Method and device for measuring lap impedance and computer readable storage medium

Abstract

The invention discloses a lap impedance measurement method and device and a computer readable storage medium, and the method comprises the steps: obtaining the target brightness of a target sub-pixel after the target sub-pixel is lightened through a target voltage parameter; and determining the overlap impedance of the target sub-pixel according to the target voltage parameter and the target brightness. The measurement method provided by the invention can simply and accurately measure the overlap resistance of the sub-pixels.

Description

Technical Field

[0001] The present application relates to the field of display technology, and in particular to a method for measuring overlap impedance, a measuring device and a computer-readable storage medium. Background Art

[0002] With the development and popularization of display technology in recent years, display panels have been applied to various electronic devices, such as mobile phones, tablet computers or other portable electronic devices.

[0003] The inventor of the present application has found that currently, when measuring the parameters of a display panel, the steps are complicated and the operation is difficult. Summary of the invention

[0004] The present application provides a method for measuring a lap impedance, a measuring device, and a computer-readable storage medium, which can simply and accurately measure the lap resistance of a sub-pixel.

[0005] A first aspect of an embodiment of the present application provides a method for measuring a lap impedance, the method comprising: obtaining a target brightness of the target sub-pixel after lighting a target sub-pixel using a target voltage parameter; and determining the lap impedance of the target sub-pixel based on the target voltage parameter and the target brightness.

[0006] In one embodiment, the step of determining the lap impedance of the target sub-pixel based on the target voltage parameter and the target brightness includes: determining a target lap impedance that matches the target brightness based on a pre-saved first target relationship, wherein the first target relationship is a correspondence between the brightness value of the sub-pixel and the lap impedance of the sub-pixel after the sub-pixel is illuminated using the target voltage parameter; and determining the target lap impedance as the lap impedance of the target sub-pixel.

[0007] In one embodiment, the step of determining a target overlap impedance that matches the target brightness based on a pre-saved first target relationship includes: determining whether the target brightness exists in the first target relationship; if the target brightness exists, determining the target overlap impedance based on the overlap impedance corresponding to the target brightness in the first target relationship; if the target brightness does not exist, searching for a first overlap impedance corresponding to the first brightness and a second overlap impedance corresponding to the second brightness in the first target relationship, and determining the target overlap impedance that matches the target brightness based on the first overlap impedance and the second overlap impedance, wherein the first brightness is less than the target brightness, the second brightness is greater than the target brightness, and in the second target relationship, the first brightness and the second brightness are both set adjacent to the target brightness.

[0008] In one embodiment, the method further includes: lighting up a plurality of test sub-pixels with the target voltage parameters in advance, and measuring the brightness of each of the test sub-pixels, wherein the plurality of test sub-pixels include a plurality of normal sub-pixels and a plurality of dark sub-pixels; measuring the lap impedance of each of the test sub-pixels; and saving the brightness and lap impedance of each of the test sub-pixels correspondingly to obtain the first target relationship.

[0009] In one embodiment, before measuring the lap impedance of each of the test sub-pixels, it also includes: for each of the test sub-pixels, cutting off the isolation structure corresponding to the test sub-pixel and the isolation structures corresponding to other sub-pixels, wherein the isolation structure corresponding to the test sub-pixel is electrically connected to the electrode in the test sub-pixel.

[0010] In one embodiment, the step of measuring the lap impedance of each of the test sub-pixels includes: for each of the test sub-pixels, contacting a first probe of a measuring device with an isolation structure corresponding to the test sub-pixel, and contacting a second probe of the measuring device with an electrode electrically connecting the test sub-pixel and the isolation structure, to obtain the lap impedance of the test sub-pixel.

[0011] In one embodiment, before determining the target overlap impedance matching the target brightness according to the pre-saved first target relationship, it also includes: obtaining the target color of the light emitted by the target sub-pixel; in at least one pre-saved first correspondence relationship, determining the first correspondence corresponding to the target color as the first target relationship; wherein different first correspondence relationships correspond to different colors, and the first correspondence corresponding to the target color is the correspondence between the brightness value and the overlap impedance of the sub-pixel with the same light-emitting color as the target color after being illuminated using the target voltage parameters.

[0012] In one implementation, the at least one first corresponding relationship includes the first corresponding relationship corresponding to red, the first corresponding relationship corresponding to blue, and the first corresponding relationship corresponding to green.

[0013] In one embodiment, the step of obtaining the target brightness of the target sub-pixel after lighting the target sub-pixel using the target voltage parameter includes: obtaining the target grayscale of the target sub-pixel after lighting the target sub-pixel using the target voltage parameter; and obtaining the target brightness based on the target grayscale.

