Automatic test system and method for memory module

Abstract

The invention provides an automatic testing system and method for a memory module, and belongs to the technical field of memory testing. The automatic testing system comprises an automatic feeding and discharging system, a mainboard testing system and a machine testing system which are integrated on the same testing platform; the mainboard test system is used for performing function test or performance test on a memory module installed on a mainboard; the machine test system is used for performing function test or performance test on the memory module installed on the machine; the automatic feeding and discharging system is used for automatically feeding and discharging the memory modules for the mainboard testing system or the machine testing system. According to the invention, the mainboard test and the machine test are carried out on the same test platform, so that on one hand, the test requirements of multiple types of memory modules on the same test platform are met, and on the other hand, the requirements of multiple function tests and performance tests of the memory modules on the same test platform are met; and the test platform does not need to be frequently replaced, thereby facilitating test operation.

Description

Technical Field

[0001] The present invention belongs to the field of memory testing technology, and relates to automatic loading of memory modules, automatic matching with a testing system, and automatic testing technology, and specifically to an automatic testing system and method for a memory module. Background Art

[0002] A memory module is a package of multiple chips to form a larger memory module. It is the final embodiment of memory in specific applications and can meet the needs of reading and writing more data. Before being put into use, the memory module needs to undergo rigorous testing, including throughput testing, delay testing, and high temperature testing of the memory module.

[0003] In the prior art, when testing a memory module, the memory module is mostly manually inserted into the memory test platform (mainboard or machine) to be tested, and the memory test platform (mainboard or machine) sends a loading request for the memory test software to the server of the memory test platform (mainboard or machine) through a pre-installed PXE environment, and then saves the test LOG file based on the test results obtained by the memory test, and then manually checks the test results. Therefore, there is no overall automated testing solution in the prior art, and the machine test and the mainboard test are performed separately, resulting in a single test function, and the test platform needs to be frequently replaced, which is inconvenient for test operations. Summary of the invention

[0004] In view of the above-mentioned background technology, when performing memory module testing, there is no overall automated testing solution in the prior art, and the machine test and the motherboard test are performed separately. There are technical problems such as single testing function, the need to frequently change the test platform, and inconvenience in testing operations. To solve this technical problem, the present invention proposes a memory module automated testing system and method.

[0005] The present invention integrates an automatic loading and unloading system, a mainboard testing system and a machine testing system on the same testing platform. The automatic loading and unloading system is used to automatically load and unload memory modules for the mainboard testing system or the machine testing system, thereby realizing mainboard testing and machine testing on the same testing platform. On the one hand, it meets the testing requirements of various types of memory modules on the same testing platform, and on the other hand, it meets the requirements of various functional tests or performance tests of memory modules on the same testing platform, and there is no need to frequently change the testing platform, thereby facilitating testing operations.

[0006] In order to solve the above technical problems, the present invention adopts the following technical solutions:

[0007] The present invention provides a memory module automatic testing system, comprising: an automatic loading and unloading system, a mainboard testing system and a machine testing system integrated on the same testing platform;

[0008] The motherboard testing system is used to perform a function test or a performance test on a memory module installed on the motherboard;

[0009] The machine test system is used to perform function test or performance test on the memory module installed on the machine;

[0010] The automatic loading and unloading system is used to automatically load and unload memory modules for a motherboard testing system or a machine testing system.

[0011] It is further defined that the automatic loading and unloading system includes an automatic control system,

[0012] The automatic control system is used to control the automatic loading and unloading of memory modules in the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system.

[0013] It is further defined that the automatic loading and unloading system includes an automatic loading unit, an automatic unloading unit and a visual positioning unit.

[0014] The motherboard test system or the machine test system is also used to generate a test start instruction or a test end instruction, and send the test start instruction or the test end instruction to the automatic control system;

[0015] The visual positioning unit is used to collect images of the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system, and send the images of the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system to the automatic control system;

[0016] The automatic control system is specifically used to generate a loading instruction according to a test start instruction, determine a loading position according to an image of an automatic loading and unloading area of ​​a mainboard test system or an image of an automatic loading and unloading area of ​​a machine test system, and send the loading position and the loading instruction to an automatic loading unit; or generate an unloading instruction according to a test end instruction, determine an unloading position according to an image of an automatic loading and unloading area of ​​a mainboard test system or an image of an automatic loading and unloading area of ​​a machine test system, and send the unloading position and the unloading instruction to an automatic unloading unit;

[0017] The automatic loading unit is used to automatically insert the memory module in the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system based on the loading position and the loading instruction;

[0018] The automatic unloading unit is used to automatically extract the memory module in the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system based on the unloading position and the unloading instruction.

