Patents
Literature
Patsnap Copilot is an intelligent assistant for R&D personnel, combined with Patent DNA, to facilitate innovative research.
Patsnap Copilot

43 results about "Reliability (characteristic)" patented technology

Reliability is an integrated characteristic that may include dependability, service life, maintainability, and storage life separately or in particular combinations of characteristics, both for the product as a whole and for its parts, depending on the function and operating conditions.

High density methods for producing diode-pumped micro lasers

A miniaturized laser package is provided comprising a standard semiconductor laser package modified to accept a solid state microchip assembly pumped by the diode laser. Standard packages described in the invention include TO and HHL packages all of which are characterized by small dimensions, well sealed housing, robust mounting features, known characterized materials and economical production and assembly techniques characteristic of the semiconductor processing industry. In particular, the microchip lasers are produced using high density techniques that lend themselves to mass production, resulting in very low unit costs. At the same time, the compact laser devices provide a solution to the problem of providing laser radiation at high beam quality and good reliability features with a variety of wavelengths and operational characteristics and low noise features not available from diode lasers yet relying primarily on standardized designs, materials and techniques common to diode laser manufacturing. The devices constructed according to methods taught by the invention can therefore be readily integrated into numerous applications where power, reliability and performance are at a premium but low cost is essential, eventually replacing diode lasers in many existing systems but also enabling many new commercial, biomedical, scientific and military systems.
Owner:SNAKE CREEK LASERS

Overheating fault simulating method for GIS (gas insulated switchgear) bus joint

An overheating fault simulating method for GIS (gas insulated switchgear) bus joint includes steps of building a mathematical temperature-rising model according to a physical heating process of the GIS bus joint; performing similarity analysis according to the mathematical temperature-rising model, determining an accurate coupling field similarity relation; simplifying the mathematical temperature-rising model, determining an approximate coupling field similarity relation; determining a simulation test scheme of overheating faults of the GIS bus joint and a physical GIS bus joint similarity model under various contact conditions; implementing an overheating fault simulation test on the basis of the physical similarity model of the GIS bus joint according to the simulation test scheme, and acquiring simulation test data. By simulating the overheating faults of the GIS bus joint with the similarity model of the GIS bus joint, overheating fault mechanisms and reliability features are indirectly researched, the defects that protomodel simulation test is high in cost, equipment manufacturing period is long and reliability during test is poor are overcome, and implementing of temperature monitoring and routing inspection of the GIS bus joint are facilitated.
Owner:FOSHAN POWER SUPPLY BUREAU GUANGDONG POWER GRID +1

Testing method for verifying reliability of electricity utilization information collecting device

ActiveCN104076224AVerify reliabilityObtain full cycle life curveElectrical testingElectricityConstant stress
The invention provides a testing method for verifying the reliability of an electricity utilization information collecting device. The testing method includes the following steps: building an electricity utilization information collecting device reliability model, determining a failure mode, a failure criteria and a failure statistic principle, carrying out a temperature-humidity-constant stress accelerated life test on the electricity utilization information collecting device, carrying out failure statistic, analyzing test data obtained through the accelerated life test, and obtaining the accumulated failure probability and the reliability. According to the testing method for verifying the reliability of the electricity utilization information collecting device, the temperature-humidity-constant stress accelerated life test on the electricity utilization information collecting device is guided to be carried out by building the electricity utilization information collecting device reliability model, and estimated values of reliability characteristic variables under the normal use condition are derived through failure data under the accelerated condition to verify whether the reliability of the electricity utilization information collecting device meets requirements or not.
Owner:CHINA ELECTRIC POWER RES INST +2

Reliability life evaluation method of long-life electronic device under multiple stresses based on depth belief network