[0014] In one embodiment, the step of acquiring the target grayscale of the target sub-pixel includes: photographing the target sub-pixel to obtain a target image; and determining the target grayscale of the target sub-pixel according to the target image.

[0015] In one embodiment, the target image comprises an OM image.

[0016] In one embodiment, the step of obtaining the target brightness based on the target grayscale includes: searching for the brightness corresponding to the target grayscale in a pre-saved second target relationship, wherein the second target relationship is the correspondence between the grayscale and brightness of the sub-pixel; and determining the found brightness as the target brightness of the target sub-pixel.

[0017] In one embodiment, the method further includes: lighting up test sub-pixels in sequence with different data voltages in advance, wherein the test sub-pixels are normal sub-pixels; obtaining the grayscale value and brightness value of the test sub-pixel after the test sub-pixel is lit each time; determining a fitting curve based on the grayscale value and brightness value of the test sub-pixel after each lighting, and saving the fitting curve as the second target relationship.

[0018] In one embodiment, the step of sequentially lighting up the test sub-pixels with different data voltages in advance includes: sequentially lighting up the test sub-pixels with 256 data voltages in advance.

[0019] In one embodiment, the step of acquiring the grayscale of the test sub-pixel includes: photographing the test sub-pixel to obtain a first image; and determining the grayscale of the test sub-pixel according to the first image.

[0020] In one embodiment, the first image comprises an OM image.

[0021] In one embodiment, the step of obtaining the brightness of the test sub-pixel includes: measuring the spectrum of the test sub-pixel using a micro-spectrometer, and determining the brightness of the test sub-pixel based on the spectrum.

[0022] In one embodiment, before searching for the brightness corresponding to the target grayscale in the pre-saved second target relationship, it also includes: obtaining the target color of the target sub-pixel light; in at least one pre-saved second correspondence relationship, determining the second correspondence corresponding to the target color as the second target relationship; wherein different second correspondence relationships correspond to different colors, and the second correspondence corresponding to the target color is a correspondence between the grayscale and brightness of sub-pixels whose light-emitting color is the same as the target color.

[0023] In one implementation, the at least one second corresponding relationship includes the second corresponding relationship corresponding to red, the second corresponding relationship corresponding to blue, and the second corresponding relationship corresponding to green.

[0024] A second aspect of an embodiment of the present application provides a measuring device, which includes a processor, a memory, and a communication circuit. The processor is coupled to the memory and the communication circuit, respectively. Program data is stored in the memory. The processor implements the steps in the above method by executing the program data in the memory.

[0025] A third aspect of an embodiment of the present application provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and the computer program can be executed by a processor to implement the steps in the above method.

[0026] The beneficial effect is: after the target sub-pixel is illuminated by using the target voltage parameter, the target brightness of the target sub-pixel is obtained; and the lap impedance of the target sub-pixel is determined according to the target voltage parameter and the target brightness. This process does not require the aid of external equipment, is simple to operate, and has high accuracy. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the description of the embodiments are briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative work, among which:

[0028] Figure 1 It is a schematic structural diagram of an embodiment of a display panel of the present application;

[0029] Figure 2 It is a flow chart of an implementation method of a method for measuring lap impedance of the present application;

[0030] Figure 3 yes Figure 2 A schematic diagram of the flow chart of step S110 in one embodiment;

[0031] Figure 4 yes Figure 3 A schematic diagram of the flow chart of step S112 in one embodiment;

[0032] Figure 5 is a schematic diagram of a second target relationship in one embodiment of the present application;

[0033] Figure 6 yes Figure 2 A schematic diagram of the process of step S120 in one embodiment;

[0034] Figure 7 is a schematic diagram of a first target relationship in one embodiment of the present application;

[0035] Figure 8It is a structural schematic diagram of an embodiment of the measuring device of the present application;

[0036] Fig. 9 It is a structural schematic diagram of an implementation method of a computer-readable storage medium of the present application. DETAILED DESCRIPTION

[0037] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0038] It should be noted that the terms "first" and "second" in this application are only used for descriptive purposes and cannot be understood as indicating or implying relative importance or implicitly indicating the number of indicated technical features. Thus, the features defined as "first" and "second" can explicitly or implicitly include at least one of the features. In the description of this application, the meaning of "multiple" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined. In addition, the terms "including" and "having" and any of their variations are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device that includes a series of steps or units is not limited to the listed steps or units, but optionally also includes steps or units that are not listed, or optionally also includes other steps or units inherent to these processes, methods, products or devices.

