Aging test circuit and device

Abstract

The utility model provides an aging test circuit and device, the aging test circuit comprises a first boost module, a second boost module, an inversion module and an electric energy supplement module, the first boost module, the second boost module and the inversion module are connected in sequence, and the first boost module is also connected with a power adapter. The inversion module is also connected with the electric energy supplementing module and the power adapter; the first boosting module is used for boosting the first voltage output by the power adapter and outputting direct-current low voltage after boosting; the second boosting module is used for acquiring the direct-current low voltage output by the first boosting module and boosting the direct-current low voltage into direct-current high voltage; the electric energy supplement module is connected with the power grid and used for converting the power grid voltage into supplement electric energy and outputting the supplement electric energy to the inversion module in an isolated mode; and the inversion module is used for combining the supplementary electric energy generated by the electric energy supplementing module and the direct-current high voltage generated by the second boosting module and then inverting the combined electric energy into alternating-current voltage, and the alternating-current voltage is used for supplying power to the power adapter.

Description

Technical Field

[0001] The present application belongs to the technical field of aging test, and specifically relates to an aging test circuit and device. Background Art

[0002] At present, in the existing aging test devices, aging tests are generally performed directly on the power adapter. In this way, electrical energy is converted into heat energy during the aging test, and the heat energy is transferred to the air through heat conduction and radiation. In this way, the electrical energy cannot be recycled. The aging test is often a long-term continuous test, which causes a huge waste of energy. Utility Model Content

[0003] The present application provides an aging test circuit and device to reduce energy consumption.

[0004] In a first aspect, the present application provides an aging test circuit, comprising a first boost module, a second boost module, an inverter module and an electric energy supplement module, wherein the input end of the first boost module is connected to the output end of a power adapter, the output end of the first boost module is connected to the input end of the second boost module, the input end of the inverter module is respectively connected to the output end of the electric energy supplement module and the output end of the second boost module, and the output end of the inverter module is connected to the input end of the power adapter:

[0005] The first boost module is used to boost the first voltage output by the power adapter to output a DC low voltage;

[0006] The second boost module is used to obtain the DC low voltage output by the first boost module, and boost the DC low voltage to a DC high voltage;

[0007] The electric energy supplement module is connected to the power grid, and is used to convert the power grid voltage into supplementary electric energy, and output the supplementary electric energy to the inverter module in isolation;

[0008] The inverter module is used to combine the supplementary electric energy generated by the electric energy supplement module and the DC high voltage generated by the second boost module and invert them into an AC voltage, and the AC voltage is used to power the power adapter.

[0009] In a second aspect, the present application provides an aging test device, comprising the aging test circuit as described in the first aspect.

[0010] It can be seen that in the present application, the first voltage output by the power adapter is firstly boosted by the first boost module to output a DC low voltage; the DC low voltage output by the first boost module is then obtained by the second boost module, and the DC low voltage is boosted to a DC high voltage; the power supply module then converts the grid voltage into supplementary power, and outputs the supplementary power to the inverter module in isolation; finally, the inverter module combines the supplementary power generated by the power supply module and the DC high voltage generated by the second boost module and inverts them into an AC voltage, which is used to power the power adapter. In this way, the power output by the power adapter is recollected, and after boosting and voltage compensation, the power adapter is powered again, so that part of the power of the power adapter can be recycled, reducing the energy consumption of the aging test. BRIEF DESCRIPTION OF THE DRAWINGS

[0011] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0012] Figure 1a It is a structural schematic diagram of a first aging test circuit provided in an embodiment of the present application;

[0013] Figure 1b It is a structural schematic diagram of the power supplement module and the second boost module provided in the embodiment of the present application cooperating to supply power to the inverter module;

[0014] Figure 2 is a structural schematic diagram of a second aging test circuit provided in an embodiment of the present application;

[0015] Figure 3 is a structural schematic diagram of a third aging test circuit provided in an embodiment of the present application;

[0016] Figure 4 is a structural schematic diagram of a first boost module provided in an embodiment of the present application;

[0017] Figure 5 is a circuit diagram of a current control unit provided in an embodiment of the present application;

[0018] Figure 6 is a circuit diagram of a voltage control unit provided in an embodiment of the present application;

[0019] Figure 7 is a circuit diagram of a driving unit provided in an embodiment of the present application;

[0020] Figure 8is a circuit diagram of a power unit provided in an embodiment of the present application;

[0021] Fig. 9 is a circuit diagram of an aging test device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0022] In order to enable those skilled in the art to better understand the solution of the present application, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0023] The terms "first", "second", etc. in the specification and claims of this application and the above-mentioned drawings are used to distinguish different objects, rather than to describe a specific order. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device that includes a series of steps or units is not limited to the listed steps or units, but optionally includes steps or units that are not listed, or optionally includes other steps or units inherent to these processes, methods, systems, products or devices.

