Driving system and driving method

Abstract

The invention discloses a driving system and a driving method. The driving system comprises a floating digital unit, a voltage source and a driving output selection unit, a floating digital driving unit in the floating digital unit comprises a digital driver and a floating ground, the output end of the digital driver is connected with one end of a driving output selection unit through a change-over switch, and the output end of a voltage source is connected with the floating ground and the other end of the driving output selection unit. The input end of the digital driver and the input end of the voltage source are used for controlling according to test parameters transmitted by the floating digital unit, the output voltage of the voltage source provides a voltage reference for the floating digital driving part and serves as floating grounding, and under the condition of floating grounding, the floating digital driving part is grounded. High-speed digital driving signals are controlled and generated according to test parameters transmitted by the floating digital driving unit, an output path is determined through the driving output selection unit, and finally high-speed driving signals adapting to high voltage or low voltage are formed, so that hardware and system structures are simplified, and power consumption and hardware cost are reduced.

Description

Technical Field

[0001] The present application relates to the technical field of integrated circuit automatic testing, and in particular to a driving system and a driving method. Background Art

[0002] With the rapid development of semiconductor technology, especially in the field of high-voltage devices and automotive semiconductors, the market demand for high-voltage digital interfaces is increasing. This trend has driven the performance requirements for test equipment, especially in the development, production and verification of chips, where high-voltage digital drive functions have become critical.

[0003] In related technologies, many current test equipment still lack high-voltage and high-speed digital driving capabilities, forcing users to build additional circuits on the test load board to meet the testing requirements of high-voltage digital interfaces. This not only increases the complexity and cost of development, but also affects test efficiency and restricts the adaptability of test equipment in high-end chip testing.

[0004] In response to the above problems, how to balance high voltage and high speed while reducing power consumption and hardware costs is an urgent problem to be solved. Summary of the invention

[0005] In view of the above problems, the present application provides a driving system and a driving method to at least solve the problems existing in the related art.

[0006] In a first aspect, an embodiment of the present application provides a drive system, including: A floating digital unit, a voltage source and a drive output selection unit; the floating digital unit comprises a floating digital drive unit; The floating digital drive unit includes a digital driver and a floating ground; The output end of the digital driver is connected to one end of the drive output selection unit via a switching switch, and the output end of the voltage source is respectively connected to the floating ground and the other end of the drive output selection unit; The digital driver input terminal and the voltage source input terminal are used for control according to the test parameter transmitted by the floating digital unit.

[0007] In some embodiments, the floating digital unit further includes: a digital logic unit and an isolation module; The digital logic unit includes a level setting module, a data timing module and a voltage source control module; The level setting module, the isolation module and the digital driver are connected in sequence, one end of the digital driver is connected to the isolation module, and the other end is connected to one end of the drive output selection unit via a switching switch, and after the data timing module is connected to the isolation module, it is respectively connected to the switching switch and the digital driver; The voltage source control module is connected to the voltage source input terminal, and the voltage source output terminal is respectively connected to the floating ground and the other terminal of the drive output selection unit.

[0008] In some embodiments, the digital driver includes a DAC module, a multiplexing module, and an amplification module connected in sequence; The data timing module is connected to the multiplexing module via the isolation module.

[0009] In some embodiments, the digital driver includes a pin driver module and a digital adjustable power module; The data timing module is connected to the pin driving module via the isolation module; The level setting module is connected to the digital adjustable power supply module via the isolation module; The pin driving module is connected to the digital adjustable power supply module and then connected to one side of the switching switch, and the other side of the switching switch is connected to the digital driving output selection switch of the driving output selection unit.

[0010] In some embodiments, the digitally adjustable power module includes a low-speed DAC, a voltage gain module, and a current gain module; The low-speed DAC is connected to the voltage gain module and the current gain module in sequence and then connected to the high level generator of the pin driving module; The low-speed DAC is connected to the voltage gain module and the current gain module in sequence and then connected to the low level generator of the pin driving module.

[0011] In some embodiments, the voltage source is a VI source, the voltage source control module is a VI source control module, the VI source control module is connected to a DAC, the DAC is connected to the VI source input, and the VI source output is respectively connected to the floating ground and the VI output selection switch of the drive output selection unit.

[0012] In some embodiments, the switch is a three-state output switch.

[0013] In a second aspect, applied to the driving system provided in the first aspect, an embodiment of the present application provides a driving method, including: Get the test parameters corresponding to the target test requirements; The test parameters are input into the driving system to determine the floating digital driving signal and / or the voltage source signal output by the driving output selection unit.

[0014] In some embodiments, the driving method further includes: determining an operating mode of the drive system based on the test parameters; The floating digital drive signal and / or the voltage source signal output by the drive output selection unit is controlled based on the test parameter and the working mode.

[0015] In some embodiments, the controlling the floating digital drive signal output by the drive output selection unit based on the test parameter and the working mode includes: Input the test parameters into the digital logic unit in the floating digital unit, so that the DAC module, the multiplexing module and the amplification module in the digital driver generate a high-voltage and high-speed signal, and output the high-voltage and high-speed signal to the switching switch; When it is determined based on the test parameters and the working mode that one end of the drive output selection unit is closed, the high-voltage and high-speed signal is output as a floating digital drive signal.

[0016] In some embodiments, the controlling the floating digital drive signal output by the drive output selection unit based on the test parameter and the working mode further includes: Input the test parameters into the digital logic unit in the floating digital unit, so that the pin driving module and the digital adjustable power supply module in the digital driver switch high and low levels to generate a high-speed digital driving signal, and output the high-speed digital driving signal to the switching switch; When it is determined based on the test parameter and the working mode that one end of the drive output selection unit is closed, the high-speed digital drive signal is output as a floating digital drive signal.