[0039] Before introducing the measurement method of the overlap impedance of this application, Figure 1 , introduce the display panel involved in this application:

[0040] The display panel includes a substrate 110 , a pixel definition layer 120 , sub-pixels 130 and an isolation structure 140 .

[0041] The composition, preparation, etc. of the isolation structure 140 are further described in patent CN118251982A, patent 202410864269.8, patent PCT / CN2024 / 098407, patent PCT / CN2024 / 102783, patent PCT / CN2024 / 098217, patent PCT / CN2024 / 099419, and patent PCT / CN2024 / 099072, the contents of which are incorporated into this application by reference for reference.

[0042] The substrate 110 plays a supporting role in the display panel. The pixel definition layer 120 is arranged on one side of the substrate 110, and the pixel definition layer 120 is provided with a pixel opening. The sub-pixel 130 is arranged in the pixel opening, which includes a first electrode 131, a light-emitting material layer 132 and a second electrode 133 stacked in sequence in a direction away from the substrate 110. Among them, the first electrode 131 is an anode, and the second electrode 133 is a cathode, or the first electrode 131 is a cathode, and the second electrode 133 is an anode. The isolation structure 140 is disposed on the side of the pixel definition layer 120 away from the substrate 110. The isolation structure 140 is provided with an isolation opening. The orthographic projection of the pixel opening on the substrate 110 is located within the orthographic projection of the isolation opening on the substrate 110. At the same time, the isolation structure 140 includes a first end 1401 and a second end 1402. The second end 1402 is located on the side of the first end 1401 away from the substrate 110. The orthographic projection of the first end 1401 on the substrate 110 is located within the orthographic projection of the second end 1402 on the substrate 110. Thus, the isolation structure 140 as a whole is approximately It is wide at the top and narrow at the bottom. Thus, during the preparation process, the functional layers in the sub-pixel 130 (the functional layers include the hole injection layer, the hole transport layer, the electron blocking layer, the light-emitting material layer 132, the hole blocking layer, the electron transport layer, the electron injection layer and other film layers) can be evaporated on the entire surface first. At the edge of the isolation structure 140, due to the step difference, the functional layer of the sub-pixel 130 will be disconnected at the edge of the isolation structure 140, so that the functional layer of the sub-pixel 130 can be partially in the isolation opening. In this way, the preparation of the functional layer does not require precision mask alignment, which can reduce costs.

[0043] Among them, the second electrode 133 in the sub-pixel 130 is overlapped with the isolation structure 140, so that the electrical signal can be transmitted to the second electrode 133 through the isolation structure 140. Among them, the overlap impedance range between the second electrode 133 and the isolation structure 140 is an important parameter. At present, when obtaining this parameter, a large number of needle tests are required each time, which is difficult to operate and inefficient. For this reason, this application proposes a method for measuring overlap impedance, which is used to measure the overlap impedance between the second electrode 133 of the sub-pixel 130 and the isolation structure 140. It should be noted that when the electrode in the sub-pixel 130 is electrically connected to other conductive parts, the measurement method of this application can also be used to measure the overlap impedance range between the two. However, for the sake of convenience, the following is a schematic illustration of measuring the overlap impedance between the second electrode 133 of the sub-pixel 130 and the isolation structure 140.

[0044] See also Figure 2 In one embodiment of the present application, the method for measuring the overlap impedance includes:

[0045] S110: After lighting up the target sub-pixel using the target voltage parameter, obtaining the target brightness of the target sub-pixel.

[0046] Specifically, the target voltage parameter may include only one voltage value, or may include multiple voltage values, for example, a data voltage value, an ELVDD voltage value, and an ELVSS voltage value.

[0047] After the target sub-pixel is lit up using the target voltage parameter, the display brightness of the target sub-pixel is obtained, and the display brightness is defined as the target brightness of the target sub-pixel. The target brightness of the target sub-pixel can be a specific brightness value or a brightness range.

[0048] In one embodiment, a spectrum of a target sub-pixel is measured using a micro-spectrometer, and the spectrum is converted into brightness, thereby obtaining the display brightness of the target sub-pixel.

[0049] In another embodiment, see Figure 3 , step S110 specifically includes:

[0050] S111: After lighting up the target sub-pixel using the target voltage parameter, obtaining a target grayscale of the target sub-pixel.

[0051] Specifically, after the target sub-pixel is lit up by using the target voltage parameter, the display grayscale of the target sub-pixel is acquired, and the display grayscale is defined as the target grayscale of the target sub-pixel.

[0052] The target grayscale of the sub-pixel may be a specific grayscale value, such as grayscale 96 or grayscale 255, or may be a grayscale range, such as grayscale 100 to grayscale 125.

