Switch optical communication interface electric signal quality test method, equipment and medium

Abstract

The invention discloses a switch optical communication interface electric signal quality test method and device and a medium, and the method comprises the steps: constructing a standard electric signal generation link based on a bit error tester, a first variable ISI board and an oscilloscope, and constructing a standard electric signal conforming to a preset eye pattern specification through the standard electric signal generation link; constructing a worst receiving link by combining a second variable ISI board and based on the maximum insertion loss value corresponding to the first optical communication interface of the switch; accessing a second optical communication interface of the switch to the test link, and sending a signal of a standard test code pattern through the second optical communication interface; and counting the receiving bit error rate corresponding to the first optical communication interface through the worst receiving link, and determining the electric signal quality of the optical communication interface of the switch according to a counting result. Through the method, potential performance problems can be found and solved in time, and the stability and reliability of the switch in practical application are ensured.

Description

Technical Field

[0001] The present application relates to the field of testing technology, and in particular to a method, device and medium for testing the quality of electrical signals at an optical communication interface of a switch. Background Art

[0002] Currently, in the field of high-speed communication technology, the signal quality of the optical communication interface of the switch is crucial. In order to ensure the stability and reliability of signal transmission, it must be strictly tested. Traditional testing methods usually rely on oscilloscopes to measure the eye diagram parameters of the electrical signal emitted by the interface, such as eye height and eye width, to evaluate the signal quality. However, with the continuous increase in communication rates and the increasing number of interfaces, traditional testing methods face many challenges.

[0003] First, as a precision test instrument, the oscilloscope has limited resources and high costs. When testing multiple switch optical communication interfaces, the oscilloscope needs to be occupied for a long time, which greatly reduces the test efficiency and increases the test cost. Secondly, the traditional test method mainly focuses on the transmitter of the signal, while ignoring the impact of the receiver on the signal quality. In practical applications, the performance of the receiver is equally important because the receiver needs to be able to accurately and reliably receive and decode the signal from the transmitter.

[0004] In order to solve the above problems, the industry has begun to explore new testing methods and technologies. Among them, one feasible solution is to measure the electrical signal transmission quality of the switch optical communication interface by constructing the worst receiving link. The core idea of ​​this method is to simulate the worst-case signal transmission environment to evaluate the performance of the interface under extreme conditions. However, how to effectively construct the worst receiving link and accurately measure the electrical signal transmission quality of the interface is a technical problem that needs to be solved urgently. Summary of the invention

[0005] The embodiments of the present application provide a method, device and medium for testing the quality of electrical signals of an optical communication interface of a switch, so as to solve the above-mentioned technical problems.

[0006] On the one hand, an embodiment of the present application provides a method for testing the quality of an electrical signal of an optical communication interface of a switch, comprising:

[0007] Based on the bit error meter, the first variable ISI board and the oscilloscope, a standard electrical signal generation link is constructed, and a standard electrical signal that conforms to a preset eye diagram specification is constructed through the standard electrical signal generation link;

[0008] In combination with the second variable ISI board, and based on the maximum insertion loss value corresponding to the first optical communication interface of the switch, a worst receiving link is constructed;

[0009] Connecting the second optical communication interface of the switch to the test link, and sending a signal of a standard test pattern through the second optical communication interface;

[0010] The worst receiving link is used to collect statistics on the receiving bit error rate corresponding to the first optical communication interface, and the electrical signal quality of the optical communication interface of the switch is determined according to the statistical results.

[0011] In one implementation of the present application, a standard electrical signal generation link is constructed based on a bit error meter, a first variable ISI board and an oscilloscope, specifically including:

[0012] Based on the code generator in the bit error meter, a signal of a standard test code pattern is issued, and the signal of the standard test code pattern is sent to the oscilloscope via the first variable ISI board.

