Chip high-voltage test equipment

Abstract

The utility model relates to the technical field of chips, and discloses chip high-voltage test equipment, which comprises a test equipment body, and the test equipment body comprises a box body. According to the chip high-voltage test equipment, a pull ring II is pulled forwards by hand holding, then an insertion rod is driven to move forwards, then the insertion rod is separated from an inner cavity of a limiting plate, then a pull rod is pulled upwards or downwards by hand holding, then the limiting plate is driven to move, then the pull ring II is pulled upwards by hand holding, and then the pull ring II is loosened after a specified position is reached; an inserting rod is inserted into an inner cavity of a limiting plate under the action of a second spring, then when a circular plate moves downwards, the effect that the circular plate in the moving process is limited through a first spring is achieved, and the problem that in the using process of existing high-voltage testing equipment, due to the fact that the thicknesses of chips needing to be tested are different, the testing efficiency is high can be solved. And the surface of the chip is easily damaged.

Description

Technical Field

[0001] The utility model relates to the technical field of chips, in particular to a chip high-voltage testing device. Background Art

[0002] An integrated circuit, also known as a microcircuit, microchip, or chip in electronics, is a way of miniaturizing circuits and is often manufactured on the surface of a semiconductor wafer.

[0003] The prior art publication number is CN 215575512 U, which is a multi-chip multi-function high-voltage testing equipment. This patented technology can provide a high-voltage, three-temperature and rotating testing environment, satisfying multi-chip multi-function testing at one time, greatly improving detection efficiency and reducing labor intensity.

[0004] At present, with the development of science and technology, the use of chips in the fields of communications, computers, automotive electronics, industrial automation, medical electronics and home appliances is extremely common, which can improve the degree of intelligence and improve equipment efficiency. In chip manufacturing, high-voltage testing equipment is often required to facilitate operators to test the performance of the chip. However, during the use of existing high-voltage testing equipment, since the thickness of the chips to be tested are different, when testing thicker chips, it is very easy to cause the test needle to over-insert the chip, and then it is very easy to damage the surface of the chip, which in turn affects the subsequent use of the chip. Therefore, improvements are proposed to the high-voltage testing equipment.

[0005] In order to solve the above problems, we have made improvements and proposed a chip high voltage testing equipment. Utility Model Content

[0006] The purpose of the utility model is to provide a chip high voltage testing device to solve the problems raised in the above background technology.

[0007] In order to achieve the above purpose, the utility model provides the following technical solutions:

[0008] A chip high-voltage test device comprises a test device body, wherein the test device body comprises a box body, a top groove is formed at the top of the inner cavity of the box body, a bottom groove is formed at the bottom of the inner cavity of the box body, a cylinder is fixedly connected to the top of the inner cavity of the top groove, a test board is fixedly connected to the output end of the cylinder, a test pin is fixedly connected to the bottom of the test board, and the number of the test pins is plural, and both sides of the inner cavity of the top groove are installed with a limit mechanism;

[0009] The limiting mechanism includes an outer column, the top and bottom of the outer column are fixedly connected to the inner cavity of the top groove, the top of the inner cavity of the outer column is movably connected with a circular plate, the inner side of the circular plate is fixedly connected with a connecting rod, the inner side of the connecting rod is fixedly connected to both sides of the test plate, the bottom of the circular plate is fixedly connected with a spring 1, the bottom of the spring 1 is fixedly connected with a limiting plate, the outer side of the limiting plate is fixedly connected with a pull rod, the outer side of the pull rod extends to the outer side of the outer column, and the inner cavity of the limiting plate is plugged with an insertion rod.

[0010] As a further solution of the utility model: a positioning plate is installed on the front side of the outer column, the front side of the insertion rod penetrates to the front side of the positioning plate and is fixedly connected with a round block, the front side of the round block is fixedly connected with a pull ring 2, and the pull ring 2 is arranged in a ring structure, the surface of the insertion rod is fixedly connected with an outer plate 1, the surface of the outer plate 1 is movably connected to the inner cavity of the positioning plate, the surface of the insertion rod is sleeved with a spring 2, the front side of the spring 2 is fixedly connected to the back side of the round block, and the back side of the spring 2 is fixedly connected to the inner cavity of the outer plate 1.