[0053] S112: Obtain target brightness according to the target grayscale.

[0054] Specifically, there is a corresponding relationship between the grayscale and brightness of a sub-pixel, so after the target grayscale of the target sub-pixel is obtained, the target brightness of the target sub-pixel can be determined according to the corresponding relationship.

[0055] In one implementation, step S111 may determine the display grayscale of the target sub-pixel by an image recognition method. Specifically, the process includes:

[0056] S1111: photograph the target sub-pixel to obtain a target image.

[0057] S1112: Determine a target grayscale of a target sub-pixel according to the target image.

[0058] Specifically, after the target image is obtained, the display grayscale of the sub-pixels in the target image, that is, the target grayscale, can be read by software.

[0059] In a specific example, the target image includes an OM image, wherein the OM image refers to an optical microscope (OM) image, that is, the target sub-pixel is photographed using an optical microscope OM to obtain the OM image.

[0060] In one embodiment, see Figure 4 The process of determining the target brightness in step S112 includes:

[0061] S1121: searching for a brightness corresponding to a target grayscale in a pre-saved second target relationship, wherein the second target relationship is a corresponding relationship between a grayscale and brightness of a sub-pixel.

[0062] S1122: Determine the found brightness as the target brightness of the target sub-pixel.

[0063] Specifically, a corresponding relationship between the grayscale and brightness of the sub-pixel (ie, the second target relationship) is pre-established and saved. After obtaining the target grayscale, the brightness corresponding to the target grayscale is searched in the second target relationship, and the brightness is the target brightness of the target sub-pixel.

[0064] Among them, the second target relationship can specifically be a one-to-one correspondence between the grayscale value and the brightness value of the sub-pixel, or a one-to-one correspondence between the grayscale value and the brightness range of the sub-pixel, or a one-to-one correspondence between the grayscale range and the brightness range of the sub-pixel, or even a one-to-one correspondence between the grayscale range and the brightness value of the sub-pixel.

[0065] In one implementation, the second target relationship may be pre-established in the following manner:

[0066] (a1) Lighting up test sub-pixels in sequence with different data voltages in advance, wherein the test sub-pixels are normal sub-pixels.

[0067] Specifically, unlike the dark sub-pixel (the dark sub-pixel cannot be lit or has low brightness after applying normal voltage parameters), the test sub-pixel is a normal sub-pixel, that is, the test sub-pixel emits light normally after applying normal voltage parameters, and the displayed brightness is within the normal brightness range.

[0068] It is understandable that when the test sub-pixels are lit up successively with different data voltages, the brightness and grayscale displayed successively by the test sub-pixels are different.

[0069] (a2) After the test sub-pixel is lit each time, the grayscale value and the brightness value of the test sub-pixel are obtained.

[0070] Specifically, each time the test sub-pixel is lit up, the grayscale value and the brightness value of the test sub-pixel are obtained, and the grayscale value and the brightness value are associated.

[0071] In one embodiment, the grayscale of the sub-pixel can be obtained by an image recognition method, and the specific process can be referred to the above-mentioned related content, which will not be described in detail here. In one embodiment, the brightness of the sub-pixel can be obtained by a micro-spectrometer, and the specific process can be referred to the above-mentioned related content, which will not be described in detail here.

[0072] (a3) Determine a fitting curve according to the grayscale value and the brightness value of the test sub-pixel after each lighting, and save the fitting curve as the second target relationship.

[0073] Specifically, combined Figure 5 , the obtained grayscale value is fitted with the brightness value, so as to obtain a fitting curve of brightness value-grayscale value, and the fitting curve is saved as the second target relationship. In one embodiment, Figure 5 As shown, the brightness value is positively correlated with the grayscale value, that is, the larger the grayscale value, the larger the brightness value.

[0074] In one embodiment, in order to ensure the comprehensiveness of the data in the second target relationship, in step (a1), the test sub-pixel is illuminated successively with 256 data voltages, so that 256 sets of data can be obtained, so that the second target relationship can cover 0-255 grayscales, ensuring that the brightness corresponding to the target grayscale can be found in the second target relationship later.

[0075] In one implementation, in order to improve the accuracy of the algorithm, before step S1121, the following steps are further included:

[0076] S1123: Obtain the target color of the target sub-pixel.

[0077] S1124: Determine, among at least one pre-saved second corresponding relationship, a second corresponding relationship corresponding to the target color as a second target relationship.

