Gas sensor module batch test method and system

Abstract

The invention relates to the technical field of gas sensor module testing, and provides a gas sensor module batch testing method and system, and the method comprises the steps: selecting a testing bottom plate as a main testing bottom plate, and selecting other testing bottom plates as auxiliary testing bottom plates; the test bottom plate is provided with one or more gas sensor modules to be tested; a test signal is sent to the test controller of the master test base plate, and the test controller of the master test base plate sends a test signal to the test controller of the slave test base plate; the test controller sends a test instruction to the gas sensor module, and the gas sensor module tests gas in the test cavity and generates test data; carrying out statistics and analysis on the test data, carrying out performance calibration on the gas sensor module, and carrying out parameter calibration on the gas sensor module. The gas sensor module test board aims to solve the problems that the test capacity is limited and the test efficiency is low when gas sensor modules are tested, and the gas sensor modules on the same test board are mutually independent and do not interfere with one another.

Description

Technical Field

[0001] The present invention relates to the technical field of gas sensor module testing, and in particular to a gas sensor module batch testing method and system. Background Art

[0002] A gas sensor module is a modular device that integrates a gas sensor and a signal processing circuit to detect and output the concentration or other parameters of a specific gas. Gas sensor modules are widely used in environmental monitoring, industrial control, medical diagnosis, security alarm and other fields. In order to ensure the performance and reliability of gas sensor modules, they need to be tested comprehensively and accurately.

[0003] At present, such as the method provided in CN107561391A, this testing method has the following problems: 1. Limited test capacity: The number of serial ports or other interfaces on the PC side is limited, and generally only a small number of gas sensor modules can be tested at the same time, which cannot meet the application scenarios that require batch testing. Such as batch production calibration, consistency and difference verification, and scale-up verification of new gas sensors. 2. There is no unified performance calibration for the gas sensor modules that have completed the test, and the performance of the gas sensor modules fluctuates greatly.

[0004] Therefore, a gas sensor module batch testing method and system are needed to solve the above problems. Summary of the invention

[0005] In view of the above-mentioned defects, the purpose of the present invention is to propose a gas sensor module batch testing method and system, aiming to solve the problems of limited test capacity and low test efficiency when testing gas sensor modules, and to ensure that the performance of multiple gas sensor modules is the same when batch generating calibration.

[0006] To achieve this object, the present invention adopts the following technical solutions:

[0007] A gas sensor module batch testing method is applied to a device including a host computer, a test base plate and a plurality of test chambers, wherein a plurality of the test base plates are arranged in each test chamber, the test base plate includes a test controller and a multiplexing circuit, the multiplexing circuit expands the serial port of the test controller into a plurality of test serial ports, the test base plate includes a plurality of gas sensor modules, each test serial port is connected to a gas sensor module, and each of the test controllers is connected to each other in a communication manner, so that the gas sensor modules on the same test base plate do not interfere with each other, and the failure of a gas sensor module does not affect the test or calibration of other gas sensors;

[0008] The gas sensor module batch testing method comprises:

[0009] A test baseboard is selected as a main test baseboard, a non-test serial port of a test controller of the main test baseboard is connected to a host computer for communication after conversion, and the remaining test baseboards are slave test baseboards;

[0010] Sending a test signal to the test controller of the master test baseboard according to the test parameters, and the test controller of the master test baseboard sending the test signal to the test controller of the slave test baseboard;

[0011] The test controller sends a test instruction to the gas sensor module, and the gas sensor module tests the gas in the test chamber and generates test data;

[0012] The host computer performs statistics and analysis on the test data, performs performance calibration on the gas sensor module, and performs parameter calibration on the gas sensor module.

[0013] Preferably, a certain voltage is given to each gas sensor module, and after ventilation in the test chamber, the response resistance on the gas sensor is measured as the concentration of the target gas changes. The response resistance of the gas sensor satisfies the relationship:

[0014] z′=X*z / (Yz)

[0015] Wherein, z′ is the response resistance after calibration, X represents the reference resistance value, z is the digital signal data of the gas sensor module, and Y represents the conversion value of the test controller at different digits.