[0013] In one implementation of the present application, constructing a standard electrical signal that complies with a preset eye diagram specification through the standard electrical signal generation link specifically includes:

[0014] Adjusting parameters of a bit error meter in the standard electrical signal generation link, and adjusting the insertion loss value of a first variable ISI board in the standard electrical signal generation link;

[0015] By means of the oscilloscope, the eye diagram data corresponding to the parameter adjustment and the insertion loss value adjustment are measured; the parameters include random jitter parameters, sinusoidal jitter parameters and noise parameters, and the eye diagram data include eye width and eye height;

[0016] When the eye width and eye height in the eye diagram data are consistent with the preset eye diagram specification, it is determined that the signal at the test point is a constructed standard electrical signal.

[0017] In one implementation of the present application, in combination with the second variable ISI board and based on the maximum insertion loss value corresponding to the first optical communication interface of the switch, before constructing the worst receiving link, the method further includes:

[0018] Enable the bit error statistics function corresponding to the first optical communication interface of the switch;

[0019] The insertion loss of the second variable ISI board is adjusted, and the bit error rate corresponding to the reception of the first optical communication interface under different insertion losses is recorded.

[0020] In one implementation of the present application, in combination with the second variable ISI board and based on the maximum insertion loss value corresponding to the first optical communication interface of the switch, a worst receiving link is constructed, specifically including:

[0021] gradually increasing the insertion loss of the second variable ISI board until the bit error rate received by the first optical communication interface is equal to a preset bit error rate threshold, and determining a maximum insertion loss value of the first optical communication interface when receiving the corresponding maximum bit error rate;

[0022] When the insertion loss of the second variable ISI board is the maximum insertion loss value, inserting the standard electrical signal into the second variable ISI board and sending it to the first optical communication interface of the switch via the HCB fixture;

[0023] A link between the standard electrical signal and the first optical communication interface is determined to be a worst reception link of the structure.

[0024] In one implementation of the present application, connecting the second optical communication interface of the switch to the test link, and sending a signal of a standard test pattern through the second optical communication interface, specifically includes:

[0025] Connecting the second optical communication interface of the switch to the test link, and based on the pattern generator, sending a signal of a standard test pattern through the second optical communication interface;

[0026] The signal of the standard test pattern is sent to the worst receiving link via the HCB fixture, and the standard electrical signal is inserted between the HCB fixture and the worst receiving link.

[0027] In an implementation of the present application, statistics are collected on a reception bit error rate corresponding to the first optical communication interface through the worst reception link, specifically including:

[0028] sending the standard electrical signal inserted into the worst receiving link to the first optical communication interface of the switch via the second variable ISI board and the HCB fixture;

[0029] Based on the bit error statistics function of the first optical communication interface and via the worst interface link, statistics are collected on the received bit error rate corresponding to the standard electrical signal at the first optical communication interface to obtain corresponding statistical results.

[0030] In one implementation of the present application, determining the quality of the electrical signal of the optical communication interface of the switch according to the statistical results specifically includes:

[0031] When the bit error rate in the statistical result is less than a preset bit error rate threshold, determining that the quality of the electrical signal sent by the second optical communication interface of the switch meets the preset specification standard;

[0032] When the bit error rate in the statistical result is greater than the preset bit error rate threshold, it is determined that the quality of the electrical signal sent by the second optical communication interface of the switch does not meet the preset specification standard.

[0033] On the other hand, an embodiment of the present application further provides a switch optical communication interface electrical signal quality testing device, the device comprising:

[0034] at least one processor;

[0035] and, a memory communicatively coupled to the at least one processor;

[0036] The memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor can execute the above-mentioned method for testing the quality of electrical signals of an optical communication interface of a switch.

[0037] On the other hand, an embodiment of the present application further provides a non-volatile computer storage medium storing computer executable instructions, which, when executed, implements a switch optical communication interface electrical signal quality testing method as described above.

