Probe for testing integrated circuit

Abstract

The utility model discloses a probe for testing an integrated circuit, which belongs to the technical field of circuit testing equipment and comprises a connecting seat, a probe body fixedly connected to the lower end of the connecting seat, a protective cylinder arranged at the outer end of the connecting seat, a sealing sleeve arranged at the lower end of the protective cylinder, and a plurality of sealing sheets fixedly connected to the inner end of the sealing sleeve. The upper end of the sealing sleeve is fixedly connected with a clamping ring, the lower end of the protection cylinder is provided with an annular clamping groove matched with the clamping ring, each sealing piece comprises a rubber piece, the rubber pieces are fixedly connected to the inner end of the sealing sleeve, and the inner end of the side, close to the probe body, of each rubber piece is fixedly connected with a dust removal eraser. The probe can achieve the purposes of wrapping and protecting the probe body through the protective cylinder and shielding the bottom by combining with the sealing piece to reduce dust adhesion to the probe body, and meanwhile, erosion of air to the probe body can be reduced by utilizing the probe body and the sealing piece, so that the service life of the probe body is effectively prolonged.

Description

Technical Field

[0001] The utility model relates to the technical field of circuit testing equipment, and more specifically to a probe for integrated circuit testing. Background Art

[0002] Probes for integrated circuit (IC) testing are connectors used to connect between test equipment and IC pins; these probes are usually designed as tiny and precise tools to ensure reliable electrical connections while minimizing damage to IC pins and test equipment.

[0003] Chinese patent authorization announcement number: CN217931768U, provides a long-life test probe for integrated circuits. This patent allows the connecting plate to move upward, so that the connecting plate can drive the connecting seat and the probe body to move into the protective cover. Through the cooperation of the second limit groove and the limit mechanism, the probe body can be fixed in the protective cover, thereby protecting the probe body and preventing the probe body from accidentally falling to the ground or being accidentally hit when not in use because the probe body is exposed to the outside, which will cause damage to the probe body and reduce the service life of the probe body.

[0004] However, in the above patent, when the probe body is stored in the protective cover, due to the hole on the side of the protective cover, dust and impurities can easily enter and adhere to the outer surface of the probe, thereby causing instability in the test results when the probe is used next time. At the same time, the probe is always in the air, which may cause oxidation or other chemical reactions. Utility Model Content

[0005] 1. Technical problems to be solved

[0006] In view of the problems existing in the prior art, the purpose of the utility model is to provide a probe for integrated circuit testing, which can wrap and protect the probe body through a protective tube and use a sealing sheet to cover the bottom to reduce the adhesion of dust to the probe body. At the same time, the probe body and the sealing sheet can also reduce the erosion of the probe body caused by air, thereby effectively improving the service life of the probe body.

[0007] 2. Technical solution

[0008] To solve the above problems, the utility model adopts the following technical solutions.

[0009] A probe for integrated circuit testing comprises a connecting seat, a probe body is fixedly connected to the lower end of the connecting seat, a protective tube is provided at the outer end of the connecting seat, a sealing sleeve is provided at the lower end of the protective tube, a plurality of sealing sheets are fixedly connected to the inner end of the sealing sleeve, and the plurality of sealing sheets abut against each other, a retaining ring is fixedly connected to the upper end of the sealing sleeve, and an annular retaining groove matching the retaining ring is provided at the lower end of the protective tube. The protective tube is used to wrap and protect the probe body, and the sealing sheet is used to shield the bottom to reduce dust adhesion to the probe body. At the same time, the probe body and the sealing sheet can also reduce the erosion of the probe body caused by air, thereby effectively improving the service life of the probe body.

[0010] Furthermore, the sealing sheet includes a rubber sheet, which is fixedly connected to the inner end of the sealing sleeve. The inner end of the rubber sheet close to the probe body is fixedly connected to a dust removal wipe. When the protective tube moves to expose the probe body, the probe body squeezes the multiple rubber sheets and squeezes them out from the middle of the multiple rubber sheets. Then, the dust on the outer surface of the probe body is wiped off with the dust removal wipe, thereby improving the accuracy of the probe body.