[0011] As a further solution of the utility model: sliding grooves are opened on both sides of the inner cavity of the positioning plate, the inner and outer sides of the outer plate are fixedly connected with sliders, the surface of the slider is movably connected to the inner cavity of the sliding groove, the four corners of the inner cavity of the positioning plate are movably connected with mounting rods, and the back side of the positioning plate is fixedly connected to the front side of the outer column through the mounting rods.

[0012] As a further solution of the utility model: a power supply box is fixedly connected to the left side of the inner cavity of the bottom groove, a data processing box is fixedly connected to the right side of the power supply box, the back side of the top of the power supply box is connected to data line 1, the back side of the top of the data processing box is connected to data line 2, both data line 1 and data line 2 pass through the inner cavity of the top groove and are connected to the left side of the top of the test board, and protective covers are fixedly connected to the surfaces of data line 1 and data line 2.

[0013] As a further solution of the utility model: both sides of the front side of the top groove are movably connected to glass doors through hinges, the inner side of the front side of the glass door is fixedly connected to a connecting plate, the front side of the connecting plate is fixedly connected to a pull ring 1, and the pull ring 1 is arranged in an annular structure, both sides of the front side of the bottom groove are movably connected to box doors through hinges, and the inner side of the front side of the box door is provided with a pull groove.

[0014] As a further solution of the utility model: the four corners of the bottom of the box body are fixedly connected with support columns, the bottom of the support columns are fixedly connected with anti-skid pads, and the anti-skid pads are arranged in a circular structure.

[0015] As a further solution of the utility model: a fixing mechanism is installed at the bottom of the inner cavity of the top groove, and the fixing mechanism includes a bottom plate, the bottom of the bottom plate is fixedly connected to the bottom of the inner cavity of the top groove, a chip body is installed on the top of the bottom plate, both sides of the front side of the top of the bottom plate are fixedly connected to shell 1, both sides of the back side of the top of the bottom plate are fixedly connected to shell 2, the inner cavity of shell 2 is movably connected with a screw, the bottom of the screw is movably connected to the top of the bottom plate, the surface of the screw is threadedly connected with a screw sleeve, the surface of the screw sleeve is fixedly connected to outer plate 2, the front side of the outer plate 2 is fixedly connected with a pressure rod, the front side of the pressure rod penetrates to the front side of shell 2, and the bottom of the pressure rod is movably connected to both sides of the top of the chip body.

[0016] As a further solution of the utility model: the top of the screw rod passes through the top of the shell two and is fixedly connected to a rotating plate, the front side of the pressure rod is fixedly connected to a guide sleeve, the surface of the guide sleeve is movably connected to the inner cavity of the shell one, the inner cavity of the guide sleeve is movably connected to a guide column, and the top and bottom of the guide column are fixedly connected to the inner cavity of the shell one.

[0017] Compared with the prior art, the beneficial effects of the utility model are:

[0018] 1. The utility model pulls the pull ring 2 toward the front side by hand, and the movement of the pull ring 2 drives the round block to move, and then drives the insertion rod to move toward the front side, and then makes the insertion rod detach from the inner cavity of the limit plate, and then the hand pulls the pull rod upward or downward, and then drives the limit plate to move, and then the hand pulls the pull ring 2 upward, and drives the round block to move through the movement of the pull ring 2, and then drives the insertion rod to move, and then drives the outer plate 1 to move, and then releases the pull ring 2 after reaching the specified position, and then under the action of the spring 2, the insertion rod is inserted into the inner cavity of the limit plate, and then when the circular plate moves downward, the circular plate is limited by the spring pair during the movement process, which can solve the problem that the existing high-voltage test equipment has the following problems in use: since the thickness of the chips to be tested are different, when testing thicker chips, it is very easy to cause the test needle to be over-inserted into the chip, and then it is very easy to damage the surface of the chip, which further affects the use effect of the subsequent chips.

