Test fixture and test module

Abstract

The utility model provides a test fixture and a test module. The test fixture comprises a test substrate and a plurality of crimping devices which are configured on the test substrate and are used for bearing and fixing products to be tested. The test fixture also comprises switching structures which are arranged between the crimping devices and the test substrate and are in one-to-one correspondence with the crimping devices. The switching structure comprises a first electric connecting piece and a test point which is electrically conducted with the first electric connecting piece; and the first electric connecting piece and the test point are electrically conducted with the test substrate and the crimping device respectively, so that the electric connecting end of the to-be-tested product is electrically conducted with the test substrate. According to the test fixture, when the surface of a test point is oxidized or damaged, the whole test substrate does not need to be replaced, the maintenance cost is low, and the maintenance period is short.

Description

Technical Field

[0001] The utility model relates to the technical field of product testing, and more specifically, to a testing fixture and a testing module. Background Art

[0002] The traditional test fixture realizes signal conduction by contacting the test points on the test substrate with the probes of the product conduction device, and the product also contacts the probes of the product conduction device, and the sockets on the test substrate and the sockets of the light board are plugged in and connected, so that the seven states of each product test are displayed. The test status of the product can be clearly judged by the LED light, and whether there is an error mode in the product test status can also be judged according to the "on" and "off" of the LED light. However, the above traditional method of direct contact between the test points and the probes on the test substrate has disadvantages. Once the surface of the test points on the test substrate is oxidized or damaged, it will lead to problems such as inability to perform testing or poor test contact. The entire test substrate needs to be replaced, with high maintenance costs and long repair cycles, affecting customer experience. In addition, the connection method of the sockets on the test substrate and the sockets on the light board is plugged in and connected, which will affect the service life of the light board assembly and the test substrate due to the inconvenience of plugging and unplugging, and there is also the problem of poor contact. Utility Model Content

[0003] In view of the above problems, the utility model provides a test fixture and a test module, which realizes that when the surface of the test point is oxidized or damaged, there is no need to replace the entire test substrate, and the maintenance cost is low and the repair cycle is short.

[0004] In order to achieve the above purpose, the utility model adopts the following technical solutions:

[0005] The utility model provides a test fixture, comprising:

[0006] A test substrate and a plurality of crimping devices disposed on the test substrate for carrying and fixing the product to be tested;

[0007] The test fixture also includes a transition structure that is arranged between the crimping device and the test substrate and corresponds to the crimping device one by one; the transition structure includes a first electrical connector and a test point that is electrically connected to the first electrical connector; the first electrical connector and the test point are respectively electrically connected to the test substrate and the crimping device so that the electrical connection end of the product to be tested is electrically connected to the test substrate.

[0008] A preferred solution is that the adapter structure further includes a plate body, and the first electrical connector and the test point are respectively arranged on two opposite sides of the plate body.

[0009] A preferred solution is that the crimping device includes a second electrical connector for contacting and conducting with the electrical connection end of the product to be tested; the plate body is fixed to the crimping device and the second electrical connector is in stable contact and conduction with the test point.

[0010] A preferred solution is that the test substrate includes a backing plate, a first circuit board and a second circuit board which are arranged in sequence; a receiving groove corresponding to the crimping device is formed on the backing plate; the receiving groove passes through two opposite side walls of the backing plate; the test substrate includes a third electrical connector; the third electrical connector is exposed from the receiving groove; and the second circuit board is electrically connected to the first circuit board.

[0011] A preferred solution is that the first circuit board also includes a supporting stud exposed by the accommodating groove; the crimping device is screwed to the supporting stud and fixed in the accommodating groove; the crimping device can be electrically connected to the test substrate through the plug-in cooperation of the first electrical connector and the third electrical connector.

[0012] A preferred solution is that the crimping device also includes a base and a pressing plate that can be flipped up and down relative to the base; the base includes a cavity for supporting and fixing the product to be tested; the head end of the second electrical connector is exposed by the bottom wall of the cavity, and the tail end is exposed by the bottom wall of the base.

