Test fixture and test system of power supply module
By designing a test fixture for push-pull clamp assembly and probe structure, the problem of unstable and low efficiency of power module testing is solved, and efficient and stable current and voltage measurement is achieved, suitable for different types of power modules.
Patent Information
- Application Number
- CN202420478504.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-03-12
- Publication Date
- 2025-01-07
- Estimated Expiration
- 2034-03-12
AI Technical Summary
The lack of adapted fixtures in the prior art leads to unstable and inefficient testing of power modules, and is prone to manual operation errors.
A test fixture including push-pull clamp assembly, push plate and probe was designed. The probe was inserted into the tubular interface of the power module through the push-pull clamp assembly, and the current and voltage measurements were achieved using different types of probes, and through The positioning pin and slider slider structure ensures the stability and adaptability of the connection.
It realizes one-time connection of the test circuit, improves testing efficiency and stability, reduces manual work errors, and has a wider adaptability.
Smart Images
Figure CN222318996U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of electronic device testing, in particular to a testing fixture and a testing system for a power module. Background Art
[0002] In the prior art, some power modules are designed to have external interfaces (pins) that can be welded in order to be stably connected to electronic devices. Figure 1 The power module shown has a tubular output interface with a wedge-shaped cross section. The purpose of this design is to facilitate observation of the butt-end interface of the electronic device inserted into this type of interface and to facilitate welding.
[0003] When performing basic parameter tests on this type of power module, since there is currently no suitable fixture, the probe can only be clamped on each interface using a clip. This connection method is not only unstable (it is easy to disconnect and cause a short circuit in the test circuit), but also has a relatively low connection efficiency for each interface (each interface measurement point needs to be manually clamped with a clip in turn). Therefore, how to improve test efficiency and avoid the problem of manual errors, and then design a set of test fixtures has become a problem that technicians in this field need to solve urgently. Utility Model Content
[0004] In view of the above problems, the present invention is proposed to provide a test fixture and a test system for a power module that overcome the above problems or at least partially solve the above problems.
[0005] In a first aspect, an embodiment of the utility model provides a test fixture for a power module, which may include: a bottom plate, a push-pull clamp assembly, a push plate, and a plurality of probes disposed on the push plate;
[0006] The push-pull clamp assembly comprises: a push-pull rod, a base for mounting the push-pull rod, and an adjusting nut connected to the end of the push-pull rod; the push-pull clamp assembly is fixedly mounted on the bottom plate through the base; the push plate is fixed on the push-pull rod through the adjusting nut;
[0007] The plurality of probes include: a plurality of first probes and two second probes, wherein the diameter of the first probes is larger than that of the second probes; the plurality of first probes are arranged in pairs perpendicular to the push plate in a vertical direction, and the second probes are respectively located above a pair of the first probes, and the second probes are arranged on the push plate at a preset angle to the plane where the push plate is located;
[0008] The power module to be tested is used to be fixed on the base plate, and the push-pull clamp assembly pushes the push plate to drive the first probe and the second probe to move toward the power module to be tested, so that the first probe is inserted into the tubular interface of the power module to be tested and abuts against the inner wall of the tubular interface and the second probe abuts against the wedge-shaped cross-section of the tubular interface.
[0009] Optionally, an angle between projections of the first probe and the second probe on a plane perpendicular to the vertical direction of the push plate is 0-30°.
[0010] Preferably, the angle between the projections of the first probe and the second probe on the plane perpendicular to the vertical direction of the push plate is 10-30°.
[0011] More preferably, the angle between the projections of the first probe and the second probe on the plane perpendicular to the vertical direction of the push plate is 20°.
[0012] Optionally, the first probe and the second probe are spring probes; and a length of the first probe extending out of the push plate is greater than a length of the second probe extending out of the push plate.
[0013] Optionally, the tail fixing heads of the first probe and the second probe are 1 mm;
[0014] The needle tip of the first probe is 5 mm, the spring travel of the first probe is 8 mm, and the spring collapse of the first probe is 4 mm; the spring collapse of the second probe is 7 mm.
