test can be tested under an environment of 80℃±5℃. The detailed functions of the RDT high temperature test include: simulated operation, test durability, and detect temperature-sensitive components. The simulated operation uses a high temperature test to simulate the actual working conditions of the SSD under high load to ensure that the SSD can work stably under extreme conditions. The durability test evaluates the heat dissipation capacity and long-term data retention capacity of the SSD through high temperature testing. The detection of temperature-sensitive components is to allow some components inside the SSD that are more sensitive to temperature to be found early under high temperature testing, and to confirm the performance of these components under thermal stress.

[0048] Among them, MPT card opening improves the stability of the solid-state drive by configuring the main partition table. The full name of MPT for MPT card opening is Master Partition Table. The detailed functions of MPT card opening include: main partition table configuration, logical address mapping, optimization of read and write efficiency, and provision of initialization settings. The main partition table configuration is to configure the main partition table of the solid-state drive to ensure that the file system is correct. Logical address mapping is to confirm that the logical block address (LBA) is mapped to the physical address of the NAND flash memory to ensure data access accuracy. Optimizing read and write efficiency is to reasonably configure the partition table to improve the read and write efficiency and service life of the solid-state drive. Providing initialization settings is to initialize the solid-state drive 10 to be tested during the MPT card opening process, such as capacity settings and cache strategy settings.

[0049] In the preferred method example, after step S5, it also includes: MPT card clearing, which is used to clear the protocol test request and the test parameters of the firmware, and reset or select the optimized use parameters of the firmware. By performing the MPT card clearing operation after the test is completed, the temporary parameters and test traces in the system during the solid-state hard disk test process are completely cleared, and the optimized system firmware parameters are reset or selected. This link ensures the independence and accuracy of the test, and ensures that the next production or test operation is carried out with optimized configuration parameters, so as to achieve the improvement of the stability and performance of the final product. Among them, MPT card clearing is the clearing and reconfiguration of the main partition table of the solid-state hard disk, and may also include comprehensive detection and repair of the solid-state hard disk. The previous card opening operation on the solid-state hard disk can effectively solve the problems of unrecognizable, disk drop, and inability to partition and format, and restore its normal use state. When performing MPT card clearing, the performance and stability of the solid-state hard disk can be repaired and optimized to the maximum extent.

[0050] In the preferred method example, after step S5 of the CDM performance test and before the MPT card is cleared and opened, the following steps are also included: BIT test and H2 read and write. Using BIT test and H2 read and write, BIT test and H2 read and write check before MPT card is cleared and opened ensure that the test platform is clean and interference-free, providing a high-quality data verification basis for each test. This complete test solution not only realizes a comprehensive evaluation of the SSD, but also ensures the flexibility and efficiency of the test process, providing a solid guarantee for the stability and compatibility of the product.

[0051] Among them, the BIT test is used to accelerate the aging process of solid-state drive products, so as to identify and eliminate potential faults and defects. In this example, the solid-state drive product is tested under normal temperature, and a high-temperature BIT test can also be performed. The full name of BIT test is Burn-In Test, which is a method for comprehensively testing solid-state drives (SSDs). Through software tools, high-load read and write operations are performed on solid-state drive products to detect performance and stability under extreme conditions. The functions of the BIT test include bad block detection. Use a bad block detection tool (such as HD Tune Pro) to ensure that the solid-state drive product does not generate bad blocks under continuous writing or / and high-temperature environments. Continuous writing can be specifically set by software to write about 15% of the disk capacity each time, and run at maximum load for 72 hours or other time to simulate the long-term, high-load working state of the solid-state drive. The high-temperature environment can be specifically 100°C and stand for 3 hours. In this example, the high-temperature environment has been implemented in the aforementioned RDT high-temperature test, and the BIT test can be normal temperature and high load.

[0052] Among them, the main function of H2 read and write is to evaluate the performance of SSD under continuous large file operation. The implementation of H2 read and write is the whole disk read and write comparison test. Use H2test software (such as Crystal Disk Mark or AS SSDBenchmark) to do a full disk read and write comparison on the SSD product to check whether the read and write speed is different from the given standard time. Only qualified comparison is considered passed. H2 read and write includes continuous read and write and random read and write, which is used to intuitively reflect the performance of SSD in different usage scenarios.