[0078] Specifically, multiple second correspondences are pre-saved, and different second correspondences correspond to different colors. For example, three second correspondences are pre-saved, and the three second correspondences correspond to red, green, and blue, respectively. The second correspondence corresponding to red is the correspondence between the grayscale and brightness of the red sub-pixel, the second correspondence corresponding to green is the correspondence between the grayscale and brightness of the green sub-pixel, and the second correspondence corresponding to blue is the correspondence between the grayscale and brightness of the blue sub-pixel.

[0079] When establishing the second relationship corresponding to red, the above steps (a1)-(a3) process can also be adopted, and it is only necessary to set the test sub-pixel in step (a1) to the red sub-pixel. Similarly, when establishing the second relationship corresponding to green, the above steps (a1)-(a3) process can also be adopted, and it is only necessary to set the test sub-pixel in step (a1) to the green sub-pixel. When establishing the second relationship corresponding to blue, the above steps (a1)-(a3) process can also be adopted, and it is only necessary to set the test sub-pixel in step (a1) to the blue sub-pixel.

[0080] When determining the target brightness of the target sub-pixel, the color of the target sub-pixel is first obtained and the color is defined as the target color. Then, among the multiple saved second correspondences, the second correspondence corresponding to the target color is determined as the second target relationship. Then, the target brightness corresponding to the target grayscale of the target sub-pixel is searched in the second target relationship.

[0081] It should be noted that in other embodiments, the number of second corresponding relationships may be only one. In this case, the second corresponding relationship is the second target relationship. During the measurement process, no matter what color the target sub-pixel is, after obtaining the target grayscale of the target sub-pixel, the corresponding target brightness is directly searched without obtaining the luminous color of the target sub-pixel.

[0082] The above describes the process of determining the target brightness of the target sub-pixel. Figure 2 , the steps after step S110 are described below:

[0083] S120: Determine the overlap impedance of the target sub-pixel according to the target voltage parameter and the target brightness value.

[0084] Specifically, the lap impedance between the second electrode 133 of the target sub-pixel and the isolation structure 140 is fixed, and the lap impedance affects the display brightness of the target sub-pixel. Under the same voltage parameters, the larger the lap impedance between the second electrode 133 and the isolation structure 140, the smaller the transmission current, and the lower the display brightness of the target sub-pixel. The smaller the lap impedance between the second electrode 133 and the isolation structure 140, the larger the transmission current, and the greater the display brightness of the target sub-pixel. Therefore, the lap impedance of the target sub-pixel can be determined according to the target voltage parameter and the target brightness.

[0085] In one embodiment, see Figure 6 , step S120 specifically includes:

[0086] S121: determining a target overlap impedance matching the target brightness according to a pre-saved first target relationship, wherein the first target relationship is a corresponding relationship between the brightness of the sub-pixel and the overlap impedance of the sub-pixel after the sub-pixel is illuminated by the target voltage parameter.

[0087] S122: Determine the target overlapping impedance as the overlapping impedance of the target sub-pixel.

[0088] Specifically, the first target relationship shows the corresponding relationship between the brightness of multiple sub-pixels and the overlapping impedance of the sub-pixels after lighting up multiple sub-pixels with the target voltage parameters. Therefore, after obtaining the target brightness, the overlapping impedance that matches the target brightness can be searched in the first target relationship to obtain the target impedance that matches the target brightness, and finally the target impedance is determined as the overlapping impedance of the target sub-pixel.

[0089] Among them, the first target relationship can specifically be a one-to-one correspondence between the brightness value of the sub-pixel and the overlapping impedance value of the sub-pixel after the sub-pixel is illuminated by the target voltage parameter, or a one-to-one correspondence between the brightness value of the sub-pixel and the overlapping impedance range of the sub-pixel after the sub-pixel is illuminated by the target voltage parameter, or a one-to-one correspondence between the brightness range of the sub-pixel and the overlapping impedance value of the sub-pixel after the sub-pixel is illuminated by the target voltage parameter, or even a one-to-one correspondence between the brightness range of the sub-pixel and the overlapping impedance range of the sub-pixel after the sub-pixel is illuminated by the target voltage parameter. It can be set specifically according to actual needs.

[0090] Combination Figure 7 In one embodiment, the construction process of the first target relationship is as follows:

[0091] (b1) lighting up a plurality of test sub-pixels with a target voltage parameter in advance, and measuring the brightness of each test sub-pixel, wherein the plurality of test sub-pixels include a plurality of normal sub-pixels and a plurality of dark sub-pixels.

[0092] In one embodiment, in order to ensure the comprehensiveness of the second target relationship, at least 32 normal sub-pixels are lit and at least 32 dark sub-pixels are lit.

[0093] (b2) Measure the bonding impedance of each test sub-pixel.

[0094] (b3) The brightness and the lap impedance of each test sub-pixel are saved correspondingly to obtain a first target relationship.