[0017] In some embodiments, the step of controlling the voltage source signal output by the drive output selection unit based on the test parameter and the working mode includes: Inputting the test parameters into the voltage source control module in the floating digital unit, so that the voltage source control module provides a reference voltage as a floating ground for the floating digital drive unit, and outputs the reference voltage to the drive output selection unit; When it is determined based on the test parameter and the working mode that the other end of the drive output selection unit is closed, the reference voltage is output as a voltage source signal.

[0018] In a third aspect, applied to the drive system provided in the first aspect, an embodiment of the present application provides a drive device, including: The acquisition module is used to obtain the test parameters corresponding to the target test requirements; The output module is used to input the test parameters into the drive system to determine the floating digital drive signal and / or the voltage source signal output by the drive output selection unit.

[0019] In a fourth aspect, an embodiment of the present application provides an electronic device, comprising a memory and a processor, wherein the memory stores a program code that can be run on the processor, and when the program code is executed by the processor, the driving method introduced in any implementation manner of the second aspect is implemented.

[0020] In a fifth aspect, an embodiment of the present application provides a computer storage medium, which stores one or more programs, and the one or more programs can be executed by the electronic device introduced in the fourth aspect to implement the driving method introduced in any implementation method of the second aspect.

[0021] A driving system and a driving method provided by an embodiment of the present application, the driving system includes: a floating digital unit, a voltage source and a driving output selection unit; the floating digital unit includes a floating digital driving unit, the floating digital driving unit includes a digital driver and a floating ground, the digital driver output end is connected to one end of the driving output selection unit via a switching switch, the voltage source output end is respectively connected to the floating ground and the other end of the driving output selection unit, the digital driver input end and the voltage source input end are used for controlling according to the test parameters transmitted by the floating digital unit, the output voltage of the voltage source provides a voltage reference for the floating digital driving part, and serves as a floating ground, under the condition of floating ground, a high-speed digital driving signal is generated according to the test parameter control transmitted by the floating digital driving unit, and the output path is determined by the driving output selection unit, and finally a high-speed driving signal adapting to high voltage or low voltage is formed, so as to simplify the hardware and system structure, reduce power consumption and hardware cost. It should be understood that the content described in this section is not intended to identify the key or important features of the embodiments of the present application, nor is it intended to limit the scope of the present application. Other features of the present application will become easily understood through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Hereinafter, the present application will be described in more detail based on embodiments and with reference to the accompanying drawings.

[0023] Figure 1 A simplified structural diagram of a driving system proposed in an embodiment of the present application is shown; Figure 2 A simplified structural diagram of another driving system proposed in an embodiment of the present application is shown; Figure 3 A structural block diagram of a driving system proposed in an embodiment of the present application is shown; Figure 4 A structural block diagram of another driving system proposed in an embodiment of the present application is shown; Figure 5 A schematic diagram of a driving method proposed in an embodiment of the present application is shown; Figure 6 A schematic diagram showing a flow chart of an exemplary driving method proposed in an embodiment of the present application is shown; Figure 7 A structural block diagram of a driving device proposed in an embodiment of the present application is shown; Figure 8 A structural block diagram of an electronic device for executing a driving method according to an embodiment of the present application is shown; Fig. 9 A computer-readable storage medium for storing or carrying a driving method according to an embodiment of the present application is shown. DETAILED DESCRIPTION

[0024] In order to make the objectives, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with embodiments and drawings. The exemplary embodiments of the present invention and their description are only used to explain the present invention and are not intended to limit the present invention.

[0025] With the rapid development of semiconductor technology, especially in the field of high-voltage devices and automotive semiconductors, the market demand for high-voltage digital interfaces is increasing. This trend has driven the performance requirements for test equipment, especially in the development, production and verification of chips, where high-voltage digital drive functions have become critical. Currently, many test equipment still lack high-voltage and high-speed digital drive capabilities, forcing users to build additional circuits on the load board to meet the test requirements of high-voltage digital interfaces. This not only increases the complexity and cost of development, but also affects test efficiency and restricts the adaptability of test equipment in high-end chip testing.

[0026] With the rapid expansion of demand for high-performance chips in emerging industries such as electric vehicles, renewable energy, and IoT devices, the market urgently needs digital drive solutions with high voltage and high speed. These requirements have driven the iterative upgrade of test equipment to enable it to adapt to the increasingly complex chip testing needs, especially the testing of high-voltage digital interfaces.

[0027] In order to meet the testing requirements of mainstream chips on the market, the high-voltage digital drive function in the test equipment needs to have the following key performance indicators: Voltage range: The voltage range of conventional digital drivers is from negative V to positive V or tens of V. High-voltage digital drivers often require negative tens of V to positive tens of V.

[0028] High-voltage chips have a wide operating voltage range, and test equipment needs to support driving capabilities from negative voltage to high positive voltage to ensure compatibility with various chip voltage interfaces.

[0029] Driving current: tens of mA.

[0030] The driving current determines the test equipment's ability to drive the load of the chip under test under high voltage, and must have sufficient current output to ensure efficient and stable signal transmission.

[0031] Slew Rate: Hundreds of V / µs.

[0032] Slew rate is an important parameter for testing whether the equipment can respond quickly to changes in digital signals. Especially in high-speed signal processing, the ability to quickly change voltage is crucial.

[0033] Minimum pulse width: tens of ns.

[0034] The minimum pulse width directly affects the resolution of the test equipment in high-speed digital signal testing, and must support the generation of short pulse signals to ensure effective testing of high-speed chips.

[0035] Maximum swing: tens of Vpp.

[0036] The digital signal swing determines the dynamic range of the signal. A larger swing ensures stable signal transmission in various high-voltage environments, especially in scenarios where high-voltage pulse drive is required.

[0037] Maximum data rate: tens of Mbps.

[0038] Test equipment must support data rates up to tens of Mbps to meet the testing requirements for high-speed digital signals.