[0015] Optionally, the lengths of the multiple first probes extending out of the push plate are the same, and the extended length is 14 mm; the lengths of the two second probes extending out of the push plate are the same, and the extended lengths are between 12 mm and 14 mm.
[0016] Optionally, the bottom plate may be provided with at least one pair of positioning pins perpendicular to the bottom plate in a vertical direction, and the power module under test is fixed to the bottom plate via the positioning pins.
[0017] Optionally, the test fixture may further include: two sliders and two slide bars;
[0018] The two sliders are arranged away from the push plate and the tested power module and fixed on the bottom plate, the two slide bars respectively penetrate the sliders and one end of the two slide bars is respectively fixed on the push plate;
[0019] When the push-pull clamp assembly pushes and pulls the push plate, the two slide bars are movably provided with the slide block so that the force on the push plate is balanced.
[0020] In a second aspect, an embodiment of the utility model provides a test system for a power module, the test system may include: a tested power module, a test circuit, and a test fixture for the power module as described in the first aspect;
[0021] Wherein, the tested power module is fixed on the base plate; and the test circuit is electrically connected to a plurality of the probes.
[0022] The beneficial effects of the above technical solution provided by the embodiment of the utility model at least include:
[0023] The embodiment of the utility model provides a test fixture and a test system for a power module. When in use, the test fixture can connect a device (test circuit) to a tested power module at one time, and all contacts are made at one time by means of probe abutment. In addition, the power input terminal can be connected by probes of different models, the current is measured by a probe with a large diameter, and the voltage is measured by a probe with a small diameter. Two probes of different models contact the same interface to achieve a Kelvin connection. Compared with using a clip to clamp each interface, the test fixture has a more stable connection and is quicker and more convenient to operate.
[0024] Other features and advantages of the utility model will be described in the following description, and partly become apparent from the description, or understood by implementing the utility model. The purpose and other advantages of the utility model can be realized and obtained by the structures particularly pointed out in the written description and the drawings.
[0025] The technical solution of the utility model is further described in detail below through the accompanying drawings and embodiments. BRIEF DESCRIPTION OF THE DRAWINGS
[0026] The accompanying drawings are used to provide a further understanding of the present invention and constitute a part of the specification. Together with the embodiments of the present invention, they are used to explain the present invention and do not constitute a limitation of the present invention. In the accompanying drawings:
[0027] Figure 1 This is a schematic diagram of the structure of the power module to be tested in the embodiment of the utility model;
[0028] Figure 2 It is a structural diagram of a test fixture of a power module in an embodiment of the utility model;
[0029] Figure 3 It is a cross-sectional view along the extending direction of the probe in the embodiment of the utility model;
[0030] Figure 4 It is a structural diagram of a test system for a power module in an embodiment of the utility model;
[0031] Among them, 1-test fixture; 2-tested power module;
[0032] 11-base plate, 12-push-pull clamp assembly; 13-push plate; 14-probe; 15-locating pin; 16-slider; 17-slide bar; 21-tubular interface; 121-push-pull rod; 122-base; 123-adjusting nut; 141-first probe; 142-second probe. DETAILED DESCRIPTION
[0033] The exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. Although the exemplary embodiments of the present disclosure are shown in the accompanying drawings, it should be understood that the present disclosure can be implemented in various forms and should not be limited by the embodiments set forth herein. On the contrary, these embodiments are provided to enable a more thorough understanding of the present disclosure and to fully convey the scope of the present disclosure to those skilled in the art.
[0034] In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", "far", "near", "front", "rear" and the like indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention. In addition, the terms "first", "second", and "third" are used for descriptive purposes only, and cannot be understood as indicating or implying relative importance.
[0035] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installation", "connection" and "connection" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.