[0095] It can be understood that if the brightness value of the sub-pixel is measured in step (b1) and the overlapping impedance value of the sub-pixel is measured in step (b2), the first target relationship finally obtained is the one-to-one correspondence between the brightness value of the sub-pixel and the overlapping impedance value; if the brightness value of the sub-pixel is measured in step (b1) and the overlapping impedance range of the sub-pixel is measured in step (b2), the first target relationship finally obtained is the one-to-one correspondence between the brightness value of the sub-pixel and the overlapping impedance range; if the brightness range of the sub-pixel is measured in step (b1) and the overlapping impedance value of the sub-pixel is measured in step (b2), the first target relationship finally obtained is the one-to-one correspondence between the brightness range of the sub-pixel and the overlapping impedance value; if the brightness range of the sub-pixel is measured in step (b1) and the overlapping impedance range of the sub-pixel is measured in step (b2), the first target relationship finally obtained is the one-to-one correspondence between the brightness range of the sub-pixel and the overlapping impedance range.

[0096] In one embodiment, to ensure the accuracy of measuring the overlap impedance, before measuring the overlap impedance of the test sub-pixel, the isolation structure corresponding to the test sub-pixel and the isolation structures corresponding to other sub-pixels are cut off, and then the overlap impedance of the test sub-pixel is measured.

[0097] Specifically, when measuring the overlap impedance between the second electrode 133 of the test sub-pixel and the isolation structure 140, the isolation structure 140 around the test sub-pixel is disconnected from other isolation structures 140, wherein the isolation structure 140 can be cut off by laser cutting, and then the overlap impedance of the test sub-pixel is measured.

[0098] When measuring the lap impedance of the test sub-pixel, the first probe of the measuring device (such as a TEG needle piercing machine) can be brought into contact with the second electrode 133 of the test sub-pixel, and the second probe can be brought into contact with the isolation structure 140 corresponding to the test sub-pixel, thereby obtaining the lap impedance between the second electrode 133 of the test sub-pixel and the corresponding isolation structure 140.

[0099] In one implementation, step S121 specifically includes:

[0100] S1211: Determine whether there is a target brightness in the first target relationship.

[0101] If it exists, execute step S1212; if it does not exist, execute step S1213.

[0102] S1212: Determine a target overlap impedance according to the overlap impedance corresponding to the target brightness in the first target relationship.

[0103] S1213: In the first target relationship, find a first overlap impedance corresponding to the first brightness and a second overlap impedance corresponding to the second brightness, and determine a target overlap impedance matching the target brightness based on the first overlap impedance and the second overlap impedance, wherein the first brightness is less than the target brightness and the second brightness is greater than the target brightness, and in the second target relationship, the first brightness and the second brightness are both set adjacent to the target brightness.

[0104] Specifically, the target brightness is first searched in the first target relationship. If the target brightness can be directly found, the overlap impedance of the target sub-pixel can be determined according to the overlap impedance corresponding to the target brightness in the first target relationship.

[0105] However, if the target brightness does not exist in the first target relationship, then the two brightnesses closest to the target brightness are found in the first target relationship, and one of the two brightnesses is larger than the target brightness value, and the other is smaller than the target brightness value, wherein the brightness smaller than the target brightness is defined as the first brightness, and the other is defined as the second brightness.

[0106] Then, in the first target relationship, the overlap impedance corresponding to the first brightness is searched, which is defined as the first overlap impedance, and the overlap impedance corresponding to the second brightness is searched, which is defined as the second overlap impedance. Finally, the target impedance range is determined based on the first overlap impedance and the second overlap impedance. For example, the first overlap impedance and the second overlap impedance here are both impedance values, then one of the first overlap impedance and the second overlap impedance is used as the lower limit of the target impedance range, and the other is used as the upper limit of the target impedance range. For another example, the first overlap impedance and the second overlap impedance here are both impedance ranges, then the minimum value covered by the first impedance range and the second overlap impedance can be used as the lower limit of the target impedance range, and the maximum value covered by the first impedance range and the second overlap impedance can be used as the upper limit of the target impedance range.

[0107] In one implementation, in order to improve the accuracy of the algorithm, before step S121, the following steps are further included:

[0108] S123: Obtain the target color of the target sub-pixel.

[0109] S124: Determine, among at least one pre-saved first corresponding relationship, a first corresponding relationship corresponding to the target color as a first target relationship.

[0110] Different first correspondences correspond to different colors, and the first correspondence corresponding to the target color is the correspondence between the brightness and impedance of the sub-pixel having the same luminous color as the target color after being illuminated using the target voltage parameter.