[0039] When the test equipment can meet these key performance indicators at the same time, it can effectively cover the test requirements of most high-voltage digital interface chips and improve the efficiency and reliability of the test.

[0040] In the study of related technologies, it was found that traditional solutions have two major bottlenecks in practical applications: one is that they cannot meet the requirements of high voltage and high speed at the same time, and the other is that the complex hardware architecture increases the cost and design difficulty of the system. When testing high-voltage and high-speed digital interface chips, existing solutions either have difficulty reaching the necessary voltage range or are insufficient in high-frequency performance. Although the op amp solution has good driving capabilities in low-voltage scenarios, it performs poorly under high-voltage conditions; and the high-speed driver chip solution cannot be used in high-voltage scenarios due to voltage range limitations.

[0041] After analyzing the above technologies, the applicant found that the problems are as follows: the technologies in the field of high-voltage digital drive need to be able to take into account both high voltage and high speed requirements.

[0042] In response to the above problem, the applicant proposed a driving system and a driving method provided in the embodiments of the present application, which utilize a voltage source to generate a DC bias, and combine the floating grounding technology to superimpose a digital driver on the output of the voltage source, thereby achieving high-speed digital driving capability while outputting high voltage. The driving system and the driving method are described in detail in the subsequent embodiments.

[0043] The following is an introduction to the drive system provided in the embodiment of the present application: See also Figure 1 , Figure 1 A simplified structural schematic diagram of a driving system provided in an embodiment of the present application, the driving system includes: a floating digital unit, a voltage source and a driving output selection unit; the floating digital unit includes a floating digital driving unit, the floating digital driving unit includes a digital driver and a floating ground, the digital driver output end is connected to one end of the driving output selection unit via a switching switch, and the voltage source output end is respectively connected to the floating ground and the other end of the driving output selection unit; the digital driver input end and the voltage source input end are used for control according to the test parameters transmitted by the floating digital unit.

[0044] In this embodiment, the floating digital unit can use a voltage source to generate a high-voltage bias signal, and on this basis, the high-speed digital signal generated by the floating digital unit as a whole is superimposed by floating grounding, thereby achieving a digital driving capability that takes both high voltage and high speed into consideration. In addition, its structure is simpler, reducing hardware costs and power consumption, and solving the limitations of existing traditional op amp solutions and high-speed digital driver chip solutions.

[0045] The floating digital unit also includes: a digital logic unit and an isolation module.

[0046] The digital logic unit includes a level setting module, a data timing module and a voltage source control module; The level setting module, the isolation module and the digital driver are connected in sequence. One end of the digital driver is connected to the isolation module, and the other end is connected to one end of the drive output selection unit through a switching switch. After the data timing module is connected to the isolation module, it is connected to the switching switch and the digital driver respectively; the voltage source control module is connected to the voltage source input end, and the voltage source output end is respectively connected to the floating ground and the other end of the drive output selection unit.

[0047] The isolation module isolates the control signal (level signal and timing signal) from the digital logic unit and converts it into a signal suitable for the floating digital drive unit. The isolated signal is input to the floating digital drive part.

[0048] Among them, the digital logic unit is responsible for configuring the digital drive level, generating a pulse signal, and generating the digital signal required for the driving voltage source, wherein the voltage source may include a VI source, and the driving voltage source control module may include a VI source control module, which includes a digital voltage setting module, a data timing module and a VI source control module, which is used to accurately set the voltage value and the pulse signal.

[0049] It should be noted that the high voltage VI source: as the core component of the tester, is used to generate high voltage signals (-tens of V to +tens of V). It provides the necessary high voltage bias voltage to support test requirements.

[0050] The digital logic unit includes a level setting module, a data timing module and a voltage source control module; the floating digital drive unit includes a digital driver and a floating ground; Level setting module: responsible for setting the level of digital drive, generating corresponding control signals through the digital voltage setting module and inputting them into the isolation module.

[0051] The data timing module generates pulse data and timing signals for controlling the driving signal and inputs them into the isolation module.

[0052] The voltage source control module is used to configure the output voltage of the voltage source to ensure that the requirements of the floating digital drive part are met.

[0053] The digital driver generates a digital driving signal according to the signal transmitted by the isolation module, and the output of the driver is a floating ground reference voltage source.

[0054] A floating ground, connected to the output voltage of a voltage source, enables the floating digital driver to operate with different voltage references.

[0055] Among them, the floating digital drive unit is powered by a separate floating power supply, and the ground of the entire module floats on the output of the VI source. This design enables the unit to have high-speed and high-voltage digital drive capabilities. It can include an isolation module, a multi-channel low-speed DAC module, a high-speed multiplexing module, a voltage and current gain module, and a three-state output switch.

[0056] The level setting module, the isolation module and the digital driver are connected in sequence, one end of the digital driver is connected to the isolation module, and the other end is connected to one end of the drive output selection unit through a switching switch, and the data timing module is connected to the isolation module and then connected to the switching switch; The voltage source control module is connected to the voltage source input terminal, and the voltage source output terminal is respectively connected to the floating ground and the other terminal of the drive output selection unit.

[0057] The voltage source, as a basic power supply module, can be a DC constant voltage source, an AC voltage source, etc., to provide a voltage reference for the floating digital drive unit and a floating ground. This voltage source can be configured according to external requirements, and the output voltage can adapt to specific test requirements.

[0058] The drive output selection unit switches different drive output modes by controlling the selection switch, and can select the output signal of the floating digital driver or the output signal of the voltage source directly.

[0059] In this embodiment, when a high-voltage and high-speed digital signal needs to be output, the digital logic unit configures a voltage source to generate a high-voltage bias voltage. The floating digital drive part is set to the output voltage of the voltage source through the floating ground. According to the test requirements, appropriate VIH / VIL levels are configured, and these levels will swing based on the bias voltage generated by the voltage source, thereby realizing high-voltage and high-speed digital drive. By floating ground and as a power supply, digital signals are generated based on the high-voltage bias of the voltage source, avoiding the problem of incompatibility between traditional high voltage and high speed.

