Test seat for SSD (Solid State Disk) storage device

Abstract

The utility model provides a test bench used for an SSD storage device, which comprises a pedestal, a base and a plurality of elastic probes, the pedestal comprises a pedestal body and a partition plate which are integrally arranged, the middle part of the upper end face of the pedestal body is provided with a first slot which penetrates downwards to the upper end face of the partition plate, and the elastic probes are arranged in the first slot. A second inserting groove upwards penetrating to the lower end face of the partition plate is formed in the middle of the lower end face of the base body, two rows of containing grooves are formed in the two sides of the first inserting groove, and two rows of extrusion grooves are formed in the positions, corresponding to the containing grooves, of the two sides of the partition plate; each elastic probe comprises a probe mounting part, and the probe mounting parts are mounted in the accommodating grooves in an interference manner; the base comprises a bottom plate and two rows of plug boards arranged on the two sides of the bottom plate. According to the mode, the base is matched with the containing groove, the moving path of the elastic probe in the assembling process is limited, and deviation of the elastic probe is prevented.

Description

Technical Field

[0001] The utility model relates to the field of solid state hard disk testing, in particular to a test socket for an SSD storage device. Background Art

[0002] In the use of existing functional test sockets, test sockets are used when performing functional tests on SSD solid state drives (Solid State Disk or Solid State Drive, SSD for short). Currently, most test sockets used by test manufacturers in the market are industrial test sockets. Although the functions can meet the test requirements, they have great defects in test life and are inconvenient to use in large-scale testing.

[0003] During the test socket assembly process, several elastic probes are configured on the test socket. However, during the assembly process, due to the large number of elastic probes, the manual insertion of the elastic probes is prone to problems such as elastic probe skew and position deviation, which affects the test effect. In addition, due to the small internal space of the test socket, it is difficult to make multiple adjustments to the elastic probes, resulting in slow overall assembly efficiency. Utility Model Content

[0004] In order to solve the above problems, the utility model provides a test socket for an SSD storage device which has a simple structure and effectively improves assembly efficiency.

[0005] The main contents of the utility model include: a base, a base and a plurality of elastic probes,

[0006] The base comprises an integrally arranged base body and a partition plate, the partition plate being arranged correspondingly at the middle part of the base body and extending horizontally along the length direction of the base body, a first slot penetrating downward to the upper end face of the partition plate is provided at the middle part of the upper end face of the base body, a second slot penetrating upward to the lower end face of the partition plate is provided at the middle part of the lower end face of the base body, two rows of receiving grooves are provided on both sides of the first slot, a single receiving groove extends along the thickness direction of the base body and penetrates to both sides of the second slot, the receiving grooves are respectively connected with the first slot and the second slot, two rows of extrusion grooves are provided on both sides of the partition plate at positions corresponding to the receiving grooves, and the extrusion grooves are connected with the receiving grooves;

[0007] A single elastic probe comprises a probe mounting portion, and the probe mounting portion is interference-mounted in the receiving groove;

[0008] The base includes a bottom plate and two rows of plug-in plates arranged on both sides of the upper end surface of the bottom plate. When the bottom plate is inserted into the second slot, the plug-in plates are correspondingly inserted into the extrusion groove and abut against the probe mounting portion.

[0009] Preferably, the probe mounting portion includes an upright mounting body, the lower end of the mounting body is provided with at least one set of barb structures, the accommodating groove is provided with an accommodating cavity at a position corresponding to the extrusion groove, and the barb structure can be interference fit in the accommodating cavity.

[0010] Preferably, the probe mounting portion is provided with a first test portion and a second test portion at one end along the length direction, the first test portion includes a first test tip formed by bending, which is used for electrically contacting with a gold finger of the SSD, and the first test tip extends into the first slot, and the second test portion includes a second test tip formed by bending, which is used for electrically contacting with a pad of a PCB board, and the second test tip extends to the bottom of the base body.

[0011] Preferably, two rows of receiving grooves are provided on both sides of the lower end surface of the base body corresponding to the second slot, a single receiving groove extends along the width direction of the base body and is connected to the accommodating groove, and the second testing part is extended in the receiving groove.

[0012] Preferably, two rows of avoidance grooves are provided on both sides of the upper end surface of the base body corresponding to the first slot, a single avoidance groove extends along the width direction of the base body and does not penetrate the base body, and the avoidance groove is communicated with the accommodating groove.

[0013] Preferably, a chamfered structure is correspondingly arranged on the upper end of the plug board.

[0014] Preferably, a single elastic probe is formed by bending an integrally formed plate with uniform thickness.