[0111] Specifically, a plurality of first correspondences are pre-stored, and different first correspondences correspond to different colors. For example, three first correspondences are pre-stored, and the three first correspondences correspond to red, green, and blue, respectively. The first correspondence corresponding to red is the correspondence between the brightness and impedance of the red sub-pixel after the red sub-pixel is lit up using the target voltage parameters. The first correspondence corresponding to green is the correspondence between the brightness and impedance of the green sub-pixel after the green sub-pixel is lit up using the target voltage parameters. The first correspondence corresponding to blue is the correspondence between the brightness and impedance of the blue sub-pixel after the blue sub-pixel is lit up using the target voltage parameters. After that, the correspondence between the brightness and impedance of the blue sub-pixel is established. When establishing the second correspondence corresponding to red, the above steps (b1)-(b3) are also used, except that the test sub-pixels in step (b1) are all set to red sub-pixels. Similarly, when establishing the second correspondence corresponding to green, the above steps (b1)-(b3) are used, and the test sub-pixels in step (b1) are all set to green sub-pixels. When establishing the second correspondence corresponding to blue, the above steps (b1)-(b3) are used, and the test sub-pixels in step (b1) are all set to blue sub-pixels.

[0112] When determining the target brightness of the target sub-pixel, the color of the target sub-pixel is first obtained and the color is defined as the target color. Then, among the multiple first corresponding relationships saved, the first corresponding relationship corresponding to the target color is determined as the first target relationship. Then, the target brightness corresponding to the target grayscale of the target sub-pixel is searched in the first target relationship.

[0113] It should be noted that in other implementations, the number of first corresponding relationships may be only one. In this case, the first corresponding relationship is the first target relationship. During the measurement process, no matter what color the target sub-pixel is, after obtaining the target brightness of the target sub-pixel, the corresponding target impedance is directly searched.

[0114] See also Figure 8 , Figure 8 1 is a schematic diagram of the structure of an embodiment of the test device of the present application. The test device 200 includes a processor 210, a memory 220 and a communication circuit 230. The processor 210 is coupled to the memory 220 and the communication circuit 230 respectively. The memory 220 stores program data. The processor 210 implements the steps in any of the above-mentioned implementation methods by executing the program data in the memory 220. The detailed steps can be found in the above-mentioned implementations and will not be repeated here.

[0115] The testing device 200 may be any device with algorithm processing capability, such as a computer or a mobile phone, and is not limited here.

[0116] See also Fig. 9 , Fig. 9 The computer-readable storage medium 400 stores a computer program 410, which can be executed by a processor to implement the steps in any of the above methods.

[0117] Among them, the computer-readable storage medium 400 can specifically be a device that can store the computer program 410, such as a USB flash drive, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk, or it can also be a server that stores the computer program 410. The server can send the stored computer program 410 to other devices for execution, or it can also run the stored computer program 410 by itself.

[0118] The above descriptions are merely embodiments of the present application and are not intended to limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the present application specification and drawings, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present application.

Claims

1. A method for measuring lap impedance, characterized in that: The method comprises: After lighting up the target sub-pixel using the target voltage parameter, obtaining a target brightness of the target sub-pixel; The bridging impedance of the target sub-pixel is determined according to the target voltage parameter and the target brightness.

2. The method according to claim 1, characterized in that The step of determining the bridging impedance of the target sub-pixel according to the target voltage parameter and the target brightness includes: Determining a target overlap impedance that matches the target brightness according to a pre-saved first target relationship, wherein the first target relationship is a corresponding relationship between a brightness value of a sub-pixel and an overlap impedance of the sub-pixel after the sub-pixel is illuminated using the target voltage parameter; Determining the target overlap impedance as the overlap impedance of the target sub-pixel; Preferably, the step of determining a target overlap impedance matching the target brightness according to the pre-saved first target relationship comprises: Determining whether the target brightness exists in the first target relationship; If the target brightness exists, determining the target overlap impedance according to the overlap impedance corresponding to the target brightness in the first target relationship; If the target brightness does not exist, then in the first target relationship, find a first overlap impedance corresponding to the first brightness and a second overlap impedance corresponding to the second brightness, and determine the target overlap impedance that matches the target brightness based on the first overlap impedance and the second overlap impedance, wherein the first brightness is less than the target brightness, and the second brightness is greater than the target brightness, and in the second target relationship, the first brightness and the second brightness are both set adjacent to the target brightness.