[0060] In some embodiments, the voltage source is a VI source, the voltage source control module is a VI source control module, the VI source control module is connected to a DAC, the DAC is connected to the VI source input terminal, and the VI source output terminal is respectively connected to the floating ground and the VI output selection switch of the driving output selection unit.

[0061] In this embodiment, a voltage source is used to generate a high-voltage bias signal, and on this basis, a high-speed digital signal is superimposed through a floating digital drive module, thereby finally achieving a digital drive capability with both high voltage and high speed.

[0062] In some embodiments, the switch is a three-state output switch.

[0063] See also Figure 2 , Figure 2 A simplified structural schematic diagram of another drive system provided in an embodiment of the present application.

[0064] Taking into account the need to better support high-voltage and high-speed digital drive in order to achieve the drive system.

[0065] In some embodiments, the digital driver includes a DAC module, a multiplexing module, and an amplification module connected in sequence; Among them, the DAC module may include: a low-speed DAC module, a multi-channel DAC module and a multi-channel low-speed DAC module. In one embodiment, the use of a low-speed DAC module can reduce costs. In another embodiment, the use of a multi-channel low-speed DAC module can output ViL / ViH / Vt levels. In yet another embodiment, the use of a multi-channel low-speed DAC module can meet the above-mentioned multiple specific testing needs.

[0066] The multiplexing module may include: a high-speed multiplexing module and a low-speed multiplexing module. In a specific implementation, the high-speed multiplexing module may be used to match applications with high digital bit rates, and the low-speed multiplexing module may be used to match applications with low digital bit rates.

[0067] The data timing module is connected to the high-speed multiplexing module via the isolation module.

[0068] See also Figure 3 , Figure 3 A structural block diagram of a drive system provided in an embodiment of the present application.

[0069] Figure 3 middle: Digital logic unit: includes digital voltage setting module, data timing module and VI source control module. The digital voltage setting module is responsible for configuring the digital drive level, the data timing module generates the required pulse signal, and the VI source control module is used to configure the VI source to output the appropriate high voltage bias.

[0070] High voltage VI source: As the core part of the tester, it is mainly used to generate high voltage signals (negative tens of V to positive tens of V). The high voltage VI source module includes a DAC module and a gain output module.

[0071] Floating digital drive unit: It consists of an isolation module, a multi-channel low-speed DAC module, a high-speed multiplexing module, a voltage and current gain module (amplification module), and a three-state output switch. The unit is powered by a floating power supply, and its floating ground is based on the output of the VI source.

[0072] Drive output selection unit: includes a digital drive output selection switch and a VI output selection switch, which are used to switch between different drive modes.

[0073] The DAC code value output by the VI source control module is connected to an external DAC through a DAC interface. The analog signal output by the DAC is further input to the VI source circuit.

[0074] The output signal of the VI source is divided into two parts, one part is connected to the VI output selection switch in the drive selection unit, and the other part is connected to the floating ground of the floating digital drive unit.

[0075] The DAC code value generated by the digital voltage setting module in the digital logic unit is connected to the isolation module in the floating digital drive unit through the DAC interface.

[0076] The isolation module isolates the signal to generate a DAC control signal referenced to a floating ground and transmits it to the multi-channel DAC.

[0077] The analog signals output by the multiple DACs are connected to the input terminals of the high-speed multiplexing module respectively. The selection port of the high-speed multiplexer is connected to the pulse signal from the data timing module in the digital logic device, and is controlled after being processed by the isolation module.

[0078] The low voltage signal output by the high-speed multiplexing module is connected to the input of the voltage and current amplifier module. The output of the voltage and current amplifier module is connected to one side of the three-state output switch, and the other side of the three-state output switch is used as the overall output of the floating digital drive.

[0079] The output of the floating digital driver is connected to a digital driver output selection switch of a driver output selection unit.

[0080] Voltage setting module: sets the voltage that drives the digital drive module DAC according to the test requirements, and configures the DAC through the matching interface.

[0081] Data timing module: Generates appropriate test pulse signals according to test requirements. Data is used to control VIL / VIH / VT, and Timing controls the position of data switching.

[0082] VI source control module: Set the high voltage DC bias of the external VI source to meet test requirements.

[0083] DAC module in the high-voltage VI source: generates the corresponding analog voltage according to the DAC code value, and amplifies the low-voltage signal into a high-voltage signal.

[0084] Isolation module in floating digital drive unit: converts the common ground signal from digital logic device into floating signal referenced to floating ground. Multiple low-speed DACs convert digital code values ​​sent by digital logic device into low-voltage analog signals, but do not have driving capability.

[0085] High-speed multiplexer: Switches between several voltages at multiple outputs at high speed. The control signals are generated by digital logic devices and processed by isolation modules.

[0086] Voltage and current amplifier module: amplifies the low-voltage analog signal output by the high-speed analog switch to the specified driving voltage range and provides the necessary driving capability.

[0087] Three-state output switch: enables the high-voltage digital driver to have three-state output capability. The control signal is provided by the data timing module of the digital logic device and processed by the isolation module.

[0088] Taking into account the drive system to better support high-speed digital drive.

[0089] In some embodiments, the digital driver includes a pin driver module and a digital adjustable power module; The data timing module is connected to the pin driving module via the isolation module; The level setting module is connected to the digital adjustable power module via the isolation module; The pin driving module is connected to the digital adjustable power supply module and connected to one side of the switching switch, and the other side of the switching switch is connected to the digital driving output selection switch of the driving output selection unit.