[0053] Regarding the protocol test request, this is a test request for the performance and quality evaluation of the solid-state drive (SSD), which is used to verify whether the solid-state drive complies with specific communication protocol specifications. The protocol test request can ensure the stability and performance of the solid-state drive in different application environments. Through the execution of the protocol test request, it is verified whether the solid-state drive 10 to be tested can fully comply with the interface specifications such as M.2-M Key, M.2-B&M Key, mSATA and SATA, so as to ensure the compatibility and stability of the solid-state drive 10 to be tested in different systems and application scenarios. The protocol test request includes the requirements for setting up the test environment, the request for test execution and assertion, and the analysis requirements for the test results. The assertion request can use the LeCroy test mode to perform data transmission and signal integrity tests on the solid-state drive 10 to be tested under the DOS protocol. The assertion part includes checking whether there are any protocol violation errors, and the expected result without errors is qualified; or, in the SATA-IO protocol test mode, the test is performed within the jitter tolerance value defined in the SATA-IO specification, and each frequency point is qualified without errors.

[0054] In the preferred method example, the protocol test request includes the protocol test scheme of all test cases, and the judgment mark of the test case is realized by the gtest assertion method under each test case, so as to develop the corresponding test script file, and the test result can be located and analyzed according to the assertion mark. By using the GTest assertion technology, accurate control and effect verification of each test case can be achieved to ensure the accuracy of the test results and the traceability of the test process. The preferred method of the present invention simplifies a large number of code writing, compatibility verification and performance evaluation processes in existing projects, significantly improves test efficiency and data accuracy, reduces cost investment, and provides strong support for the rapid development and technology upgrading of the solid-state drive industry. In addition, the powerful customization and expansion capabilities enable the test method to adapt to the diverse needs of future solid-state drive technology, ensuring the continuous provision of high-quality test reports and performance optimization suggestions in a rapidly changing market environment.

[0055] In a preferred method example, when the test result is lower than the warning value, product downgrade verification is performed, and the first preset test reading speed is replaced by a second preset test reading speed that is lower than the first preset test reading speed, and steps S3 to S5 are re-run. When the test result is lower than the warning value, product downgrade verification is performed, and the first preset test reading speed is replaced by a second preset test reading speed that is lower than the first preset test reading speed, and steps S3 to S5 are re-run, and the re-run protocol test request is lower than the protocol test request before the re-run. If it is found during the test that the performance indicator does not reach the preset warning value, it indicates that there is a quality risk. By adjusting the test strategy, the second lowest (second preset test reading speed) rate is used for re-testing, which not only ensures the comprehensiveness and accuracy of the test, but also ensures the accurate identification and optimization of the performance shortcomings of the solid-state drive. This strategy is flexibly adjusted, does not require the replacement of the carrier, strikes a balance between problem discovery and rapid response, effectively improves the product optimization cycle, and ensures high standards of product quality. This SSD testing method can complement the advantages of other testing solutions and take efficient dynamic strategy adjustments when dealing with problems. It shows remarkable technical effects in the compatibility evaluation and optimization between operating systems and interfaces, and provides strong technical support for the hardware product planning, design, production and quality control of SSDs.

[0056] See also Figure 2 and Figure 3 The embodiment of the present invention also provides a solid state drive intelligent protocol test device, which is mainly used to implement the solid state drive intelligent protocol test method described above. The test device includes: a common test motherboard 20 and a plurality of connection sockets 30. The connection sockets 30 serve as an extended base of the solid state drive 10 to be tested. The solid state drive 10 to be tested can be better combined with the common test motherboard 20. During the test, a plurality of solid state drives 10 to be tested can stand upright on the common test motherboard 20. Figure 4 The solid state drive intelligent protocol testing device also includes a test interface judgment module 50 under a preloaded operating system, an operating system sandbox simulation module 60, a compilation environment configuration module 70, a test script generation module 80 and a test result analysis module 90.

