Electron paramagnetic resonance probe and electron paramagnetic resonance spectrometer

Abstract

The invention discloses an electron paramagnetic resonance probe and an electron paramagnetic resonance spectrometer. The electron paramagnetic resonance probe comprises a metal probe body; the metal probe body comprises a first auxiliary resonant cavity, a first gap, a main resonant cavity, a second gap and a second auxiliary resonant cavity which are sequentially arranged along a first direction; the first auxiliary resonant cavity is communicated with the main resonant cavity through a first gap; the main resonant cavity is communicated with the second auxiliary resonant cavity through a second gap; the boundary of the main resonant cavity comprises a first arc and a second arc which are oppositely arranged at an interval; the first arc and the second arc are symmetrical about a first symmetry axis which is parallel to the first direction; the boundary of the first auxiliary resonant cavity and the boundary of the second auxiliary resonant cavity are symmetrical about a second symmetry axis of the first circle, and the straight line where the second symmetry axis is located is perpendicular to the first direction. According to the electron paramagnetic resonance probe and the electron paramagnetic resonance spectrometer, the structure is simple, the manufacturing cost is low, the uniformity of the magnetic field in the main resonant cavity is good, and the magnetic field intensity is large.

Description

Technical Field

[0001] The invention relates to the technical field of electron paramagnetic resonance, and in particular to an electron paramagnetic resonance probe and an electron paramagnetic resonance spectrometer. Background Art

[0002] An important unit in the electron paramagnetic resonance (EPR) spectrometer is the metal probe.

[0003] The metal probe includes a resonant cavity. The role of the resonant cavity in the entire EPR spectrometer test is to convert the microwave signal input by the microwave bridge transmitter into an oscillating magnetic field in the area where the sample to be tested is located to stimulate the electron spin transition of the sample to be tested, and convert the electromagnetic field signal carrying the EPR signal into a measurable microwave signal to be transmitted to the microwave bridge receiver.

[0004] The specific situation in the resonant cavity is as follows: after the microwave signal enters the resonant cavity, an alternating electric field and magnetic field will be generated in the cavity space. The sample to be tested will absorb microwave energy due to dielectric loss in the alternating electric field. On the one hand, this will reduce the Q value of the resonant cavity, and on the other hand, it will cause the sample to be tested to heat up. These are unfavorable factors, so special attention should be paid during design. In addition, only alternating magnetic fields can cause paramagnetic resonance, so when designing the resonant cavity, the requirement for the sample area is that the magnetic field should be as strong as possible.

[0005] The resonant cavity currently used has a complex structure and high manufacturing cost. Summary of the invention

[0006] The invention provides an electron paramagnetic resonance probe and an electron paramagnetic resonance spectrometer, which have simple structure, low manufacturing cost, good magnetic field uniformity and high magnetic field intensity in a main resonance cavity.

[0007] According to one aspect of the present invention, an electron paramagnetic resonance probe is provided, the electron paramagnetic resonance probe comprising: a metal probe body;

[0008] The metal probe body comprises a first sub-resonance cavity, a first gap, a main resonance cavity, a second gap and a second sub-resonance cavity which are arranged in sequence along a first direction;

[0009] The first sub-resonant cavity is connected to the main resonant cavity through the first gap; the main resonant cavity is connected to the second sub-resonant cavity through the second gap;

[0010] The depth of the first sub-resonance cavity, the depth of the first gap, the depth of the main resonance cavity, the depth of the second gap and the depth of the second sub-resonance cavity are all equal to the thickness of the metal probe body;

[0011] The main resonant cavity is used to accommodate the sample to be tested;

[0012] The boundary of the main resonant cavity includes a first circular arc and a second circular arc that are spaced apart and arranged opposite to each other; the arc length of the first circular arc is equal to the arc length of the second circular arc, the first circular arc and the second circular arc are both in a first circle, the first circular arc and the second circular arc are symmetrical about a first symmetry axis, and the first symmetry axis is parallel to the first direction;

[0013] The boundary of the first sub-resonant cavity and the boundary of the second sub-resonant cavity are symmetrical about a second symmetry axis of the first circle, and the straight line where the second symmetry axis lies is perpendicular to the first direction.

