Pressure testing method and device, electronic equipment and storage medium

Abstract

The invention provides a pressure test method and device, electronic equipment and a storage medium, and the method comprises the steps: determining first configuration data of a BC system and second configuration data of a PLC in response to a data configuration operation; wherein the first configuration data is used for generating to-be-selected events; in response to an event selection operation, determining a to-be-tested event from the to-be-selected events; in response to starting test operation, writing the generated simulation data of the event to be tested into the PLC according to the second configuration data; and determining a test result of the BC system according to feedback data when the BC system writes the PLC data. According to the invention, manual work is reduced, the efficiency and accuracy of the configuration and test process are improved, the stability and safety of the system are enhanced, and the maintenance cost is reduced.

Description

Technical Field

[0001] The present application relates to the technical field of pressure testing, and in particular to a pressure testing method, device, electronic device and storage medium. Background Art

[0002] In the field of industrial automation, the BC system (Block Control System) is the core part of production line management and needs to frequently interact with PLC. In order to ensure the stability and reliability of the system, stress testing is usually required before actual deployment.

[0003] Traditional stress testing methods require a lot of manual participation. This kind of manual testing method requires a lot of configuration work, which is time-consuming and labor-intensive. In addition, errors are prone to occur during configuration, resulting in inaccurate stress test results. Summary of the invention

[0004] In view of this, the purpose of the present application is to provide a pressure testing method, device, electronic device and storage medium to overcome the problems in the prior art.

[0005] In a first aspect, an embodiment of the present application provides a stress testing method, which acts on a device line control BC system, a simulation device and a programmable logic controller PLC, wherein the simulation device is connected to the PLC, and the simulation device and the PLC are also connected to the BC system respectively; the method comprises:

[0006] In response to a data configuration operation, determining first configuration data of the BC system and second configuration data of the PLC; wherein the first configuration data is used to generate a to-be-selected event;

[0007] In response to an event selection operation, determining an event to be tested from the events to be selected;

[0008] In response to starting a test operation, writing the generated simulation data of the event to be tested into the PLC according to the second configuration data;

[0009] The test result of the BC system is determined according to the feedback data when the BC system writes the PLC data.

[0010] In some technical solutions of the present application, in response to the data configuration operation, the first configuration data of the BC system and the second configuration data of the PLC are determined; wherein the first configuration data is used to generate a to-be-selected event, including:

[0011] In response to the data configuration operation, the database address and database type of the BC system and the data used for the test of the PLC are determined.

[0012] In some technical solutions of the present application, in response to the event selection operation, determining the event to be tested from the events to be selected includes:

[0013] In response to an event selection operation, determining a preliminary selected event from the events to be selected;

[0014] In response to the sequence adjustment operation, the sequence of the initially selected events is adjusted to obtain the adjusted events to be tested.

[0015] In some technical solutions of the present application, before starting the test operation, the method further includes:

[0016] In response to a condition setting operation, generating a test rule corresponding to the condition setting operation;

[0017] In response to starting the test operation, writing the generated simulation data of the event to be tested into the PLC according to the second configuration data includes:

[0018] In response to starting a test operation, the generated simulation data of the event to be tested is written into the PLC according to the test rule and the second configuration data.

[0019] In some technical solutions of the present application, the number of the above-mentioned PLC is one, and the second configuration data includes a first code program and a second code program;

[0020] In response to starting the test operation, writing the generated first simulation data of the event to be tested into the PLC according to the second configuration data includes:

[0021] In response to starting a test operation, writing the generated first type simulation data of the event to be tested into the PLC according to the first code program;

[0022] According to the second code program, the generated second type simulation data of the event to be tested is written into the PLC.

[0023] In some technical solutions of the present application, the test result of the BC system is determined according to the feedback data when the BC system writes the PLC data, including:

[0024] The test result of the BC system is determined according to the processing time and the amount of processed data when the BC system writes the PLC data.