[0011] Furthermore, the sealing sheet also includes a plurality of magnetic strips, which are respectively fixedly connected to one end of a plurality of rubber sheets close to each other. Through the mutual magnetic attraction between the magnetic strips, when the protective tube wraps the probe body, the gap between the plurality of rubber sheets is reduced, thereby reducing air entry, preventing the probe body from being oxidized or corroded, and improving its service life.

[0012] Furthermore, the clamping ring includes an annular clamping plate, which is fixedly connected to the upper end of the sealing sleeve, and a pair of rubber clamping strips are fixedly connected to the outer end of the annular clamping plate. A pair of fitting grooves matching the rubber clamping strips are provided on the inner wall of the annular clamping groove. When the annular clamping plate is clamped into the annular clamping strip by applying force, the rubber clamping strip is forced to shrink until it fits with the fitting groove, thereby fixing the sealing sleeve on the lower end of the protective tube, and also facilitating subsequent disassembly and replacement.

[0013] Furthermore, an anti-drop sleeve is fixedly connected to the outer end of the connecting seat, and the anti-drop sleeve is located above the protective tube. The protective tube is limited by the anti-drop sleeve, and the gap between the protective tube and the connecting seat can be blocked to reduce gas infiltration.

[0014] Furthermore, the protective tube and the connecting seat are fixedly connected with a threaded plate at one end close to each other, and the pair of threaded plates are matched. By adopting a pair of threaded plates that are screwed together, it is not only convenient to move up and down, but also the threads between the two are not easy to penetrate gas.

[0015] 3. Beneficial effects

[0016] Compared with the prior art, the advantages of the present invention are:

[0017] (1) This solution can achieve the purpose of wrapping the probe body with a protective tube and shielding the bottom with a sealing sheet to reduce dust adhesion to the probe body. At the same time, the probe body and the sealing sheet can also reduce the erosion of the probe body caused by air, thereby effectively improving the service life of the probe body.

[0018] (2) In the present solution, the sealing sheet includes a rubber sheet, which is fixedly connected to the inner end of the sealing sleeve. The inner end of the rubber sheet close to the probe body is fixedly connected to a dust removal wiper. When the protective tube moves to expose the probe body, the probe body squeezes the multiple rubber sheets and squeezes out from the middle of the multiple rubber sheets. Then, the dust on the outer surface of the probe body is wiped off with the dust removal wiper, thereby improving the accuracy of the probe body.

[0019] (3) In the present embodiment, the sealing sheet also includes a plurality of magnetic strips, which are respectively fixedly connected to one end of a plurality of rubber sheets close to each other. The magnetic strips are magnetically attracted to each other, so that when the protective tube wraps the probe body, the gap between the plurality of rubber sheets is reduced, thereby reducing air entry, preventing the probe body from being oxidized or corroded, and improving its service life.

[0020] (4) In this scheme, the retaining ring includes an annular retaining plate, which is fixedly connected to the upper end of the sealing sleeve. A pair of rubber retaining strips are fixedly connected to the outer end of the annular retaining plate. A pair of fitting grooves matching the rubber retaining strips are opened on the inner wall of the annular retaining groove. When the annular retaining plate is clamped into the annular retaining strip by applying a force, the rubber retaining strip is forced to shrink until it fits into the fitting groove, thereby fixing the sealing sleeve on the lower end of the protective tube, and also facilitating subsequent disassembly and replacement.

[0021] (5) In this solution, an anti-drop sleeve is fixedly connected to the outer end of the connecting seat, and the anti-drop sleeve is located above the protective tube. The protective tube is limited by the anti-drop sleeve, and at the same time, the gap between the protective tube and the connecting seat can be blocked to reduce gas infiltration.

[0022] (6) In this solution, the protective tube and the connecting seat are fixedly connected with a threaded plate at one end close to each other, and the pair of threaded plates are matched. By adopting a pair of threaded plates that are screwed together, it is not only convenient to move up and down, but also the threads between the two are not easy to penetrate gas. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 It is a schematic diagram of the overall structure of the utility model;

[0024] Figure 2 It is a schematic diagram of the structure of the front section view of the utility model;

[0025] Figure 3 For the utility model Figure 2 The enlarged structural diagram at A in the middle;

[0026] Figure 4 It is a structural schematic diagram of the sealing sleeve in the utility model.

