Casting blank defect backtracking method and device, electronic equipment and storage medium

Abstract

The embodiment of the invention provides a casting blank defect backtracking method and device, electronic equipment and a storage medium, and relates to the technical field of steel production. The method comprises the following steps: receiving a casting blank defect backtracking instruction, wherein the casting blank defect backtracking instruction comprises a casting blank number; defective casting blanks are determined from the multiple casting blanks based on the casting blank numbers, each casting blank comprises multiple casting blank slices, and each casting blank slice corresponds to a unique casting blank slice number. A high-frequency parameter set associated with each casting blank slice number in the defective casting blank is called from a database, and each high-frequency parameter set comprises a plurality of different types of high-frequency parameters. And determining abnormal high-frequency parameters from the high-frequency parameter groups based on a preset high-frequency parameter range. And determining defective casting blank slices and defect generation time according to the abnormal high-frequency parameters. According to the method, data backtracking can be quickly performed on the defects when the casting blank has the defects, so that the causes of the defects are found out, and the steel production efficiency is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of steel production, and in particular to a method, device, electronic equipment and storage medium for tracing defects of a casting blank. Background Art

[0002] Continuous casting is an important process in the steel production process. If there are defects in the quality of the ingot during the continuous casting process, the metal yield will be reduced and the production cost will increase at the very least. In serious cases, it will also cause abnormal accidents, affect the effective connection between the continuous casting and rolling production processes, and affect the quality of the final product.

[0003] When defects are found in the quality inspection of the ingot, how to quickly trace the defects to find out the causes of the defects and thus improve the production efficiency of steel is an urgent problem to be solved. Summary of the invention

[0004] The objectives of the present invention include, for example, providing a method, device, electronic device and storage medium for tracing defects of a casting billet, which can at least partially solve the above-mentioned technical problems.

[0005] The embodiments of the present invention can be implemented as follows:

[0006] In a first aspect, an embodiment of the present invention provides a method for backtracking defects of a casting billet, which is applied to a controller of a continuous casting system; the method comprises:

[0007] receiving a slab defect tracing instruction, wherein the slab defect tracing instruction includes a slab number;

[0008] Determine a defective ingot from a plurality of ingots based on the ingot numbers, each of the ingots comprising a plurality of ingot slices, each of the ingot slices corresponding to a unique ingot slice number;

[0009] Retrieving from the database a high-frequency parameter group associated with each of the defective ingot slice numbers, wherein each high-frequency parameter group includes a plurality of high-frequency parameters of different types;

[0010] Determining abnormal high frequency parameters from each of the high frequency parameter groups based on a preset high frequency parameter range;

[0011] The defective slab slice and the time when the defect occurred are determined according to the abnormal high-frequency parameters.

[0012] Optionally, the method further comprises the step of associating the ingot slice with the high-frequency parameter group, the step comprising:

[0013] In response to the high-frequency parameter association instruction, determining a target high-frequency parameter influence interval from a plurality of high-frequency parameter influence intervals, and determining a corresponding target high-frequency parameter group based on the target high-frequency parameter influence interval;

[0014] Collecting each of the high-frequency parameters in the target high-frequency parameter group according to a preset collection frequency, and recording the collection time of each collection;

[0015] During the casting process, real-time recording of the first moment when each of the cast slab slices enters the target high-frequency parameter influence interval and the second moment when each of the cast slab slices leaves the target high-frequency parameter influence interval;

[0016] For each of the strand slices, a target high-frequency parameter group collected at the first time and the second time is associated with the strand slice.

[0017] Optionally, the continuous casting system further comprises a crystallizer, a cutter and a casting length detector; the method further comprises a step of determining the ingot slices included in the ingot, the step comprising:

[0018] Acquire a first distance from the cutting point of the cutter to the casting starting point, acquire a second distance that the cutter moves when cutting the ingot, acquire a third distance of the cut produced by the cutter, acquire a measured value of the ingot length that has been cut, and acquire a detected value of the ingot length that has been cut detected by the casting length detector; wherein the casting starting point is the meniscus position of the crystallizer;

[0019] Based on a casting length calculation formula, determining a casting length correction value according to the first distance, the second distance, the third distance, the measured value of the casting length, and the detected value of the casting length;

[0020] The strand slices respectively included in the two strand sections that have been cut and the two strand sections that have not been cut are determined according to the casting length correction value.

