Detection defect display method, system and device and medium

By responding to triggering different controls to screen the detection results and displaying charts during the glass manufacturing process, the problem of difficult to visually display the detection results and elimination situations is solved, and the optimization of the production process and the accurate identification of defect causes are achieved.

CN119456426AActive Publication Date: 2025-02-18FOSHAN HUAXING GLASS
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Patent Information

Application Number
CN202411602798.7
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-11-11
Publication Date
2025-02-18
Estimated Expiration
2044-11-11

AI Technical Summary

Technical Problem

During the glass manufacturing process, multiple production lines run at the same time and produce more products, which makes it difficult to visually display the inspection results and elimination of the testing equipment, affecting users' optimization of the production process.

Method used

By responding to triggering different controls, the corresponding detection results are filtered according to the production line information, and the defect data is eliminated according to the obtained station removal data and module number, and the corresponding chart is displayed to intuitively display the defect data and detection results.

Benefits of technology

It realizes intuitive display of detection results and elimination, helping users quickly integrate analysis detection results, accurately determine the causes of defects and production stations, thereby improving users' ability to optimize production processes.

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Abstract

The invention discloses a detection defect display method, system and device and a medium, and relates to the technical field of glass manufacturing. The method comprises the steps that in response to a detection query request, all first detection results corresponding to detection equipment are obtained, a first control and a second control are displayed on a main interface, and the first detection results are displayed on the second control; responding to the first control triggered, obtaining production line information, screening out a second detection result corresponding to the production line information from the first detection result, displaying a third control on the main interface, and displaying the second detection result on the third control; responding to a third control triggered, acquiring station rejecting defect data and module number rejecting defect data, and displaying a station rejecting defect table on the main interface according to the station rejecting defect data; and displaying a defect analysis chart corresponding to the station rejecting defect data and the module number rejecting defect data on the main interface in response to triggering the chart control. Defect data and detection results are visually obtained, and optimization of a user on a production process is improved.
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Description

Technical Field

[0001] The present application relates to the field of glass manufacturing technology, and in particular to a method, system, device and medium for detecting and displaying defects. Background Art

[0002] With the development of technology, the production efficiency of glass manufacturing has gradually improved, and several products can be produced at one time. In order to improve the quality of finished products, various equipment will be used on the production line to detect products in order to eliminate defective products.

[0003] In the related art, glass manufacturing is a process where multiple production lines are run simultaneously and a large number of products are produced. Therefore, it is difficult to fully and intuitively display the test results and rejection status of each test device, and it is difficult to integrate and analyze the test results to determine the cause of the defect and the production station. The display of the test results and rejection status has the problem of poor visualization, which in turn affects the user's optimization of the production process. Summary of the invention

[0004] The main purpose of the embodiments of the present application is to provide a detection defect display method, system, device and medium, so as to realize the intuitive display of detection results and rejection situations, and improve the user's optimization of the production process.

[0005] To achieve the above object, an embodiment of the present application provides a method for detecting defective display, comprising the following steps: In response to the detection query request, all first detection results corresponding to the detection device are obtained, and a first control and a second control are displayed on the main interface, and the first detection result is displayed on the second control; In response to being triggered by the first control, obtaining production line information, filtering out a second detection result corresponding to the production line information from the first detection result, updating the second control on the main interface, displaying a third control, and displaying the second detection result on the third control; In response to being triggered by the third control, according to the second detection result, station rejection defect data and mold number rejection defect data are obtained, and according to the station rejection defect data, a station rejection defect table, a station rejection label and a chart control are displayed on the main interface, wherein the station rejection label is used to provide an entry to the interface of the station rejection defect table; In response to being triggered by the chart control, a defect analysis chart corresponding to the workstation rejection defect data and the mold number rejection defect data is displayed on the main interface, and the chart control is used to provide an entry to the interface of the defect analysis chart.

[0006] Furthermore, the method further comprises: When responding to the detection query request, the main interface also displays a statistical control; In response to being triggered by the statistics control, updating the first control, and displaying a query control, a first detection tag, and a second detection tag on the main interface; In response to being triggered by the query control, first detection rejection data and second detection rejection data are obtained, and according to the first detection rejection data, the station rejection defect data and the mold number rejection defect data, a first rejection analysis chart detected and rejected by the crack machine is displayed on the main interface, wherein the first detection label is used to provide an entry to an interface for entering the first rejection analysis chart; In response to the triggering of the second detection label, a second rejection analysis chart detected and rejected by the camera is displayed on the main interface according to the second detection rejection data, the workstation rejection defect data and the mold number rejection defect data, and the second detection label is used to provide an entry to the interface of the second rejection analysis chart.

[0007] Further, the first control includes a kiln control and a row machine control; the response is triggered by the first control, and obtaining the production line information specifically includes: In response to the kiln control being triggered, a first selection control is displayed on the main interface, and in response to the first selection control being triggered, a kiln number is obtained; In response to being triggered by the row and column machine control, a second selection control is displayed on the main interface, and in response to being triggered by the second selection control, a row and column machine number is obtained; The production line information includes the kiln number and the row and column machine number.

[0008] Further, the updating of the second control and displaying the third control on the main interface specifically includes: Filtering out the detection result corresponding to the production line information from the first detection result, and using the detection result corresponding to the production line information as the second detection result; The second control displayed corresponding to the second detection result is used as the third control, the second control is cleared on the main interface, and the third control is displayed to update the second control.

[0009] Further, the workstation rejection defect data includes: product code, group, start time, end time, total number, total qualified number, total rejected number, qualified rate, rejection rate, mold reading rate and defective part parameters; the workstation rejection defect table displayed on the main interface according to the workstation rejection defect data specifically includes: Using the product code as the row data reference, the group, the start time, the end time, the total number, the total number of qualified items, the total number of rejected items, the qualified rate, the rejection rate, the mold reading rate and the defective part parameters are displayed on the main interface in a table to display the work station rejection defect table.