3. The method according to claim 2, characterized in that The method further comprises: Preliminarily lighting up a plurality of test sub-pixels with the target voltage parameter, and measuring the brightness of each of the test sub-pixels, wherein the plurality of test sub-pixels include a plurality of normal sub-pixels and a plurality of dark sub-pixels; Measuring the bridging impedance of each of the test sub-pixels; The brightness and the overlap impedance of each of the test sub-pixels are correspondingly saved to obtain the first target relationship; Preferably, before measuring the lap impedance of each of the test sub-pixels, the method further comprises: For each of the test sub-pixels, cutting off the isolation structure corresponding to the test sub-pixel and the isolation structures corresponding to other sub-pixels, wherein the isolation structure corresponding to the test sub-pixel is electrically connected to the electrode in the test sub-pixel; Preferably, the step of measuring the bridging impedance of each of the test sub-pixels comprises: For each of the test sub-pixels, a first probe of a measuring device is brought into contact with an isolation structure corresponding to the test sub-pixel, and a second probe of the measuring device is brought into contact with an electrode electrically connecting the test sub-pixel to the isolation structure, to obtain a lap impedance of the test sub-pixel.

4. The method according to claim 2, characterized in that: Before determining the target overlap impedance matching the target brightness according to the pre-stored first target relationship, the method further includes: Acquire a target color emitted by the target sub-pixel; Among at least one first corresponding relationship stored in advance, determining the first corresponding relationship corresponding to the target color as the first target relationship; Different first corresponding relationships correspond to different colors, and the first corresponding relationship corresponding to the target color is a corresponding relationship between the brightness value and the bridging impedance of a sub-pixel having the same luminous color as the target color after being illuminated using the target voltage parameter; Preferably, the at least one first corresponding relationship includes the first corresponding relationship corresponding to red, the first corresponding relationship corresponding to blue, and the first corresponding relationship corresponding to green.

5. The method according to claim 1, characterized in that The step of obtaining a target brightness of the target sub-pixel after lighting the target sub-pixel using the target voltage parameter comprises: After lighting up the target sub-pixel using the target voltage parameter, acquiring a target grayscale of the target sub-pixel; According to the target grayscale, obtaining the target brightness; Preferably, the step of acquiring the target grayscale of the target sub-pixel includes: photographing the target sub-pixel to obtain a target image; Determining the target grayscale of the target sub-pixel according to the target image; Preferably, the target image comprises an OM image.

6. The method according to claim 5, characterized in that The step of obtaining the target brightness according to the target grayscale comprises: Searching for the brightness corresponding to the target grayscale in a pre-saved second target relationship, wherein the second target relationship is a corresponding relationship between the grayscale and brightness of a sub-pixel; The found brightness is determined as the target brightness of the target sub-pixel.

7. The method according to claim 6, characterized in that The method further comprises: Lighting up test sub-pixels in sequence with different data voltages in advance, wherein the test sub-pixels are normal sub-pixels; After the test sub-pixel is lit each time, obtaining the grayscale value and brightness value of the test sub-pixel; Determine a fitting curve according to the grayscale value and the brightness value of the test sub-pixel after each lighting, and save the fitting curve as the second target relationship; Preferably, the step of lighting up the test sub-pixels in sequence with different data voltages in advance includes: Lighting up the test sub-pixels in sequence with 256 data voltages in advance; Preferably, the step of obtaining the grayscale of the test sub-pixel includes: photographing the test sub-pixel to obtain a first image; determining a grayscale of the test sub-pixel according to the first image; Preferably, the first image comprises an OM image; Preferably, the step of obtaining the brightness of the test sub-pixel comprises: The spectrum of the test sub-pixel is measured by a micro-spectrometer, and the brightness of the test sub-pixel is determined according to the spectrum.

8. The method according to claim 6, characterized in that Before searching for the brightness corresponding to the target grayscale in the pre-saved second target relationship, the method further includes: Acquire a target color emitted by the target sub-pixel; Among at least one second corresponding relationship stored in advance, determining the second corresponding relationship corresponding to the target color as the second target relationship; Different second corresponding relationships correspond to different colors, and the second corresponding relationship corresponding to the target color is a corresponding relationship between grayscale and brightness of sub-pixels with the same luminous color as the target color; Preferably, the at least one second corresponding relationship includes the second corresponding relationship corresponding to red, the second corresponding relationship corresponding to blue, and the second corresponding relationship corresponding to green.

9. A measuring device, characterized in that: The measuring device includes a processor, a memory and a communication circuit, the processor is coupled to the memory and the communication circuit respectively, the memory stores program data, and the processor implements the steps in the method as described in any one of claims 1 to 8 by executing the program data in the memory.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, and the computer program can be executed by a processor to implement the steps in the method according to any one of claims 1 to 8.

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