[0021] Optionally, the determining of the casting length correction value based on the casting length calculation formula according to the first distance, the second distance, the third distance, the measured value of the casting length and the detected value of the casting length includes:

[0022] Taking the sum of the first distance, the second distance, the third distance and the measured value of the length of the casting strand as the current casting length value;

[0023] The ratio of the measured value of the length of the ingot to the detected value of the length of the ingot is used as a correction coefficient;

[0024] The product of the current casting length value and the correction coefficient is used as the casting length correction value.

[0025] Optionally, the casting length calculation formula is:

[0026] L=(C1+C2+C3+L1)*L1 / L2

[0027] Among them, C1 is the first distance, C2 is the second distance, C3 is the third distance, L1 is the measured value of the ingot length, L2 is the detected value of the ingot length, and L is the casting length correction value.

[0028] Optionally, determining the casting slab slices respectively included in the two sections of the casting slab that have been cut and the two sections that have not been cut according to the casting length correction value comprises:

[0029] half of the casting length correction value is used as the length of the cast billet that has been cut, and the other half is used as the length of the cast billet that has not been cut;

[0030] Based on the preset strand slice length, the strand slices included in the strand that has been cut and the strand that has not been cut are calculated in sequence starting from the head of the strand that has been cut.

[0031] Optionally, the high-frequency parameter influence interval includes a crystallizer high-frequency parameter influence interval and a secondary cooling zone high-frequency parameter influence interval;

[0032] The high-frequency parameters corresponding to the high-frequency parameter influence interval of the crystallizer include stopper rod type, crystallizer cooling mode, crystallizer liquid level fluctuation and crystallizer water flow rate;

[0033] The high-frequency parameters corresponding to the secondary cooling zone high-frequency parameter influence interval include secondary cooling water mode, secondary cooling water main pipe flow, secondary cooling water main pipe pressure and secondary cooling water main pipe temperature.

[0034] In a second aspect, an embodiment of the present invention provides a casting defect backtracking device, which is applied to a controller of a continuous casting system; the casting defect backtracking device comprises:

[0035] A casting defect backtracking instruction receiving unit, used for receiving a casting defect backtracking instruction, wherein the casting defect backtracking instruction includes a casting number;

[0036] A defective ingot determining unit, used for determining a defective ingot from a plurality of ingots based on the ingot numbers, each of the ingots comprising a plurality of ingot slices, each of the ingot slices corresponding to a unique ingot slice number;

[0037] A high-frequency parameter group calling unit, used to call the high-frequency parameter group associated with each of the slice numbers of the defective ingot from the database, wherein each high-frequency parameter group includes a plurality of high-frequency parameters of different types;

[0038] an abnormal high frequency parameter determination unit, configured to determine an abnormal high frequency parameter from each of the high frequency parameter groups based on a preset high frequency parameter range;

[0039] The backtracking unit is used to determine the defective ingot slice and the time when the defect occurred according to the abnormal high-frequency parameters.

[0040] In a third aspect, an embodiment of the present invention provides an electronic device, comprising: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of any one of the above methods when executing the program.

[0041] In a fourth aspect, an embodiment of the present invention provides a computer-readable storage medium, wherein the computer-readable storage medium includes a computer program, and when the computer program is executed, the server where the computer-readable storage medium is located is controlled to implement the steps of any one of the above methods.

[0042] The beneficial effects of the embodiments of the present invention include, for example:

[0043] When a defect occurs, the defective billet number is obtained by receiving the billet defect tracing instruction, and the defective billet slice and the time of defect occurrence are further located according to the high-frequency parameters associated with the billet slice in the defective billet. This enables the staff to quickly find the cause of the defect and deal with it accordingly, thereby improving the production efficiency of the continuous casting process. BRIEF DESCRIPTION OF THE DRAWINGS

[0044] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for use in the embodiments are briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present invention and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without creative work.