[0010] Further, the workstation rejection defect data includes defect location parameters, the mold number rejection defect data includes mold number defect parameters, and the defect analysis chart corresponding to the workstation rejection defect data and the mold number rejection defect data displayed on the main interface specifically includes: According to the defect part parameters, the number of occurrences of each defect part factor is counted to obtain the total number of occurrences of each defect part factor at the workstation; On the main interface, a defect analysis bar chart corresponding to each defect location factor is displayed from high to low according to the total number of occurrences of the workstation according to the counting dimension; According to the mold number defect parameter, the number of occurrences of each mold number defect factor is counted to obtain the total number of occurrences of the mold number of each mold number defect factor; Displaying a defect analysis circular graph corresponding to the defect factors of each mold number according to the total number of occurrences of the mold number on the main interface; Wherein, the defect analysis chart includes a defect analysis bar chart and a defect analysis ring chart.

[0011] Furthermore, the method further comprises: When the response is triggered on the third control, the main interface also displays a model number rejection label; In response to being triggered by the mold rejection label, a mold rejection defect table corresponding to the mold rejection defect data is displayed on the main interface, and the mold rejection label is used to provide an entry to the interface of the mold rejection defect table.

[0012] To achieve the above object, another aspect of the embodiment of the present application provides a detection defect display system, the system comprising: A first module is used to respond to a detection query request, obtain all first detection results corresponding to the detection device, and display a first control and a second control on a main interface, wherein the first detection result is displayed on the second control; A second module is used for responding to the trigger of the first control, obtaining production line information, filtering out a second detection result corresponding to the production line information from the first detection result, and updating the second control on the main interface, displaying a third control, and displaying the second detection result on the third control; A third module is used for responding to the triggering of the third control, obtaining the workstation rejection defect data and the mold number rejection defect data according to the second detection result, and displaying the workstation rejection defect table, the workstation rejection label and the chart control on the main interface according to the workstation rejection defect data, wherein the workstation rejection label is used to provide an entry to the interface of the workstation rejection defect table; The fourth module is used to respond to the trigger of the chart control and display the defect analysis chart corresponding to the workstation rejection defect data and the mold number rejection defect data on the main interface, and the chart control is used to provide an entry to the interface of the defect analysis chart.

[0013] To achieve the above-mentioned purpose, another aspect of an embodiment of the present application proposes an electronic device, characterized in that the electronic device includes a hardware device, the hardware device includes a memory and a processor, the memory stores a computer program, and the processor implements the above-mentioned defect detection display method when executing the computer program.

[0014] Another aspect of the technical solution of the present application is a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by one or more processors, the steps of the above-mentioned method for detecting defect display can be implemented.

[0015] The embodiments of the present application include at least the following beneficial effects: The present application provides a detection defect display method, system, device and medium, which responds to triggering different controls, filters the corresponding detection results according to the production line information, and rejects the defect data according to the acquired workstation and model number, and displays the corresponding charts to intuitively display the defect data and detection results, and can quickly integrate and analyze the detection results through defect analysis charts, accurately determine the causes of the defects and the production stations, facilitate the detection of the defect data, and improve the user's optimization of the production process.

[0016] Additional aspects and advantages of the present application will be given in part in the description below, and in part will become apparent from the description below, or will be learned through the practice of the present application. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] The above and / or additional aspects and advantages of the present application will become apparent and easily understood from the description of the embodiments in conjunction with the following drawings, in which: Figure 1 is a flow chart of a method for detecting defect display provided by some embodiments of the present application; Figure 2 It is a display schematic effect diagram of a second control of a detection defect display method provided by some embodiments of the present application; Figure 3is a display schematic effect diagram of a third control of a detection defect display method provided by some embodiments of the present application; Figure 4 It is a display schematic effect diagram of a workstation rejection defect table of a detection defect display method provided by some embodiments of the present application; Figure 5 It is a display schematic effect diagram of a defect analysis chart of a detection defect display method provided by some embodiments of the present application; Figure 6 It is a display schematic effect diagram of a model number rejection defect table of a detection defect display method provided by some embodiments of the present application; Figure 7 It is a schematic display effect diagram of a first rejection analysis chart of a detection defect display method provided in some embodiments of the present application. DETAILED DESCRIPTION

[0018] In order to make the purpose, technical solutions and advantages of the present application clearer, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the reference to "embodiment" in this article means that the specific features, structures or characteristics described in conjunction with the embodiment may be included in at least one embodiment of the present application. The appearance of this phrase in various positions in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the embodiments of the present application. They are only examples of devices and methods consistent with some aspects of the embodiments of the present application as detailed in the attached claims.

[0019] It is understood that the terms "first", "second", etc. used in this application can be used to describe various concepts in this article, but unless otherwise specified, these concepts are not limited by these terms. These terms are only used to distinguish one concept from another concept. For example, without departing from the scope of the embodiment of the present application, the first information may also be referred to as the second information, and similarly, the second information may also be referred to as the first information. Depending on the context, the words "if" and "if" as used herein can be interpreted as "at the time of" or "when" or "in response to determination".

[0020] The terms "at least one", "multiple", "each", "any", etc. used in this application, at least one includes one, two or more, multiple includes two or more, each refers to each of the corresponding multiple, and any refers to any one of the multiple.

[0021] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art to which this application belongs. The terms used herein are only for the purpose of describing the embodiments of this application and are not intended to limit this application.

[0022] In the following description, specific details such as specific system structures, technologies, etc. are provided for the purpose of illustration rather than limitation, so as to provide a thorough understanding of the embodiments of the present application. However, it should be clear to those skilled in the art that the present application may also be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to prevent unnecessary details from obstructing the description of the present application.