[0013] A preferred solution is that the test fixture further comprises a light board assembly fixed to the test substrate and electrically connected thereto; the light board assembly is configured to display a test status of a product to be tested that is supported and fixed on the crimping device.

[0014] A preferred solution is that the test substrate and the light board assembly are connected via a flat cable; the test substrate includes a first connector, and the light board assembly includes a second connector; one end of the flat cable is plugged into and connected to the first connector, and the other end is plugged into and connected to the second connector.

[0015] Preferably, the socket orientation of the first connector is perpendicular to the socket orientation of the second connector.

[0016] The utility model also provides a test module, comprising a fixture frame and a plurality of test fixtures as described above; the fixture frame is used for carrying the test fixtures.

[0017] The beneficial effects of the utility model are:

[0018] The utility model cooperates with a test substrate, a crimping device and an adapter structure, and utilizes the adapter structure to connect the third electrical connector and the second electrical connector so that the electrical connection end of the product to be tested can be electrically connected to the test substrate, thereby enabling product testing, and replaces the test point on the test substrate with the third electrical connector for electrical connection with the first electrical connector, while the test point is set on the adapter structure to be in contact with the second electrical connection. Therefore, when the surface of the test point is oxidized or damaged, resulting in the inability to test or poor test contact, there is no need to replace the entire test substrate, but only the corresponding adapter structure can be disassembled, replaced and installed, with low maintenance cost and short repair cycle. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] The specific implementation of the utility model is further described in detail below with reference to the accompanying drawings.

[0020] Figure 1 It is a structural schematic diagram of the test module of the utility model.

[0021] Figure 2 It is a structural schematic diagram of the test fixture of the utility model.

[0022] Figure 3 It is an assembly schematic diagram of the test fixture of the utility model.

[0023] Figure 4 It is a schematic diagram of the cooperation between the first circuit board and the light board assembly of the utility model.

[0024] Figure 5 It is a schematic diagram of the cooperation between the crimping device of the utility model and the first circuit board.

[0025] Figure 6 It is an assembly schematic diagram of the crimping device of the utility model.

[0026] Figure numerals: 1. test substrate; 11. first connector; 12. lining plate; 13. first circuit board; 14. second circuit board; 15. third electrical connector; 121. receiving groove; 131. supporting stud; 2. crimping device; 21. second electrical connector; 22. base; 221. cavity; 23. pressing plate; 24. card body; 25. hook; 31. first electrical connector; 32. test point; 33. board body; 4. lamp board assembly; 41. second connector; 42. cable; 43. handle; 5. product to be tested; 10. test fixture; 20. fixture rack. DETAILED DESCRIPTION

[0027] Various exemplary embodiments of the present invention will now be described in detail with reference to the accompanying drawings. It should be noted that unless otherwise specifically stated, the relative arrangements of components and steps, numerical expressions and numerical values ​​set forth in these embodiments do not limit the scope of the present invention.

[0028] The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the present invention, its application, or uses.

[0029] Techniques and equipment known to ordinary technicians in the relevant art may not be discussed in detail, but where appropriate, the techniques and equipment should be considered part of the specification.

[0030] In all examples shown and discussed herein, any specific values ​​should be interpreted as merely exemplary and not as limiting. Therefore, other examples of the exemplary embodiments may have different values.

[0031] It should be noted that like reference numerals and letters refer to similar items in the following figures, and therefore, once an item is defined in one figure, it need not be further discussed in subsequent figures.