[0057] See also Figure 3 The common test motherboard 20 has a plurality of slot groups 21, each slot group 21 has a plurality of interface slots 22 corresponding to a plurality of interface specifications, and the interface slots 22 of the same group are closely arranged in one area, that is, adjacent slot groups 21 do not overlap. Figure 2 and Figure 3 , a plurality of the connecting seats 30 are correspondingly arranged on the slot group 21, and an adapter seat 31 for installing the solid-state hard disk 10 to be tested and a card slot 32 for fixing the solid-state hard disk 10 to be tested are provided above each connecting seat 30, and an electric connector 33 electrically connecting the adapter seat 31 to an interface slot of a specific interface specification and a plurality of morphological connectors 34 engaged with interface slots of other interface specifications are formed at the bottom of each connecting seat 30; the interface specification of the electric connector 33 can correspond to the interface specification of the adapter seat 31.

[0058] The implementation principle of the device example of the present invention is to share multiple slot groups 21 of the test motherboard 20, each slot group 21 is provided with multiple interface slots 22 for different interface specifications (such as M.2-M Key, M.2-B&M Key, mSATA, SATA, etc.), and a connection seat 30 corresponding to various interface specifications, each connection seat 30 is equipped with an adapter seat 31 and a card slot 32, so as to realize the simple installation and stable clamping of the solid-state hard disk 10 to be tested, and the connection seat 30 can be used as an extended base for the upright installation of the solid-state hard disk 10 to be tested; at the same time, through the design of the electrical connector 33 and the morphological connector 34, the reliable electrical and physical connection with the specific interface slot 22 of the motherboard is ensured, and an efficient interface matching environment is established. Through the solid-state hard disk intelligent protocol test device of the present application, the intelligent protocol consistency of the solid-state hard disk automatic test is realized, and solid-state hard disks of various interface types are supported, the test efficiency and accuracy are improved, and the existing solid-state hard disk test technology is optimized.

[0059] See also Figure 2In a specific example, the connector type of the adapter seat 31 of the connection seat 30 corresponds to the interface type of the finished product interface 11 of the solid state drive 10 to be tested. The main insulating material of the connection seat 30 can be selected from polycarbonate or glass fiber reinforced polyamide to ensure its strength and toughness; the internal conductive material of the connection seat 30 that establishes the circuit connection between the adapter seat 31 and the electrical connector 33 can be selected from copper alloy or stainless steel. The adapter seat 31, the electrical connector 33 and the form connector 34 structurally include an electrical contact sheet and a connecting wire, and the material of the electrical contact sheet is copper or brass. Two or more contacts in the form connector 34 can form a short circuit. Specifically, a short-circuit electrical contact sheet can be provided in the form connector 34. When the form connector 34 is combined with the corresponding interface slot 22 of the common test mainboard 20, the short-circuit electrical contact sheet electrically short-circuits the two contacts in the form connector 34. At this time, a short circuit is formed to feedback a seat signal to the common test mainboard 20. The connection seat 30 is a multi-component structure and can be assembled using screws. The slot 32 of the connector 30 may include an elastic claw and a positioning pin to effectively prevent the shaking of the solid state drive 10 during the test. The elastic claw is made of polyurethane to ensure long-term elasticity; the positioning pin is made of aluminum alloy to stabilize the structure lightly.

[0060] The test interface judgment module 50 under the preloaded operating system can quickly identify the physical properties and interface requirements of the SSD, and realize intelligent automatic adaptation and adjustment to match the corresponding environmental test conditions. The operating system sandbox simulation module 60 builds an isolated and independent operating system running environment to ensure the purity and security of the test process and effectively avoid the influence of external environmental interference on the test results. The compilation environment configuration module 70 provides adaptive environment configuration according to the specific requirements of the SSD driver or related software being tested to ensure the high consistency of the test environment with the actual application environment. The test script generation module 80 intelligently generates a test script that closely matches the characteristics of the SSD 10 to be tested, and efficiently realizes comprehensive and detailed functional inspection, covering key test points of data reading and writing, performance benchmarks and stability. The test result analysis module 90 further analyzes the test data, refines key performance indicators, and produces easy-to-understand test reports, providing developers, manufacturers or end users with detailed references to help improve the quality and compatibility of SSDs. Through this device, full coverage from compatibility verification to functional testing is achieved without the need to accept multiple external requests, which significantly improves the efficiency and accuracy of solid-state drive quality verification.