[0019] It is further defined that the automatic control system is also used to compare whether the memory modules in the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system are of the same type. If so, the automatic loading unit is controlled to automatically plug in the memory module in the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system; otherwise, the memory module is replaced and compared again.

[0020] It is further defined that the automatic control system is used to compare whether the memory modules in the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system are of the same type based on the identification code of the memory module.

[0021] It is further defined that the automatic control system is also used to determine whether the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system is fully plugged in the memory modules. If so, a test request instruction is generated and sent to the motherboard test system or the machine test system; otherwise, the automatic loading unit continues to be controlled to automatically plug in the memory modules in the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system.

[0022] It is further defined that the motherboard test system is specifically used to, after receiving a test request instruction sent by an automatic control system, identify the memory module, match the test program according to the identification result, use the test program to perform automated testing on the memory module installed on the motherboard, and provide real-time feedback of the test status and test results to the automatic control system.

[0023] It is further defined that the machine test system is specifically used to: after receiving a test request instruction sent by an automatic control system, match the SPD burning test program, Contact test program, Shmoo test program and / or HPPR test program according to the type of machine, perform automatic testing on the memory module according to the SPD burning test program, Contact test program, Shmoo test program and / or HPPR test program, and feed back the test status and test results to the automatic control system in real time.

[0024] It is further defined that the automatic control system is also used to classify the memory modules according to the test results.

[0025] The present invention provides a memory module automatic testing method, comprising the following steps:

[0026] Generate test start instructions to automatically load memory modules for the motherboard test system or machine test system on the same test platform;

[0027] Performing functional tests or performance tests on memory modules installed on a motherboard, or performing functional tests or performance tests on memory modules installed on a machine;

[0028] After the test is completed, a test end instruction is generated, and the memory module is automatically unloaded for the motherboard test system or the machine test system on the same test platform.

[0029] Compared with the prior art, the present invention has the following beneficial effects:

[0030] 1. The present invention provides an automatic loading and unloading system for memory modules, including an automatic loading and unloading system, a mainboard testing system and a machine testing system integrated on the same testing platform. The mainboard testing system is used to perform functional tests or performance tests on memory modules installed on the mainboard; the machine testing system is used to perform functional tests or performance tests on memory modules installed on the machine; and the automatic loading and unloading system is used to automatically load and unload memory modules for the mainboard testing system or the machine testing system. The present invention integrates the automatic loading and unloading system, the mainboard testing system and the machine testing system on the same testing platform. The automatic loading and unloading system is used to automatically load and unload memory modules for the mainboard testing system or the machine testing system, thereby realizing mainboard testing and machine testing on the same testing platform. On the one hand, it meets the testing requirements of various types of memory modules on the same testing platform, and on the other hand, it meets the requirements of various functional tests or performance tests of memory modules on the same testing platform, and does not require frequent replacement of the testing platform, which is convenient for testing operations.

[0031] 2. In the present invention, the automatic loading and unloading system also includes an automatic loading unit, an automatic unloading unit and a visual positioning unit. The visual positioning unit is used to collect images of the automatic loading and unloading area of ​​the mainboard test system or the automatic loading and unloading area of ​​the machine test system. The automatic control system determines the loading position or the unloading position based on the image of the automatic loading and unloading area of ​​the mainboard test system or the image of the automatic loading and unloading area of ​​the machine test system, thereby realizing fully automated control of loading and unloading, avoiding human influence, saving manpower and improving efficiency. At present, the efficiency of machine automation testing is estimated to reach 400UPH.

[0032] 3. In the present invention, the motherboard test system can identify the memory module and match the test program according to the identification result; the machine test system can match the SPD burning test program, Contact test program, Shmoo test program and / or HPPR test program according to the machine type; through the process of test program matching and machine matching, the memory module automatic test system of the present invention can perform multiple types of memory module tests on the motherboard or machine at the same time, can perform diversified tests, and at the same time improve the stability of the test.