[0032] In order to solve the problem that when the test point surface of the traditional test substrate is oxidized or damaged, the entire test substrate needs to be replaced, which has high maintenance costs and long repair cycles, affecting customer experience. Figures 1 to 6 As shown, specifically, the test fixture 10 includes: a test substrate 1, the test substrate 1 includes a third electrical connector 15; and a plurality of crimping devices 2 arranged on the test substrate 1 for supporting and fixing the product to be tested 5; the crimping device 2 includes a second electrical connector 21 for contacting and conducting with the electrical connection end of the product to be tested 5; the test fixture 10 also includes a transition structure arranged between the crimping device 2 and the test substrate 1 in a one-to-one correspondence with the crimping device 2; the transition structure includes a first electrical connector 31 and a test point 32 electrically connected to the first electrical connector 31; the first electrical connector 31 and the test point 32 are electrically connected to the third electrical connector 15 and the second electrical connector 21 respectively so that the electrical connection end of the product to be tested 5 and the test substrate 1 are electrically connected. In the utility model, the test point on the test substrate 1 is eliminated, and a third electrical connector is added to the test substrate 1; and a transfer structure is fixed at the bottom of the crimping device 2, and the test point is set on the transfer structure to achieve electrical conduction between the transfer structure and the test substrate 1 and the crimping device 2, thereby completing the product test. Based on the advantages of a single transfer structure with low production cost and easy disassembly and installation, the problem of high cost and long maintenance cycle caused by direct replacement of the entire test substrate when the test point surface is oxidized or damaged is solved.

[0033] In a specific embodiment, the adapter structure also includes a plate body 33, and the first electrical connector 31 and the test point 32 are respectively arranged on two opposite sides of the plate body 33 to respectively correspond to the test substrate 1 and the crimping device 2. More specifically, the first electrical connector 31 is arranged on the bottom wall of the plate body 33 and is plugged and connected with the third electrical connector 15 on the test substrate 1, and the test point 32 is arranged on the top wall of the plate body 33 and is in contact and connected with the second electrical connector 21 of the crimping device 2; and the first electrical connector 31 and the test point 32 are conductive, thereby achieving electrical conductivity between the test substrate 1 and the product to be tested 5.

[0034] Furthermore, the plate body 33 is fixed to the crimping device 2 and the second electrical connector 21 is stably in contact with the test point 32 and is in conduction; the crimping device 2 can be electrically connected to the test substrate 1 through the plug-in cooperation of the first electrical connector 31 and the third electrical connector 15; the second electrical connector 21 is a probe, and after the plate body 33 is fixed to the crimping device 2, the end of the probe can maintain stable contact with the test point 32; the first electrical connector 31 is a plug connector, and the third electrical connector 15 is a plug connector, and the electrical connection between the crimping device 2 and the test substrate 1 is achieved by directly inserting the first electrical connector 31 into the third electrical connector 15. In this embodiment, by fixing the adapter structure on the basis of the crimping device 2, designing the test point 32 on the adapter structure, aligning the test point 32 on the adapter structure with the probe inside the crimping device 2, and then fastening the adapter structure to the bottom of the crimping device 2 by screws and pins, this method can better protect the probe, avoid damage to the probe due to uneven placement of the crimping device 2, improve production efficiency, and save costs.

[0035] In a specific embodiment, the test fixture 10 further includes a light board assembly 4 which is fixedly connected to the test substrate 1 and electrically conductive; the light board assembly 4 is configured to display the test status of the product to be tested 5 which is supported and fixed on the crimping device 2. The test substrate 1 is electrically conductively connected to the crimping device 2, so that the electrical connection end of the product to be tested 5 and the light board assembly 4 can be electrically conductively connected through the crimping device 2. It should be noted that the light board assembly 4 can be an LED substrate, and the LED substrate includes indicator lights corresponding to different test states of each product. The indicator lights can display the test status of all products, with less wiring harnesses, convenient maintenance, a large number of tests, and clear display of the test status. When there is an abnormality in the test of one of the products, it can be accurately known which channel and which mode has an error. Furthermore, the test substrate 1 and the LED substrate are connected via a flat cable 42; the test substrate 1 includes a first connector 11, and the LED substrate includes a second connector 41; one end of the flat cable 42 is plugged into and connected to the first connector 11, and the other end is plugged into and connected to the second connector 41, thereby achieving electrical conduction between the LED substrate and the test substrate 1. Since the existing light board assembly and the test substrate are directly plugged into and connected to each other through a socket, this connection method will cause inconvenience in plugging and unplugging and affect the service life of the light board assembly and the test substrate, and there is also a problem of poor contact; in order to solve the above problems, the utility model additionally adds a flat cable 42, one end of the flat cable 42 is inserted into the first connector 11 of the test substrate 1 to achieve interconnection, and the other end of the flat cable 42 is inserted into the second connector 41 of the light board assembly 4 to achieve interconnection, which can facilitate disassembly and assembly, increase the service life of the test substrate 1 and the light board assembly 4, and improve the contact.