[0038] The present application provides a method, device and medium for testing the quality of electrical signals of an optical communication interface of a switch, which at least have the following beneficial effects:

[0039] By constructing a standard electrical signal generation link, it is possible to ensure that the generated signal has high precision and stability, thereby improving the accuracy and reliability of the test. By constructing a standard electrical signal that conforms to the preset eye diagram specification, it helps to ensure that the quality of the test signal meets industry standards and enhances the comparability and effectiveness of the test results. By constructing the worst receiving link, it is possible to simulate the worst communication conditions in actual use and effectively verify the performance of the switch optical communication interface under extreme conditions. By sending a signal of a standard test pattern through the second optical communication interface, it is possible to ensure the consistency and repeatability of the signal during the test, which is convenient for subsequent data analysis and problem location. By using the worst receiving link, the receiving bit error rate corresponding to the first optical communication interface is counted, which can directly reflect the data transmission quality of the switch optical communication interface under harsh conditions and provide an objective basis for evaluating the interface performance. According to the statistical results, the electrical signal quality of the switch optical communication interface is determined, which helps to promptly discover and solve potential performance problems and ensure the stability and reliability of the switch in actual applications. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] The drawings described herein are used to provide a further understanding of the present application and constitute a part of the present application. The illustrative embodiments of the present application and their descriptions are used to explain the present application and do not constitute an improper limitation on the present application. In the drawings:

[0041] Figure 1 A flow chart of a method for testing the quality of electrical signals of an optical communication interface of a switch provided in an embodiment of the present application;

[0042] Figure 2 A schematic diagram of the internal structure of a switch optical communication interface electrical signal quality testing device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0043] In order to make the purpose, technical solution and advantages of the present application clearer, the technical solution of the present application will be clearly and completely described below in combination with the specific embodiments of the present application and the corresponding drawings. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present application.

[0044] The technical solutions provided by various embodiments of the present application are described in detail below in conjunction with the accompanying drawings.

[0045] Figure 1 A flow chart of a method for testing the quality of electrical signals at an optical communication interface of a switch provided in an embodiment of the present application.

[0046] The analysis method involved in the embodiments of the present application can be implemented by a terminal device or a server, and the present application does not impose any special restrictions on this. For the convenience of understanding and description, the following embodiments are described in detail by taking a server as an example.

[0047] It should be noted that the server may be a single device or a system consisting of multiple devices, that is, a distributed server, and this application does not make any specific limitation on this.

[0048] like Figure 1 As shown, a method for testing the quality of electrical signals of an optical communication interface of a switch provided in an embodiment of the present application includes:

[0049] 101. Based on the bit error meter, the first variable ISI board and the oscilloscope, a standard electrical signal generation link is constructed, and a standard electrical signal that conforms to a preset eye diagram specification is constructed through the standard electrical signal generation link.

[0050] Specifically, in one embodiment of the present application, based on a bit error meter, a first variable ISI board and an oscilloscope, a standard electrical signal generation link is constructed, specifically including:

[0051] Based on the code generator in the bit error tester, a signal of a standard test code pattern is issued, and the signal of the standard test code pattern is sent to the oscilloscope via the first variable ISI board.

[0052] In one embodiment, a bit error meter is prepared and its pattern generator is ensured to be able to generate the required standard test pattern signal, and a first variable ISI board is prepared and ensured to be in good working condition. The bit error meter, the first variable ISI board and the oscilloscope are sequentially connected in a predetermined order and connection mode to form a standard electrical signal generation link.

[0053] Set the parameters of the pattern generator in the BERT to generate a standard test pattern signal that meets the test requirements, and ensure that the generated signal is of good quality and can meet the requirements of subsequent tests. Start the pattern generator of the BERT to start emitting a standard test pattern signal, which will pass through the first variable ISI board and eventually be captured and displayed by the oscilloscope. Observe the captured signal waveform on the oscilloscope, paying attention to key parameters such as the amplitude, frequency, and phase of the signal.

[0054] In one embodiment of the present application, a standard electrical signal generation link is constructed by a standard electrical signal to conform to a preset eye diagram specification, specifically including:

[0055] Adjusting parameters of a bit error meter in a standard electrical signal generation link, and adjusting an insertion loss value of a first variable ISI board in the standard electrical signal generation link;

[0056] Through an oscilloscope, measure the eye diagram data corresponding to the parameter adjustment and insertion loss value adjustment; the parameters include random jitter parameters, sinusoidal jitter parameters and noise parameters, and the eye diagram data includes eye width and eye height;

[0057] When the eye width and eye height in the eye diagram data are consistent with preset eye diagram specifications, it is determined that the signal at the test point is a constructed standard electrical signal.

