Wireless chip test system

Abstract

The utility model is applicable to the technical field of chip testing, and provides a wireless chip testing system, which comprises a tested wireless chip and a testing device connected with the tested wireless chip through a communication bus and a radio frequency transmission structure, the radio frequency transmission structure is connected between a first antenna of a tested wireless chip and a second antenna of a Golden chip, the testing device is used for generating a testing signal, receiving a to-be-tested signal sent by the tested wireless chip based on the testing signal, comparing the to-be-tested signal with the testing signal, and sending the to-be-tested signal to the Golden chip. Therefore, the test loop is built through the Golden chip, the requirements for a test instrument and a test environment in the wireless chip test are greatly reduced, and the test cost is reduced.

Description

Technical Field

[0001] The utility model belongs to the technical field of chip testing, and in particular relates to a wireless chip testing system. Background Art

[0002] In chip testing, wireless chip testing in the form of AIP packaging has always been a difficult problem in the industry. The more common solution is to use OTA testing. This testing solution requires the construction of a shielded darkroom and wireless testing related equipment. The cost is very high, and the testing efficiency is low, and it is not mass-producible. Other solutions are to lead the RF signal to the machine to implement loopback testing. Usually, the device under test (DUT) is evaluated using detection instruments or evaluation boards. In this test solution, the DUT sends wireless signals to the receiver through the antenna for analysis and testing. This requires the use of multiple environments for testing, and ATE test instruments are expensive and require high testing resources. Utility Model Content

[0003] The utility model aims to provide a wireless chip testing system, aiming to solve the problem in the prior art that wireless chip testing has high requirements on testing instruments and environment and high testing cost.

[0004] The utility model provides a wireless chip testing system, the wireless chip testing system comprising:

[0005] A wireless chip under test, and a test device connected to the wireless chip under test through a communication bus and a radio frequency connection structure, wherein the test device includes a Golden chip, and the radio frequency transmission structure is connected between a first antenna of the wireless chip under test and a second antenna of the Golden chip, wherein:

[0006] The testing device is used to generate a test signal, and to receive a signal to be tested sent by the wireless chip under test based on the test signal, and to compare the signal to be tested with the test signal;

[0007] The radio frequency transmission structure is used to provide a radio frequency link for the first antenna and the second antenna.

[0008] Optionally, the Golden chip further includes a signal generator and a detection circuit connected to the signal generator, wherein:

[0009] The signal generator is used to generate a first test signal, and the first test signal is transmitted to the wireless chip under test through the second antenna and the radio frequency transmission structure;

[0010] The detection circuit is used to compare the received first signal to be tested with the first test signal, the first signal to be tested is sent by the wireless chip under test based on the first test signal and transmitted to the detection circuit through the communication bus;

[0011] and / or

[0012] The signal generator is used to generate a second test signal, and the second test signal is transmitted to the wireless chip under test through the communication bus;

[0013] The detection circuit is used to compare the received second signal to be tested with the second test signal. The second signal to be tested is sent by the wireless chip under test based on the second test signal and is transmitted to the detection circuit through the RF transmission structure and the second antenna.

[0014] Optionally, the test device further includes a control module connected to the Golden chip and the wireless chip under test, the control module includes a signal generator and a detection circuit connected to the signal generator, wherein:

[0015] The signal generator is used to generate a first test signal, and the first test signal is transmitted to the wireless chip under test through the Golden chip and the radio frequency transmission structure;

[0016] The detection circuit is used to compare the received first signal to be tested with the first test signal, the first signal to be tested is sent by the wireless chip under test based on the first test signal and transmitted to the detection circuit through the communication bus;

[0017] and / or

[0018] The signal generator is used to generate a second test signal, and the second test signal is transmitted to the wireless chip under test through the communication bus;

[0019] The detection circuit is used to compare the received second signal to be tested with the second test signal. The second signal to be tested is sent by the wireless chip under test based on the second test signal and is transmitted to the detection circuit through the RF transmission structure and the Golden chip.

