Vibration test clamp for large-size CQFP256 packaging integrated circuit with frame

Abstract

The invention belongs to the technical field of integrated circuit testing, and particularly relates to a vibration test clamp for a large-size CQFP256 packaging integrated circuit with a frame. Comprising a base, the middle of the top of the base is provided with a porcelain body groove and a packaging porcelain body used for placing an integrated circuit, and the periphery of the porcelain body groove is provided with four lead frame grooves and a lead frame used for placing the integrated circuit; the hard rubber gasket is placed at the bottom of the porcelain body groove and is used for abutting against the packaging porcelain body of the integrated circuit; one end of the cover plate pressing strip is detachably locked on the base, and the other end of the cover plate pressing strip is used for pressing a cover plate of the integrated circuit; the two ends of the frame connecting rib pressing strip are detachably locked on the base, and the frame connecting rib pressing strip is used for pressing the frame connecting rib. Damage of a leading-out end frame, deformation of a cover plate, air leakage of a seal, even breakage of a porcelain body and the like are avoided, the to-be-tested integrated circuit is placed and taken down through fixation of the pressing strips and the screws, and operation is simplified.

Description

Technical Field

[0001] The invention belongs to the technical field of integrated circuit testing, and in particular relates to a vibration test fixture for a large-size CQFP256 frame-packaged integrated circuit. Background Art

[0002] Vibration testing is one of the effective means of screening to measure the vibration strength of integrated circuit packaging, internal metallization and lead systems, chips and other internal components or substrate metal bonding. With the increase in functions and packaging density of monolithic integrated circuits and hybrid integrated circuits, the package size is getting larger, the proportion of the sealing area is increasing, and the shape is more complex. The vibration test stress has increased from a few G to dozens of G.

[0003] There are currently two major ways to fix integrated circuits during vibration testing: one is the "gluing method", where the integrated circuit is glued to the fixture base with hard glue; the other is to fix it directly with a screw strip. The "gluing method" is prone to causing the integrated circuit to fall off due to weak bonding, and it is difficult to disassemble if the bonding is too strong, so its applicability is limited. Directly fixing with a screw strip is prone to causing large-size and large-mass integrated circuits to have excessive local stress under high-frequency acceleration due to the protrusion of the cover or the package body, causing leakage or even cracking of the package body, so its applicability is limited.

[0004] For example, a patent application with the publication number CN206132340U discloses a special fixture for vibration testing of electronic components. This patent mainly solves the installation problem of some electronic components during vibration testing by opening a central threaded hole and a number of long hole mounting grooves on the bottom plate of the fixture and fixing them with a number of bolts, but it cannot solve the installation problem of vibration testing of large-size and large-mass integrated circuits.

[0005] For example, a patent application has been published with the publication number CN208179350U, which discloses a specimen fixture for large-scale vibration tests. This patent mainly solves the installation problem of some board components during large-scale vibration tests by drilling holes on the fixture plate and fixing them with screws. However, it is not suitable for the installation of large-size and large-mass integrated circuit vibration tests.

[0006] For example, a patent application with the publication number CN202255806U discloses a vibration fixture for electronic components. This patent mainly solves the installation problem of a large number of small electronic components during vibration tests by soldering the electronic components to the PCB printed circuit board and fixing the PCB printed circuit board to the vibration table with screws. However, it is also not suitable for the installation of large-size and large-mass integrated circuits (especially those with a large sealing surface) during vibration tests, and cannot solve the problems of easy damage and leakage around the sealing cover plate (core cavity) or even porcelain cracks during the test. Summary of the invention

[0007] The purpose of the present invention is to provide a vibration test fixture for large-size monolithic integrated circuits or hybrid integrated circuits and multi-cavity system-level packaged integrated circuits that can protect cover plates, ceramic bodies or lead-end frames, etc., to solve the problems of lead frame cracking and damage, deformation of large-size thin cover plates, damage to large-mass package bodies leading to leakage and even ceramic body breakage during vibration tests.

