Discharging circuit of integrated module testing device

Abstract

The invention relates to the technical field of testing devices, in particular to a discharging circuit of an integrated module testing device. The circuit state identification unit generates a test state signal and transmits the test state signal to the state signal transmission unit for data interaction and the test state prompting unit for prompting; when the power supply module is powered off, the input end and the second output end of the large-current switch piece are connected, and the visual electric energy consumption piece consumes residual electric energy and visually displays the consumption degree of the residual electric energy. The circuit state identification unit generates a discharge state signal and transmits the discharge state signal to the state signal transmission unit for data interaction and the discharge state warning unit for warning; therefore, the device is more suitable for an integrated module testing device, the service life of the testing device is prolonged, the consumption process can be visually observed while all residual electric energy is quickly consumed, and the testing efficiency is improved.

Description

Technical Field

[0001] The invention relates to the technical field of testing devices, in particular to a discharge circuit of an integrated module testing device. Background Art

[0002] The power semiconductor module (Intelligent Power Module, IPM) is a power drive product that combines power electronics and integrated circuit technology. It has the advantages of high current, low saturation voltage and high withstand voltage of GTR (high power transistor), and the advantages of high input impedance, high switching frequency and low driving power of MOSFET (field effect transistor). The IPM module integrates logic control, detection and protection circuits, etc. It has high integration and is easy to use. It not only reduces the size of the system and shortens the development time, but also enhances the reliability of the system. It is widely used in the fields of household appliances, power supplies and chargers, industrial power supplies, and networks and communications. For integrated modules like IPM modules, whether they are used for R&D products or for mass production products, they will be subjected to various test items such as FCT tests and aging tests in advance to verify their functional integrity and various performances.

[0003] However, most of the test devices currently used for IPM module testing are not equipped with discharge devices or discharge circuits. After the IPM module is tested, the residual electrical energy inside the IPM module needs to be naturally consumed through the internal circuit impedance. The discharge time is relatively long, requiring 5-8s, which seriously affects the test efficiency. In addition, the residual electrical energy may still remain. Based on the limited anti-static ability of the IPM module, the remaining residual electrical energy may cause the IPM module to be at risk of breakdown.

[0004] More importantly, the discharge circuit commonly used in current circuits is composed of a transistor and a resistor. If the currently commonly used discharge circuit is directly used as the discharge circuit of the IPM module test device, the gate of the transistor will be at risk of overvoltage damage due to the uncertainty of the residual electric energy and the need for frequent testing and discharge of the test device, thereby causing the discharge circuit to fail and making it difficult to replace the transistor and resistor. Moreover, the speed of discharging the electric energy to the ground using a resistor is slow, and it is impossible to intuitively know whether the electric energy has been discharged. Therefore, the commonly used discharge circuit is not suitable for the test device. Summary of the invention

[0005] In view of the above-mentioned defects, the purpose of the present invention is to propose a discharge circuit for an integrated module testing device, which is more suitable for the integrated module testing device, prolongs the service life of the testing device, and can quickly consume all residual electrical energy while intuitively observing the consumption process, thereby improving testing efficiency.

[0006] To achieve this object, the present invention adopts the following technical solutions:

[0007] A discharge circuit of an integrated module test device, comprising a power supply unit of the integrated module test device, a large current switch component that is easy to load and unload, a visual electric energy consumption component that is easy to load and unload, a circuit state recognition unit, a state signal transmission unit, a test state prompt unit and a discharge state warning unit; the V1 power supply terminal of the power supply unit and the input terminal of the large current switch component are all electrically connected to the positive electrode of the integrated module under test, the negative terminal of the power supply unit, the negative electrode of the visual electric energy consumption component, the ground terminal of the test state prompt unit, and the ground terminal of the discharge state warning unit are all electrically connected to the negative electrode of the integrated module under test, and the large current switch component is connected to the ground terminal of the test state prompt unit. The positive power supply terminal of the current switch component is electrically connected to the V2 power supply terminal of the power supply unit, the negative power supply terminal of the high-current switch component is grounded, the first output terminal of the high-current switch component is electrically connected to the input terminal of the circuit state identification unit, the input terminal of the state signal transmission unit, the input terminal of the test state prompt unit, and the input terminal of the discharge state warning unit are all electrically connected to the output terminal of the circuit state identification unit, the output terminal of the state signal transmission unit is electrically connected to the controller of the integrated module test device, and the second output terminal of the high-current switch component is electrically connected to the positive electrode of the visualized electric energy consumption component;