[0020] Optionally, the Golden chip further includes a first signal generator and a first detection circuit connected to the first signal generator, the test device further includes a control module connected to the wireless chip under test, the control module includes a second signal generator and a second detection circuit connected to the second signal generator, wherein,

[0021] The first signal generator is used to generate a first test signal, and the first test signal is transmitted to the wireless chip under test through the second antenna and the radio frequency transmission structure;

[0022] The second signal generator is used to generate a second test signal, the second test signal is transmitted to the wireless chip under test through the communication bus, and the second test signal is the same as the first test signal;

[0023] The first detection circuit is used to compare a received second signal to be tested with the first test signal, the second signal to be tested is sent by the wireless chip under test based on the second test signal, and is transmitted to the first detection circuit through the radio frequency transmission structure and the second antenna;

[0024] The second detection circuit is used to compare a received first signal to be tested with the second test signal, wherein the first signal to be tested is sent by the wireless chip under test based on the first test signal and is transmitted to the second detection circuit via the communication bus.

[0025] Optionally, the test device further includes two control modules, the two control modules include a first control module and a second control module, the first control module is connected to the Golden chip, the second control module is connected to the wireless chip under test, the first control module includes a first signal generator and a first detection circuit connected to the first signal generator, the second control module includes a second signal generator and a second detection circuit connected to the second signal generator, wherein,

[0026] The first signal generator is used to generate a first test signal, and the first test signal is transmitted to the wireless chip under test through the Golden chip and the radio frequency transmission structure;

[0027] The second signal generator is used to generate a second test signal, the second test signal is transmitted to the wireless chip under test through the communication bus, and the second test signal is the same as the first test signal;

[0028] The first detection circuit is used to compare the received second signal to be tested with the first test signal, the second signal to be tested is sent by the wireless chip under test based on the second test signal, and is transmitted to the first detection circuit through the radio frequency transmission structure and the Golden chip;

[0029] The second detection circuit is used to compare a received first signal to be tested with the second test signal, wherein the first signal to be tested is sent by the wireless chip under test based on the first test signal and is transmitted to the second detection circuit via the communication bus.

[0030] Optionally, the control module is a FPGA chip.

[0031] Optionally, the radio frequency transmission structure is a waveguide.

[0032] Optionally, the Golden chip is fixed to one end of the waveguide.

[0033] Optionally, the second antenna is a transceiver antenna.

[0034] Optionally, the type of the Golden chip is the same as the type of the wireless chip under test.

[0035] The wireless chip testing system provided by the utility model comprises a wireless chip to be tested, a testing device connected to the wireless chip to be tested via a communication bus and a radio frequency transmission structure, the testing device being used to generate a test signal, and being used to receive a signal to be tested sent by the wireless chip to be tested based on the test signal, and to compare the signal to be tested with the test signal; wherein the testing device comprises a Golden chip, the radio frequency transmission structure being connected between a first antenna of the wireless chip to be tested and a second antenna of the Golden chip, thereby building a test loop via the Golden chip, greatly reducing the requirements for test instruments and test environment in wireless chip testing, and reducing the test cost. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] Figure 1 It is a structural schematic diagram of a wireless chip testing system provided by an embodiment of the utility model;

[0037] Figure 2 It is a detailed structural diagram of a wireless chip testing system provided by an embodiment of the utility model;

[0038] Figure 3 It is another detailed structural diagram of the wireless chip testing system provided by the embodiment of the utility model;

[0039] Figure 4 It is another detailed structural diagram of the wireless chip testing system provided by the embodiment of the utility model;

[0040] Figure 5 It is another detailed structural diagram of the wireless chip testing system provided by the embodiment of the utility model. DETAILED DESCRIPTION

[0041] In order to make the purpose, technical solution and advantages of the utility model more clear, the utility model is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the utility model and are not used to limit the utility model.

[0042] The specific implementation of the present invention is described in detail below in conjunction with specific embodiments:

[0043] like Figure 1 to Figure 5 As shown, the wireless chip test system provided by the utility model includes: a wireless chip 1 under test, a test device connected to the wireless chip 1 under test through a radio frequency transmission structure 3 and a communication bus 4, the wireless chip 1 under test includes a first antenna 10, the test device includes a Golden chip 2, and the Golden chip includes a second antenna 20; the radio frequency transmission structure 3 is connected between the first antenna 10 and the second antenna 20, and is used to provide a radio frequency link for the first antenna 10 and the second antenna 20, and the communication bus 4 is used to transmit a test signal to the wireless chip 1 under test and / or to transmit a signal to be tested to the test device; the test device is used to generate a test signal, and the test device is also used to receive a signal to be tested sent by the wireless chip 1 under test based on the test signal, and compare the signal to be tested with the test signal. The above-mentioned Golden chip refers to a good chip that has been tested and verified.