[0045] Figure 1 A block diagram of an electronic device provided by an embodiment of the present invention;

[0046] Figure 2 A flowchart of a method for tracing defects in a casting blank provided by an embodiment of the present invention;

[0047] Figure 3 A schematic diagram of a continuous casting system provided by an embodiment of the present invention;

[0048] Figure 4 An architectural diagram of a slab defect tracing device provided in an embodiment of the present invention.

[0049] Icons: 100-electronic device; 110-memory; 120-processor; 130-communication module; 300-ingot defect backtracking device; 301-ingot defect backtracking instruction receiving unit; 302-defective ingot determination unit; 303-high frequency parameter group calling unit; 304-abnormal high frequency parameter determination unit; 305-backtracking unit. DETAILED DESCRIPTION

[0050] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Generally, the components of the embodiments of the present invention described and shown in the drawings here can be arranged and designed in various different configurations.

[0051] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the invention claimed for protection, but merely represents selected embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0052] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, further definition and explanation thereof is not required in subsequent drawings.

[0053] In addition, the terms “first”, “second”, etc., if used, are merely used to distinguish between the descriptions and should not be understood as indicating or implying relative importance.

[0054] It should be noted that, in the absence of conflict, the features in the embodiments of the present invention may be combined with each other.

[0055] In the steel production process, the continuous casting process is the successor to the steelmaking process and the downstream steel rolling process, and it plays a very important role. If defects occur in the quality of the ingot during the continuous casting production process, the metal yield rate will be reduced and the production cost will be increased; in serious cases, abnormal accidents will occur, affecting the effective connection between the continuous casting and rolling production processes and the quality of the final product.

[0056] Common ingot quality defects include cracks, slag inclusions, looseness, shrinkage, segregation, etc., which are affected by many factors such as molten steel composition, process parameters (casting speed, molten steel superheat, mold liquid level, mold inlet and outlet water temperature difference, etc.), equipment status, raw materials, production operations, etc. Online prediction of the location where ingot quality defects occur and disappearance, and timely offline inspection and cleaning of defective ingots can reduce resource waste. Therefore, a method that can trace the causes of ingot quality defects online is urgently needed.

[0057] Based on the above situation, an embodiment of the present invention provides a casting defect backtracking method, device, electronic device and storage medium, which can effectively alleviate the above technical problems.

[0058] Please refer to Figure 1 , is a block diagram of an electronic device 100 provided by the present application. The electronic device 100 may be a device capable of performing data processing, which is not limited in this embodiment. The electronic device 100 includes a memory 110, a processor 120, and a communication module 130. The memory 110, the processor 120, and the communication module 130. Each component is electrically connected to each other directly or indirectly to achieve data transmission or interaction. For example, these components can be electrically connected to each other via one or more communication buses or signal lines.

[0059] The memory 110 is used to store programs or data. The memory 110 may be, but is not limited to, a random access memory (RAM), a read only memory (ROM), a programmable read-only memory (PROM), an erasable programmable read-only memory (EPROM), an electrically erasable programmable read-only memory (EEPROM), etc.

[0060] The processor 120 is used to read / write data or programs stored in the memory and execute corresponding functions.

[0061] The communication module 130 is used to establish a communication connection between the server and other communication terminals through the network, and to send and receive data through the network.

[0062] It should be understood that Figure 1 The structure shown is only a schematic diagram of the structure of the electronic device 100. The electronic device 100 may also include Figure 1 More or fewer components as shown, or with Figure 1 Different configurations are shown. Figure 1 The components shown in the figure can be implemented by hardware, software or a combination thereof. The electronic device 100 can be arranged in other devices or as an independent device.

[0063] Corresponding to the electronic device 100, an embodiment of the present invention provides a method for tracing defects of a casting blank, which is applied to a controller of a continuous casting system. The method includes: Figure 2The following steps are shown:

[0064] Step S110: receiving a slab defect tracing instruction, wherein the slab defect tracing instruction includes a slab number.

[0065] Step S120: Determine defective ingots from a plurality of ingots based on the ingot numbers, each of the ingots comprising a plurality of ingot slices, and each ingot slice corresponds to a unique ingot slice number.

[0066] Step S130: calling the high-frequency parameter group associated with each of the defective ingot slice numbers from the database, wherein each high-frequency parameter group includes a plurality of high-frequency parameters of different types.