[0027] Description of the numbers in the figure:

[0028] 1. Connecting seat; 2. Probe body; 3. Protective tube; 4. Sealing sleeve; 5. Sealing sheet; 51. Rubber sheet; 52. Dust removal wipe; 53. Magnetic strip; 6. Snap ring; 61. Ring-shaped clamping plate; 62. Rubber clamping strip; 7. Anti-slip sleeve; 8. Threaded plate. DETAILED DESCRIPTION

[0029] The technical solutions in the embodiments of the utility model will be clearly and completely described below in conjunction with the drawings in the embodiments of the utility model; it is obvious that the described embodiments are only part of the embodiments of the utility model, rather than all of the embodiments, and all other embodiments obtained by ordinary technicians in this field based on the embodiments of the utility model without making creative work are within the scope of protection of the utility model.

[0030] In the description of the present invention, it should be noted that the terms "upper", "lower", "inner", "outer", "top / bottom" and the like indicate positions or positional relationships based on the positions or positional relationships shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific position, be constructed and operated in a specific position, and therefore cannot be understood as limiting the present invention. In addition, the terms "first" and "second" are used for descriptive purposes only, and cannot be understood as indicating or implying relative importance.

[0031] In the description of the present utility model, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "provided with", "set / connected", "connected", etc. should be understood in a broad sense. For example, "connected" can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present utility model can be understood according to specific circumstances.

[0032] Embodiment 1:

[0033] See also Figure 1-4A probe for integrated circuit testing comprises a connecting seat 1, a probe body 2 is fixedly connected to the lower end of the connecting seat 1, a protective tube 3 is provided at the outer end of the connecting seat 1, a sealing sleeve 4 is provided at the lower end of the protective tube 3, a plurality of sealing sheets 5 are fixedly connected to the inner end of the sealing sleeve 4, and the plurality of sealing sheets 5 are abutted against each other, a clamping ring 6 is fixedly connected to the upper end of the sealing sleeve 4, and an annular clamping groove matching the clamping ring 6 is opened at the lower end of the protective tube 3. The probe body 2 is wrapped and protected by the protective tube 3 and the bottom is shielded by the sealing sheet 5 to reduce dust adhesion to the probe body 2. At the same time, the probe body 2 and the sealing sheet 5 can also reduce the erosion of the probe body 2 caused by air, thereby effectively improving the service life of the probe body 2.

[0034] The sealing sheet 5 includes a rubber sheet 51, which is fixedly connected to the inner end of the sealing sleeve 4. A dust removal wipe 52 is fixedly connected to the inner end of the rubber sheet 51 close to the probe body 2. When the protective tube 3 moves to expose the probe body 2, the probe body 2 squeezes the multiple rubber sheets 51 and squeezes out from the middle of the multiple rubber sheets 51, and then the dust removal wipe 52 is used to wipe off the dust on the outer surface of the probe body 2, so as to improve the accuracy of the probe body 2.

[0035] The sealing sheet 5 also includes a plurality of magnetic strips 53, which are respectively fixedly connected to one end of the plurality of rubber sheets 51 close to each other. The magnetic strips 53 are magnetically attracted to each other, so that when the protective tube 3 wraps the probe body 2, the gap between the plurality of rubber sheets 51 is reduced, thereby reducing air entry, preventing the probe body 2 from being oxidized or corroded, and improving its service life.

[0036] The clamping ring 6 includes an annular clamping plate 61, which is fixedly connected to the upper end of the sealing sleeve 4. A pair of rubber clamping strips 62 are fixedly connected to the outer end of the annular clamping plate 61. A pair of fitting grooves matching the rubber clamping strips 62 are provided on the inner wall of the annular clamping groove. When the annular clamping plate 61 is clamped into the annular clamping groove by applying a force, the rubber clamping strips 62 are forced to shrink until they fit into the fitting groove, thereby fixing the sealing sleeve 4 on the lower end of the protective tube 3, and also facilitating subsequent disassembly and replacement.