[0023] In order to make the inventive concept of the present application easy to understand, before describing the embodiments of the present application in detail, the English abbreviations (terms) / related concepts involved in the embodiments of the present application are first described. The English abbreviations (terms) / related concepts involved in the embodiments of the present application are subject to the following explanations.

[0024] Mold number: usually refers to the mold number used to determine the size and shape of glass products. The mold number usually consists of a number and a name, and can be marked on the product.

[0025] Crack Machine: Usually refers to the operation of using a crack machine to scan defective glass and locate the defect in order to separate or remove it during the glass manufacturing or processing process.

[0026] Camera: Usually refers to the operation of using a camera to scan defective glass, locate the defect, and separate or remove it during the glass manufacturing or processing process.

[0027] As described in the background technology, in the related art, glass manufacturing is a process where multiple production lines are operated simultaneously, and a large number of products are produced. Therefore, it is difficult to fully and intuitively display the test results and rejection status of each test device, and it is difficult to integrate and analyze the test results to determine the cause of the defect and the production station. The display of the test results and rejection status has the problem of poor visualization, which in turn affects the user's optimization of the production process.

[0028] The method provided in the embodiment of the present application can be applied to the system provided in the embodiment of the present application, wherein the system can be a terminal or a server.

[0029] The terminal may be a tablet computer, a laptop computer, a desktop computer, etc., but is not limited thereto.

[0030] The server can be an independent physical server, a server cluster or distributed system composed of multiple physical servers, or a cloud server that provides basic cloud computing services such as cloud services, cloud databases, cloud computing, cloud functions, cloud storage, network services, cloud communications, middleware services, domain name services, security services, content distribution networks, as well as big data and artificial intelligence platforms.

[0031] The above is an introduction to the implementation environment of the embodiments of the present application.

[0032] The following will describe in detail the implementation steps of a defect detection and display method provided by an embodiment of the present application in conjunction with the accompanying drawings.

[0033] Please refer to Figure 1 , Figure 1 A flowchart of a method for detecting defect display is provided for some embodiments of the present application; it should be noted that the steps shown in the flowchart of the accompanying drawings can be executed in a computer system such as a set of computer executable instructions, and, although a logical order is shown in the flowchart, in some cases, the steps shown or described can be executed in an order different from that shown here.

[0034] The method of the embodiment of the present application comprises the following steps: S100, responding to a detection query request, obtaining all first detection results corresponding to the detection device, and displaying a first control and a second control on a main interface, with the first detection result displayed on the second control.

[0035] S200, in response to being triggered by the first control, obtaining production line information, filtering out a second detection result corresponding to the production line information from the first detection result, and updating the second control on the main interface, displaying the third control, and displaying the second detection result on the third control.

[0036] S300, in response to being triggered in the third control, obtains the workstation rejection defect data and the mold number rejection defect data according to the second detection result, and displays the workstation rejection defect table, the workstation rejection label and the chart control on the main interface according to the workstation rejection defect data. The workstation rejection label is used to provide an entry to the interface of the workstation rejection defect table.

[0037] S400, in response to being triggered by a chart control, a defect analysis chart corresponding to the workstation rejection defect data and the mold number rejection defect data is displayed on the main interface, and the chart control is used to provide an entry to the interface of the defect analysis chart.

[0038] Steps S100 to S400 shown in the embodiment of the present application, by responding to triggering different controls, filter the corresponding test results according to the production line information, and reject the defect data according to the acquired workstation and model number, display the corresponding charts to intuitively display the defect data and test results, and can quickly integrate and analyze the test results through defect analysis charts, accurately determine the causes of the defects and the production stations, facilitate the detection of the defect data obtained, improve the user's optimization of the production process, thereby improving the production process, and improving production efficiency and product quality.

[0039] The specific implementation methods of the above steps are introduced below.

[0040] In S100, by responding to the detection query request, all first detection results are obtained, and the first detection results correspond to the detection equipment. That is to say, a detection equipment detects and rejects the product to obtain a first detection result. Since there are multiple production lines in glass manufacturing, and each production line is equipped with a detection equipment, in this embodiment, the first detection result refers to the detection result corresponding to all detection equipment of the multiple production lines. Then, by responding to the detection query request, the detection results of all detection equipment are obtained. By responding to the detection query request, the main interface displays the first control and the second control, and the second control can display the first detection result to intuitively display the detection situation.

[0041] The response to the detection query request can be obtained by responding to other interfaces or controls, or it can be issued by other devices and responded to. There is no restriction on this request in this application.

[0042] In one embodiment, the first control includes: a kiln control and a row machine control. Through the first control, the user is guided to query the rejection status and detection results of different production lines, which is convenient for the user to manage and view the rejection data and improve the user's optimization of production technology and production process.

[0043] The number of the second controls is consistent with the number of the first test results, and this application does not limit the number of the second controls. The first test results include: test equipment, number of bottles fed, number of rejected bottles, qualified rate, rejection rate, mold reading rate and test time.

[0044] For example, refer to Figure 2, by responding to the detection query request, all the first detection results are obtained, and the first control and the second control are displayed on the main interface. The first control includes: kiln control and row machine control. Each second control displays the first detection result correspondingly. One of the first detection results includes: DY5-1-LW1 (detection equipment number), 509 (number of bottles entering), 66 (number of rejections), 88.52% (qualified rate), 11.48% (rejection rate), 99.8% (mold reading rate) and 2024-08-06 15:00-15:03 detection time), the first detection result corresponds to the detection equipment.

[0045] The embodiment provided in the present application responds to a detection query request, displays a first control to guide the user to query the rejection status and detection results of different production lines, and obtains all first detection results, and displays the corresponding first detection results through a second control, so that the user can intuitively view the detection results and optimize the production process and production process.

[0046] In S200, in response to triggering the first control, the production line information that the user needs to query is determined, that is, the production line that the user needs to query is determined, and according to the production line information, the corresponding test result is screened from the acquired first test result, and it is used as the second test result. The second control corresponding to the second test result is used as the third control, and the third control can display the second test result. The third control replaces the second control and is displayed on the main interface to update the second control.