[0025] In some technical solutions of the present application, the test result of the BC system is determined according to the processing time and the amount of data processed when the BC system writes the PLC data, including:

[0026] A display chart reflecting the performance of the BC system is generated according to the processing time and the amount of processed data.

[0027] In a second aspect, an embodiment of the present application provides a pressure testing device, which acts on a BC system, a simulation device and a programmable logic controller PLC, wherein the simulation device is connected to the PLC, and the simulation device and the PLC are also connected to the BC system respectively; the device includes:

[0028] A first response module, configured to determine first configuration data of the BC system and second configuration data of the PLC in response to a data configuration operation; wherein the first configuration data is used to generate a to-be-selected event;

[0029] A second response module, configured to determine an event to be tested from the events to be selected in response to an event selection operation;

[0030] a third response module, configured to write the generated simulation data of the event to be tested into the PLC according to the second configuration data in response to starting the test operation;

[0031] The test module is used to determine the test result of the BC system according to the feedback data when the BC system writes the PLC data.

[0032] In a third aspect, an embodiment of the present application provides an electronic device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of the above-mentioned stress testing method when executing the computer program.

[0033] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the steps of the above-mentioned stress testing method are executed.

[0034] The technical solution provided by the embodiments of the present application may have the following beneficial effects:

[0035] The method of the present application includes determining the first configuration data of the BC system and the second configuration data of the PLC in response to a data configuration operation; wherein the first configuration data is used to generate a to-be-selected event; in response to an event selection operation, determining an event to be tested from the to-be-selected events; in response to a start test operation, writing the generated simulation data of the event to be tested into the PLC according to the second configuration data; and determining the test result of the BC system according to feedback data when the BC system writes the PLC data.

[0036] This application reduces the work of manual participation, not only improves the efficiency and accuracy of the configuration and testing process, but also enhances the stability and security of the system and reduces maintenance costs.

[0037] In order to make the above-mentioned objects, features and advantages of the present application more obvious and easy to understand, preferred embodiments are specifically cited below and described in detail with reference to the attached drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the embodiments will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present application and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0039] Figure 1 A schematic diagram of a pressure testing method provided in an embodiment of the present application is shown;

[0040] Figure 2 A schematic diagram showing another pressure testing method provided in an embodiment of the present application is shown;

[0041] Figure 3 A schematic diagram of a pressure testing device provided in an embodiment of the present application is shown;

[0042] Figure 4 A schematic diagram of the structure of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0043] To make the purpose, technical scheme and advantages of the embodiments of the present application clearer, the technical scheme in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. It should be understood that the drawings in the present application only serve the purpose of explanation and description and are not used to limit the scope of protection of the present application. In addition, it should be understood that the schematic drawings are not drawn in real proportion. The flowchart used in this application shows the operations implemented according to some embodiments of the present application. It should be understood that the operations of the flowchart can be implemented out of sequence, and the steps without logical context can be reversed in order or implemented simultaneously. In addition, those skilled in the art can add one or more other operations to the flowchart under the guidance of the content of the present application, or remove one or more operations from the flowchart.

[0044] In addition, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. The components of the embodiments of the present application described and shown in the drawings here can be arranged and designed in various configurations. Therefore, the following detailed description of the embodiments of the present application provided in the drawings is not intended to limit the scope of the application claimed for protection, but merely represents the selected embodiments of the present application. Based on the embodiments of the present application, all other embodiments obtained by those skilled in the art without making creative work belong to the scope of protection of the present application.

[0045] It should be noted that the term "comprising" will be used in the embodiments of the present application to indicate the existence of the features declared thereafter, but does not exclude the addition of other features.

[0046] In the field of industrial automation, the BC system (Block Control System) is the core part of production line management and needs to frequently interact with PLC. In order to ensure the stability and reliability of the system, stress testing is usually required before actual deployment.

