Chip test equipment capable of rapidly cooling

Abstract

The utility model provides chip testing equipment capable of rapidly cooling, and belongs to the technical field of testing equipment. The chip testing equipment capable of rapidly cooling comprises a testing device body and a ventilation assembly, the ventilation assembly comprises a drawer, a drawing sealing plate, a first pipeline, a second pipeline, a third pipeline, a first one-way valve and a second one-way valve, and the drawing sealing plate is fixedly connected to one side of the drawer. The drawer and the drawing sealing plate are both in sliding connection with the interior of the testing device body, the upper portion of the third pipeline is communicated with an electronic element area in the testing device body, and the second one-way valve is arranged outside the third pipeline. Therefore, rapid ventilation of air in an electronic component area is realized, hot air is rapidly led out, rapid cooling is realized, the working environment temperature of the electronic component is reduced, and the service life of the electronic component in the testing device is prolonged.

Description

Technical Field

[0001] The present application relates to the field of testing equipment, and in particular, to a chip testing equipment capable of rapidly cooling down. Background Art

[0002] Generally speaking, when testing chips, testing equipment is used. However, there are also many electronic components installed inside the testing equipment. During use, the electronic components will release a lot of heat. Therefore, a fan is often installed inside the testing equipment. However, the fan is usually small and the wind force is limited. Therefore, during the heat dissipation process, the hot air inside the testing equipment cannot be quickly discharged. As a result, the electronic components inside the testing equipment will be in a high temperature environment during use, which will reduce the service life of the electronic components over time. Utility Model Content

[0003] In order to make up for the above shortcomings, the present application provides a chip testing device that can quickly cool down, aiming to improve the problem that the internal electronic components of the testing device are in a high temperature environment during use, which will reduce the service life of the electronic components over time.

[0004] An embodiment of the present application provides a chip testing device that can quickly cool down, including a testing device body and a ventilation component, the ventilation component including a drawer, a pull-out sealing plate, a first pipe, a second pipe, a third pipe, a first one-way valve and a second one-way valve, the pull-out sealing plate is fixedly connected to one side of the drawer, the drawer and the pull-out sealing plate are both slidably connected to the inside of the testing device body, one side of the first pipe is connected to the sliding connection area between the drawer and the testing device body, the other side of the first pipe is connected to one side of the second pipe, the other side of the second pipe is connected to the outside of the testing device body, the first one-way valve is arranged on the outside of one side of the second pipe, the bottom of the third pipe is connected to the second pipe, the upper part of the third pipe is connected to the electronic component area inside the testing device body, and the second one-way valve is arranged on the outside of the third pipe.

[0005] In a specific embodiment, a first inner cavity is opened inside the testing device body, and the drawer and the pull-out sealing plate are both slidably connected inside the first inner cavity.

[0006] In the above implementation process, the setting of the first inner cavity facilitates the pulling and pulling of the drawer. When pulling and pulling, the effect of a pulling and pulling bellows is formed between the first inner cavity and the pulling and pulling sealing plate, which can suck air from the outside of the test device into the first inner cavity and discharge the first inner cavity into the third pipe.

[0007] In a specific embodiment, the testing device body is provided with a second inner cavity, and one side of the first pipeline, one side of the second pipeline, one side of the third pipeline, the first one-way valve and the second one-way valve are all located inside the second inner cavity.

[0008] In the above implementation process, the second inner cavity is mainly used for installing the first pipeline, the second pipeline, the third pipeline, the first one-way valve and the second one-way valve.

[0009] In a specific embodiment, the drawer is provided with an elastic limit member on one side close to the outside of the test device body, and the elastic limit member includes a spring and a limit bead. One side of the spring and the limit bead are both located inside the drawer, one side of the spring abuts against the inside of the drawer, and the other side of the spring abuts against one side of the limit bead. The other side of the limit bead passes through the drawer and abuts against the inside of the test device body.

[0010] In the above implementation process, the provision of the elastic limiting member can limit the position of the shaft.