[0058] In one embodiment, ensure that all devices in the standard electrical signal generation link (including the bit error meter, the first variable ISI board, the MCB fixture, the oscilloscope, etc.) are properly connected and in good working condition. Prepare a high-performance oscilloscope to ensure that it can accurately measure the eye diagram data. According to the test requirements and industry standards, preset a set of eye diagram specifications, including ideal eye width and eye height values.

[0059] In the bit error meter, set the initial random jitter parameters, sinusoidal jitter parameters and noise parameters. These parameters will affect the quality of the generated electrical signal, especially its eye diagram characteristics. Start the bit error meter, generate an electrical signal containing random jitter, sinusoidal jitter and noise, and adjust the insertion loss value of the first variable ISI board in the standard electrical signal generation link, so that the signal is sent to the oscilloscope through the standard electrical signal generation link. On the oscilloscope, set appropriate measurement parameters, insertion loss values ​​and trigger conditions to accurately capture and measure the eye diagram of the electrical signal, that is, measure and record the eye width and eye height values ​​of the eye diagram. According to the comparison results of the measured eye diagram data with the preset eye diagram specifications, fine-tune the parameters in the bit error meter and the insertion loss value of the first variable ISI board. Repeat the generation, transmission and measurement steps until the eye width and eye height in the eye diagram data are consistent with the preset eye diagram specifications.

[0060] After multiple parameter adjustments and iterations, a set of parameter settings is finally obtained that makes the eye diagram data meet the preset specifications. At this point, the eye diagram displayed on the oscilloscope should have a clear outline, and the eye width and eye height values ​​are within the preset specification range. After confirming that the eye diagram data meets the preset specifications, it can be determined that the signal at the current test point is a constructed standard electrical signal. This signal will be used for subsequent testing or evaluation work.

[0061] 102. In combination with the second variable ISI board, based on the maximum insertion loss value corresponding to the first optical communication interface of the switch, construct a worst receiving link.

[0062] Specifically, in one embodiment of the present application, in combination with the second variable ISI board and based on the maximum insertion loss value corresponding to the first optical communication interface of the switch, before constructing the worst receiving link, the method further includes:

[0063] Enable the bit error statistics function corresponding to the first optical communication interface of the switch;

[0064] The insertion loss of the second variable ISI board is adjusted, and the bit error rate corresponding to the reception of the first optical communication interface under different insertion losses is recorded.

[0065] In one embodiment, in the management interface of the switch, find the configuration option corresponding to the first optical communication interface, and enable the bit error statistics function corresponding to the interface to ensure that the switch can record and count the received bit errors in real time.

[0066] Insert the second variable ISI board into the optical communication link to ensure that its connection is stable and correct. Set up the optical signal source to emit an optical signal that meets the test requirements and transmit it to the first optical communication interface of the switch through the second variable ISI board. By adjusting the relevant parameters or physical structure on the second variable ISI board, gradually change its insertion loss. After each adjustment, use an optical power meter to measure the optical signal power after passing through the second variable ISI board to ensure the accuracy of the adjustment.

[0067] After each change in the insertion loss of the second variable ISI board, observe and record the bit error rate corresponding to the first optical communication interface of the switch. A bit error tester can be set to be connected to the switch to more accurately measure and record the bit error rate data. The recorded bit error rate data and the corresponding insertion loss values ​​are sorted to form a clear data table or chart. Analyze the data to observe the impact of the insertion loss on the bit error rate and whether the bit error rate meets the preset test standards or industry specifications.

[0068] In one embodiment of the present application, in combination with the second variable ISI board, and based on the maximum insertion loss value corresponding to the first optical communication interface of the switch, a worst receiving link is constructed, specifically including:

[0069] gradually increasing the insertion loss of the second variable ISI board until the bit error rate received by the first optical communication interface is equal to a preset bit error rate threshold, and determining a maximum insertion loss value of the first optical communication interface when receiving the corresponding maximum bit error rate;

[0070] When the insertion loss of the second variable ISI board is at the maximum insertion loss value, inserting the standard electrical signal into the second variable ISI board and sending the standard electrical signal to the first optical communication interface of the switch via the HCB fixture;

[0071] A link between the standard electrical signal and the first optical communication interface is determined to be the worst receiving link of the construction.