[0090] The digital adjustable power module includes a low-speed DAC, a voltage gain module and a current gain module; Among them, the low-speed DAC is connected to the voltage gain module and the current gain module in sequence and then connected to the high level generator of the pin driving module; The low-speed DAC is connected in sequence to the voltage gain module and the current gain module and then connected to the low level generator of the pin driving module.

[0091] See also Figure 4 , Figure 4 A structural block diagram of another drive system provided in an embodiment of the present application.

[0092] Figure 4 middle: The drive system consists of the following components: Isolation block: Isolates the signals generated by digital logic devices from the floating ground and converts them into DAC control signals based on the floating ground.

[0093] Pin driver module (Pin Driver chip): High and low level switching is achieved through the VH and VL voltages of the adjustable power supply.

[0094] Digital adjustable power supply module: The low voltage signal output by the DAC is processed by voltage amplification and current gain to provide the VH and VL voltages required by the Pin Driver chip.

[0095] Three-state output switch: controls the output of the Pin Driver chip to achieve three-state output capability.

[0096] Connection relationship between each component: The DAC code value output by the VI source control module is connected to the external DAC through the DAC interface, and the analog signal output by the DAC is input into the VI source circuit. The output signal of the VI source is divided into two parts: one part is connected to the VI output selection switch of the drive selection unit, and the other part is connected to the floating digital drive unit as a floating ground.

[0097] The DAC code value generated by the digital voltage setting module in the digital logic unit is connected to the isolation module in the floating digital drive unit through the DAC interface. The isolation module isolates the signal and generates a DAC control signal referenced to the floating ground, which is then transmitted to the adjustable power module.

[0098] The low-speed DAC in the adjustable power module converts the digital signal into the VH and VL levels that match the test requirements. The analog signal output by the low-speed DAC is amplified by the voltage gain module, and the amplified signal is further enhanced by the current buffer. The enhanced current signal is connected to the VH and VL pins of the Pin Driver chip to provide power for them.

[0099] The selection port of the Pin Driver chip is connected to the logic pulse signal from the digital logic device, which is processed by the isolation module to control the output switching of the Pin Driver chip, thereby generating high and low level digital pulse waveforms that meet the test requirements.

[0100] The output signal of the Pin Driver passes through the three-state output switch as the overall output of the floating digital driver, and is finally output through the digital driver output selection switch of the driver output selection unit.

[0101] Isolation module: Converts common ground signals from digital logic devices into floating ground based signals, providing isolation for subsequent circuits.

[0102] Pin Driver Chip: By cooperating with the digital pulse signal generated by the digital logic device, the VH and VL levels generated by the digital adjustable power supply are used to achieve fast high and low level switching.

[0103] Digital adjustable power module: Sets the appropriate VH and VL voltages according to the control signals provided by the digital logic device, and improves the signal driving capability through the voltage and current gain modules.

[0104] Three-state output switch: enables the high-voltage digital driver to have a three-state output function. The control signal is provided by the logic pulse module of the digital logic device and is isolated.

[0105] In this drive system, the floating digital drive unit cooperates with the isolation module, the multi-channel low-speed DAC module, the high-speed multiplexing module and the voltage and current amplification module to realize the high-speed and high-voltage digital signal output with reference to the floating ground. The floating ground design enables the drive module to flexibly generate high-speed digital signals based on the high-voltage bias voltage. By adopting a three-state output switch, the drive output can be switched between high level, low level and high impedance state, so that it not only supports high-speed and high-voltage digital signal output, but also can meet more complex test requirements. Through the drive output selection unit, it can flexibly switch between analog drive (driven by VI source) and digital drive (driven by floating digital drive unit), which increases the flexibility and applicability of the system.

[0106] The following is an introduction to the application scenarios of the driving method provided in the embodiment of the present application: See also Figure 1 , Figure 1 A schematic diagram of a driving method flow chart provided in an embodiment of the present application is applied to a driving system. In this embodiment, the driving method can be performed as follows: Figure 7 The data evaluation device 300 shown is Figure 8 The electronic device 200 shown in the figure may include one or more electronic devices, and information may be transmitted between the multiple electronic devices in a wireless and / or wired manner. The multiple electronic devices may cooperate to complete the driving method. For example, the electronic device may include a mobile terminal, a computer, a tablet, etc., which is not limited in this application. Figure 5 The process shown is described in detail, and the driving method may include S110 to S120.

[0107] S110: Obtain test parameters corresponding to target test requirements.

[0108] In an embodiment of the present application, for a device that needs to be tested, the present application provides test parameters required for the test based on a drive system, wherein the test parameters include: test excitation source data.

[0109] Among them, the digital logic unit in the driving system obtains the test stimulus source data required for the test from other control devices, and the test stimulus source data includes: at least one or more of the various level data of the test waveform, high-voltage bias data, digital signal code value and switching timing data.

[0110] S120: Inputting the test parameters into the driving system to determine the floating digital driving signal and / or the voltage source signal output by the driving output selection unit.

[0111] In this embodiment, after the test parameters are input, the drive output selection unit can select to output a floating digital drive signal according to the input information, or directly select the signal output of the voltage source, and finally form a high-speed drive signal that adapts to high voltage or low voltage.

[0112] For example, see Figure 6 , Figure 6 A flowchart of an exemplary driving method is provided.

[0113] The drive methods include: S1: Get test stimulus source data.

[0114] S2: configuring each module in the digital logic unit, the voltage source module, the digital level of the digital driver and the drive output selection unit according to the test stimulus source data.

[0115] S3: Determine the pulse signal generated by the data timing module in the digital logic unit, and output a high-voltage and high-speed pulse signal through a digital driver, a switching switch and a drive output selection unit.

[0116] Among them, in some aspects, for the internal part of the digital logic unit, after obtaining the configuration data, the digital logic unit will configure the corresponding level data to the level setting module, configure the high voltage bias data to the voltage source control module, and configure the corresponding digital signal code value and switching timing data to the data timing module.