[0015] Preferably, a positioning body is further provided on the base, and the positioning body is transversely arranged along the width direction of the base and passes through the first slot.

[0016] Preferably, two ends of the bottom of the base are provided with positioning pins and fixing bolt holes, the positioning pins are matched with the positioning pin holes on the upper end of the PCB board, and the base is locked on the PCB board by fixing bolts.

[0017] The beneficial effects of the utility model are as follows: the base plug plate is abutted against the mounting body of the elastic probe to restrict the elastic probe between the accommodating groove and the plug plate, thereby restricting the horizontal movement of the elastic probe; the barb structure on the elastic probe is then used to assist in guiding the movement trajectory of the elastic probe, thereby ensuring that the elastic probe will not produce position deviation during the assembly process, thereby effectively improving the assembly efficiency of the test socket. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 This is a schematic diagram of the three-dimensional structure of a preferred embodiment;

[0019] Figure 2 This is a schematic diagram of a top view of a preferred embodiment;

[0020] Figure 3 This is a schematic diagram of the structure of a preferred embodiment when viewed from above;

[0021] Figure 4 for Figure 2 Schematic diagram of the cross-sectional structure of AA;

[0022] Figure 5 This is a schematic diagram of the three-dimensional structure of a base in a preferred embodiment;

[0023] Figure 6 This is a schematic diagram of the three-dimensional structure of an elastic probe according to a preferred embodiment;

[0024] Figure 7 This is a schematic diagram of the three-dimensional structure of a base in a preferred embodiment;

[0025] Reference numerals:

[0026] 1. base; 11. base body; 111. first slot; 112. second slot; 113. receiving slot; 114. avoidance slot; 115. receiving slot; 12. partition plate; 121. extrusion slot; 13. positioning body;

[0027] 2. Base; 21. Bottom plate; 22. Insert plate;

[0028] 3. Elastic probe; 31. Probe mounting portion; 311. Mounting body; 312. Barb structure; 32. First test portion; 321. First test tip; 33. Second test portion; 331. Second test tip. DETAILED DESCRIPTION

[0029] The technical solution protected by the utility model is described in detail below with reference to the accompanying drawings.

[0030] like Figure 1 As shown, the present application discloses a test socket for an SSD storage device, which comprises a base 1, a base 2 and a plurality of elastic probes 3. The elastic probes 3 are correspondingly inserted into the base 1, and during the assembly process, the movement of the elastic probes 3 during assembly is limited by the cooperation of the base 2, thereby ensuring that during the assembly process, the insertion process of the elastic probes 3 will not cause deviation, which will affect the assembly speed.

[0031] like Figure 1-5As shown, the base 1 includes an integrally injection-molded base body 11 and a partition plate 12, wherein the partition plate 12 is horizontally arranged in the middle of the base body 11 and extends horizontally along the length direction of the base body 11. A first slot 111 is provided in the middle of the upper end surface of the base body 11, and the first slot 111 penetrates downwardly along the thickness direction of the base body 11 to the upper end surface of the partition plate 12, and the first slot 111 is used to insert the SSD; a second slot 112 is provided in the middle of the lower end surface of the base body 11, and the second slot 112 penetrates upwardly along the thickness direction of the base body 11 to the lower end surface of the partition plate 12, and the second slot 112 is used to insert the base 2; wherein, both the first slot 111 and the second slot 112 extend along the length direction of the base body 11 and do not penetrate through both ends of the base body 11. Two rows of receiving grooves 113 are formed on both sides of the first slot 111 , and a single receiving groove 113 passes through the thickness direction of the base body 11 to both sides of the second slot 112 , and the receiving groove 113 is connected to the first slot 111 and the second slot 112 , respectively. The receiving groove 113 is used to receive the elastic probe 3 .

[0032] like Figure 1-5 As shown, preferably, two rows of receiving grooves 115 are provided on both sides of the lower end surface of the base body 11 corresponding to the second slot 112, and a single receiving groove 115 extends along the width direction of the base body 11 and is interconnected with the receiving groove 113. When the elastic probe 3 is installed in the receiving groove 113, the lower end of the elastic probe 3 is correspondingly extended and arranged in the receiving groove 115 to prevent the bottom end of the elastic probe 3 from being displaced or deformed due to other interference.