[0047] Traditional stress testing methods require a lot of manual participation. This kind of manual testing method requires a lot of configuration work, which is time-consuming and labor-intensive. In addition, errors are prone to occur during configuration, resulting in inaccurate stress test results.

[0048] Based on this, the embodiments of the present application provide a stress testing method, device, electronic device and storage medium, which are described below through embodiments.

[0049] Figure 1 A flow chart of a stress testing method provided in an embodiment of the present application is shown, wherein the method acts on a device line control BC system, a simulation device and a programmable logic controller PLC, wherein the simulation device is connected to the PLC, and the simulation device and the PLC are also connected to the BC system respectively; the method comprises steps S101-S104; specifically:

[0050] S101, in response to a data configuration operation, determining first configuration data of the BC system and second configuration data of the PLC; wherein the first configuration data is used to generate a to-be-selected event;

[0051] S102, in response to an event selection operation, determining an event to be tested from the events to be selected;

[0052] S103, in response to starting a test operation, writing the generated simulation data of the event to be tested into the PLC according to the second configuration data;

[0053] S104: Determine a test result of the BC system according to feedback data when the BC system writes the PLC data.

[0054] This application reduces the work of manual participation, not only improves the efficiency and accuracy of the configuration and testing process, but also enhances the stability and security of the system and reduces maintenance costs.

[0055] Some embodiments of the present application are described in detail below. In the absence of conflict, the following embodiments and features in the embodiments can be combined with each other.

[0056] The embodiment of the present application provides a stress testing method to test the data interaction between the BC system and the PLC. In the prior art, when testing, if it is necessary to test between multiple PLCs and the BC system, the BC system needs to be connected to multiple PLCs, and each PLC needs to be configured, which requires a lot of manual labor. The stress testing method in the embodiment of the present application, when testing the data transmission between the BC system and multiple PLCs, only requires the BC system to be connected to one PLC. In other words, the stress testing system in which the stress testing method in the embodiment of the present application acts includes a BC system, a simulation device and a PLC, and the number of PLCs here is one. That is, the embodiment of the present application can realize the test of data transmission of multiple PLCs to the BC system through one configuration.

[0057] For the above-mentioned stress testing system, the embodiment of the present application requires the tester to perform data configuration operations. After receiving the instructions corresponding to the data configuration operation, the stress testing system determines the first configuration data and the second configuration data of the PLC; wherein the first configuration data is used to generate events to be selected. Specifically, the first configuration data here is the database address and database type of the BC system, and the second configuration data is the data used for the PLC test (including configuring the PLC communication method and the range that can be directly written). When configuring the second configuration data, in order to enable one PLC to complete the function of sending data of multiple PLCs, the second configuration data in the embodiment of the present application needs to be set to multiple groups of code programs (for example, the first code program and the second code program. During actual testing, the number of code programs here is set according to actual needs, and can be set to ten groups, fifty groups, eighty-six groups, etc.).

[0058] After completing the setting of the first configuration data and the second configuration data, key information such as PLC address, data type, data length, etc. is automatically read from the database of the BC system, realizing fast acquisition and accurate matching of information. At the same time, it supports multiple database formats to ensure data compatibility and readability.

[0059] After reading the PLC data, test events to be selected are generated for the tester to choose. The tester can independently select the events he needs. When selecting, the tester can set the priority of different events. Specifically, the tester first selects the preliminary events from the events to be selected, and then adjusts the order of the preliminary events, puts the events that need to be processed preferentially in the front row, and puts the events that do not need to be processed preferentially in the back row. By adjusting the order of the preliminary events, the preliminary events in the adjusted order are obtained. For the convenience of description, the present application implements the method of calling the preliminary events in the adjusted order as the events to be tested.

[0060] After determining the event to be tested, the tester can start the test by starting the test operation. In the specific implementation, the tester can start the test by touching the start control. When the test is performed, the corresponding simulation data can be generated according to the read PLC address information, and the simulation data can be automatically written to the specified address of the PLC.

