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Connection unit

A technology for connecting units and connectors, which can be used in electronic circuit testing, measuring device casings, etc., and can solve problems such as difficulties

Inactive Publication Date: 2008-05-28
ADVANTEST CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0016] However, since the connector on the side of the connection unit is fixed, it is difficult to connect the performance board with the connector at a different position to the connection unit

Method used

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Embodiment Construction

[0128] The specific structures, features and functions of the connection unit, the measured component mounting board, the probe card and the component interface part according to the present invention will be described in detail below in conjunction with the accompanying drawings and preferred embodiments.

[0129] Although the following examples illustrate the present invention, the following examples do not limit the patent scope of the present application, and all combinations of features in the examples are not limited to the solution means of the present invention.

[0130] FIG. 1 is a schematic diagram of an embodiment of the measured component mounting board of the present invention, and parts corresponding to those in FIG. 15 are given the same symbols, and thus detailed descriptions thereof are omitted.

[0131] In this example, the measured component mounting board 50 having a multilayer printed wiring board structure, the electrode pads 21, 22 on the upper and lower ...

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PUM

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Abstract

The invention relates to a connection unit, a DUT mounting board, a detecting probe card and an interface part for the assembly. The connection unit is suitable for electrically connecting a DUT mounting board and a testing apparatus, wherein, the DUT mounting board is mounted with an IC socket, and the testing apparatus is used for testing an electronic device inserted into the IC socket. The connection unit has a holding substrate provided to face the DUT mounting board and a connection-unit-side connector, which is provided on the holding substrate to be able to change a position of the connection-unit-side connector on the holding substrate, for being connected to a performance-board-side connector included in the DUT mounting board. The DUT mounting board can reduce end capacity in through hole part, thus to obtain the DUT mounting board matching high speed signals. The interface part of the IC socket testing apparatus is provided with the DUT mounting board, even with high speed signals, good wave shape quality can be acquired, and high speed experiment can be performed. The connection unit can connect with complex properties plates or detecting probe cards to accurately test IC assembly.

Description

[0001] The application number is 03801058.5 (international application number: PCT / JP03 / 13595 / ), the international application date is October 24, 2003, and the name is "connection unit, measured component mounting board, probe card and component interface part". "A divisional application of the patent application. technical field [0002] The present invention relates to a test device, and in particular to a measured component mounting board called a performance board, a probe card, and a socket board for mounting a measured component (DUT, Device Under Test), and a connection The connection unit between the mounting board of the measured component and the main body of the test device. [0003] This case is related to Japanese application No. 2002-317287 (application date: October 31, 2002) and case No. 2002-338560 (application date: November 21, 2002), and the contents of these applications It is also incorporated into this case as part of the record of this case. Backgro...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G01R1/04
Inventor 福岛健太郎星野正史
Owner ADVANTEST CORP
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