[0033] like Figure 1-4 As shown, two rows of avoidance grooves 114 are provided on both sides of the upper end surface of the base body 11 corresponding to the first slot 111. A single avoidance groove 114 extends along the width direction of the base body 11 and does not penetrate the side wall of the base body 11. The avoidance groove 114 is connected with the accommodating groove 113. When the elastic probe 3 is installed in the accommodating groove 113, if the elastic probe 3 is deformed by external force, the upper end of the elastic probe 3 abuts against the groove wall of the avoidance groove 114, and the groove wall of the avoidance groove 114 applies a reverse force to the upper end of the elastic probe 3.

[0034] like Figure 1-5 As shown, extrusion grooves 121 are opened at the positions of the receiving grooves 113 on both sides of the partition plate 12, and the extrusion grooves 121 penetrate from the upper end surface of the partition plate 12 to the lower end surface of the partition plate 12 along the thickness direction of the base body 11. The extrusion grooves 121 and the corresponding receiving grooves 113 are interconnected. When the elastic probe 3 is placed in the receiving groove 113, the base 2 can be correspondingly inserted into the extrusion groove 121 and partially placed in the receiving groove 113, and abut against the elastic probe 3 to limit the movement of the elastic probe 3 in the horizontal direction.

[0035] like Figure 6As shown, a single elastic probe 3 includes a probe mounting portion 31, and the two ends of the probe mounting portion 31 along the length direction are respectively provided with a first test portion 32 and a second test portion 33. In this embodiment, the elastic probe 3 is formed as a whole by bending a plate with uniform thickness, that is, the probe mounting portion 31, the first test portion 32 and the second test portion 33 are an integral structure, and the thickness of each part is the same, so that in actual manufacturing, after processing the blank, the elastic probe 3 can be obtained by bending according to the set requirements, and the molding process is simple.

[0036] like Figure 1-6 As shown, the probe mounting portion 31 is interference-fitted in the receiving groove 113 to fix the position of the elastic probe 3. Specifically, a receiving cavity (not shown) is provided at the position of the receiving groove 113 corresponding to the extrusion groove 121, and the width of the receiving cavity is slightly larger than the width of the receiving groove 113, so as to adapt the width of the barb structure 312. The probe mounting portion 31 includes a vertically arranged mounting body 311, and the mounting body 311 is interference-fitted in the receiving cavity. In this embodiment, at least one group of barb structures 312 are convexly provided on the lower part of the mounting body 311, and the barb structures 312 are correspondingly interference-fitted in the receiving cavity, so that the elastic probe 3 is stably assembled in the receiving groove 113. Preferably, the barb structure 312 is set as an inverted triangle structure, which plays a guiding role in the insertion process of the elastic probe 3, and the inverted triangle structure is adapted to the receiving cavity to guide and limit the moving trajectory of the elastic probe 3 during the insertion process, so that the clamping effect is achieved while improving the smoothness of the insertion process of the elastic probe 3.

[0037] like Figure 4-6 As shown, the first test portion 32 includes a first test tip 321 formed by bending, which is used to electrically contact the gold finger of the SSD. When the elastic probe 3 is installed in the receiving groove 113 and the mounting body 311 is fixedly engaged in the receiving cavity, the elastic probe 3 is subjected to external force, and its first test tip 321 protrudes from the receiving groove 113 and is correspondingly placed in the first slot 111. The second test portion 33 includes a second test tip 331 formed by bending, which is used to electrically contact the pad of the PCB board.

[0038] like Figure 1-7 As shown, the base 2 specifically includes a bottom plate 21, and two rows of plug-in boards 22 are correspondingly arranged on the bottom plate 21. The width of the bottom plate 21 corresponds to the width of the second slot 112, and the spacing of the plug-in boards 22 thereon are adapted to the spacing of the accommodating grooves 113 on both sides. During the test seat assembly process, the plug-in boards 22 on the base 2 are used to assist the assembly action of the elastic probe 3, which can effectively improve the speed of the test seat assembly process and ensure that the elastic probe 3 will not deviate during assembly. Preferably, a chamfered structure is correspondingly arranged on the upper end of the plug-in board 22 to facilitate the insertion action and reduce hard collisions.

[0039] like Figure 1 As shown, preferably, in order to realize the rapid positioning and error prevention of the SSD to be tested and the test socket, a positioning body 13 is further provided on the base 1, and the positioning body 13 is transversely arranged along the width direction of the base 1 and passes through the first slot. When the SSD to be tested is inserted, the positioning body 13 is adapted to the opening of the insertion end of the SSD.

[0040] Preferably, in this embodiment, the base is injection molded with PA9T material, which is easy to shape during injection molding, has high heat resistance, and will not produce bubbles when tested at 280 degrees. In a high temperature environment, the mechanical strength and rigidity decrease less, and the bonding line strength and recyclability are good.