[0072] In one embodiment, ensure that the switch, the second variable ISI board, the optical signal source, the optical power meter, the bit error tester, the HCB fixture and other equipment are properly connected and in good working condition. The switch should be configured with a first optical communication interface for receiving optical signals, and the bit error statistics function should be enabled. According to the test requirements and industry standards, a bit error rate threshold is preset as a basis for judging whether the receiving performance of the first optical communication interface meets the standard.

[0073] Insert the second variable ISI board into the optical communication link and set its initial insertion loss to a lower value. Gradually increase the insertion loss of the second variable ISI board. After each increase, observe and record the bit error rate received by the first optical communication interface. Use a bit error tester to monitor the change of the bit error rate in real time to ensure the accuracy of the data. When the bit error rate received by the first optical communication interface is equal to the preset bit error rate threshold, stop increasing the insertion loss and record the insertion loss value of the second variable ISI board at this time as the maximum insertion loss value.

[0074] Adjust the insertion loss of the second variable ISI board to the maximum insertion loss value determined previously. Send the standard electrical signal to the second variable ISI board through the optical signal source to ensure the stability and accuracy of the signal. Transmit the standard electrical signal that has passed through the second variable ISI board through the HCB fixture and finally send it to the first optical communication interface of the switch. Observe the first optical communication interface receiving the standard electrical signal and confirm that under this condition, the link between the standard electrical signal and the first optical communication interface is the worst receiving link constructed. Perform performance tests on the worst receiving link constructed, including bit error rate tests, signal quality assessments, etc., to ensure that the link meets the test requirements and industry standards.

[0075] 103. Connect the second optical communication interface of the switch to the test link, and send a signal of a standard test pattern through the second optical communication interface.

[0076] Specifically, in one embodiment of the present application, connecting the second optical communication interface of the switch to the test link, and sending a signal of a standard test pattern through the second optical communication interface specifically includes:

[0077] Connecting the second optical communication interface of the switch to the test link, and based on the pattern generator, sending a signal of a standard test pattern through the second optical communication interface;

[0078] A signal of a standard test pattern is sent to the worst receiving link via the HCB fixture, and a standard electrical signal is inserted between the HCB fixture and the worst receiving link.

[0079] In one embodiment, according to the test requirements and industry standards, a standard test pattern is preset as the basis for the pattern generator to generate a signal. The second optical communication interface of the switch is connected to the test link to ensure that the connection is stable and correct. The pattern generator is started to generate an optical signal according to the preset standard test pattern, and the generated optical signal is sent through the second optical communication interface of the switch.

[0080] Transmit the standard test pattern signal sent from the second optical communication interface of the switch through the HCB fixture, and ensure that the HCB fixture connection is stable and can accurately transmit the optical signal. Insert the previously prepared standard electrical signal between the HCB fixture and the worst receiving link, and ensure that the insertion of the standard electrical signal does not interfere with the transmission of the standard test pattern signal.

[0081] 104. Collect statistics on the receiving bit error rate corresponding to the first optical communication interface through the worst receiving link, and determine the electrical signal quality of the optical communication interface of the switch according to the statistical result.

[0082] Specifically, in one embodiment of the present application, statistics are collected on the receiving bit error rate corresponding to the first optical communication interface through the worst receiving link, specifically including:

[0083] sending the standard electrical signal inserted into the worst receiving link to the first optical communication interface of the switch via the second variable ISI board and the HCB fixture;

[0084] Based on the bit error statistics function of the first optical communication interface and via the worst interface link, statistics are collected on the received bit error rate corresponding to the standard electrical signal at the first optical communication interface to obtain corresponding statistical results.

[0085] In one embodiment, a standard electrical signal that meets the test requirements is prepared to ensure its stability and accuracy. The standard electrical signal is transmitted through the second variable ISI board and the HCB fixture. The stability and accuracy of the signal during the transmission process are ensured to avoid interference and loss. The first optical communication interface of the switch receives the standard electrical signal transmitted through the second variable ISI board and the HCB fixture. Ensure that the connection of the receiving port is stable and can accurately receive the optical signal.

