Device for rapidly detecting surface resistance of golden finger of integrated circuit aging test board

Abstract

The utility model belongs to the technical field of semiconductor integrated circuit aging tests, and discloses an integrated circuit aging test board golden finger surface resistance rapid detection device, which comprises a test host and a self-checking box, and is characterized in that the test host comprises a control circuit board, a serial port liquid crystal display screen, a direct current power supply and a host connecting port; the serial port liquid crystal display screen is connected with the control circuit board; the control circuit board is connected with the direct-current power supply and the host connecting port; the self-checking box comprises a plug board and a self-checking box connecting port, and the plug board is connected with the self-checking box connecting port; and the host connecting port is connected with the self-checking box connecting port through a cable. The device has the characteristics of reliable test result, high test efficiency and strong operability.

Description

Technical Field

[0001] The utility model belongs to the technical field of semiconductor integrated circuit aging test, in particular to a fast detection device for the surface resistance of gold fingers of an integrated circuit aging test board. Background Art

[0002] Burn-in test is an essential item in "Test Methods and Procedures for Microelectronic Devices". Burn-in test board is the carrier of components in burn-in test, so monitoring its functions and performance is a very important task. The gold finger surface of burn-in test board is easily affected by oxidation and pollutants, which causes the surface resistance to increase. The surface resistance of the gold finger of the test board is (5-10) mΩ when it leaves the factory. After long-term use, due to the wear and oxidation of the gold plating layer, it gradually changes to hundreds of milliohms to tens of ohms or even open circuit. If a large current passes through high impedance, it may cause excessive energy consumption and cause the contact to overheat. Burn-in test board without regular surface resistance detection will have safety and quality risks during the continuous 48h-96h test under the test conditions of rated current / voltage and temperature +125℃. The test board mainly detects the surface resistance performance of VCC, GND, VEE, and VMUX ports that are prone to overheating during the test.

[0003] At present, there is no integrated dedicated test instrument for testing the surface resistance of gold finger of test board in China. Micro-ohmmeter or digital multimeter is often used for testing. The following defects were found through testing: only the surface resistance of gold finger of VCC, GND, VEE and VMUX ports can be tested one by one, and the test efficiency is low. Utility Model Content

[0004] The technical problem to be solved by the utility model is that the surface resistance of the gold fingers of the VCC, GND, VEE and VMUX ports can only be tested one by one, resulting in low testing efficiency.

[0005] In order to solve the above technical problems, the specific technical solutions of the utility model are as follows:

[0006] A device for quickly detecting the surface resistance of the gold finger of an integrated circuit aging test board comprises a test host and a self-test box, wherein the test host comprises a control circuit board, a serial port liquid crystal display, a direct current power supply and a host connection port; the serial port liquid crystal display is connected to the control circuit board, and the control circuit board is connected to the direct current power supply and the host connection port; the self-test box comprises a plug-in board and a self-test box connection port, and the plug-in board is connected to the self-test box connection port; the host connection port is connected to the self-test box connection port through a cable.

[0007] Wherein, a resistor mounting seat is arranged on the self-test box.

[0008] The utility model has the following advantages: it adopts LCD touch screen control, can automatically complete the surface resistance detection of the gold finger VCC, VMUX, VEE, GND ports within 4 seconds, and performs software calibration on the deviations generated by the operational amplifier, ADC conversion, circuit, and connector by adjusting the K value (correction coefficient). In order to ensure the reliability and effectiveness of the test results of the gold finger detection device, a special self-test box is designed, which adopts the four-wire standard resistance source method to monitor the measurement range and accuracy of the gold finger detection device. The detection device has the characteristics of reliable test results, high test efficiency, and strong operability. BRIEF DESCRIPTION OF THE DRAWINGS

[0009] Figure 1 This is a schematic diagram of the structure of the detection device of the utility model;

[0010] Figure 2 It is the main interface plan;

[0011] Figure 3 Set up the interface plan for the parameters;

[0012] Figure 4 To control the operation interface plan;

[0013] Figure 5 is the system block diagram;

[0014] Figure 6 To test the host circuit diagram;

[0015] Figure 7 This is the working principle diagram of the single-channel detection circuit. DETAILED DESCRIPTION

[0016] In order to better understand the purpose, structure and function of the present invention, the present invention is further described in detail below in conjunction with the accompanying drawings.

[0017] like Figure 1 As shown, the utility model of the integrated circuit aging test board gold finger surface resistance rapid detection device includes a test host 1 and a self-test box 2, and the test host includes a control circuit board, a serial port LCD display 3, a DC power supply and a host connection port 4. The serial port LCD display 3 is connected to the control circuit board, and the control circuit board is connected to the DC power supply and the host connection port. The self-test box consists of a plug-in board and a self-test box connection port 5, and the plug-in board is connected to the self-test box connection port. The host connection port 4 is connected to the self-test box connection port 5 through a 16-core cable.