[0044] In a specific application, the first antenna 10 of the wireless chip 1 under test can be a single-transmit antenna, a single-receive antenna, or a transceiver antenna. Correspondingly, the second antenna 20 of the Golden chip 2 can be a single-receive antenna corresponding to the first antenna 10, a single-transmit antenna corresponding to the first antenna 10, or a transceiver antenna. This embodiment does not limit this. Taking the first antenna 10 of the wireless chip 1 under test and the second antenna 20 of the Golden chip 2 as an example, when testing the wireless chip 1 under test, the following two methods can be used to test the wireless chip under test:

[0045] Specific test method one, the test device generates a first test signal, the first test signal (data0) is sent to the RF transmission structure through the transmitting end (TXg) of the second antenna, the first test signal (data0) is transmitted through the RF transmission structure, received by the receiving end (RXd) of the first antenna, and then outputs the first test signal (data0') after passing through the internal circuit of the wireless chip under test (mutual conversion between RF signal and digital signal), the first test signal (data0') is transmitted to the test device through the communication bus, the test device compares the received first test signal (data0') with the first test signal (data0), calculates the bit error rate, and thus confirms the performance parameters of the wireless chip under test.

[0046] Specific test method two, the test device generates a second test signal (data1), the second test signal (data1) is transmitted to the wireless chip under test through the communication bus, after the wireless chip under test receives the second test signal, the second test signal (data1) is transmitted (millimeter wave) through the transmitting end (TXd) of the first antenna through the internal circuit (mutual conversion between RF signals and digital signals), the second test signal (data 1') is transmitted to the receiving end (RXg) of the second antenna of the Golden chip through the RF transmission structure, after passing through the internal circuit of the test device (mutual conversion between RF signals and digital signals), the received second test signal (data 1') is compared with the second test signal (data1), the bit error rate is calculated, and the performance parameters of the wireless chip under test are confirmed.

[0047] It should be noted here that when the first antenna 10 is a single receiving antenna, the above-mentioned test method 1 is used to test the wireless chip 1 under test; when the first antenna 10 is a single transmitting antenna, the above-mentioned test method 2 is used to test the wireless chip under test; when the first antenna 10 is a transmitting and receiving antenna, the combination of the above-mentioned test method 1 and the above-mentioned test method 2 is used to test the wireless chip 1 under test.

[0048] like Figure 2 As shown, in an optional embodiment, the Golden chip 2 further includes a signal generator (GEN) 21, and a detection circuit (CHK) 22 connected to the signal generator (GEN) 21, wherein:

[0049] The signal generator 21 is used to generate a first test signal, and the first test signal is transmitted to the wireless chip 1 under test through the second antenna 20 and the RF transmission structure 3; the detection circuit 22 is used to compare the received first test signal with the first test signal, and the first test signal is sent by the wireless chip 1 under test based on the first test signal and transmitted to the detection circuit 22 through the communication bus 4; and / or

[0050] The signal generator 21 is used to generate a second test signal, which is transmitted to the wireless chip 1 under test through the communication bus 4; the detection circuit 22 is used to compare the received second test signal with the second test signal, which is sent by the wireless chip 1 under test based on the second test signal and transmitted to the detection circuit 22 through the RF transmission structure 3 and the second antenna 20.

[0051] In a specific application, when the first antenna 10 and the second antenna 20 are both transceiver antennas, in order to meet the test requirements, the output end of the signal generator 21 is connected to the input end of the second antenna 20 and the input end of the wireless chip 1 under test, and the input end of the detection circuit 22 is connected to the output end of the second antenna 20 and the output end of the wireless chip 1 under test; when the first antenna 10 is a single-transmitting antenna, the output end of the signal generator 21 is not connected to the input end of the second antenna 20, and the input end of the detection circuit 22 is not connected to the output end of the wireless chip 1 under test, which can also meet the test requirements; when the first antenna 10 is a single-receiving antenna, the output end of the signal generator 21 is not connected to the input end of the wireless chip 1 under test, and the input end of the detection circuit 22 is not connected to the output end of the second antenna 20, which can also meet the test requirements.