[0014] Optionally, the boundary of the first sub-resonant cavity includes a third circular arc;

[0015] The radius of the circle where the third arc is located is equal to the radius of the first circle.

[0016] Optionally, the boundary of the first sub-resonant cavity includes a fourth circular arc, a fifth circular arc and a first curve;

[0017] The fourth arc and the fifth arc are spaced apart and located in the second circle; the center of the second circle is the same as the center of the first circle; the arc length of the fourth arc is equal to the arc length of the fifth arc; the first end of the fourth arc is connected to the first end of the first curve, and the first end of the fifth arc is connected to the second end of the first curve; the fourth arc and the fifth arc are both located on the side of the first curve close to the main resonant cavity; the first curve is a parabola; and the line connecting the vertex of the parabola and the center of the first circle is parallel to the first direction.

[0018] Optionally, the boundary of the first sub-resonant cavity further includes a sixth circular arc and a seventh circular arc;

[0019] The first end of the sixth arc is connected to the first end of the fourth arc, and the second end of the sixth arc is connected to the first end of the first curve;

[0020] The first end of the seventh arc is connected to the first end of the fifth arc, and the second end of the seventh arc is connected to the second end of the first curve.

[0021] Optionally, the length of the metal probe body is less than or equal to 20 mm;

[0022] The width of the metal probe body is less than or equal to 10 mm.

[0023] Optionally, the electron paramagnetic resonance probe provided in this embodiment further includes a dielectric plate and a microstrip line;

[0024] The dielectric plate is located on one side of the metal probe body;

[0025] The dielectric plate is at a set distance from the metal probe body;

[0026] The dielectric plate comprises a groove, and the groove is used to accommodate the microstrip line;

[0027] The microstrip line is used for receiving a pulse current to generate an alternating magnetic field.

[0028] Optionally, the electron paramagnetic resonance probe provided in this embodiment further includes a sample tube;

[0029] The sample tube is arranged in the main resonant cavity;

[0030] The sample tube is used to contain the sample to be tested.

[0031] Optionally, the electron paramagnetic resonance probe provided in this embodiment further includes at least one adjustable support rod;

[0032] The metal probe body further comprises first through holes having the same number as the adjustable support rods;

[0033] The adjustable support rod is located in the first through hole, and the adjustable support rod is used to support the metal probe body.

[0034] Optionally, the electron paramagnetic resonance probe provided in this embodiment further includes a shielding cover;

[0035] The shielding cover surrounds part of the metal probe body and the dielectric plate;

[0036] The shielding cover comprises a second through hole and a third through hole; the second through hole is arranged opposite to the third through hole;

[0037] The orthographic projection of the second through hole on the dielectric plate coincides with the orthographic projection of the third through hole on the dielectric plate; the orthographic projection of the second through hole on the dielectric plate covers the orthographic projection of the sample tube on the dielectric plate.

[0038] According to another aspect of the present invention, an electron paramagnetic resonance spectrometer is provided. The electron paramagnetic resonance spectrometer includes the electron paramagnetic resonance probe provided by any embodiment of the present invention.

[0039] An embodiment of the present invention provides an electron paramagnetic resonance probe, which includes a metal probe body. The metal probe body includes a first sub-resonant cavity, a first gap, a main resonant cavity, a second gap, and a second sub-resonant cavity arranged in sequence and connected along a first direction. The boundary of the main resonant cavity includes a first arc and a second arc that are spaced and arranged oppositely, the first arc and the second arc are both in the first circle, the first arc and the second arc are symmetrical about the first symmetry axis, and the first symmetry axis is parallel to the first direction. The main resonant cavity is used to accommodate a sample to be tested, and can realize EPR detection of the sample to be tested. It can be seen that the electron paramagnetic resonance probe provided in this embodiment can perform EPR detection on the sample to be tested, and has the characteristics of simple structure, easy to manufacture, and can reduce the manufacturing cost. In this embodiment, by arranging the first sub-resonant cavity and the second sub-resonant cavity on both sides of the main resonant cavity, the magnetic flux generated by the main resonant cavity can be returned to the main resonant cavity after passing through the first sub-resonant cavity and the second sub-resonant cavity, thereby increasing the magnetic flux of the main resonant cavity and improving the EPR detection effect of the sample to be tested. The boundary of the first sub-resonant cavity and the boundary of the second sub-resonant cavity are set symmetrically about the second symmetry axis of the first circle, so that the magnetic flux distribution of the main resonant cavity can be more uniform. In summary, the electron paramagnetic resonance probe provided in this embodiment has a simple structure, low manufacturing cost, and good magnetic field uniformity and high magnetic field strength in the main resonant cavity.