[0086] Confirm that the error statistics function of the first optical communication interface of the switch is enabled and can record and count the received error conditions in real time. Based on the error statistics function of the first optical communication interface, count the received error rate corresponding to the received standard electrical signal. Use an error tester to verify and calibrate the statistical results to ensure the accuracy of the data. Obtain and record the statistical results, including the received error rate, number of errors, test time and other information. Analyze the statistical results to evaluate the transmission performance and stability of the link.

[0087] In one embodiment of the present application, determining the electrical signal quality of the optical communication interface of the switch according to the statistical results specifically includes:

[0088] When the bit error rate in the statistical result is less than a preset bit error rate threshold, determining that the quality of the electrical signal sent by the second optical communication interface of the switch meets the preset specification standard;

[0089] When the bit error rate in the statistical result is greater than the preset bit error rate threshold, it is determined that the quality of the electrical signal sent by the second optical communication interface of the switch does not meet the preset specification standard.

[0090] In one embodiment, statistical results are obtained from a bit error tester, including key indicators such as a bit error rate and the number of bit errors. The bit error rate in the statistical results is compared with a preset bit error rate threshold. If the bit error rate in the statistical results is less than the preset bit error rate threshold, it is determined that the quality of the electrical signal emitted by the second optical communication interface of the switch meets the preset specification standard. If the bit error rate in the statistical results is greater than the preset bit error rate threshold, it is determined that the quality of the electrical signal emitted by the second optical communication interface of the switch does not meet the preset specification standard.

[0091] Record the test results in detail and write a test report, including the test process, statistical results, quality judgment, and possible improvement suggestions. If the quality of the electrical signal does not meet the preset specifications, the switch, pattern generator, second variable ISI board and other equipment should be checked and optimized to improve the signal quality. Retest the optimized system to verify whether the quality of the electrical signal meets the preset specifications.

[0092] The above is an embodiment of the method proposed in this application. Based on the same inventive concept, the embodiment of this application also provides a switch optical communication interface electrical signal quality test device, whose structure is as follows: Figure 2 shown.

[0093] Figure 2 The internal structure diagram of a switch optical communication interface electrical signal quality test device provided in an embodiment of the present application. Figure 2 As shown, the device includes:

[0094] at least one processor;

[0095] and, a memory communicatively coupled to the at least one processor;

[0096] The memory stores instructions that can be executed by at least one processor, and the instructions are executed by at least one processor to enable the at least one processor to:

[0097] Based on the bit error meter, the first variable ISI board and the oscilloscope, a standard electrical signal generation link is constructed, and a standard electrical signal that conforms to a preset eye diagram specification is constructed through the standard electrical signal generation link;

[0098] In combination with the second variable ISI board, and based on the maximum insertion loss value corresponding to the first optical communication interface of the switch, a worst receiving link is constructed;

[0099] Connecting the second optical communication interface of the switch to the test link, and sending a signal of a standard test pattern through the second optical communication interface;

[0100] The receiving bit error rate corresponding to the first optical communication interface is counted through the worst receiving link, and the electrical signal quality of the optical communication interface of the switch is determined according to the statistical result.

[0101] The present application also provides a non-volatile computer storage medium storing computer executable instructions. When the computer executable instructions are executed, they can:

[0102] Based on the bit error meter, the first variable ISI board and the oscilloscope, a standard electrical signal generation link is constructed, and a standard electrical signal that conforms to a preset eye diagram specification is constructed through the standard electrical signal generation link;

[0103] In combination with the second variable ISI board, and based on the maximum insertion loss value corresponding to the first optical communication interface of the switch, a worst receiving link is constructed;

[0104] Connecting the second optical communication interface of the switch to the test link, and sending a signal of a standard test pattern through the second optical communication interface;

[0105] The receiving bit error rate corresponding to the first optical communication interface is counted through the worst receiving link, and the electrical signal quality of the optical communication interface of the switch is determined according to the statistical result.