[0019] 2. The utility model achieves the effect of connecting the pull ring 2 and the plug rod in the working state through the setting of the round block. The setting of the pull ring 2 makes it easier for the operator to move the round block, thereby achieving the effect of plugging and fixing the limit plates in different positions. Through the setting of the spring 2, when the pull ring 2 moves, the round block will be driven to move, thereby absorbing the generated force. Further, when the pull ring 2 loses its force, the round block will return to its original position, thereby achieving the effect of plugging and fixing the limit plate. Through the setting of the power supply box, the test board and the test needle in the working state can be powered. Through the setting of the data processing box, the structure after the test needle is detected can be collected and analyzed. Through the setting of the protective cover and the data line 2, the test board can be powered, and the data of the test board can be collected and transmitted to the data processing box through the data line 2. Through the setting of the protective cover, the data line 1 and the data line 2 in the working state can be protected. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] Figure 1 It is a structural schematic diagram of a chip high voltage testing device;

[0021] Figure 2 This is a schematic diagram of the structural connection of a power supply box in a chip high-voltage test device;

[0022] Figure 3 This is a schematic diagram of the structural connection of a pressure rod in a chip high-voltage test device;

[0023] Figure 4 It is a cross-sectional view of a housing 1 and a housing 2 in a chip high voltage testing device;

[0024] Figure 5 This is a schematic diagram of the structural connection of a protective cover in a chip high voltage testing device;

[0025] Figure 6 This is a schematic diagram of the structural connection of a test needle in a chip high voltage test device;

[0026] Figure 7 A cross-sectional view of an outer column in a chip high voltage testing device;

[0027] Figure 8 The figure is a schematic diagram of the structural connection of a plug-in rod in a chip high-voltage testing device.

[0028] In the figure: 1. Test equipment body; 101. Box body; 102. Glass door; 103. Connecting plate; 104. Pull ring 1; 105. Box door; 106. Pull groove; 107. Support column; 108. Anti-skid pad; 109. Top groove; 110. Bottom groove; 111. Power supply box; 112. Data processing box; 113. Cylinder; 114. Protective cover; 115. Data line 1; 116. Data line 2; 117. Test board; 118. Test needle; 2. Limiting mechanism; 201. Outer column; 202. Positioning plate; 203. Connecting Rod; 204, round plate; 205, spring one; 206, limit plate; 207, pull ring two; 208, round block; 209, slide groove; 210, mounting rod; 211, slider; 212, outer plate one; 213, pull rod; 214, plug rod; 215, spring two; 3, fixing mechanism; 301, bottom plate; 302, outer shell one; 303, pressure rod; 304, rotating plate; 305, outer shell two; 306, chip body; 307, guide column; 308, guide sleeve; 309, outer plate two; 310, screw sleeve; 311, screw. DETAILED DESCRIPTION

[0029] In order to make the purpose, technical solution and advantages of the implementation mode of the utility model clearer, the technical solution in the implementation mode of the utility model will be clearly and completely described below in conjunction with the drawings in the implementation mode of the utility model. Obviously, the implementation mode described is a part of the implementation mode of the utility model, not all the implementation modes. Based on the implementation mode of the utility model, all other implementation modes obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0030] Example

[0031] See also Figure 1 , 2 , 5, 6, 7 and 8, a chip high-voltage test device, comprising a test device body 1, the test device body 1 comprising a box body 101, a top groove 109 is provided at the top of the inner cavity of the box body 101, a bottom groove 110 is provided at the bottom of the inner cavity of the box body 101, a cylinder 113 is fixedly connected to the top of the inner cavity of the top groove 109, a test board 117 is fixedly connected to the output end of the cylinder 113, a test pin 118 is fixedly connected to the bottom of the test board 117, and the number of the test pins 118 is multiple, and both sides of the inner cavity of the top groove 109 are installed with a limit mechanism 2;