[0016] Preferably, the test baseboard further includes a hardware encoding circuit;

[0017] The selecting a test board as the main test board includes: setting different version numbers for the test boards according to the hardware coding circuit, and selecting the test board with the same version number as the preset value as the main test board through the DIP switch.

[0018] Preferably, the test base plate is also provided with an LED display light;

[0019] The method of selecting the test base plate with the same version number as the preset value as the main test base plate by the DIP switch includes:

[0020] The test baseboard is dialed, and if the board number after dialing is the same as the version number, the LED display light flashes at a first frequency;

[0021] If the board number after dialing is different from the version number, the LED display light flashes at the second frequency.

[0022] Preferably, a non-test serial port of the test controller of the main test baseboard is connected to the host computer for communication after conversion, including:

[0023] Convert the TTL serial port of the test controller to a USB serial port and communicate with the host computer through the USB serial port.

[0024] Preferably, before sending the test signal to the test controller of the main test baseboard according to the test parameters, the method includes: setting the test parameters in the built-in software of the host computer;

[0025] The test parameters include test time, concentration and type of the gas to be tested.

[0026] A gas sensor module batch test system is applied to a device including a host computer, a test base plate and a plurality of test chambers, wherein a plurality of the test base plates are arranged in each test chamber, the test base plate includes a test controller and a multiplexing circuit, the multiplexing circuit expands the serial port of the test controller into a plurality of test serial ports, the test chamber includes gas and a plurality of gas sensor modules, each test serial port is connected to a gas sensor module, and each of the test controllers is connected to each other in communication;

[0027] The gas sensor module batch testing system comprises:

[0028] The mainboard selection module is used to select a test baseboard as the main test baseboard, and a non-test serial port of the test controller of the main test baseboard is communicated with the host computer after conversion, and the remaining test baseboards are slave test baseboards;

[0029] A signal transmission module, used for sending a test signal to the test controller of the main test baseboard according to the test parameters, and the test controller of the main test baseboard sends the test signal to the test controller of the slave test baseboard;

[0030] A test module, used to control the test controller to send a test instruction to the gas sensor module, and the gas sensor module tests the gas in the test chamber and generates test data;

[0031] The data processing and analysis module is used to control the host computer to perform statistics and analysis on the test data, and to perform performance calibration and parameter calibration on the gas sensor module.

[0032] The test baseboard also includes a hardware encoding circuit;

[0033] In the mainboard selection module, selecting a test baseboard as the main test baseboard includes:

[0034] Different version numbers are set for the test baseboards according to the hardware coding circuit, and the test baseboard with the same version number as the preset value is selected as the main test baseboard through the dip switch;

[0035] The test baseboard is also provided with an LED display light. In the mainboard selection module, the test baseboard with the same version number as the preset value is selected as the main test baseboard by the dip switch, including:

[0036] The test baseboard is dialed, and if the board number after dialing is the same as the version number, the LED display light flashes at a first frequency;

[0037] If the board number after dialing is different from the version number, the LED display light flashes at the second frequency;

[0038] In the data processing and analysis module, the performance calibration of the gas sensor module satisfies the relationship:

[0039] z′=X*z / (Yz)

[0040] Wherein, z′ is the response resistance after calibration, X represents the resistance value, z is the digital signal data of the gas sensor module, and Y represents the conversion value of the test controller at different digits.

[0041] One of the above technical solutions has the following advantages or beneficial effects:

[0042] The present invention has excellent scalability, and can realize the function of testing multiple gas sensor modules at the same time by increasing the number of test base plates, meeting the needs of large-scale testing. At the same time, each test base plate also has the function of multi-mode operation, and can select different serial port numbers and test parameters according to different test requirements, enhance the flexibility of the system, and provide a convenient data management and integration mechanism, through the communication bus, efficient data compression and aggregation are carried out between multiple test base plates, and the rapid transmission and processing of gas sensor module data are realized, bandwidth and time are saved, and test efficiency is improved. The gas sensor modules on the same test board are independent of each other and do not interfere with each other. At the same time, the host computer can display the output characteristic curve of the gas sensor module in real time, facilitate users to obtain and analyze test results, and calibrate the performance of the gas sensor module when the data is obtained, so as to ensure the consistency of the performance of each gas sensor module as much as possible. BRIEF DESCRIPTION OF THE DRAWINGS

[0043] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on the provided drawings without paying creative work.