[0067] Step S140: determining abnormal high frequency parameters from each of the high frequency parameter groups based on a preset high frequency parameter range.

[0068] Step S150: Determine defective ingot slices and defect generation time according to the abnormal high-frequency parameters.

[0069] In step S110, a slab defect tracing instruction is received, wherein the slab defect tracing instruction includes a slab number.

[0070] If there are quality problems with the ingots produced by the continuous casting system, the staff can issue an ingot defect tracing instruction to the controller through the control terminal to find the cause of the defect. When issuing the ingot defect tracing instruction, the staff can send the ingot number of the ingot with quality problems to the controller. After receiving the ingot defect tracing instruction, the controller can determine the ingot that needs defect tracing according to the received ingot number.

[0071] Execute step S120 to determine a defective ingot from a plurality of ingots based on the ingot numbers, each of the ingots comprising a plurality of ingot slices, and each ingot slice corresponds to a unique ingot slice number.

[0072] During the continuous casting process, in order to match the real-time parameters during casting with the billet, each billet can be virtually divided into multiple billet slices. After receiving the billet number, the controller can find the corresponding billet number from the multiple billet numbers and determine the billet corresponding to the billet number as the defective billet. Then, the billet slice where the defect occurs can be further located from the billet slices included in the defective billet.

[0073] In step S130, a high-frequency parameter group associated with each of the defective ingot slice numbers is retrieved from a database, wherein each high-frequency parameter group includes a plurality of high-frequency parameters of different types.

[0074] When the ingot is cast, the real-time parameters can be associated with each ingot slice in the ingot. Since there are multiple parameters that affect the quality of the ingot (i.e., high-frequency parameters) at each moment, the multiple high-frequency parameters of different types collected at the same time can be used as a high-frequency parameter group, associated with the ingot slice being cast at this time, and the associated high-frequency parameter group can be stored in the database. For example, if the ingot slice A in a certain ingot starts to be cast at time a and is finished at time b, then at least one high-frequency parameter group collected from time a to time b is associated with the ingot slice A.

[0075] Optionally, the method further comprises the step of associating the ingot slice with the high-frequency parameter group, the step comprising:

[0076] In response to the high-frequency parameter association instruction, a target high-frequency parameter influence interval is determined from a plurality of high-frequency parameter influence intervals, and a corresponding target high-frequency parameter group is determined based on the target high-frequency parameter influence interval.

[0077] Each of the high-frequency parameters in the target high-frequency parameter group is collected according to a preset collection frequency, and the collection time of each collection is recorded.

[0078] During the casting process, the first moment when each of the ingot slices enters the target high-frequency parameter influence interval and the second moment when each ingot slice leaves the target high-frequency parameter influence interval are recorded in real time.

[0079] For each of the strand slices, a target high-frequency parameter group collected at the first time and the second time is associated with the strand slice.

[0080] As an optional implementation, associating the ingot slice with the high-frequency parameter group can be achieved in the following manner:

[0081] In the continuous casting process, the high-frequency parameters that affect the quality of the ingot are different in different casting steps. For example, when the ingot is in the crystallizer area, the high-frequency parameters that affect its quality are the crystallizer water main temperature, the water outlet temperature in the crystallizer width, etc.; and when the ingot is in the secondary cooling area, the high-frequency parameters that affect its quality are the secondary cooling water main flow, the secondary cooling water main pressure, etc. Therefore, when associating high-frequency parameters, the staff can preset the high-frequency parameter influence range that needs to be focused on in this continuous casting, that is, the target high-frequency parameter influence range, through the high-frequency parameter association instructions. Then during continuous casting, the controller only associates the high-frequency parameters included in the target high-frequency parameter influence range to avoid wasting computing resources. The high-frequency parameters and the high-frequency parameter influence range can be shown in the following table:

[0082] Table 1

[0083]

[0084]