[0047] The first control can be a button, a label, or a tree view. The present application does not limit the specific form of the first control. The triggering operation of the first control can be a user touch and click operation, a mouse move or click, or a voice control trigger. The present application does not limit the triggering operation of the first control. Similarly, the specific form and triggering operation of the second control are not limited.

[0048] In one embodiment, the first control includes: a kiln control and a row and column machine control, and the production line information includes: a kiln number and a row and column machine number. The production line information is displayed on the first control.

[0049] For example, refer to Figure 3When the user clicks on the first control (furnace control and row and column machine control), the furnace number and the row and column machine number are obtained. When the furnace number is "DY2" and the row and column machine number is "DY2-2", the corresponding second test result is filtered out from the first test result according to the furnace number and the row and column machine number, and the second control is updated on the main interface to display the third control. The third control displays the second test result corresponding to the furnace number "DY2" and the row and column machine number "DY2-2", that is, the detection equipment number, the number of bottles fed in, the number of rejected bottles, the qualified rate, the rejected rate, the mold reading rate and the detection time corresponding to the furnace number "DY2" and the row and column machine number "DY2-2" are displayed.

[0050] The embodiment provided in the present application guides the user to query the rejection status and test results of different production lines in response to triggering the first control, determines the production line that the user needs to query, filters the corresponding test results through the production line information, and displays them so that the test results can be viewed intuitively, eliminating information interference from other production lines, and clarifying the rejection status and production status of the current production line.

[0051] In S300, by responding to the trigger on the third control, the station rejection defect data and the mold number rejection defect data corresponding to the second detection result are obtained, and the corresponding second detection result corresponds to the third control used for triggering, and the main interface displays the station rejection defect data in the form of a table, thereby displaying the station rejection defect table. The main interface also displays the station rejection label, the mold number rejection label and the chart control, and the station rejection label can provide an entry to the interface of the station rejection defect table.

[0052] That is to say, when the third control is triggered by a response, according to the second detection result of S300, the corresponding second detection result corresponds to the third control used for triggering, and the station rejection defect data and the mold number rejection defect data detected and rejected on the production line are obtained, and the station rejection defect data are displayed in a table on the main interface, and the station rejection defect table is displayed. The main interface also displays the station rejection label, the mold number rejection label and the chart control. When the station rejection label is triggered by a response, the main interface can directly display the station rejection defect table.

[0053] The third control can be a button, a label, or a tree view. This application does not limit the specific form of the third control. The triggering operation of the third control can be a user touch and click operation, a mouse move or click, or a voice control trigger. This application does not limit the triggering operation of the third control. Similarly, the specific form and triggering operation of the workstation rejection label, model number rejection label, and chart control are not limited.

[0054] Since the third control is obtained by filtering the second control, this application does not limit the number of third controls.

[0055] In one embodiment, the workstation rejection defect data may include: product code, group, start time, end time, total number, total qualified number, total rejected number, qualified rate, rejection rate, mold reading rate and defective part parameters. The mold number rejection defect data may include: product code, group, start time, end time, mold number, mold number defect parameters and rejection number.

[0056] The workstation rejection defect table can use the product code as the row data basis to display the group, start time, end time, total number, total number of qualified items, total number of rejection items, qualified rate, rejection rate, mold reading rate and defective part parameters in a table.

[0057] For example, refer to Figure 4 When the user clicks one of the third controls, according to the second detection result corresponding to the clicked third control, the corresponding station rejection defect data and mold number rejection defect data are obtained, and the main interface displays the station rejection defect data corresponding to the production line information in a table, thereby displaying the station rejection defect table, which displays the product code, group, start time, end time, total number, total number of qualified products, total number of rejections, qualified rate, rejection rate, mold reading rate and defect part parameters. The main interface also displays the station rejection label, mold number rejection label and chart controls.

[0058] The embodiment provided in the present application obtains the rejection defect data corresponding to the production line that the user needs to query by responding to the trigger on the third control, intuitively displays the rejection status of the corresponding data, and clarifies the defect factors and defective workstations.

[0059] In S400, by responding to the trigger on the chart control, the defect analysis chart corresponding to the workstation rejection defect data and the mold number rejection defect data is displayed on the main interface, and the chart control can provide an entry to the interface of the defect analysis chart. That is, when the chart control is triggered by the response, the main interface can directly display the defect analysis chart.

[0060] Defect analysis charts include: defect analysis bar chart and defect analysis ring chart.

[0061] For example, refer to Figure 5 When the user clicks on the chart control, the main interface displays the defect analysis bar chart and defect analysis ring chart. The defect analysis bar chart displays the total number of occurrences of each defect location factor at the workstation and each defect location factor, and the defect analysis ring chart displays the number of occurrences of each mold number defect factor and each mold number defect factor.

[0062] The embodiment provided in the present application displays a defect analysis chart through a chart control that responds to a trigger to intuitively display defect data and test results, and can quickly integrate and analyze the test results through the defect analysis chart to accurately determine the cause of the defect and the production station, facilitate the detection of the defect data, and enhance the user's optimization of the production process, thereby improving the production process, and improving production efficiency and product quality.

[0063] In some embodiments of the present invention, in S200, the process of acquiring production line information specifically includes: The production line information includes: kiln number and row and column machine number, and the first control includes: kiln control and row and column machine control.

[0064] S210, in response to the trigger on the kiln control, a first selection control is displayed on the main interface, and in response to the first selection control, a kiln number is obtained.

[0065] S220, in response to the trigger on the row and column machine control, display a second selection control on the main interface, and in response to the second selection control, obtain the row and column machine number.

[0066] The specific implementation methods of the above steps are introduced below.

[0067] In S210, when the kiln control is triggered by a response, a first selection control is displayed on the main interface, and the first selection control corresponds to the kiln control.