[0061] See also Figure 5In a variation of the preferred device example, a plurality of the connection seats 30 are formed on or fixed to an adapter board 40; a swap circuit board 35 is provided in the connection seat 30, which is used to change the connection path of the adapter seat 31 corresponding to the connection to the electrical connector 33, so as to interchange the position of the electrical connector 33 and one of the form connectors 34; based on the limit of the card slot 32 on the solid state drive 10 to be tested, the adapter seat 31 corresponds to the interface specification of the electrical connector 33. By using a common test motherboard 20 with a plurality of slot groups 21 and a connection seat 30 specially configured with an electrical connector 33 and a form connector 34 at the bottom, an adapter seat 31 and a card slot 32 are provided above the connection seat 30, so as to achieve compatibility with diversified interface specifications, and provide greater possibilities for testing more abundant and diverse peripherals of the solid state drive. The diverse interface design can not only test the solid state drive 10 to be tested with different specifications and types of interfaces installed vertically, but also provide the preloaded operating system with priority judgment on whether to trigger the sandbox simulation system, which greatly improves the adaptability and practicality of the test device. The test device integrates the test interface judgment module 50 under the preloaded operating system, the operating system sandbox simulation module 60, the compilation environment configuration module 70, the test script generation module 80 and the test result analysis module 90, and provides a comprehensive test process from test script generation, test execution to result analysis. The design of the swappable circuit board 35 built into the connection seat 30 can change the circuit connection path of the connection seat 30, so that the interface specifications of the electrical connector 33 may not correspond to the interface specifications of the adapter seat 31, further enhancing the adaptability of the solid-state hard disk test device. The design of the universal interface slot 22 and the limit of the card slot 32 on the solid-state hard disk 10 to be tested ensure that the installation of the solid-state hard disk 10 to be tested is safe and the operation is fast before the test. Overall, the test device of the present invention integrates high compatibility, efficient test process and flexibility, greatly improves the test efficiency and quality of the solid-state hard disk, simplifies the test process, and reduces the test cost. It is particularly suitable for various customer product requirements and various interface compatibility test requirements in the development, verification and quality control stages.

[0062] The embodiments of this specific implementation method are all preferred embodiments for facilitating the understanding or implementation of the technical solutions of the present invention, and are not intended to limit the protection scope of the present invention. All equivalent changes made based on the structure, shape, and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A solid state drive intelligent protocol testing method, characterized in that: include: S1. Load several solid-state hard disks to be tested on a common test motherboard, connect the corresponding solid-state hard disks to be tested to the common test motherboard with a plurality of connection sockets, and provide an adapter socket for installing the solid-state hard disk to be tested and a card slot for fixing the solid-state hard disk to be tested above each connection socket, and form an electrical connector for electrically connecting the adapter socket to an interface slot of a specific interface specification and a plurality of morphological connectors for engaging with interface slots of other interface specifications at the bottom of each connection socket; S2, current detection of the solid state drive to be tested to determine the working current of the solid state drive to be tested, and judging the communicable test interface based on whether the electrical connector and the form connector are connected to the solid state drive to be tested, so as to determine the specific interface specification of the shared test motherboard; S3, when the specific interface specification meets the setting of the preloaded operating system, determining whether the preloaded open source driver of the preloaded operating system can drive the solid state drive to be tested at a first preset test reading speed; If possible, preferentially configuring an off-box compilation environment in the preloaded operating system to compile the preloaded open source driver and the open source unit test framework using the first communication protocol; generating an out-of-box test script in the preloaded operating system according to the protocol test request; S4, when the specific interface specification does not conform to the setting of the preloaded operating system and the preloaded open source driver cannot drive the solid state drive to be tested at the first preset test reading speed, the sandbox simulation system in the preloaded operating system is executed, and the in-box compilation environment is configured in the sandbox simulation system, and the corresponding sandbox open source driver and sandbox test framework are selected for compilation using the communicative first communication protocol or the second communication protocol; In the sandbox simulation system, generating an in-box test script according to the protocol test request; S5. Based on the open source unit testing framework, the preloaded open source driver and the out-of-box testing script of step S3 or the sandbox testing framework, the sandbox open source driver and the in-box testing script of step S4, CDM performance tests the solid state drive to be tested.