[0036] In the above embodiment, in order to provide operating space to facilitate the plugging and unplugging operations between the flat cable 42 and the connector, the socket of the first connector 11 is oriented perpendicular to the socket of the second connector 41. Specifically, the socket of the first connector 11 is vertically facing upward or downward, and the socket of the second connector 41 is horizontally facing left or right.

[0037] In a specific embodiment, the test substrate 1 includes a backing plate 12, a first circuit board 13 and a second circuit board 14 which are arranged in sequence, wherein the first circuit board 13 is an adapter board, and the second circuit board 14 is a test board for driving the test; a receiving groove 121 corresponding to the crimping device 2 is formed on the backing plate 12; the receiving groove 121 passes through two opposite side walls of the backing plate 12; the third electrical connector 15 is arranged on the first circuit board 13 and exposed by the receiving groove 121; the second circuit board 14 is electrically connected with the first circuit board 13; when the first electrical connector 31 and the third electrical connector 15 need to be plugged and connected, the adapter structure needs to completely enter the receiving groove 121, and the crimping device 2 can be limited by the receiving groove 121.

[0038] Furthermore, the first circuit board 13 also includes a vertically arranged support stud 131 exposed by the accommodating groove 121; the base 22 of the crimping device 2 is screwed to the support stud 131 by bolts and the base 22 is limited and fixed in the accommodating groove 121, at this time, the first electrical connector 31 and the third electrical connector 15 are stably plugged in and conductive; each accommodating groove 121 corresponds to a channel, two third electrical connectors 15 are arranged in each channel, and two first electrical connectors 31 are correspondingly arranged on the bottom wall of the plate body 33 of each adapter structure; the utility model greatly reduces the production cost of the test substrate by setting the traditional support studs on the back of each channel to the front and eliminating all test points on the first circuit board, and can realize the testing of multiple products at the same time and display the test status of a single product.

[0039] In a specific embodiment, the crimping device 2 also includes a base 22 and a pressing plate 23 that can be flipped up and down relative to the base 22; the top wall of the base 22 includes a cavity 221 for supporting and fixing the product to be tested 5; the head end of the second electrical connector 21 is exposed by the bottom wall of the cavity 221, and the tail end is exposed by the bottom wall of the base 22; the head end of the second electrical connector 21 is in contact and conduction with the electrical connection end of the product to be tested 5, and the tail end of the second electrical connector 21 is in contact and conduction with the test point 32 of the adapter structure. In order to keep the electrical connection end between the second electrical connector 21 and the product to be tested 5 always in a conducting state when testing the product to be tested, the test fixture 10 also includes a hook component; the hook component at least includes: a card body 24 formed on the base 22; and a hook 25 located on the pressing plate 23 and corresponding to the card body 24.

[0040] The utility model also provides a test module, which includes a fixture rack 20 and a plurality of test fixtures 10 as described above; the fixture rack 20 is used to carry the test fixtures 10. The specific structure of the test fixture 10 of the test module refers to the above embodiment. Since the test module adopts all the technical solutions of the above embodiment, it has at least all the beneficial effects brought by the technical solutions of the above embodiment, which will not be repeated here; by integrating and placing multiple test fixtures 10 on the fixture rack 20, the test efficiency is further improved.

[0041] In addition, in order to facilitate the extraction of the test jig 10 from the jig rack 20 or the pushing of the test jig 10 into the jig rack 20 , a handle 43 for pushing and pulling the test jig 10 on the jig rack 20 is provided on the light board assembly 4 .

