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Analysis method and device for equipment defect

An analysis device and analysis method technology, applied in special data processing applications, instruments, electrical digital data processing, etc., can solve the problems of lack of scientificity and rigor in analysis, and achieve the effect of enhancing scientificity and rigor

Active Publication Date: 2015-08-19
STATE GRID CORP OF CHINA +1
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

[0007] The main purpose of the present invention is to provide an analysis method and device for equipment defects to solve the problem of lack of scientificity and rigor in the analysis of equipment defects in the prior art

Method used

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  • Analysis method and device for equipment defect
  • Analysis method and device for equipment defect
  • Analysis method and device for equipment defect

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Embodiment Construction

[0022] It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other. The present invention will be described in detail below with reference to the accompanying drawings and examples.

[0023] figure 1 It is a flowchart of the main steps of the method for analyzing equipment defects according to an embodiment of the present invention, such as figure 1 As shown, the method mainly includes the following steps:

[0024] Step S101: Determine the level corresponding to each type of equipment defect within the sampling period according to the degree of impact of each type of equipment defect on the operation of the equipment;

[0025] Preferably, the grades corresponding to the equipment defects mainly include: critical defects, serious defects and general defects.

[0026] Among them, a critical defect refers to a defect that seriously affects the normal operation of the device,...

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Abstract

The invention provides an analysis method and device of equipment defects. The method comprises the following steps of: obtaining operation time of equipment in a sampling time interval and incidence frequency of each grade of equipment defect in the sampling time interval; obtaining a product value of the incidence frequency of each grade of the equipment defect and a weight value corresponding to the grade of the equipment defect according to the incidence frequency of each grade of the equipment defect and a pre-set weight value of each grade of the equipment defect, wherein the product value is used as an effective value of the incidence frequency of the grade of the equipment defect; summing the effective values of the incidence frequencies of all grades of equipment defects to obtain the sum value of the effective values of the incidence frequencies of all the grades of equipment defects; and obtaining a quotient value of the sum value of the effective values of the incidence frequencies of all the grades of equipment defects and operation time of the equipment in the sampling time interval, wherein the quotient value is a defect rate of the equipment. The analysis method and device are good for obvious improvement of an operating risk pre-controlling level of the equipment.

Description

technical field [0001] The invention relates to an analysis method and device for equipment defects. Background technique [0002] The current analysis of equipment defects often only uses empirical observation and simple counting methods to analyze equipment defects. [0003] The empirical observation method is an analysis method that draws conclusions intuitively based on a large number of operating experience and maintenance experience. This method is simple and clear, and has a relatively intuitive reflection on the overall situation of defect occurrence, but it is easily affected by subjective cognition, and it is difficult to achieve scientific and rigorous analysis conclusions. [0004] The simple counting analysis method is to analyze the simple data of the automation defect sample, which generally includes: the number of occurrences of automation defects in each substation during the sampling period, the ratio of the number of operating failures of each manufacture...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F19/00
Inventor 赵岩
Owner STATE GRID CORP OF CHINA
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