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Fluorescence spectrometer and its control method

A technology of fluorescence spectrometer and control method, which is applied in the direction of using feedback control, instruments, scientific instruments, etc., and can solve the problems of lack of devices and methods for detecting whether the stage 103 has accurately reached the optimal distance

Active Publication Date: 2011-12-07
JIANGSU SKYRAY INSTR
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Problems solved by technology

However, in the prior art, there is a lack of devices and methods for detecting whether the stage 103 has accurately reached the optimal distance

Method used

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  • Fluorescence spectrometer and its control method
  • Fluorescence spectrometer and its control method
  • Fluorescence spectrometer and its control method

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Embodiment Construction

[0027] In the specific embodiment of the present invention, the necessary structure of the fluorescence spectrometer and the control method of the fluorescence spectrometer are described in detail, which can accurately move the stage to the optimal distance from the X-ray emission system, that is, the optimal working position. It should be understood that the following descriptions are preferred embodiments of the present invention and are not intended to limit the scope of the claims.

[0028] Such as figure 2 As shown, the fluorescence spectrometer 201 of an embodiment of the present invention includes an X-ray emission system 202 and an object stage 203, in addition to at least a first image acquisition device 204, a second image acquisition device 206, and a comparison device 208 And the stage control device 209.

[0029] Wherein, the X-ray emission surface 210 of the X-ray emission system 202 faces the side of the stage 203 for carrying samples (not shown in the figure)...

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Abstract

The invention relates to a fluorescence spectrometer and a control method thereof. The present invention adopts more than two sets of image acquisition devices to collect the images of the stage and / or the sample to be tested respectively, compare the similarity of the images collected by different image acquisition devices, and then compare the images before and after the movement of the stage. The similarity obtained twice adjacently is used to judge whether the aforementioned moving process is closer to the optimal working position or farther away from the optimal working position, so as to adjust the moving direction of the stage until the stage reaches the allowable error range of the optimal working position Within, the stage can be accurately moved to the optimal distance from the X-ray emission system, that is, the optimal working position.

Description

technical field [0001] The invention relates to a spectrometer, in particular to a fluorescence spectrometer and a control method thereof. Background technique [0002] When the sample is irradiated with X-rays, the sample can be excited to emit fluorescent X-rays of various wavelengths. It is necessary to separate the mixed X-rays according to wavelength or energy, and measure the intensities of X-rays with different wavelengths or energies for qualitative and quantitative analysis. The instrument used for this purpose is an X-ray fluorescence spectrometer. Since X-rays have a certain wavelength and energy, there are two basic types of X-ray fluorescence spectrometers, namely, wavelength dispersive and energy dispersive. [0003] The wavelength dispersive X-ray fluorescence spectrometer is equipped with a spectroscopic system, and its main component is a crystal spectrometer. The role of the crystal beam splitter is to separate the X-rays of different wavelengths through...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/223G05D3/12
Inventor 刘召贵应刚胡晓斌姚栋樑李玉花
Owner JIANGSU SKYRAY INSTR
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