The invention discloses a reliability life evaluation method of a long-life electronic device under multiple stresses based on a depth belief network, which estimates reliability characteristics by obtaining device failure data under different environmental stresses through an accelerated life test, and then establishes a reliability derivation model to complete the reliability life derivation under a constant stress level. The evaluation method comprises the following steps: firstly, determining the environmental stress which affects the working reliability of the electronic components; secondly, designing the accelerated life test; thirdly, performing statistical analysis in the test data to obtain the reliability life estimated values of components under different stress levels; and finally, determining the reliability derivation model by using the accelerated life test data. The invention solves the problems of sample shortage and limited test time, adopts a novel constant stress reliability characteristic derivation model, solves the problem that the traditional single stress estimation method is prone to model nesting risk, and realizes the establishment of the life derivation model under multiple stress levels.
Owner:BEIJING UNIV OF TECH

Method for detecting storage life characteristics of monolithic integrated circuits

ActiveCN105004367AShelf Life EstimationSolve the problem of detection of storage life characteristicsElectronic circuit testingElectricityReliability (characteristic)
The present invention relates to a method for detecting storage life characteristics of monolithic integrated circuits, comprising the steps of: performing appearance quality inspection for the monolithic integrated circuits and obtaining appearance inspection qualified products and appearance inspection failure products according to inspection results; performing electrical parameter measurement for the appearance inspection qualified products and obtaining final-inspection qualified products and final-inspection failure products according to measurement results; and performing reliability characteristic analysis for the final-inspection qualified products to obtain predicted storage lives. According to the method of the present invention, appearance quality inspection and electrical parameter measurement are performed for the monolithic integrated circuits to select qualified products with unfailed functions, and reliability characteristic analysis is performed for the qualified products to obtain the predicted storage lives of the integrated circuits, thus a storage life of a missile can be estimated, and the problem of detecting the storage life characteristics of the monolithic integrated circuits can be solved.
Owner:FIFTH ELECTRONICS RES INST OF MINIST OF IND & INFORMATION TECH

Method for quickly analyzing universal reliability indicators of printed circuit board

The invention discloses a method for quickly analyzing universal reliability indicators of a printed circuit board. The method includes steps of setting up a reliability characteristic parameter distribution model of electronic components; acquiring an electronic component list by calling an interface function; compiling a detailed electronic component list of the printed circuit board; acquiring a table list containing universal failure parameters of all the electronic components according to the reliability characteristic parameter distribution model of the electronic components of the printed circuit board; calculating failure rate of the printed circuit board in the using environment; calculating system reliability, system unreliability and system average faultless service life of the printed circuit board according to the failure rate of the printed circuit board in the using environment. The design of the circuit board is of great guidance significance, continuity between the design of the circuit board and reliability analysis is realized, cross implementation of the design of the circuit board and the reliability analysis can be conveniently realized by users, and design efficiency of the circuit board is improved.
Owner:ZHEJIANG UNIV

Reliability evaluation test method of built-in load switch for electric energy meter

The invention discloses a reliability evaluation test method of a built-in load switch for an electric energy meter. The reliability evaluation test method is characterized by including a load switch mechanical reliability and electrical reliability evaluation method. According to the method, a failure rate is adopted as a reliability characteristic parameter, and grading testing is carried out through adopting a fixed event censoring mode. The method includes the following steps that: S01, an allowable failure number Ac and a censoring failure number rc are selected, wherein rc and Ac satisfies a relational expression that rc=Ac+1; S02, the number Tc of times of censoring is obtained according to the allowable failure number Ac and a pre-selected failure rate grade; S03, the number tz of times of test censoring of test pieces is selected; S04, the number n of the test pieces is determined according to Tc, Ac and tz; S05, n test pieces are randomly sampled from products in batch production; S06, test and inspection are carried out according to regulations; S07, a failure number r and the number of times of the test of failed products are calculated; and S08, a test result is judged. The test method of the invention has the advantages of simple operation, accurate detection and the like.
Owner:STATE GRID CORP OF CHINA +3

Communication controlling system based on No.7 signalling network, method and service controller structure thereof