[0040] It should be understood that the contents described in this section are not intended to identify the key or important features of the embodiments of the present invention, nor are they intended to limit the scope of the present invention. Other features of the present invention will become easily understood through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0041] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0042] Figure 1 is a schematic structural diagram of an electron paramagnetic resonance probe provided according to an embodiment of the present invention;

[0043] Figure 2 is a schematic structural diagram of another electron paramagnetic resonance probe provided according to an embodiment of the present invention;

[0044] Figure 3 yes Figure 2 Schematic diagram of the magnetic field line distribution of the electron paramagnetic resonance probe shown;

[0045] Figure 4 is a schematic structural diagram of another electron paramagnetic resonance probe provided according to an embodiment of the present invention;

[0046] Figure 5 yes Figure 1 A schematic diagram of the top view of the structure of the electron paramagnetic resonance probe shown;

[0047] Figure 6 yes Figure 5 Schematic diagram of the electric field distribution of the electron paramagnetic resonance probe shown;

[0048] Figure 7 is a schematic structural diagram of another electron paramagnetic resonance probe provided according to an embodiment of the present invention;

[0049] Figure 8 is a schematic diagram of the three-dimensional structure of another electron paramagnetic resonance probe provided according to an embodiment of the present invention;

[0050] Fig. 9 yes Figure 8 The main structural schematic diagram of the electron paramagnetic resonance probe shown;

[0051] Fig.10 yes Figure 8 A schematic diagram of the top view of the electron paramagnetic resonance probe shown;

[0052] Fig.11 Detailed Description of the Invention This is a schematic structural diagram of another electron paramagnetic resonance probe provided according to an embodiment of the present invention. DETAILED DESCRIPTION

[0053] In order to enable those skilled in the art to better understand the scheme of the present invention, the technical scheme in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present invention.

[0054] It should be noted that the terms "first", "second", etc. in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units that are clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0055] Figure 1 is a schematic diagram of the structure of an electron paramagnetic resonance probe provided according to an embodiment of the present invention, with reference to Figure 1 The electron paramagnetic resonance probe provided in this embodiment includes: a metal probe body 110; the metal probe body 110 includes a first sub-resonant cavity 111, a first gap 112, a main resonant cavity 113, a second gap 114, and a second sub-resonant cavity 115 arranged in sequence along a first direction X; the first sub-resonant cavity 111 is connected to the main resonant cavity 113 through the first gap 112; the main resonant cavity 113 is connected to the second sub-resonant cavity 115 through the second gap 114; the depth of the first sub-resonant cavity 111, the depth of the first gap 112, the depth of the main resonant cavity 113, the depth of the second gap 114, and the depth of the second sub-resonant cavity 115 are all the same as the depth of the metal probe. The thickness of the head body 110 is equal; the main resonant cavity 113 is used to accommodate the sample to be tested; the boundary of the main resonant cavity 113 includes a first arc 1131 and a second arc 1132 that are spaced apart and arranged opposite to each other, the arc length of the first arc 1131 is equal to the arc length of the second arc 1132, the first arc 1131 and the second arc 1132 are both in the first circle, the first arc 1131 and the second arc 1132 are symmetrical about the first symmetry axis, and the first symmetry axis is parallel to the first direction X; the boundary of the first sub-resonant cavity 111 and the boundary of the second sub-resonant cavity 115 are symmetrical about the second symmetry axis of the first circle, and the straight line where the second symmetry axis is located is perpendicular to the first direction X.

[0056] Specifically, the first arc 1131 and the second arc 1132 are separated by the width of the first gap 112 and the width of the second gap 114. The width of the first gap 112 is equal to the width of the second gap 114, and the length of the first gap 112 is equal to the length of the second gap 114.

