Test tool for integrated circuit chip

Abstract

The utility model relates to the technical field of chip testing, in particular to a testing tool for an integrated circuit chip, which comprises a workbench, the top of the workbench is fixedly connected with a rotating motor through a first bolt, and the output end of the rotating motor is fixedly connected with a turntable. Chip positioning assemblies are fixedly connected to the top of the rotating disc at equal intervals through second bolts, and chip testing assemblies are symmetrically and fixedly connected to the position, located on one side of the rotating disc, of the top of the workbench through third bolts. The utility model aims to provide the test tool for the integrated circuit chip, so as to solve the problems that the existing integrated circuit chip is mostly tested at a single test position, the loading and unloading of the integrated circuit chip need to wait, the test efficiency is low, the test result is judged by one-time test, and the test data has certain occasion, so that the test accuracy is poor.

Description

Technical Field

[0001] The utility model relates to the technical field of chip testing, in particular to a testing tool for integrated circuit chips. Background Art

[0002] Integrated circuit chips are microelectronic devices that can realize certain circuit functions. In order to ensure the stable and smooth operation of integrated circuit chips, it is necessary to test the integrated circuit chips and screen out defective products, so test tools are needed to detect them.

[0003] Most existing integrated circuit chips are tested by a single test bit, which requires waiting for loading and unloading, has low test efficiency, and only one test is required to determine the test result. The test data has a certain degree of randomness, resulting in poor test accuracy. Utility Model Content

[0004] The purpose of the utility model is to provide a testing tool for integrated circuit chips to solve the problem that most of the existing integrated circuit chips are tested by a single test position, and the loading and unloading of the chips need to wait, the test efficiency is low, and the test results are judged by a single test. The test data has a certain randomness, which leads to poor test accuracy.

[0005] In order to achieve the above purpose, the utility model provides the following technical solutions:

[0006] A test fixture for integrated circuit chips, comprising a workbench, a rotating motor is fixedly connected to the top of the workbench by a first bolt, a turntable is fixedly connected to the output end of the rotating motor, and a chip positioning assembly is fixedly connected to the top of the turntable by a second bolt at an equidistant distance;

[0007] The chip positioning assembly comprises a fixing block, a positioning groove is formed on the top of the fixing block, a suction pen is integrated and fixed inside the fixing block and at the bottom of the inner wall of the positioning groove, and a connection hole of the suction pen is located on the inner side of the fixing block;

[0008] A chip testing assembly is symmetrically fixedly connected to the top of the workbench and located on one side of the turntable through a third bolt;

[0009] The chip testing assembly includes a fixed frame, a frame is fixedly connected to the top of the front side of the fixed frame, a wire shaft is rotatably connected to the center of the frame, the top of the wire shaft is fixed to the output shaft of the lifting motor, the lifting motor is fixedly connected to the frame, a movable frame is threadedly connected to the surface of the wire shaft, the movable frame is slidably connected to the fixed frame, the outer bottom of the movable frame is fixedly connected to a connecting block by a fourth bolt, the bottom of the connecting block is fixedly connected to a test board, and the bottom of the test board is fixedly connected to a test probe.

[0010] Preferably, the workbench, the fixed frame and the rotating motor are positioned by first pins, and the fixed block and the turntable and the movable frame and the connecting block are positioned by second pins.

[0011] Preferably, the upper portion of the turntable includes two material waiting positions, a material loading position, two test positions and a material unloading position, and two chip test assemblies symmetrically fixed outside the turntable are arranged corresponding to the two test positions.

[0012] Preferably, the contour of the positioning groove is consistent with the contour of the integrated circuit chip being tested, and the top is chamfered.

[0013] Compared with the prior art, the beneficial effects of the utility model are:

[0014] 1. In the utility model, by adopting a turntable-type six-station design and dividing it into a loading position, a waiting position, a unloading position and a testing position, the integrated circuit chip loading, testing and unloading processes can be completed in sequence during one rotation of the turntable, so as to cooperate with the loading and unloading of the robot arm to realize mechanical automatic cycle testing. The waiting time for loading and unloading can be greatly reduced compared with manual work, and the test efficiency is high.

[0015] 2. In the utility model, by adopting a double-station sequential testing structural design, each chip loaded from the loading position on the turntable can be tested on both sides, and the result can be judged by comparing the test data on both sides. If both test data are within the test error, it is judged as a good product. If there is a problem with one of them, it is judged as a product to be checked. If there are problems with both times, it is directly judged as a defective product. The data of two tests are more accurate than the traditional one-time test results, which can avoid the occurrence of sporadic data.