The invention relates to a No.7 signaling network-based communication control system and method and the service controller structure thereof. And the system comprises several service controllers and service management servers connected to the No.7 signaling network, and the service controller applies processor technique and dispersive data list technique to communication network, and skillfully uses message transfer ability and inherent high-reliability characteristics of the No.7 signaling network to provide two signaling link access modes to implement inquiring and executing service logics of memory service data list: traditional signaling point-possessing signaling terminal mode and no-signaling point signaling conversion mode, implementing high efficiency handling and transfer of signaling information. And the invention breaks through the limit of traditional switching and intelligent network techniques, both able to be independent of the active communication network and implement in scale the services, such as user service authentication, detailed bill accounting, number upgrading and number carrying, and possessing all interfaces and characteristics of NGN data sublist and HLR.
Owner:SHANGHAI LIANGJIANG COMM SYST

Method for determining the demand quantity of spare parts of a multi-Weibull unit part for overall part replacement and maintenance of a large cargo ship

InactiveCN109492974AImprove securitySolve the problem of inaccurate calculation of spare parts demandLogisticsMulti unitMechanical equipment
The invention discloses a method for determining the demand quantity of spare parts of a multi-Weibull unit part for overall part replacement and maintenance of a large cargo ship, belongs to a mechanical equipment supportability design method, and solves the problem that the demand quantity of the spare parts is difficult and inaccurate to calculate in the supportability design process of the mechanical equipment. The method comprises the steps of Gamma equivalent part establishment, initial value setting, guarantee probability calculation and judgment. According to the reliability characteristic of the Weibull unit, the number of the spare parts can be quickly calculated on the basis of the real reliability structure of the multi-unit k/N voting component, and the problem that the calculation of the demand quantity of the spare parts in the existing mechanical equipment supportability design is inaccurate is solved. In the supportability design stage and the train installation operation stage of the mechanical equipment, the demand quantity of spare parts can be accurately determined, the related cost of the mechanical equipment in the whole life cycle can be accurately estimated, and technical support is provided for evaluating the cost-to-efficiency ratio state of the mechanical equipment, achieving good guarantee of the mechanical equipment and guaranteeing the mechanicalequipment.
Owner:青岛航讯网络技术服务有限公司

Intelligent substation secondary system reliability assessment method based on coefficient of variation method

The invention provides an intelligent substation secondary system reliability assessment method based on a coefficient of variation method. The method includes: performing statistics on the number of key elements in an intelligent substation, and calculating the comprehensive failure rate of each element in various network structures; establishing a reliability evaluation matrix; converting the reliability evaluation matrix to a standard reliability matrix; obtaining the weight value of the comprehensive failure rate of each element according to a coefficient of variation to further obtain a weighted reliability matrix; and establishing a reliability characteristic space to obtain the relative proximity of each sample point to the optimal point and the worst point, ranking the relative proximity of each sample, and obtaining a reliability assessment result of a secondary system network structure represented by each sample point. According to the method, comprehensive evaluation is performed by employing the coefficient of variation method, factors which influence the reliability of the intelligent substation secondary system can be rapidly found out, and the reliability level of a substation communication system in the design and planning process is improved.
Owner:CHINA ELECTRIC POWER RES INST +2

System for implementing telecom value added business based on signaling processing technology

The invention relates to a system based on the signaling processing art for realizing the telecom value-added service. The system comprises a plurality of service control devices accessed in a No 7 signaling network and a service management server. The service control device organically applies the processor art and the decentralized data table art to a communication network, and ingeniously utilizes the message-passing ability and the internal high-reliability characteristics of the No 7 signaling network, and provides two signaling link access modes to realize the query about a memory service data sheet and the execution service logic, wherein, the access modes are a signaling terminal mode with signaling points and a signaling transfer mode without signaling points, so that the high-effective processing and transferring of the signaling information are realized. The invention breaks the confines of the traditional exchange and the intelligent network art, implements the services, such as the user service authentication, the number portability, the signaling monitoring, and the like, in a large scale, effectively solves the contradictions between investment and benefit, and technology and development, and is dependent of the prior communication network.
Owner:SHANGHAI LIANGJIANG COMM SYST

