LDO (Low Dropout Regulator) test mainboard and test device
Through the LDO test motherboard integrating MCU control unit and operational amplifier, the problem of large size and high cost of traditional test devices is solved, and efficient and accurate LDO product performance detection is achieved, which is suitable for quickly and conveniently generating test reports on the production line.
Patent Information
- Application Number
- CN202420334391.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-02-21
- Publication Date
- 2025-01-17
- Estimated Expiration
- 2034-02-21
AI Technical Summary
Traditional LDO testing devices are costly, large in size, heavy in weight, and cumbersome in testing process, making it difficult to meet the efficient testing needs of modern electronic component production lines.
A LDO test motherboard integrating MCU control unit, power supply and operational amplifier was designed. Through the MCU control unit, the upper computer is communicated with the upper computer, and the output ripple suppression ratio of the LDO product is tested using square wave signals to achieve one-click generation of test reports, simplifying the Test process.
It realizes the size reduction, cost reduction, easy operation and high testing accuracy of the test device, which is suitable for efficient LDO product performance testing on the production line.
Smart Images
Figure CN222365047U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of LDO testing, in particular to an LDO testing mainboard and a testing device. Background Art
[0002] With the rapid development of society, various electronic instruments and devices have entered thousands of households. Among the various electronic components, low dropout regulator (LDO) is a very common and important component. The main function of LDO is to convert unstable input voltage into a more stable and adjustable DC output voltage, so as to power other chips and components and reduce the performance changes of products caused by unstable power supply voltage. LDO has the advantages of simple structure, low power consumption and small output voltage ripple. Its main performance indicators include input voltage range, output voltage, minimum voltage difference, output ripple, output ripple suppression ratio, etc. For LDO products, the products should usually be highly consistent and the actual performance of the products should be stable around the performance indicators. Under normal circumstances, the performance indicators of LDOs produced in the same batch are basically the same. However, nothing can be completely consistent. Even LDOs produced under the same production conditions will have differences in performance. This difference usually does not disappear but accumulates little by little, and eventually affects the performance of the final product, resulting in inconsistent final product performance.
[0003] At present, although traditional LDO test equipment is compatible with many functions and has very high accuracy, it is expensive, large in size, heavy in weight, and relatively troublesome to test. Utility Model Content
[0004] The utility model aims to solve the technical problems existing in the background technology and proposes an LDO test mainboard. The test mainboard is provided with an MCU control unit, a power supply, an operational amplifier and an LDO test clip. The power supply is respectively connected to the input ends of the MCU control unit and the LDO test clip, the output end of the LDO test clip is connected to the input end of the operational amplifier, the output end of the operational amplifier is connected to the MCU control unit, and the MCU control unit is used to be connected to a host computer.
[0005] Furthermore, the MCU control unit includes a signal superposition unit, a data processing unit and a communication unit. The communication unit is connected to the data processing unit and the signal superposition unit respectively. The communication unit is used to communicate with the host computer to realize communication between the MCU control unit and the host computer. The signal superposition unit is connected to the power supply to generate a square wave signal and act on the power supply. The data processing unit is connected to the operational amplifier to receive a signal from the operational amplifier and transmit the signal to the host computer through the communication unit.
[0006] Furthermore, the LDO test clip includes a plurality of test clip units, and the test clip units are provided with insertion ports, which are used for inserting LDO products.
[0007] Furthermore, a buckle is provided at the insertion port, and the buckle is used for clamping the LDO product.
[0008] Furthermore, the LDO test clip is arranged on the back side of the test mainboard.
[0009] In addition, the utility model also provides an LDO testing device, including an LDO testing mainboard of the utility model.
[0010] Furthermore, the LDO test device is provided with a communication serial port, the MCU control unit is connected to the communication serial port, and communicates with a host computer through the communication serial port.
[0011] Furthermore, the communication serial port is connected to the host computer via USB.
[0012] Compared with the prior art, the utility model has the following beneficial technical effects: the utility model can realize the test of LDO by integrating the MCU control unit, power supply, operational amplifier and LDO test clip on the test mainboard, and the structure is simple. Furthermore, because the test mainboard is a PCB board, it has a high degree of integration, so the size of the test device can be greatly reduced. In summary, it can be understood that the test device of the utility model has low cost, small size, light weight, and easy operation. The test report can be generated by one-click through the host computer software, which is convenient for direct testing on the production line, and the test accuracy is high, which meets the testing needs of most enterprises. BRIEF DESCRIPTION OF THE DRAWINGS
[0013] Figure 1 This is a schematic diagram of the LDO test mainboard structure;
[0014] Figure 2 Physical picture of the motherboard for LDO testing (front view);
[0015] Figure 3 Physical picture of the motherboard for LDO testing (back);
[0016] Figure 4 This is the interface diagram of the host computer. DETAILED DESCRIPTION
[0017] It should be noted that, in the absence of conflict, the embodiments of the present invention and the features in the embodiments can be combined with each other.
[0018] In the description of the present utility model, it should be understood that the terms "center", "longitudinal", "lateral", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside" and the like indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present utility model and simplifying the description, rather than indicating or implying that the device or component referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present utility model. In addition, the terms "first", "second", etc. are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, features defined as "first", "second", etc. may explicitly or implicitly include one or more features. In the description of the present utility model, unless otherwise specified, "multiple" means two or more.
[0019] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installation", "connection" and "connection" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or a specific connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood by specific circumstances.
[0020] The specific embodiments of the present utility model are described in detail below with reference to the accompanying drawings.