[0008] When the power supply unit is powered on, the input terminal and the first output terminal of the high-current switch are turned on, and the circuit state identification unit generates a test state signal and transmits it to the state signal transmission unit and the test state prompt unit;

[0009] When the power supply unit is powered off, the input end and the second output end of the high-current switch are turned on, the visual power consumption part consumes the residual power and visually displays the residual power consumption degree, and the circuit state recognition unit generates a discharge state signal and transmits it to the state signal transmission unit and the discharge state warning unit;

[0010] The state signal transmission unit is used for exchanging data with the controller of the integrated module test device when receiving the test state signal or the discharge state signal;

[0011] The test status prompt unit is used to send a prompt to the tester that the integrated module is being tested;

[0012] The discharge state warning unit is used to issue a discharge danger state warning to the tester.

[0013] Furthermore, the visualized power consumption component is a high-pressure filament bulb, one end of the high-pressure filament bulb is used as the positive electrode of the visualized power consumption component, and the other end of the high-pressure filament bulb is used as the negative electrode of the visualized power consumption component.

[0014] Furthermore, the high-current switching device is a relay, one end of the coil of the relay is used as the positive power supply terminal of the high-current switching device, the other end of the coil of the relay is used as the negative power supply terminal of the high-current switching device, the middle contact of the relay is used as the input terminal of the high-current switching device, the normally open contact of the relay is used as the first output terminal of the high-current switching device, and the normally closed contact of the relay is used as the second output terminal of the high-current switching device.

[0015] Furthermore, it also includes an integrated module driving load; the positive electrode of the integrated module driving load is electrically connected to the positive electrode of the integrated module under test, and the negative electrode of the integrated module driving load is electrically connected to the negative electrode of the integrated module under test.

[0016] Further, the circuit state identification unit includes a resistor R2, a resistor R8, a comparator CMP1, a diode D2 and a diode D3; one end of the resistor R8 is used as an input end of the circuit state identification unit, and the output end of the comparator CMP1 is used as an output end of the circuit state identification unit;

[0017] The other end of the resistor R8 is electrically connected to the positive input end of the comparator CMP1, the negative input end of the comparator CMP1 is connected to the Vref voltage, the negative input end of the comparator CMP1 is electrically connected to one end of the resistor R2, and the other end of the resistor R2, the anode of the diode D2, and the anode of the diode D3 are all electrically connected to the output end of the comparator CMP1.

[0018] Furthermore, the state signal transmission unit includes a NOT gate N1 and a MOS transistor Q2; the input end of the NOT gate N1 is used as the input end of the state signal transmission unit, and the drain of the MOS transistor Q2 is used as the output end of the state signal transmission unit;

[0019] The output end of the NOT gate N1 is electrically connected to the gate of the MOS transistor Q2 , and the source of the MOS transistor Q2 is grounded.

[0020] Furthermore, the test status prompt unit includes a light emitting diode D4 and a resistor R7; the anode of the light emitting diode D4 is used as the input end of the test status prompt unit, and one end of the resistor R7 is used as the ground end of the test status prompt unit;

[0021] The cathode of the light emitting diode D4 is electrically connected to the other end of the resistor R7.

[0022] Further, the discharge state warning unit includes a MOS tube Q4, a buzzer SPK1 and a resistor R9; the gate of the MOS tube Q4 is used as the input end of the discharge state warning unit, and one end of the resistor R9 is used as the ground end of the discharge state warning unit;

[0023] The drain of the MOS tube Q4 is connected to the VCC power supply, the source of the MOS tube Q4 is electrically connected to the positive electrode of the buzzer SPK1, and the negative electrode of the buzzer SPK1 is electrically connected to the other end of the resistor R9.

