Detection method of storage life characteristics of monolithic integrated circuits
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- FIFTH ELECTRONICS RES INST OF MINIST OF IND & INFORMATION TECH
- Publication Date
- 2017-12-05
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Abstract
Description
technical field
[0001] The invention relates to the detection technology of electronic devices, in particular to a method for detecting the characteristics of the storage life of a monolithic integrated circuit. Background technique
[0002] Storage life is an important quality characteristic of weapons and equipment. For missiles with long-term storage and one-time use characteristics, it generally needs to go through a storage time of 8-10 years. However, my country's production and development units often do not give its storage life. Therefore, it is impossible to know how long the missiles can be stored. For imported missiles, when they reach the specified service life one after another, the life extension repair work of missiles will enter a phased peak period. Therefore, the life-extending repair of weapons and equipment according to the storage life plays an important role in maximizing the combat effectiveness of equipment, restoring combat readiness, and saving mil...