Analysis method and device of equipment defects
An analysis device and analysis method technology, applied in special data processing applications, instruments, electrical digital data processing, etc., can solve the problems of lack of scientificity and rigor in analysis, and achieve the effect of enhancing scientificity and rigor
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[0022] It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other. The present invention will be described in detail below with reference to the accompanying drawings and examples.
[0023] figure 1 It is a flowchart of the main steps of the method for analyzing equipment defects according to an embodiment of the present invention, such as figure 1 As shown, the method mainly includes the following steps:
[0024] Step S101: Determine the level corresponding to each type of equipment defect within the sampling period according to the degree of impact of each type of equipment defect on the operation of the equipment;
[0025] Preferably, the grades corresponding to the equipment defects mainly include: critical defects, serious defects and general defects.
[0026] Among them, a critical defect refers to a defect that seriously affects the normal operation of the device,...
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