[0011] In a specific implementation, the drawer is provided with a pull ring on one side of the elastic limiting member, and the pull ring is rotatably connected to the drawer.

[0012] In the above implementation process, the provision of the pull ring facilitates the pulling of the drawer.

[0013] In a specific embodiment, an ice bag box is provided on one side of the second pipe, an ice bag is provided inside the ice bag box, and the ice bag box is fixedly connected to the outside of the testing device body.

[0014] In the above implementation process, the provision of the ice bag box facilitates placing ice bags inside the ice bag box, thereby cooling the air.

[0015] In a specific embodiment, a box cover is hinged on the upper portion of the ice bag box, and the ice bag box and the box cover are connected by a buckle.

[0016] In the above implementation process, the provision of the box cover facilitates the sealing of the ice bag box, and also facilitates the placement of ice bags in the ice bag box and the removal of ice bags from the ice bag box.

[0017] In a specific implementation manner, a wind head is provided on one side of the upper portion of the third pipe, and an air outlet end of the wind head faces an electronic component area provided inside the testing device body.

[0018] In the above implementation process, the setting of the wind head makes it easy to blow air quickly into the testing device body.

[0019] Beneficial effect: The present application provides a chip testing device that can quickly cool down. First, the drawer is set up to store some parts or power cords into the drawer. At the same time, pulling the drawer can drive the movement of the pull-out sealing plate. When the drawer and the pull-out sealing plate move toward one side of the test device body shell, the air outside the test device body is sucked into the bottom of the inner side of the test device through the first pipe, the second pipe and the first one-way valve. When the drawer and the pull-out sealing plate move toward the inside of the test device body, the first one-way valve closes one side of the second pipe. At this time, the air will enter the second pipe through the first pipe, and enter the test The electronic component area inside the device body can inhale a large amount of air when the drawer and the pull-out sealing plate move toward the side of the test device body shell. It is only necessary to quickly push the drawer and the pull-out sealing plate into the interior of the test device body, and a large amount of air will quickly enter the electronic component area of ​​the test device body. When a large amount of air enters the electronic component area, air will be discharged from the electronic component area, thereby realizing rapid ventilation of the air in the electronic component area, quickly extracting hot air, and realizing rapid cooling, thereby reducing the working environment temperature of the electronic components, and increasing the service life of the electronic components inside the test device. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] In order to more clearly illustrate the technical solutions of the implementation methods of the present application, the drawings required for use in the implementation methods will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present application and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0021] Figure 1 This is a schematic structural diagram of a first-view chip testing device capable of rapid cooling provided by an embodiment of the present application;

[0022] Figure 2 A schematic structural diagram of a second perspective of a chip testing device capable of rapid cooling provided in an embodiment of the present application;

[0023] Figure 3 A schematic diagram of a partial structure of a drawer provided in an embodiment of the present application;

[0024] Figure 4 A partial structural schematic diagram of a first pipeline, a second pipeline and a third pipeline provided in an embodiment of the present application;

[0025] Figure 5 A schematic diagram of a portion of the structure of an ice bag box provided in an embodiment of the present application;

[0026] Figure 6A partial structural schematic diagram of the elastic limiter provided in an embodiment of the present application.

[0027] In the figure: 100-test device body; 110-first inner cavity; 120-second inner cavity; 200-ventilation assembly; 210-drawer; 211-pull ring; 220-pull-out sealing plate; 230-first pipe; 240-second pipe; 241-ice bag box; 242-box cover; 250-third pipe; 251-wind head; 260-first one-way valve; 270-second one-way valve; 280-elastic limiter; 281-spring; 282-limiting bead. DETAILED DESCRIPTION

[0028] The technical solutions in the embodiments of the present application will be described below in conjunction with the drawings in the embodiments of the present application.