[0044] Figure 1 It is a flow chart of a gas sensor module batch testing method provided by an embodiment of the present invention;

[0045] Figure 2 It is a test flow diagram of a gas sensor module batch test method provided by an embodiment of the present invention;

[0046] Figure 3 It is a structural schematic diagram of a gas sensor module batch testing system provided by an embodiment of the present invention;

[0047] Figure 4 It is a structural schematic diagram of a test base plate and a gas sensor module of a gas sensor module batch testing method provided by an embodiment of the present invention;

[0048] Figure 5 It is a curve chart displayed by the host computer of the gas sensor module batch testing method provided by the embodiment of the present invention. DETAILED DESCRIPTION

[0049] Embodiments of the present invention are described in detail below, examples of which are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and cannot be understood as limiting the present invention.

[0050] In the present invention, the terms "comprises", "comprising" or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of more restrictions, an element defined by the sentence "comprising a ..." does not exclude the presence of other identical elements in the process, method, article or device comprising the element.

[0051] like Figure 1 and Figure 4 As shown, a preferred embodiment of the present application is a gas sensor module batch testing method, which is applied to a device including a host computer, a test base plate and a plurality of test chambers, wherein a plurality of the test base plates are arranged in each test chamber, the test base plate includes a test controller and a multiplexing circuit, the multiplexing circuit expands the serial port of the test controller into a plurality of test serial ports, the test chamber includes gas and a plurality of gas sensor modules, each test serial port is connected to a gas sensor module, and each of the test controllers is connected to each other in a communication manner, so that the gas sensor modules on the same test base plate do not interfere with each other, and the failure of a gas sensor module does not affect the test or calibration of other gas sensors;

[0052] The gas sensor module batch testing method comprises the steps of:

[0053] S1: Select a test baseboard as the main test baseboard, a non-test serial port of the test controller of the main test baseboard is connected to the host computer through conversion, and the remaining test baseboards are slave test baseboards;

[0054] S2: sending a test signal to the test controller of the master test baseboard according to the test parameters, and the test controller of the master test baseboard sends the test signal to the test controller of the slave test baseboard;

[0055] S3: the test controller sends a test instruction to the gas sensor module, and the gas sensor module tests the gas in the test chamber and generates test data;

[0056] S4: The host computer performs statistics and analysis on the test data, performs performance calibration on the gas sensor module, and performs parameter calibration on the gas sensor module.

[0057] Among them, one test cavity corresponds to one test baseboard. The multiplexing circuit in the test baseboard expands one serial port of the test controller into multiple test interfaces. The multiplexing circuit allows the main controller to communicate with multiple sensor modules through a single serial port, effectively reducing the complexity of physical wiring, such as Figure 4 As shown, this embodiment uses time-division multiplexing in multiplexing. The multi-channel test serial port is connected to multiple gas sensor modules in the test chamber, and the data tested by the gas sensor modules will be transmitted to the test controller. The gas sensor modules on the same test base plate do not interfere with each other, and the failure of a gas sensor module does not affect the test or calibration of other gas sensors.

[0058] Specifically, in step S1, it is necessary to select one of several test boards as the main test board. It is worth noting that all test boards can be used as the main test board, which can be flexibly changed according to actual conditions in actual use. After the main test board is selected, a non-test serial port on the main test board is converted, and after being converted into other serial ports, it can communicate with the host computer. Once the main test board is set, the remaining test boards are regarded as slave test boards.