[0033] 4. The present invention realizes the fully automated operation of memory module testing, including automated loading and unloading, automated matching of test programs or machines, and automated classification after the test is completed, thereby improving the testing efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] Figure 1 A schematic diagram of an automatic memory module testing system according to the present invention;

[0035] Figure 2 A schematic diagram of an automatic memory module testing method of the present invention;

[0036] Figure 3 It is a structural block diagram of the memory module automatic testing system of the present invention. DETAILED DESCRIPTION

[0037] In order to make the technical solution of the present invention clearer, the technical solution of the present invention will be clearly and completely described below in combination with the embodiments and drawings. Obviously, the described embodiments are part of the embodiments of the present invention, rather than all the embodiments. Therefore, the following detailed description of the embodiments of the present invention provided in the drawings is not intended to limit the scope of protection claimed, but merely represents the selected embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0038] The prior art requires the pre-installation of third-party testing tools (third-party TFTPD tools and third-party PXE tools) in the test system when testing the memory module. When testing the motherboard network, third-party tools are used to push the test version. The software is difficult to maintain in the future, has low scalability and low stability. When testing the machine network, non-automated manual operations are used, and it is not compatible with other test machine software, has low scalability and high labor costs. As a result, there is no overall automated testing solution, the machine automated testing is not combined with the motherboard automated testing, and the testing function is single.

[0039] See also Figure 1 The present invention provides a memory module automatic test system, including: an automatic loading and unloading system, a mainboard test system and a machine test system integrated on the same test platform; the mainboard test system is used to perform a function test or a performance test on a memory module installed on the mainboard; the machine test system is used to perform a function test or a performance test on a memory module installed on the machine; the automatic loading and unloading system is used to perform automatic loading and unloading of memory modules for the mainboard test system or the machine test system.

[0040] The present invention integrates a mainboard test system and a machine test system on the same test platform, and the mainboard test system and the machine test system share the same automatic loading and unloading system for automatic loading and unloading, thereby realizing mainboard testing and machine testing on the same test platform. On the one hand, it meets the testing requirements of various types of memory modules on the same test platform, and on the other hand, it meets the requirements of various functional tests or performance tests of memory modules on the same test platform, and there is no need to frequently change the test platform, thereby facilitating the test operation.

[0041] In the present invention, the automatic loading and unloading system includes an automatic control system, which is used to control the automatic loading and unloading of memory modules in the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system.

[0042] Among them, the automatic loading and unloading system also includes automatic loading unit, automatic unloading unit and visual positioning unit.

[0043] The mainboard test system or the machine test system is also used to generate a test start instruction or a test end instruction, and send the test start instruction or the test end instruction to the automatic control system;

[0044] The visual positioning unit is used to collect images of the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system, and send the images of the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system to the automatic control system;

[0045] The automatic control system is specifically used to generate a loading instruction according to a test start instruction, determine a loading position according to an image of an automatic loading and unloading area of ​​a mainboard test system or an image of an automatic loading and unloading area of ​​a machine test system, and send the loading position and the loading instruction to an automatic loading unit; or generate an unloading instruction according to a test end instruction, determine an unloading position according to an image of an automatic loading and unloading area of ​​a mainboard test system or an image of an automatic loading and unloading area of ​​a machine test system, and send the unloading position and the unloading instruction to an automatic unloading unit;

[0046] The automatic loading unit is used to move the memory module to be tested to the material collection area, and based on the loading position and loading instructions, automatically insert the memory module in the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system;

[0047] The automatic unloading unit is used to automatically extract the memory module in the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system based on the unloading position and unloading instruction, and remove the memory module after the test is completed.

[0048] In the present invention, the automatic control system is also used to compare whether the memory modules in the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system are of the same type. If so, the automatic loading unit is controlled to automatically plug in the memory module in the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system; otherwise, the memory module is replaced and compared again; until the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system is fully plugged with memory modules of the same type.

[0049] Specifically, the automatic control system is used to compare whether the memory modules in the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system are of the same type based on the identification code of the memory module.

[0050] In the present invention, the automatic control system is also used to determine whether the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system is fully plugged in with memory modules. If so, a test request instruction is generated and sent to the motherboard test system or the machine test system; otherwise, the automatic loading unit continues to be controlled to automatically plug in the memory module in the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system.

[0051] Specifically, the automatic control system determines whether the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system is fully plugged with memory modules based on the image of the automatic loading and unloading area of ​​the motherboard test system or the image of the automatic loading and unloading area of ​​the machine test system sent by the visual positioning unit. Specifically, the automatic loading unit and the automatic unloading unit are both manipulators that can be controlled by the automatic control system, wherein the manipulator is a mechanical structure well known to those skilled in the art.