[0036] The present invention provides a test fixture for a power module. Figure 2 , Figure 3 And combined Figure 4As shown, the test fixture 1 may include: a base plate 11, a push-pull clamp assembly 12, a push plate 13 and a plurality of probes 14 arranged on the push plate 13; the push-pull clamp assembly 12 includes: a push-pull rod 121, a base 122 for installing the push-pull rod 121 and an adjusting nut 123 connected to the end of the push-pull rod 121; the push-pull clamp assembly 12 is fixedly installed on the base plate 11 through the base 122; the push plate 13 is fixed on the push-pull rod 121 through the adjusting nut 123; the plurality of probes 14 include: a plurality of first probes 141 and two second probes 142, the diameter of the first probe 141 is larger than that of the second probe 142; the plurality of second probes 141 are provided on the push-pull rod 121, and the plurality of first probes 141 are provided on the push-pull rod 121. A pair of probes 141 are arranged perpendicular to the push plate 13 in the vertical direction, and the second probes 142 are respectively located above a pair of first probes 141, and the second probes 142 are arranged on the push plate 13 at a preset angle to the plane where the push plate 13 is located; the power module 2 under test is used to be fixed on the base plate 11, and the push plate 13 is pushed by the push-pull clamp assembly 12 to drive the first probes 141 and the second probes 142 to move toward the power module 2 under test, so that the first probe 141 is inserted into the tubular interface 21 of the power module 2 under test and abuts against the inner wall of the tubular interface 21, and the second probe 142 abuts against the wedge-shaped cross-section of the tubular interface 21.
[0037] The above-mentioned test fixture provided in the embodiment of the utility model can connect the device (test circuit) with the tested power module at one time when in use, and all of them can be contacted at one time by the probe abutment method. In addition, the power input terminal can be connected by probes of different models, the current is measured by a probe with a large diameter, and the voltage is measured by a probe with a small diameter. Two probes of different models contact the same interface to achieve Kelvin connection. Compared with using a clip to clamp each interface, the test fixture has a more stable connection and is faster and more convenient to operate.
[0038] In an alternative embodiment, referring to Figure 1 As shown, the tubular interface of the tested power module is wedge-shaped, that is, it has a wedge-shaped cross section. Therefore, the second probe in this embodiment is not arranged perpendicular to the push plate, that is, referring to Figure 3 As shown, the angle between the projections of the first probe 141 and the second probe 142 on the plane perpendicular to the vertical direction of the push plate 13 cannot be 0°. Figure 3 As shown, the angle between the projections of the first probe 141 and the second probe 142 on the plane perpendicular to the vertical direction of the push plate 13 is 0 to 30°. Specifically, the angle between the projections of the first probe 141 and the second probe 142 on the plane perpendicular to the vertical direction of the push plate 13 is 10 to 30°. More preferably, the angle between the projections of the first probe 141 and the second probe 142 on the plane perpendicular to the vertical direction of the push plate 13 is 20°.
[0039] For example, the notch angle of the tubular interface of the power module under test is 60° and the thickness is 2mm. In order to enable the second probe to accurately abut against the wedge-shaped section of the interface, the projection angle between the first probe and the second probe is selected to be between 0 and 30°. The inventor found in the actual debugging process that when the angle is between 0 and 10°, the inclination angle of the second probe is small, and the contact between the probe and the wedge-shaped section of the interface is prone to slippage. Therefore, the angle between the first probe and the second probe is selected to be between 10 and 30°. More preferably, the angle between the first probe and the second probe is selected to be 20°, so that the second probe can be well abutted against the wedge-shaped section of the interface, and the interface with a notch angle of 0 to 70° can be compatible according to the margin of the extension length of the second probe.