[0061] For example, in order to conduct a test between three PLCs and a BC system, the embodiment of the present application needs to set up three sets of code programs (a first code program, a second code program, and a third code program). When conducting the test, the first type of simulation data of the first code program, the second type of simulation data of the second code program, and the third type of simulation data of the third code program are generated respectively, and then the first type of simulation data, the second type of simulation data, and the third type of simulation data are written into the specified address of the PLC.

[0062] In order to facilitate a more comprehensive simulation, the tester can also set the test conditions before starting the test operation. By setting the conditions, the tester can set different types of functions, the delay time between each function (do not select the default 20ms), customize the start time and end time, and set the number of cycles according to the specific test needs. The setting process here can be a pre-stored test plan directly imported by the tester, or it can be set manually by the tester. After the setting is completed, the tester can also export the currently configured list for use in the next configuration. The settings here can meet different levels of stress testing needs.

[0063] After completing the above settings, test according to the above test conditions. Specifically, each group of code programs in the PLC reads the description of the corresponding columns of each event in the PLC Map file according to the set throughput and write frequency, and takes the first value as the stress test data. The BC system monitors the PLC, and when it detects a change in the address area of ​​the PLC, it starts to execute the BC logic: L starts with the device actively reporting the event, and there is no need to wait for the BC system to reply; H starts with the device requesting a function, and it is necessary to wait for the BC system to reply; S is a signal point, with only one Bit address. During the event processing process of the BC system, feedback data from the BC system is collected. For example, key performance indicators such as response time and throughput are collected to conduct in-depth analysis of the test results. Finally, based on the analysis results, users can make corresponding adjustments to the BC system or PLC to optimize the overall performance.

[0064] When analyzing the feedback data, on the one hand, manual analysis can be adopted, on the other hand, automatic analysis can be adopted, and similarly, manual analysis and automatic analysis can be combined. When performing specific analysis, a display chart that feedbacks the performance of the BC system can be generated according to the processing time and processing data volume of the BC system. After obtaining the display chart, manual analysis can be performed by showing it to the tester, and by the tester annotating the display chart. It is also possible to automatically analyze the lines or data in the display chart using a preset algorithm. Similarly, the method of combining manual analysis with automatic analysis is that after obtaining the manual analysis results and the automatic analysis results, the final target analysis results are obtained by fusing the manual analysis results and the automatic analysis results. Specific fusion methods include weighting the manual analysis results and the automatic analysis results, binarizing the manual analysis results and the automatic analysis results, and randomly taking values ​​for the manual analysis results and the automatic analysis results.

[0065] In an optional implementation, the pressure test method in the embodiment of the present application can be performed according to Figure 2 Perform the test in the manner shown in the figure, configure the database address of the current BC system, the database type, and the PLC related configuration to be tested; after successful configuration, the address and data type of each event monitored by the current system will be automatically obtained; users can check the simulation function event list, event interval, trigger times, trigger time period and other functions according to the read event results. The test plan can be exported into a configuration file and can be directly imported next time; click Start, the program automatically writes the address value of the Word area and Bit area corresponding to each event according to the user configuration; the system starts to monitor and record the response time of each function, and counts the data throughput of each time period; based on the recorded response time, throughput and other data, a line graph is output to feedback the test efficiency.

[0066] Figure 3 A schematic diagram of the structure of a pressure testing device provided in an embodiment of the present application is shown, the device comprising:

[0067] Acting on the equipment line control BC system, the simulation device and the programmable logic controller PLC, wherein the simulation device is connected to the PLC, and the simulation device and the PLC are also connected to the BC system respectively; the device includes:

[0068] A first response module, configured to determine first configuration data of the BC system and second configuration data of the PLC in response to a data configuration operation; wherein the first configuration data is used to generate a to-be-selected event;

[0069] A second response module, configured to determine an event to be tested from the events to be selected in response to an event selection operation;

[0070] a third response module, configured to write the generated simulation data of the event to be tested into the PLC according to the second configuration data in response to starting the test operation;

[0071] The test module is used to determine the test result of the BC system according to the feedback data when the BC system writes the PLC data.