[0052] In the present invention, the motherboard test system is specifically used to, after receiving the test request instruction sent by the automatic control system, identify the memory module, match the test program according to the identification result, use the test program to perform automatic testing on the memory module installed on the motherboard, and feed back the test status and test results to the automatic control system in real time. Specifically, the motherboard test system identifies the identification code of the memory module, and converts the format of the identification code to form an ASCII code, and associates the ASCII code with the name of the test program as the identification result, so that the memory module matches the test program, thereby completing the docking and matching of the memory module and the test program. Among them, the test program is a test program well known to those skilled in the art, for example: a test program for high temperature testing, a test program for delay testing, etc. In the present invention, the machine test system is specifically used for: after receiving the test request instruction sent by the automatic control system, matching the SPD burning test program, Contact test program, Shmoo test program and / or HPPR test program according to the type of the machine, performing automatic testing on the memory module according to the matched SPD burning test program, Contact test program, Shmoo test program and / or HPPR test program, and feeding back the test status and test results to the automatic control system in real time.

[0053] In the present invention, the automatic control system is also used to classify memory modules according to the test results. For example, according to the test results, memory modules that have passed the test are classified into one category, and memory modules that have not passed the test are classified into another category, etc., so as to realize automatic classification of memory modules that have completed the test.

[0054] The memory module automated testing system of the present invention also includes a data processing system. The automatic control system is used to send the test status and test results to the data processing system. The data processing system is used to analyze and process the test status and test results, for example: analyzing the proportion of memory modules that passed the test, the proportion of memory modules that failed the test, or the proportion of memory modules that had test abnormalities.

[0055] In the present invention, the test status of the motherboard test system includes: test passed, test failed, test process error, overcooling or overheating. The test result includes test passed or test failed.

[0056] In the present invention, the test status of the machine test system includes: three nodes, namely, the pass or fail of the SPD burning test, the pass or fail of the Contact test, and the pass or fail of the Shmoo test. If one of the nodes fails, the test result is the test failure. If all three nodes pass, the test result is the pass.

[0057] The present invention realizes automated management of version push and version management of the test program by automatically matching the test program, and improves the test stability, thereby improving the operational stability and convenience, and is compatible with most memory module testing requirements.

[0058] See also Figure 3 , is a structural block diagram of the memory module automatic test system of the present invention, the machine includes machine 1, machine 2, machine 3, ..., machine N, and the N machines can be used to match the SPD burning test program, the Contact test program, the Shmoo test program and / or the HPPR test program. The motherboard includes motherboard 1, motherboard 2, motherboard 3, ..., motherboard N, and the N motherboards can be used to match the test program. The automatic loading and unloading system includes an automatic loading unit, an automatic unloading unit, a visual positioning unit and an automatic control system.

[0059] See also Figure 2 The present invention also provides a memory module automatic testing method, which corresponds to the above-mentioned memory module automatic testing system, and includes the following steps:

[0060] Generate test start instructions to automatically load memory modules for the motherboard test system or machine test system on the same test platform;

[0061] Performing functional tests or performance tests on memory modules installed on a motherboard or performing functional tests or performance tests on memory modules installed on a machine;

[0062] After the test is completed, a test end instruction is generated, and the memory module is automatically unloaded for the motherboard test system or the machine test system on the same test platform.

[0063] Specifically, the automatic loading of memory modules includes:

[0064] Generate a loading instruction based on the test start instruction, collect images of the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system, determine the loading position based on the images of the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system, and perform automatic loading (inserting memory modules) in the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system according to the loading instruction and the loading position;

[0065] During the loading process, compare whether the memory modules in the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system are of the same type. If so, control the automatic loading unit to automatically insert the memory module in the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system; otherwise, replace the memory module and compare again until the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system is fully inserted with the memory module; specifically, the comparison is performed based on the identification code of the memory module;

[0066] During the loading process, it is also necessary to determine whether the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system is fully populated with memory modules based on the image of the automatic loading and unloading area of ​​the motherboard test system or the image of the automatic loading and unloading area of ​​the machine test system. If so, generate a test request instruction and send it to the motherboard test system or the machine test system; otherwise, continue to automatically insert the memory modules in the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system.

[0067] Specifically, the functional test or performance test of the memory module installed on the motherboard is as follows: the memory module is identified based on the test request instruction, the test program is matched according to the identification result, the memory module installed on the motherboard is automatically tested using the test program, and the test status and test results are fed back in real time, and the tested memory modules are classified according to the test results.

[0068] Specifically, the functional test or performance test of the memory module installed on the machine is as follows: based on the test request instruction, the SPD burning test program, the Contact test program, the Shmoo test program and / or the HPPR test program are matched according to the type of the machine, and the memory module is automatically tested according to the SPD burning test program, the Contact test program, the Shmoo test program and / or the HPPR test program, and the test status and test results are fed back in real time, and the tested memory modules are classified according to the test results.