[0041] Preferably, the bottom ends of the base are provided with positioning pins and fixing bolt holes, the positioning pins are matched with the positioning pin holes on the upper end of the PCB board, and the base is locked on the PCB board by fixing bolts. When the two need to be separated, only the corresponding bolts or screws need to be removed.

[0042] Working principle:

[0043] During the test seat assembly process, the elastic probe 3 is first inserted into the base body 11 from the bottom, the upright part of the upper end of the mounting body 311 is placed in the receiving groove 113, and the barb structure 312 part of the mounting body 311 and the second test part 33 below are both placed below the base body 11; then the base 2 is correspondingly inserted into the extrusion groove 121, the plug plate 22 part of the base 2 is placed in the receiving groove 113 and pushes against the mounting body, so that the mounting body 311 is restricted in the receiving groove 113, so that the elastic probe 3, the base 1 and the base 2 are all in a preliminary stable state; the test seat is pressed down as a whole, and the mounting body 311 of the elastic probe 3 is pushed completely into the receiving groove, and its barb structure 312 is correspondingly engaged in the receiving cavity, thereby completing the overall assembly of the test seat.

[0044] The above description is only an embodiment of the present invention, and does not limit the patent scope of the present invention. Any equivalent structure or equivalent process transformation made by using the contents of the specification and drawings of the present invention, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present invention.

Claims

1. A test socket for an SSD storage device, characterized in that: Mainly include: A base, a base and several elastic probes, The base comprises an integrally arranged base body and a partition plate, the partition plate being arranged correspondingly at the middle part of the base body and extending horizontally along the length direction of the base body, a first slot penetrating downward to the upper end face of the partition plate is provided at the middle part of the upper end face of the base body, a second slot penetrating upward to the lower end face of the partition plate is provided at the middle part of the lower end face of the base body, two rows of receiving grooves are provided on both sides of the first slot, a single receiving groove extends along the thickness direction of the base body and penetrates to both sides of the second slot, the receiving grooves are respectively connected with the first slot and the second slot, two rows of extrusion grooves are provided on both sides of the partition plate at positions corresponding to the receiving grooves, and the extrusion grooves are connected with the receiving grooves; A single elastic probe comprises a probe mounting portion, and the probe mounting portion is interference-mounted in the receiving groove; The base includes a bottom plate and two rows of plug-in plates arranged on both sides of the upper end surface of the bottom plate. When the bottom plate is inserted into the second slot, the plug-in plates are correspondingly inserted into the extrusion groove and abut against the probe mounting portion.

2. A test socket for an SSD storage device according to claim 1, characterized in that: The probe mounting portion includes an upright mounting body, the lower end of which is provided with at least one set of barb structures, the accommodating groove is provided with an accommodating cavity at a position corresponding to the extrusion groove, and the barb structure can be interference-fitted in the accommodating cavity.

3. A test socket for an SSD storage device according to claim 1, characterized in that: The probe mounting portion is provided with a first test portion and a second test portion at one end along the length direction, wherein the first test portion includes a first test tip formed by bending, which is used for making electrical contact with a gold finger of the SSD, and the first test tip extends into the first slot, and the second test portion includes a second test tip formed by bending, which is used for making electrical contact with a pad of a PCB board, and the second test tip extends to the bottom of the base body.

4. A test socket for an SSD storage device according to claim 3, characterized in that: Two rows of receiving grooves are provided on the lower end surface of the base body corresponding to both sides of the second slot, a single receiving groove extends along the width direction of the base body and is connected to the accommodating groove, and the second testing part is extended in the receiving groove.

5. The test socket for an SSD storage device according to claim 3, characterized in that: Two rows of avoidance grooves are provided on the upper end surface of the base body corresponding to both sides of the first slot, a single avoidance groove extends along the width direction of the base body and does not penetrate the base body, and the avoidance groove is communicated with the accommodating groove.

6. The test socket for an SSD storage device according to claim 1, characterized in that: A chamfered structure is correspondingly arranged on the upper end of the plug board.

7. The test socket for an SSD storage device according to claim 1, characterized in that: A single elastic probe is formed by bending an integrally formed plate body with uniform thickness.

8. The test socket for an SSD storage device according to claim 1, characterized in that: The base is also provided with a positioning body, which is arranged transversely along the width direction of the base and passes through the first slot.

9. The test socket for an SSD storage device according to claim 1, characterized in that: The two ends of the bottom of the base are provided with positioning pins and fixing bolt holes, the positioning pins are matched with the positioning pin holes on the upper end of the PCB board, and the base is locked on the PCB board by fixing bolts.

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