[0052] Optionally, the test device is composed of one or more chips to further reduce the requirements on test instruments in wireless chip testing and reduce the test cost.

[0053] Figure 2 In the wireless chip test system shown, there is half-duplex communication between the wireless chip 1 under test and the test device. A test loop can be designed through a golden chip to realize automatic testing of the wireless chip. The test method is simple and greatly reduces the requirements for test instruments and test environment in wireless chip testing.

[0054] like Figure 3 As shown, in an optional embodiment, the test device further includes a control module 3 connected to the Golden chip 2 and the wireless chip 1 under test, the control module 3 includes a signal generator 31, and a detection circuit 32 connected to the signal generator 31, wherein:

[0055] The signal generator 31 is used to generate a first test signal, and the first test signal is transmitted to the wireless chip 1 under test through the Golden chip 2 and the RF transmission structure 3; the detection circuit 32 is used to compare the received first test signal with the first test signal, and the first test signal is sent by the wireless chip 1 under test based on the first test signal and transmitted to the detection circuit 32 through the communication bus 4; and / or

[0056] The signal generator 31 is used to generate a second test signal, which is transmitted to the wireless chip 1 under test through the communication bus 4; the detection circuit 32 is used to compare the received second test signal with the second test signal, which is sent by the wireless chip 1 under test based on the second test signal and transmitted to the detection circuit 32 through the RF transmission structure 3 and the Golden chip 2.

[0057] In specific applications, when the first antenna 10 and the second antenna 20 are both transceiver antennas, in order to meet the test requirements, the output end of the signal generator 31 is connected to the input end of the Golden chip 2 and the input end of the wireless chip 1 under test, and the input end of the detection circuit 32 is connected to the output end of the Golden chip 2 and the output end of the wireless chip 1 under test; when the first antenna 10 is a single-transmitting antenna, the output end of the signal generator 31 is not connected to the input end of the Golden chip 2, and the input end of the detection circuit 32 is not connected to the output end of the wireless chip 1 under test, which can also meet the test requirements; when the first antenna 10 is a single-receiving antenna, the output end of the signal generator 31 is not connected to the input end of the wireless chip 1 under test, and the input end of the detection circuit 32 is not connected to the output end of the Golden chip 2, which can also meet the test requirements.

[0058] Figure 3 In the wireless chip test system shown in the figure, the wireless chip under test and the test device communicate in half-duplex mode. Figure 2 The difference is, Figure 3 The wireless chip test system shown adopts the combination of golden chip and control module to realize the automatic test of wireless chip, thus improving the flexibility of the test.

[0059] like Figure 4 As shown, in an optional embodiment, the Golden chip 2 further includes a signal generator (GEN) 21, and a first detection circuit (CHK) 22 connected to the first signal generator (GEN) 21, the test device further includes a control module 3' connected to the wireless chip 1 under test, the control module 3' includes a second signal generator (GEN) 31' and a second detection circuit (CHK) 32' connected to the second signal generator 31', wherein:

[0060] The first signal generator 21 is used to generate a first test signal, and the first test signal is transmitted to the wireless chip 1 under test through the second antenna 20 and the radio frequency transmission structure 3;

[0061] The second signal generator 31' is used to generate a second test signal, which is transmitted to the wireless chip 1 under test via the communication bus 4, and the second test signal is the same as the first test signal;

[0062] The first detection circuit 22 is used to compare the received second test signal with the first test signal, the second test signal is sent by the wireless chip 1 under test based on the second test signal, and is transmitted to the first detection circuit 22 through the RF transmission structure 3 and the second antenna 20;

[0063] The second detection circuit 32 ′ is used to compare the received first test signal with the second test signal. The first test signal is sent by the tested wireless chip 1 based on the first test signal and is transmitted to the second detection circuit 32 ′ through the communication bus 4 .

[0064] In a specific application, the output end of the signal generator 21 is also connected to the input end of the second antenna 20, the input end of the first detection circuit 22 is also connected to the output end of the second antenna 20, the output end of the signal generator 31' is also connected to the input end of the wireless chip 1 under test, and the input end of the second detection circuit 22 is also connected to the output end of the wireless chip 1 under test.