[0024] Reference to "embodiments" herein means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0025] The following is an introduction to the relevant terms involved in this application.

[0026] USB-PD fast charging, also known as USB Power Delivery, is a fast charging specification developed by the USB-IF (USB Implementers Forum) organization and is one of the mainstream fast charging protocols.

[0027] At present, with the popularity of mobile devices such as smart phones and tablets, and consumers' increasing requirements for charging speed and charging experience, the PD fast charging industry has emerged. The emergence of fast charging technology has greatly improved the charging speed, which has also made the charging adapter develop in the direction of higher voltage and higher power. At the same time, it needs to be compatible with multiple charging protocol standards. In addition, the output connection port of the adapter has also developed from a single port output to multiple ports output. Therefore, new requirements are put forward for the supporting industries of the adapter industry and the test aging power supply industry.

[0028] As the basic equipment in the PD fast charging and adapter industry, the existing aging test equipment in the industry directly converts the electric energy consumed during the aging test into heat energy. This is because the industry mostly uses power resistors or electronic loads to age the adapters, which is a continuation of the previous equipment. This is due to the development of the industry and the investment of upstream companies. In this aging method, the heat energy consumed during the aging process is transferred to the air through heat conduction and radiation, and the heat cannot be recycled, which leads to a serious waste of energy, but the company pays a large cost for it.

[0029] To solve the above problems, an embodiment of the present application provides an aging test circuit and device. The aging test circuit and device can be applied to the scenario of aging test on the fast charging adapter. The first voltage output by the power adapter can be boosted by the first boost module, and a DC low voltage can be output after boosting; the DC low voltage output by the first boost module is then obtained by the second boost module, and the DC low voltage is boosted to a DC high voltage; then the power supply module converts the grid voltage into a supplementary voltage, and outputs the supplementary voltage to the inverter module in isolation; finally, the inverter module inverts the DC high voltage into an AC voltage, and generates a power supply voltage based on the AC voltage and the supplementary voltage, and the power supply voltage is used to power the power adapter. In this way, the electric energy output by the power adapter is collected, and the power adapter is powered again after boosting and inversion, so that most of the electric energy consumed by the power adapter due to aging can be recycled and reused, reducing the energy consumption of the aging test. This solution can also be applied to a variety of scenarios, including but not limited to the application scenarios mentioned above.

[0030] The specific aging test circuit and device are introduced in detail below.

[0031] See also Figure 1aThe present application provides an aging test circuit 10, comprising a first boost module 11, a second boost module 12, an inverter module 13 and an electric energy supplement module 14, wherein the input end of the first boost module 11 is connected to the output end of a power adapter 20, the output end of the first boost module 11 is connected to the input end of the second boost module 12, the input end of the inverter module 13 is respectively connected to the output end of the electric energy supplement module 14 and the output end of the second boost module 12, and the output end of the inverter module 13 is connected to the input end of the power adapter 20:

[0032] A first boost module 11, used for boosting the first voltage output by the power adapter 20 to output a DC low voltage;

[0033] The second boost module 12 is used to obtain the DC low voltage output by the first boost module 11 and boost the DC low voltage to a DC high voltage;

[0034] The electric energy supplement module 14 is connected to the power grid 30 and is used to convert the voltage of the power grid 30 into a supplementary voltage and output the supplementary voltage to the inverter module 13 in isolation;

[0035] The inverter module 13 is used to invert the DC high voltage into AC voltage, and then invert the DC high voltage generated by the power supply module 14 and the second boost module 12 into AC voltage after merging. The AC voltage is used to power the power adapter 20.

