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Detection method of storage life characteristics of monolithic integrated circuits

A single-chip integrated circuit, storage life technology, applied in the direction of electronic circuit testing, measuring devices, instruments, etc., can solve the problem that the detection of the storage life characteristics of single-chip integrated circuits cannot be realized

Active Publication Date: 2017-12-05
FIFTH ELECTRONICS RES INST OF MINIST OF IND & INFORMATION TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, failure analysis only conducts research and analysis on electronic components that have failed, and DPA only detects electronic components that have not failed functions, and neither can realize the detection of storage life characteristics of monolithic integrated circuits.

Method used

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  • Detection method of storage life characteristics of monolithic integrated circuits
  • Detection method of storage life characteristics of monolithic integrated circuits
  • Detection method of storage life characteristics of monolithic integrated circuits

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Experimental program
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Embodiment Construction

[0016] refer to figure 1 , in a preferred embodiment of the detection method for the storage life characteristic of the monolithic integrated circuit of the present invention, it includes step S410, step S430 and step S450.

[0017] S410: Carry out appearance quality inspection on the monolithic integrated circuit, and obtain external inspection qualified products and external inspection failed products according to the inspection results.

[0018] In one of the embodiments, refer to figure 2 , step S410 includes step S411-step S413.

[0019] S411: Visually inspect the monolithic integrated circuit, observe the shell and pins of the monolithic integrated circuit.

[0020] S412: Perform a microscopic inspection on the monolithic integrated circuit, and observe the shell and pins of the monolithic integrated circuit.

[0021] S413: According to the results of visual inspection and microscopic inspection, the products that pass the external inspection and the products that fa...

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Abstract

The invention relates to a method for detecting the storage life characteristics of a monolithic integrated circuit, comprising the steps of: inspecting the appearance quality of the monolithic integrated circuit, and obtaining a qualified product and a failed product according to the inspection result; Measurement, and according to the measurement results, the final inspection qualified products and final inspection failed products are obtained; the reliability characteristics of the final inspection qualified products are analyzed to obtain the predicted storage life. Through the appearance quality inspection and electrical parameter measurement of the monolithic integrated circuit, the qualified products with unfailed functions are selected, and the predicted storage life of the integrated circuits is obtained by analyzing the reliability characteristics of the qualified products, so that the storage of missiles can be estimated Life, which solves the problem of detecting the storage life characteristics of monolithic integrated circuits.

Description

technical field [0001] The invention relates to the detection technology of electronic devices, in particular to a method for detecting the characteristics of the storage life of a monolithic integrated circuit. Background technique [0002] Storage life is an important quality characteristic of weapons and equipment. For missiles with long-term storage and one-time use characteristics, it generally needs to go through a storage time of 8-10 years. However, my country's production and development units often do not give its storage life. Therefore, it is impossible to know how long the missiles can be stored. For imported missiles, when they reach the specified service life one after another, the life extension repair work of missiles will enter a phased peak period. Therefore, the life-extending repair of weapons and equipment according to the storage life plays an important role in maximizing the combat effectiveness of equipment, restoring combat readiness, and saving mil...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01D21/02G01R31/28
Inventor 程德斌高军李坤兰解江邱宝军
Owner FIFTH ELECTRONICS RES INST OF MINIST OF IND & INFORMATION TECH
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