[0072] In response to the data configuration operation, determining the first configuration data of the BC system and the second configuration data of the PLC; wherein the first configuration data is used to generate a to-be-selected event, including:

[0073] In response to the data configuration operation, the database address and database type of the BC system and the data used for the test of the PLC are determined.

[0074] The step of determining the event to be tested from the events to be selected in response to the event selection operation includes:

[0075] In response to an event selection operation, determining a preliminary selected event from the events to be selected;

[0076] In response to the sequence adjustment operation, the sequence of the initially selected events is adjusted to obtain the adjusted events to be tested.

[0077] Before starting the test operation, the second response module is used to:

[0078] In response to a condition setting operation, generating a test rule corresponding to the condition setting operation;

[0079] In response to starting the test operation, writing the generated simulation data of the event to be tested into the PLC according to the second configuration data includes:

[0080] In response to starting a test operation, the generated simulation data of the event to be tested is written into the PLC according to the test rule and the second configuration data.

[0081] The number of the PLC is one, and the second configuration data includes a first code program and a second code program;

[0082] In response to starting the test operation, writing the generated first simulation data of the event to be tested into the PLC according to the second configuration data includes:

[0083] In response to starting a test operation, writing the generated first type simulation data of the event to be tested into the PLC according to the first code program;

[0084] According to the second code program, the generated second type simulation data of the event to be tested is written into the PLC.

[0085] Determining the test result of the BC system according to the feedback data when the BC system writes the PLC data includes:

[0086] The test result of the BC system is determined according to the processing time and the amount of processed data when the BC system writes the PLC data.

[0087] The determining the test result of the BC system according to the processing time and the amount of data processed when the BC system writes the PLC data includes:

[0088] A display chart reflecting the performance of the BC system is generated according to the processing time and the amount of processed data.

[0089] like Figure 4 As shown, an embodiment of the present application provides an electronic device for executing the stress testing method in the present application, the device comprising a memory, a processor, a bus, and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of the stress testing method when executing the computer program.

[0090] Specifically, the above-mentioned memory and processor may be general-purpose memory and processor, which are not specifically limited here. When the processor runs the computer program stored in the memory, the above-mentioned stress testing method can be executed.

[0091] Corresponding to the stress testing method in the present application, an embodiment of the present application also provides a computer-readable storage medium, on which a computer program is stored, and when the computer program is executed by a processor, the steps of the above-mentioned stress testing method are executed.

[0092] Specifically, the storage medium can be a general storage medium, such as a mobile disk, a hard disk, etc. When the computer program on the storage medium is run, the above-mentioned stress testing method can be executed.

[0093] In the embodiments provided in the present application, it should be understood that the disclosed systems and methods can be implemented in other ways. The system embodiments described above are merely schematic. For example, the division of the units is only a logical function division. There may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some communication interfaces, indirect coupling or communication connection of systems or units, which can be electrical, mechanical or other forms.

[0094] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, and may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0095] In addition, each functional unit in the embodiments provided in the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit.

[0096] If the functions are implemented in the form of software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application can be essentially or partly embodied in the form of a software product that contributes to the prior art. The computer software product is stored in a storage medium and includes several instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the methods described in each embodiment of the present application. The aforementioned storage medium includes: various media that can store program codes, such as a USB flash drive, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk.

[0097] It should be noted that similar numbers and letters represent similar items in the following figures. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures. In addition, the terms "first", "second", "third", etc. are only used to distinguish the description and are not to be understood as indicating or implying relative importance.