[0042] The specific working process of the utility model is as follows: ① place the product 5 to be tested into the cavity 221 of the crimping device 2 and fix it; ② close the pressing plate 23 of the crimping device 2 downward, and clamp the hook 25 and the card body 24; ③ insert the test fixture 10 into the fixture frame 20; ④ put it into the aging box; ⑤ start testing.

[0043] To summarize, the utility model cooperates with the test substrate, the crimping device and the adapter structure, and utilizes the adapter structure to connect the third electrical connector and the second electrical connector so that the electrical connection end of the product to be tested can be electrically connected to the test substrate, thereby enabling product testing. The third electrical connector replaces the test point on the test substrate for electrical connection with the first electrical connector, and the test point is set on the adapter structure to be in contact and connected with the second electrical connection. Therefore, when the surface of the test point is oxidized or damaged, resulting in the inability to test or poor test contact, there is no need to replace the entire test substrate, but the corresponding adapter structure can be disassembled, replaced and installed separately, with low maintenance costs and short repair cycles.

[0044] Obviously, the above embodiments of the present invention are merely examples for clearly illustrating the present invention, and are not limitations on the implementation methods of the present invention. For ordinary technicians in the relevant field, other different forms of changes or modifications can be made based on the above description. It is impossible to list all the implementation methods here. All obvious changes or modifications derived from the technical solution of the present invention are still within the scope of protection of the present invention.

Claims

1. A test fixture, characterized in that: include: A test substrate and a plurality of crimping devices disposed on the test substrate for carrying and fixing the product to be tested; The test fixture also includes a transition structure that is arranged between the crimping device and the test substrate and corresponds to the crimping device one by one; the transition structure includes a first electrical connector and a test point that is electrically connected to the first electrical connector; the first electrical connector and the test point are respectively electrically connected to the test substrate and the crimping device so that the electrical connection end of the product to be tested is electrically connected to the test substrate.

2. The test fixture according to claim 1, characterized in that: The adapter structure also includes a plate body, and the first electrical connector and the test point are respectively arranged on two opposite sides of the plate body.

3. The test fixture according to claim 2, characterized in that: The crimping device comprises a second electrical connector for contacting and conducting with the electrical connection end of the product to be tested; the plate body is fixed to the crimping device and the second electrical connector is in stable contact and conduction with the test point.

4. The test fixture according to claim 1, characterized in that: The test substrate includes a backing plate, a first circuit board and a second circuit board arranged in sequence; a receiving groove corresponding to the crimping device is formed on the backing plate; the receiving groove passes through two opposite side walls of the backing plate; the test substrate includes a third electrical connector; the third electrical connector is exposed by the receiving groove; the second circuit board is electrically connected to the first circuit board.

5. The test fixture according to claim 4, characterized in that: The first circuit board also includes a supporting stud exposed by the receiving groove; the crimping device is screwed to the supporting stud and fixed in the receiving groove; the crimping device can be electrically connected to the test substrate through the plug-in cooperation of the first electrical connector and the third electrical connector.

6. The test fixture according to claim 3, characterized in that: The crimping device also includes a base and a pressing plate that can be flipped up and down relative to the base; the base includes a cavity for supporting and fixing the product to be tested; the head end of the second electrical connector is exposed from the bottom wall of the cavity, and the tail end is exposed from the bottom wall of the base.

7. The test fixture according to claim 1, characterized in that: The test fixture also includes a light board assembly fixed to the test substrate and electrically connected; the light board assembly is configured to display the test status of the product to be tested that is carried and fixed on the crimping device.

8. The test fixture according to claim 7, characterized in that: The test substrate and the light board assembly are connected via a flat cable; the test substrate includes a first connector, and the light board assembly includes a second connector; one end of the flat cable is plugged and connected to the first connector, and the other end is plugged and connected to the second connector.

9. The test fixture according to claim 8, characterized in that: The socket orientation of the first connector is perpendicular to the socket orientation of the second connector.

10. A test module, characterized in that: It comprises a fixture frame and a plurality of test fixtures as described in any one of claims 1 to 9; the fixture frame is used to carry the test fixtures.

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