Semiconductor discrete device storage life characteristic detection method and system

ActiveCN106546290AAccurately assess shelf life statusMeasurement devicesTest sampleDependability
The present invention relates to a semiconductor discrete device storage life characteristic detection method and system. The method includes the following steps that: test samples are obtained; failure detection and classification are performed on the test samples, so that a qualified sample set and a failure sample set can be obtained; storage reliability feature detection analysis is performed on the qualified sample set, so that a first analysis result can be obtained; failure analysis is performed on the failure sample set, so that a second analysis result is obtained; and the storage life states of the test samples can be obtained according to the first analysis result and the second analysis result. According to the semiconductor discrete device storage life characteristic detection method and system of the invention, the storage reliability feature detection analysis is performed on the qualified sample set, so that whether test samples having storage degradation failure characteristics exist in the qualified sample set can be judged; the failure analysis is performed on the failure sample set, so that whether test samples having storage failure information exist in the failure sample set can be judged; and the storage life states of the test samples can be obtained according to the analysis results. With the above scientific storage life evaluation method adopted, the storage life states of the test samples can be evaluated accurately and accurately.
Owner:CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST THE FIFTH ELECTRONICS RES INST OF MIITCEPREI LAB

Reliability technology teaching experiment system

The invention provides a reliability technology teaching experiment system. The reliability technology teaching experiment system comprises an upper control microcomputer, a high and low temperature cycling test chamber, a bus type experiment frame, a temperature control instrument, an electrical stress loading/measuring system and a programmable power supply. Discrete electronic components are used as an experimental subject and inserted in a corresponding experiment board, and the experiment board is inserted in the bus type experiment frame inside the high and low temperature cycling test chamber. System control software which is developed in a customized mode is installed in the upper control microcomputer, and can conduct integrated control over stress loading and on-line testing. Temperature changes of the high and low temperature cycling test chamber are changed through the temperature control instrument. Electrical stress borne by the experiment board is controlled through the electrical stress loading/measuring system and the programmable power supply. Measurement data of reliability characteristic quantities of all the experiment components on the experiment board are collected on line and in real time through the electrical stress loading/measuring system. The upper control microcomputer, the high and low temperature cycling test chamber, the bus type experiment frame, the temperature control instrument, the electrical stress loading/measuring system and the programmable power supply are distributed in an integrated cabinet in an integrated mode, and the experiment board is selected for use as needed in an experiment.
Owner:SHANGHAI DIANJI UNIV

Robust optimization design method of contact net support suspension system wrist-arm based on disturbance interference theory

The invention discloses a robust optimization design method of a contact net support suspension system wrist-arm based on a disturbance interference theory. The robust optimization design method of the contact net support suspension system wrist-arm based on the disturbance interference theory comprises the following steps: establishing a stress expression for an X type wrist-arm; considering design parameters as random variables, and obtaining a reliability characteristic equation based on the probability interference theory; performing micro-disturbance on the random variables and the reliability characteristic equation; calculating a robust reliability indicator; converting a probability distribution function that randomly distributes the random parameters into a standard normal distribution function; calculating the robust reliability of the wrist-arm; and establishing a mathematical model for the robust optimization of the wrist-arm. In the robust optimization design method of thecontact net support suspension system wrist-arm based on the disturbance interference theory, the non-deterministic probability theory, micro-disturbance and Edgeworth theory are introduced into thestructural design of the wrist-arm, and the wrist-arm reliability is directly embedded into the optimization model; therefore, the key technology of the robust design of electrified railway contact net is solved.
Owner:WENZHOU UNIVERSITY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products