[0008] In order to solve the above technical problems, the present invention provides a vibration test fixture for a large-size CQFP256 frame-packaged integrated circuit, comprising:

[0009] A base, wherein a ceramic body groove is provided in the middle of the top of the base for placing the packaged ceramic body of the integrated circuit, and four lead frame grooves are provided around the ceramic body groove for placing the lead frame of the integrated circuit;

[0010] A hard rubber gasket is placed at the bottom of the ceramic body groove and is used to abut against the package ceramic body of the integrated circuit;

[0011] A cover plate pressure strip, one end of which is detachably locked on the base, and the other end of which is used to press the cover plate of the integrated circuit;

[0012] The frame connecting rib pressing strip has two ends which are detachably locked on the base and are used to press the frame connecting ribs.

[0013] Preferably, the base is provided with a fixing through hole for fixing the vibration table, and the fixing through hole is locked and fixed by a screw rod that cooperates with the fixing through hole.

[0014] Preferably, three screw holes 1 are opened on the outer sides of the left and right lead frame grooves, and the three screw holes 1 are opened linearly front to back, and the cover plate pressure strip is fixed and locked by screw 1 cooperating with the screw hole 1.

[0015] Preferably, the base also includes four groups of screw holes 2, which are arranged in a rectangular array between every two adjacent lead frame grooves, and the frame connecting rib strip is fixed and locked by the cooperation of screws 2 and screw holes 2.

[0016] Preferably, the number of screw holes 2 opened in each group is two, and they are arranged in a linear path with an inclined angle.

[0017] Preferably, it also includes a cover plate protection sheet, which is arranged between the cover plate pressure strip and the package ceramic body of the integrated circuit. The size and hardness of the cover plate protection sheet are similar to those of the cover plate, and the thickness is slightly thinner than that of the cover plate.

[0018] Preferably, the depth of the ceramic body groove is the same as the height of the package ceramic body of the integrated circuit after the hard rubber gasket is padded, and the width of the ceramic body groove is 0.08mm to 0.15mm larger than the width of the package ceramic body of the integrated circuit.

[0019] Preferably, the width of the cover plate molding is slightly wider than that of the cover plate, and the thickness is slightly thinner than that of the packaging ceramic body of the integrated circuit.

[0020] Preferably, the thickness of the frame connecting rib strip is 1 mm.

[0021] Preferably, the base is made of hard aluminum, and the hard rubber gasket is made of polyurethane rubber or polyethylene sheet with a certain hardness.

[0022] Compared with the prior art, the present invention has the following beneficial effects:

[0023] The invention discloses a large-size CQFP256 frame-packaged integrated circuit vibration test fixture, comprising a base, a cover plate bead, a frame connecting rib bead, a hard rubber gasket with a specific hardness, and a cover plate protective sheet (if necessary); wherein the base has four corners with mounting fixing through holes fixed to a vibration table, the base has grooves for an integrated circuit porcelain body and a lead frame, the bottom of the groove is padded with a hard rubber gasket with a specific hardness, three screw holes are provided on each side of the groove, and the cover plate bead has corresponding through holes; the groove has four corners with fixing screw holes corresponding to the frame connecting rib bead; the integrated circuit is tightened in the corresponding groove on the base by means of screws and the cover plate bead; for a large-size thin cover plate, a cover plate protective sheet with a size similar to that of the cover plate is provided on the porcelain body bead; the frame connecting rib bead is used to fix the frame connecting rib on the base. The integrated circuit to be tested is fixed in the groove of the fixture, and the fixture is installed on the vibration table, and the test can be carried out. The integrated circuit vibration test fixture provided by the present invention avoids damage to the lead-out terminal frame, deformation of the cover plate, air leakage in the seal and even fracture of the porcelain body through conformal structural design, and uses pressure strips and screws to fix the integrated circuit to be tested to place and remove it, thereby simplifying the operation. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 It is a schematic diagram of the overall structure of the vibration test fixture of the present invention.

[0025] Figure 2 It is a schematic structural diagram of the base of the present invention.

[0026] Figure 3 It is a schematic diagram of the structure of the CQFP256 packaged integrated circuit of the present invention.

[0027] Figure 4 It is a schematic structural diagram of the cover plate layer strip of the present invention.

[0028] Figure 5 It is a schematic structural diagram of the lead frame connecting rib strip of the present invention.

[0029] Figure 6 It is a structural schematic diagram of the cover plate protection sheet.

[0030] Figure 7 It is a structural schematic diagram of a hard rubber gasket.