[0036] In the specific implementation, the aging test circuit 10 in this embodiment converts the AC voltage of the power grid 30 into supplementary power through the power supplement module 14 in the initial stage. The voltage of the supplementary power is about 400V. At this time, since the power supplement module 14 supplies power to the inverter module 13 alone, the output AC voltage of the inverter module supplies power to the power adapter 20; when the power adapter 20 is powered on and started, the corresponding first voltage is output, and the first boost module 11 boosts the first voltage to a DC low voltage, and then the second boost module 12 boosts the DC low voltage to a DC high voltage of about 400V. The DC high voltage of about 400V is slightly higher than the voltage of the supplementary power of the power supplement module 14 in the circuit setting, and then the inverter module 13 inverts the DC high voltage into an AC voltage, which is used as the power supply voltage of the power adapter, and the power supply voltage supplies power to the power adapter 20, so as to form an energy recovery loop, and recover part of the electric energy to participate in the power supply of the power adapter 20 again, and so on. The cycle is repeated, reducing the energy consumption of the aging test.

[0037] like Figure 1bAs shown, the function of the electric energy supplement module 14 in the circuit is to initially supply power to the power adapter 20 when the power is first turned on. When the voltage of the second boost module 12 arrives, since the second boost module 12 is set slightly higher than the output voltage of the electric energy supplement, the second boost module 12 supplies power to the inverter module 13. In this process, the energy of the second boost module 12 and the electric energy of the electric energy supplement module 14 are automatically balanced. When one is insufficient, the other will make up for it. The output voltage of the second boost module 12 is rectified by the third diode D3, and the electric energy supplement module is rectified by the fourth diode D4, so that the input voltages of the two modules are connected in parallel through the diodes to prevent backflow.

[0038] Furthermore, the electric energy supplement module 14 also has a power factor correction function, and can perform power factor correction according to the grid voltage and convert it into the supplementary DC voltage.

[0039] For example, the first boost module 11 can be a boot boost circuit, or other topological circuits with a boost function, etc., and the second boost module 12 is an isolated DC / DC boost circuit, which isolates the first boost module and the inverter module. The inverter circuit is a DC / AC inverter circuit, which is not limited here.

[0040] The electric energy supplement module 14 adopts an isolation topology, that is, it is connected to the power grid 30 through the primary end and then connected to the inverter module 13 through the secondary end. Energy is transmitted from the primary end to the secondary end in isolation to generate a corresponding supplementary voltage. The isolation topology can be transformer isolation or other methods, which are not limited here.

[0041] It can be seen that in the present application, the first voltage output by the power adapter 20 is firstly boosted by the first boost module 11 to output a DC low voltage; the DC low voltage output by the first boost module 11 is then obtained by the second boost module 12, and the DC low voltage is boosted to a DC high voltage; the power supply module 14 then converts the power of the power grid 30 into supplementary power, and outputs the supplementary power to the inverter module 13 in isolation; finally, the inverter module 13 combines the supplementary power generated by the power supply module 14 and the DC high voltage generated by the second boost module 12 and inverts them into an AC voltage, which is used to power the power adapter 20. In this way, the power output by the power adapter 20 is collected again, and the power adapter 20 is powered again after boosting and energy compensation, so that most of the power consumed by the aging of the power adapter 20 is recycled, reducing the energy consumption of the aging test.

[0042] In one possible embodiment, see Figure 2The aging test circuit 10 also includes: an input module 16, used to connect the first boost module with the power adapter 20, and trick the power adapter 20 into outputting a corresponding voltage to power the first boost module 11; an output module 15, used to monitor the output parameters of the inverter module 13, and control the output of the AC voltage to the power adapter 20 to power the power adapter 20.

[0043] The output parameters include but are not limited to monitoring the output voltage, output current, frequency, power, power factor, and ripple of the inverter module 13 .

[0044] In a specific implementation, the input module 16 processes the first voltage output by the power adapter 20 and acts as a fast charge deception module, deceiving the power adapter 20 to output a preset voltage to power the first boost module 11, so that the power adapter 20 can perform an aging test with a constant output. The output module 15 controls and monitors the power supply voltage output by the inverter module 13, and outputs it to the power supply end of the power adapter 20 to power the power adapter 20, thereby completing the construction of the aging loop and the energy recovery loop.

[0045] It can be seen that in this embodiment, functions such as voltage deception, cycle aging test and energy recovery are implemented, which reduces the power consumption of the fast charging power adapter 20 aging test.

[0046] In one possible embodiment, see Figure 3 The aging test circuit 10 further includes: an auxiliary power supply module 18, which is used to supply power to each module in the aging test circuit 10, such as outputting the required +12V and +3.3V voltages.