[0085] After determining the target high-frequency parameter influence interval, the target high-frequency parameter group corresponding to the target high-frequency parameter influence interval is determined. When continuous casting starts, the controller collects each high-frequency parameter in the target high-frequency parameter group according to the preset collection frequency and records the collection time. At the same time, record the first moment when each billet slice of the billet enters the target high-frequency parameter influence interval and the second moment when it leaves the target high-frequency parameter influence interval. Associate the target high-frequency parameter group collected between the second moment and the first moment to the billet slice. As shown in the following table, this is an example of the time information of each billet slice entering and leaving the crystallizer interval:

[0086] Table 2

[0087]

[0088] Optionally, the continuous casting system further comprises a crystallizer, a cutter and a casting length detector. The method further comprises a step of determining the slab slices included in the slab, the step comprising:

[0089] Obtain a first distance from the cutting point of the cutting machine to the starting point of casting, obtain a second distance that the cutting machine moves when cutting the ingot, obtain a third distance of the cut produced by the cutting machine, obtain a measured value of the ingot length that has been cut, and obtain a detected value of the ingot length that has been cut detected by the casting length detector; wherein the casting starting point is the meniscus position of the crystallizer.

[0090] Based on the casting length calculation formula, the casting length correction value is determined according to the first distance, the second distance, the third distance, the measured value of the casting length and the detected value of the casting length.

[0091] The strand slices respectively included in the two strand sections that have been cut and the two strand sections that have not been cut are determined according to the casting length correction value.

[0092] At present, the casting length of the continuous casting machine is obtained through the encoder provided by the continuous casting machine. During the casting process, the encoder provided on the roller records the number of turns of the roller in real time. However, since the roller is easy to slip, the encoder provided by the continuous casting machine is prone to errors and cannot accurately record the length of the continuous casting billet. This will cause the real-time continuous casting production data to be mismatched with the billet, thereby generating errors. Therefore, when determining the billet slices included in the billet, it is necessary to first correct the casting length of the billet and then determine the billet slices included in each billet.

[0093] See also Figure 3, is a schematic diagram of the continuous casting system. When casting begins, the molten steel starts to be cast from the starting point of the meniscus of the crystallizer (i.e. the starting point of casting), and the ingot passes through the crystallizer along the meniscus to the starting point of the cutter. Since the casting process is continuous, the cutter needs to move forward a distance from the start of cutting to the completion of cutting. Figure 3 When the cutter completes the first cut, the actual length of the casting is the length of two billets, and the length of the first billet has been detected by the casting length detector set at the cutting point. The length of the second billet is the length from the casting start point to the cutting position of the cutter.

[0094] As an optional implementation, the first distance from the cutting point of the cutter to the casting start point, the second distance moved by the cutter when cutting the ingot, the third distance of the slit produced by the cutter, the measured value of the cut ingot length (obtained by the encoder mentioned above), and the detected value of the cut ingot length detected by the casting length detector can be obtained by sensors, etc. After obtaining these values, the casting length correction value is calculated according to the preset casting length calculation formula, and then the ingot slices included in the two ingot sections that have been cut and the two ingot sections that have not been cut are determined.

[0095] Optionally, the determining of the casting length correction value based on the casting length calculation formula according to the first distance, the second distance, the third distance, the measured value of the casting length and the detected value of the casting length includes:

[0096] The sum of the first distance, the second distance, the third distance and the measured value of the length of the casting strand is taken as the current casting length value.

[0097] The ratio of the measured value of the ingot length to the detected value of the ingot length is used as a correction factor.

[0098] The product of the current casting length value and the correction coefficient is used as the casting length correction value.

[0099] Optionally, the casting length calculation formula is:

[0100] L=(C1+C2+C3+L1)*L1 / L2

[0101] Among them, C1 is the first distance, C2 is the second distance, C3 is the third distance, L1 is the measured value of the ingot length, L2 is the detected value of the ingot length, and L is the casting length correction value.

[0102] When calculating the casting length correction value, the sum of the first distance, the second distance, the third distance and the measured value of the billet length can be used as the current casting length value, that is, the total length of the two billets before correction. Then, the ratio of the billet length detection value detected by the casting length detector that has been cut and the billet length detection value measured by the encoder is used as the correction coefficient. The casting length correction value is then obtained by multiplying the current casting length value by the correction coefficient.