[0024] The technical solution provided by the present invention may include the following beneficial effects: when the integrated module is being tested, the power supply module in the integrated module testing device will provide V1 power to the integrated module under test to maintain the normal operation of the integrated module under test. At this time, discharge is not possible, so the high-current switch component is also provided with V2 power by the power supply module for control associated with the test status of the integrated module under test, that is, when the power supply module is powered on, the high-current switch component turns on its input end and the first output end as the integrated module under test starts testing, the visual power consumption component PX is disconnected from the integrated module under test, and discharge is not possible. The circuit state identification unit is connected to the main circuit to generate a test state signal that is transmitted to the state signal transmission unit and the test state prompt unit, so that the state feedback of the integrated module testing device performing the test work at this time can be informed to the controller of the integrated module testing device for recording or the next action, and at the same time, the test state prompt unit sends a prompt to the tester that the integrated module is being tested.

[0025] If the power module is powered off, the V2 power supply of the high-current switch component will be disconnected along with the V1 power supply of the integrated module under test, the input end of the high-current switch component will be reset and connected to the second output end, the integrated module under test will be connected to the visual power consumption component, the residual power of the integrated module under test can be quickly and completely consumed, and the residual power consumption level can be intuitively displayed to the tester, so as to accurately judge the power consumption situation and avoid the residual power of the integrated module under test being removed by the tester before it is completely released or not removed in time after it is released, which affects the test efficiency; at the same time, the circuit state recognition unit will generate a discharge state signal due to the disconnection of the main circuit, which will be transmitted to the state signal transmission unit and the discharge state warning unit, so that the state of discharge after the integrated module test device is tested can be fed back to the controller of the integrated module test device for recording or the next action, and at the same time, the discharge state warning unit will issue a discharge danger state warning to the tester, emphasizing to remind the tester not to approach to avoid endangering the tester.

[0026] More importantly, the large-current switch components have better current-bearing capacity and frequent switching capacity, and are more suitable for test equipment for frequent operation and to withstand discharge current; and the large-current switch components and visual power consumption components are easy to load and unload, and can be replaced in time when they are damaged during frequent tests, avoiding affecting the test efficiency, and can resume the test in a short time, extending the service life of the test equipment. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] Figure 1The present invention is a schematic diagram of the circuit principle of a discharge circuit of an integrated module testing device according to one embodiment of the present invention.

[0028] Among them: power supply unit 1, high-current switch component RS, visual power consumption component PX, circuit state identification unit 2, state signal transmission unit 3, test state prompt unit 4, discharge state warning unit 5, tested integrated module 6, integrated module drive load 7, resistor R2, resistor R8, comparator CMP1, diode D2, diode D3, NOT gate N1, MOS tube Q2, light-emitting diode D4, resistor R7, MOS tube Q4, buzzer SPK1, resistor R9. DETAILED DESCRIPTION

[0029] Embodiments of the present invention are described in detail below, examples of which are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and cannot be understood as limiting the present invention.

[0030] In the description of the embodiments of the present invention, the terms "first" and "second" are used for descriptive purposes only and are not to be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Thus, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of the embodiments of the present invention, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.

[0031] In the description of the embodiments of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be directly connected or indirectly connected through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in the embodiments of the present invention can be understood according to specific circumstances.

[0032] Combine the following Figure 1 , describing a discharge circuit of an integrated module testing device according to an embodiment of the present invention.