[0057] The straight line where the second symmetry axis is located is parallel to the second direction Y. The material of the metal probe body 110 can be copper. The depth of the first sub-resonance cavity 111, the depth of the first gap 112, the depth of the main resonant cavity 113, the depth of the second gap 114 and the depth of the second sub-resonance cavity 115 all refer to the length along the third direction, and the third direction is perpendicular to the first direction X and the second direction Y.

[0058] The boundary of the first sub-resonant cavity 111, the boundary of the main resonant cavity 113, and the boundary of the second sub-resonant cavity 115 may be located in the same plane. The boundary of the first sub-resonant cavity 111 refers to the shape obtained by cutting the first sub-resonant cavity 111 along the second direction Y. The boundary of the main resonant cavity 113 refers to the shape obtained by cutting the main resonant cavity 113 along the second direction Y. The boundary of the second sub-resonant cavity 115 refers to the shape obtained by cutting the second sub-resonant cavity 115 along the second direction Y. The boundary of the first sub-resonant cavity 111 and the boundary of the second sub-resonant cavity 115 are symmetrical about the second symmetry axis of the first circle, that is, the boundary of the first sub-resonant cavity 111 and the boundary of the second sub-resonant cavity 115 are the same. The boundary of the first sub-resonant cavity 111 may be the same as the boundary of the main resonant cavity 113. The boundary of the first sub-resonant cavity 111 may also be a "meniscus".

[0059] The first sub-resonance cavity 111, the main resonance cavity 113 and the second sub-resonance cavity 115 in the metal probe body 110 can be used as inductors, and the first gap 112 and the second gap 114 can be used as capacitors, thereby realizing EPR detection of the sample to be tested. Compared with the electron paramagnetic resonance probe provided by the prior art, the electron paramagnetic resonance probe provided in this embodiment can perform EPR detection on the sample to be tested by setting three resonant cavities, and has the characteristics of simple structure, easy manufacturing, and can reduce the manufacturing cost of the metal probe body 110.

[0060] The electron paramagnetic resonance probe provided in this embodiment may also include a microstrip line, which is used to connect to an external pulse current. When performing EPR detection on a sample to be tested, the sample to be tested is placed in the main resonant cavity 113, and the microstrip line is connected to an external pulse current, thereby generating an alternating magnetic field. The metal probe body 110 is affected by the magnetic field, and a current is formed on the surface of the metal probe body 110, generating an alternating electric field at the first gap 112 and the second gap 114, and the alternating electric field generates a strong alternating magnetic field. The magnetic field energy of the main resonant cavity 113 is much higher than the magnetic field energy in the first sub-resonant cavity 111 and the second sub-resonant cavity 115. It can be seen that the electron paramagnetic resonance probe provided in this embodiment can improve the magnetic field strength of the main resonant cavity 113, thereby improving the EPR detection effect of the sample to be tested.

[0061] In this embodiment, the boundary of the first sub-resonant cavity 111 and the boundary of the second sub-resonant cavity 115 are symmetrical about the second symmetry axis, which can make the magnetic field energy distribution in the main resonant cavity 113 uniform, thereby further improving the EPR detection effect of the sample to be tested.

[0062] The present embodiment provides an electron paramagnetic resonance probe, which includes a metal probe body. The metal probe body includes a first sub-resonant cavity, a first gap, a main resonant cavity, a second gap, and a second sub-resonant cavity arranged in sequence and connected along a first direction. The boundary of the main resonant cavity includes a first arc and a second arc that are spaced and arranged oppositely, the first arc and the second arc are both in the first circle, the first arc and the second arc are symmetrical about the first symmetry axis, and the first symmetry axis is parallel to the first direction. The main resonant cavity is used to accommodate a sample to be tested, and can realize EPR detection of the sample to be tested. It can be seen that the electron paramagnetic resonance probe provided in this embodiment can perform EPR detection on the sample to be tested, and has the characteristics of simple structure, easy to manufacture, and can reduce the manufacturing cost. In this embodiment, by arranging the first sub-resonant cavity and the second sub-resonant cavity on both sides of the main resonant cavity, the magnetic flux generated by the main resonant cavity can be returned to the main resonant cavity after passing through the first sub-resonant cavity and the second sub-resonant cavity, thereby increasing the magnetic flux of the main resonant cavity and improving the EPR detection effect of the sample to be tested. The boundary of the first sub-resonant cavity and the boundary of the second sub-resonant cavity are set symmetrically about the second symmetry axis of the first circle, so that the magnetic flux distribution of the main resonant cavity can be more uniform. In summary, the electron paramagnetic resonance probe provided in this embodiment has a simple structure, low manufacturing cost, and good magnetic field uniformity and high magnetic field strength in the main resonant cavity.