[0047] In one possible embodiment, please refer to Figure 3 The aging test circuit 10 also includes: an isolation communication module 17, connected to the host computer 40, used to receive the aging task and the aging parameters corresponding to the aging task issued by the host computer 40, and send the output parameters of the aging test circuit 10 to the host computer 40.

[0048] In the specific implementation, the isolated communication module 17 transmits the aging task and the aging parameters corresponding to the aging task (such as the set values ​​of the test voltage and current) sent by the host computer 40 to the aging test circuit 10. The aging test circuit 10 performs the corresponding aging test according to the aging task and the aging parameters, and uploads the output parameters and operating parameters obtained by the output module monitoring the inverter module in the aging test circuit 10 during the aging test to the host computer 40 to realize test monitoring.

[0049] It can be seen that in this embodiment, isolated transmission between the aging test circuit 10 and the host computer 40 is achieved, so that the aging test circuit 10 is electrically isolated from the host computer 40, thereby increasing the reliability of the system.

[0050] In one possible embodiment, see Figure 4 The first boost module 11 includes: a current sampling unit 111, used for performing current sampling to obtain a first sampling current; a current control unit 112, used for comparing the first sampling current with a reference current to obtain a first error signal; a driving unit 115, used for outputting a corresponding first control signal according to the first error signal; a power unit 116, used for adjusting the first current according to the first control signal to control the first current within a first preset range, wherein the first current is a current generated under the power supply of the first voltage.

[0051] For details, please refer to Figure 5 , the current control unit 112 includes a first resistor R1, a second resistor R2, a third resistor R3, a fourth resistor R4, a fifth resistor R5, a first capacitor C1, a second capacitor C2, a third capacitor C3, a fourth capacitor C4, a fifth capacitor C5, a sixth capacitor C6, a seventh capacitor C7, a first diode D1, a first operational amplifier U1A and a second operational amplifier U1B;

[0052] One end of the first resistor R1 is connected to the positive electrode of the first reference source U1, the other end of the first resistor R1 is connected to one end of the second resistor R2 and one end of the first capacitor C1, the other end of the second resistor R2 is connected to one end of the second capacitor C2 and the non-inverting input end of the first operational amplifier U1A, the other end of the first capacitor C1, the other end of the second capacitor C2 and the inverting input end of the first operational amplifier U1A are connected to the negative electrode of the first reference source U1 and grounded, the first power supply end of the first operational amplifier U1A is connected to the second voltage and connected to one end of the third capacitor C3, the second power supply end of the first operational amplifier U1A is connected to the third voltage and connected to one end of the fourth capacitor C4, the other end of the third capacitor C3 and the other end of the fourth capacitor C4 are both grounded, and the output end of the first operational amplifier U1A is connected to one end of the third resistor R3, The other end of the third resistor R3 is connected to the inverting input end of the second operational amplifier U1B and one end of the fifth capacitor C5, the other end of the fifth capacitor C5 is connected to one end of the fourth resistor R4, the non-inverting input end of the second operational amplifier U1B is connected to one end of the fifth resistor R5, the fifth resistor R5 is connected to the current sampling unit 111, the first power supply end of the second operational amplifier U1B is connected to the fourth voltage and connected to one end of the sixth capacitor C6, the second power supply end of the second operational amplifier U1B is connected to the fifth voltage and connected to one end of the seventh capacitor C7, the other end of the sixth capacitor C6 and the other end of the seventh capacitor C7 are both grounded, the output end of the second operational amplifier U1B is connected to the other end of the fourth resistor R4 and the cathode of the first diode D1, and the anode of the first diode D1 is connected to the driving unit 115 (for example Figure 5 The first diode D1 is connected to the compensation terminal COMP of the driving unit 115).

