Method for testing CPU system performance

A central processing unit and system performance technology, applied in the direction of electrical digital data processing, instrumentation, error detection/correction, etc., can solve problems such as difficulty in maintaining the highest level of memory usage, reduction of CPU and memory usage, and memory usage. Achieve the effect of improving the test effect, shortening the time, and increasing the occupancy rate

Inactive Publication Date: 2009-04-15
HUAWEI TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] 1) Commercial test software usually focuses on how to make the CPU run at full capacity, but it is difficult to keep the memory usage at the highest level all the time
[0009] 2) Commercial test software needs to be supported by the computer operating system to run, and cannot be directly placed on the single board of the communication device to run
[0010] 3) Although the method of running the game seems to be effective, it is time-consuming and labor-intensive. Once the game is stopped, the CPU and memory usage will be significantly reduced. It is impossible to guarantee that the CPU will continue to run at full capacity for a long time , it is impossible to occupy a large amount of memory for a long time
And this method can be used in the whole machine test of the computer, but it is impossible to use it in the single board test of the communication equipment

Method used

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  • Method for testing CPU system performance
  • Method for testing CPU system performance

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Embodiment Construction

[0032] In order to make the purpose, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0033] The core idea of ​​the present invention is: the CPU system can use its own operating system management memory mechanism to continuously allocate memory buffers, reduce free memory, and use the existing memory unit test algorithm to cycle test the allocated memory blocks , so that when the CPU system test is performed, the CPU and memory of the system can maintain a high occupancy rate for a long time.

[0034] see figure 1 , figure 1 It is a flow chart of the CPU system performance testing method of the present invention. Such as figure 1 As shown, the process includes the following steps:

[0035] Step 101, allocating the memory of the CPU system.

[0036] Here, the allocation may be performed by defining an array of memory ...

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Abstract

A method for testing performance of central processor system includes continuously distributing internal memory module by CPU in utilizing character of using operation system to manage internal memory till all internal memories are exhausted, utilizing existed internal memory unit test means to carry out cyclic test on all internal memory block being distributed with internal memory for realizing to have high acquisition ratio of CPU and internal memory at long time in test course so as to raise quality and effect of performance test.

Description

technical field [0001] The invention relates to a testing method, in particular to a central processing unit system performance testing method. Background technique [0002] At present, with the development of communication technology, there are more and more types of single boards, and the running speed is faster and faster, so higher requirements are put forward for the performance of the single boards. The central processing unit (CPU) system on the single board generally includes: CPU, synchronous dynamic random access memory (SDRAM) and flash memory (FLASH), where the FLASH refers specifically to the FLASH for storing the basic input output system (BIOS). [0003] Wherein, the CPU is the core of the board, and is used to execute various operations specified by the board software. SDRAM is a dynamic memory. After the board is powered off, the program or data stored in SDRAM will be lost, and the CPU can quickly read and write to SDRAM. FLASH is an electrically erasable...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/00
Inventor 朱星海
Owner HUAWEI TECH CO LTD
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