[0063] Optional, Figure 2 is a schematic diagram of the structure of another electron paramagnetic resonance probe provided according to an embodiment of the present invention, with reference to Figure 2 , the boundary of the first sub-resonant cavity 111 includes a third circular arc 1111; the radius of the circle where the third circular arc 1111 is located is equal to the radius of the first circle.

[0064] Specifically, the first end of the third circular arc 1111 is spaced from the second end of the third circular arc 1111 by the width of the first gap 112. Since the shape of the boundary of the first sub-resonant cavity 111 is symmetrical to the shape of the boundary of the second sub-resonant cavity 115, the shape of the boundary of the second sub-resonant cavity 115 also includes the third circular arc 1111. Figure 3 yes Figure 2 Schematic diagram of the magnetic field line distribution of the electron paramagnetic resonance probe shown in Figure 1. Figure 3 The first sub-resonant cavity 111 and the second sub-resonant cavity 115 serve as channels for the microwave magnetic field flux of the main resonant cavity 113 to flow back. There are equi-electromotive forces at the first gap 112 and the second gap 114. The magnetic field energy stored in the main resonant cavity 113 in which the sample to be tested is stored is much stronger than the magnetic field energy of the first sub-resonant cavity 111 and the magnetic field energy of the second sub-resonant cavity 115.

[0065] Optional, Figure 4 is a schematic diagram of the structure of another electron paramagnetic resonance probe provided according to an embodiment of the present invention, with reference to Figure 4, the boundary of the first sub-resonant cavity 111 includes the fourth arc 10, the fifth arc 11 and the first curve 20; the fourth arc 10 and the fifth arc 11 are spaced apart and located in the second circle; the center of the second circle is the same as the center of the first circle; the arc length of the fourth arc 10 is equal to the arc length of the fifth arc 11; the first end of the fourth arc 10 is connected to the first end of the first curve 20, and the first end of the fifth arc 10 is connected to the second end of the first curve 20; the fourth arc 10 and the fifth arc 11 are both located on the side of the first curve 20 close to the main resonant cavity 113; the first curve 20 is a parabola; the line connecting the vertex of the parabola and the center of the first circle is parallel to the first direction X.

[0066] Specifically, the second end of the fourth arc 10 and the second end of the fifth arc 11 are separated by the width of the first gap 113. The boundary of the first sub-resonant cavity 111 is symmetrical about the third symmetry axis, and the third symmetry axis is parallel to the first direction X. The shape of the boundary of the first sub-resonant cavity 111 can be regarded as a "crescent shape". The shape of the first sub-resonant cavity 111 and the shape of the second sub-resonant cavity 115 set in this embodiment are "crescent shapes", which can allow the first sub-resonant cavity 111 and the second sub-resonant cavity 115 to pass more magnetic induction lines, and the magnetic induction lines through the first sub-resonant cavity 111 and the second sub-resonant cavity 115 enter the main resonant cavity 113, so that there are more magnetic induction lines in the main resonant cavity 113, thereby improving the magnetic field strength of the main resonant cavity 113. In addition, the shape of the first sub-resonant cavity 111 and the shape of the second sub-resonant cavity 115 provided in this embodiment adopt a "crescent shape", which can enable the metal probe body 110 to retain more metal medium, thereby reducing the resonant frequency of the metal probe body 110. The electron paramagnetic resonance probe provided in this embodiment can ensure that the volume of the main resonant cavity 113 remains unchanged, so that the main resonant cavity 113 can accommodate more samples to be tested, and appropriately reduce the volume of the first sub-resonant cavity 111 and the volume of the second sub-resonant cavity 115 to increase the metal medium of the metal probe body 110, thereby reducing the resonant frequency of the metal probe body 110 when performing EPR detection on the sample to be tested, thereby improving the EPR detection effect of the sample to be tested.