[0033] A discharge circuit of an integrated module test device, comprising a power supply unit 1 of the integrated module test device, a large current switch component RS that is easy to load and unload, a visual power consumption component PX that is easy to load and unload, a circuit state recognition unit 2, a state signal transmission unit 3, a test state prompt unit 4 and a discharge state warning unit 5; the V1 power supply terminal of the power supply unit 1 and the input terminal of the large current switch component RS are all electrically connected to the positive electrode of the tested integrated module 6, and the negative terminal of the power supply unit 1, the negative electrode of the visual power consumption component PX, the ground terminal of the test state prompt unit 4, and the ground terminal of the discharge state warning unit 5 are all electrically connected to the negative electrode of the tested integrated module 6. Electrical connection, the positive power supply terminal of the high-current switch element RS is electrically connected to the V2 power supply terminal of the power supply unit 1, the negative power supply terminal of the high-current switch element RS is grounded, the first output terminal of the high-current switch element RS is electrically connected to the input terminal of the circuit state identification unit 2, the input terminal of the state signal transmission unit 3, the input terminal of the test state prompt unit 4, and the input terminal of the discharge state warning unit 5 are all electrically connected to the output terminal of the circuit state identification unit 2, the output terminal of the state signal transmission unit 3 is electrically connected to the controller of the integrated module test device, and the second output terminal of the high-current switch element RS is electrically connected to the positive electrode of the visualized power consumption component PX;

[0034] When the power supply unit 1 is powered on, the input terminal and the first output terminal of the high-current switch RS are turned on, and the circuit state recognition unit 2 generates a test state signal and transmits it to the state signal transmission unit 3 and the test state prompt unit 4;

[0035] When the power supply unit 1 is powered off, the input terminal and the second output terminal of the high current switch RS are turned on, the visual power consumption component PX consumes the residual power and visually displays the residual power consumption degree, and the circuit state recognition unit 2 generates a discharge state signal and transmits it to the state signal transmission unit 3 and the discharge state warning unit 5;

[0036] The state signal transmission unit 3 is used to interact with the controller data of the integrated module test device when receiving the test state signal or the discharge state signal;

[0037] The test status prompt unit 4 is used to send a prompt to the tester that the integrated module is being tested;

[0038] The discharge state warning unit 5 is used to issue a discharge danger state warning to the tester.

[0039] The present invention proposes a preferred embodiment of a discharge circuit of an integrated module testing device, such as Figure 1As shown, the power supply unit 1 (connected to the mains and converted into the voltage level output required in the circuit) in the integrated module testing device will provide V1 power to the integrated module 6 under test to maintain the normal operation of the integrated module 6 under test when the integrated module is tested. At this time, discharge is not allowed, so the high-current switch RS is also provided with V2 power by the power supply unit 1 for control associated with the test state of the integrated module 6 under test, that is, when the power supply unit 1 is powered on (that is, K1 is closed), the high-current switch RS starts testing the integrated module 6 and turns on its input end and the first output end, the visual power consumption part PX is disconnected from the integrated module 6 under test, and discharge is not allowed. The circuit state identification unit 2 is connected to the main circuit to generate a test state signal that is transmitted to the state signal transmission unit 3 and the test state prompt unit 4, so that the state feedback of the integrated module testing device under test at this time can be informed to the controller of the integrated module testing device for recording or the next action, and at the same time, the test state prompt unit 4 sends a prompt of integrated module testing to the tester.

[0040] If the power supply unit 1 is powered off (i.e. K1 is disconnected), the V2 power supply of the high-current switch component RS will be disconnected along with the V1 power supply of the integrated module 6 under test, and the input end of the high-current switch component RS will be reset and connected to the second output end, and the integrated module 6 under test will be connected to the visual power consumption component PX, so that the residual power of the integrated module 6 under test can be quickly and completely consumed, and the residual power consumption degree can be intuitively displayed to the tester, so as to accurately judge the power consumption situation and avoid the integrated module 6 under test being removed by the tester before the residual power is completely released or not removed in time after being released, which affects the test efficiency; at the same time, the circuit state identification unit 2 will generate a discharge state signal due to the disconnection of the main circuit, which will be transmitted to the state signal transmission unit 3 and the discharge state warning unit 5, so that the state of discharge after the integrated module test device is tested can be fed back to the controller of the integrated module test device for recording or the next step, and at the same time, the discharge state warning unit 5 will issue a discharge danger state warning to the tester, especially reminding the tester not to approach to avoid endangering the tester.