[0016] 3. In the present invention, the test components all adopt a bolt and pin structural design, which can achieve high-precision disassembly and assembly, and is convenient for replacing the test components according to the specifications of the test chip, and has high flexibility in use. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 This is an upper axis view of a test fixture for integrated circuit chips of the utility model;

[0018] Figure 2 This is a distribution state diagram of the first pin and the second pin of a testing tool for integrated circuit chips of the utility model;

[0019] Figure 3 This is a diagram showing the distribution state of a turntable station of a test tool for integrated circuit chips of the utility model;

[0020] Figure 4 The utility model is a cross-sectional view of a chip positioning component of a testing tool for an integrated circuit chip.

[0021] In the figure: 1. workbench; 2. first bolt; 3. rotating motor; 4. turntable; 41. waiting position; 42. loading position; 43. testing position; 44. unloading position; 5. second bolt; 6. chip positioning assembly; 61. fixing block; 62. positioning groove; 63. suction pen; 64. connecting hole; 7. third bolt; 8. chip testing assembly; 81. fixing frame; 82. frame; 83. wire shaft; 84. lifting motor; 85. movable frame; 86. fourth bolt; 87. connecting block; 88. test board; 89. test probe; 9. first pin; 10. second pin; 11. integrated circuit chip. DETAILED DESCRIPTION

[0022] The technical solutions in the embodiments of the utility model will be clearly and completely described below in conjunction with the drawings in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, rather than all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the utility model.

[0023] See also Figure 1-4 , the utility model provides a technical solution:

[0024] A test fixture for integrated circuit chips, comprising a workbench 1, a rotating motor 3 is fixedly connected to the top of the workbench 1 through a first bolt 2, and is used for rotating a turntable to switch between various workstations; a turntable 4 is fixedly connected to the output end of the rotating motor 3, and a chip positioning component 6 is fixedly connected to the top of the turntable 4 through a second bolt 5 at equal intervals, and is used for quickly placing and fixing the integrated circuit chip to improve the test efficiency;

[0025] The chip positioning assembly 6 includes a fixing block 61, and a positioning groove 62 is provided on the top of the fixing block 61 for placing and fixing the chip; a suction pen 63 is integrated and fixed inside the fixing block 61 and at the bottom of the inner wall of the positioning groove 62, which adsorbs and fixes the chip placed in the positioning groove to ensure the test stability and assist the robot arm in loading and unloading; a connection hole 64 of the suction pen 63 is located on the inner side of the fixing block 61, and is used for pneumatic control connection of the suction pen;

[0026] A chip testing assembly 8 is symmetrically fixedly connected to the top of the workbench 1 and located on one side of the turntable 4 through a third bolt 7 for chip testing;

[0027] The chip testing assembly 8 includes a fixed frame 81, the front top of the fixed frame 81 is fixedly connected to a frame 82, the center of the frame 82 is rotatably connected to a wire shaft 83, the top of the wire shaft 83 is fixed to the output shaft of a lifting motor 84, the lifting motor 84 is fixedly connected to the frame 82, the surface of the wire shaft 83 is threadedly connected to a movable frame 85, the movable frame 85 is slidably connected to the fixed frame 81, the outer bottom of the movable frame 85 is fixedly connected to a connecting block 87 by a fourth bolt 86, the bottom of the connecting block 87 is fixedly connected to a test board 88, and the bottom of the test board 88 is fixedly connected to a test probe 89. The lifting motor can be used to drive the wire shaft to rotate, and the wire shaft can drive the movable frame to move up and down, thereby driving the test probe to move up and down and mechanically open and close the chip pins to complete the chip test.

[0028] In this embodiment, please refer to Figure 2 The workbench 1 and the fixed frame 81 and the rotating motor 3 are positioned by the first pin 9, and the fixed block 61 and the turntable 4 and the movable frame 85 and the connecting block 87 are positioned by the second pin 10, which is used for positioning between the connecting parts to ensure its high-precision disassembly and assembly design requirements.

[0029] In this embodiment, please refer to Figure 3 The upper part of the turntable 4 includes two waiting positions 41, a loading position 42, two testing positions 43 and a unloading position 44. Two chip testing components 8 symmetrically fixed outside the turntable 4 are arranged corresponding to the two testing positions 43. The turntable can rotate one circle to complete the loading, testing and efficiency of the chip in turn, which can reduce the waiting time for loading and unloading and improve the testing efficiency.

