Rapid semantic processor for pin-based APG (Automatic Pattern Generator)

A semantic processor, fast technology for instrumentation, static memory, software testing/debugging, etc.

Active Publication Date: 2015-01-21
ADVANTEST CORP
View PDF6 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0009] However, if the recursive variable cannot be optimized into a stateless expression, then the variable will be evaluated recursively, which is very, very slow

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Rapid semantic processor for pin-based APG (Automatic Pattern Generator)
  • Rapid semantic processor for pin-based APG (Automatic Pattern Generator)
  • Rapid semantic processor for pin-based APG (Automatic Pattern Generator)

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0020] Specific embodiments of the present invention will be described below with reference to the accompanying drawings. In the following description, numerous specific details are provided to enable those skilled in the art to better understand the present invention. It should be understood, however, that these specific details are illustrative rather than limiting, and that the invention may be practiced without some or all of these specific details. Additionally, structures or techniques that are known in the art have not been described in detail to avoid unnecessarily obscuring the present invention.

[0021] When testing integrated circuits such as memory or SoC chips, first write a test program, such as a C-like program, which contains various test patterns (statements), and then use the semantic processor to perform test patterns on the MTL compiler. Convert (interpret) and use the device access timing generation module to generate a repeating tree.

[0022] figure ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a rapid semantic processor for a pin-based APG (Automatic Pattern Generator). A memory test language compiler comprises the rapid semantic processor for converting a stateful pattern into a stateless pattern specific to compiling patterns in a test program, and a device access time sequence generating module for generating output based on the stateless pattern.

Description

technical field [0001] The present invention generally relates to the testing of integrated circuits, and more particularly relates to a fast semantic processor for pin-based APG (Automatic Pattern Generator, automatic pattern generator). Background technique [0002] Test handlers are used in intelligent testing of integrated circuits such as memory or SoC (system on chip) chips, which typically lack registers and computation units and are incapable of conditional execution. Instead, test handlers can only execute nested repeating trees, an example of which is as follows: [0003] [0004] Among them, repeat means repetition, for example, repeat10 means to repeat the content in the parentheses 10 times; vector means data vector. The repeating tree determines the binary sequence used for testing. By executing the iterative tree, the test handler generates binary sequences for testing. The test handler includes, for example, a repetition tree execution module that conve...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06F11/36
CPCG11C29/10G11C29/56004
Inventor崔华春卡兹·弗特克哈·艾哈迈德
OwnerADVANTEST CORP