[0059] In step S2, the test controller may be connected via a communication bus, and the test parameters include but are not limited to test gas type, concentration range, temperature and humidity conditions, sampling frequency and duration, etc., which may affect the test results. After setting the parameters, an electronic signal containing the test parameter information is generated and sent to the test controller of the main test base through the serial port converted in step S1. After the main test base receives the test signal, the test controller of the main test base broadcasts the test signal to all slave test bases using the communication bus to ensure that all test bases also perform the test tasks with the same test parameters. It is worth noting that the communication bus is a physical or logical connection used to transmit data and signals in a computer or electronic device, which may be UART, SPI, I2C or RS-485, etc. In addition to sending test signals, the test bases will also exchange data through the communication bus. In practical applications, the data of the test base can be expanded or reduced according to actual conditions.

[0060] In step S3, after receiving the test signal, the test controller sends out a test instruction to each gas sensor module through the serial port expanded by the multiplexing circuit. The test instruction is changed according to different versions or models of gas sensor modules, and the content is different from the test signal, so a distinction is made. Both the test instruction and the test signal can be regarded as commands to control the execution of the test task. After the gas sensor module receives the test instruction, the gas sensor module tests the gas in the test cavity and collects the original data and concentration data of the gas.

[0061] In step S4, the test data generated by the gas sensor module is sent to the corresponding test controller. The test controller of the slave test board sends the test data to the test controller of the main test board through the communication bus. The test controller of the main test board compresses and summarizes the test data. After receiving the test data, the host computer performs statistics and analysis, such as Figure 2 As shown, Figure 2 The signal release and data flow process of this solution is described (only one gas sensor module and the main test base are shown). The performance of each sensor produced will not be exactly the same. In order to achieve the same performance requirements, a calibration formula is used to calibrate each module to keep their performance consistent as much as possible. After calibration, the corresponding output characteristic curve is displayed on the host computer, such as Figure 5 As shown, Figure 5The upper computer obtains the data sent by the test board, and then obtains the chart after filtering and data processing. This table shows the data of four modules on each board. The x-axis represents time, and the y-axis represents sensor data. The data with a relatively jittery curve in the figure is because it takes a certain amount of time for the sensor data to stabilize. The jittery output curve of the gas sensor module is because the gas sensor module is still in the heating process, and the data is not so stable. Based on the results of analysis and statistics, the calibration parameters of each module are calculated and sent to the test controller corresponding to the main test baseboard, and then sent to the corresponding gas sensor module. It is worth noting that the test controller can be a single-chip microcomputer or microcontroller that can perform specific tasks and logical operations according to pre-set programs and input signals. It is worth noting that the number of connections between the test baseboards and the number of gas sensor modules connected to the same test controller can be any number.

[0062] This solution has excellent scalability. By increasing the number of test boards, it can realize the function of testing multiple gas sensor modules at the same time to meet the needs of large-scale testing. At the same time, each test board also has the function of multi-mode operation. It can select different serial port numbers and test parameters according to different test requirements, which enhances the flexibility of the system and provides a convenient data management and integration mechanism. Through the communication bus, efficient data compression and aggregation are performed between multiple test boards, which realizes the rapid transmission and processing of gas sensor module data, saves bandwidth and time, and improves test efficiency. At the same time, the host computer can display the output characteristic curve of the gas sensor module in real time, which is convenient for users to obtain and analyze test results. When the data is obtained, the gas sensor module is calibrated to ensure the performance of each gas sensor module as consistent as possible.

[0063] Furthermore, the performance calibration of the gas sensor module satisfies the relationship:

[0064] z′=X*z / (Yz)

[0065] Among them, z′ is the calibrated data, X represents the resistance value, z is the digital signal data of the gas sensor module, and Y represents the conversion value of the test controller at different digits.

[0066] X represents the resistance value. The X corresponding to the gas sensor module used in this embodiment is 100. This parameter can be changed according to different gas sensor modules to achieve more accurate calibration. It is worth noting that z is the actual test data of the gas sensor module. The data read from the gas sensor module is a digital signal. Y represents the conversion value of the test controller at different bits. The test controller used in this embodiment is 12 bits, so the value of Y is 2 to the 12th power, which is equal to 4096.