[0029] In order to make the purpose, technical solutions and advantages of the implementation methods of this application clearer, the technical solutions in the implementation methods of this application will be clearly and completely described below in conjunction with the drawings in the implementation methods of this application. Obviously, the described implementation methods are part of the implementation methods of this application, not all of the implementation methods. Based on the implementation methods in this application, all other implementation methods obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0030] Therefore, the following detailed description of the embodiments of the present application provided in the accompanying drawings is not intended to limit the scope of the present application for protection, but merely represents the selected embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in the field without creative work are within the scope of protection of the present application.

[0031] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, further definition and explanation thereof is not required in subsequent drawings.

[0032] In the description of the present application, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise" and the like indicating orientations or positional relationships are based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present application.

[0033] See also Figure 1The present application provides a chip testing device capable of rapidly cooling down the chip, including a testing device body 100 and a ventilation assembly 200 .

[0034] See also Figure 1-Figure 6 The ventilation assembly 200 includes a drawer 210, a pull-out sealing plate 220, a first pipe 230, a second pipe 240, a third pipe 250, a first one-way valve 260 and a second one-way valve 270. The pull-out sealing plate 220 is fixedly connected to one side of the drawer 210. The drawer 210 and the pull-out sealing plate 220 are both slidably connected to the inside of the test device body 100. One side of the first pipe 230 is connected to the sliding connection area between the drawer 210 and the test device body 100. The other side of the first pipe 230 is connected to one side of the second pipe 240. The other side of the second pipe 240 is connected to the outside of the test device body 100, the first one-way valve 260 is arranged on the outside of one side of the second pipe 240, the bottom of the third pipe 250 is connected to the second pipe 240, the upper part of the third pipe 250 is connected to the electronic component area inside the test device body 100, the second one-way valve 270 is arranged on the outside of the third pipe 250, and the first inner cavity 110 is opened inside the test device body 100, and the drawer 210 and the pull-out sealing plate 220 are both slidably connected inside the first inner cavity 110.

[0035] The test device body 100 is provided with a second inner cavity 120, one side of the first pipe 230, one side of the second pipe 240, one side of the third pipe 250, the first one-way valve 260 and the second one-way valve 270 are all located inside the second inner cavity 120, and the drawer 210 is located on the side close to the outside of the test device body 100 and is provided with an elastic limiter 280, the elastic limiter 280 includes a spring 281 and a limiter bead 282, one side of the spring 281 and the limiter bead 282 are both located inside the drawer 210, one side of the spring 281 is against the inside of the drawer 210, the other side of the spring 281 is against one side of the limiter bead 282, and the other side of the limiter bead 282 penetrates The drawer 210 is against the inside of the test device body 100, and a pull ring 211 is provided on the side of the elastic limit member 280 of the drawer 210, and the pull ring 211 is rotatably connected to the drawer 210, and an ice bag box 241 is provided on one side of the second pipe 240, and an ice bag is provided inside the ice bag box 241, and the ice bag box 241 is fixedly connected to the outside of the test device body 100, and a box cover 242 is hinged on the upper part of the ice bag box 241, and the ice bag box 241 and the box cover 242 are connected by a buckle, and a wind head 251 is provided on one side of the upper part of the third pipe 250, and the air outlet end of the wind head 251 faces the electronic component area set inside the test device body 100.

[0036] The working principle of this kind of chip testing equipment that can quickly cool down is as follows: first, the setting of the drawer 210 can store some parts or power cords into the inside of the drawer 210. At the same time, pulling the drawer 210 can drive the movement of the pull-out sealing plate 220. When the drawer 210 and the pull-out sealing plate 220 move toward the side of the outer shell of the test device body 100, the air outside the test device body 100 is sucked into the first inner cavity 110 through the first pipe 230, the second pipe 240 and the first one-way valve 260. When the drawer 210 and the pull-out sealing plate 220 move toward the inside of the test device body 100, the first one-way valve 260 closes one side of the second pipe 240. At this time, the air will enter the second pipe 240 through the first pipe 230, and pass through the second pipe 240 and the second one-way valve 270 enter the electronic component area inside the test device body 100. When the drawer 210 and the pull-out sealing plate 220 move toward the side of the outer shell of the test device body 100, a large amount of air can be inhaled. It is only necessary to quickly push the drawer 210 and the pull-out sealing plate 220 into the first inner cavity 110, and a large amount of air will quickly enter the electronic component area of ​​the test device body 100. When a large amount of air enters the electronic component area, air will be discharged from the inside of the electronic component area, thereby realizing rapid ventilation of the air in the electronic component area, quickly extracting hot air, and then realizing rapid cooling, thereby reducing the working environment temperature of the electronic components, and increasing the service life of the electronic components inside the test device.