[0068] The first selection control may be a drop-down box, a prompt box, or a tree view. The present application does not limit the specific form of the first selection control.

[0069] When the first selection control is triggered in response, the furnace number in the production line information is obtained.

[0070] The embodiment provided in the present application displays a first selection control corresponding to the kiln control in response to triggering the kiln control, and triggers the first selection control to allow the user to determine the kiln number as needed, thereby helping the user to quickly find the required kiln number, maintain the consistency of the second detection result and the kiln number, and improve the user experience.

[0071] In S220, when the row-column machine control is triggered by a response, a second selection control is displayed on the main interface, and the second selection control corresponds to the row-column machine control.

[0072] The second selection control may be a drop-down box, a prompt box, or a tree view. The present application does not limit the specific form of the second selection control.

[0073] When the second selection control is triggered by a response, the row, column and machine number in the production line information is obtained.

[0074] The embodiment provided in the present application displays a second selection control corresponding to the row and column machine control in response to triggering the row and column machine control. By triggering the second selection control, the user can determine the row and column machine number as needed, thereby helping the user to quickly find the required row and column machine number, maintain the consistency of the second detection result with the row and column machine number, and improve the user experience.

[0075] In some embodiments of the present invention, in S200, the display process of the third control specifically includes: S230, filtering out the detection result corresponding to the production line information from the first detection result, and using the detection result corresponding to the production line information as the second detection result.

[0076] S240, using the second control displayed corresponding to the second detection result as the third control, clearing the second control on the main interface, and displaying the third control to update the second control.

[0077] The specific implementation methods of the above steps are introduced below.

[0078] In S230, according to the production line information, a corresponding test result is screened out from the acquired first test results and used as the second test result.

[0079] In S240, the second control displayed corresponding to the second detection result is used as a third control, and the third control can display the second detection result. The third control replaces the second control and is displayed on the main interface to update the second control.

[0080] The embodiment provided in the present application guides the user to query the rejection status and test results of different production lines in response to triggering the first control, determines the production line that the user needs to query, filters the corresponding test results through the production line information, and displays them so that the test results can be viewed intuitively, eliminating information interference from other production lines, and clarifying the rejection status and production status of the current production line.

[0081] In some embodiments of the present invention, in S400, the display process of the defect analysis chart specifically includes: S410, counting the number of occurrences of each defect location factor according to the defect location parameter, and obtaining the total number of occurrences of each defect location factor at the workstation.

[0082] S420, displaying a defect analysis bar chart corresponding to each defect location factor from high to low according to the total number of occurrences of the workstations in accordance with the counting dimension on the main interface.

[0083] S430, counting the number of occurrences of each mold defect factor according to the mold defect parameter, and obtaining the total number of occurrences of each mold defect factor.

[0084] S440, displaying a defect analysis circular graph corresponding to each mold number defect factor according to the total number of occurrences of the mold number on the main interface.

[0085] The specific implementation methods of the above steps are introduced below.

[0086] In S410, the number of occurrences of each defective part factor is counted using the defective part parameter to obtain the total number of occurrences of each defective part factor at the workstation.

[0087] Among them, the product can be inspected by detection equipment such as a crack machine and / or a camera to locate the defective part. According to the current product code, the type of defect in the part is recorded to form the defect part factor, and the number of occurrences of the defect part factor is recorded to form the defect part parameter.

[0088] In S420, the total number of workstation occurrences corresponding to each defect location factor is sorted from high to low, and the total number of workstation occurrences and the corresponding defect location factors are displayed in the form of a bar chart to form a defect analysis bar chart, and the defect analysis bar chart is displayed on the main interface.

[0089] For example, refer to Figure 5 , the defect location factors include: "flat bottom crack", "insufficient bottle mouth", "other bottle mouth defects", "bottom stone", "other bottle bottom defects", "bottom dirty", "bottom mouth positioning failure", "bottom bubble", "bottom black spot", then the total number of occurrences of the above defect location factors at the workstations are sorted from high to low, the total number of occurrences of "flat bottom crack" at the workstation is the highest, and the total number of occurrences of "bottom black spot" at the workstation is the lowest, and the total number of occurrences of the workstations and the corresponding defect location factors are displayed in the form of a bar chart, and the defect analysis bar chart is displayed on the main interface.

[0090] In S430, the number of occurrences of each mold defect factor is counted using the mold defect parameter to obtain the total number of occurrences of the mold corresponding to each mold defect factor.

[0091] Among them, the product can be inspected by a crack machine and / or a camera and other inspection equipment to locate the defective mold number, and based on the current product code, record what kind of defect the mold number has to form the mold number defect factor, and record the number of occurrences of the mold number defect factor, thereby forming the mold number defect parameter.

[0092] In S440, the total number of module occurrences corresponding to each module defect factor is used to display the total number of module occurrences and the corresponding module defect factors in the form of a ring graph according to the total number of module occurrences to form a defect analysis ring graph, and the defect analysis ring graph is displayed on the main interface.

[0093] For example, refer to Figure 5 and Figure 6 The mold defect factors include: "defect code" and "defect name". According to the total number of occurrences of the mold corresponding to the above mold defect factors, the proportion of each mold defect factor in the total mold defect factors is calculated, and the total number of occurrences of the workstation and the corresponding defect location factors are displayed in the form of a ring chart. The defect analysis ring chart is displayed on the main interface.

[0094] The embodiments provided in the present application process different defect parameters to form corresponding defect analysis charts, so as to quickly integrate and analyze the test results, accurately determine the causes of the defects and the production stations, facilitate the detection of the defect data, and enhance the user's optimization of the production process, thereby improving the production process, and improving production efficiency and product quality.

[0095] In some embodiments of the present invention, the display method further includes: S301, when the response is triggered on the third control, the module number rejection label is also displayed on the main interface; S302, in response to being triggered by the mold rejection tag, a mold rejection defect table corresponding to the mold rejection defect data is displayed on the main interface, and the mold rejection tag is used to provide an entry to the interface of the mold rejection defect table.