[0040] In another optional embodiment, the first probe 141 and the second probe 142 are spring probes 14; the length of the first probe 141 extending out of the push plate 13 is greater than the length of the second probe 142 extending out of the push plate 13. In this embodiment, the length of the first probe extending out of the push plate is longer than the length of the second probe extending out of the push plate. The purpose is, on the one hand, to allow the first probe to partially extend into the hollow tubular interface after the second probe abuts against the wedge-shaped section of the interface, thereby increasing the contact area between the first probe and the interface, so that the first probe can pass a larger current (for example, a current with a rated power of 40A); on the other hand, to avoid the second probe abutting against the wedge-shaped section of the interface with too much force in order to fully contact the first probe with the interface after the first probe is extended to a certain distance in the tubular interface, so that the second probe spring cannot be fully restored.
[0041] In a specific embodiment, the tail fixing head of the first probe 141 and the second probe 142 is 1 mm; the needle head of the first probe 141 is 5 mm, the spring travel of the first probe 141 is 8 mm, the spring collapse of the first probe 141 is 4 mm; the spring collapse of the second probe 142 is 7 mm. Figure 2 Therefore, the lengths of the first probes 141 extending out of the push plate 13 are consistent, and the extended length is 14 mm; the lengths of the two second probes 142 extending out of the push plate 13 are consistent, and the extended lengths are between 12 mm and 14 mm.
[0042] In this embodiment, the length of the first probe extending out of the push plate is 14mm, the tail fixed head is 1mm, the length of the needle is 5mm, and the spring travel of the first probe 141 is 8mm. The internal depth of the interface is 7mm. In order to achieve good contact, the spring of the first probe 141 is set to collapse 4mm. Therefore, after good contact, the total length of the first probe is 10mm. The second probe 142 is set to collapse to 7mm after the spring collapses to the bottom (some margin is reserved compared to the travel set for the first probe 141). The original length of 12 to 14mm is basically the same as the first probe 141.
[0043] In another optional embodiment, because the probe uses a spring to move the needle, it is necessary to give a fixed force to the tested power module so that the tested power module remains in a fixed position, and only the probe moves to achieve electrical connection. Figure 2 and Figure 4 As shown, at least one pair of locating pins 15 perpendicular to the bottom plate 11 in the vertical direction are provided on the bottom plate 11, and the power module 2 under test is fixed on the bottom plate 11 by the locating pins 15. In this embodiment, the power module under test is fixed at a preset position by means of locating pins. It should be noted that the above-mentioned push-pull clamp assembly in this embodiment includes an adjusting nut, and the distance between the push plate and the power module under test can be adjusted by adjusting the position of the nut on the push-pull rod, so that power modules with various interface lengths can be adapted, making the adaptability of the entire test fixture more extensive. Therefore, the position of the above-mentioned locating pin is fixed, and has no effect on the distance between the power module under test and the probe.
[0044] In another optional embodiment, the inventors found that if the push plate is connected to a single push-pull clamp assembly in a point connection form, the two ends of the push plate cannot maintain balance, and the push plate is unstable during the push-pull process. Figure 2 to Figure 4 As shown, the test fixture 1 may also include: two sliders 16 and two slide bars 17; the two sliders 16 are arranged away from the push plate 13 and the tested power module 2 and fixed on the bottom plate 11, the two slide bars 17 respectively penetrate the sliders 16 and one end of the two slide bars 17 is respectively fixed on the push plate 13; when the push-pull clamp assembly 12 pushes and pulls the push plate 13, the two slide bars 17 can movably penetrate the sliders 16 so that the force on the push plate 13 is balanced. The embodiment of the utility model adds a fixed slide rail composed of a slider + a slide bar on both sides of the push plate, so that the three points are fixedly connected to the push plate, and the push-pull action can be stably completed.
[0045] Based on the same inventive concept, the present utility model also provides a power module testing system, referring to Figure 4As shown, the system may include: a tested power module 2, a test circuit (not shown in the figure) and a test fixture 1 for the above-mentioned power module; wherein the tested power module 2 is fixed on a base plate 11; and the test circuit is electrically connected to a plurality of probes 13.