[0037] The above description is only an embodiment of the present application and is not intended to limit the scope of protection of the present application. For those skilled in the art, the present application may have various changes and variations. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present application should be included in the scope of protection of the present application. It should be noted that similar reference numerals and letters represent similar items in the following drawings, so once an item is defined in one drawing, it does not need to be further defined and explained in the subsequent drawings.

Claims

1. A chip testing device capable of rapidly cooling down, characterized in that: include Testing device body (100); A ventilation assembly (200), the ventilation assembly (200) comprising a drawer (210), a pull-out sealing plate (220), a first pipe (230), a second pipe (240), a third pipe (250), a first one-way valve (260) and a second one-way valve (270), the pull-out sealing plate (220) being fixedly connected to one side of the drawer (210), the drawer (210) and the pull-out sealing plate (220) being both slidably connected to the inside of the test device body (100), one side of the first pipe (230) being connected to the drawer (210) and the test device body (100), 00) is connected to the sliding connection area, the other side of the first pipe (230) is connected to one side of the second pipe (240), the other side of the second pipe (240) is connected to the outside of the test device body (100), the first one-way valve (260) is arranged outside the one side of the second pipe (240), the bottom of the third pipe (250) is connected to the second pipe (240), the upper part of the third pipe (250) is connected to the electronic component area inside the test device body (100), and the second one-way valve (270) is arranged outside the third pipe (250).

2. The chip testing device capable of rapid cooling according to claim 1, characterized in that: A first inner cavity (110) is provided inside the testing device body (100), and the drawer (210) and the drawer sealing plate (220) are both slidably connected inside the first inner cavity (110).

3. The chip testing device capable of rapid cooling according to claim 1, characterized in that: The testing device body (100) is provided with a second inner cavity (120), and one side of the first pipe (230), one side of the second pipe (240), one side of the third pipe (250), the first one-way valve (260) and the second one-way valve (270) are all located inside the second inner cavity (120).

4. The chip testing device capable of rapid cooling according to claim 1, characterized in that: The drawer (210) is provided with an elastic limiting member (280) on one side close to the outside of the test device body (100); the elastic limiting member (280) comprises a spring (281) and a limiting bead (282); one side of the spring (281) and the limiting bead (282) are both located inside the drawer (210); one side of the spring (281) abuts against the inside of the drawer (210); the other side of the spring (281) abuts against one side of the limiting bead (282); and the other side of the limiting bead (282) passes through the drawer (210) and abuts against the inside of the test device body (100).

5. The chip testing device capable of rapid cooling according to claim 4, characterized in that: The drawer (210) is provided with a pull ring (211) on one side of the elastic limiting member (280), and the pull ring (211) is rotatably connected to the drawer (210).

6. The chip testing device capable of rapid cooling according to claim 1, characterized in that: An ice bag box (241) is provided on one side of the second pipe (240), an ice bag is provided inside the ice bag box (241), and the ice bag box (241) is fixedly connected to the outside of the test device body (100).

7. The chip testing device capable of rapid cooling according to claim 6, characterized in that: A box cover (242) is hingedly connected to the upper part of the ice bag box (241), and the ice bag box (241) and the box cover (242) are connected via a buckle.

8. The chip testing device capable of rapid cooling according to claim 1, characterized in that: A wind head (251) is provided on one side of the upper portion of the third pipe (250), and an air outlet end of the wind head (251) faces an electronic component area provided inside the testing device body (100).

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