Method for detecting storage life characteristics of monolithic integrated circuits

A monolithic integrated circuit, storage life technology, applied in the direction of electronic circuit testing, measuring devices, instruments, etc., can solve problems such as the detection of the storage life characteristics of monolithic integrated circuits that cannot be realized.

Active Publication Date: 2015-10-28
FIFTH ELECTRONICS RES INST OF MINIST OF IND & INFORMATION TECH
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  • Abstract
  • Description
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  • Application Information

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Problems solved by technology

However, failure analysis only conducts research and analysis on electronic components that have failed, and DPA only detects electronic components that have not failed functions, and neither can realize the detection of storage life characteristics of monolithic integrated circuits.

Method used

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  • Method for detecting storage life characteristics of monolithic integrated circuits
  • Method for detecting storage life characteristics of monolithic integrated circuits
  • Method for detecting storage life characteristics of monolithic integrated circuits

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Embodiment Construction

[0016] refer to figure 1 , in a preferred embodiment of the detection method for the storage life characteristic of the monolithic integrated circuit of the present invention, it includes step S410, step S430 and step S450.

[0017] S410: Carry out appearance quality inspection on the monolithic integrated circuit, and obtain external inspection qualified products and external inspection failed products according to the inspection results.

[0018] In one of the embodiments, refer to figure 2 , step S410 includes step S411-step S413.

[0019] S411: Visually inspect the monolithic integrated circuit, observe the shell and pins of the monolithic integrated circuit.

[0020] S412: Perform a microscopic inspection on the monolithic integrated circuit, and observe the shell and pins of the monolithic integrated circuit.

[0021] S413: According to the results of visual inspection and microscopic inspection, the products that pass the external inspection and the products that fa...

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Abstract

The present invention relates to a method for detecting storage life characteristics of monolithic integrated circuits, comprising the steps of: performing appearance quality inspection for the monolithic integrated circuits and obtaining appearance inspection qualified products and appearance inspection failure products according to inspection results; performing electrical parameter measurement for the appearance inspection qualified products and obtaining final-inspection qualified products and final-inspection failure products according to measurement results; and performing reliability characteristic analysis for the final-inspection qualified products to obtain predicted storage lives. According to the method of the present invention, appearance quality inspection and electrical parameter measurement are performed for the monolithic integrated circuits to select qualified products with unfailed functions, and reliability characteristic analysis is performed for the qualified products to obtain the predicted storage lives of the integrated circuits, thus a storage life of a missile can be estimated, and the problem of detecting the storage life characteristics of the monolithic integrated circuits can be solved.

Description

technical field [0001] The invention relates to the detection technology of electronic devices, in particular to a method for detecting the characteristics of the storage life of a monolithic integrated circuit. Background technique [0002] Storage life is an important quality characteristic of weapons and equipment. For missiles with long-term storage and one-time use characteristics, it generally needs to go through a storage time of 8-10 years. However, my country's production and development units often do not give its storage life. Therefore, it is impossible to know how long the missiles can be stored. For imported missiles, when they reach the specified service life one after another, the life extension repair work of missiles will enter a phased peak period. Therefore, the life-extending repair of weapons and equipment according to the storage life plays an important role in maximizing the combat effectiveness of equipment, restoring combat readiness, and saving mil...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01D21/02G01R31/28
Inventor 程德斌高军李坤兰解江邱宝军
Owner FIFTH ELECTRONICS RES INST OF MINIST OF IND & INFORMATION TECH
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