[0053] Furthermore, the first boost module 11 further includes: a voltage sampling unit 113, which is used to sample the first voltage to obtain a first sampled voltage; a voltage control unit 114, which is used to compare the first sampled voltage with a reference voltage to obtain a second error signal; the driving unit 115, which is also used to output a corresponding second control signal according to the second error signal; and the power unit 116, which is also used to adjust the first voltage according to the second control signal to control the first voltage within a second preset range. For details, please refer to Figure 6, the voltage control unit 114 includes a sixth resistor R6, a seventh resistor R7, an eighth resistor R8, a ninth resistor R9, an eighth capacitor C8, a ninth capacitor C9, a tenth capacitor C10, a second diode D2, a third operational amplifier U2A and a fourth operational amplifier U2B; one end of the sixth resistor R6 is connected to the positive electrode of the second reference source U2, the other end of the sixth resistor R6 is connected to one end of the seventh resistor R7 and one end of the eighth capacitor C8, the other end of the seventh resistor R7 is connected to one end of the ninth capacitor C9 and the non-inverting input terminal of the third operational amplifier U2A, the other end of the eighth capacitor C8, the other end of the ninth capacitor C9 and the third operational amplifier U2A are connected. The inverting input terminal of the operational amplifier U2A is connected to the negative electrode of the second reference source U2 and is grounded, the output terminal of the third operational amplifier U2A is connected to one end of the eighth resistor R8, the other end of the eighth resistor R8 is connected to the inverting input terminal of the fourth operational amplifier U2B and one end of the tenth capacitor C10, the other end of the tenth capacitor C10 is connected to one end of the ninth resistor R9, the non-inverting input terminal of the fourth operational amplifier U2B is connected to the voltage sampling unit 113, the output terminal of the fourth operational amplifier U2B is connected to the other end of the ninth resistor R9 and the negative electrode of the second diode D2, and the positive electrode of the second diode D2 is connected to the driving unit 115 (for example Figure 6 The second diode D2 is connected to the compensation terminal COMP of the driving unit 115).

[0054] In a specific implementation, the first boost module 11 may further include an input protection unit 117 connected to the current sampling unit 111 and the driving unit 115, and the input protection unit 117 implements the short circuit protection, overcurrent protection, input reverse connection protection and other functions of the first boost module 11. In this embodiment, after the first boost module 11 receives the first voltage, the current sampling unit 111 in the first boost module 11 samples the first current generated by the first voltage, obtains the first sampled current and outputs it to the current control circuit, thereby implementing high-end sampling of the input current. Then, the second operational amplifier U1B in the current control unit 112 compares the first sampling current with the preset reference current and outputs a first error signal to the driving unit 115; wherein the reference current is generated after being supplied by the first reference source U1 and input into the first operational amplifier U1A through the first resistor R1, the second resistor R2, the first capacitor C1 and the second capacitor C2. The first reference source U1 can be an adjustable reference source provided by the MCU. For example, the PWM output is set by the single-chip microcomputer to be converted into a reference current by a two-stage RC integration circuit composed of the first resistor R1, the first capacitor C1, the second resistor R2 and the second capacitor C2, or is provided by a DAC output, which is not limited here.

[0055] Further, after the voltage sampling unit 113 samples the first voltage, a first sampling voltage is obtained, and the first sampling voltage is output to the voltage control unit 114. The voltage control unit 114 compares the first sampling voltage with the reference voltage to obtain a second error signal, and then outputs the second error signal to the driving unit 115. The reference voltage is generated by the output voltage of the second reference source U2 after being input into the third operational amplifier U2A through the sixth resistor R6, the seventh resistor R7, the eighth capacitor C8 and the ninth capacitor C9. The second reference source U2 can be an externally provided adjustable reference source, for example, the PWM output is set by the single chip microcomputer to the two-stage RC integration circuit composed of the sixth resistor R6 and the eighth capacitor C8, the seventh resistor R7 and the ninth capacitor C9 to become the reference voltage or provided by the DAC output, which is not limited here.