[0096] The specific implementation methods of the above steps are introduced below.

[0097] In S301, when the third control is triggered by a response, the main interface displays a workstation rejection defect table, a workstation rejection label, a mold number rejection label and a chart control.

[0098] In S302, when the mold rejection tag is triggered by a response, the mold rejection defect table is displayed on the main interface according to the mold rejection defect data, and the workstation rejection defect table is not displayed.

[0099] The mold number rejection defect data may include: product code, group, start time, end time, mold number, mold number defect parameters and rejection number.

[0100] The mold number rejection defect table can use the product code as the row data basis to display the group, start time, end time, mold number, mold number defect parameters and rejection number in a table format.

[0101] The mold number rejection label can provide an entry to the interface of the mold number rejection defect table, that is, in response to triggering the mold number rejection label, the main interface can directly display the mold number rejection defect table.

[0102] The model rejection tag can be a button, a tag, or a tree view. This application does not limit the specific form of the model rejection tag. The triggering operation of the model rejection tag can be a user touch and click operation, a mouse move or click, or a voice control trigger. This application does not limit the triggering operation of the model rejection tag.

[0103] For example, refer to Figure 6 When the user clicks the mold rejection label, the mold rejection defect table is displayed in a table according to the mold rejection defect data. The mold rejection defect table displays the product code, group, start time, end time, mold number, mold defect parameters and rejection number. The main interface also displays the station rejection label, mold rejection label and chart control.

[0104] In some embodiments of the present invention, the display method further includes: S101, when responding to a detection query request, a statistics control is also displayed on the main interface.

[0105] S102, in response to being triggered by the statistics control, updating the first control, and displaying the query control, the first detection tag, and the second detection tag on the main interface.

[0106] S103, in response to being triggered by the query control, obtains the first detection rejection data and the second detection rejection data, and displays the first rejection analysis chart detected and rejected by the crack machine on the main interface according to the first detection rejection data, the workstation rejection defect data and the mold number rejection defect data, and the first detection label is used to provide an entry to the interface of the first rejection analysis chart.

[0107] S104, in response to being triggered by the second detection label, a second rejection analysis chart detected and rejected by the camera is displayed on the main interface according to the second detection rejection data, the workstation rejection defect data and the mold number rejection defect data. The second detection label is used to provide an entry to the interface of the second rejection analysis chart.

[0108] The specific implementation methods of the above steps are introduced below.

[0109] In S101, when responding to a detection query request, a first control, a second control and a statistical control are displayed on the main interface; the first control includes: a kiln control and a row and column machine control.

[0110] In S102, when the statistics control is triggered by a response, the query control is displayed on the main interface, and the first control is not displayed, so as to implement the update of the first control.

[0111] The first detection label and the second detection label are also displayed on the main interface to update the interface displaying the third control or the interface displaying the defect analysis chart.

[0112] The statistics control can provide an entry into the interface of the query control, the first detection tab, and the second detection tab.

[0113] The statistical control can be a button, a label, or a tree view. This application does not limit the specific form of the statistical control. The triggering operation of the statistical control can be a user touch and click operation, a mouse move or click, or a voice control trigger. This application does not limit the triggering operation of the statistical control. Similarly, the specific form and triggering operation of the query control, the first detection tag, and the second detection tag are not limited.

[0114] In S103, when the query control is triggered by a response, the first detection rejection data and the second detection rejection data are obtained.

[0115] The first detection and rejection data is the data obtained by scanning and detecting defective products through a crack machine, locating the defective position, and rejecting the products. The second detection and rejection data is the data obtained by scanning and detecting defective products through a camera, locating the defective position, and rejecting the products.

[0116] Based on the first detection rejection data, the work station rejection defect data and the mold number rejection defect data, the work station rejection defect data and the mold number rejection defect data are processed, and a first rejection analysis chart is displayed on the main interface. The first rejection analysis chart includes: a bar chart of the work station rejection analysis detected by the crack machine and a circular chart of the mold number rejection analysis detected by the crack machine.

[0117] The first detection tag can provide an entry to the interface of the first rejection analysis chart, that is, in response to triggering the first detection tag, the main interface can directly display the first rejection analysis chart.

[0118] For example, refer to Figure 7 When the user clicks the query control, the first detection rejection data is obtained. Based on the first detection rejection data, the station rejection defect data and the mold number rejection defect data, the station rejection analysis bar chart and the mold number rejection analysis ring chart (first rejection analysis chart) detected by the crack machine are displayed on the main interface. The cause of the defect can be quickly determined through the station rejection analysis bar chart and the mold number rejection analysis ring chart detected by the crack machine. The first detection label is the crack machine label, and the second detection label is the camera label.

[0119] In S104, when the second detection tag is triggered by a response, the workstation rejection defect data and the mold number rejection defect data are processed based on the second detection rejection data, the workstation rejection defect data and the mold number rejection defect data, and a second rejection analysis chart detected and rejected by the camera is displayed on the main interface. The second rejection analysis chart includes: a bar chart of the workstation rejection analysis detected by the camera and a circular chart of the mold number rejection analysis detected by the camera.

[0120] The second detection tag can provide an entry to the interface of the second rejection analysis chart, that is, in response to triggering the second detection tag, the main interface can directly display the second rejection analysis chart.

[0121] The embodiment provided in the present application can view the data of the corresponding detection and rejection products of different detection equipment through the response statistical control, thereby forming a corresponding rejection analysis chart, so as to quickly integrate and analyze the detection results, accurately determine the causes of defects and production stations, facilitate the detection of defect data, improve users' optimization of production processes, thereby improving production processes, and improving production efficiency and product quality.

[0122] The above is an introduction to an embodiment of a method for detecting defects and displaying them provided in this application.