[0067] Furthermore, the test baseboard also includes a hardware encoding circuit;

[0068] The selecting a test base plate as the main test base plate comprises:

[0069] Different version numbers are set for the test baseboard according to the hardware encoding circuit, and the test baseboard with the same version number as the preset value is selected as the main test baseboard through the dip switch.

[0070] Specifically, the hardware encoding circuit plays a key role in the test baseboard. It is used to set a unique version number or identifier as the serial number of the test baseboard, which can avoid confusion during data collection and subsequent parameter calibration steps. The dip switch is used to manually set or select different parameters or states. In this case, the dip switch is used to select the main test baseboard. The position of the dip switch will correspond to the preset version number. When the dip switch setting is consistent with the version number of a certain test baseboard, this test baseboard will be selected as the main test baseboard. Once the main test baseboard is determined by the dip switch, this baseboard will play a key role in the entire test process. Its main function is to connect the upper and lower levels. From connecting with the PC to communicating with the slave test baseboard, the main test baseboard is at work. The combination of hardware encoding and dip switches ensures the uniqueness and identifiability of each test baseboard. The main test baseboard is selected by toggling the dip switch, which is simple and reliable to operate, reducing the possibility of human error.

[0071] In another preferred embodiment of the present application, the test base plate is further provided with an LED display light;

[0072] The method of selecting the test base plate with the same version number as the preset value as the main test base plate by the DIP switch includes:

[0073] Dial the code of the test board. If the board number after dialing is the same as the version number, the LED display light flashes at a cycle of 1 second.

[0074] If the board number after dialing is different from the version number, the LED display light flashes at a period of 0.2 seconds.

[0075] Specifically, it is used to indicate the status and specific information of the test board. The LED will flash at different periods to indicate different conditions. When the version number after dialing the code is the same as the preset version number, it indicates that the test board is selected as the host. The first frequency is once per second, and the second frequency is once per two seconds. The LED will flash at the first frequency. Otherwise, if it is a slave test board, the LED will flash at the second frequency. The different flashing frequencies of the LED can be used to intuitively inform the user whether the version number setting of the current test board meets expectations and whether it is the main test board.

[0076] In another preferred embodiment of the present application, a non-test serial port of the test controller of the main test baseboard is connected to the host computer for communication after conversion, including:

[0077] Convert the TTL serial port of the test controller to a USB serial port and communicate with the host computer through the USB serial port.

[0078] Specifically, the test controller of the main test base plate usually has multiple serial port interfaces. Here, the use of a non-test serial port is described. The TTL serial port is a standard serial port communication mode, which usually works at a low-level logic (TTL level). The host computer is usually connected to the main test base plate through a USB interface. Therefore, it is necessary to convert the TTL serial port signal of the test controller into a USB serial port signal. Through the serial port conversion circuit, the electrical signal of the TTL serial port can be converted into a signal compatible with the USB interface. Once the TTL serial port signal is converted into a USB signal through the converter, the main test base plate can communicate directly with the host computer through the USB interface. This connection usually supports bidirectional data transmission, allowing the host computer to send signals to the main test base plate and receive feedback data or test results from the main test base plate. USB usually provides higher data transmission speed and more reliable connection quality than traditional serial ports (such as RS232). By using the USB interface, the complexity of using multiple different interfaces is reduced, and the overall reliability and ease of use of the system are improved. The USB interface is widely used in computers and other devices, so that the main test base plate can be more conveniently integrated into the existing test system.

[0079] Furthermore, before sending a test signal to the test controller of the main test baseboard according to the test parameters, the method includes:

[0080] Set the test parameters in the built-in software of the host computer;

[0081] The test parameters include test time, concentration and type of the gas to be tested.

[0082] Specifically, the host computer is a computer system that controls and monitors the test process. It runs special test software to set test parameters. The test time refers to the length of time the test lasts. This parameter is crucial for evaluating the stability and long-term performance of gas sensors. The concentration of the gas to be tested is the concentration of the gas sample used in the test, usually expressed in volume fraction (ppm or %) or volume ratio (such as ppb). This parameter is a key factor in testing the detection sensitivity and linear range of gas sensors. Gases of different concentrations can be used to evaluate the response characteristics and accuracy of the sensor in different concentration ranges. The type of gas to be tested refers to the specific gas type or combination used in the test. Different gases may respond differently to the sensor. Therefore, by testing different types of gases, the selectivity and cross-interference of the sensor can be evaluated. Common gas types include carbon monoxide, carbon dioxide, methane, ammonia, formaldehyde or acetaldehyde.