[0046] In the embodiment of the utility model, the test circuit may include a test device for measuring voltage (measuring input or output voltage, etc.), and may also include a test device for measuring current, etc., so as to measure the basic parameters of the tested power module through the test circuit and the test fixture. The technical problem solved by the test system in this embodiment is the same as that of the test fixture, and its beneficial effects and detailed description can refer to the relevant description of the test fixture, and the utility model embodiment will not be repeated here.
[0047] Obviously, those skilled in the art may make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. The present disclosure is not limited to the precise structure described above and shown in the accompanying drawings, and various modifications and changes may be made without departing from its scope. The scope of the present disclosure is limited only by the appended claims. Thus, if these modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include these modifications and variations.
Claims
1. A test fixture for a power module, characterized in that: include: A base plate, a push-pull clamp assembly, a push plate, and a plurality of probes disposed on the push plate; The push-pull clamp assembly includes: a push-pull rod, a base for mounting the push-pull rod, and an adjusting nut connected to the end of the push-pull rod; The push-pull clamp assembly is fixedly mounted on the bottom plate via the base; The push plate is fixed on the push-pull rod through the adjusting nut; The plurality of probes include: a plurality of first probes and two second probes, wherein the diameter of the first probes is larger than that of the second probes; the plurality of first probes are arranged in pairs perpendicular to the push plate in a vertical direction, and the second probes are respectively located above a pair of the first probes, and the second probes are arranged on the push plate at a preset angle to the plane where the push plate is located; The power module to be tested is used to be fixed on the base plate, and the push-pull clamp assembly pushes the push plate to drive the first probe and the second probe to move toward the power module to be tested, so that the first probe is inserted into the tubular interface of the power module to be tested and abuts against the inner wall of the tubular interface and the second probe abuts against the wedge-shaped cross-section of the tubular interface.
2. The test fixture according to claim 1, characterized in that: The angle between the projections of the first probe and the second probe on the plane perpendicular to the vertical direction of the push plate is 0-30°.
3. The test fixture according to claim 2, characterized in that: The angle between the projections of the first probe and the second probe on the plane perpendicular to the vertical direction of the push plate is 10 to 30 degrees.
4. The test fixture according to claim 3, characterized in that: The angle between the projections of the first probe and the second probe on the plane perpendicular to the vertical direction of the push plate is 20°.
5. The test fixture according to claim 1, characterized in that: The first probe and the second probe are spring probes; a length of the first probe extending out of the push plate is greater than a length of the second probe extending out of the push plate.
6. The test fixture according to claim 5, characterized in that: The tail fixing heads of the first probe and the second probe are 1 mm; The needle tip of the first probe is 5 mm, the spring travel of the first probe is 8 mm, and the spring collapse of the first probe is 4 mm; the spring collapse of the second probe is 7 mm.
7. The test fixture according to claim 5, characterized in that: The first probes extend out of the push plate to the same length, and the extension length is 14 mm; the two second probes extend out of the push plate to the same length, and the extension length is between 12 mm and 14 mm.
8. The test fixture according to any one of claims 1 to 7, characterized in that: The bottom plate is provided with at least one pair of positioning pins which are perpendicular to the bottom plate in a vertical direction, and the tested power module is fixed to the bottom plate through the positioning pins.
9. The test fixture according to any one of claims 1 to 7, characterized in that: The test fixture also includes: two sliders and two slide bars; The two sliders are arranged away from the push plate and the tested power module and fixed on the bottom plate, the two slide bars respectively penetrate the sliders and one end of the two slide bars is respectively fixed on the push plate; When the push-pull clamp assembly pushes and pulls the push plate, the two slide bars are movably provided with the slide block so that the force on the push plate is balanced.
10. A power module testing system, characterized in that: include: A power module to be tested, a test circuit, and a test fixture for the power module as claimed in any one of claims 1 to 9; Wherein, the tested power module is fixed on the base plate; and the test circuit is electrically connected to a plurality of the probes.
Citation Information
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