[0117] In other aspects, the digital logic unit also configures the drive output selection unit according to the currently required working mode. If high-voltage DC output is required, the voltage source output is selected as the overall output. If high-voltage and high-speed digital signal output is required, a floating grounded digital driver is selected as the output.

[0118] It should be noted that: the data timing module generates corresponding digital pulses according to the configuration information and inputs them into the digital driving part through the corresponding interface, so as to drive and generate corresponding digital pulses.

[0119] In some implementations, the voltage source control module in the digital logic unit configures the corresponding high-voltage bias signal through the configuration interface, and the voltage source can generate the corresponding high-voltage bias signal.

[0120] In some implementations, the level setting module in the digital logic unit configures the corresponding digital voltage in the test waveform into the digital driver through the corresponding interface to generate the corresponding digital level.

[0121] In some embodiments, the driving method further includes S210 to S220.

[0122] S210: Determine an operating mode of the drive system based on the test parameters.

[0123] In this embodiment, the drive output selection unit can be specifically configured according to the currently required working mode, that is, different test requirements correspond to different required signals.

[0124] S220: Control the floating digital driving signal and / or the voltage source signal output by the driving output selection unit based on the test parameter and the working mode.

[0125] In this embodiment, the test parameters may be directly configured to the digital logic unit, and the working mode may be determined according to the user's additional currently required program or logic instructions.

[0126] In some embodiments, the step S120 of inputting the test parameters into the driving system to determine that the driving output selection unit outputs the voltage source signal may include S121 to S122.

[0127] S121: Input the test parameters to the voltage source control module, so that the voltage source control module provides a reference voltage as a floating ground for the floating digital driving unit, and outputs the reference voltage to the driving output selection unit.

[0128] S122: When it is determined based on the test parameters that the VI output selection switch is closed (the other end of the driving output selection unit), the reference voltage is output as a voltage source signal.

[0129] As an implementation manner, controlling the voltage source signal output by the driving output selection unit based on the test parameter and the working mode in step S220 may include S221 to S222.

[0130] S221: inputting the test parameters into the voltage source control module, so that the voltage source control module provides a reference voltage as a floating ground for the floating digital drive unit, and outputs the reference voltage to the drive output selection unit; S222: When it is determined based on the test parameters and the working mode that the VI output selection switch (the other end of the driving output selection unit) is closed, the reference voltage is output as a voltage source signal.

[0131] In this embodiment, see Figure 1 and Figure 2 In the working mode: Voltage source configuration: The voltage source control module sets the voltage source so that its output meets the current test requirements. The output voltage of the voltage source provides a voltage reference for the floating digital drive section and serves as a floating ground.

[0132] Signal isolation and processing: The signals generated by the level setting module and the data timing module are first processed by the isolation module. After isolation, the signals are matched with the floating ground reference and transmitted to the floating digital drive unit.

[0133] Floating digital drive signal generation: The floating digital drive unit generates a high-speed digital drive signal according to the timing signal under the condition of floating grounding, and determines the output path through the driving output selection unit.

[0134] Drive output: The drive output selection unit can choose to output a floating digital drive signal, or directly select the signal output of a voltage source, ultimately forming a high-speed drive signal that adapts to high or low voltage.

[0135] In this embodiment, the VI output selection switch can directly use the reference voltage output by the voltage source control module as a voltage source signal to be output from the drive output selection unit to test the automatic test equipment.

[0136] In some embodiments, in step S120 , the test parameters are input into the driving system to determine that the driving output selection unit outputs a floating digital driving signal, including S123 to S124 . S123: Input the test parameters into the digital logic unit, so that the multiple low-speed DAC modules, the high-speed multiplexing module and the amplification module generate high-voltage and high-speed signals, and output the high-voltage and high-speed signals to the switching switch.

[0137] In this embodiment, the high-speed high-voltage pulse signal is output as a high-speed high-voltage pulse signal under the control of the data timing module.

[0138] S124: When it is determined based on the test parameters that the digital drive output selection switch (one end of the drive output selection unit) is closed, the high-voltage and high-speed signal is output as a floating digital drive signal.

[0139] As an implementation manner, controlling the floating digital driving signal output by the driving output selection unit based on the test parameters and the working mode in step S220 may include S223 to S224.

[0140] S223: input the test parameters into the digital logic unit, so that the multiple low-speed DAC modules, the high-speed multiplexing module and the amplification module generate high-voltage and high-speed signals, and output the high-voltage and high-speed signals to the switching switch; S224: When the digital drive output selection switch (one end of the drive output selection unit) is closed based on the test parameters and the working mode, the high-voltage and high-speed signal is output as a floating digital drive signal.

[0141] In this embodiment, in the digital driving mode: The VI source control module configures the VI source to generate a suitable high voltage DC bias.

[0142] The floating digital drive unit generates a digital pulse signal based on the VI source to form a high-voltage and high-speed signal.

[0143] The voltage and current amplifier module amplifies the signal to a specified range and provides the required driving capability, and the three-state output switch ensures that the signal has a three-state output.

[0144] The digital drive output selection switch of the drive output selection unit outputs the floating digital drive signal, and finally forms a high-voltage and high-speed digital drive signal.

[0145] In some embodiments, in step S120 , the test parameters are input into the driving system to determine that the driving output selection unit outputs a floating digital driving signal, and further includes: S125 to S126 .

[0146] S125: Input the test parameters into the digital logic unit, so that the pin drive module and the digital adjustable power supply module switch high and low levels to generate a high-speed digital drive signal, and output the high-speed digital drive signal to the switching switch.

[0147] The data and timing module generates corresponding digital pulses according to the configuration information and inputs the corresponding digital pulses to the digital driver through the corresponding interface, and the driver generates corresponding digital pulses.