[0030] In this embodiment, please refer to Figure 1 The contour of the positioning groove 62 is consistent with the contour of the tested integrated circuit chip 11, and the top is chamfered to guide the material discharge, and the chip's own weight can be used to perform certain position correction to ensure the loading accuracy.

[0031] Working principle of the utility model: when in use, it can cooperate with the external loading robot arm of the loading position 42 and the automatic loading of the equipment. After the integrated circuit chip 11 is loaded at the loading position 42, the rotating motor 3 will drive the turntable 4 to rotate step by step to switch the various stations in sequence, and the chip is transferred to the bottom of the front chip test assembly 8, and then the lifting motor 84 will drive the wire shaft 83 to rotate, and the wire shaft 83 drives the movable frame 85 to move down, and the movable frame 85 cooperates with the connecting block 87 to drive the test board 88 to move down, and the test probe 89 on the test board 88 touches the pins on the integrated circuit chip to perform the test. After the test is completed, it is recorded as data one, and then the lifting motor 84 is reversed, and the test probe 89 is reset. The turntable 4 rotates continuously to make the tested chip enter under the chip test assembly 8 at the rear, and then performs the test. The principle is the same as above, and the measured result is data 2. The tested chip at the rear is then placed under the chip test assembly 8 at the front, and the next chip data 1 test is performed. This process is repeated to measure the test results of each chip twice in turn. The product is judged by comparing data 1 and data 2 of the two test results. If both test data are within the test error, it is judged as a good product. If one of them has a problem, it is judged as a product to be checked. If both have problems, it is directly judged as a defective product. When the chip that has completed the two tests rotates to the unloading position, it can be unloaded automatically by a robotic arm.

[0032] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions. The sentence "includes an element defined by ... does not exclude the existence of other identical elements in the process, method, article or device including the element".

[0033] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A test tool for integrated circuit chips, comprising a workbench (1), characterized in that: The top of the workbench (1) is fixedly connected to a rotating motor (3) via a first bolt (2); the output end of the rotating motor (3) is fixedly connected to a rotating disk (4); the top of the rotating disk (4) is fixedly connected to a chip positioning assembly (6) at equal intervals via a second bolt (5); The chip positioning assembly (6) comprises a fixing block (61), a positioning groove (62) is provided on the top of the fixing block (61), a suction pen (63) is integrated and fixed inside the fixing block (61) and at the bottom of the inner wall of the positioning groove (62), and a connecting hole (64) of the suction pen (63) is located on the inner side of the fixing block (61); A chip testing assembly (8) is symmetrically fixedly connected to the top of the workbench (1) and located on one side of the turntable (4) via a third bolt (7); The chip testing assembly (8) comprises a fixed frame (81), the front top of the fixed frame (81) is fixedly connected to a frame (82), the center of the frame (82) is rotatably connected to a wire shaft (83), the top of the wire shaft (83) is fixed to the output shaft of a lifting motor (84), the lifting motor (84) is fixedly connected to the frame (82), the surface of the wire shaft (83) is threadedly connected to a movable frame (85), the movable frame (85) is slidably connected to the fixed frame (81), the outer bottom of the movable frame (85) is fixedly connected to a connecting block (87) by a fourth bolt (86), the bottom of the connecting block (87) is fixedly connected to a test board (88), and the bottom of the test board (88) is fixedly connected to a test probe (89).

2. A test fixture for integrated circuit chips according to claim 1, characterized in that: The workbench (1) is positioned with the fixed frame (81) and the rotating motor (3) by means of a first pin (9), and the fixed block (61) is positioned with the rotating disk (4) and the movable frame (85) is positioned with the connecting block (87) by means of a second pin (10).

3. A test fixture for integrated circuit chips according to claim 1, characterized in that: The upper part of the turntable (4) comprises two material waiting positions (41), a material loading position (42), two test positions (43) and a material unloading position (44), and two chip test assemblies (8) symmetrically fixed outside the turntable (4) are arranged corresponding to the two test positions (43).

4. A test fixture for integrated circuit chips according to claim 1, characterized in that: The contour of the positioning groove (62) is consistent with the contour of the integrated circuit chip (11) being tested, and a chamfer design is performed on the top.

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