[0103] For example, if the first distance of the billet with the billet number 24B07849A20 is 4350mm, the second distance is 2150mm, the third distance is 8mm, the billet length measurement value is 9140mm, and the billet length detection value is 9105mm. Then, according to the casting length calculation formula, the casting length correction value can be calculated to be 65968mm.

[0104] Optionally, determining the casting slab slices respectively included in the two sections of the casting slab that have been cut and the two sections that have not been cut according to the casting length correction value comprises:

[0105] Half of the casting length correction value is used as the length of the strand that has been cut, and the other half is used as the length of the strand that has not been cut.

[0106] Based on the preset strand slice length, the strand slices included in the strand that has been cut and the strand that has not been cut are calculated in sequence starting from the head of the strand that has been cut.

[0107] In an optional embodiment, half of the casting length correction value can be used as the length of the cut billet (i.e., the billet that has passed the cutter and the casting length detector), and the other half can be used as the length of the billet that has not been cut (i.e., the billet from the cutting point to the casting start point). Since the billet slice is virtual, its length can be set. Then, starting from the head of the billet that has been cut to the cutting point position, the billet slices recorded in real time during casting can be matched in sequence; and then starting from the cutting point position to the high-frequency parameter influence interval, the billet slices that have passed the high-frequency parameter influence interval can be matched in sequence.

[0108] Optionally, the high-frequency parameter influence interval includes a crystallizer high-frequency parameter influence interval and a secondary cooling zone high-frequency parameter influence interval.

[0109] The high-frequency parameters corresponding to the high-frequency parameter influence interval of the crystallizer include stopper rod type, crystallizer cooling mode, crystallizer liquid level fluctuation and crystallizer water flow.

[0110] The high-frequency parameters corresponding to the secondary cooling zone high-frequency parameter influence interval include secondary cooling water mode, secondary cooling water main pipe flow, secondary cooling water main pipe pressure and secondary cooling water main pipe temperature.

[0111] In actual production, the high-frequency parameter impact intervals and high-frequency parameters that need to be paid attention to are different in different situations. The staff can flexibly set one or more target high-frequency parameter impact intervals, and set the high-frequency parameters corresponding to the target high-frequency parameter impact intervals to meet actual production needs. The embodiments of the present invention do not specifically limit this.

[0112] In step S140, abnormal high frequency parameters are determined from each of the high frequency parameter groups based on a preset high frequency parameter range.

[0113] A normal range (ie, a preset high-frequency parameter range) may be set for each high-frequency parameter. If a parameter in the high-frequency parameter group is not within the corresponding preset high-frequency parameter range, the high-frequency parameter is determined to be an abnormal high-frequency parameter.

[0114] Execute step S150 to determine the defective ingot slice and the time when the defect occurred according to the abnormal high-frequency parameters.

[0115] After the abnormal high-frequency parameters are determined, the corresponding high-frequency parameter group can be determined by the abnormal high-frequency parameters, and then the corresponding defective slab slice can be determined from the determined high-frequency parameter group, and the defect generation time can be determined by the acquisition time of the determined high-frequency parameter group. The slab slice number, defect generation time and abnormal high-frequency parameters corresponding to the defective slab slice are sent to the control end, so that the staff can quickly find the cause of the defect and deal with it.

[0116] Based on the same inventive concept, Figure 4 As shown, the embodiment of the present invention provides a slab defect tracing device 300, which is applied to a controller of a continuous casting system. The slab defect tracing device 300 includes:

[0117] The slab defect backtracking instruction receiving unit 301 is used to receive a slab defect backtracking instruction, wherein the slab defect backtracking instruction includes a slab number.

[0118] The defective ingot determining unit 302 is used to determine a defective ingot from a plurality of ingots based on the ingot numbers, each of the ingots comprising a plurality of ingot slices, each of which corresponds to a unique ingot slice number.

[0119] The high-frequency parameter group calling unit 303 is used to call the high-frequency parameter group associated with each of the defective ingot slice numbers from the database, wherein each high-frequency parameter group includes a plurality of high-frequency parameters of different types.

[0120] The abnormal high frequency parameter determining unit 304 is configured to determine an abnormal high frequency parameter from each of the high frequency parameter groups based on a preset high frequency parameter range.