[0148] S126: When it is determined based on the test parameters that the digital drive output selection switch (one end of the drive output selection unit) is closed, the high-speed digital drive signal is output as a floating digital drive signal.

[0149] As an implementation manner, controlling the floating digital driving signal output by the driving output selection unit based on the test parameters and the working mode in step S220 may include S225 to S226.

[0150] S225: input the test parameters into the digital logic unit, so that the pin drive module and the digital adjustable power supply module switch high and low levels to generate a high-speed digital drive signal, and output the high-speed digital drive signal to the switch; S226: When the digital drive output selection switch (one end of the drive output selection unit) is closed based on the test parameters and the working mode, the high-speed digital drive signal is output as a floating digital drive signal.

[0151] In this embodiment, under the driving method: The VI source provides the basic high voltage DC bias signal and acts as a floating ground reference.

[0152] The Pin Driver chip switches high and low levels by controlling the signal to achieve high-speed digital drive.

[0153] The digital adjustable power module provides the appropriate power supply voltage for the Pin Driver chip and ensures the driving capability.

[0154] The three-state output switch ensures that the output signal has three-state functionality, providing flexible testing capabilities.

[0155] In this application, when a high-voltage and high-speed digital signal needs to be output, the digital logic unit configures the VI source to generate a high-voltage bias voltage, and the reference ground of the floating digital drive part is set to the output voltage of the VI source. According to the test requirements, appropriate VIH / VIL levels are configured, and these levels will swing based on the bias voltage generated by the VI source, thereby realizing high-voltage and high-speed digital drive.

[0156] See also Figure 7 , Figure 7This is a structural block diagram of a data evaluation device provided by the present application. The data evaluation device 300 includes: an acquisition module 310, a processing module 320, a determination module 330 and an evaluation module 340, wherein: The acquisition module 310 is used to acquire the test parameters corresponding to the target test requirements.

[0157] The output module 320 is used to input the test parameters into the driving system to determine the floating digital driving signal and / or the voltage source signal output by the driving output selection unit.

[0158] The device embodiment in the present application may also include other modules, which specifically correspond to part of the content of the above method.

[0159] It should be noted that the device embodiments in the present application correspond to each other with the aforementioned method embodiments. The specific principles in the device embodiments can be found in the contents of the aforementioned method embodiments and will not be repeated here.

[0160] In several embodiments provided in this embodiment, the coupling between modules may be electrical, mechanical or other forms of coupling.

[0161] In addition, each functional module in each embodiment of the present invention may be integrated into one processing module, or each module may exist physically separately, or two or more modules may be integrated into one module. The above-mentioned integrated module may be implemented in the form of hardware or in the form of software functional modules.

[0162] See also Figure 8 , Figure 8 The present application provides a structural block diagram of an electronic device 200 that can execute the above-mentioned driving method. The electronic device 200 can be a smart phone, a tablet computer, a computer, a portable computer or other devices.

[0163] The electronic device 200 further includes a processor 202 and a memory 204. The memory 204 stores a program that can execute the contents of the aforementioned embodiments, and the processor 202 can execute the program stored in the memory 204.

[0164] Among them, the processor 202 may include one or more cores and message matrix units for processing data. The processor 202 uses various interfaces and lines to connect various parts of the entire electronic device 200, and executes various functions and processes data of the electronic device 200 by running or executing instructions, programs, code sets or instruction sets stored in the memory 204, and calling data stored in the memory 204. Optionally, the processor 202 can be implemented in at least one hardware form of digital signal processing (Digital Signal Processing, DSP), field programmable gate array (Field-Programmable Gate Array, FPGA), and programmable logic array (Programmable Logic Array, PLA). The processor 202 can integrate one or a combination of a central processing unit (Central Processing Unit, CPU), a graphics processing unit (Graphics Processing Unit, GPU) and a modulation decoder. Among them, the CPU mainly processes the operating system, user interface and application programs; the GPU is responsible for rendering and drawing display content; and the modem is used to process wireless communications. It can be understood that the above-mentioned modulation decoder may not be integrated into the processor, but may be implemented separately through a communication chip.

[0165] The memory 204 may include a random access memory (RAM) or a read-only memory (ROM). The memory 204 may be used to store instructions, programs, codes, code sets or instruction sets. The memory 204 may include a program storage area and a data storage area, wherein the program storage area may store instructions for implementing an operating system, instructions for implementing at least one function (e.g., instructions for a user to obtain a random number), instructions for implementing the following various method embodiments, etc. The data storage area may also store data (e.g., random numbers) created by the terminal during use, etc.

[0166] The electronic device 200 may also include a network module and a screen. The network module is used to receive and send electromagnetic waves to realize the mutual conversion between electromagnetic waves and electrical signals, so as to communicate with a communication network or other devices, such as communicating with an audio playback device. The network module may include various existing circuit components for performing these functions, such as antennas, radio frequency transceivers, digital signal processors, encryption / decryption chips, user identity modules (SIM) cards, memories, etc. The network module may communicate with various networks such as the Internet, corporate intranets, wireless networks, or communicate with other devices via wireless networks. The above-mentioned wireless networks may include cellular telephone networks, wireless local area networks, or metropolitan area networks. The screen may display interface content and perform data interaction.

[0167] Please refer to Fig. 9 , Fig. 9 The computer-readable storage medium 400 stores program code 410, which can be called by a processor to execute the method described in the above method embodiment.

[0168] The computer-readable storage medium 400 may be an electronic memory such as a flash memory, an EEPROM (electrically erasable programmable read-only memory), an EPROM, a hard disk, or a ROM. Optionally, the computer-readable storage medium includes a non-transitory computer-readable storage medium. The computer-readable storage medium 400 has storage space for computer program codes 410 for executing any method steps in the above method. These computer program codes 410 may be read from or written to one or more computer program products. The computer program codes 410 may be compressed, for example, in a suitable form.