[0083] like Figure 3 As shown, a gas sensor module batch test system is applied to a device including a host computer, a test base plate and a plurality of test chambers, wherein a plurality of the test base plates are arranged in each test chamber, the test base plate includes a test controller and a multiplexing circuit, the multiplexing circuit expands the serial port of the test controller into a plurality of test serial ports, the test chamber includes gas and a plurality of gas sensor modules, each test serial port is connected to a gas sensor module, and each of the test controllers is connected to each other in communication;

[0084] The gas sensor module batch testing system comprises:

[0085] The mainboard selection module 1 is used to select a test baseboard as the main test baseboard, and a non-test serial port of the test controller of the main test baseboard is connected to the host computer through communication after conversion, and the remaining test baseboards are slave test baseboards;

[0086] A signal transmission module 2, used for sending a test signal to the test controller of the main test baseboard according to the test parameters, and the test controller of the main test baseboard sends the test signal to the test controller of the slave test baseboard;

[0087] A test module 3, used to control the test controller to send a test instruction to the gas sensor module, and the gas sensor module tests the gas in the test chamber and generates test data;

[0088] The data processing and analysis module 4 is used to control the host computer to perform statistics and analysis on the test data, and to perform performance calibration and parameter calibration on the gas sensor module.

[0089] This embodiment implements a gas sensor module batch testing method and implementation process. Please refer to the above embodiments and will not be described in detail here.

[0090] Furthermore, the test baseboard also includes a hardware encoding circuit;

[0091] In the mainboard selection module 1, selecting a test baseboard as the main test baseboard includes:

[0092] Different version numbers are set for the test baseboards according to the hardware coding circuit, and the test baseboard with the same version number as the preset value is selected as the main test baseboard through the dip switch;

[0093] The test baseboard is also provided with an LED display light. In the mainboard selection module 1, the test baseboard with the same version number as the preset value is selected as the main test baseboard by the dip switch, including:

[0094] The test baseboard is dialed, and if the board number after dialing is the same as the version number, the LED display light flashes at a first frequency;

[0095] If the board number after dialing is different from the version number, the LED display light flashes at the second frequency;

[0096] In the data processing and analysis module 4, the performance calibration of the gas sensor module satisfies the relationship:

[0097] z′=X*z / (Yz)

[0098] Wherein, z′ is the response resistance after calibration, X is a parameter determined by the production process of the gas sensor module, z is the actual test data of the gas sensor module, and Y is a constant used for calibration.

[0099] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "illustrative embodiments", "examples", "specific examples", or "some examples" means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner.

[0100] Although the embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the claims and their equivalents.

Claims

1. A gas sensor module batch testing method, characterized in that: Applicable to a device including a host computer, a test base plate and several test chambers, wherein each test chamber is provided with several test base plates, wherein the test base plate includes a test controller and a multiplexing circuit, wherein the multiplexing circuit expands the serial port of the test controller into several test serial ports, wherein the test base plate includes several gas sensor modules, wherein each test serial port is connected to a gas sensor module, and each of the test controllers is connected to each other in a communication manner, so that the gas sensor modules on the same test base plate do not interfere with each other, and the failure of a gas sensor module does not affect the test or calibration of other gas sensors; The gas sensor module batch testing method comprises: A test baseboard is selected as a main test baseboard, a non-test serial port of a test controller of the main test baseboard is connected to a host computer for communication after conversion, and the remaining test baseboards are slave test baseboards; Sending a test signal to the test controller of the master test baseboard according to the test parameters, and the test controller of the master test baseboard sending the test signal to the test controller of the slave test baseboard; The test controller sends a test instruction to the gas sensor module, and the gas sensor module tests the gas in the test chamber and generates test data; The host computer performs statistics and analysis on the test data, performs performance calibration on the gas sensor module, and performs parameter calibration on the gas sensor module.

