The invention belongs to the technical field of analysis and testing of impurities in high-purity samples, and particularly relates to an ICP-MS (
Inductively Coupled Plasma Mass Spectrometry) detection method for trace impurities in high-purity
yellow phosphorus. Through accurate weighing of a
yellow phosphorus sample and a mixed acid-
microwave digestion technology, the sample is rapidly dissolved under high-temperature and high-pressure conditions, and the sample is diluted and then directly detected on a
machine; the
yellow phosphorus sample pretreatment and on-
machine measurement efficiency is improved. The method mainly comprises the following steps: S1, weighing a yellow
phosphorus sample; s2, sample
digestion; and S3, ICP-MS
machine detection is carried out. According to the method, a yellow
phosphorus sample is digested by adopting a mixed acid-
microwave digestion method and then is detected by adopting an ICP-MS (
Inductively Coupled Plasma Mass Spectrometry), and a proper amount of
oxalic acid is added into the digested
nitric acid, so that elements such as impurities As, Mg, Na, Ca and Fe in the yellow
phosphorus sample can be effectively dissolved and released within a short time; in the detection process, a collision reaction tank mode is adopted to eliminate element interference, 23 trace
impurity elements can be detected at the same time, the detection efficiency is high, the detection time of each batch of samples is shortened to be within 4 h, and the
detection limit of each element is reduced to 10 ppt or below.