[0123] The implementation of the detection defect display system provided by the embodiment of the present application will be described in detail below with reference to the accompanying drawings.

[0124] For the defect detection and display method provided in the above embodiment, the present application embodiment further provides a defect detection and display system for implementing the above method. The defect detection and display system includes: The first module responds to the detection query request, obtains all first detection results corresponding to the detection device, and displays the first control and the second control on the main interface, and the first detection result is displayed on the second control.

[0125] The second module responds to the trigger on the first control, obtains the production line information, filters out the second detection result corresponding to the production line information from the first detection result, updates the second control on the main interface, displays the third control, and displays the second detection result on the third control.

[0126] The third module responds to being triggered by the third control, obtains the workstation rejection defect data and the mold number rejection defect data according to the second detection result, and displays the workstation rejection defect table, the workstation rejection label and the chart control on the main interface according to the workstation rejection defect data. The workstation rejection label is used to provide an entry to the interface of the workstation rejection defect table.

[0127] The fourth module, in response to being triggered by the chart control, displays a defect analysis chart corresponding to the workstation rejection defect data and the mold number rejection defect data on the main interface, and the chart control is used to provide an entry to the interface of the defect analysis chart.

[0128] It can be understood that the contents of the above method embodiments are all applicable to the present system embodiments, the functions specifically implemented by the present device embodiments are the same as those of the above method embodiments, and the beneficial effects achieved are also the same as those achieved by the above method embodiments.

[0129] The embodiment of the present application also provides an electronic device, which includes a hardware device, and the hardware device includes a memory, one or more processors, and a computer program stored in the memory and executable on the processor. The memory is used to store software programs and units, and the processor executes various functional applications and data processing by running the software programs and units stored in the memory to obtain the resources corresponding to the above-mentioned preset events. Optionally, the processor implements the above-mentioned defect detection display method by running the above-mentioned computer program stored in the memory.

[0130] The memory, as a non-transitory computer-readable medium, can be used to store non-transitory software programs and non-transitory computer executable programs. In addition, the memory may include a high-speed random access memory, and may also include a non-transitory memory, such as at least one disk storage device, a flash memory device, or other non-transitory solid-state storage device. In some embodiments, the memory may optionally include a memory remotely disposed relative to the processor, and these remote memories may be connected to the processor via a network.

[0131] It can be understood that the contents of the above method embodiments are all applicable to the electronic device embodiment, the functions specifically implemented by the electronic device embodiment are the same as those of the above method embodiments, and the beneficial effects achieved are also the same as those achieved by the above method embodiments.

[0132] An embodiment of the present application further provides a computer-readable storage medium, which stores a computer program. When the computer program is executed by a processor, the above-mentioned defect detection and display method is implemented.

[0133] It can be understood that the contents of the above method embodiments are all applicable to the present storage medium embodiments, the functions specifically implemented by the present storage medium embodiments are the same as those of the above method embodiments, and the beneficial effects achieved are also the same as those achieved by the above method embodiments.

[0134] An embodiment of the present application further provides a computer program product, which includes a computer program. When the computer program is executed by one or more processors, it can implement the steps of the above-mentioned method for detecting defect display.

[0135] It can be understood that the contents of the above method embodiments are all applicable to this computer program product, the functions specifically implemented by this computer program product embodiment are the same as those of the above method embodiments, and the beneficial effects achieved are also the same as those achieved by the above method embodiments.

[0136] The embodiments described in the embodiments of the present application are intended to more clearly illustrate the technical solutions of the embodiments of the present application and do not constitute a limitation on the technical solutions provided in the embodiments of the present application. Those skilled in the art will appreciate that with the evolution of technology and the emergence of new application scenarios, the technical solutions provided in the embodiments of the present application are also applicable to similar technical problems.

[0137] Although specific embodiments are described herein, those of ordinary skill in the art will recognize that many other modifications or alternative embodiments are also within the scope of the present disclosure. For example, any of the functions and / or processing capabilities described in conjunction with a particular device or component may be performed by any other device or component. In addition, although various exemplary implementations and architectures have been described according to embodiments of the present disclosure, those of ordinary skill in the art will recognize that many other modifications to the exemplary implementations and architectures described herein are also within the scope of the present disclosure.

[0138] Some aspects of the present disclosure are described above with reference to the block diagram and flow chart of the system, method, system and / or computer program product according to the exemplary embodiments.It should be understood that the combination of one or more blocks in the block diagram and the flow chart and the blocks in the block diagram and the flow chart can be realized by executing computer executable program instructions respectively.Equally, according to some embodiments, some blocks in the block diagram and the flow chart may not need to be executed in the order shown, or may not need to be executed in full.In addition, additional components and / or operations beyond those components and / or operations shown in the blocks in the block diagram and the flow chart may be present in certain embodiments.

[0139] Therefore, the blocks in the block diagrams and flow charts support the combination of devices for performing the specified functions, the combination of elements or steps for performing the specified functions, and the program instruction devices for performing the specified functions. It should also be understood that each block in the block diagrams and flow charts and the combination of blocks in the block diagrams and flow charts can be implemented by a special-purpose hardware computer system or a combination of special-purpose hardware and computer instructions that performs a specific function, element or step.

[0140] The program modules, applications, etc. described herein may include one or more software components, including, for example, software objects, methods, data structures, etc. Each such software component may include computer-executable instructions that, in response to execution, cause at least a portion of the functionality described herein (e.g., one or more operations of the illustrative methods described herein) to be performed.

[0141] Software components may be stored as files or other data storage structures. Software components of similar type or related functions may be stored together, such as in a specific directory, folder, or library. Software components may be static (e.g., preset or fixed) or dynamic (e.g., created or modified at execution time).

[0142] The embodiments of the present application are described in detail above in conjunction with the accompanying drawings, but the present application is not limited to the above embodiments, and various changes can be made within the knowledge scope of ordinary technicians in the relevant technical field without departing from the purpose of the present application.