[0121] The backtracking unit 305 is used to determine the defective ingot slice and the time when the defect occurred according to the abnormal high-frequency parameters.

[0122] Regarding the above-mentioned ingot defect tracing device 300, the specific functions of each unit therein have been described in detail in the embodiment of the ingot defect tracing method provided in this specification, and will not be elaborated here.

[0123] Based on the same inventive concept, an embodiment of the present invention specification provides a computer-readable storage medium on which a computer program is stored. When the program is executed by a processor, the steps of any method of the above-mentioned casting defect backtracking method are implemented.

[0124] The present invention has at least the following beneficial effects:

[0125] When a defect occurs in a slab, the defective slab number is obtained by receiving the slab defect tracing instruction, and the defective slab slice and the time of defect occurrence are further located according to the high-frequency parameters associated with the slab slice in the defective slab. This enables the staff to quickly find the cause of the defect and deal with it accordingly, thus improving the production efficiency of the continuous casting process.

[0126] In several embodiments provided by the present invention, it should be understood that the disclosed devices and methods can also be implemented in other ways. The device embodiments described above are merely schematic. For example, the flowcharts and block diagrams in the accompanying drawings show the possible architecture, functions and operations of the devices, methods and computer program products according to multiple embodiments of the present invention. In this regard, each box in the flowchart or block diagram can represent a module, a program segment or a part of a code, and the module, a program segment or a part of a code contains one or more executable instructions for implementing the specified logical functions. It should also be noted that in some alternative implementations, the functions marked in the box can also occur in a different order from the order marked in the accompanying drawings. For example, two consecutive boxes can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each box in the block diagram and / or flowchart, and the combination of boxes in the block diagram and / or flowchart can be implemented with a dedicated hardware-based system that performs a specified function or action, or can be implemented with a combination of dedicated hardware and computer instructions.

[0127] In addition, the functional modules in the various embodiments of the present invention may be integrated together to form an independent part, or each module may exist independently, or two or more modules may be integrated to form an independent part.

[0128] If the functions are implemented in the form of software function modules and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, or the part that contributes to the prior art or the part of the technical solution, can be embodied in the form of a software product. The computer software product is stored in a storage medium, including several instructions for enabling a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the methods described in each embodiment of the present invention. The aforementioned storage medium includes: various media that can store program codes, such as a USB flash drive, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk.

[0129] The above is only a specific embodiment of the present invention, but the protection scope of the present invention is not limited thereto. Any changes or substitutions that can be easily thought of by a person skilled in the art within the technical scope disclosed by the present invention should be included in the protection scope of the present invention. Therefore, the protection scope of the present invention should be based on the protection scope of the claims.

Claims

1. A method for tracing defects of a casting billet, characterized in that: A controller for a continuous casting system; the method comprising: receiving a slab defect tracing instruction, wherein the slab defect tracing instruction includes a slab number; Determine a defective ingot from a plurality of ingots based on the ingot numbers, each of the ingots comprising a plurality of ingot slices, each of the ingot slices corresponding to a unique ingot slice number; Retrieving from the database a high-frequency parameter group associated with each of the defective ingot slice numbers, wherein each high-frequency parameter group includes a plurality of high-frequency parameters of different types; Determining abnormal high frequency parameters from each of the high frequency parameter groups based on a preset high frequency parameter range; The defective slab slice and the time when the defect occurred are determined according to the abnormal high-frequency parameters.

2. The method for tracing back defects of a casting billet according to claim 1, characterized in that: The method further comprises the step of associating the strand slice with the high frequency parameter set, the step comprising: In response to the high-frequency parameter association instruction, determining a target high-frequency parameter influence interval from a plurality of high-frequency parameter influence intervals, and determining a corresponding target high-frequency parameter group based on the target high-frequency parameter influence interval; Collecting each of the high-frequency parameters in the target high-frequency parameter group according to a preset collection frequency, and recording the collection time of each collection; During the casting process, real-time recording of the first moment when each of the cast slab slices enters the target high-frequency parameter influence interval and the second moment when each of the cast slab slices leaves the target high-frequency parameter influence interval; For each of the strand slices, a target high-frequency parameter group collected at the first time and the second time is associated with the strand slice.