[0065] Figure 4 The wireless chip test system shown is Figure 2 , Figure 3 The difference is that there is full-duplex communication between the wireless chip under test and the test device, which further improves the test efficiency.

[0066] like Figure 5 As shown, in an optional embodiment, the test device further includes two control modules, namely a first control module 3 and a second control module 3', the first control module 3 is connected to the Golden chip 2, the second control module 3' is connected to the wireless chip 1 under test, the first control module 3 includes a first signal generator 31 and a first detection circuit 32 connected to the first signal generator 31, the second control module 3' includes a second signal generator 31' and a second detection circuit 32' connected to the second signal generator 31', wherein:

[0067] The first signal generator 31 is used to generate a first test signal, and the first test signal is transmitted to the wireless chip 1 under test through the Golden chip 2 and the radio frequency transmission structure 3;

[0068] The second signal generator 31' is used to generate a second test signal, which is transmitted to the wireless chip 1 under test via the communication bus 4, and the second test signal is the same as the first test signal;

[0069] The first detection circuit 32 is used to compare the received second test signal with the first test signal, the second test signal is sent by the wireless chip 1 under test based on the second test signal, and is transmitted to the first detection circuit 32 through the RF transmission structure 3 and the Golden chip 2;

[0070] The second detection circuit 32 ′ is used to compare the received first test signal with the second test signal. The first test signal is sent by the tested wireless chip 1 based on the first test signal and is transmitted to the second detection circuit 32 ′ through the communication bus 4 .

[0071] In a specific application, the output end of the first signal generator 31 is also connected to the input end of the Golden chip 2, the input end of the first detection circuit 32 is also connected to the output end of the Golden chip 2, the output end of the second signal generator 31' is also connected to the input end of the wireless chip 1 under test, and the input end of the second detection circuit 32' is also connected to the output end of the wireless chip 1 under test.

[0072] Figure 5 The wireless chip test system shown is Figure 2 , Figure 3 The difference is that there is full-duplex communication between the wireless chip under test and the test device, and two control modules are used, which further improves the test efficiency and test flexibility.

[0073] Optionally, the control module is a FPGA chip, so as to utilize FPGA to improve the flexibility of chip testing.

[0074] Optionally, the above-mentioned RF transmission structure is a waveguide, so as to utilize the waveguide to transmit signals between the first antenna and the second antenna to improve the accuracy of the wireless chip test. The waveguide can be cylindrical, square, U-shaped, S-shaped, etc., and the shape of the waveguide is not specifically limited in this embodiment. The material of the waveguide can be independently selected according to the test conditions, and is not specifically limited in this embodiment.

[0075] Optionally, the type of the Golden chip is the same as the type of the wireless chip under test to improve the test effect. In a specific application, the Golden chip can be set according to the wireless chip under test.

[0076] Optionally, the Golden chip is fixed to one end of a waveguide to improve the convenience of testing. In a specific application, one end of the waveguide can be fixed to carry the Golden chip.

[0077] Optionally, the second antenna is a transceiver antenna to meet the test requirements of different wireless chips under test.

[0078] The wireless chip testing system provided by the utility model comprises a wireless chip to be tested, a testing device connected to the wireless chip to be tested via a communication bus and a radio frequency transmission structure, the testing device comprises a Golden chip, the radio frequency transmission structure is connected between a first antenna of the wireless chip to be tested and a second antenna of the Golden chip, wherein the testing device is used to generate a test signal, and to receive a signal to be tested sent by the wireless chip to be tested based on the test signal, and to compare the signal to be tested with the test signal, thereby building a test loop through the Golden chip, greatly reducing the requirements for test instruments and test environment in wireless chip testing, and reducing the test cost.

[0079] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A wireless chip testing system, characterized in that: The wireless chip testing system comprises: A wireless chip under test, and a test device connected to the wireless chip under test through a communication bus and a radio frequency transmission structure, wherein the test device includes a Golden chip, and the radio frequency transmission structure is connected between a first antenna of the wireless chip under test and a second antenna of the Golden chip, wherein: The testing device is used to generate a test signal, and to receive a signal to be tested sent by the wireless chip under test based on the test signal, and to compare the signal to be tested with the test signal; The radio frequency transmission structure is used to provide a radio frequency link for the first antenna and the second antenna.