[0037] The outer end of the connecting seat 1 is fixedly connected with an anti-drop sleeve 7, and the anti-drop sleeve 7 is located above the protective tube 3. The anti-drop sleeve 7 limits the protective tube 3 and can block the gap between the protective tube 3 and the connecting seat 1 to reduce gas infiltration.

[0038] The protective tube 3 and the connecting seat 1 are fixedly connected with a threaded plate 8 at one end close to each other, and the pair of threaded plates 8 match each other. By adopting a pair of threaded plates 8 that are screwed together, it is not only convenient to move up and down, but also the threads between the two are not easy to penetrate gas.

[0039] When using, please refer to Figure 1-4, by rotating the protective tube 3 to make it move downward, the probe body 2 is wrapped, and at the same time, the multiple rubber sheets 51 are mutually adsorbed by the magnetic strips 53 to form a seal to protect the probe body 2. During testing, the protective tube 3 is reversed to make it move upward. At this time, the probe body 2 squeezes the rubber sheet 51 to open the adsorption between the multiple magnetic strips 53. At the same time, the probe body 2 passes through the rubber sheet 51 and the protective tube 3 continues to move upward. At this time, the dust removal wipe 52 is close to the probe body 2 and wipes the dust on its surface. Compared with traditional integrated circuit testing probes, the utility model can achieve the purpose of wrapping and protecting the probe body 2 by the protective tube 3 and combining the sealing sheet 5 to cover the bottom to reduce the dust adhering to the probe body 2. At the same time, the probe body 2 and the sealing sheet 5 can also reduce the erosion of the probe body 2 caused by air, thereby effectively improving the service life of the probe body 2.

[0040] The above is only a preferred specific implementation of the utility model; however, the protection scope of the utility model is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes according to the technical solution and improved ideas of the utility model within the technical scope disclosed by the utility model, which should be included in the protection scope of the utility model.

Claims

1. A probe for testing an integrated circuit, comprising a connection socket (1), characterized in that: The lower end of the connecting seat (1) is fixedly connected to a probe body (2); the outer end of the connecting seat (1) is provided with a protective tube (3); the lower end of the protective tube (3) is provided with a sealing sleeve (4); the inner end of the sealing sleeve (4) is fixedly connected to a plurality of sealing sheets (5), and the plurality of sealing sheets (5) are abutted against each other; the upper end of the sealing sleeve (4) is fixedly connected to a retaining ring (6); and the lower end of the protective tube (3) is provided with an annular retaining groove matching the retaining ring (6).

2. The integrated circuit testing probe according to claim 1, characterized in that: The sealing sheet (5) comprises a rubber sheet (51), the rubber sheet (51) is fixedly connected to the inner end of the sealing sleeve (4), and a dust removal wiper (52) is fixedly connected to the inner end of the rubber sheet (51) on a side close to the probe body (2).

3. The integrated circuit testing probe according to claim 2, characterized in that: The sealing sheet (5) further comprises a plurality of magnetic strips (53), wherein the plurality of magnetic strips (53) are respectively fixedly connected to one end of the plurality of rubber sheets (51) close to each other.

4. The integrated circuit testing probe according to claim 1, characterized in that: The clamping ring (6) comprises an annular clamping plate (61), the annular clamping plate (61) is fixedly connected to the upper end of the sealing sleeve (4), a pair of rubber clamping strips (62) are fixedly connected to the outer end of the annular clamping plate (61), and a pair of matching grooves matching the rubber clamping strips (62) are formed on the inner wall of the annular clamping groove.

5. The integrated circuit testing probe according to claim 1, characterized in that: An anti-drop sleeve (7) is fixedly connected to the outer end of the connection seat (1), and the anti-drop sleeve (7) is located above the protective tube (3).

6. The integrated circuit testing probe according to claim 1, characterized in that: The protective tube (3) and the connecting seat (1) are both fixedly connected with a threaded plate (8) at one end close to each other, and the pair of threaded plates (8) match each other.

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