Claims

1. A method for detecting defects and displaying the same, characterized in that: The following steps are involved: In response to the detection query request, all first detection results corresponding to the detection device are obtained, and a first control and a second control are displayed on the main interface, and the first detection result is displayed on the second control; In response to being triggered by the first control, obtaining production line information, filtering out a second detection result corresponding to the production line information from the first detection result, updating the second control on the main interface, displaying a third control, and displaying the second detection result on the third control; In response to being triggered by the third control, according to the second detection result, station rejection defect data and mold number rejection defect data are obtained, and according to the station rejection defect data, a station rejection defect table, a station rejection label and a chart control are displayed on the main interface, wherein the station rejection label is used to provide an entry to the interface of the station rejection defect table; In response to being triggered by the chart control, a defect analysis chart corresponding to the workstation rejection defect data and the mold number rejection defect data is displayed on the main interface, and the chart control is used to provide an entry to the interface of the defect analysis chart.

2. The detection defect display method according to claim 1, characterized in that: The method further comprises: When responding to the detection query request, the main interface also displays a statistical control; In response to being triggered by the statistics control, updating the first control, and displaying a query control, a first detection tag, and a second detection tag on the main interface; In response to being triggered by the query control, first detection rejection data and second detection rejection data are obtained, and according to the first detection rejection data, the station rejection defect data and the mold number rejection defect data, a first rejection analysis chart detected and rejected by the crack machine is displayed on the main interface, wherein the first detection label is used to provide an entry to an interface for entering the first rejection analysis chart; In response to the triggering of the second detection label, a second rejection analysis chart detected and rejected by the camera is displayed on the main interface according to the second detection rejection data, the workstation rejection defect data and the mold number rejection defect data, and the second detection label is used to provide an entry to the interface of the second rejection analysis chart.

3. The detection defect display method according to claim 1, characterized in that: The first control includes a kiln control and a row machine control; the response is triggered by the first control, and obtaining the production line information specifically includes: In response to the kiln control being triggered, a first selection control is displayed on the main interface, and in response to the first selection control being triggered, a kiln number is obtained; In response to being triggered by the row and column machine control, a second selection control is displayed on the main interface, and in response to being triggered by the second selection control, a row and column machine number is obtained; The production line information includes the kiln number and the row and column machine number.

4. The detection defect display method according to claim 1, characterized in that: The updating of the second control and displaying the third control on the main interface specifically includes: Filtering out the detection result corresponding to the production line information from the first detection result, and using the detection result corresponding to the production line information as the second detection result; The second control displayed corresponding to the second detection result is used as the third control, the second control is cleared on the main interface, and the third control is displayed to update the second control.

5. The detection defect display method according to claim 1, characterized in that: The workstation rejection defect data includes: product code, group, start time, end time, total number, qualified total number, rejected total number, qualified rate, rejection rate, mold reading rate and defective part parameters; the workstation rejection defect table displayed on the main interface according to the workstation rejection defect data specifically includes: Using the product code as the row data reference, the group, the start time, the end time, the total number, the total number of qualified items, the total number of rejected items, the qualified rate, the rejection rate, the mold reading rate and the defective part parameters are displayed on the main interface in a table to display the work station rejection defect table.

6. The detection defect display method according to claim 5, characterized in that: The workstation rejection defect data includes defect location parameters, the mold number rejection defect data includes mold number defect parameters, and the defect analysis chart corresponding to the workstation rejection defect data and the mold number rejection defect data displayed on the main interface specifically includes: According to the defect part parameters, the number of occurrences of each defect part factor is counted to obtain the total number of occurrences of each defect part factor at the workstation; On the main interface, a defect analysis bar chart corresponding to the factors of each defect position is displayed from high to low according to the counting dimension according to the total number of occurrences of the workstation; According to the mold defect parameters, the number of occurrences of each mold defect factor is counted to obtain the total number of occurrences of each mold defect factor; Displaying a defect analysis circular graph corresponding to the defect factors of each mold number according to the total number of occurrences of the mold number on the main interface; Wherein, the defect analysis chart includes a defect analysis bar chart and a defect analysis ring chart.

7. The detection defect display method according to claim 1, characterized in that: The method further comprises: When the response is triggered on the third control, the main interface also displays a model rejection label; In response to being triggered by the mold rejection label, a mold rejection defect table corresponding to the mold rejection defect data is displayed on the main interface, and the mold rejection label is used to provide an entry to the interface of the mold rejection defect table.

8. A detection defect display system, characterized in that: include: A first module is used to respond to a detection query request, obtain all first detection results corresponding to the detection device, and display a first control and a second control on a main interface, wherein the first detection result is displayed on the second control; A second module is used for responding to the trigger of the first control, obtaining production line information, filtering out a second detection result corresponding to the production line information from the first detection result, and updating the second control on the main interface, displaying a third control, and displaying the second detection result on the third control; A third module is used for responding to the triggering of the third control, obtaining the workstation rejection defect data and the mold number rejection defect data according to the second detection result, and displaying the workstation rejection defect table, the workstation rejection label and the chart control on the main interface according to the workstation rejection defect data, wherein the workstation rejection label is used to provide an entry to the interface of the workstation rejection defect table; The fourth module is used to respond to the trigger of the chart control and display the defect analysis chart corresponding to the workstation rejection defect data and the mold number rejection defect data on the main interface, and the chart control is used to provide an entry to the interface of the defect analysis chart.

9. An electronic device, characterized in that: The electronic device includes a hardware device, the hardware device includes a memory and a processor, the memory stores a computer program, and the processor implements the detection defect display method as described in any one of claims 1 to 7 when executing the computer program.

10. A computer-readable storage medium storing a computer program, characterized in that: When the computer program is executed by a processor, the detection defect display method according to any one of claims 1 to 7 is implemented.

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