[0041] More importantly, the high-current switch component RS has better current-bearing capacity and frequent switching capacity, and is more suitable for test equipment for frequent operation and discharge current bearing; and the high-current switch component RS and the visual power consumption component PX are easy to load and unload, and can be replaced in time when they are damaged during frequent tests, avoiding affecting the test efficiency, and can resume the test in a short time, extending the service life of the test equipment.

[0042] Furthermore, the visualized power consumption part PX is a high-pressure filament bulb, one end of the high-pressure filament bulb is used as the positive electrode of the visualized power consumption part PX, and the other end of the high-pressure filament bulb is used as the negative electrode of the visualized power consumption part PX.

[0043] In this embodiment, because the visualized power consumption part PX needs to consume power quickly and display the degree of power consumption, a high-pressure filament bulb is preferably used. The bulb can quickly consume power for light emission. The brightness of the light emission represents the consumption of the residual power of the tested integrated module 6. It will change from bright to dark. When the bulb goes out, it means that the residual power is exhausted. The high-pressure filament bulb is also easy to load and unload. It can be directly installed or removed from the lamp holder. More importantly, compared with high-pressure gas bulbs, high-pressure filament bulbs are cheaper and more reliable, which can reduce testing costs.

[0044] Furthermore, the high-current switching element RS is a relay, one end of the coil of the relay is used as the positive power supply terminal of the high-current switching element RS, the other end of the coil of the relay is used as the negative power supply terminal of the high-current switching element RS, the middle contact of the relay is used as the input terminal of the high-current switching element RS, the normally open contact of the relay is used as the first output terminal of the high-current switching element RS, and the normally closed contact of the relay is used as the second output terminal of the high-current switching element RS.

[0045] In this embodiment, because the high-current switch element RS needs to have three characteristics: high current bearing capacity, adaptability to frequent switching and easy loading and unloading, a relay is preferably used. The relay itself is used for high-current switching, and has strong high current bearing capacity and frequent switching adaptability. The normally open contact of the relay is connected to the integrated module 6 under test, and the normally closed contact is connected to the visual power consumption component PX. The coil is controlled by the power supply unit 1, which meets the design requirements. It can connect the integrated module 6 under test when power is turned on, and reset and connect the visual power consumption component PX when power is turned off, so that the test device can be in a discharge state for a long time, thereby avoiding leakage of the test device. The relay can also be plugged in and unloaded in the circuit through the wiring terminal, which reflects its easy loading and unloading.

[0046] Furthermore, it also includes an integrated module driving load 7; the positive electrode of the integrated module driving load 7 is electrically connected to the positive electrode of the integrated module 6 under test, and the negative electrode of the integrated module driving load 7 is electrically connected to the negative electrode of the integrated module 6 under test.

[0047] In this embodiment, due to the enhanced discharge capability of the test device, the integrated module driving load 7 can be connected to the output end of the integrated module 6 under test, so that the integrated module 6 under test can drive the integrated module driving load 7 to simulate the most realistic application scenario during the test, and the function of the integrated module 6 under test can be better verified. After the test, the residual electric energy of the integrated module driving load 7 can also be released together, so that the test device can face the test objects with more complex system composition.

[0048] Further, the circuit state identification unit 2 includes a resistor R2, a resistor R8, a comparator CMP1, a diode D2 and a diode D3; one end of the resistor R8 is used as an input end of the circuit state identification unit 2, and the output end of the comparator CMP1 is used as an output end of the circuit state identification unit 2;

[0049] The other end of the resistor R8 is electrically connected to the positive input end of the comparator CMP1, the negative input end of the comparator CMP1 is connected to the Vref voltage, the negative input end of the comparator CMP1 is electrically connected to one end of the resistor R2, and the other end of the resistor R2, the anode of the diode D2, and the anode of the diode D3 are all electrically connected to the output end of the comparator CMP1.