2. The wireless chip testing system according to claim 1, characterized in that: The Golden chip also includes a signal generator and a detection circuit connected to the signal generator, wherein: The signal generator is used to generate a first test signal, and the first test signal is transmitted to the wireless chip under test through the second antenna and the radio frequency transmission structure; The detection circuit is used to compare the received first signal to be tested with the first test signal, the first signal to be tested is sent by the wireless chip under test based on the first test signal and transmitted to the detection circuit through the communication bus; and / or The signal generator is used to generate a second test signal, and the second test signal is transmitted to the wireless chip under test through the communication bus; The detection circuit is used to compare the received second signal to be tested with the second test signal. The second signal to be tested is sent by the wireless chip under test based on the second test signal and is transmitted to the detection circuit through the RF transmission structure and the second antenna.

3. The wireless chip testing system according to claim 1, characterized in that: The test device further includes a control module connected to the Golden chip and the wireless chip under test, wherein the control module includes a signal generator and a detection circuit connected to the signal generator, wherein: The signal generator is used to generate a first test signal, and the first test signal is transmitted to the wireless chip under test through the Golden chip and the radio frequency transmission structure; The detection circuit is used to compare the received first signal to be tested with the first test signal, the first signal to be tested is sent by the wireless chip under test based on the first test signal and transmitted to the detection circuit through the communication bus; and / or The signal generator is used to generate a second test signal, and the second test signal is transmitted to the wireless chip under test through the communication bus; The detection circuit is used to compare the received second signal to be tested with the second test signal. The second signal to be tested is sent by the wireless chip under test based on the second test signal and is transmitted to the detection circuit through the RF transmission structure and the Golden chip.

4. The wireless chip testing system according to claim 1, characterized in that: The Golden chip further includes a first signal generator and a first detection circuit connected to the first signal generator, the test device further includes a control module connected to the wireless chip under test, the control module includes a second signal generator and a second detection circuit connected to the second signal generator, wherein: The first signal generator is used to generate a first test signal, and the first test signal is transmitted to the wireless chip under test through the second antenna and the radio frequency transmission structure; The second signal generator is used to generate a second test signal, the second test signal is transmitted to the wireless chip under test through the communication bus, and the second test signal is the same as the first test signal; The first detection circuit is used to compare a received second signal to be tested with the first test signal, the second signal to be tested is sent by the wireless chip under test based on the second test signal, and is transmitted to the first detection circuit through the radio frequency transmission structure and the second antenna; The second detection circuit is used to compare a received first signal to be tested with the second test signal, wherein the first signal to be tested is sent by the wireless chip under test based on the first test signal and is transmitted to the second detection circuit via the communication bus.

5. The wireless chip testing system according to claim 1, characterized in that: The test device also includes two control modules, the two control modules include a first control module and a second control module, the first control module is connected to the Golden chip, the second control module is connected to the wireless chip under test, the first control module includes a first signal generator and a first detection circuit connected to the first signal generator, the second control module includes a second signal generator and a second detection circuit connected to the second signal generator, wherein, The first signal generator is used to generate a first test signal, and the first test signal is transmitted to the wireless chip under test through the Golden chip and the radio frequency transmission structure; The second signal generator is used to generate a second test signal, the second test signal is transmitted to the wireless chip under test through the communication bus, and the second test signal is the same as the first test signal; The first detection circuit is used to compare the received second signal to be tested with the first test signal, the second signal to be tested is sent by the wireless chip under test based on the second test signal, and is transmitted to the first detection circuit through the radio frequency transmission structure and the Golden chip; The second detection circuit is used to compare a received first signal to be tested with the second test signal, wherein the first signal to be tested is sent by the wireless chip under test based on the first test signal and is transmitted to the second detection circuit via the communication bus.

6. The wireless chip testing system according to any one of claims 3 to 5, characterized in that: The control module is an FPGA chip.

7. The wireless chip testing system according to claim 1, characterized in that: The radio frequency transmission structure is a waveguide.

8. The wireless chip testing system as claimed in claim 7, characterized in that: The Golden chip is fixed to one end of the waveguide.

9. The wireless chip testing system according to claim 1, characterized in that: The second antenna is a transceiver antenna.

10. The wireless chip testing system according to claim 1, characterized in that: The type of the Golden chip is the same as the type of the wireless chip under test.

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