[0069] Specifically, the automatic blanking of memory modules includes:

[0070] Generate a material unloading instruction based on the test end instruction, collect images of the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system, determine the material unloading position based on the images of the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system, and perform automatic unloading (pulling memory modules) in the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system according to the material unloading instruction and the material unloading position;

[0071] During the unloading process, comparison also needs to be made based on the image of the automatic loading and unloading area of ​​the motherboard test system or the image of the automatic loading and unloading area of ​​the machine test system to determine whether the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system has been completed. If so, the unloading process is stopped; otherwise, the memory module continues to be automatically removed in the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system.

[0072] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. For those skilled in the art, the present invention may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. A memory module automated testing system, characterized in that: include: Automatic loading and unloading system, motherboard test system and machine test system integrated on the same test platform; The motherboard testing system is used to perform a function test or a performance test on a memory module installed on the motherboard; The machine test system is used to perform a function test or a performance test on a memory module installed on the machine; The automatic loading and unloading system is used to automatically load and unload memory modules for a motherboard testing system or a machine testing system.

2. The memory module automatic testing system according to claim 1, characterized in that: The automatic loading and unloading system includes an automatic control system, The automatic control system is used to control the automatic loading and unloading of memory modules in the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system.

3. The memory module automatic testing system according to claim 2, characterized in that: The automatic loading and unloading system also includes an automatic loading unit, an automatic unloading unit and a visual positioning unit. The motherboard test system or the machine test system is also used to generate a test start instruction or a test end instruction, and send the test start instruction or the test end instruction to the automatic control system; The visual positioning unit is used to collect images of the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system, and send the images of the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system to the automatic control system; The automatic control system is specifically used to generate a loading instruction according to a test start instruction, determine a loading position according to an image of an automatic loading and unloading area of ​​a mainboard test system or an image of an automatic loading and unloading area of ​​a machine test system, and send the loading position and the loading instruction to an automatic loading unit; or generate an unloading instruction according to a test end instruction, determine an unloading position according to an image of an automatic loading and unloading area of ​​a mainboard test system or an image of an automatic loading and unloading area of ​​a machine test system, and send the unloading position and the unloading instruction to an automatic unloading unit; The automatic loading unit is used to automatically insert the memory module in the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system based on the loading position and the loading instruction; The automatic unloading unit is used to automatically extract the memory module in the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system based on the unloading position and the unloading instruction.

4. The memory module automatic testing system according to claim 3, characterized in that: The automatic control system is also used to compare whether the memory modules in the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system are of the same type. If so, the automatic loading unit is controlled to automatically plug in the memory module in the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system; otherwise, the memory module is replaced and compared again.

5. The memory module automatic testing system according to claim 4, characterized in that: The automatic control system is used to compare whether the memory modules in the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system are of the same type based on the identification code of the memory module.

6. The memory module automatic testing system according to claim 3 or 4, characterized in that: The automatic control system is also used to determine whether the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system is fully plugged in with memory modules. If so, a test request instruction is generated and sent to the motherboard test system or the machine test system; otherwise, the automatic loading unit continues to be controlled to automatically plug in the memory module in the automatic loading and unloading area of ​​the motherboard test system or the automatic loading and unloading area of ​​the machine test system.

7. The memory module automatic testing system according to claim 6, characterized in that: The motherboard test system is specifically used to, after receiving a test request instruction sent by an automatic control system, identify the memory module, match the test program according to the identification result, use the test program to perform automated testing on the memory module installed on the motherboard, and provide real-time feedback of the test status and test results to the automatic control system.

8. The memory module automatic testing system according to claim 6, characterized in that: The machine test system is specifically used for: after receiving a test request instruction sent by an automatic control system, matching an SPD burning test program, a Contact test program, a Shmoo test program and / or an HPPR test program according to the type of the machine, performing an automatic test on the memory module according to the SPD burning test program, the Contact test program, the Shmoo test program and / or the HPPR test program, and feeding back the test status and test results to the automatic control system in real time.

9. The memory module automatic testing system according to claim 7 or 8, characterized in that: The automatic control system is also used to classify the memory modules according to the test results.

10. A memory module automated testing method, characterized in that: The following steps are involved: Generate test start instructions to automatically load memory modules for the motherboard test system or machine test system on the same test platform; Performing functional tests or performance tests on memory modules installed on a motherboard, or performing functional tests or performance tests on memory modules installed on a machine; After the test is completed, a test end instruction is generated, and the memory module is automatically unloaded for the motherboard test system or the machine test system on the same test platform.

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