[0031] In the figure: 1-base, 2-ceramic body groove, 3-packaged ceramic body, 4-lead frame groove, 5-lead frame, 6-hard rubber gasket, 7-cover strip, 8-cover, 9-frame connecting rib strip, 10-frame connecting rib, 11-fixing through hole, 12-screw, 13-screw hole one, 14-screw one, 15-screw hole two, 16-screw two, 17-cover protection sheet. DETAILED DESCRIPTION

[0032] The present invention is further described in detail below in conjunction with the accompanying drawings and specific embodiments. The advantages and features of the present invention will become more apparent from the following description. It should be noted that the accompanying drawings are in very simplified form and in non-precise proportions, and are only used to conveniently and clearly assist in explaining the purpose of the embodiments of the present invention.

[0033] like Figures 1 to 7 As shown, the embodiment of the present invention specifically provides a large-size CQFP256 frame-packaged integrated circuit vibration test fixture, including a base 1, a cover plate pressure strip 7, a frame connecting rib pressure strip 9, a hard rubber gasket 6 of specific hardness, and a cover plate protection sheet 17 (if necessary); wherein the base 1 has four corners with fixed through holes 11 fixedly mounted on the vibration table, the base 1 has a ceramic body groove 2 and a lead frame groove for the integrated circuit, the bottom of the lead frame groove is padded with a hard rubber gasket 6 of specific hardness, three screw holes 13 are provided on each side of the lead frame groove, and the cover plate pressure strip 7 has corresponding through holes; the lead frame groove has four corners with fixing screw holes 15 corresponding to the frame connecting rib pressure strip 9; the cover plate pressure strip 7 is tightened by means of screws 14 to press the integrated circuit into the corresponding ceramic body groove 2 on the base 1; for the large-size thin cover 8, a cover plate protection sheet 17 of a size similar to that of the cover 8 is provided on the cover plate pressure strip 7; the frame connecting rib pressure strip 9 is used to fix the frame connecting rib 10 on the base 1. The integrated circuit to be tested is fixed in the groove of the fixture, and the fixture is installed on the vibration table, and the test can be carried out. The ceramic groove 2 of the base 1 is a conformal structure with the integrated circuit to be tested, and the lead frame 5 connecting ribs are fixed by the frame connecting rib pressure strip 9 and screws 16 to avoid breakage, and the large-sized thin cover plate 8 is protected by a cover plate protection sheet 17 to protect the cover plate 8 from deformation caused by extrusion. The above-mentioned hard rubber gasket 6 eliminates the problem of sealing leakage or even ceramic body breakage caused by local stress concentration caused by the rigidity of the traditional hard aluminum fixture due to the size difference between individual large-sized integrated circuits.

[0034] In the above test fixture, the base 1 is made of hard aluminum; the hard rubber gasket 6 is made of polyurethane rubber or polyethylene sheet with a certain hardness determined according to the quality of the integrated circuit and the contact surface.

[0035] In the above test fixture, the depth of the grooves corresponding to the hard rubber gasket 6 and the integrated circuit package ceramic body 3 is the same as the package body, and the groove width is 0.08mm to 0.15mm larger than the width of the integrated circuit ceramic body to facilitate placement.

[0036] In the above-mentioned test fixture, for large-sized and large-mass tested integrated circuits (especially those with a large ratio of sealing area to package size), a cover protection sheet 17 with a size and hardness similar to that of the integrated circuit cover 8 and slightly thinner than the cover 8 is placed in the corresponding position of the sealing cover 8 of the tested integrated circuit.

[0037] In the above test fixture, a pressure strip slightly wider than the cover plate 8 and slightly thinner than the package ceramic body 3 is used in combination with screws to fix the cover plate 8, and a pressure strip 1 mm thick is used in combination with screws to fix the lead wire connection rib frame.

[0038] The present invention is different from conventional clamps and uses a pressure strip, a hard rubber gasket 6, a cover plate protection sheet 17, and screws to fix the integrated circuit, thereby eliminating the need for gluing or clamping steps.

[0039] Working principle: a hard rubber gasket 6 of a specific hardness is placed at the bottom of the porcelain groove 2 of the integrated circuit on the base 1, and the CQFP256 framed packaged integrated circuit is installed in the corresponding groove. A cover protection sheet 17 is placed on the cover 8, and the cover pressure strip 7 is tightened on the cover protection sheet 17 by means of fixing screws; the lead frame 5 connecting rib pressure strip is tightened on the lead frame 5 connecting rib by means of fixing screws.

