Integral Scattering Rate/Integral Transmittance High-Precision Measurement System for Ultra-High Mirrors

A measurement system and mirror technology, applied in the field of optical testing, can solve the problems of low accuracy and stability, complicated operation, etc., to achieve the effect of automatic control, simplified measurement operation, and improved measurement stability

Active Publication Date: 2018-05-15
XIDIAN UNIV
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Problems solved by technology

[0004] The purpose of the present invention is to overcome the deficiencies of the above-mentioned prior art, and propose a high-precision measurement system for the integrated scattering rate / integrated transmittance of an ultra-high reflector, which is used to solve the problems of low precision and stability and low operation of the existing measurement system. complex technical issues

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  • Integral Scattering Rate/Integral Transmittance High-Precision Measurement System for Ultra-High Mirrors

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Embodiment Construction

[0026] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.

[0027] refer to figure 1 , the present invention includes an optical path control module 1, a parameter measurement module 2, a reference measurement module 3 and a measurement control module 4; wherein:

[0028] The optical path control module 1 includes a laser 11, a converging convex lens 12, an aperture 13, an axial displacement stage 14, a collimating convex lens 15, a motor rotation stage 16, a polarizer group 17 and a beam splitter 18, wherein the converging convex lens 12, the aperture 13. The collimating convex lens 15, the polarizer group 17, and the beam splitter 18 are sequentially arranged on the main optical axis of the laser 11, and the center coincides with the main optical axis of the laser 11, wherein the diaphragm 13 is located at the center of the converging convex lens 12 focus. The converging convex lens 12 and the coll...

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Abstract

The invention provides a high-precision measurement system for the integrated scattering rate / integrated transmissivity of an ultrahigh reflector and is used for solving problems in the prior art that the technical precision and stability is low and the operation is complex. The high-precision measurement system comprises an optical path control module, a parameter measurement module, a reference measurement module and a measurement control module. The optical path control module comprises a convergence convex lens, a diaphragm, a collimation convex lens controlled by an axial displacement bench, a polaroid set controlled by a motor rotating table and a beam splitter mirror. The parameter measurement module comprises an integrating sphere, a transmission sample carrying platform positioned before a light incoming hole of the integrating sphere, a scattering sample wafer carrying platform positioned on the inner surface of the integrating sphere, and a detector. The photosensitive surface of the detector is tightly adhered to a narrowband filter. The reference measurement module comprises an attenuation sheet, the narrowband filter and a detector which are arranged on a secondary optical path in sequence. The measurement control module comprises a preamplifier, a divider, a data collection card and a computer which are connected in sequence. The invention is advantaged by simple operation, stable measurement and high precision.

Description

technical field [0001] The invention belongs to the technical field of optical testing, and relates to a high-precision measurement system for the integrated scattering rate / integrated transmittance of an ultra-high reflective mirror, which can be used for measuring the roughness of an optical surface. Background technique [0002] Ultra-high reflective mirrors, that is, optical elements with less loss such as scattering, transmission, and diffraction. Scattering, transmission and diffraction loss of the component are key factors affecting its performance, and accurate measurement of these parameters is of great value in many technical fields. For example, in the laser gyro system, the scattering and transmission characteristics of the ultra-high reflection mirror are one of the most important factors affecting its accuracy. Accurate measurement has very important guiding significance for the preparation of the laser gyro; during the preparation of the ultra-high reflection ...

Claims

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Application Information

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Patent Type & AuthorityPatents(China)
IPC IPC(8): G01M11/02
CPCG01M11/02G01M11/0207
Inventor邵晓鹏陈星李晨旭温少华朱广华
OwnerXIDIAN UNIV