3. The method for tracing back defects of a casting billet according to claim 1, characterized in that: The continuous casting system further comprises a crystallizer, a cutter and a casting length detector; the method further comprises a step of determining the ingot slices included in the ingot, the step comprising: Acquire a first distance from the cutting point of the cutter to the casting starting point, acquire a second distance that the cutter moves when cutting the ingot, acquire a third distance of the slit produced by the cutter, acquire a measured value of the ingot length that has been cut, and acquire a detected value of the ingot length that has been cut detected by the casting length detector; wherein the casting starting point is the meniscus position of the crystallizer; Based on a casting length calculation formula, determining a casting length correction value according to the first distance, the second distance, the third distance, the measured value of the casting length, and the detected value of the casting length; The strand slices respectively included in the two strand sections that have been cut and the two strand sections that have not been cut are determined according to the casting length correction value.

4. The method for tracing back defects of a casting billet according to claim 3, characterized in that: The method of determining the casting length correction value based on the casting length calculation formula according to the first distance, the second distance, the third distance, the measured value of the casting length and the detected value of the casting length comprises: Taking the sum of the first distance, the second distance, the third distance and the measured value of the length of the casting strand as the current casting length value; The ratio of the measured value of the length of the ingot to the detected value of the length of the ingot is used as a correction coefficient; The product of the current casting length value and the correction coefficient is used as the casting length correction value.

5. The method for tracing back defects of a casting billet according to claim 4, characterized in that: The casting length calculation formula is: L=(C1+C2+C3+L1)*L1 / L2 Among them, C1 is the first distance, C2 is the second distance, C3 is the third distance, L1 is the measured value of the ingot length, L2 is the detected value of the ingot length, and L is the casting length correction value.

6. The method for tracing back defects of a casting billet according to claim 3, characterized in that: The step of determining the casting slab slices respectively included in the two sections of the casting slab that have been cut and the two sections of the casting slab that have not been cut according to the casting length correction value comprises: half of the casting length correction value is used as the length of the cast billet that has been cut, and the other half is used as the length of the cast billet that has not been cut; Based on the preset strand slice length, the strand slices included in the strand that has been cut and the strand that has not been cut are calculated in sequence starting from the head of the strand that has been cut.

7. The method for tracing back defects of a casting billet according to claim 2, characterized in that: The high-frequency parameter influence interval includes the high-frequency parameter influence interval of the crystallizer and the high-frequency parameter influence interval of the secondary cooling zone; The high-frequency parameters corresponding to the high-frequency parameter influence interval of the crystallizer include stopper rod type, crystallizer cooling mode, crystallizer liquid level fluctuation and crystallizer water flow rate; The high-frequency parameters corresponding to the secondary cooling zone high-frequency parameter influence interval include secondary cooling water mode, secondary cooling water main pipe flow, secondary cooling water main pipe pressure and secondary cooling water main pipe temperature.

8. A casting defect tracing device, characterized in that: A controller applied to a continuous casting system; the ingot defect tracing device comprises: A casting defect backtracking instruction receiving unit, used for receiving a casting defect backtracking instruction, wherein the casting defect backtracking instruction includes a casting number; A defective ingot determining unit, used for determining a defective ingot from a plurality of ingots based on the ingot numbers, each of the ingots comprising a plurality of ingot slices, each of the ingot slices corresponding to a unique ingot slice number; A high-frequency parameter group calling unit, used to call the high-frequency parameter group associated with each of the slice numbers of the defective ingot from the database, wherein each high-frequency parameter group includes a plurality of high-frequency parameters of different types; an abnormal high frequency parameter determination unit, configured to determine an abnormal high frequency parameter from each of the high frequency parameter groups based on a preset high frequency parameter range; The backtracking unit is used to determine the defective ingot slice and the time when the defect occurred according to the abnormal high-frequency parameters.

9. An electronic device, characterized in that: include: A memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of the method according to any one of claims 1 to 7 when executing the program.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium includes a computer program, and when the computer program is executed, the server where the computer-readable storage medium is located is controlled to implement the steps of the method according to any one of claims 1 to 7.

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