[0106] Each embodiment in this application is described in a progressive manner, and the same or similar parts between the embodiments can be referred to each other, and each embodiment focuses on the differences from other embodiments. In particular, for the device and medium embodiments, since they are basically similar to the method embodiments, the description is relatively simple, and the relevant parts can be referred to the partial description of the method embodiments.

[0107] The above describes specific embodiments of the present application. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps recorded in the claims can be performed in an order different from that in the embodiments and still achieve the desired results. In addition, the processes depicted in the accompanying drawings do not necessarily require the specific order or continuous order shown to achieve the desired results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0108] The devices and media provided in the embodiments of the present application correspond one-to-one to the methods. Therefore, the devices and media also have similar beneficial technical effects as the corresponding methods. Since the beneficial technical effects of the methods have been described in detail above, the beneficial technical effects of the devices and media will not be repeated here.

[0109] Those skilled in the art will appreciate that the embodiments of the present application may be provided as methods, systems, or computer program products. Therefore, the present application may adopt the form of a complete hardware embodiment, a complete software embodiment, or an embodiment in combination with software and hardware. Moreover, the present application may adopt the form of a computer program product implemented in one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) that include computer-usable program code.

[0110] The present application is described with reference to the flowcharts and / or block diagrams of the methods, devices (systems), and computer program products according to the embodiments of the present application. It should be understood that each process and / or box in the flowchart and / or block diagram, as well as the combination of the processes and / or boxes in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to generate a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0111] These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing device to operate in a specific manner, so that the instructions stored in the computer-readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0112] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for implementing the process. Figure 1 A process or multiple processes and / or boxes Figure 1 The steps for the functions specified in one or more boxes.

[0113] In a typical configuration, a computing device includes one or more processors (CPU), input / output interfaces, network interfaces, and memory.

[0114] The memory may include non-permanent storage in a computer-readable medium, random access memory (RAM) and / or non-volatile memory in the form of read-only memory (ROM) or flash RAM. The memory is an example of a computer-readable medium.

[0115] Computer readable media include permanent and non-permanent, removable and non-removable media that can be implemented by any method or technology to store information. Information can be computer readable instructions, data structures, program modules or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technology, compact disk read-only memory (CD-ROM), digital versatile disk (DVD) or other optical storage, magnetic cassettes, magnetic tape disk storage or other magnetic storage devices or any other non-transmission media that can be used to store information that can be accessed by a computing device. As defined herein, computer readable media does not include temporary computer readable media (transitory media), such as modulated data signals and carrier waves.

[0116] It should also be noted that the terms "include", "comprises" or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, commodity or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, commodity or device. In the absence of more restrictions, the elements defined by the sentence "comprises a ..." do not exclude the existence of other identical elements in the process, method, commodity or device including the elements.

[0117] The above is only an embodiment of the present application and is not intended to limit the present application. For those skilled in the art, the present application may have various changes and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application should be included in the scope of the claims of the present application.

Claims

1. A method for testing the quality of electrical signals of an optical communication interface of a switch, characterized in that: The method comprises: Based on the bit error meter, the first variable ISI board and the oscilloscope, a standard electrical signal generation link is constructed, and a standard electrical signal that conforms to a preset eye diagram specification is constructed through the standard electrical signal generation link; In combination with the second variable ISI board, and based on the maximum insertion loss value corresponding to the first optical communication interface of the switch, a worst receiving link is constructed; Connecting the second optical communication interface of the switch to the test link, and sending a signal of a standard test pattern through the second optical communication interface; The worst receiving link is used to collect statistics on the receiving bit error rate corresponding to the first optical communication interface, and the electrical signal quality of the optical communication interface of the switch is determined according to the statistical results.

2. A method for testing the quality of electrical signals of an optical communication interface of a switch according to claim 1, characterized in that: Based on the bit error tester, the first variable ISI board and the oscilloscope, a standard electrical signal generation link is constructed, which specifically includes: Based on the code generator in the bit error tester, a signal of a standard test code pattern is issued, and the signal of the standard test code pattern is sent to the oscilloscope via the first variable ISI board.