[0021] like Figure 1-Figure 4 As shown, the utility model proposes an LDO test device, including an LDO test mainboard, on which an MCU control unit, a power supply, an operational amplifier and an LDO test clip are arranged, the power supply is respectively connected to the input ends of the MCU control unit and the LDO test clip, the output end of the LDO test clip is connected to the input end of the operational amplifier, the output end of the operational amplifier is connected to the MCU control unit, and the MCU control unit is connected to a host computer via a communication serial port on the test device.
[0022] It can be understood that in this embodiment, the host computer can be a PC or other professional testing devices. Through the above settings, the LDO test device of the utility model can install the LDO product on the corresponding LDO test clip during testing, and the power supply on the test mainboard can power the LDO through the power supply circuit. At the same time, the MCU control unit can superimpose 0.2V square wave signals of different frequencies on the power supply, and transmit them to the LDO product through the input end of the LDO test clip. The LDO product then leads the LDO output through the output end of the LDO test clip, and after the operational amplifier (two-stage operational amplifier) is amplified by 100 times and 20 times, it is handed over to the MCU control unit for data processing. After the MCU control unit processes the data, it sends the data to the host computer through the communication serial port for sorting and analysis. The host computer calculates the output ripple suppression ratio of the LDO to be tested by comparing the 0.2V square waves of different frequencies on the input power supply with the output ripple to achieve the test of the LDO.
[0023] It can be understood that the utility model can realize the test of LDO by integrating the MCU control unit, power supply, operational amplifier and LDO test clip on the test mainboard, and the structure is simple. Furthermore, because the test mainboard is a PCB board, it has a high degree of integration, and thus the size of the test device can be greatly reduced. In summary, it can be understood that the test device of the utility model has low cost, small size, light weight, and easy operation. The test report can be generated by one-click through the host computer software, which is convenient for direct testing on the production line, and the test accuracy is high, which meets the testing needs of most enterprises.
[0024] Furthermore, in the present embodiment, the MCU control unit includes a signal superposition unit, a data processing unit and a communication unit. The communication unit is connected to the data processing unit and the signal superposition unit respectively. The communication unit is connected to the communication serial port. The communication serial port is connected to the host computer via a USB to realize communication between the MCU control unit and the host computer. The signal superposition unit is connected to the power supply to generate 0.2V square wave signals of different frequencies and act on the power supply. The data processing unit is connected to the operational amplifier to receive the signal from the operational amplifier for processing and transmit the signal to the host computer via the communication unit.
[0025] Furthermore, in the present embodiment, the LDO test clip is arranged on the back side of the test mainboard, and the LDO test clip includes a plurality of test clip units, and the test clip units are provided with plug-in ports, and the plug-in ports are used for plugging in the LDO products. Specifically, the plug-in ports are also provided with buckles, and the buckles are used for clamping the LDO products.
[0026] Specifically, in this embodiment, there are three test clip units on the back of the test device of the back of the test mainboard. The plug-in ports on different test clip units can correspond to LDO products with different pin packages of SOT23 and SOT89 respectively. Through the above settings, during the test, the LDO to be tested can be installed in the corresponding position, and then the buckle is buckled, and the upper computer software is opened. The corresponding interface of the upper computer software is as follows: Figure 4 As shown, first select the serial port address of the LDO test device, adjust the serial port baud rate to 256000, then connect the communication serial port, and click the Start Test button to test. After the test is completed, click Generate Report to generate the LDO performance report with one click, which is convenient and fast.
[0027] The above are one or more implementation methods provided in combination with specific content, and it is not intended that the specific implementation of the utility model is limited to these descriptions. Any method, structure, etc. similar to or identical to the method, structure, etc. of the utility model, or any technical deduction or replacement based on the concept of the utility model, shall be deemed to be within the protection scope of the utility model.
Claims
1. A LDO test motherboard, characterized in that: The test mainboard is provided with an MCU control unit, a power supply, an operational amplifier and an LDO test clip. The power supply is respectively connected to the input ends of the MCU control unit and the LDO test clip, the output end of the LDO test clip is connected to the input end of the operational amplifier, the output end of the operational amplifier is connected to the MCU control unit, and the MCU control unit is used to connect to a host computer.
2. A LDO test motherboard according to claim 1, characterized in that: The MCU control unit includes a signal superposition unit, a data processing unit and a communication unit. The communication unit is connected to the data processing unit and the signal superposition unit respectively. The communication unit is used to communicate with the host computer to realize the communication between the MCU control unit and the host computer. The signal superposition unit is connected to the power supply to generate a square wave signal and act on the power supply. The data processing unit is connected to the operational amplifier to receive a signal from the operational amplifier and transmit the signal to the host computer through the communication unit.
3. The LDO test motherboard according to claim 1, characterized in that: The LDO test clip comprises a plurality of test clip units, each of which is provided with an insertion port for inserting an LDO product.
4. The LDO test motherboard according to claim 3, characterized in that: The insertion port is also provided with a buckle, which is used for clamping the LDO product.
5. The LDO test motherboard according to claim 1, characterized in that: The LDO test clip is arranged on the back side of the test main board.
6. A LDO testing device, characterized in that: A LDO test mainboard comprising any one of claims 1-5.
7. The LDO testing device according to claim 6, characterized in that: The LDO test device is provided with a communication serial port, the MCU control unit is connected to the communication serial port, and communicates with a host computer through the communication serial port.
8. The LDO testing device according to claim 7, characterized in that: The communication serial port is connected to the host computer via USB.