A discrete power-on self-test circuit

A discrete and self-checking technology, applied in the field of discrete self-checking methods and circuits, can solve problems such as high power consumption, and achieve the effects of reducing power consumption, fewer peripheral circuits, and reducing self-checking costs

Active Publication Date: 2016-11-02
西安翔腾微电子科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] The purpose of the present invention is to propose a discrete power-on self-test circuit, which can effectively solve the technical problem of high power consumption caused by peripheral devices in the prior art

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  • A discrete power-on self-test circuit

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Embodiment Construction

[0017] The technical solutions of the present invention are clearly and completely described below in conjunction with the accompanying drawings and specific embodiments. Obviously, the described embodiments are only a part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without making creative work are all Belong to the protection scope of the present invention.

[0018] The principle of the self-test method of this embodiment is to determine the self-test type according to the instruction register accessed for the first time. When first accessing the instruction 1 register, when performing a 0 / 1 self-test, the s0 sent at this time is "0" first, and then It is "1", "0" means the self-test starts (k1 is closed), and the discrete port signal is shielded (k0 is turned on); s1 is "0" first and then "1", "0" means that the vref_hi port is shielded, "1 "I...

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Abstract

The invention discloses a self-test circuit for discrete magnitude. The technical problem of high power consumption caused by peripheral devices in the prior art can be effectively solved. According to the self-test circuit and a self-test method for the discrete magnitude, port signals are selected for comparison according to a self-test type, and a comparison result is compared with an instruction register to self-test each channel once; the self-test circuit is integrated in a discrete magnitude circuit chip, so that only vref_hi and vref_l0 are required to be provided by an external port, and few peripheral circuits are required; in addition, the circuit is simple in structure, and can be widely applied to discrete circuits, the power consumption is reduced, and the self-test cost is lowered.

Description

technical field [0001] The invention belongs to the design technology for electronic circuits, in particular to a discrete quantity self-checking method and circuit. Background technique [0002] Discrete circuits are widely used in electromechanical systems to process discrete quantities of each channel. Whether the result processed by the discrete circuit is credible has become a very important issue. Traditional discrete signal processing uses peripheral devices and logic chips to build circuits to complete the self-test function, but due to the large area occupied by peripheral devices, the power consumption of discrete self-test circuits is large, and the use of peripheral devices also improves self-test performance. cost. Contents of the invention [0003] The purpose of the present invention is to propose a discrete power-on self-test circuit, which can effectively solve the technical problem of high power consumption caused by peripheral devices in the prior art....

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Application Information

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Patent Type & AuthorityPatents(China)
IPC IPC(8): G06F17/10
Inventor田泽邵刚蔡叶芳郎静李世杰杨峰郭蒙王泉
Owner西安翔腾微电子科技有限公司