[0067] Figure 4 Specifically, it is a schematic diagram of the electric field distribution of one of the electron paramagnetic resonance probes provided in this embodiment. In this embodiment, the first end of the fourth arc 10 of the first sub-resonance cavity 111 is directly connected to the first end of the first curve 20, and the first end of the fifth arc 11 is directly connected to the second end of the first curve 20, so that a sharp corner can be formed at the connection. The current at the sharp corner is not easy to escape, so that the current intensity of the main resonant cavity 113 can be increased.

[0068] Optional, Figure 5 yes Figure 1 The schematic diagram of the top view of the electron paramagnetic resonance probe shown in FIG. Figure 5, the boundary of the first sub-resonant cavity 111 also includes a sixth arc 30 and a seventh arc 40; the first end of the sixth arc 30 is connected to the first end of the fourth arc 10, and the second end of the sixth arc 30 is connected to the first end of the first curve 20; the first end of the seventh arc 40 is connected to the first end of the fifth arc 11, and the second end of the seventh arc 40 is connected to the second end of the first curve 20.

[0069] Specifically, the sixth arc 30 is provided so that the first curve 20 and the fourth arc 10 are connected by an arc, and the seventh arc 40 is provided so that the first curve 20 and the fifth arc 11 are connected by an arc, thereby facilitating the processing of the first sub-resonant cavity 111 and the second sub-resonant cavity 115, and preventing the metal probe body 110 from being damaged or scrapped when the first sub-resonant cavity 111 and the second sub-resonant cavity 115 are manufactured. The first sub-resonant cavity 111 and the second sub-resonant cavity 115 are manufactured in a small volume of metal medium and are not easily damaged or scrapped, which can enable the electron paramagnetic resonance probe to be miniaturized. And compared to Figure 4 The electron paramagnetic resonance probe shown uses the sixth arc 30 to connect the first curve 20 and the fourth arc 10, and uses the seventh arc 40 to connect the first curve 20 and the fifth arc 11, which can retain more metal medium of the metal probe body 110, thereby further reducing the resonant frequency of the metal probe body 110 when performing EPR detection on the sample to be tested, and improving the EPR detection effect of the sample to be tested. The radius of the circle where the sixth arc 30 is located and the radius of the circle where the seventh arc 40 is located can be the same. The shape of the boundary of the first sub-resonance cavity 111 provided in this embodiment is an axisymmetric figure, and its symmetry axis is parallel to the first direction X. Figure 6 yes Figure 5 Schematic diagram of the electric field distribution of the electron paramagnetic resonance probe shown in Figure 1. Figure 6 , the current intensity of the main resonant cavity 113 is relatively strong.

[0070] Optionally, the length of the metal probe body is less than or equal to 20 mm; the width of the metal probe body is less than or equal to 10 mm.

[0071] Specifically, the length of the metal probe body can be 20 mm, 19 mm, 18 mm, 17.5 mm or 17.5 mm, etc., and the width of the metal probe body can be 10 mm, 9.8 mm, 9.5 mm, 9 mm or 8 mm, etc. The electron paramagnetic resonance probe provided in this embodiment has the characteristic of small size and can be developed in the direction of miniaturization, thereby increasing the scope of application scenarios of the electron paramagnetic resonance probe.

[0072] Optional, Figure 7 is a schematic diagram of the structure of another electron paramagnetic resonance probe provided according to an embodiment of the present invention, with reference to Figure 7The electron paramagnetic resonance probe provided in this embodiment also includes a dielectric plate 120 and a microstrip line 130; the dielectric plate 120 is located on one side of the metal probe body 110; the dielectric plate 120 is at a set distance from the metal probe body 110; the dielectric plate 120 includes a groove, the groove is used to accommodate the microstrip line 130; the microstrip line 130 is used to receive a pulse current to generate an alternating magnetic field.

