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Reliability life evaluation method of long-life electronic device under multiple stresses based on depth belief network

A technology of deep belief network and electronic devices, applied in biological neural network models, instruments, electrical digital data processing, etc., can solve problems such as shortening evaluation time, limited performance of single stress accelerated derivation model, long test time, etc., to reduce Cost of experimentation, avoiding the risk of getting stuck in data overfitting, the effect of reducing usage

Inactive Publication Date: 2018-10-16
BEIJING UNIV OF TECH
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Problems solved by technology

[0009] The purpose of the present invention is to provide a reliability evaluation method for long-life electronic components to solve the problems of long test time under normal stress and limited performance of single stress acceleration derivation model under the influence of comprehensive factors, and effectively improve the test efficiency of electronic components , reducing the evaluation time while improving the robustness of product reliability evaluation

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  • Reliability life evaluation method of long-life electronic device under multiple stresses based on depth belief network
  • Reliability life evaluation method of long-life electronic device under multiple stresses based on depth belief network
  • Reliability life evaluation method of long-life electronic device under multiple stresses based on depth belief network

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Embodiment Construction

[0044] The following will combine figure 1 The method for evaluating the reliability of long-life electronic components of the present invention is further described in detail.

[0045] The method for evaluating the reliability of long-life electronic components of the present invention is based on certain assumptions, which include:

[0046] Hypothesis 1: The performance degradation process of the product is monotonic, that is, the performance degradation is irreversible.

[0047] Hypothesis 2: Under each accelerated stress, the failure mechanism and failure mode of the product remain unchanged.

[0048] Hypothesis 3: Accelerated degradation data have the same distribution form at different comprehensive stress levels, and the pseudo-failure life of products under different stress levels obtained through the data obeys the same distribution form.

[0049] Hypothesis 4: The residual life of the product only depends on the cumulative failure part and the comprehensive stress ...

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Abstract

The invention discloses a reliability life evaluation method of a long-life electronic device under multiple stresses based on a depth belief network, which estimates reliability characteristics by obtaining device failure data under different environmental stresses through an accelerated life test, and then establishes a reliability derivation model to complete the reliability life derivation under a constant stress level. The evaluation method comprises the following steps: firstly, determining the environmental stress which affects the working reliability of the electronic components; secondly, designing the accelerated life test; thirdly, performing statistical analysis in the test data to obtain the reliability life estimated values of components under different stress levels; and finally, determining the reliability derivation model by using the accelerated life test data. The invention solves the problems of sample shortage and limited test time, adopts a novel constant stress reliability characteristic derivation model, solves the problem that the traditional single stress estimation method is prone to model nesting risk, and realizes the establishment of the life derivation model under multiple stress levels.

Description

technical field [0001] The invention relates to reliability evaluation technology, in particular to a reliability evaluation method for long-life electronic device products under multiple stresses, which is used to verify whether electronic products meet specified reliability indicators under different stress levels. Background technique [0002] The progress of modern science and technology and the continuous development of microelectronics technology and computer technology have promoted the development of electronic equipment and systems in the direction of complexity, high speed, high efficiency, informatization, precision and automation, and have been successfully applied in aerospace, aviation, Fields such as ships and weapons. Electronic equipment is both a basic component and a core position in equipment and equipment. For example, electronics in aviation systems account for about 50% of the cost. Electronic equipment can greatly improve the working efficiency of t...

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Application Information

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IPC IPC(8): G06F17/50G06N3/04
CPCG06F30/20G06F2119/04G06N3/045
Inventor 张利国孙启龙
Owner BEIJING UNIV OF TECH
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