[0032] The limiting mechanism 2 includes an outer column 201, the top and bottom of the outer column 201 are fixedly connected to the inner cavity of the top groove 109, the top of the inner cavity of the outer column 201 is movably connected to a circular plate 204, the inner side of the circular plate 204 is fixedly connected to a connecting rod 203, the inner side of the connecting rod 203 is fixedly connected to both sides of the test plate 117, the bottom of the circular plate 204 is fixedly connected to a spring 205, the bottom of the spring 205 is fixedly connected to a limiting plate 206, the outer side of the limiting plate 206 is fixedly connected to a pull rod 213, the outer side of the pull rod 213 passes through the outer side of the outer column 201, and the inner cavity of the limiting plate 206 is plugged with a plug rod 214. The main innovative mechanism is classified together

[0033] A positioning plate 202 is installed on the front side of the outer column 201, and the front side of the insertion rod 214 passes through the front side of the positioning plate 202 and is fixedly connected with a round block 208. The front side of the round block 208 is fixedly connected with a pull ring 207, and the pull ring 207 is arranged in an annular structure. The surface of the insertion rod 214 is fixedly connected with the outer plate 1 212, and the surface of the outer plate 1 212 is movably connected to the inner cavity of the positioning plate 202. The surface of the insertion rod 214 is sleeved with a spring 215, and the front side of the spring 215 is fixedly connected to the back side of the round block 208, and the back side of the spring 215 is fixedly connected to the inner cavity of the outer plate 1 212. Through the arrangement of the round block 208, the pull ring 207 and the insertion rod 214 in the working state are connected. Through the arrangement of the pull ring 207, it is more convenient for the operator to move the round block 208, and then the limit plate 206 in different positions is plugged and fixed. Through the arrangement of the spring 215, when the pull ring 2 When the pull ring 207 moves, it will drive the round block 208 to move, thereby absorbing the energy of the generated force. Further, when the pull ring 207 loses its force, the round block 208 will return to its original position, thereby achieving the effect of plugging and fixing the limit plate 206. Slide grooves 209 are provided on both sides of the inner cavity of the positioning plate 202, and the inner and outer sides of the outer plate 212 are fixedly connected with sliders 211. The surface of the slider 211 is movably connected to the inner cavity of the slide groove 209, and the four corners of the inner cavity of the positioning plate 202 are movably connected with mounting rods 210. The back side of the positioning plate 202 is fixedly connected to the front side of the outer column 201 through the mounting rod 210. Through the setting of the slide groove 209, the outer plate 212 during the movement is guided and limited, thereby avoiding the phenomenon of deviation and falling off of the outer plate 212 during the movement. Through the setting of the mounting rod 210, the positioning plate 202 in the working state is installed and fixed.

[0034] The left side of the inner cavity of the bottom groove 110 is fixedly connected with a power supply box 111, the right side of the power supply box 111 is fixedly connected with a data processing box 112, the back side of the top of the power supply box 111 is connected with a data line 115, the back side of the top of the data processing box 112 is connected with a data line 2 116, the data line 115 and the data line 2 116 are both passed through the inner cavity of the top groove 109 and connected to the left side of the top of the test board 117, and the surfaces of the data line 115 and the data line 2 116 are fixedly connected with a protective cover 114. By setting the power supply box 111, the work is protected. The function of powering the test board 117 and the test needle 118 in the working state is achieved through the setting of the data processing box 112, and the effect of collecting and analyzing the structure after the test needle 118 is detected is achieved. The function of powering the test board 117 is achieved through the setting of the protective cover 114 and the data line 116, and the data of the test board 117 is collected and transmitted to the data processing box 112 through the data line 116. The effect of protecting the data line 1 15 and the data line 2 116 in the working state is achieved through the setting of the protective cover 114.