3. A method for testing the quality of electrical signals of an optical communication interface of a switch according to claim 1, characterized in that: The standard electrical signal generation link is used to construct a standard electrical signal that conforms to a preset eye diagram specification, specifically including: Adjusting parameters of a bit error meter in the standard electrical signal generation link, and adjusting the insertion loss value of a first variable ISI board in the standard electrical signal generation link; By means of the oscilloscope, the eye diagram data corresponding to the parameter adjustment and the insertion loss value adjustment are measured; the parameters include random jitter parameters, sinusoidal jitter parameters and noise parameters, and the eye diagram data include eye width and eye height; When the eye width and the eye height in the eye diagram data are consistent with the preset eye diagram specification, it is determined that the signal at the test point is a constructed standard electrical signal.

4. A method for testing the quality of electrical signals of an optical communication interface of a switch according to claim 1, characterized in that: In combination with the second variable ISI board and based on the maximum insertion loss value corresponding to the first optical communication interface of the switch, before constructing the worst receiving link, the method further includes: Enable the bit error statistics function corresponding to the first optical communication interface of the switch; The insertion loss of the second variable ISI board is adjusted, and the bit error rate corresponding to the reception of the first optical communication interface under different insertion losses is recorded.

5. A method for testing the quality of electrical signals of an optical communication interface of a switch according to claim 4, characterized in that: In combination with the second variable ISI board, and based on the maximum insertion loss value corresponding to the first optical communication interface of the switch, a worst receiving link is constructed, specifically including: gradually increasing the insertion loss of the second variable ISI board until the bit error rate received by the first optical communication interface is equal to a preset bit error rate threshold, and determining a maximum insertion loss value of the first optical communication interface when receiving the corresponding maximum bit error rate; When the insertion loss of the second variable ISI board is the maximum insertion loss value, inserting the standard electrical signal into the second variable ISI board and sending it to the first optical communication interface of the switch via the HCB fixture; A link between the standard electrical signal and the first optical communication interface is determined to be a worst reception link of the structure.

6. A method for testing the quality of electrical signals of optical communication interfaces of switches according to claim 1, characterized in that: Connecting the second optical communication interface of the switch to the test link, and sending a signal of a standard test pattern through the second optical communication interface, specifically includes: Connecting the second optical communication interface of the switch to the test link, and based on the pattern generator, sending a signal of a standard test pattern through the second optical communication interface; The signal of the standard test pattern is sent to the worst receiving link via the HCB fixture, and the standard electrical signal is inserted between the HCB fixture and the worst receiving link.

7. A method for testing the quality of electrical signals of optical communication interfaces of switches according to claim 1, characterized in that: The step of collecting statistics on a receiving bit error rate corresponding to the first optical communication interface through the worst receiving link specifically includes: sending the standard electrical signal inserted into the worst receiving link to the first optical communication interface of the switch via the second variable ISI board and the HCB fixture; Based on the bit error statistics function of the first optical communication interface and via the worst interface link, statistics are collected on the received bit error rate corresponding to the standard electrical signal at the first optical communication interface to obtain corresponding statistical results.

8. A method for testing the quality of electrical signals of optical communication interfaces of switches according to claim 1, characterized in that: According to the statistical results, determine the electrical signal quality of the switch optical communication interface, including: When the bit error rate in the statistical result is less than a preset bit error rate threshold, determining that the quality of the electrical signal sent by the second optical communication interface of the switch meets the preset specification standard; When the bit error rate in the statistical result is greater than the preset bit error rate threshold, it is determined that the quality of the electrical signal sent by the second optical communication interface of the switch does not meet the preset specification standard.

9. A switch optical communication interface electrical signal quality test device, characterized in that: The device comprises: at least one processor; and, a memory communicatively coupled to the at least one processor; The memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor can execute the method for testing the quality of electrical signals of an optical communication interface of a switch as described in any one of claims 1-8.

10. A non-volatile computer storage medium storing computer executable instructions, characterized in that: When the computer executable instructions are executed, a method for testing the quality of electrical signals of an optical communication interface of a switch as described in any one of claims 1 to 8 is implemented.

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