2. The solid state drive intelligent protocol testing method according to claim 1, characterized in that: The preloaded operating system is a Linux system, more specifically an Ubuntu operating system; the set interface specification of the preloaded operating system is an M.2-MKey interface type, the preloaded open source driver is an NVMe driver, the first preset test read speed is above 2500 MB / S, and the first communication protocol is a PCI-E protocol; and in the sandbox simulation system, the sandbox open source driver is an AHCI driver, and the second communication protocol is a SATA protocol.

3. The solid state drive intelligent protocol testing method according to claim 1, characterized in that: The connector types of the electrical connector and the form connector are selected from one of M.2-M Key, M.2-B&M Key, mSATA, and SATA, and are not repeated in pairs.

4. The solid state drive intelligent protocol testing method according to claim 1, characterized in that: The steps between step S2 and step S5 also include: RDT card opening, RDT high temperature test and MPT card opening, wherein the protocol test request is pre-stored in the solid state drive to be tested during the MPT card opening process.

5. The solid state drive intelligent protocol testing method according to claim 4, characterized in that: After step S5, the method further includes: MPT card clearing and opening, which is used to clear the protocol test request and the test parameters of the firmware, and reset or select the optimized use parameters of the firmware.

6. The solid state drive intelligent protocol testing method according to claim 5, characterized in that: After step S5 and before MPT clearing and opening the card, the following steps are also included: BIT test and H2 reading and writing.

7. The solid state drive intelligent protocol testing method according to any one of claims 1 to 6, characterized in that: The protocol test request includes the protocol test schemes for all test cases. Under each test case, the judgment identification of the test case is implemented by gtest assertion to facilitate the development of the corresponding test script file, and the test results can be located and analyzed according to the assertion identification.

8. The solid state drive intelligent protocol testing method according to claim 7, characterized in that: When the test result is lower than the warning value, a product downgrade verification is performed, and steps S3 to S5 are re-run by replacing the first preset test reading speed with a second preset test reading speed that is lower than the first preset test reading speed. The re-run protocol test request is lower than the protocol test request before the re-run.

9. A solid state hard disk intelligent protocol testing device, characterized in that: include: A common test motherboard has a plurality of slot groups, each of which has a plurality of interface slots corresponding to a plurality of interface specifications; A plurality of connection seats are correspondingly arranged on the slot group, an adapter seat for installing the solid-state hard disk to be tested and a card slot for fixing the solid-state hard disk to be tested are arranged above each connection seat, and an electrical connector for electrically connecting the adapter seat to an interface slot of a specific interface specification and a plurality of morphological connectors for engaging with interface slots of other interface specifications are formed at the bottom of each connection seat; The solid state drive intelligent protocol testing device also includes a test interface judgment module under a preloaded operating system, an operating system sandbox simulation module, a compilation environment configuration module, a test script generation module and a test result analysis module.

10. The solid state drive intelligent protocol testing device according to claim 9, characterized in that: A plurality of the connecting seats are formed on or fixed to an adapter board; a replaceable circuit board is arranged in the connecting seat, which is used to change the connection path of the adapter seat corresponding to the connection to the electrical connector, so as to interchange the position of the electrical connector and one of the morphological connectors; based on the limiting position of the card slot on the solid state drive to be tested, the interface specifications corresponding to the adapter seat and the electrical connector correspond to each other.

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