[0073] Specifically, the set distance can be set according to actual needs, and the set distance between the dielectric plate 120 and the metal probe body 110 is adjustable. The shape of the orthographic projection of the first sub-resonant cavity 111 on the dielectric plate 120 is the shape of the boundary of the first sub-resonant cavity 111, and the shape of the orthographic projection of the second sub-resonant cavity 115 on the dielectric plate 120 is the shape of the boundary of the second sub-resonant cavity 115. The dielectric plate 120 also includes a sample through hole, and the orthographic projection of the main resonant cavity 113 on the dielectric plate 120 is located in the sample through hole. The microstrip line 130 generates an alternating magnetic field, which causes the metal probe body 110 to generate a strong alternating magnetic field, so that the metal probe body 110 performs EPR detection on the sample to be tested.

[0074] Figure 8 is a schematic diagram of the three-dimensional structure of another electron paramagnetic resonance probe provided according to an embodiment of the present invention, Fig. 9 yes Figure 8 The main structural diagram of the electron paramagnetic resonance probe shown in FIG. Fig.10 yes Figure 8 The schematic diagram of the top view of the electron paramagnetic resonance probe shown in FIG. Figure 8-Figure 10 The electron paramagnetic resonance probe provided in this embodiment further includes a grounding wire 140 . The grounding wire 140 may be located on a side of the dielectric plate 120 away from the metal probe body 110 . The grounding wire 140 is electrically connected to the microstrip line 130 .

[0075] Optional, continue to refer to Figure 7 The electron paramagnetic resonance probe provided in this embodiment further includes a sample tube 150; the sample tube 150 is disposed in the main resonant cavity; the sample tube 150 is used to accommodate the sample to be tested.

[0076] Specifically, the sample tube 150 includes a sample cavity 151. When performing EPR detection on the sample to be tested, the sample to be tested is placed in the sample cavity 151 of the sample tube 150, which can protect the main resonant cavity from being corroded and damaged by the sample to be tested.

[0077] Optional, continue to refer to Figure 7 The electron paramagnetic resonance probe provided in this embodiment also includes at least one adjustable support rod 160; the metal probe body 110 also includes first through holes equal in number to the adjustable support rods 160; the adjustable support rods 160 are located in the first through holes, and the adjustable support rods 160 are used to support the metal probe body 110.

[0078] Specifically, the electron paramagnetic resonance probe may include one adjustable support rod 160, two adjustable support rods 160, or three adjustable support rods 160. The adjustable support rod 160 passes through the first through hole and can be fixed to the dielectric plate 120. The adjustable support rod can adjust the set distance between the metal probe body 110 and the dielectric plate 120.

[0079] Optional, Fig.11 is a schematic diagram of the structure of another electron paramagnetic resonance probe provided according to an embodiment of the present invention, with reference to Fig.11 The electron paramagnetic resonance probe provided in this embodiment also includes a shielding cover 170; the shielding cover 170 surrounds part of the metal probe body and the dielectric plate; the shielding cover 170 includes a second through hole and a third through hole; the second through hole is arranged opposite to the third through hole; the orthographic projection of the second through hole on the dielectric plate coincides with the orthographic projection of the third through hole on the dielectric plate; the orthographic projection of the second through hole on the dielectric plate covers the orthographic projection of the sample tube on the dielectric plate.

[0080] Specifically, the shielding cover 170 can be made of metal, and is used to shield external interference and improve the detection accuracy of the electron paramagnetic resonance probe on the sample to be tested. The second through hole and the third through hole on the shielding cover 170 allow the sample tube to pass through and enter the main resonant cavity.

[0081] This embodiment also provides an electron paramagnetic resonance spectrometer, which includes the electron paramagnetic resonance probe provided by any embodiment of the present invention.

[0082] It should be understood that the various forms of processes shown above can be used to reorder, add or delete steps. For example, the steps described in the present invention can be executed in parallel, sequentially or in different orders, as long as the desired results of the technical solution of the present invention can be achieved, and this document does not limit this.