[0098] Finally, it should be noted that the above-described embodiments are only specific implementation methods of the present application, which are used to illustrate the technical solutions of the present application, rather than to limit them. The protection scope of the present application is not limited thereto. Although the present application is described in detail with reference to the above-mentioned embodiments, ordinary technicians in the field should understand that any technician familiar with the technical field can still modify the technical solutions recorded in the above-mentioned embodiments within the technical scope disclosed in the present application, or can easily think of changes, or make equivalent replacements for some of the technical features therein; and these modifications, changes or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present application. They should all be included in the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.

Claims

1. A stress testing method, characterized in that: Acting on the equipment line control BC system, the simulation device and the programmable logic controller PLC, wherein the simulation device is connected to the PLC, and the simulation device and the PLC are also connected to the BC system respectively; the method includes: In response to a data configuration operation, determining first configuration data of the BC system and second configuration data of the PLC; wherein the first configuration data is used to generate a to-be-selected event; In response to an event selection operation, determining an event to be tested from the events to be selected; In response to starting a test operation, writing the generated simulation data of the event to be tested into the PLC according to the second configuration data; The test result of the BC system is determined according to the feedback data when the BC system writes the PLC data.

2. The method according to claim 1, characterized in that In response to the data configuration operation, determining the first configuration data of the BC system and the second configuration data of the PLC; wherein the first configuration data is used to generate a to-be-selected event, including: In response to the data configuration operation, the database address and database type of the BC system and the data used for the test of the PLC are determined.

3. The method according to claim 1, characterized in that The step of determining the event to be tested from the events to be selected in response to the event selection operation includes: In response to an event selection operation, determining a preliminary selected event from the events to be selected; In response to the sequence adjustment operation, the sequence of the initially selected events is adjusted to obtain the adjusted events to be tested.

4. The method according to claim 1, characterized in that: Before starting the test operation, the method further includes: In response to a condition setting operation, generating a test rule corresponding to the condition setting operation; In response to starting the test operation, writing the generated simulation data of the event to be tested into the PLC according to the second configuration data includes: In response to starting a test operation, the generated simulation data of the event to be tested is written into the PLC according to the test rule and the second configuration data.

5. The method according to claim 1, characterized in that The number of the PLC is one, and the second configuration data includes a first code program and a second code program; In response to starting the test operation, writing the generated first simulation data of the event to be tested into the PLC according to the second configuration data includes: In response to starting a test operation, writing the generated first type simulation data of the event to be tested into the PLC according to the first code program; According to the second code program, the generated second type simulation data of the event to be tested is written into the PLC.

6. The method according to claim 1, characterized in that Determining the test result of the BC system according to the feedback data when the BC system writes the PLC data includes: The test result of the BC system is determined according to the processing time and the amount of processed data when the BC system writes the PLC data.

7. The method according to claim 6, characterized in that The determining the test result of the BC system according to the processing time and the amount of data processed when the BC system writes the PLC data includes: A display chart reflecting the performance of the BC system is generated according to the processing time and the amount of processed data.

8. A pressure testing device, characterized in that: Acting on the equipment line control BC system, the simulation device and the programmable logic controller PLC, wherein the simulation device is connected to the PLC, and the simulation device and the PLC are also connected to the BC system respectively; the device includes: A first response module, configured to determine first configuration data of the BC system and second configuration data of the PLC in response to a data configuration operation; wherein the first configuration data is used to generate a to-be-selected event; A second response module, configured to determine an event to be tested from the events to be selected in response to an event selection operation; a third response module, configured to write the generated simulation data of the event to be tested into the PLC according to the second configuration data in response to starting the test operation; The test module is used to determine the test result of the BC system according to the feedback data when the BC system writes the PLC data.

9. An electronic device, characterized in that: include: A processor, a memory and a bus, wherein the memory stores machine-readable instructions executable by the processor, and when the electronic device is running, the processor and the memory communicate via the bus, and when the machine-readable instructions are executed by the processor, the steps of the stress testing method as described in any one of claims 1 to 7 are performed.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps of the stress testing method according to any one of claims 1 to 7 are executed.

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