[0018] Embodiment 1

[0019] This embodiment consists of a test host 1 and a self-test box 2. The LCD touch screen 3 is used for display and control. The host connection port 4 and the self-test box connection port 5 use a 16-core cable holder for connecting the detection signal. The standard resistor holder 6 is used to install the standard resistor 7. The test host is powered by the power input terminal 8. During the test, the gold finger VCC, VMUX, VEE, and GND ports are connected to the port 4 through a 16-core cable. Click the run button on the LCD touch screen, and the test host automatically detects the surface resistance value of the VCC, VMUX, VEE, and GND channels.

[0020] like Figure 2 As shown, the main interface displayed on the LCD touch screen of the test host of the utility model is provided with parameter setting buttons or control operation buttons.

[0021] like Figure 3 As shown, the parameter setting interface of the test host of the utility model can set the detection upper limit values ​​of VCC, VMUX, VEE, and GND, as well as set the software correction value K, including K-VCC, K-VMUX, K-VEE, and K-GND. Click the confirm button to save, and click the exit button to return to the main interface.

[0022] like Figure 4 As shown, the test interface of the test host of the utility model. Click the Run button to start automatic detection, and the detection values ​​of the surface resistance of VCC, VMUX, VEE, and GND are displayed in the corresponding dialog boxes respectively. Click the Exit button to return to the main interface.

[0023] like Figure 5 As shown, the utility model self-test box. The self-test box is equipped with four standard resistor sockets, which can be equipped with standard resistors of different resistance values ​​and precisions according to the use requirements. Use 4 standard resistors of 10mΩ, 1Ω, and 10Ω, with an accuracy of 0.1%. The standard resistors are effectively traced. During the self-test, insert the standard resistor 7 into the standard resistor holder 6, connect port 4 and port 5 through a 16-core cable, connect the host connection port 4 to the self-test box connection port 5 through a 16-core cable, and click the run button on the LCD touch screen to test the host to automatically detect the resistance values ​​of the VCC, VMUX, VEE, and GND channels.

[0024] like Figure 6 As shown, the system of the utility model is composed of five parts: a display screen unit, a power supply conversion unit, an AD conversion unit, a constant current excitation unit, and an MCU unit.

[0025] The display unit uses a 5-inch serial port LCD display with model number TJC8048X550_011CS to control the device, the power conversion unit uses a 5V DC power supply to power the device, the AD conversion unit uses a model MCP3421A0 (18-bit) ADC for analog-to-digital conversion, the constant current excitation unit uses a MOS tube with model number IRFP150N as a constant current source, and the MCU uses a model IAP15W4K61S4 microcontroller for control.

[0026] like Figure 7 As shown, taking the single-channel detection process as an example, the circuit operation is specifically described:

[0027] After the LCD screen issues the "start" command, the 24th pin of U0 outputs a pulse width modulation signal, which is divided by R3, R4, R5 and filtered by C18, C19 to output the current program control voltage VC1 through R26 to the 5th pin of U1. The first current I1 is input to the 2nd and 3rd pins of U1 through R19, R20, and then output to the 1st pin after differential analysis by U1A. After being compared with VC1, the 7th pin output is connected to the Q1 control pin through R27 to achieve constant current. The constant current is converted by the ADC of UD0. The contact voltage is converted by the ADC of UD4. U0 automatically calculates the surface resistance value according to the internal program, and sends the value to the LCD screen through TX3 for display. The detection of this path is completed, and U0 continues to execute the detection of the next path. The detection time of a single path is about 1 second. From the issuance of the detection command to the microcontroller, the time for the microcontroller to start executing the program is about 10ms, the constant current source excitation to stabilization time is about 50ms, the detection time is about 900ms, and the detection result is sent to the display screen in about 10ms. The detection device automatically completes the detection of VCC, GND, VEE, and VMUX ports in less than 4 seconds.

[0028] Although the embodiments of the present invention are described in conjunction with the accompanying drawings, those skilled in the art may make several modifications and improvements without departing from the principle of the present invention, and these modifications and improvements should also be considered to belong to the protection scope of the present invention.

Claims

1. A rapid detection device for the surface resistance of the gold finger of the integrated circuit aging test board, It is characterized in that It includes a test host and a self-test box. The test host includes a control circuit board, a serial port LCD display, a DC power supply and a host connection port. The serial port LCD display is connected to the control circuit board, and the control circuit board is connected to the DC power supply and the host connection port. The self-test box includes a plug-in board and a self-test box connection port, and the plug-in board is connected to the self-test box connection port. The host connection port is connected to the self-test box connection port through a cable.

2. The integrated circuit aging test board gold finger surface resistance rapid detection device according to claim 1, It is characterized in that The self-test box is provided with a resistor mounting seat.

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