[0083] The above specific implementations do not constitute a limitation on the protection scope of the present invention. It should be understood by those skilled in the art that various modifications, combinations, sub-combinations and substitutions can be made according to design requirements and other factors. Any modification, equivalent substitution and improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. An electron paramagnetic resonance probe, characterized in that: include: Metal probe body; The metal probe body comprises a first sub-resonance cavity, a first gap, a main resonance cavity, a second gap and a second sub-resonance cavity which are arranged in sequence along a first direction; The first sub-resonant cavity is connected to the main resonant cavity through the first gap; the main resonant cavity is connected to the second sub-resonant cavity through the second gap; The depth of the first sub-resonance cavity, the depth of the first gap, the depth of the main resonance cavity, the depth of the second gap and the depth of the second sub-resonance cavity are all equal to the thickness of the metal probe body; The main resonant cavity is used to accommodate the sample to be tested; The boundary of the main resonant cavity includes a first circular arc and a second circular arc that are spaced apart and arranged opposite to each other; the arc length of the first circular arc is equal to the arc length of the second circular arc, the first circular arc and the second circular arc are both in a first circle, the first circular arc and the second circular arc are symmetrical about a first symmetry axis, and the first symmetry axis is parallel to the first direction; The boundary of the first sub-resonant cavity and the boundary of the second sub-resonant cavity are symmetrical about a second symmetry axis of the first circle, and the straight line where the second symmetry axis lies is perpendicular to the first direction.

2. The electron paramagnetic resonance probe according to claim 1, characterized in that: The boundary of the first sub-resonant cavity includes a third circular arc; The radius of the circle where the third arc is located is equal to the radius of the first circle.

3. The electron paramagnetic resonance probe according to claim 1, characterized in that: The boundary of the first sub-resonant cavity includes a fourth circular arc, a fifth circular arc and a first curve; The fourth arc and the fifth arc are spaced apart and located in the second circle; the center of the second circle is the same as the center of the first circle; the arc length of the fourth arc is equal to the arc length of the fifth arc; the first end of the fourth arc is connected to the first end of the first curve, and the first end of the fifth arc is connected to the second end of the first curve; the fourth arc and the fifth arc are both located on the side of the first curve close to the main resonant cavity; the first curve is a parabola; and the line connecting the vertex of the parabola and the center of the first circle is parallel to the first direction.

4. The electron paramagnetic resonance probe according to claim 3, characterized in that: The boundary of the first sub-resonant cavity further includes a sixth circular arc and a seventh circular arc; The first end of the sixth arc is connected to the first end of the fourth arc, and the second end of the sixth arc is connected to the first end of the first curve; The first end of the seventh arc is connected to the first end of the fifth arc, and the second end of the seventh arc is connected to the second end of the first curve.

5. The electron paramagnetic resonance probe according to claim 1, characterized in that: The length of the metal probe body is less than or equal to 20 mm; The width of the metal probe body is less than or equal to 10 mm.

6. The electron paramagnetic resonance probe according to claim 1, characterized in that: It also includes dielectric plates and microstrip lines; The dielectric plate is located on one side of the metal probe body; The dielectric plate is at a set distance from the metal probe body; The dielectric plate comprises a groove, and the groove is used to accommodate the microstrip line; The microstrip line is used for receiving a pulse current to generate an alternating magnetic field.

7. The electron paramagnetic resonance probe according to claim 6, characterized in that: Also included are sample tubes; The sample tube is arranged in the main resonant cavity; The sample tube is used to contain the sample to be tested.

8. The electron paramagnetic resonance probe according to claim 6, characterized in that: Also included is at least one adjustable support rod; The metal probe body further comprises first through holes having the same number as the adjustable support rods; The adjustable support rod is located in the first through hole, and the adjustable support rod is used to support the metal probe body.

9. The electron paramagnetic resonance probe according to claim 7, characterized in that: Also includes a shielding cover; The shielding cover surrounds part of the metal probe body and the dielectric plate; The shielding cover comprises a second through hole and a third through hole; the second through hole is arranged opposite to the third through hole; The orthographic projection of the second through hole on the dielectric plate coincides with the orthographic projection of the third through hole on the dielectric plate; the orthographic projection of the second through hole on the dielectric plate covers the orthographic projection of the sample tube on the dielectric plate.

10. An electron paramagnetic resonance spectrometer, characterized in that: The invention comprises the electron paramagnetic resonance probe as described in any one of claims 1 to 9.

Images