[0035] Both sides of the front side of the top groove 109 are movably connected to the glass door 102 through hinges, the inner side of the front side of the glass door 102 is fixedly connected to a connecting plate 103, the front side of the connecting plate 103 is fixedly connected to a pull ring 104, the pull ring 104 is arranged in an annular structure, both sides of the front side of the bottom groove 110 are movably connected to the box door 105 through hinges, the inner side of the front side of the box door 105 is provided with a pull groove 106, through the arrangement of the glass door 102 and the box door 105, the box in the working state can be controlled. The box body 101 is protected to prevent other factors from interfering with the working results inside the box body 101. The setting of the pull groove 106 and the pull ring 104 makes it easier for operators to pull the box door 105 and the glass door 102. The setting of the connecting plate 103 realizes the connection between the glass door 102 and the pull ring 104. The four corners of the bottom of the box body 101 are fixedly connected with support columns 107, and the bottom of the support column 107 is fixedly connected with an anti-slip pad 108. The anti-skid pad 108 is arranged in a circular structure. The support column 107 is arranged to support and fix the box body 101 during the working process. The anti-skid pad 108 is arranged to prevent the box body 101 from slipping in the working state, and the box body 101 is prevented from deviating during the working process. The top of the screw rod 311 passes through the top of the second shell 305 and is fixedly connected to the rotating plate 304. The front side of the pressure rod 303 is fixedly connected to the guide sleeve 308. The surface of the guide sleeve 308 is movably connected to the inner cavity of the first shell 302. The inner cavity of the guide sleeve 308 is movably connected to the guide column 307. The top and bottom of the guide column 307 are fixedly connected to the inner cavity of the first shell 302. The rotating plate 304 is arranged to make it easier for the operator to rotate the screw rod 311. The guide column 307 is arranged to support and guide the pressure rod 303 during the movement, and the pressure rod 303 is prevented from deviating and falling off during the movement.

[0036] See also Figure 2 , 34. A chip high-voltage testing device, wherein a fixing mechanism 3 is installed at the bottom of the inner cavity of the top groove 109, and the fixing mechanism 3 includes a bottom plate 301, the bottom of the bottom plate 301 is fixedly connected to the bottom of the inner cavity of the top groove 109, a chip body 306 is installed on the top of the bottom plate 301, both sides of the front side of the top of the bottom plate 301 are fixedly connected to the shell 1 302, both sides of the back side of the top of the bottom plate 301 are fixedly connected to the shell 2 305, the inner cavity of the shell 2 305 is movably connected to a screw rod 311, the bottom of the screw rod 311 is movably connected to the top of the bottom plate 301, the surface of the screw rod 311 is threadedly connected to a screw sleeve 310, the surface of the screw sleeve 310 is fixedly connected to an outer plate 2 309, and the front side of the outer plate 2 309 is fixedly connected to the outer plate 2 A pressure rod 303 is connected, and the front side of the pressure rod 303 passes through the front side of the outer shell 2 305. The bottom of the pressure rod 303 is movably connected to the two sides of the top of the chip body 306. The chip body 306 is placed on the top of the bottom plate 301 by hand, and then the rotating plate 304 is rotated by hand. The rotation of the rotating plate 304 drives the screw rod 311 to rotate, and then drives the screw sleeve 310 to move, and then drives the outer plate 2 309 to move, and then drives the pressure rod 303 to move, and then drives the guide sleeve 308 to slide on the surface of the guide column 307, and then makes the bottom of the pressure rod 303 fit the surface of the chip body 306, thereby achieving the effect of clamping and fixing the chip body 306 in the working detection state.