[0169] The embodiment of the present application also provides a computer program product or a computer program, which includes a computer instruction stored in a computer-readable storage medium. The processor of the computer device reads the computer instruction from the computer-readable storage medium, and the processor executes the computer instruction, so that the computer device executes the driving method described in the above various optional implementations.

[0170] The above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit it. Although the present application has been described in detail with reference to the aforementioned embodiments, a person skilled in the art should understand that the technical solutions described in the aforementioned embodiments can still be modified, or some of the technical features can be replaced by equivalents. However, these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present application.

Claims

1. A drive system, characterized in that: The driving system comprises: a floating digital unit, a voltage source and a driving output selection unit; the floating digital unit comprises a floating digital driving unit; The floating digital drive unit includes a digital driver and a floating ground; The output end of the digital driver is connected to one end of the drive output selection unit via a switching switch, and the output end of the voltage source is respectively connected to the floating ground and the other end of the drive output selection unit; The digital driver input terminal and the voltage source input terminal are used for control according to the test parameter transmitted by the floating digital unit.

2. The drive system according to claim 1, characterized in that: The floating digital unit further comprises: a digital logic unit and an isolation module; The digital logic unit includes a level setting module, a data timing module and a voltage source control module; The level setting module, the isolation module and the digital driver are connected in sequence, one end of the digital driver is connected to the isolation module, and the other end is connected to one end of the drive output selection unit via a switching switch, and after the data timing module is connected to the isolation module, it is respectively connected to the switching switch and the digital driver; The voltage source control module is connected to the voltage source input terminal, and the voltage source output terminal is respectively connected to the floating ground and the other terminal of the drive output selection unit.

3. The drive system according to claim 2, characterized in that: The digital driver comprises a DAC module, a multiplexing module and an amplification module connected in sequence; The data timing module is connected to the multiplexing module via the isolation module.

4. The drive system according to claim 2, characterized in that: The digital driver comprises a pin driving module and a digital adjustable power supply module; The data timing module is connected to the pin driving module via the isolation module; The level setting module is connected to the digital adjustable power supply module via the isolation module; The pin driving module is connected to the digital adjustable power supply module and then connected to one side of the switching switch, and the other side of the switching switch is connected to the digital driving output selection switch of the driving output selection unit.

5. The drive system according to claim 4, characterized in that: The digital adjustable power supply module includes a low-speed DAC, a voltage gain module and a current gain module; The low-speed DAC is connected to the voltage gain module and the current gain module in sequence and then connected to the high level generator of the pin driving module; The low-speed DAC is connected to the voltage gain module and the current gain module in sequence and then connected to the low level generator of the pin driving module.

6. The drive system according to claim 1, characterized in that: The voltage source is a VI source, the voltage source control module is a VI source control module, the VI source control module is connected with a DAC, the DAC is connected to the VI source input terminal, and the VI source output terminal is respectively connected to the floating ground and the VI output selection switch of the drive output selection unit.

7. The drive system according to any one of claims 1 to 6, characterized in that: The switch is a three-state output switch.

8. A driving method, characterized in that: Applied to the drive system according to any one of claims 1 to 7, the drive method comprises: Get the test parameters corresponding to the target test requirements; The test parameters are input into the driving system to determine the floating digital driving signal and / or the voltage source signal output by the driving output selection unit.

9. The driving method according to claim 8, characterized in that: The driving method further includes: determining an operating mode of the drive system based on the test parameters; The floating digital drive signal and / or the voltage source signal output by the drive output selection unit is controlled based on the test parameter and the working mode.

10. The driving method according to claim 9, characterized in that: The method of controlling the floating digital drive signal output by the drive output selection unit based on the test parameter and the working mode includes: Inputting the test parameters into the digital logic unit in the floating digital unit, so that the DAC module, the multiplexing module and the amplification module in the digital driver generate a high-voltage and high-speed signal, and outputting the high-voltage and high-speed signal to the switching switch; When it is determined based on the test parameters and the working mode that one end of the drive output selection unit is closed, the high-voltage and high-speed signal is output as a floating digital drive signal.

11. The driving method according to claim 9, characterized in that: The method of controlling the floating digital drive signal output by the drive output selection unit based on the test parameters and the working mode further includes: inputting the test parameters into the digital logic unit in the floating digital unit, so that the pin drive module and the digital adjustable power supply module in the digital driver switch high and low levels to generate a high-speed digital drive signal, and outputting the high-speed digital drive signal to the switch; When it is determined based on the test parameter and the working mode that one end of the drive output selection unit is closed, the high-speed digital drive signal is output as a floating digital drive signal.

12. The driving method according to claim 9, characterized in that: The step of controlling the voltage source signal output by the drive output selection unit based on the test parameter and the working mode includes: Inputting the test parameters into the voltage source control module in the floating digital unit, so that the voltage source control module provides a reference voltage as a floating ground for the floating digital drive unit, and outputs the reference voltage to the drive output selection unit; When it is determined based on the test parameter and the working mode that the other end of the drive output selection unit is closed, the reference voltage is output as a voltage source signal.

13. A driving device, characterized in that: Applicable to the drive system according to any one of claims 1 to 7, the drive device comprising: The acquisition module is used to obtain the test parameters corresponding to the target test requirements; The output module is used to input the test parameters into the drive system to determine the floating digital drive signal and / or the voltage source signal output by the drive output selection unit.

14. An electronic device, characterized in that: The electronic device includes a memory and a processor, wherein the memory stores program codes that can be run on the processor, and when the program codes are executed by the processor, the driving method according to any one of claims 8 to 12 is implemented.

15. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores program codes, and the program codes can be called by one or more processors to execute the driving method according to any one of claims 8 to 12.

Images