[0056] For further information, see Figure 7The driving unit 115 includes a first controller U3, an eleventh resistor R11, a twelfth resistor R12, a thirteenth resistor R13, a fourteenth resistor R14, an eleventh capacitor C11, a twelfth capacitor C12, a thirteenth capacitor C13, a fourteenth capacitor C14, a fifteenth capacitor C15, a sixteenth capacitor C16, a seventeenth capacitor C17, and a first transistor Q1; a power supply terminal VCC of the first controller U3 is connected to the sixth voltage and connected to one end of the eleventh capacitor C11, a reference voltage output terminal VREF of the first controller U3 is connected to one end of the twelfth capacitor C12, one end of the eleventh resistor R11 and the collector of the first transistor Q1, a peak current detection terminal CT of the first controller U3 is connected to one end of the thirteenth capacitor C13, the base of the first transistor Q1 and the other end of the eleventh resistor R11, and a current zero-crossing detection terminal ISENS of the first controller U3 is connected to one end of the twelfth resistor R12, one end of the fourteenth capacitor C14, and one end of the fifteenth capacitor C15 and one end of the thirteenth resistor R13, the emitter of the first transistor Q1 is connected to the other end of the twelfth resistor R12 and the other end of the fourteenth capacitor C14, the other end of the thirteenth resistor R13 is connected to the power unit 116, the feedback end FB of the first controller U3 is connected to the DC low voltage feedback signal V1 and is connected to one end of the fourteenth resistor R14 and one end of the sixteenth capacitor C16, the other end of the fourteenth resistor R14 is connected to one end of the seventeenth capacitor C17, the compensation end COMP of the first controller U3 is connected to the other end of the sixteenth capacitor C16, the other end of the seventeenth capacitor C17 and the current control unit 112 and the voltage control unit 114, the driving end PWM of the first controller U3 is connected to the power unit 116, and the other end of the eleventh capacitor C11, the other end of the twelfth capacitor C12, the other end of the thirteenth capacitor C13, the other end of the fifteenth capacitor C15 and the grounding pin of the first controller U3 are all grounded.

[0057] In a specific implementation, in a scenario where constant current control is required, the compensation terminal COMP of the first controller U3 in the driving unit 115 will receive a first error signal, and then the first controller U3 generates a first control signal according to the first error signal, and outputs the first control signal to the power unit 116 through the driving terminal. In a scenario where constant voltage control is required, the compensation terminal COMP of the first controller U3 in the driving unit 115 will receive a second error signal, and then the first controller U3 generates a second control signal according to the second error signal, and outputs the second control signal to the power unit 116 through the driving terminal.

[0058] For further information, see Figure 8The power unit 116 includes a fifteenth resistor R15, a sixteenth resistor R16, a seventeenth resistor R17, a first inductor L1, a first current transformer T1, a third diode D3 and a first MOS transistor Q2; one end of the first inductor L1 is connected to the input protection unit 117, the other end of the first inductor L1 is connected to one end of the primary side of the first current transformer T1, and is also connected to the rectification and filtering unit 118 to output the DC low voltage, the second end of the primary side of the first current transformer T1 is connected to the drain of the first MOS transistor Q2, and the first M The gate of the OS transistor Q2 is connected to one end of the fifteenth resistor R15 and one end of the sixteenth resistor R16, the source of the first MOS transistor Q2 is grounded, the other end of the fifteenth resistor R15 is connected to the driving unit 115, the cathode of the third diode D3 is connected to one end of the seventeenth resistor R17 and the driving unit 115, the third diode D3 is connected to the first end of the secondary side of the first current transformer T1, the second end of the secondary side of the first current transformer T1, the other end of the seventeenth resistor R17 and the other end of the sixteenth resistor R16 are all grounded.

[0059] In a specific implementation, in a scenario where constant current control is required, the first inductor L1 of the power unit 116 generates a first current according to the first voltage, and the first MOS tube Q2 of the power unit 116 receives a first control signal output by the first controller U3, and the first MOS tube Q2 adjusts the duty cycle according to the first control signal, thereby controlling the first current within a preset range, and then outputs the regulated first current to the second boost module 12 after output processing. In a scenario where constant voltage control is required, the first MOS tube Q2 of the power unit 116 receives a second control signal output by the first controller U3, and the first MOS tube Q2 adjusts the duty cycle according to the second control signal, thereby controlling the first voltage within a preset range, and then outputs the regulated first voltage to the second boost module 12 after output processing.

[0060] For example, Figure 5-Figure 8 As shown, the second voltage and the fourth voltage mentioned above may be +12V, the third voltage and the fifth voltage may be +3.3V, and the first controller U3 may be any control chip that can realize the functions in the embodiments of the present application.

[0061] In addition, most of the existing energy-saving test equipment is split-type. To build a test system, it is often necessary to combine multiple devices. It is necessary to prepare a power supply and an electronic load for the power adapter. In the era of PD adapters, the electronic load does not have the function of deceiving the output of the PD adapter, so a special deception module needs to be added. This discrete combination makes installation and debugging more troublesome. Another reason is that the aging equipment on the production line is made into an aging cabinet that can test multiple channels, not this integrated single unit.