[0037] The working principle of the utility model is as follows: first, the pull ring 104 is pulled forward by hand, and the movement of the pull ring 104 drives the connecting plate 103 to move, and then drives the glass door 102 to move, so that the box body 101 is in an opened state, and then the chip body 306 is placed on the top of the bottom plate 301 by hand, and then the rotating plate 304 is rotated by hand, and the screw rod 311 is rotated by the rotation of the rotating plate 304, and then the screw sleeve 310 is moved, and then the outer plate 2 309 is moved, and then the pressure rod 303 is moved, and then the guide sleeve 308 is driven to slide on the surface of the guide column 307, and then the bottom of the pressure rod 303 is attached to the chip body 306. , thereby achieving the effect of clamping and fixing the chip body 306 in the working detection state, and then pulling the pull ring 207 to the front side by hand, and the movement of the pull ring 207 drives the round block 208 to move, and then drives the insertion rod 214 to move to the front side, and then makes the insertion rod 214 separate from the inner cavity of the limiting plate 206, and then the hand pulls the pull rod 213 upward or downward, and then drives the limiting plate 206 to move, and then pulls the pull ring 207 upward by hand, and drives the round block 208 to move through the movement of the pull ring 207, and then drives the insertion rod 214 to move, and then drives the outer plate 1 212 to move, and then releases the pull ring 207 after reaching the specified position, and then in Under the action of spring 215, the insertion rod 214 is inserted into the inner cavity of the limiting plate 206. Then, when the circular plate 204 moves downward, the spring 1 205 is used to limit the circular plate 204 during the movement. Finally, the power supply inside the power supply box 111 is transmitted to the inside of the test plate 117 through the data line 115, and then transmitted to the test needle 118. Then the cylinder 113 is started, and the test plate 117 is driven to move downward through the work of the cylinder 113, and then the test needle 118 is driven to move, and then the connecting rod 203 is driven to move, and then the circular plate 204 is driven to slide in the inner cavity of the outer column 201, and then the spring 1 205 is compressed. Then, when the spring 1 20 When the compression reaches a certain value, the position of the circular plate 204 is limited, and then the positions of the test board 117 and the test needle 118 are limited. After the detection is completed, the detected data is transmitted to the inner cavity of the data processing box 112 through the data line 116, and then the data processing box 112 processes the transmitted data. Then, the operator can pull the groove 106 to the front side by hand, and the movement of the groove 106 drives the box door 105 to move, and then the bottom of the inner cavity of the box body 101 is opened. Then the operator can collect the processed data inside the data processing box 112, and then complete the high-voltage detection process of the chip by the staff.

[0038] What is described above is only a preferred specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes within the technical scope disclosed by the present invention according to the technical scheme and the utility model concept of the present invention, which should be covered by the protection scope of the present invention.

Claims

1. A chip high voltage test device, comprising a test device body (1), characterized in that: The test device body (1) comprises a box (101), a top groove (109) is provided at the top of the inner cavity of the box (101), a bottom groove (110) is provided at the bottom of the inner cavity of the box (101), a cylinder (113) is fixedly connected to the top of the inner cavity of the top groove (109), a test board (117) is fixedly connected to the output end of the cylinder (113), a test pin (118) is fixedly connected to the bottom of the test board (117), a plurality of test pins (118) are provided, and limiting mechanisms (2) are installed on both sides of the inner cavity of the top groove (109); The limiting mechanism (2) comprises an outer column (201), the top and bottom of the outer column (201) are fixedly connected to the inner cavity of the top groove (109), the top of the inner cavity of the outer column (201) is movably connected to a circular plate (204), the inner side of the circular plate (204) is fixedly connected to a connecting rod (203), the inner side of the connecting rod (203) is fixedly connected to two sides of the test plate (117), the bottom of the circular plate (204) is fixedly connected to a spring 1 (205), the bottom of the spring 1 (205) is fixedly connected to a limiting plate (206), the outer side of the limiting plate (206) is fixedly connected to a pull rod (213), the outer side of the pull rod (213) passes through the outer side of the outer column (201), and the inner cavity of the limiting plate (206) is plugged with an insertion rod (214).