2. The gas sensor module batch testing method according to claim 1, characterized in that: A certain voltage is given to each gas sensor module. After ventilation in the test chamber, the response resistance on the gas sensor is measured as the concentration of the target gas changes. The response resistance of the gas sensor satisfies the relationship: z′=X*z / (Yz) Wherein, z′ is the response resistance after calibration, X represents the reference resistance value, z is the digital signal data of the gas sensor module, and Y represents the conversion value of the test controller at different digits.

3. The gas sensor module batch testing method according to claim 1, characterized in that: The test baseboard also includes a hardware encoding circuit; The selecting a test base plate as the main test base plate comprises: Different version numbers are set for the test baseboard according to the hardware encoding circuit, and the test baseboard with the same version number as the preset value is selected as the main test baseboard through the dip switch.

4. The gas sensor module batch testing method according to claim 3, characterized in that: The test base plate is also equipped with LED display lights; The method of selecting the test base plate with the same version number as the preset value as the main test base plate by the DIP switch includes: The test baseboard is dialed, and if the board number after dialing is the same as the version number, the LED display light flashes at a first frequency; If the board number after dialing is different from the version number, the LED display light flashes at the second frequency.

5. The gas sensor module batch testing method according to claim 1, characterized in that: The non-test serial port of the test controller of the main test baseboard is connected to the host computer through communication after conversion, including: Convert the TTL serial port of the test controller to a USB serial port and communicate with the host computer through the USB serial port.

6. The gas sensor module batch testing method according to claim 1, characterized in that: Before sending a test signal to the test controller of the main test baseboard according to the test parameters, the method includes: Set the test parameters in the built-in software of the host computer; The test parameters include test time, concentration and type of the gas to be tested.

7. A gas sensor module batch testing system, characterized in that: Applicable to a device including a host computer, a test base plate and several test chambers, wherein several test base plates are arranged in each test chamber, wherein the test base plate includes a test controller and a multiplexing circuit, wherein the multiplexing circuit expands the serial port of the test controller into several test serial ports, wherein the test chamber includes gas and several gas sensor modules, wherein each test serial port is connected to a gas sensor module, and each of the test controllers is connected to each other in communication; The gas sensor module batch testing system comprises: The mainboard selection module is used to select a test baseboard as the main test baseboard, and a non-test serial port of the test controller of the main test baseboard is communicated with the host computer after conversion, and the remaining test baseboards are slave test baseboards; A signal transmission module, used for sending a test signal to the test controller of the main test baseboard according to the test parameters, and the test controller of the main test baseboard sends the test signal to the test controller of the slave test baseboard; A test module, used to control the test controller to send a test instruction to the gas sensor module, and the gas sensor module tests the gas in the test chamber and generates test data; The data processing and analysis module is used to control the host computer to perform statistics and analysis on the test data, and to perform performance calibration and parameter calibration on the gas sensor module.

8. The gas sensor module batch testing system according to claim 7, characterized in that: The test baseboard also includes a hardware encoding circuit; In the mainboard selection module, selecting a test baseboard as the main test baseboard includes: Different version numbers are set for the test baseboards according to the hardware coding circuit, and the test baseboard with the same version number as the preset value is selected as the main test baseboard through the dip switch; The test baseboard is also provided with an LED display light. In the mainboard selection module, the test baseboard with the same version number as the preset value is selected as the main test baseboard by the dip switch, including: The test baseboard is dialed, and if the board number after dialing is the same as the version number, the LED display light flashes at a first frequency; If the board number after dialing is different from the version number, the LED display light flashes at the second frequency; In the data processing and analysis module, the performance calibration of the gas sensor module satisfies the relationship: z′=X*z / (Yz) Wherein, z′ is the response resistance after calibration, X represents the reference resistance value, z is the actual test data of the gas sensor module, and Y represents the conversion value of the test controller at different digits.

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