[0050] In this embodiment, the circuit state identification unit 2 mainly uses the comparator CMP1 to identify the state of the test device. In the test state, the positive input terminal of the comparator CMP1 is connected to the main circuit. At this time, it is obviously larger than the reference voltage (i.e., Vref voltage), and a high level (test state signal) is output, and it is clamped by the diode D2; in the discharge state, the positive input terminal of the comparator CMP1 is disconnected from the main circuit. At this time, it is obviously smaller than the reference voltage (i.e., Vref voltage), and a low level (discharge state signal) is output, and it is clamped by the diode D3.

[0051] Furthermore, the state signal transmission unit 3 includes a NOT gate N1 and a MOS transistor Q2; the input end of the NOT gate N1 is used as the input end of the state signal transmission unit 3, and the drain of the MOS transistor Q2 is used as the output end of the state signal transmission unit 3;

[0052] The output end of the NOT gate N1 is electrically connected to the gate of the MOS transistor Q2 , and the source of the MOS transistor Q2 is grounded.

[0053] In this embodiment, when the status signal transmission unit 3 receives the test status signal or the discharge status signal and interacts with the controller data of the integrated module test device, the output level of the comparator CMP1 drives the MOS tube Q2 to be turned on and off through the NOT gate N1 to feedback the test status and the discharge status to the controller of the integrated module test device.

[0054] Further, the test status prompt unit 4 includes a light emitting diode D4 and a resistor R7; the anode of the light emitting diode D4 is used as the input terminal of the test status prompt unit 4, and one end of the resistor R7 is used as the ground terminal of the test status prompt unit 4;

[0055] The cathode of the light emitting diode D4 is electrically connected to the other end of the resistor R7.

[0056] In this embodiment, since the tested integrated module 6 is relatively safe during testing, the light emitting diode D4 can be used to illuminate to remind the tester that the test is in progress.

[0057] Furthermore, the discharge state warning unit 5 includes a MOS tube Q4, a buzzer SPK1 and a resistor R9; the gate of the MOS tube Q4 is used as an input end of the discharge state warning unit 5, and one end of the resistor R9 is used as a ground end of the discharge state warning unit 5;

[0058] The drain of the MOS tube Q4 is connected to the VCC power supply, the source of the MOS tube Q4 is electrically connected to the positive electrode of the buzzer SPK1, and the negative electrode of the buzzer SPK1 is electrically connected to the other end of the resistor R9.

[0059] In this embodiment, because the amount of residual electrical energy is unknown during discharge, the current may be very large and relatively dangerous. The buzzer SPK1 is used to make a sound during the discharge process to warn the tester and prevent the tester from getting close and getting electric shock.

[0060] Other structures and operations of the discharge circuit of an integrated module testing device according to an embodiment of the present invention are known to those skilled in the art and will not be described in detail here.

[0061] In the description of this specification, the description with reference to the terms "embodiment", "example", etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any one or more embodiments or examples in a suitable manner.

[0062] Although the embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the claims and their equivalents.

Claims

1. A discharge circuit of an integrated module test device, characterized in that: The integrated module test device comprises a power supply unit, a large current switch for easy loading and unloading, a visual power consumption part for easy loading and unloading, a circuit state recognition unit, a state signal transmission unit, a test state prompt unit and a discharge state warning unit; the V1 power supply terminal of the power supply unit and the input terminal of the large current switch are electrically connected to the positive electrode of the integrated module under test, the negative terminal of the power supply unit, the negative electrode of the visual power consumption part, the ground terminal of the test state prompt unit and the ground terminal of the discharge state warning unit are electrically connected to the negative electrode of the integrated module under test, the positive electrode of the large current switch is electrically connected to the positive electrode of the integrated module under test, and the positive electrode of the large current switch is electrically connected to the positive electrode of the integrated module under test. The power supply terminal is electrically connected to the V2 power supply terminal of the power supply unit, the negative power supply terminal of the high-current switch component is grounded, the first output terminal of the high-current switch component is electrically connected to the input terminal of the circuit state identification unit, the input terminal of the state signal transmission unit, the input terminal of the test state prompt unit, and the input terminal of the discharge state warning unit are all electrically connected to the output terminal of the circuit state identification unit, the output terminal of the state signal transmission unit is electrically connected to the controller of the integrated module test device, and the second output terminal of the high-current switch component is electrically connected to the positive electrode of the visualized electric energy consumption component; When the power supply unit is powered on, the input terminal and the first output terminal of the high-current switch are turned on, and the circuit state identification unit generates a test state signal and transmits it to the state signal transmission unit and the test state prompt unit; When the power supply unit is powered off, the input end and the second output end of the high-current switch are turned on, the visual power consumption part consumes the residual power and visually displays the residual power consumption degree, and the circuit state recognition unit generates a discharge state signal and transmits it to the state signal transmission unit and the discharge state warning unit; The state signal transmission unit is used for exchanging data with the controller of the integrated module test device when receiving the test state signal or the discharge state signal; The test status prompt unit is used to send a prompt to the tester that the integrated module is being tested; The discharge state warning unit is used to issue a discharge danger state warning to the tester.