2. A chip high voltage test device according to claim 1, characterized in that: A positioning plate (202) is installed on the front side of the outer column (201), the front side of the insertion rod (214) penetrates to the front side of the positioning plate (202) and is fixedly connected to a round block (208), the front side of the round block (208) is fixedly connected to a pull ring 2 (207), and the pull ring 2 (207) is arranged in a ring structure, the surface of the insertion rod (214) is fixedly connected to an outer plate 1 (212), the surface of the outer plate 1 (212) is movably connected to the inner cavity of the positioning plate (202), the surface of the insertion rod (214) is sleeved with a spring 2 (215), the front side of the spring 2 (215) is fixedly connected to the back side of the round block (208), and the back side of the spring 2 (215) is fixedly connected to the inner cavity of the outer plate 1 (212).

3. A chip high voltage testing device according to claim 2, characterized in that: Slide grooves (209) are provided on both sides of the inner cavity of the positioning plate (202), and sliders (211) are fixedly connected to the inner and outer sides of the outer plate (212). The surface of the slider (211) is movably connected to the inner cavity of the slide groove (209), and the four corners of the inner cavity of the positioning plate (202) are movably connected to mounting rods (210). The back side of the positioning plate (202) is fixedly connected to the front side of the outer column (201) through the mounting rods (210).

4. The chip high voltage testing device according to claim 1, characterized in that: A power supply box (111) is fixedly connected to the left side of the inner cavity of the bottom groove (110), a data processing box (112) is fixedly connected to the right side of the power supply box (111), a data line 1 (115) is connected to the back side of the top of the power supply box (111), a data line 2 (116) is connected to the back side of the top of the data processing box (112), both the data line 1 (115) and the data line 2 (116) pass through the inner cavity of the top groove (109) and are connected to the left side of the top of the test board (117), and protective covers (114) are fixedly connected to the surfaces of the data line 1 (115) and the data line 2 (116).

5. The chip high voltage testing device according to claim 1, characterized in that: Both sides of the front side of the top groove (109) are movably connected to the glass door (102) through hinges, the inner side of the front side of the glass door (102) is fixedly connected to a connecting plate (103), the front side of the connecting plate (103) is fixedly connected to a pull ring (104), and the pull ring (104) is arranged in an annular structure, and both sides of the front side of the bottom groove (110) are movably connected to the box door (105) through hinges, and the inner side of the front side of the box door (105) is provided with a pull groove (106).

6. The chip high voltage testing device according to claim 1, characterized in that: The four corners of the bottom of the box body (101) are fixedly connected to support columns (107), and the bottom of the support column (107) is fixedly connected to an anti-skid pad (108), and the anti-skid pad (108) is arranged in a circular structure.

7. The chip high voltage testing device according to claim 1, characterized in that: A fixing mechanism (3) is installed at the bottom of the inner cavity of the top groove (109), and the fixing mechanism (3) includes a bottom plate (301), the bottom of the bottom plate (301) is fixedly connected to the bottom of the inner cavity of the top groove (109), a chip body (306) is installed on the top of the bottom plate (301), both sides of the front side of the top of the bottom plate (301) are fixedly connected to the shell 1 (302), and both sides of the back side of the top of the bottom plate (301) are fixedly connected to the shell 2 (305), and the inner cavity of the shell 2 (305) is movable. The chip body (306) is movably connected to a screw rod (311), the bottom of the screw rod (311) is movably connected to the top of the bottom plate (301), the surface of the screw rod (311) is threadedly connected to a screw sleeve (310), the surface of the screw sleeve (310) is fixedly connected to an outer plate 2 (309), the front side of the outer plate 2 (309) is fixedly connected to a pressure rod (303), the front side of the pressure rod (303) passes through the front side of the outer shell 2 (305), and the bottom of the pressure rod (303) is movably connected to both sides of the top of the chip body (306).

8. The chip high voltage testing device according to claim 7, characterized in that: The top of the screw rod (311) passes through the top of the second shell (305) and is fixedly connected to the rotating plate (304); the front side of the pressure rod (303) is fixedly connected to a guide sleeve (308); the surface of the guide sleeve (308) is movably connected to the inner cavity of the first shell (302); the inner cavity of the guide sleeve (308) is movably connected to a guide column (307); the top and bottom of the guide column (307) are both fixedly connected to the inner cavity of the first shell (302).

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