[0040] During the vibration test, first, the CQFP256 framed packaged integrated circuit to be tested is installed and fixed in the test fixture, and then the fixture is fixed to the vibration test bench by fixing screws, and then the vibration test is started; after the vibration test, the fixture is removed, and the CQFP256 framed packaged integrated circuit is taken out to complete the test.

[0041] The above description is only a description of the preferred embodiments of the present invention, and is not intended to limit the scope of the present invention. Any changes or modifications made by a person skilled in the art in the field of the present invention based on the above disclosure shall fall within the scope of protection of the claims.

Claims

1. A vibration test fixture for large-size CQFP256 frame-packaged integrated circuits, characterized in that: include: A base (1), wherein a ceramic body groove (2) is provided in the middle of the top of the base (1) for accommodating a packaged ceramic body (3) of an integrated circuit, and four lead frame grooves are provided around the ceramic body groove (2) for accommodating a lead frame (5) of the integrated circuit; A hard rubber gasket (6) is placed at the bottom of the ceramic body groove (2) and is used to abut against the package ceramic body (3) of the integrated circuit; A cover plate pressure strip (7), one end of which is detachably locked on the base (1), and the other end of which is used to press the cover plate (8) of the integrated circuit; The frame connecting rib pressing strip (9) has two ends which are detachably locked on the base (1) and are used to press the frame connecting rib (10).

2. A vibration test fixture for a large-size CQFP256 integrated circuit packaged with a frame as claimed in claim 1, characterized in that: The base (1) is provided with a fixing through hole (11) fixedly mounted on the vibration table, and a screw rod (12) is matched with the fixing through hole (11) to be locked and fixed.

3. A vibration test fixture for a large-size CQFP256 integrated circuit packaged with a frame as claimed in claim 1, characterized in that: Three screw holes (13) are also provided on the outer sides of the left and right lead frame grooves. The three screw holes (13) are provided linearly front to back. The cover plate pressure strip (7) is fixed and locked by means of screws (14) cooperating with the screw holes (13).

4. A vibration test fixture for a large-size CQFP256 integrated circuit packaged with a frame as claimed in claim 1, characterized in that: The base (1) also includes four groups of screw holes (15) opened thereon. The four groups of screw holes (15) are arranged in a rectangular array between each two adjacent lead frame grooves. The frame connecting rib strip (9) is fixed and locked by means of screws (16) cooperating with the screw holes (15).

5. A vibration test fixture for a large-size CQFP256 integrated circuit packaged with a frame as claimed in claim 4, characterized in that: The number of screw holes 2 (15) in each group is two, and they are arranged in a linear path at an inclined angle.

6. A vibration test fixture for a large-size CQFP256 integrated circuit packaged with a frame as claimed in claim 1, characterized in that: It also comprises a cover plate protection sheet (17), which is arranged between the cover plate pressure strip (7) and the package ceramic body (3) of the integrated circuit, and the size and hardness of the cover plate protection sheet (17) are similar to those of the cover plate (8), and the thickness is slightly thinner than that of the cover plate (8).

7. A vibration test fixture for a large-size CQFP256 frame-packaged integrated circuit as claimed in claim 1, characterized in that: The depth of the ceramic body groove (2) is the same as the height of the integrated circuit package ceramic body (3) after the hard rubber gasket (6) is inserted, and the width of the ceramic body groove (2) is 0.08mm to 0.15mm larger than the width of the integrated circuit package ceramic body (3).

8. A vibration test fixture for a large-size CQFP256 integrated circuit packaged with a frame as claimed in claim 1, characterized in that: The width of the cover plate pressure strip (7) is slightly wider than that of the cover plate (8), and the thickness is slightly thinner than that of the package ceramic body (3) of the integrated circuit.

9. A vibration test fixture for a large-size CQFP256 frame-packaged integrated circuit as claimed in claim 1, characterized in that: The thickness of the frame connecting rib strip (9) is 1 mm.

10. A vibration test fixture for a large-size CQFP256 frame-packaged integrated circuit as claimed in claim 1, characterized in that: The base (1) is made of hard aluminum, and the hard rubber gasket (6) is made of polyurethane rubber or polyethylene sheet with a certain hardness.

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