[0062] Based on this, see Fig. 9 The present application provides an aging test device 100, which includes a housing and the above-mentioned aging test circuit. The housing is used to fix the aging test circuit and configure the ports required for input and output of the aging test circuit, such as the output port of the output module and the input port of the input module.

[0063] It can be seen that in this embodiment, various aging test modules are integrated and fixed in the housing of the aging test device 100, and discrete aging test equipment is integrated into one device, which reduces the size of the equipment and improves the convenience of installation and use.

Claims

1. An aging test circuit, characterized in that: It includes a first boost module, a second boost module, an inverter module and an electric energy supplement module, wherein the input end of the first boost module is connected to the output end of the power adapter, the output end of the first boost module is connected to the input end of the second boost module, the input end of the inverter module is respectively connected to the output end of the electric energy supplement module and the output end of the second boost module, and the output end of the inverter module is connected to the input end of the power adapter: The first boost module is used to boost the first voltage output by the power adapter to output a DC low voltage; The second boost module is used to obtain the DC low voltage output by the first boost module, and boost the DC low voltage to a DC high voltage; The electric energy supplement module is connected to the power grid, and is used to convert the power grid voltage into supplementary electric energy, and output the supplementary electric energy to the inverter module in isolation; The inverter module is used to combine the supplementary electric energy generated by the electric energy supplement module and the DC high voltage generated by the second boost module and invert them into an AC voltage, and the AC voltage is used to power the power adapter.

2. The aging test circuit according to claim 1, characterized in that: Also includes: An input module for connecting the first boost module to the power adapter and tricking the power adapter into outputting a corresponding voltage to power the first boost module; The output module is used to monitor the output parameters of the inverter module and output the AC voltage to the power adapter to supply power to the power adapter.

3. The aging test circuit according to claim 2, characterized in that: Also includes: The isolation communication module is connected to the host computer, and is used to receive the aging task and the corresponding aging parameter of the aging task sent by the host computer, and send the output parameters in the aging test circuit to the host computer.

4. The aging test circuit according to claim 1, characterized in that: The first boost module comprises: A current sampling unit, used for performing current sampling to obtain a first sampling current; A current control unit, used for comparing the first sampled current with a reference current to obtain a first error signal; a driving unit, configured to output a corresponding first control signal according to the first error signal; The power unit is used to adjust a first current according to the first control signal to control the first current within a first preset range, wherein the first current is a current generated when powered by the first voltage.

5. The aging test circuit according to claim 4, characterized in that: The first boost module also includes: A voltage sampling unit, used for sampling the first voltage to obtain a first sampled voltage; A voltage control unit, used for comparing the first sampled voltage with a reference voltage to obtain a second error signal; The driving unit is further configured to output a corresponding second control signal according to the second error signal; The power unit is further used to adjust the first voltage according to the second control signal to control the first voltage within a second preset range.

6. The aging test circuit according to claim 4, characterized in that: The current control unit includes a first resistor, a second resistor, a third resistor, a fourth resistor, a fifth resistor, a first capacitor, a second capacitor, a third capacitor, a fourth capacitor, a fifth capacitor, a sixth capacitor, a seventh capacitor, a first diode, a first operational amplifier and a second operational amplifier; One end of the first resistor is connected to the positive electrode of the first reference source, the other end of the first resistor is connected to one end of the second resistor and one end of the first capacitor, the other end of the second resistor is connected to one end of the second capacitor and the non-inverting input end of the first operational amplifier, the other end of the first capacitor, the other end of the second capacitor and the inverting input end of the first operational amplifier are connected to the negative electrode of the first reference source and grounded, the first power supply end of the first operational amplifier is connected to the second voltage and connected to one end of the third capacitor, the second power supply end of the first operational amplifier is connected to the third voltage and connected to one end of the fourth capacitor, the other end of the third capacitor and the other end of the fourth capacitor are both grounded, and the output end of the first operational amplifier is connected to one end of the third resistor. end, the other end of the third resistor is connected to the inverting input end of the second operational amplifier and one end of the fifth capacitor, the other end of the fifth capacitor is connected to one end of the fourth resistor, the non-inverting input end of the second operational amplifier is connected to one end of the fifth resistor, the fifth resistor is connected to the current sampling unit, the first power supply end of the second operational amplifier is connected to the fourth voltage and connected to one end of the sixth capacitor, the second power supply end of the second operational amplifier is connected to the fifth voltage and connected to one end of the seventh capacitor, the other end of the sixth capacitor and the other end of the seventh capacitor are both grounded, the output end of the second operational amplifier is connected to the other end of the fourth resistor and the cathode of the first diode, and the anode of the first diode is connected to the driving unit.