2. The discharge circuit of the integrated module testing device according to claim 1, characterized in that: The visualized power consumption component is a high-voltage filament bulb, one end of the high-voltage filament bulb is used as the positive electrode of the visualized power consumption component, and the other end of the high-voltage filament bulb is used as the negative electrode of the visualized power consumption component.

3. The discharge circuit of the integrated module testing device according to claim 1, characterized in that: The high-current switching device is a relay, one end of the coil of the relay is used as the positive power supply terminal of the high-current switching device, the other end of the coil of the relay is used as the negative power supply terminal of the high-current switching device, the middle contact of the relay is used as the input terminal of the high-current switching device, the normally open contact of the relay is used as the first output terminal of the high-current switching device, and the normally closed contact of the relay is used as the second output terminal of the high-current switching device.

4. The discharge circuit of the integrated module testing device according to claim 1, characterized in that: It also includes an integrated module driving load; the positive electrode of the integrated module driving load is electrically connected to the positive electrode of the integrated module under test, and the negative electrode of the integrated module driving load is electrically connected to the negative electrode of the integrated module under test.

5. The discharge circuit of the integrated module testing device according to claim 1, characterized in that: The circuit state identification unit includes a resistor R2, a resistor R8, a comparator CMP1, a diode D2 and a diode D3; one end of the resistor R8 is used as an input end of the circuit state identification unit, and the output end of the comparator CMP1 is used as an output end of the circuit state identification unit; The other end of the resistor R8 is electrically connected to the positive input end of the comparator CMP1, the negative input end of the comparator CMP1 is connected to the Vref voltage, the negative input end of the comparator CMP1 is electrically connected to one end of the resistor R2, and the other end of the resistor R2, the anode of the diode D2, and the anode of the diode D3 are all electrically connected to the output end of the comparator CMP1.

6. The discharge circuit of the integrated module testing device according to claim 1, characterized in that: The state signal transmission unit includes a NOT gate N1 and a MOS transistor Q2; the input end of the NOT gate N1 is used as the input end of the state signal transmission unit, and the drain of the MOS transistor Q2 is used as the output end of the state signal transmission unit; The output end of the NOT gate N1 is electrically connected to the gate of the MOS transistor Q2 , and the source of the MOS transistor Q2 is grounded.

7. The discharge circuit of the integrated module testing device according to claim 1, characterized in that: The test status prompt unit includes a light emitting diode D4 and a resistor R7; the anode of the light emitting diode D4 is used as the input end of the test status prompt unit, and one end of the resistor R7 is used as the ground end of the test status prompt unit; The cathode of the light emitting diode D4 is electrically connected to the other end of the resistor R7.

8. The discharge circuit of the integrated module testing device according to claim 1, characterized in that: The discharge state warning unit includes a MOS tube Q4, a buzzer SPK1 and a resistor R9; the gate of the MOS tube Q4 is used as the input end of the discharge state warning unit, and one end of the resistor R9 is used as the ground end of the discharge state warning unit; The drain of the MOS tube Q4 is connected to the VCC power supply, the source of the MOS tube Q4 is electrically connected to the positive electrode of the buzzer SPK1, and the negative electrode of the buzzer SPK1 is electrically connected to the other end of the resistor R9.

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