7. The aging test circuit according to claim 5, characterized in that: The voltage control unit includes a sixth resistor, a seventh resistor, an eighth resistor, a ninth resistor, an eighth capacitor, a ninth capacitor, a tenth capacitor, a second diode, a third operational amplifier and a fourth operational amplifier; One end of the sixth resistor is connected to the positive electrode of the second reference source, the other end of the sixth resistor is connected to one end of the seventh resistor and one end of the eighth capacitor, the other end of the seventh resistor is connected to one end of the ninth capacitor and the non-inverting input end of the third operational amplifier, the other end of the eighth capacitor, the other end of the ninth capacitor and the inverting input end of the third operational amplifier are connected to the negative electrode of the second reference source and grounded, the output end of the third operational amplifier is connected to one end of the eighth resistor, the other end of the eighth resistor is connected to the inverting input end of the fourth operational amplifier and one end of the tenth capacitor, the other end of the tenth capacitor is connected to one end of the ninth resistor, the non-inverting input end of the fourth operational amplifier is connected to the voltage sampling unit, the output end of the fourth operational amplifier is connected to the other end of the ninth resistor and the negative electrode of the second diode, and the positive electrode of the second diode is connected to the driving unit.

8. The aging test circuit according to claim 5, characterized in that: The driving unit includes a first controller, an eleventh resistor, a twelfth resistor, a thirteenth resistor, a fourteenth resistor, an eleventh capacitor, a twelfth capacitor, a thirteenth capacitor, a fourteenth capacitor, a fifteenth capacitor, a sixteenth capacitor, a seventeenth capacitor, and a first transistor; The power supply end of the first controller is connected to the sixth voltage and connected to one end of the eleventh capacitor, the reference end of the first controller is connected to one end of the twelfth capacitor, one end of the eleventh resistor and the collector of the first transistor, the current mutual inductance input end of the first controller is connected to one end of the thirteenth capacitor, the base of the first transistor and the other end of the eleventh resistor, the current zero-crossing detection end of the first controller is connected to one end of the twelfth resistor, one end of the fourteenth capacitor, one end of the fifteenth capacitor and one end of the thirteenth resistor, the emitter of the first transistor is connected to the other end of the twelfth resistor and the other end of the fourteenth capacitor, and the base of the thirteenth capacitor is connected to the base of the first transistor. The other end of the resistor is connected to the power unit, the feedback end of the first controller is connected to the feedback signal of the DC low voltage and is connected to one end of the fourteenth resistor and one end of the sixteenth capacitor, the other end of the fourteenth resistor is connected to one end of the seventeenth capacitor, the compensation end of the first controller is connected to the other end of the sixteenth capacitor, the other end of the seventeenth capacitor and the current control unit and the voltage control unit, the driving end of the first controller is connected to the power unit, and the other end of the eleventh capacitor, the other end of the twelfth capacitor, the other end of the thirteenth capacitor, the other end of the fifteenth capacitor and the grounding pin of the first controller are all grounded.

9. The aging test circuit according to claim 5, characterized in that: The power unit includes a fifteenth resistor, a sixteenth resistor, a seventeenth resistor, a first inductor, a first current transformer, a third diode and a first MOS tube; One end of the first inductor is connected to the input protection unit, the other end of the first inductor is connected to the first end of the primary side of the first current transformer and the rectifier and filter unit to output the DC low voltage, the second end of the primary side of the first current transformer is connected to the drain of the first MOS tube, the gate of the first MOS tube is connected to one end of the fifteenth resistor and one end of the sixteenth resistor, the source of the first MOS tube is grounded, the other end of the fifteenth resistor is connected to the driving unit, the cathode of the third diode is connected to one end of the seventeenth resistor and the driving unit, the anode of the third diode is connected to the first end of the secondary side of the first current, and the second end of the secondary side of the first current transformer, the other end of the seventeenth resistor and the other end of the sixteenth resistor are all grounded.

10. An aging test device, characterized in that: The invention comprises an aging test circuit as described in any one of claims 1 to 9.

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